CN116539966B - Electromagnetic super-surface near-field measurement device and electromagnetic super-surface near-field measurement method - Google Patents
Electromagnetic super-surface near-field measurement device and electromagnetic super-surface near-field measurement method Download PDFInfo
- Publication number
- CN116539966B CN116539966B CN202310446737.5A CN202310446737A CN116539966B CN 116539966 B CN116539966 B CN 116539966B CN 202310446737 A CN202310446737 A CN 202310446737A CN 116539966 B CN116539966 B CN 116539966B
- Authority
- CN
- China
- Prior art keywords
- signal receiving
- signal
- electromagnetic
- sample
- mechanical arm
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000005259 measurement Methods 0.000 title claims abstract description 73
- 238000000691 measurement method Methods 0.000 title claims abstract description 14
- 238000012360 testing method Methods 0.000 claims abstract description 57
- 230000007246 mechanism Effects 0.000 claims abstract description 12
- 239000000523 sample Substances 0.000 claims description 138
- 238000006073 displacement reaction Methods 0.000 claims description 63
- 230000005540 biological transmission Effects 0.000 claims description 17
- 238000000034 method Methods 0.000 claims description 17
- 238000009434 installation Methods 0.000 claims description 11
- 238000013101 initial test Methods 0.000 claims description 10
- 230000008569 process Effects 0.000 claims description 10
- 230000009466 transformation Effects 0.000 claims description 10
- 239000002184 metal Substances 0.000 claims description 4
- 239000002023 wood Substances 0.000 claims description 4
- 230000001276 controlling effect Effects 0.000 claims description 3
- 230000003287 optical effect Effects 0.000 claims description 2
- 230000002093 peripheral effect Effects 0.000 claims description 2
- 230000001105 regulatory effect Effects 0.000 claims description 2
- 238000004519 manufacturing process Methods 0.000 abstract description 8
- 230000005672 electromagnetic field Effects 0.000 description 5
- 239000011358 absorbing material Substances 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 238000011056 performance test Methods 0.000 description 3
- 230000005855 radiation Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 239000004793 Polystyrene Substances 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000003750 conditioning effect Effects 0.000 description 1
- 230000001808 coupling effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 230000005670 electromagnetic radiation Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000006260 foam Substances 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 239000004814 polyurethane Substances 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 230000002035 prolonged effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/08—Measuring electromagnetic field characteristics
- G01R29/0864—Measuring electromagnetic field characteristics characterised by constructional or functional features
- G01R29/0871—Complete apparatus or systems; circuits, e.g. receivers or amplifiers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R35/00—Testing or calibrating of apparatus covered by the other groups of this subclass
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D30/00—Reducing energy consumption in communication networks
- Y02D30/70—Reducing energy consumption in communication networks in wireless communication networks
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The application relates to the technical field of electromagnetic measurement, and provides an electromagnetic super-surface near-field measurement device and an electromagnetic super-surface near-field measurement method. The electromagnetic super-surface near-field measurement device includes: a platform having a table top; the bracket is used for fixing the tested sample and driving the tested sample to horizontally rotate; the signal transmitting piece and the signal receiving piece are arranged on the table top at intervals, at least one of the bracket and the signal transmitting piece can move along a first direction parallel to the table top, the signal transmitting piece and the measured sample have a preset distance and a preset included angle, and the signal receiving piece is perpendicular to the measured sample; the mechanical arm is connected with the signal receiving piece and is used for driving the signal receiving piece to move; and the control mechanism is respectively and electrically connected with the signal transmitting part, the signal receiving part and the mechanical arm. The electromagnetic super-surface near-field measuring device solves the problems of low testing precision and high manufacturing cost when testing the electromagnetic performance of the electromagnetic super-surface in the prior art.
Description
Technical Field
The present disclosure relates to the field of electromagnetic measurement technologies, and in particular, to an electromagnetic super-surface near-field measurement device and an electromagnetic super-surface near-field measurement method.
Background
The electromagnetic super surface is novel electromagnetic equipment, and electromagnetic waves in the environment can be regulated and controlled in a macroscopic manner by arranging series of units with different electromagnetic characteristics; electromagnetic supersurfaces may be used to improve signals, increasing signal-to-noise ratio and thus optimizing communication quality. The transmission, reflection and absorption functions can be realized by using units with different S parameter curves, and meanwhile, the combination of multiple functions can be realized by matching different characteristics of different frequency bands; furthermore, through the phase regulation and control of the adjusting unit on the electromagnetic wave, single-point or multi-point focusing of transmission and reflection can be realized, and even electromagnetic holographic projection can be realized when the electromagnetic super-surface scale is large enough. With the continuous improvement of the structure and continuous enrichment of the functions of the electromagnetic super-surface, the performance test requirements for the prepared electromagnetic super-surface are gradually increased.
As a device for complex regulation of electromagnetic waves, precise and efficient electromagnetic field distribution of an electromagnetic super-surface under electromagnetic wave irradiation is an important problem for super-surface design, delivery and later debugging. Because the electromagnetic super surface can regulate and control the characteristics of electromagnetic waves at a longer distance, the electromagnetic super surface is easy to be affected by electromagnetic interference when tested under the condition of an external field or a far field, and the cost for establishing a longer-distance microwave darkroom is higher; meanwhile, the electromagnetic super-surface has larger size and rich functions, the high-precision reflecting surface for compact range measurement has high cost, and the super-surface is a passive device and needs to be measured after a feed source antenna is used for transmitting signals, so that the multipath effect of the feed source signal directly reflected by the reflecting surface is difficult to eliminate, and the testing precision is influenced to a certain extent.
Disclosure of Invention
The purpose of the application is to provide an electromagnetic super-surface near-field measurement device and an electromagnetic super-surface near-field measurement method, so as to solve the problems of low test precision and high manufacturing cost when testing electromagnetic performance of an electromagnetic super-surface in the prior art.
