CN116682479A - Method and system for testing enterprise-level solid state disk time delay index - Google Patents
Method and system for testing enterprise-level solid state disk time delay index Download PDFInfo
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Abstract
The invention provides a method and a system for testing time delay indexes of an enterprise-level solid state disk, which can perform standardized test on various time delay indexes of the enterprise-level solid state disk and obtain a comprehensive time delay index graph, and are used for judging the distribution rule of the time delay indexes of the enterprise-level solid state disk, so that the time delay indexes of the enterprise-level solid state disk are visualized and the stability of the time delay indexes can be judged.
Description
Technical Field
The invention relates to the technical field related to enterprise-level solid state disks, in particular to a method and a system for testing delay indexes of enterprise-level solid state disks.
Background
The hard disk delay refers to the time that a single read-write operation is handled by the solid state disk. For example: one memory system that can handle 1000 read and write operations per second and has an average latency of 10 milliseconds is better in application performance than another memory system that can handle 5000 read and write operations per second but has an average latency of 50 milliseconds.
For consumer-grade hard disks, the user has low requirements for hard disk delay. However, for enterprise-level hard disks, enterprise applications such as databases, data centers, OLTP (Online Transaction Processing ) are sensitive to latency requirements, such as BAT (hundred degrees, alembic, tech.) internet applications, where latency is related to user experience and internet application speed. This type of application is not very sensitive to IOPS and throughput, but rather is latency-critical (including an average latency, maximum latency, or quality of service indicator).
In the aspect of testing enterprise-level solid state disks, the IOPS and throughput of the solid state disks are basically tested, and only average time delay is recorded in the test of time delay indexes. But in addition to the average latency there are many other parameters describing the latency performance of the hard disk, such as: the delay profile, maximum delay, qoS quality of service (including 99.9% confidence, 99.99% confidence, 99.999% confidence) for each IO. The current industry does not have a testing method specific to each time delay index of the solid state disk.
In view of the above-mentioned drawbacks, there is a need to design a method and a system for testing delay indexes of enterprise-level solid state disk to meet the requirements of industrial production testing.
Disclosure of Invention
In order to solve the problems mentioned in the foregoing, the invention provides a method and a system for testing the time delay index of an enterprise-level solid state disk, which can perform standardized test on each time delay index of the enterprise-level solid state disk and obtain a comprehensive time delay index graph, and the comprehensive time delay index graph is used for judging the distribution rule of the time delay index of the enterprise-level solid state disk, so that the time delay index of the enterprise-level solid state disk is visualized and the stability of the time delay index can be judged.
The technical scheme is as follows:
a method for testing the time delay index of an enterprise-level solid state disk is characterized by comprising the following steps: the method comprises the following steps:
step S10, building an experimental environment and installing a tested solid state disk;
step 11, safely erasing the whole disk to restore the solid state disk to a factory state, and preprocessing;
step s12, circularly running the same work load as step s14, and starting steady-state verification;
step s13, judging steady-state verification, and if the judgment is passed, performing a step s14; otherwise, repeating the step s12 until the steady-state verification judgment of the step s13 is passed;
step s14, operating the workload, recording the response time of each IO, namely the time delay time, and acquiring a time delay index;
and step S15, counting the number of IO completed by integrating different response times, calculating the confidence level of each time point, and drawing a time delay index chart.
Further, the preprocessing in step s11 specifically includes: thread, queue depth, block size, and full disk sequential write pass are set.
Further, the same workload in step s12, specifically, thread, queue depth, block size, and read/write format remain consistent.
Further, the determination of the steady state verification in step s13 specifically includes: selecting 5 continuous working cycles in the step s12, acquiring average time delay data of each working cycle, obtaining a Slope data fitting line of the average time delay data, and if the offset of the average time delay data is lower than or equal to 20% and the Slope data fitting line is lower than or equal to 10%, then the tested solid state disk is in a steady state, and performing a step s14; otherwise, the tested solid state disk is not in a steady state, and the step s12 is repeated until the steady state verification judgment of the step s13 is passed.
