CN110491318B - Array substrate - Google Patents
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- CN110491318B CN110491318B CN201910670588.4A CN201910670588A CN110491318B CN 110491318 B CN110491318 B CN 110491318B CN 201910670588 A CN201910670588 A CN 201910670588A CN 110491318 B CN110491318 B CN 110491318B
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136254—Checking; Testing
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- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Computer Hardware Design (AREA)
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- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
Abstract
The invention provides an array substrate, which comprises an enabling signal input terminal, a preset potential input terminal and a connecting resistor, wherein the enabling signal input terminal is used for inputting an enabling signal when a panel test is carried out; the preset potential input terminal is used for inputting a preset potential during panel testing; the connecting resistor is connected with the enabling signal input terminal and the preset potential input terminal, and the resistance value of the connecting resistor is a preset multiple of the resistance value of the enabling signal input terminal. By providing the connection resistance between the enable signal input terminal and the preset potential input terminal, when the enable signal input terminal is poorly connected due to impurities, the enable signal can be input through the preset potential input terminal.
Description
Technical Field
The invention relates to the technical field of display, in particular to an array substrate.
Background
After the array substrate is prepared, a plurality of tests are usually performed on the array substrate. In order to ensure the test accuracy, when a test is carried out, the thin film transistors of other tests must be switched off by inputting high potential, so that the test effect is not influenced.
In the prior art, an enable signal for turning off a thin film transistor is input through a test terminal on an array substrate, but the test terminal is often connected poorly due to impurities, so that a high potential signal cannot be input, and the corresponding thin film transistor is not turned off, so that an abnormality occurs on a screen of the array substrate when other tests are performed.
Therefore, the conventional array substrate has the technical problem that the enable signal cannot be normally input, and needs to be improved.
Disclosure of Invention
The invention provides an array substrate, which is used for relieving the technical problem that the enabling signal of the existing array substrate cannot be normally input.
In order to solve the above problems, the technical scheme provided by the invention is as follows:
the invention provides an array substrate, comprising:
an enable signal input terminal for inputting an enable signal when performing a panel test;
the preset potential input terminal is used for inputting a preset potential during panel testing;
and the connecting resistor is connected with the enable signal input terminal and the preset potential input terminal, and the resistance value of the connecting resistor is a preset multiple of the resistance value of the enable signal input terminal.
In the array substrate of the invention, the material of the connection resistor is polysilicon.
In the array substrate of the invention, the material of the connection resistor is a wide bandgap material.
In the array substrate of the present invention, the resistance value of the connection resistor is greater than or equal to 400 times the resistance value of the enable signal input terminal.
In the array substrate of the invention, the connection resistor is at least one of circular, rectangular or wave-shaped.
In the array substrate of the invention, the connection resistor and the active layer of the array substrate are arranged in the same layer.
In the array substrate of the invention, the connection resistor is arranged on the surface of the array substrate and is connected with the enable signal input terminal and the preset potential input terminal through a via hole.
In the array substrate of the present invention, the enable signal input terminal includes at least one of an array substrate test terminal and a display panel test terminal.
In the array substrate of the present invention, the connection resistor includes a first connection resistor and a second connection resistor, the first connection resistor connects the array substrate test terminal and the preset potential input terminal, and the second connection resistor connects the display panel test terminal and the preset potential input terminal.
In the array substrate, the array substrate test terminal and the display panel test terminal are arranged on the same layer.
The invention has the beneficial effects that: the invention provides an array substrate, which comprises an enabling signal input terminal, a preset potential input terminal and a connecting resistor, wherein the enabling signal input terminal is used for inputting an enabling signal when a panel test is carried out; the preset potential input terminal is used for inputting a preset potential during panel testing; the connecting resistor is connected with the enabling signal input terminal and the preset potential input terminal, and the resistance value of the connecting resistor is a preset multiple of the resistance value of the enabling signal input terminal. By providing the connection resistance between the enable signal input terminal and the preset potential input terminal, when the enable signal input terminal is poorly connected due to impurities, the enable signal can be input through the preset potential input terminal.
Drawings
In order to illustrate the embodiments or the technical solutions in the prior art more clearly, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the invention, and it is obvious for a person skilled in the art that other drawings can be obtained according to these drawings without creative efforts.
Fig. 1 is a schematic view of a first structure of an array substrate according to an embodiment of the present invention;
fig. 2 is a schematic view of a second structure of an array substrate according to an embodiment of the present invention;
fig. 3 is a schematic diagram illustrating a first position of a connection resistor in an array substrate according to an embodiment of the invention;
fig. 4 is a schematic diagram of a second position of a connection resistor in an array substrate according to an embodiment of the invention.