An embodiment of a first aspect of the present application proposes an electromagnetic super-surface near-field measurement device, comprising:
a platform having a table top;
the bracket is arranged on the table top and is used for fixing a tested sample and driving the tested sample to horizontally rotate;
the signal transmitting piece and the signal receiving piece are arranged on the table top at intervals, at least one of the bracket and the signal transmitting piece can move along a first direction parallel to the table top, the signal transmitting piece and the tested sample have a preset distance and a preset included angle, and the signal receiving piece is perpendicular to the tested sample;
the mechanical arm is connected with the signal receiving part and is used for driving the signal receiving part to move;
the control mechanism is respectively and electrically connected with the signal transmitting part, the signal receiving part and the mechanical arm, and is used for controlling the mechanical arm to move, generating electromagnetic signals and transmitting the electromagnetic signals through the signal transmitting part, and the electromagnetic signals are received by the signal receiving part.
In an embodiment, the electromagnetic super-surface near-field measurement device has an initial installation state, and when the electromagnetic super-surface near-field measurement device is in the initial installation state, the geometric centers and the central axes of the signal transmitting element and the measured sample are all located on the same straight line parallel to the table top; the geometric center of the signal receiving element is positioned on a normal line of the geometric center of the measured sample.
In an embodiment, the electromagnetic super-surface near-field measurement device further includes a base disposed on the table top and extending along the first direction, and the bracket and the signal transmitting member are both slidably connected to the base along the first direction.
In an embodiment, the support comprises a slider, a rotary table, a horizontal displacement frame and a first height displacement frame, wherein the horizontal displacement frame is fixedly connected with the first height displacement frame, the slider is connected to the base in a sliding manner along a first direction, the rotary table is arranged on the slider and can horizontally rotate relative to the slider, the horizontal displacement frame is arranged on the rotary table and can move along a second direction, the second direction is parallel to the table top and forms an included angle with the first direction, and the tested sample is arranged on the first height displacement frame and can move along a third direction perpendicular to the table top;
The electromagnetic super-surface near-field measuring device further comprises a second height displacement frame which is connected to the base in a sliding mode along the first direction, and the signal transmitting piece is arranged on the second height displacement frame and can move along the third direction.
In an embodiment, the electromagnetic super-surface near-field measurement device further comprises a wave absorbing member, wherein the wave absorbing member is arranged on the front side and the rear side of the measured sample, the table top, one side, away from the bracket, of the signal receiving member and the peripheral side of the mechanical arm.
In an embodiment, the electromagnetic super-surface near-field measurement device further includes an extension bracket, where the extension bracket is disposed on the mechanical arm and is used for fixing the signal receiving element, and a material of the extension bracket is wood or low scattering metal;
wherein the mechanical arm is a six-axis mechanical arm; the signal receiving element is a waveguide antenna or a probe antenna.
The electromagnetic super-surface near-field measuring device comprises a platform, a bracket, a signal transmitting part, a signal receiving part, a mechanical arm and a control mechanism. At least one of the support and the signal emitting piece can move along a first direction parallel to the table top, so that the distance between the support and the signal emitting piece can be adjusted randomly according to the requirement, and the flexibility is high. And secondly, the signal receiving part is connected to the mechanical arm, and then the signal receiving part can move under the drive of the mechanical arm, so that the distance and the included angle between the signal receiving part and the bracket can be adjusted at will, the degree of freedom and the flexibility are high, the test deviation caused by the fact that the position is not adjusted in place can be reduced, and the test precision is high. And secondly, the bracket can drive the tested sample to horizontally rotate, so that the device can be compatible with near-field measurement of transmission and reflection performance of the electromagnetic super surface, and has high utilization rate. In addition, a microwave darkroom with a long distance is not required to be established, and the production cost is reduced, so that the technical problems of low testing precision and high manufacturing cost in the prior art when the electromagnetic performance of the electromagnetic super surface is tested are solved.
An embodiment of a second aspect of the present application provides an electromagnetic super-surface near-field measurement method, which adopts the electromagnetic super-surface near-field measurement device according to any one of the embodiments of the first aspect, and the electromagnetic super-surface near-field measurement method includes:
adjusting initial positions of a signal transmitting part, a measured sample and a signal receiving part so as to enable the electromagnetic super-surface near-field measurement device to be in an initial installation state;
setting a near field measurement frequency point, an array length and width and a stepping distance, and establishing an array lattice Am X Bn, wherein the array lattice is positioned on a plane perpendicular to the central lines of the signal receiving piece and the tested sample;
moving the signal receiving part to an initial test point through a mechanical arm, and recording first data of the signal receiving part;
moving the signal receiving part to the next test point through the mechanical arm again, and recording second data of the signal receiving part;
repeating the moving and stepping processes until the scanning of the Am X Bn array points is completed, and recording the data corresponding to the signal receiving piece at each test point.
In one embodiment, after adjusting the initial positions of the signal emitting member, the sample to be measured and the signal receiving member, the method further comprises:
The signal transmitting piece and the signal receiving piece are respectively positioned at two opposite sides of the tested sample so as to perform transmission performance near-field test;
or adjusting the signal transmitting piece and the signal receiving piece to be positioned on the same side of the tested sample at the same time so as to perform the reflection performance near-field test.
In an embodiment, the adjusting the initial positions of the signal emitting element, the measured sample and the signal receiving element includes adjusting an initial level of the signal emitting element, the measured sample and the signal receiving element, and specifically includes:
the first height support and the second height support are adjusted through the laser rope alignment instrument so as to calibrate the geometric centers of the signal transmitting piece and the measured sample and the central axis to be positioned on a plane parallel to the table top;
the horizontal displacement frame is adjusted through the laser alignment rope instrument, so that the geometric centers and the central axes of the signal transmitting piece and the measured sample are positioned on a straight line parallel to the table top;
and adjusting the position of the signal receiving part through the laser alignment instrument and the mechanical arm so that the geometric center of the signal receiving part is positioned on a normal line of the geometric center of the measured sample.
