CN117991141A - High-voltage ripple testing system and frequency sweeping method thereof - Google Patents
High-voltage ripple testing system and frequency sweeping method thereof Download PDFInfo
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- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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Abstract
The invention provides a high-voltage ripple test system and a frequency sweeping method thereof, which relate to the field of electric automobile high-voltage system test. The resonance point amplitude increasing protection strategy provided by the invention solves the problems of judging the resonance frequency point and sweeping frequency at the LC resonance frequency, so that the test process is safer and more reliable, and the experimental risk of the electric performance test of the automobile high-voltage component is effectively reduced.
Description
Technical Field
The invention relates to the field of high-voltage system testing of electric automobiles, in particular to a high-voltage ripple testing system and a frequency sweeping method thereof.
Background
The ripple exists in the output voltage of the switching power supply, along with the expansion of the application range of the charger in recent years, relevant standards are formulated for the ripple of the direct current power supply in the country and the inside and outside of the industry, and particularly, a high-voltage direct current ripple power supply test is required for the new energy automobile industry to simulate the situation that the ripple is generated in an in-car electric system in the starting and stopping processes of a motor and an auxiliary motor under the actual condition.
The existing ripple power supply technology can realize the function of superposing ripples on direct current voltage, but lead parasitic inductance in a ripple test system and capacitive load in a DUT (device under test) can form LC resonance, but on one hand, resonance points cannot be judged, and on the other hand, system oscillation, test interruption or equipment damage are easily caused by undefined resonance points and unknown resonance points out of sweep frequency.
Disclosure of Invention
The invention aims to provide a high-voltage ripple test system and a frequency sweeping method thereof, which can judge resonant frequency points in the test system with high-frequency ripple sampling separation, and provide a corresponding protection strategy to avoid system oscillation.
The invention aims to achieve the aim, and the aim is achieved by the following technical scheme:
The high-voltage ripple test system comprises a high-voltage high-power direct-current power supply, a ripple generator, a coupling transformer, a voltage sampling conditioning circuit, a decoupling unit and a tested object DUT, wherein the high-voltage high-power direct-current power supply provides a bus direct-current voltage;
The decoupling unit comprises a direct current decoupling inductor L1, a direct current decoupling capacitor C1, a high-frequency decoupling resistor R, a first high-frequency decoupling capacitor C2 and a second high-frequency decoupling capacitor C3, wherein one end of the L1 is connected with a bus direct current voltage negative output terminal, the other end of the L1 is connected with a negative voltage of a measured object, one end of the C1 is connected with a secondary side a end of a coupling transformer, the other end of the C2 is connected with a negative voltage of the measured object, one end of the C2 is connected with a secondary side B end of the coupling transformer, the other end of the C3 is connected with a negative voltage of the measured object, one end of the R is connected with the C2, the other end of the R is connected with a secondary side B end of the coupling transformer, and primary side A ends and B ends corresponding to the secondary side a ends of the coupling transformer are respectively connected with an L output end and an N output end of a ripple generator.
A sweep frequency method of a high-voltage ripple test system is realized based on the system, firstly, a fixed-amplitude full-frequency band sweep frequency is carried out, and a resonance frequency point fc of a resonance network formed by parasitic inductances Ls2, ls5 and C DUT is determined; then, the amplitude of the resonance frequency point fc is gradually increased to sweep, the parasitic inductance Ls2 is the parasitic inductance of the positive voltage connecting wire of the secondary side b of the coupling transformer and the measured object, the parasitic inductance Ls5 is the parasitic inductance of the negative voltage connecting wire of the C2 and the measured object, C DUT is the capacitive load of the measured object, and the parasitic inductances Ls2, ls5 and C DUT form an LC resonance network.
Further, the method for determining the resonance frequency point fc is as follows: and controlling the ripple voltage on the measured object to be fixed in amplitude, sweeping at a set amplitude point, and recording the sweep frequency f and the given value usAMP of the ripple generator in the sweep process, wherein the frequency at the minimum of the usAMP is fc.