Detailed Description
The following description of the various embodiments refers to the accompanying drawings that illustrate specific embodiments in which the invention may be practiced. The directional terms mentioned in the present invention, such as [ upper ], [ lower ], [ front ], [ rear ], [ left ], [ right ], [ inner ], [ outer ], [ side ], are only referring to the directions of the attached drawings. Accordingly, the directional terms used are used for explanation and understanding of the present invention, and are not used for limiting the present invention. In the drawings, elements having similar structures are denoted by the same reference numerals.
The invention provides an array substrate, which aims to solve the technical problem of poor connection of the conventional array substrate test terminal.
Fig. 1 is a schematic view of a first structure of an array substrate according to an embodiment of the present invention. The array substrate 100 includes an enable signal input terminal 10, a preset potential input terminal 20, and a connection resistor 30. The connection resistor 30 connects the enable signal input terminal 10 and the preset potential input terminal 20, and the resistance value of the connection resistor 30 is a predetermined multiple of the resistance value of the enable signal input terminal 10.
The array substrate 100 includes a display area 101 and a non-display area 102, the enable signal input terminal 10, the preset potential input terminal 20 and the connecting resistor 30 are all located in the non-display area 102, and after the panel test is completed, the panel is cut off when the panel is cut.
The enable signal input terminal 10 is used for inputting an enable signal to control the corresponding thin film transistor to be turned on and off during a panel test. The enable signal input terminal 10 includes at least one of an array substrate test terminal 11 and a display panel test terminal 12, and in the present embodiment, the enable signal input terminal 10 includes the array substrate test terminal 11 and the display panel test terminal 12.
As shown in fig. 1, the connection resistor 30 connects the array substrate test terminal 11 and the preset potential input terminal 20, that is, the connection resistor 30 is provided only between the array substrate test terminal 11 and the preset potential input terminal 20. Of course, the connection resistor 30 may be provided only between the display panel test terminal 12 and the preset potential input terminal 20.
In the manufacturing process of the array substrate, due to certain fluctuation of factors of equipment operation, process environment and mass energy of raw materials, when the fluctuation exceeds the specification of the process, process defects can be generated, the yield of products is influenced, in order to discover and feed back the occurrence of defects of each process link as soon as possible, the process can be improved as soon as possible, the generated defects can be repaired as far as possible, the yield of final output of array manufacturing engineering is improved, and inspection and repair processes are added on a plurality of key process links. Common tests include array substrate test (AT), display panel test (CT), and Module Test (MT).
The array substrate test (AT) is a detection method for finding various bad electricities by uniformly charging all pixels on a panel after an array process is finished and the pixels have complete electrical functional structures, and then detecting and comparing the surface voltage difference and the distribution rule of the pixels by adopting a non-contact sensor.
The display panel test (CT) is a man-machine combination test of electrically driving a liquid crystal display screen performed on-line after cutting liquid crystal cells one by one on a glass substrate.
The Module Test (MT) is a test of the performance of the liquid crystal display screen, the polarizer, the driving IC, the printed circuit board, the driving circuit and the backlight module which are combined together to form the liquid crystal module.
In the production process, the array substrate is firstly tested, then the display panel is tested, and finally the module is tested. An enable signal during the array substrate test is input through the array substrate test terminal 11, and a preset potential signal is input through the preset potential input terminal 20. The enable signal for the display panel test is inputted through the display bread board test terminal 12, and the preset potential signal is inputted through the preset potential input terminal 20.
During testing, the testing device inputs an enable signal through the probe connection enable signal input terminal 10 to control the on and off of the thin film transistor in the array substrate 100, and inputs a preset potential through the probe connection preset potential input terminal 20 to detect the corresponding thin film transistor.
When the array substrate is tested, an enable signal and a preset potential are applied by using a probe contact manner to complete the charging of the panel, and then a sensor (not shown) located above the display area 101 senses the surface electric field intensity of each pixel on the panel, and the electrical defects of the pixels are detected by a voltage comparison method.
When the probe inputs a low potential to the array substrate test terminal 11, the thin film transistor in the array substrate 100 is turned on, and a signal of a preset potential can be input to the thin film transistor, so that the test is normally performed. When the test is completed, the probe inputs a high potential to the array substrate test terminal 11, and the thin film transistor is turned off.