In one embodiment, after adjusting the initial positions of the signal emitting member, the sample to be measured and the signal receiving member, the method further comprises: rotating a rotating table to enable an incident electromagnetic signal sent by the signal transmitting piece and a plane where the tested sample is located to form a preset included angle;
When the transmission performance is measured, the horizontal rotation angle theta of the signal receiving part is adjusted through the mechanical arm, so that the signal receiving part is perpendicular to the measured sample, the mechanical arm is moved according to coordinate transformation so that the relative position and the horizontal height of the signal receiving part and the measured sample are kept unchanged, and the signal receiving part and the signal transmitting part are positioned on two opposite sides of the measured sample;
or when the reflection performance is measured, the horizontal rotation angle pi-theta of the signal receiving part is adjusted through the mechanical arm, so that the signal receiving part is vertical to the measured sample, the mechanical arm is moved according to coordinate transformation so that the relative position and the horizontal height of the signal receiving part and the measured sample are adjusted to be symmetrical, and the signal receiving part and the signal transmitting part are positioned on the same side of the measured sample.
The electromagnetic super-surface near-field measurement method simplifies the calibration flow of electromagnetic super-surface near-field measurement, and simultaneously realizes the compatibility of transmission and reflection performance near-field measurement of the electromagnetic super-surface by utilizing the high degree of freedom and flexibility of the bracket and the mechanical arm; the plane scanning process steps are provided, so that the main control computer, the mechanical arm and the radio frequency signal receiving and transmitting unit automatically interact, manual operation in the near field scanning process is omitted, the scanning speed is optimized, and the efficiency and the accuracy of near field testing are improved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings that are required for the embodiments or the description of the prior art will be briefly described below, it being obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
FIG. 1 is a schematic perspective view of an electromagnetic subsurface near field measurement device according to an embodiment of the present application;
FIG. 2 is a schematic illustration of the electromagnetic subsurface near field measurement device of FIG. 1 in an initial state;
FIG. 3 is a schematic diagram of transmission performance testing performed by the electromagnetic subsurface near field measurement device shown in FIG. 1;
FIG. 4 is a schematic diagram of the electromagnetic subsurface near field measurement device of FIG. 1 performing a reflection performance test;
FIG. 5 is a flow chart of a near field electromagnetic subsurface measurement method according to an embodiment of the present application.
The meaning of the labels in the figures is:
100. an electromagnetic super-surface near-field measurement device; 200. a sample to be tested;
10. a platform; 11. a table top;
20. a bracket; 21. a slide block; 22. a rotary table; 23. a horizontal displacement frame; 24. a first height displacement frame;
30. A signal transmitting member;
40. a signal receiving member;
50. a mechanical arm;
60. a control mechanism; 61. a main control computer; 62. a radio frequency signal receiving and transmitting unit;
71. a base; 72. a second height displacement frame; 73. the bracket is prolonged.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application will be further described in detail with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the present application.
It will be understood that when an element is referred to as being "mounted" or "disposed" on another element, it can be directly on the other element or be indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or be indirectly connected to the other element.
It should be appreciated that the terms "length," "width," "upper," "lower," "inner," "outer," and the like indicate an orientation or positional relationship based on that shown in the drawings, merely to facilitate description of the present application and simplify the description, and do not indicate or imply that the apparatus or element in question must have a particular orientation, be configured and operated in a particular orientation, and therefore should not be construed as limiting the present application. In the description of the present application, the meaning of "a plurality" is two or more, unless explicitly defined otherwise.
In this application, unless specifically stated and limited otherwise, the terms "mounted," "connected," "secured," and the like are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally formed; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communicated with the inside of two elements or the interaction relationship of the two elements. The specific meaning of the terms in this application will be understood by those of ordinary skill in the art as the case may be.
The near field measurement overcomes the space requirement compared with the far field, meanwhile, the reflection surface structure is abandoned in comparison with the compact range measurement, the electromagnetic field distribution of the tested equipment is directly measured in a close range, and then the far field electromagnetic field distribution is obtained by converting the electromagnetic field distribution into the far field through an algorithm, so that the method is a novel testing method which is more suitable for the electromagnetic performance of the electromagnetic super surface and has high precision.
Because the electromagnetic super-surface has passivity and multifunctionality, compared with the general electromagnetic field distribution near-field measurement, the near-field measurement of the electromagnetic super-surface needs to solve the angle and distance relation between a radio frequency source and the electromagnetic super-surface and the angle and distance relation between a signal receiving probe and the electromagnetic super-surface, so that the traditional antenna near-field measurement system is difficult to meet the near-field measurement requirement of the electromagnetic super-surface.
Based on this, an embodiment of the first aspect of the present application provides an electromagnetic super-surface near-field measurement device for testing electromagnetic regulation performance of an electromagnetic super-surface, which is easy to operate, high in testing precision and low in cost.
Referring to fig. 1, in one embodiment of the present application, an electromagnetic super-surface near-field measurement device 100 includes a platform 10, a support 20, a signal transmitting member 30, a signal receiving member 40, a robotic arm 50, and a control mechanism 60.
The platform 10 has a table top 11, the table top 11 being parallel to the horizontal plane.
The support 20 is disposed on the table top 11, and the support 20 is used for fixing the measured sample 200 and driving the measured sample 200 to horizontally rotate. Wherein the sample 200 to be measured is a rectangular electromagnetic super surface.
The signal emitting member 30 and the signal receiving member 40 are disposed on the table top 11 at intervals, at least one of the stand 20 and the signal emitting member 30 is movable along a first direction (X direction in the drawing) parallel to the table top 11, the signal emitting member 30 and the sample 200 to be measured have a predetermined distance and a predetermined angle, and the signal receiving member 40 is perpendicular to the sample 200 to be measured.