Further, the specific determination method of the resonance frequency point fc is as follows:
setting a sweep voltage amplitude Vamp, a sweep initial frequency f0 and a sweep maximum fmax, wherein an initial minimum amplitude usmin =32767 and i=0;
The frequency f of the sweep frequency starts from f0, n periodic sine waves are output every time of the sweep frequency, the amplitude usi of the periodic sine waves is calculated, the minimum amplitude usmin =min [ usi, usmin ] is taken, and fc= fusmin, fusmin is the frequency when the given voltage amplitude is minimum;
let i=i+1, f=f+fy, fy >0, if f is equal to or greater than fmax, output resonance frequency fc, sweep is completed; if f is less than fmax, the sweep is continued.
Preferably, f0 is 10hz, fmax is 150khz, fy=5, n=5.
Further, the method for increasing the frequency sweep amplitude at the resonance frequency point fc comprises the following steps:
setting the sweep frequency to fc, wherein the sweep initial amplitude usmin =1, pmax=0 and i=0;
The sweep amplitude us starts sweep from the initial amplitude usmin, m periodic sine waves are output every sweep, the output power Pi=U DUTi* I is calculated, and the maximum value Pmax=max [ Pi, pmax ]; u DUTi is the effective value of the voltage on the DUT of the ith sweep frequency measured object, and I is the effective value of the current corresponding to U DUTi.
Let us=us+uy, i=i+1, uy >0, if Pmax is greater than or equal to rated power Pe, or I is greater than or equal to rated current Ie, outputting maximum sweep amplitude usmax of the resonance point, and completing sweep; if Pmax is less than rated power Pe and I is less than rated current Ie, the sweep is continued.
Preferably uy=1, m=5.
The invention has the advantages that: a set of high-voltage direct-current ripple power supply test circuit system is designed, so that alternating current components can be separated accurately, and a high-power high-voltage direct-current power supply can be decoupled;
aiming at the new circuit system, a resonance point amplitude increasing protection strategy is provided, so that the problems of judging the resonance frequency point and sweeping frequency at the LC resonance frequency are solved, and the testing process is safer and more reliable;
The experimental risk of the electrical performance test of the automobile high-voltage component is effectively reduced, and the safety and reliability of the system are improved.
Drawings
FIG. 1 is a schematic diagram of circuitry in accordance with the present invention;
Fig. 2 is a schematic diagram of determining resonance points of a resonance network composed of parasitic inductances Ls2, ls5 and C DUT according to the present invention;
FIG. 3 is a flow chart of a method for determining a resonance point according to the present invention;
FIG. 4 is a flow chart of a method for sweeping frequency at a resonance frequency point according to the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention.
Example 1
The embodiment provides a high-voltage ripple test system, please refer to fig. 1, which comprises a high-voltage high-power direct-current power supply, a ripple generator, a coupling transformer, a voltage sampling conditioning circuit, a decoupling unit and a tested object DUT, wherein the high-voltage high-power direct-current power supply provides a bus direct-current voltage, a bus direct-current voltage negative output terminal is connected with the decoupling unit, a secondary side a end of the coupling transformer is connected with a bus direct-current voltage positive output terminal udc+, a secondary side b is connected with a tested object positive voltage, both positive and negative voltages of the tested object DUT are connected with the voltage sampling conditioning circuit, and the voltage sampling conditioning circuit is connected with the ripple generator.
The decoupling unit comprises a direct current decoupling inductor L1, a direct current decoupling capacitor C1, a high-frequency decoupling resistor R, a first high-frequency decoupling capacitor C2 and a second high-frequency decoupling capacitor C3, wherein one end of the L1 is connected with a busbar direct current voltage negative output terminal Udc-and the other end of the L1 is connected with a negative voltage of a measured object, one end of the C1 is connected with a secondary side a end of a coupling transformer TR, the other end of the C1 is connected with a negative voltage of the measured object, one end of the C2 is connected with one end of the R, one end of the C3 is connected with a secondary side B end of the coupling transformer, the other end of the C3 is connected with a negative voltage of the measured object, and the other end of the R is connected with a secondary side B end of the coupling transformer, and primary side A ends and B ends corresponding to the secondary side a end and B ends of the coupling transformer are respectively connected with an L output end and an N output end of a ripple generator.