Further, the delay index in step s14 includes: average delay, maximum delay, 99.9% confidence level delay, 99.99% confidence level delay, 99.999% confidence level delay.
Further, the time delay index map in step s15 includes a first ordinate, a second ordinate and an abscissa; the first ordinate represents the number of IOs for which the time delay is completed, the second ordinate represents the confidence level of the time delay, and the abscissa represents the time delay time; the time delay index diagram also shows an average time delay, a confidence level of 99.9 percent time delay, a confidence level of 99.99 percent time delay, a confidence level of 99.999 percent time delay and a confidence level line diagram.
Based on the method, the invention also provides a system for testing the time delay index of the enterprise-level solid state disk, which is characterized in that: the system comprises: the system comprises a server platform and a computer PC end, wherein the server platform and the computer PC end are connected through a network interface.
Further, the server platform comprises a server platform processor, a server platform memory, a server platform network interface, a server platform operating system, a time delay test script and a tested solid state disk; the PC end of the computer comprises a PC end processor, a PC end memory, a PC end network interface, a PC end operating system and EXCEL software.
Further, the delay test script includes: the system comprises a preprocessing module, a log information collection module, a steady-state verification module, a time delay load module and a data statistics module.
Furthermore, the EXCEL software is used for sorting data output by the time delay test script and drawing a time delay index chart.
The beneficial effects of the invention are as follows:
1. according to the method, the standardized testing flow is established, the testing of each time delay index is completed, and a comprehensive time delay index diagram is obtained and is used for judging the distribution rule of the time delay indexes of the enterprise-level solid state disk, so that the time delay indexes of the enterprise-level solid state disk are visualized, and the stability of the time delay indexes can be further judged.
2. Before the time delay index test data are acquired, the steady-state verification and judgment of the solid state disk are carried out, so that performance measurement in a steady-state area is ensured, the acquired test result can represent the performance of the solid state disk in the normal service life period of the solid state disk, and the accuracy of the test result is improved.
3. The server platform and the computer PC end in the test system are connected through the network interface, so that the test system can remotely test the time delay indexes of the enterprise-level solid state disks with different specifications on different servers, and the practicability of the test system is improved.
Drawings
FIG. 1 is a flow chart of the testing method of the present invention.
FIG. 2 is a graph of steady state verification determination data according to the present invention.
Fig. 3 is a time delay index diagram of an embodiment of the present invention.
FIG. 4 is a schematic diagram of a test system according to the present invention.
Fig. 5 is a schematic diagram of a delay test script architecture according to the present invention.
Detailed Description
The invention is further described below with reference to examples.
The following examples are illustrative of the present invention but are not intended to limit the scope of the invention. The conditions in the examples can be further adjusted according to specific conditions, and simple modifications of the method of the invention under the premise of the conception of the invention are all within the scope of the invention as claimed.
Examples
As shown in fig. 1, a method for testing a delay index of an enterprise-level solid state disk includes the following steps:
step s10, building an experimental environment and installing the tested solid state disk.
And step 11, safely erasing the whole disk to restore the solid state disk to a factory state, and preprocessing the solid state disk. The pretreatment specifically comprises the following steps: thread, queue depth, block size, and full disk sequential write pass are set.
Step s12, the same workload as step s14 is cyclically run, and steady-state verification is started. Because of a typical solid state disk device, it is typically subjected to a brief period of high performance after just being unpacked for use and exposed to a workload, and then transitions to steady state performance. Performance testing requires ensuring that performance measurements are made in the steady-state region, representing the performance of the device during its normal operating life. The same workload specifically refers to thread, queue depth, block size, read-write format keeping consistent.
Step s13, judging steady-state verification, and if the judgment is passed, performing a step s14; otherwise, repeating the step s12 until the steady-state verification judgment of the step s13 is passed.