The mechanical arm 50 is connected to the signal receiving element 40, and the mechanical arm 50 is used for driving the signal receiving element 40 to move. That is, the signal receiving element 40 can be moved to any position in the space under the driving of the mechanical arm 50.
The control mechanism 60 is electrically connected to the signal emitting element 30, the signal receiving element 40 and the mechanical arm 50, respectively, and the control mechanism 60 is used for controlling the mechanical arm 50 to move, generating an electromagnetic signal and emitting the electromagnetic signal through the signal emitting element 30, wherein the electromagnetic signal is received by the signal receiving element 40.
Because the rack 20 can drive the measured sample 200 to rotate horizontally, the electromagnetic super-surface near-field measurement device 100 can perform near-field measurement of the transmission and reflection properties of the electromagnetic super-surface. Referring to fig. 3, when the electromagnetic super-surface near-field measurement device 100 is in the transmission performance test state, the bracket 20 drives the measured sample 200 to horizontally rotate until the measured sample 200 forms a certain angle with the first direction, and the mechanical arm 50 drives the signal receiving element 40 to move so as to ensure that the signal receiving element 40 is perpendicular to the measured sample 200, and at this time, the signal receiving element 40 and the signal transmitting element 30 are located on opposite sides of the electromagnetic super-surface. In addition, the electromagnetic super-surface near-field measurement device 100 further has a reflection performance testing state, referring to fig. 4, when the electromagnetic super-surface near-field measurement device 100 is in the reflection performance testing state, the bracket 20 drives the measured sample 200 to horizontally rotate until the measured sample 200 forms a certain angle with the first direction, and the mechanical arm 50 drives the signal receiving element 40 to move until the signal receiving element 40 and the signal transmitting element 30 are located on the same side of the electromagnetic super-surface, and the signal receiving element 40 is ensured to be perpendicular to the measured sample 200.
The platform 10 is used for providing a horizontal table top 11 and standard equidistant screw holes on the table top 11 to fix the mechanical arm 50, the bracket 20 and the signal receiving and transmitting mechanism through screws. It will be appreciated that the platform 10 may be an optical platform 10 with good stability and high planarity, so that installation errors may be reduced.
It will be appreciated that in other embodiments of the present application, the robotic arm 50 may also be movable in a first direction parallel to the table top 11, for example, by adding a sliding rail to the table top 11 to facilitate movement of the robotic arm 50. In this way, when the near-field measurement of the transmission and reflection performance of the electromagnetic super-surface is performed subsequently, the position of the signal receiving element 40 is flexibly adjusted, and the interference of the mechanical arm 50 on the electromagnetic signal can be reduced.
In this embodiment, both the stand 20 and the signal emitting member 30 can move along the first direction parallel to the table top 11, so as to facilitate the adjustment of the position, and the adjustment efficiency is high. It will be appreciated that in other embodiments of the present application, the support 20 or the signal emitting member 30 may be movable in a first direction parallel to the table top 11, and that adjustment of the relative position between the support 20 and the signal emitting member 30 may be achieved as well, without limitation.
The electromagnetic super-surface near-field measurement device 100 provided by the application comprises a platform 10, a bracket 20, a signal transmitting piece 30, a signal receiving piece 40, a mechanical arm 50 and a control mechanism 60. At least one of the bracket 20 and the signal emitting member 30 can move along the first direction parallel to the table top 11, so that the distance between the bracket 20 and the signal emitting member 30 can be adjusted arbitrarily as required, and the flexibility is high. And secondly, the signal receiving element 40 is connected to the mechanical arm 50, so that the signal receiving element 40 can move under the drive of the mechanical arm 50, the distance and the included angle between the signal receiving element 40 and the bracket 20 can be adjusted at will, the degree of freedom and the flexibility are high, the testing deviation caused by the fact that the position is not adjusted in place can be reduced, and the testing precision is high. Secondly, the bracket 20 can drive the tested sample 200 to horizontally rotate, so that the near-field measurement of the transmission and reflection performance of the electromagnetic super surface can be compatible, and the device utilization rate is high. In addition, a microwave darkroom with a long distance is not required to be established, and the production cost is reduced, so that the technical problems of low testing precision and high manufacturing cost in the prior art when the electromagnetic performance of the electromagnetic super surface is tested are solved.
In this embodiment, the control mechanism 60 includes a main control computer 61 and a radio frequency signal transceiver unit 62, the main control computer 61 is provided with matched control software, and the radio frequency signal transceiver unit 62 is electrically connected to the signal transmitting member 30 and the signal receiving member 40. Further, the radio frequency signal transceiver 62 is a vector network analyzer, and can be connected to the signal transmitting element 30 and the signal receiving element 40 through a low-impedance coaxial signal line to acquire and process the information such as the phase and the amplitude measured by the signal receiving element 40.
The control software is used for providing a measurement setting function, generating a control instruction of the gesture of the mechanical arm 50 and a working instruction of the radio frequency signal receiving and transmitting unit 62, and ensuring that the working flow of the system is correct. The main control computer 61 is connected to the mechanical arm 50 and the radio frequency signal transceiver unit 62, and the main control computer 61 is used for sending a control instruction to the mechanical arm 50, sending a working instruction to the radio frequency signal transceiver unit 62, receiving measurement data returned by the radio frequency signal transceiver unit 62 and processing the measurement data.
That is, the mechanical arm 50 receives the control command and drives the signal receiving element 40 to move; the radio frequency signal transceiver unit 62 receives the operation instruction, transmits and receives electromagnetic signal data, and transmits test data to the main control computer 61.
Further, the mechanical arm 50 is a six-axis mechanical arm, has six degrees of freedom, occupies small space, has good flexibility, can move the signal receiving element 40 to any position in space, meets the requirement of an included angle between the signal receiving element 40 and the measured sample 200, and has high adjustment efficiency.