The voltage sampling conditioning circuit comprises a differential amplifying circuit and an alternating current-direct current separating circuit: the differential amplifying circuit comprises resistors Ri1, ri2, rf1 and Rf2 and a second operational amplifier, wherein a positive voltage UDUT + of a measured object is connected with an inverting input end of the second operational amplifier through the resistor Ri1, a negative voltage UDUT-of the measured object is connected with a non-inverting input end of the second operational amplifier through the resistor Ri2, the non-inverting input end of the second operational amplifier is grounded after being connected with the resistor Rf2, and the resistor Rf1 is connected between the inverting input end and the output end in series.
The alternating current-direct current separation circuit comprises a first operational amplifier, an integrator and an inverting amplifier; the non-inverting input end of the first operational amplifier is connected with the output end of the differential amplifying circuit through a resistor R11, the output end of the first operational amplifier is connected with the inverting input end of the integrator through a resistor R23, a capacitor C is connected in series between the inverting input end and the output end of the integrator, the output end of the first operational amplifier is connected with the non-inverting input end of the follower, the inverting input end and the output end of the follower are in short circuit, the output end of the follower is connected with the inverting input end of the inverting amplifier through a resistor R22, a resistor R21 is connected between the inverting input end and the output end of the inverting amplifier in series, the non-inverting input end of the inverting amplifier is grounded, the output end of the first operational amplifier is connected with the inverting input end of the first operational amplifier through a resistor R13, and a resistor R12 is connected between the inverting input end and the output end of the first operational amplifier in series.
Example 2
The embodiment provides a sweep method of a high-voltage ripple test system aiming at the circuit system of the embodiment 1, which comprises the steps of firstly fixing an amplitude full-frequency band sweep, and determining a resonance frequency point fc of a resonance network formed by parasitic inductances Ls2, ls5 and C DUT; and then the amplitude of the frequency sweep at the resonance frequency point fc is gradually increased, so that system oscillation, experiment interruption or equipment damage caused by undefined resonance points and excessive amplitude of the frequency sweep at unknown resonance points can be avoided.
The parasitic inductance Ls1 is the parasitic inductance of a lead wire connected between the positive output of the bus DC voltage and the end a of the secondary side of the coupling transformer, the parasitic inductance Ls2 is the parasitic inductance of a positive voltage connecting lead wire of the secondary side b of the coupling transformer and the tested object, the parasitic inductance Ls3 is the parasitic inductance of a negative output terminal Udc-of the bus DC voltage and a lead wire L1, the parasitic inductance Ls4 is the parasitic inductance of a negative voltage UDUT-connecting lead wire of the L1 and the tested object, the parasitic inductance Ls5 is the parasitic inductance of a negative voltage connecting lead wire of the C2 and the tested object, the C DUT is the capacitive load of the tested object, and the parasitic inductances Ls2, ls5 and C DUT form an LC resonance network.
The resonance point amplitude increasing protection strategy comprises the following two steps:
In a first step, a resonance point fc of the resonance network composed of parasitic inductances Ls2, ls5 and C DUT is determined.
The inductances Ls2 and Ls5 and the capacitive load C DUT of the measured object form an LC resonance network, because the parasitic inductance increases Ls2 and Ls5 to be the parasitic parameters of the connecting wires of the experimental system, the inductance is unknown, and the resonance frequencies of different experimental systems Ls2, ls5 and C DUT are different, so that the resonance frequency of the resonance system needs to be tested. In a first step, a resonance point fc of the resonance network composed of parasitic inductances Ls2, ls5 and C DUT is determined.