As shown in fig. 2, the abscissa is the number of cycles, the ordinate is time, the Average time delay of each cycle load task is recorded, namely the Lat line in the graph, the Average value of the time delays from the cycle 21 to the cycle 25 is calculated, namely the Average line in the graph, 90% of the Average value is the 90% Average line in the graph, 110% of the Average value is the 110% Average line in the graph, and the linear (Lat) of the time delay Slope data fitting line from the cycle 21 to the cycle 25 is simulated.
The judgment of the steady state verification is specifically as follows: selecting 5 continuous working cycles in the step s12, acquiring average time delay data of each working cycle, obtaining a Slope data fitting line of the average time delay data, and if the offset of the average time delay data is lower than or equal to 20% and the Slope data fitting line is lower than or equal to 10%, then the tested solid state disk is in a steady state, and performing a step s14; otherwise, the tested solid state disk is not in a steady state, and the step s12 is repeated until the steady state verification judgment of the step s13 is passed.
Step s14, operating the workload, recording the response time of each IO, namely the time delay time, and obtaining the time delay index. The delay index comprises: average delay, maximum delay, 99.9% confidence level delay, 99.99% confidence level delay, 99.999% confidence level delay.
And step S15, counting the number of IO completed by integrating different response times, calculating the confidence level of each time point, and drawing a time delay index chart.
The time delay index graph comprises a first ordinate, a second ordinate and an abscissa; the first ordinate represents the number of IOs for which the time delay is completed, the second ordinate represents the confidence level of the time delay, and the abscissa represents the time delay time; the time delay index diagram also shows an average time delay, a confidence level of 99.9 percent time delay, a confidence level of 99.99 percent time delay, a confidence level of 99.999 percent time delay and a confidence level line diagram.
As shown in fig. 3, s31 is Count, and is the ordinate of the bar graph, which indicates the number of IOs at a certain time delay. Examples: taking the bar graph coordinate points (0.012, 1299354) indicates that when the abscissa time delay is 0.012, the ordinate count is 1299354, i.e., the time delay for completion of 1299354 IOs is 0.012. s32 is Confidence Level, which is the ordinate of the line graph and indicates the Confidence Level of the time delay. Examples: taking the line graph plot (0.0173,99.9%) shows that the ordinate confidence level is 99.9% when the abscissa time delay is 0.0173, i.e. 99.9% of the IOs are completed within 0.0173 ms. s33 is Time (ms), which is an abscissa value, and represents the Time of the IO delay in milliseconds. s34 represents the average delay of 0.0120ms for all IOs of the load task. s35 indicates that 99.9% of the number of IOs are completed within 0.0173 ms. s36 indicates that 99.99% of the number of IOs are completed within 0.0193 ms. s37 indicates that 99.999% of the number of IOs are completed within 0.0314 ms. s38 represents a confidence level line graph with Time (ms) on the abscissa and percentage on the ordinate.
Examples
The invention also provides a system for testing the time delay index of the enterprise-level solid state disk, which is characterized in that: the system comprises: the system comprises a server platform and a computer PC end, wherein the server platform and the computer PC end are connected through a network interface.
The server platform comprises a server platform processor, a server platform memory, a server platform network interface, a server platform operating system, a time delay test script and a tested solid state disk; the PC end of the computer comprises a PC end processor, a PC end memory, a PC end network interface, a PC end operating system and EXCEL software.
As shown in FIG. 4, s41 is a server platform for testing an experimental environment of the enterprise-level solid state disk delay index. s42 is a server platform processor for executing the computer program. S43 is a server platform operating system, and manages and schedules the software, hardware and data resources of the server. s44 is a delay test script for delay index testing. s45 is a server platform memory, providing an environment for the running of an operating system s43 and test scripts s 44. s46 is a network interface of the server platform, which is used for communicating with the PC end and transmitting data. s47 is the tested solid state disk. s51 is a PC, specifically a computer operated by a tester. s52 is a PC-side processor for executing the computer program. s53 is the memory of the PC, and provides an operating environment for the PC computer. s54 is a network interface of the PC end, which is used for communicating with the server platform and transmitting data. s55 is the PC operating system, which manages and schedules the PC software and hardware and data resources. s56 is EXCEL software, which is used for sorting data output by the time delay test script and drawing a chart.