It is understood that in other embodiments of the present application, the mechanical arm 50 may be other multi-axis mechanical arms such as a five-axis mechanical arm, and any adjustment of the signal receiving element 40 may be achieved by adding other position adjusting elements, but is not limited thereto.
Further, the signal receiving element 40 is a waveguide antenna or a probe antenna, so that the coupling effect with the electromagnetic wave passing through the sample 200 to be measured is small, and the measurement effect is negligible for most of the samples with large size, so that the applicability is wide.
Referring to fig. 1 and 2, in one embodiment of the present application, the electromagnetic super-surface near-field measurement device 100 has an initial installation state, and when the electromagnetic super-surface near-field measurement device 100 is in the initial installation state, the geometric centers and central axes of the signal emitter 30 and the measured sample 200 are all located on the same straight line parallel to the table top 11; the geometric center of the signal receiving element 40 is located on the normal line to the geometric center of the sample 200 under test.
Wherein the signal receiving element 40 is always perpendicular to the sample 200 to be tested.
In addition, the electromagnetic super-surface near-field measurement device 100 changes the positions of the measured sample 200 and the signal receiving member 40 during the measurement after the initial installation is completed, but keeps the geometric center of the signal receiving member 40 on the normal line of the measured sample 200.
Referring to fig. 1, in one embodiment of the present application, the electromagnetic super-surface near-field measurement device 100 further includes a base 71 disposed on the table top 11 and extending along a first direction, and the stand 20 and the signal transmitting member 30 are slidably connected to the base 71 along the first direction. Thus, the base 71 can play a guiding role in adjusting the positions of the bracket 20 and the signal transmitting member 30, so that the movement error is reduced; in addition, since the bracket 20 and the signal transmitting member 30 are both slidably connected to the base 71, the position adjustment of the bracket 20 and the signal transmitting member 30 in the moving process along the first direction is precise, and the positioning accuracy is high.
Referring to fig. 1, in an embodiment of the present application, the support 20 includes a slider 21, a rotary table 22, a horizontal displacement frame 23 fixedly connected to the slider 21, and a first height displacement frame 24, the slider 21 is slidably connected to the base 71 along a first direction, the rotary table 22 is disposed on the slider 21 and can horizontally rotate relative to the slider 21, the horizontal displacement frame 23 is disposed on the rotary table 22 and can move along a second direction parallel to the table top 11 and forming an included angle with the first direction, and the sample 200 to be measured is disposed on the first height displacement frame 24 and can move along a third direction (illustrated Z direction) perpendicular to the table top 11. The electromagnetic super-surface near-field measurement device 100 further includes a second height displacement frame 72 slidably connected to the base 71 along the first direction, and the signal transmitting element 30 is disposed on the second height displacement frame 72 and is movable along the third direction.
In this embodiment, a groove extending along a second direction (Y direction in the drawing) is disposed on a surface of the rotary table 22 facing away from the table top 11, and the horizontal displacement rack 23 is slidably connected to the groove, so that the horizontal displacement rack 23 can move along the second direction, thereby driving the sample 200 to be measured to move along the second direction. When the rotary table 22 does not rotate horizontally relative to the slider 21, the second direction is perpendicular to the first direction, and it can be understood that after the rotary table 22 rotates horizontally relative to the slider 21, the horizontal displacement frame 23 disposed on the rotary table 22 can move along the second direction, and at this time, the included angle between the second direction and the first direction can be any value of 0-90 degrees, which is not limited herein.
It will be appreciated that one of the slider 21 and the base 71 is provided with a sliding slot, and the other is provided with a projection adapted to the sliding slot, so as to realize the reciprocating movement of the slider 21 on the base 71. It will be appreciated that in other embodiments of the present application, the base 71 may be omitted, a groove extending along the first direction may be formed on the table 11, and a protrusion capable of being received in the groove may be formed on the slider 21, so that the slider 21 may reciprocate on the base 71.
In this embodiment, the rotary table 22 is rotatably connected to the slider 21 through a rotary shaft, and it can be understood that one end of the rotary shaft is fixedly connected to the slider 21, and the rotary table 22 is sleeved on the other end of the rotary shaft and rotates around the rotary shaft as an axis.
The first height displacement rack 24 includes two parallel displacement racks arranged at intervals, and the two displacement racks are respectively arranged at two opposite ends of the horizontal displacement rack 23 and form a space for placing the sample 200 to be tested. The sample 200 to be measured can be slidably connected to the two displacement frames along the third direction.
On the one hand, the first height displacement frame 24 and the measured sample 200 can be horizontally rotated by the horizontal rotation of the rotary table 22, so that the included angle between the plane of the measured sample 200 and the extending direction of the signal transmitting member 30 can be adjusted, and the test of the projection and reflection performance of the electromagnetic super-surface can be compatible.
On the other hand, the first height displacement frame 24 and the second height displacement frame 72 can enable the tested sample 200 and the signal emitting part 30 to move along the third direction perpendicular to the table top 11, so that the heights of the two can be respectively adjusted, the geometric center of the signal emitting part 30 and the geometric center of the tested sample 200 are located at the same height, the adjusting structure is simple, the operation is simple and convenient, the radiation direction of the signal emitting part 30 can be ensured not to deviate, the testing precision can be conveniently improved when the radiation direction characteristic of the signal emitting part 30 is ignored, or the modeling difficulty is optimized under the condition that the radiation direction characteristic of the signal emitting part 30 is not ignored, and the testing precision is high.
Further, a side of the second height displacement frame 72 facing the base 71 is also provided with a slider 21 to realize the reciprocating movement of the second height displacement frame 72 on the base 71 in the first direction. It is understood that in other embodiments of the present application, the slider 21 may be omitted, and the side of the second height displacement frame 72 facing the base 71 is directly slidingly connected with the base 71, but is not limited thereto.