In order to ensure the test accuracy, when the next test is carried out, the thin film transistor of the previous test must be turned off by inputting high potential, so that the test effect of the current time is not influenced.
In the prior art, the enable signal for turning off the thin film transistor is input through the enable signal input terminal 10 on the array substrate 100, but the enable signal input terminal 10 is often connected to the probe poorly due to impurities, so that a high potential signal cannot be input, and the corresponding thin film transistor is not turned off, so that an abnormality occurs on the screen of the array substrate 100 during other tests, and the test result is affected.
According to the invention, the connecting resistor 30 is arranged between the array substrate test terminal 11 and the preset potential input terminal 20, and if the array substrate test terminal 11 is poorly connected with the probe, an enable signal can be input into a high potential through the preset potential input terminal 20, so that a corresponding thin film transistor is turned off, and the condition that a screen is lighted abnormally in other test stages is ensured.
The resistance value of the connection resistor 30 is generally large, being a predetermined multiple of the resistance value of the enable signal input terminal 10. Since the connection resistor 30 is disposed only between the array substrate test terminal 11 and the preset potential input terminal 20 in this embodiment, the resistance value of the connection resistor 30 is greater than or equal to 400 times the resistance value of the array substrate test terminal 11.
When the array substrate is tested, if the array substrate test terminal 11 is connected to the probe well, the probe inputs a low potential through the array substrate test terminal 11, the thin film transistor is turned on, and at the same time, the probe inputs a preset high potential through the preset potential input terminal 20, so that there is a potential difference between both sides of the connecting resistor 30, but since the resistance of the connecting resistor 30 is large, the voltage is released in the form of heat on the connecting resistor 30. Compared with the array substrate test terminal 11, the resistance value of the connection resistor 30 is greater than or equal to 400 times of the resistance value of the array substrate test terminal 11, the resistance of the array substrate test terminal 11 can be ignored, and the divided voltage of the potential difference is basically all on the connection resistor 30, so when the resistance value of the connection resistor 30 is large enough, when the array substrate test terminal 11 is well connected with the probe, the input enable signal of the array substrate test terminal 11 cannot be influenced.
If the array substrate test terminal 11 is not well connected to the probe, the enable signal can be input to a high potential through the preset potential input terminal 20, so that the corresponding thin film transistor is turned off, and it is ensured that the screen is lighted abnormally in the subsequent display panel test and module test stages.
In order to ensure that the resistance of the connection resistor 30 is sufficiently large, polysilicon is generally used for the connection resistor 30. In addition, since the wider the bandgap of the material, the higher the resistivity, the connection resistor 30 may also be made of a wide bandgap material such as indium nitride (InN), gallium nitride (GaN), aluminum nitride (AIN), and alloys thereof.
In practical production, the distance between the array substrate test terminal 11 and the preset potential input terminal 20 is small, and to ensure that the resistance of the connection resistor 30 is large enough, the connection resistor 30 is usually designed to have a waveform as shown in fig. 1, and the waveform is bent back and forth between small intervals to increase the length and increase the resistance. Of course, the connecting resistor 30 may have other shapes, such as at least one of a circular shape, a rectangular shape, or a wave shape.
Through setting up connecting resistance 30, when array substrate test terminal 11 is connected poorly with the probe because of having impurity, enable signal can be through predetermineeing electric potential input terminal 20 input high potential to turn off the thin film transistor of array substrate test stage test, and then guarantee that display panel test and module test stage screen are lighted and are had no unusual.
When the connection resistor 30 connects the display panel test terminal 12 and the preset potential input terminal 20, the principle of operation of the connection resistor 30 is the same as that in the above-described embodiment. By arranging the connecting resistor 30, when the display panel test terminal 12 is badly connected with the probe due to impurities, the enabling signal can input high potential through the preset potential input terminal 20, so that the thin film transistor tested in the test stage of the display panel is turned off, and the condition that a screen is lighted abnormally in the subsequent module test stage is ensured.
Fig. 2 is a schematic view of a second structure of the array substrate according to the embodiment of the invention. The array substrate 100 includes an enable signal input terminal 10, a preset potential input terminal 20, and a connection resistor 30.
In the present embodiment, the connection resistor 30 includes a first connection resistor 31 and a second connection resistor 32, the first connection resistor 31 connects the array substrate test terminal 11 and the preset potential input terminal 20, and the second connection resistor 32 connects the display panel test terminal 12 and the preset potential input terminal 20.