The time delay test script comprises: the system comprises a preprocessing module, a log information collection module, a steady-state verification module, a time delay load module and a data statistics module. As shown in fig. 5, s20 is a preprocessing module, configured to securely erase a measured disc, and perform preprocessing on a full disc; the SATA solid state disk adopts SECURITY ERASE, the NVMe solid state disk adopts NVME-cli, and the pretreatment mode is as follows: the whole disc was run 2 times using the fio tool. s21 log information collection module, which is used for collecting SMART information (Self-Monitoring Analysis and Reporting Technology automatic detection analysis and reporting technology) information, lspcb information and system log information of the hard disk: hard disk work log information and operating system running work log information. And S22, a steady-state verification module is used for running a load cycle consistent with the time delay load, counting the average time delay of the load running of each cycle, and judging whether the tested disc reaches a steady state or not. Using a cyclic grammar to perform steady-state verification load cycle, and using a fio tool to apply IO to a tested disc by a work load; judging whether the tested disk reaches a steady state or not by using the judgment grammar. And s23, a delay load module, which is used for running a formal delay test load. And after the tested disk reaches a steady state, applying a time delay index workload to the tested solid state disk by using a fio tool. And s24 data statistics module for recording the data of the time delay test load, wherein the time delay, average time delay, maximum time delay, 99.9& time delay, 99.99% time delay and 99.999% time delay of each IO. And intercepting data in each file generated by the fio tool by using an information grabbing function module of the time delay test script.
Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made therein without departing from the spirit and scope of the invention as defined by the appended claims and their equivalents.
Claims (10)
1. A method for testing the time delay index of an enterprise-level solid state disk is characterized by comprising the following steps: the method comprises the following steps:
step S10, building an experimental environment and installing a tested solid state disk;
step 11, safely erasing the whole disk to restore the solid state disk to a factory state, and preprocessing;
step s12, circularly running the same work load as step s14, and starting steady-state verification;
step s13, judging steady-state verification, and if the judgment is passed, performing a step s14; otherwise, repeating the step s12 until the steady-state verification judgment of the step s13 is passed;
step s14, operating the workload, recording the response time of each IO, namely the time delay time, and acquiring a time delay index;
and step S15, counting the number of IO completed by integrating different response times, calculating the confidence level of each time point, and drawing a time delay index chart.
2. The method for testing the time delay index of the enterprise-level solid state disk as set forth in claim 1, wherein the method comprises the following steps: the preprocessing in step s11 specifically includes: thread, queue depth, block size, and full disk sequential write pass are set.
3. The method for testing the time delay index of the enterprise-level solid state disk as set forth in claim 1, wherein the method comprises the following steps: the same workload in step s12, specifically, thread, queue depth, block size, and read-write form remain consistent.
4. The method for testing the time delay index of the enterprise-level solid state disk as set forth in claim 1, wherein the method comprises the following steps: the judging of the steady state verification in the step s13 specifically includes: selecting 5 continuous working cycles in the step s12, acquiring average time delay data of each working cycle, obtaining a Slope data fitting line of the average time delay data, and if the offset of the average time delay data is lower than or equal to 20% and the Slope data fitting line is lower than or equal to 10%, then the tested solid state disk is in a steady state, and performing a step s14; otherwise, the tested solid state disk is not in a steady state, and the step s12 is repeated until the steady state verification judgment of the step s13 is passed.