In one embodiment of the present application, the electromagnetic super-surface near-field measurement device 100 further includes a wave absorbing member (not shown) mounted on the front and rear sides of the sample 200 to be measured, on the table top 11, on a side of the signal receiving member 40 facing away from the stand 20, and on a circumferential side of the mechanical arm 50, that is, on a circumferential side of the sample 200 to be measured.
Wherein, the wave absorbing member is made of wave absorbing material, and the wave absorbing member arranged at the periphery of the measured sample 200 can effectively reduce the reflection of electromagnetic radiation of the measured sample 200, thereby reducing the interference of electromagnetic waves. Further, the wave absorbing material may be a polystyrene material containing carbon powder, or a foam absorbing material including Polyurethane (PU) or the like, but is not limited thereto.
Specifically, of the two displacement frames included in the first height displacement frame 24, the two sides of each displacement frame facing the signal transmitting member 30 and the signal receiving member 40 are adhered with wave absorbing members; the side of the second height displacement frame 72 facing the sample 200 to be measured is also adhered with a wave absorbing member; the mechanical arm 50 is adhered with a wave absorbing member except for joints.
Referring to fig. 1, in an embodiment of the present application, the electromagnetic super-surface near-field measurement device 100 further includes an extension bracket 73, where the extension bracket 73 is disposed on the mechanical arm 50 and is used for fixing the signal receiving element 40, and the material of the extension bracket 73 is wood or low scattering metal.
That is, the signal receiving element 40 is connected to the mechanical arm 50 through the extension bracket 73, so that errors caused by scattering near the signal receiving element 40 can be reduced; in addition, the added extension bracket 73 may facilitate installation of the wave absorbing member. Specifically, the wave absorbing member may be sleeved on the signal receiving member 40 and adhered to the extension bracket 73.
The electromagnetic super-surface near-field measurement device 100 provided by the application comprises a platform 10, a bracket 20, a signal transmitting piece 30, a signal receiving piece 40 and a mechanical arm 50. At least one of the bracket 20 and the signal emitting member 30 can move along the first direction parallel to the table top 11, so that the distance between the bracket 20 and the signal emitting member 30 can be adjusted arbitrarily as required, and the flexibility is high. And secondly, the signal receiving element 40 is connected to the mechanical arm 50, so that the signal receiving element 40 can move under the drive of the mechanical arm 50, the distance and the included angle between the signal receiving element 40 and the bracket 20 can be adjusted at will, the degree of freedom and the flexibility are high, the testing deviation caused by the fact that the position is not adjusted in place can be reduced, and the testing precision is high. Secondly, the bracket 20 can drive the tested sample 200 to horizontally rotate, so that the near-field measurement of the transmission and reflection performance of the electromagnetic super surface can be compatible, and the device utilization rate is high. In addition, a microwave darkroom with a long distance is not required to be established, and the production cost is reduced, so that the technical problems of low testing precision and high manufacturing cost in the prior art when the electromagnetic performance of the electromagnetic super surface is tested are solved.
An embodiment of a second aspect of the present application proposes an electromagnetic super-surface near-field measurement method, which uses an electromagnetic super-surface near-field measurement device 100 as in any embodiment of the first aspect, referring to fig. 1 to 5, and includes the following steps:
s1, adjusting initial positions of the signal transmitting element 30, the tested sample 200 and the signal receiving element 40.
Referring to fig. 1 and 2, initial positions of the signal transmitting element 30, the sample 200 and the signal receiving element 40 are adjusted to make the electromagnetic super-surface near-field measurement device 100 in an initial installation state. Specifically, the initial horizontal heights of the signal emitting member 30, the measured sample 200, and the signal receiving member 40 are adjusted such that the geometric centers and central axes of the signal emitting member 30 and the measured sample 200 are located on a straight line parallel to the table top 11, and the geometric center of the signal receiving member 40 is located on a normal line of the geometric center of the measured sample 200; next, the distances between the signal emitting member 30, the sample 200 to be measured, and the signal receiving member 40 are adjusted.
Specifically, a base 71, a first height displacement frame 24, a horizontal displacement frame 23, a rotary table 22, and a second height displacement frame 72 are mounted on the table top; mounting the signal emitter 30 on the second height displacement frame 72 and mounting the sample 200 to be measured on the first height displacement frame 24; an extension bracket 73 made of wood or low scattering metal is arranged at the tail end of the mechanical arm 50 through a flange plate; mounting the signal receiving element 40 on the extension bracket 73; using a laser alignment gauge and adjusting the height of the calibration signal emitter 30, the geometric center of the sample 200 to be measured, and the central axis on a plane parallel to the table top 11; using a laser alignment gauge and adjusting the horizontal positions of the first height displacement frame 24 and the second height displacement frame 72 so that the geometric centers of the signal transmitting antenna and the measured sample 200 are on a straight line parallel to the table top 11; rotating the rotary table 22 provided with the tested sample 200, and adjusting the angle between the incident electromagnetic signal and the tested sample 200; using a laser alignment gauge and adjusting the geometric center of the signal receiving element 40 at the tail end of the mechanical arm 50 to be on a normal line passing through the center of the measured sample 200 through the control mechanism 60; the position of the slider 21 is moved and the distance between the signal transmitting member 30, the sample 200 to be measured and the signal receiving member 40 is set using a scale and a laser level.
S2, setting a near field measurement frequency point, an array length and width and a stepping distance, and establishing an array lattice Am X Bn, wherein the array lattice is positioned on a plane perpendicular to the geometric center line of the signal receiving element 40 and the measured sample 200.