The parasitic inductances Ls2 and Ls5 and the capacitive load C DUT of the measured object form an LC resonance network, and because the parasitic inductance values Ls2 and Ls5 are parasitic parameters of the connecting wires of the experimental system, the inductance values are unknown, and the different experimental systems Ls2, ls5 and C DUT are different, the resonance frequency of the resonance system needs to be tested. Referring to fig. 2 for determining the principle, the first curve in the graph is a gain-frequency baud plot of LC filtering composed of parasitic inductances Ls2, ls5 and C DUT, and in the frequency increasing process from 0 to fc, the amplification factor of the signal by the LC link composed of parasitic inductances Ls2, ls5 and C DUT gradually increases, and reaches the maximum at the resonance frequency fc, and after fc, the amplification factor of the signal by the LC link gradually decreases. The third curve is a graph of the amplitude udutAMP of the ac ripple voltage on the DUT to be measured versus frequency, and the full frequency band controls the ripple amplitude on the DUT to be measured to remain unchanged. The second curve is a plot of the voltage amplitude uabAMP across the secondary ab versus frequency of the coupling transformer, where the gain of LC is maximum and the voltage amplitude uabAMP across the secondary ab is minimum at the resonance point. The fourth curve is the relationship of the ripple generator set point usAMP to frequency, where the gain of the LC is maximum and the ripple generator set point usAMP is minimum. At the resonance point, the relation between the gain of the resonance network and the amplitude of the modulation wave us of the ripple generator is embodied, the amplitude of the ripple voltage on the measured object is controlled to be fixed, the frequency is swept within the range of 10Hz-150kHz, the gain of the LC resonance network is maximum near the resonance point, the voltage amplitude uabAMP between ab is minimum, the given value usAMP of the ripple generator is minimum, and the frequency f and usAMP at the minimum position of the usAMP, namely the LC resonance frequency fc, are recorded in the frequency sweeping process.
The specific flow of determination is shown in fig. 3.
S1.1, setting a sweep frequency voltage amplitude Vamp, wherein Vamp is a predicted value, and ensuring that rated power and rated voltage cannot be exceeded under the amplitude;
s1.2, the initial frequency f0=10 Hz of the sweep, the initial minimum amplitude usmin =32767, and i=0;
S1.3, setting a sweep frequency f, and starting sweep frequency;
S1.4, outputting 5 periodic sine waves at each sweep frequency, calculating the amplitude usi of the periodic sine waves, and taking the minimum amplitude usmin =min [ usi, usmin ], wherein fc= fusmin, fusmin is the frequency at which the given voltage amplitude is minimum;
S1.5, let i=i+1, f=f+5;
s1.6, if f is greater than or equal to 150kHz, outputting a resonance frequency fc, and finishing frequency sweep; if f is less than fmax, the process returns to S1.3 to continue the sweep.
In the second step, the frequency is swept by increasing the amplitude at the resonance frequency point fc of the resonance networks Ls2, ls5 and C DUT, and the method is shown in fig. 4.
S2.1, setting sweep frequency as the determined fc;
s2.2, sweep initial amplitude usmin =1, pmax=0, i=0;
S2.3, setting a sweep frequency amplitude us, and starting sweep frequency;
S2.4, outputting sine waves of 5 periods every sweep frequency, calculating output power Pi=U DUTi* I, and taking a maximum value Pmax=max [ Pi, pmax ]; u DUTi is the effective value of the voltage on the DUT of the ith sweep frequency measured object, and I is the effective value of the current corresponding to U DUTi.
S2.5, let us=us+1, i=i+1;
s2.6, if Pmax is larger than or equal to rated power Pe or I is larger than or equal to rated current Ie, outputting maximum sweep amplitude usmax of a resonance point, and completing sweep; if Pmax is less than rated power Pe and I is less than rated current Ie, then the process returns to S2.3 to continue the sweep.
Finally, it should be noted that: the foregoing description of the preferred embodiments of the invention is not intended to limit the invention to the precise form disclosed, and any such modifications, equivalents, and alternatives falling within the spirit and principles of the invention are intended to be included within the scope of the invention.