5. The method for testing the time delay index of the enterprise-level solid state disk as set forth in claim 1, wherein the method comprises the following steps: the delay index in step s14 includes: average delay, maximum delay, 99.9% confidence level delay, 99.99% confidence level delay, 99.999% confidence level delay.
6. The method for testing the time delay index of the enterprise-level solid state disk as set forth in claim 1, wherein the method comprises the following steps: the time delay index graph in step s15 includes a first ordinate, a second ordinate and an abscissa; the first ordinate represents the number of IOs for which the time delay is completed, the second ordinate represents the confidence level of the time delay, and the abscissa represents the time delay time; the time delay index diagram also shows an average time delay, a confidence level of 99.9 percent time delay, a confidence level of 99.99 percent time delay, a confidence level of 99.999 percent time delay and a confidence level line diagram.
7. A testing system for an enterprise-level solid state disk delay indicator based on the testing method of any one of claims 1-6, characterized in that: the system comprises: the system comprises a server platform and a computer PC end, wherein the server platform and the computer PC end are connected through a network interface.
8. The system for testing the delay index of the enterprise-class solid state disk of claim 7, wherein the system comprises: the server platform comprises a server platform processor, a server platform memory, a server platform network interface, a server platform operating system, a time delay test script and a tested solid state disk; the PC end of the computer comprises a PC end processor, a PC end memory, a PC end network interface, a PC end operating system and EXCEL software.
9. The system for testing the delay index of the enterprise-class solid state disk of claim 8, wherein the system comprises: the time delay test script comprises: the system comprises a preprocessing module, a log information collection module, a steady-state verification module, a time delay load module and a data statistics module.
10. The system for testing the delay index of the enterprise-class solid state disk of claim 8, wherein the system comprises: the EXCEL software is used for sorting data output by the time delay test script and drawing a time delay index chart.
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116994629A (en) * | 2023-09-22 | 2023-11-03 | 江苏华存电子科技有限公司 | Method for hard disk performance test and test data acquisition and analysis |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107799158A (en) * | 2017-11-23 | 2018-03-13 | 郑州云海信息技术有限公司 | A kind of NVMe SSD IO delays automated testing method |
| CN108520768A (en) * | 2018-04-12 | 2018-09-11 | 郑州云海信息技术有限公司 | A kind of test method, system and the device of SSD performances |
| CN109117330A (en) * | 2018-07-27 | 2019-01-01 | 郑州云海信息技术有限公司 | A kind of test method, test macro and the relevant apparatus of SSD power-on and power-off |
| CN109215721A (en) * | 2018-10-24 | 2019-01-15 | 郑州云海信息技术有限公司 | A kind of method, device and equipment of test NVME SSD hard disk delay |
| CN109346122A (en) * | 2018-10-15 | 2019-02-15 | 郑州云海信息技术有限公司 | The test method and device of solid state hard disk performance |
-
2023
- 2023-07-28 CN CN202310934576.4A patent/CN116682479A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107799158A (en) * | 2017-11-23 | 2018-03-13 | 郑州云海信息技术有限公司 | A kind of NVMe SSD IO delays automated testing method |
| CN108520768A (en) * | 2018-04-12 | 2018-09-11 | 郑州云海信息技术有限公司 | A kind of test method, system and the device of SSD performances |
| CN109117330A (en) * | 2018-07-27 | 2019-01-01 | 郑州云海信息技术有限公司 | A kind of test method, test macro and the relevant apparatus of SSD power-on and power-off |
| CN109346122A (en) * | 2018-10-15 | 2019-02-15 | 郑州云海信息技术有限公司 | The test method and device of solid state hard disk performance |
| CN109215721A (en) * | 2018-10-24 | 2019-01-15 | 郑州云海信息技术有限公司 | A kind of method, device and equipment of test NVME SSD hard disk delay |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116994629A (en) * | 2023-09-22 | 2023-11-03 | 江苏华存电子科技有限公司 | Method for hard disk performance test and test data acquisition and analysis |
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Application publication date: 20230901 |