The array lattice coordinate system is a rectangular coordinate system constructed by taking the position of the signal receiving element 40 after the center line is calibrated as an origin and parallel to the measured sample 200, and all the point coordinates in the array lattice are symmetrically distributed about the X axis and the Y axis of the coordinate system. The straight line parallel to the table top 11 is the X axis, the straight line perpendicular to the table top 11 is the Y axis, and the length, width and stepping distance of the array are set according to the requirement to balance the scanning time and the scanning precision so as to improve the scanning efficiency. Further, setting according to the requirement means that the array length and width as small as possible are used on the premise of covering the whole measured sample 200 by referring to the size of the measured sample 200; on the other hand, on the premise of ensuring the scanning precision, a proper number of test points are set, so that the scanning precision and the scanning time are both considered.
S3, moving the signal receiving element 40 to the initial test point through the mechanical arm 50, and recording first data of the signal receiving element 40.
The initial test points may be four points in the coordinate system, where the absolute value of the X, Y axis coordinate is the largest, respectively (A1, B1), (A1, bn), (Am, B1), (Am, bn), that is, the signal receiving element 40 is first moved from the origin to the initial test point by the mechanical arm 50; the first data refers to the measured phase and amplitude information of each frequency point when the signal receiving element 40 is located at the initial test point. It will be appreciated that the initial test point may be any other test point, and that the path of travel of the signal receiving element 40 need only be changed, and that the minimum total step distance may be achieved without limitation.
S4, moving the signal receiving element 40 to the next test point through the mechanical arm 50, and recording second data of the signal receiving element 40.
The next test point is a test point adjacent to the initial test point, so that the stepping distance can be reduced.
S5, repeating the moving and stepping processes until the Am X Bn array points are scanned, and recording the data of the signal receiving element 40 corresponding to each test point.
For example, signal receiving element 40 starts testing from an initial test point (A1, B1), moves m-1 times in the direction of Am along the X-axis, moves a step in the direction of Y-axis adjacent to the test point, moves m-1 times in the direction of A1 along the X-axis, and so on until all test points are passed, and the direction of movement along the Y-axis is unchanged during the process.
Alternatively, the signal receiving member 40 starts the test from the initial test point (A1, B1), first, moves m-1 times along the X axis in the Am direction; moving n-1 times along the Y axis in the Bn direction, and then moving m-1 times along the X axis in the A1 direction; then moving n-2 times along the Y axis in the direction B1, and then moving m-2 times along the X axis in the direction Am; and then moving along the Y-axis n-3 times in the Bn direction, and then moving along the X-axis m-3 times in the A1 direction, and so on until all test points are passed, it will be appreciated that the direction of each movement of the signal receiving member 40 along the Y-axis is opposite to the direction of the next movement along the Y-axis.
Further, in one embodiment of the present application, in step S4 and step S5, the method of moving the signal receiving member 40 includes the steps of:
first, the signal receiving element 40 is moved to the nearest unmeasured test point along any axis of the rectangular coordinate system;
then, if the coordinate axis along which the steps are carried out has no non-tested point, moving to the other right angle coordinate axis to the nearest non-tested point, otherwise repeating the previous step;
the above steps are then repeated until there are no unmeasured test points, ending the movement.
That is, when the movement mode of the mechanical arm 50 is set, the signal receiving element 40 should be prevented from repeatedly moving to the tested test point in the moving process, that is, avoiding the repeated path, thereby reducing the total stepping distance and improving the test efficiency.
Referring to fig. 1 to 4, in an embodiment of the present application, after adjusting the initial positions of the signal emitting member 30, the sample 200 to be tested and the signal receiving member 40, step S1 further includes:
the adjusting signal emitting part 30 and the signal receiving part 40 are respectively positioned at two opposite sides of the tested sample 200 so as to perform transmission performance near-field test;
alternatively, the conditioning signal transmitter 30 and the signal receiver 40 are simultaneously located on the same side of the sample 200 to be tested for near-field testing of reflectance properties.
In one embodiment of the present application, S1, adjusting the initial positions of the signal emitting member 30, the measured sample 200, and the signal receiving member 40 includes:
s11, adjusting the initial level of the signal transmitting element 30, the measured sample 200 and the signal receiving element 40, wherein the initial level comprises the following specific steps:
s111, the first height displacement frame 24 and the second height displacement frame 72 are adjusted by the laser alignment gauge to calibrate the geometric centers of the signal emitter 30 and the sample 200 to be measured and the central axis to be located on the plane parallel to the table top 11.
Specifically, the first height displacement frame 24 and the second height displacement frame 72 are respectively provided with an adjusting knob, and the laser alignment gauge is used for providing an adjusting target position datum line, so that the height adjustment of the signal emitting part 30 and the measured sample 200 can be conveniently performed through the adjusting knobs.
S112, adjusting the horizontal displacement frame 23 through a laser alignment gauge so that the geometric center and the central axis of the signal transmitting piece 30 and the measured sample 200 are positioned on a straight line parallel to the table top 11;
specifically, the horizontal displacement frame 23 is also provided with an adjusting knob for adjusting the positions of the signal emitter 30 and the sample 200 to be measured.
S113, the position of the signal receiving element 40 is adjusted through the laser alignment instrument and the mechanical arm 50 so that the geometric center of the signal receiving element 40 is positioned on the normal line of the center of the measured sample 200.
Specifically, the mechanical arm 50 is a six-axis mechanical arm, and the movement of the six-axis mechanical arm is controlled to drive the signal receiving element 40, so as to realize position adjustment.
Therefore, the calibration flow of near-field measurement of the electromagnetic super-surface can be simplified by using the platform 10, the bracket 20 and the laser alignment rope instrument under the premise of high precision; the high degree of freedom and flexibility of the turntable 22 and the mechanical arm 50 are utilized to realize the compatibility of near-field measurement of the transmission and reflection performance of the electromagnetic super surface.