Claims (7)
1. The high-voltage ripple test system is characterized by comprising a high-voltage high-power direct-current power supply, a ripple generator, a coupling transformer, a voltage sampling conditioning circuit, a decoupling unit and a tested object DUT, wherein the high-voltage high-power direct-current power supply provides a bus direct-current voltage;
The decoupling unit comprises a direct current decoupling inductor L1, a direct current decoupling capacitor C1, a high-frequency decoupling resistor R, a first high-frequency decoupling capacitor C2 and a second high-frequency decoupling capacitor C3, wherein one end of the L1 is connected with a bus direct current voltage negative output terminal, the other end of the L1 is connected with a negative voltage of a measured object, one end of the C1 is connected with a secondary side a end of a coupling transformer, the other end of the C2 is connected with a negative voltage of the measured object, one end of the C2 is connected with a secondary side B end of the coupling transformer, the other end of the C3 is connected with a negative voltage of the measured object, one end of the R is connected with the C2, the other end of the R is connected with a secondary side B end of the coupling transformer, and primary side A ends and B ends corresponding to the secondary side a ends of the coupling transformer are respectively connected with an L output end and an N output end of a ripple generator.
2. A frequency sweep method of a high-voltage ripple test system based on the system implementation of claim 1, characterized in that the frequency sweep of a full frequency band with fixed amplitude is firstly carried out, and a resonance frequency point fc of a resonance network formed by parasitic inductances Ls2, ls5 and C DUT is determined; then the amplitude value at the resonance frequency point fc is increased and swept; the parasitic inductance Ls2 is a parasitic inductance of a positive voltage connecting wire of the secondary side b of the coupling transformer and the measured object, the parasitic inductance Ls5 is a parasitic inductance of a negative voltage connecting wire of the C2 and the measured object, C DUT is a capacitive load of the measured object, and the parasitic inductances Ls2, ls5 and C DUT form an LC resonance network.
3. The method for sweeping a Gao Yawen wave test system according to claim 2, wherein the method for determining the resonance frequency point fc is: and controlling the ripple voltage on the measured object to be fixed in amplitude, sweeping at a set amplitude point, and recording the sweep frequency f and the given value usAMP of the ripple generator in the sweep process, wherein the frequency at the minimum of the usAMP is fc.
4. A method for scanning a Gao Yawen wave test system according to claim 3, wherein the method for determining the resonance frequency point fc is:
setting a sweep voltage amplitude Vamp, a sweep initial frequency f0 and a sweep maximum fmax, wherein an initial minimum amplitude usmin =32767 and i=0;
The frequency f of the sweep frequency starts from f0, n periodic sine waves are output every time of the sweep frequency, the amplitude usi of the periodic sine waves is calculated, the minimum amplitude usmin =min [ usi, usmin ] is taken, and fc= fusmin, fusmin is the frequency when the given voltage amplitude is minimum;
let i=i+1, f=f+fy, fy >0, if f is equal to or greater than fmax, output resonance frequency fc, sweep is completed; if f is less than fmax, the sweep is continued.
5.A method of sweeping a Gao Yawen wave test system according to claim 4, wherein f0 is 10hz, fmax is 150khz, fy=5, n=5.
6. The method for sweeping the Gao Yawen wave test system as defined in claim 2, wherein the method for sweeping the frequency at the resonance frequency point fc in an incremental manner is as follows:
setting the sweep frequency to fc, wherein the sweep initial amplitude usmin =1, pmax=0 and i=0;
The sweep amplitude us starts sweep from the initial amplitude usmin, m periodic sine waves are output every sweep, the output power Pi=U DUTi* I is calculated, and the maximum value Pmax=max [ Pi, pmax ]; u DUTi is the effective value of the voltage on the DUT of the ith sweep frequency measured object, and I is the effective value of the current corresponding to U DUTi;
Let us=us+uy, i=i+1, uy >0, if Pmax is greater than or equal to rated power Pe, or I is greater than or equal to rated current Ie, outputting maximum sweep amplitude usmax of the resonance point, and completing sweep; if Pmax is less than rated power Pe and I is less than rated current Ie, the sweep is continued.
7. A method of sweeping a Gao Yawen wave test system according to claim 6, wherein uy = 1 and m = 5.
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| CN117991141B (en) | 2024-08-06 |
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