The resistance value of the connection resistor 30 is a predetermined multiple of the resistance value of the enable signal input terminal 10. In this embodiment, the resistance of the first connection resistor 31 is greater than or equal to 400 times the resistance of the array substrate test terminal 11, and the resistance of the second connection resistor 32 is greater than or equal to 400 times the resistance of the display panel test terminal 12.
When the array substrate test is performed, if the array substrate test terminal 11 is well connected to the probe, the probe inputs a low potential through the array substrate test terminal 11 and the thin film transistor is turned on, and at the same time, the probe inputs a preset high potential through the preset potential input terminal 20, so that there is a potential difference across the first connection resistor 31, but since the resistance of the first connection resistor 31 is large, this voltage is thermally released at the first connection resistor 31. Compared with the array substrate test terminal 11, the resistance value of the first connection resistor 31 is greater than or equal to 400 times of the resistance value of the array substrate test terminal 11, the resistance of the array substrate test terminal 11 can be ignored, and the partial voltage of the potential difference is basically all on the first connection resistor 31, so when the resistance value of the first connection resistor 31 is large enough, the input enable signal of the array substrate test terminal 11 cannot be influenced when the array substrate test terminal 11 is well connected with the probe.
If the array substrate test terminal 11 is not well connected to the probe, the enable signal can be input to a high potential through the preset potential input terminal 20, so that the corresponding thin film transistor is turned off, and it is ensured that the screen is lighted abnormally in the subsequent display panel test and module test stages.
Similarly, when the display panel test is performed, if the display panel test terminal 12 is connected to the probe pin well, the probe pin inputs a low potential through the display panel test terminal 12, the thin film transistor is turned on, and at the same time, the probe pin inputs a preset high potential through the preset potential input terminal 20, so that there is a potential difference across the second connection resistor 32, but since the resistance of the second connection resistor 32 is large, the voltage is released in the form of heat at the second connection resistor 32. Compared with the display panel test terminal 12, the resistance value of the second connection resistor 32 is greater than or equal to 400 times of the resistance value of the display panel test terminal 12, the resistance of the display panel test terminal 12 can be ignored, and the divided voltage of the potential difference is basically all on the second connection resistor 32, so when the resistance value of the second connection resistor 32 is large enough, the input enable signal of the display panel test terminal 12 cannot be influenced when the display panel test terminal 12 is well connected with the probe.
If the connection between the test terminal 12 of the display panel and the probe is poor, the enable signal can input a high potential through the preset potential input terminal 20, so that the corresponding thin film transistor is turned off, and the condition that the screen is lighted abnormally in the subsequent module test stage is ensured.
The first connecting resistor 31 and the second connecting resistor 32 may be made of the same material or different materials, and in order to ensure that the resistance of the connecting resistor 30 is sufficiently large, the connecting resistor 30 is usually made of polysilicon or a wide bandgap material. In addition, in practical production, the distance between the array substrate test terminal 11 and the preset potential input terminal 20 is small, and in order to ensure that the resistance of the connection resistor 30 is large enough, the connection resistor 30 is usually designed to have a waveform as shown in fig. 2, and the connection resistor 30 is bent back and forth between small intervals to increase the length and increase the resistance. Of course, the connecting resistor 30 may have other shapes, such as at least one of a circular shape, a rectangular shape, or a wave shape.
The connection resistor 30 is disposed in the array substrate 100 in various ways, taking a top gate structure as an example, as shown in fig. 3, which is a schematic diagram of a first position of the connection resistor according to the embodiment of the present invention. The array substrate 100 includes a substrate 110, an active layer 120, a gate insulating layer 130, a gate layer, an interlayer insulating layer 150, a source drain layer, and a passivation layer 180, which are stacked.
The gate layer is patterned to form the gate electrode 140, the source and drain electrode layers are patterned to form the source electrode 160 and the drain electrode 170, the source electrode 160 is electrically connected to the active layer 120 through a first via hole 161 penetrating the gate insulating layer 130 and the interlayer insulating layer 150, and the drain electrode 170 is electrically connected to the active layer 120 through a second via hole 171 penetrating the gate insulating layer 130 and the interlayer insulating layer 150.
When the connection resistor 30 is a polysilicon material, since the active layer 120 is usually also a polysilicon material, the connection resistor 30 may be disposed on the same layer as the active layer 120, and the connection resistor 30 is located in the non-display region 102 of the array substrate 100, as shown in fig. 3, the first connection resistor 31 and the second connection resistor 32 are both disposed on the same layer as the active layer 120, and the first connection resistor 31 and the second connection resistor 32 may be connected to each other or insulated from each other.
When a panel test is performed, data lines or scan lines are generally divided into several groups and respectively gathered to test terminals in a short circuit manner, and the test terminals may be disposed in the same layer as the corresponding data lines or scan lines.
In one embodiment, the array substrate test terminals 11 and the display panel test terminals 12 are disposed in the same layer.
The array substrate test terminal 11 is connected to a scan line of the array substrate 100, an enable signal is input to control the on and off of the thin film transistor, the display panel test terminal 12 is also connected to the scan line of the array substrate 100, and an enable signal is input to control the on and off of the thin film transistor, so that the array substrate test terminal 11 and the display panel test terminal 12 can be disposed in the same layer as the gate electrode 140, that is, the gate layer is patterned to form the gate electrode 140, the array substrate test terminal 11 and the display panel test terminal 12, wherein the gate electrode 140 is located in the display area 101 of the array substrate 100, and the array substrate test terminal 11 and the display panel test terminal 12 are located in the non-display area 102.
Of course, the arrangement manner of the array substrate test terminal 11 and the display panel test terminal 12 is not limited to this, and the array substrate test terminal 11 and the display panel test terminal 12 may be arranged on the surface of the array substrate 100 or on another layer, or the array substrate test terminal 11 and the display panel test terminal 12 are arranged on different layers, and the scan line in the array substrate 100 may be connected to the corresponding enable signal input terminal 10 through a via hole.
The preset potential input terminal 20 inputs the preset potential after the thin film transistor is turned on, so the array substrate test terminal 11 may be disposed in the same layer as the source 160 and the drain 170, that is, the source and drain layers are patterned to form the source 160, the drain 170 and the preset potential input terminal 20, wherein the source 160 and the drain 170 are located in the display area 101 of the array substrate 100, and the preset potential input terminal 20 is located in the non-display area 102.
The array substrate test terminal 11 is connected to the first connection resistor 31 through a third via hole 111 formed in the gate insulating layer 130, and the preset potential input terminal 20 is connected to the first connection resistor 31 through a fourth via hole 121 formed in the interlayer insulating layer 150.
The display panel test terminal 12 is connected to the second connection resistor 32 through a fifth via 112 formed in the gate insulating layer 130, and the preset potential input terminal 20 is connected to the second connection resistor 32 through a sixth via 122 formed in the interlayer insulating layer 150.
Fig. 4 is a schematic diagram of a second position of a connection resistor in an array substrate according to an embodiment of the invention. The array substrate 100 includes a substrate 110, an active layer 120, a gate insulating layer 130, a gate layer, an interlayer insulating layer 150, a source drain layer, and a passivation layer 180, which are stacked.
The structure is different from that of fig. 3 in that the first connection resistor 31 and the second connection resistor 32 are both disposed on the surface of the array substrate 100.
The array substrate test terminal 11 is connected to the first connection resistor 31 through a seventh via hole 113 formed in the interlayer insulating layer 150 and the passivation layer 180, and the preset potential input terminal 20 is connected to the first connection resistor 31 through an eighth via hole 123 formed in the passivation layer 180.
The display panel test terminal 12 is connected to the second connection resistor 33 through a ninth via hole 114 formed in the interlayer insulating layer 150 and the passivation layer 180, and the preset potential input terminal 20 is connected to the second connection resistor 32 through a tenth via hole 124 formed in the passivation layer 180.
Of course, the arrangement manner of the connection resistor 30 is not limited thereto, and the first connection resistor 31 and the second connection resistor 32 may be disposed in different layers of the array substrate 100, for example, the first connection resistor 31 is disposed on the surface of the array substrate 100, and the second connection resistor 32 is disposed in the same layer as the active layer 120 of the array substrate 100.
The top gate structure is illustrated in fig. 3 and 4, but the arrangement of the connection resistor 30 is also applicable to other types of structures such as the top gate structure.
By arranging the first connecting resistor 31, when the array substrate test terminal 11 is poorly connected with the probe due to impurities, the enable signal can input a high potential through the preset potential input terminal 20, so that the thin film transistor tested in the array substrate test stage is turned off, and the condition that the screen is lighted abnormally in other test stages is ensured. By arranging the second connecting resistor 32, when the display panel test terminal 12 is not well connected with the probe due to impurities, the enable signal can input high potential through the preset potential input terminal 20, so that the thin film transistor tested in the test stage of the display panel is turned off, and the condition that the screen is lighted abnormally in other test stages is ensured.
The invention also provides a display panel, which comprises an array substrate, wherein the array substrate comprises an enabling signal input terminal, a preset potential input terminal and a connecting resistor. The connecting resistor is connected with the enabling signal input terminal and the preset potential input terminal, and the resistance value of the connecting resistor is a preset multiple of the resistance value of the enabling signal input terminal.
In one embodiment, the material of the connecting resistor is polysilicon.
In one embodiment, the material of the connecting resistor is a wide bandgap material.
In one embodiment, the resistance of the connection resistor is greater than or equal to 400 times the resistance of the enable signal input terminal.
In one embodiment, the connection resistor is at least one of circular, rectangular, or wave shaped.
In one embodiment, the connection resistor is disposed on the same layer as the active layer of the array substrate.
In one embodiment, the connection resistor is disposed on the surface of the array substrate, and the enable signal input terminal and the preset potential input terminal are connected through a via hole.
In one embodiment, the enable signal input terminal includes at least one of an array substrate test terminal and a display panel test terminal.
In one embodiment, the connection resistor includes a first connection resistor and a second connection resistor, the first connection resistor connects the array substrate test terminal and the preset potential input terminal, and the second connection resistor connects the display panel test terminal and the preset potential input terminal.
In one embodiment, the array substrate test terminals and the display panel test terminals are arranged in the same layer.
According to the above embodiments:
the invention provides an array substrate and a display panel, wherein the array substrate comprises an enabling signal input terminal, a preset potential input terminal and a connecting resistor, wherein the enabling signal input terminal is used for inputting an enabling signal when the panel is tested; the preset potential input terminal is used for inputting a preset potential during panel testing; the connecting resistor is connected with the enabling signal input terminal and the preset potential input terminal, and the resistance value of the connecting resistor is a preset multiple of the resistance value of the enabling signal input terminal. By providing the connection resistance between the enable signal input terminal and the preset potential input terminal, when the enable signal input terminal is poorly connected due to impurities, the enable signal can be input through the preset potential input terminal.
In summary, although the present invention has been described with reference to the preferred embodiments, the above-described preferred embodiments are not intended to limit the present invention, and those skilled in the art can make various changes and modifications without departing from the spirit and scope of the present invention, therefore, the scope of the present invention shall be determined by the appended claims.
Claims (8)
1. An array substrate, comprising:
an enable signal input terminal for inputting an enable signal when performing a panel test;
the preset potential input terminal is used for inputting a preset potential during panel testing;
the connecting resistor is connected with the enabling signal input terminal and the preset potential input terminal, and the resistance value of the connecting resistor is a preset multiple of the resistance value of the enabling signal input terminal; the connecting resistor is arranged on the surface of the array substrate or arranged on the same layer with the active layer of the array substrate, and the connecting resistor is connected with the enable signal input terminal and the preset potential input terminal through a via hole.
2. The array substrate of claim 1, wherein the material of the connection resistor is polysilicon.
3. The array substrate of claim 1, wherein the connection resistor is made of a wide bandgap material.
4. The array substrate of claim 1, wherein the connection resistor has a resistance greater than or equal to 400 times a resistance of the enable signal input terminal.
5. The array substrate of claim 1, wherein the connection resistor is at least one of circular, rectangular or wave-shaped.
6. The array substrate of claim 1, wherein the enable signal input terminal comprises at least one of an array substrate test terminal and a display panel test terminal.
7. The array substrate of claim 6, wherein the connection resistor comprises a first connection resistor and a second connection resistor, the first connection resistor connects the array substrate test terminal and the preset potential input terminal, and the second connection resistor connects the display panel test terminal and the preset potential input terminal.
8. The array substrate of claim 7, wherein the array substrate test terminals and the display panel test terminals are disposed in a same layer.
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910670588.4A CN110491318B (en) | 2019-07-24 | 2019-07-24 | Array substrate |
| US16/630,447 US11043159B2 (en) | 2019-07-24 | 2019-10-16 | Array substrate and display panel |
| PCT/CN2019/111470 WO2021012415A1 (en) | 2019-07-24 | 2019-10-16 | Array substrate and display panel |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910670588.4A CN110491318B (en) | 2019-07-24 | 2019-07-24 | Array substrate |
Publications (2)
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| WO2021012415A1 (en) | 2021-01-28 |
| CN110491318A (en) | 2019-11-22 |
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