In one embodiment of the present application, after adjusting the initial positions of the signal emitting member 30, the measured sample 200, and the signal receiving member 40, S1 further includes: the rotary table 22 is rotated to make the incident electromagnetic signal emitted by the signal emitting member 30 form a preset included angle with the plane of the sample 200 to be measured.
In the measurement of the transmittance, referring to fig. 3, the horizontal rotation angle θ of the signal receiving element 40 is adjusted by the mechanical arm 50, so that the signal receiving element 40 is perpendicular to the measured sample 200, and the mechanical arm 50 is moved according to the coordinate transformation so that the relative position and the horizontal height of the signal receiving element 40 and the measured sample 200 are kept unchanged, and the signal receiving element 40 and the signal transmitting element 30 are located at two opposite sides of the measured sample 200.
Or, referring to fig. 4, when the reflection performance is measured, the horizontal rotation angle pi- θ of the signal receiving element 40 is adjusted by the mechanical arm 50, so that the signal receiving element 40 is perpendicular to the measured sample 200, and the mechanical arm 50 is moved according to the coordinate transformation to make the relative position and horizontal height of the signal receiving element 40 and the measured sample 200 symmetrical after adjustment, and the signal receiving element 40 and the signal transmitting element 30 are located at the same side of the measured sample 200.
Since the sample 200 is moved and rotated on the base 71, it is necessary to convert points fixed with respect to the coordinate system of the sample 200 to coordinates on the fixed coordinate system in the system using coordinate transformation, and the points include coordinates of the points of the scan measurement lattice with the signal receiving element 40 aligned with the origin position of the sample 200.
Taking the six-axis mechanical arm 50 as an example, since the six-axis mechanical arm 50 is usually fixed on the table top 11, and the above points are reached by moving the signal receiving element 40 at the end of the mechanical arm 50, the fixed coordinate system in the system can be the base coordinate system of the six-axis mechanical arm 50, the coordinate system is set as a rectangular coordinate system, and the X axis is the extending direction of the base 71, namely the first direction; the Y axis is the vertical direction of the base 71, i.e., the second direction; the Z axis is vertical to the direction of the table top 11, namely a third direction; step S11, after the level adjustment is completed, coordinates (a, b, c) of the signal receiving element 40 are obtained by six-axis coordinate transformation of the mechanical arm 50 and one-time tool coordinate transformation, and the center coordinates (a+l, b, c) of the measured sample 200 are obtained by setting the distance between the signal receiving element 40 and the center of the measured sample 200 as l; because the measured sample 200 rotates by an angle θ, the transformation from the coordinate system of the measured sample 200 to the base coordinate system of the six-axis mechanical arm 50 requires first rotating by an angle θ and then moving by a+l, b, c along the X, Y, Z axes, respectively; assuming that the coordinates of the point in the coordinate system of the measured sample 200 are (x ', y ', z '), and the coordinates of the point in the base coordinate system of the six-axis mechanical arm 50 are (x, y, z), the following formula is used for coordinate conversion:
In step S2, the array lattice may be regarded as a point having a distance l from the coordinate plane of the sample 200. In this way, the plane scanning flow steps are provided, so that the main control computer 61, the mechanical arm 50 and the radio frequency signal receiving and transmitting unit 62 automatically interact, the manual operation in the near field scanning process is omitted, the scanning speed is optimized, and the efficiency and the accuracy of near field testing are improved.
The electromagnetic super-surface near-field measurement method simplifies the calibration flow of electromagnetic super-surface near-field measurement, and simultaneously realizes the compatibility of transmission and reflection performance near-field measurement of the electromagnetic super-surface by utilizing the high degree of freedom and flexibility of the bracket 20 and the mechanical arm 50; and a plane scanning flow step is provided, so that the main control computer 61, the mechanical arm 50 and the radio frequency signal receiving and transmitting unit 62 automatically interact, the manual operation in the near field scanning process is omitted, the scanning speed is optimized, and the efficiency and the precision of near field testing are improved.
The above embodiments are only for illustrating the technical solution of the present application, and are not limiting; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical scheme described in the foregoing embodiments can be modified or some technical features thereof can be replaced by equivalents; such modifications and substitutions do not depart from the spirit and scope of the technical solutions of the embodiments of the present application, and are intended to be included in the scope of the present application.
Claims (8)
1. An electromagnetic subsurface near field measurement device, comprising:
an optical platform having a mesa;
the base is arranged on the table top and extends along a first direction;
the support is arranged on the table top and comprises a sliding block, a rotating table, a horizontal displacement frame and a first height displacement frame, wherein the horizontal displacement frame is fixedly connected with the sliding block along the first direction, the rotating table is arranged on the sliding block and can horizontally rotate relative to the sliding block, the horizontal displacement frame is arranged on the rotating table and can move along the second direction, the second direction is parallel to the table top and forms an included angle with the first direction, the first height displacement frame comprises two parallel displacement frames which are arranged at intervals, the two displacement frames are respectively arranged at the opposite ends of the horizontal displacement frame and form a space for placing a tested sample, and the tested sample is connected with the two displacement frames along the third direction in a sliding manner;
the second height displacement frame is connected to the base in a sliding manner along the first direction;
the signal transmitting piece and the signal receiving piece are arranged on the table top at intervals, the signal transmitting piece is arranged on the second height displacement frame and can move along the third direction, the signal transmitting piece and the measured sample have a preset distance and a preset included angle, and the signal receiving piece is perpendicular to the measured sample;
The mechanical arm is connected with the signal receiving part and is used for driving the signal receiving part to sequentially move to a plurality of test points;
the extension bracket is arranged on the mechanical arm and used for fixing the signal receiving piece, and the extension bracket is made of wood or low-scattering metal;
the control mechanism is respectively and electrically connected with the signal transmitting part, the signal receiving part and the mechanical arm, and is used for controlling the mechanical arm to move, generating electromagnetic signals and transmitting the electromagnetic signals through the signal transmitting part, and the electromagnetic signals are received by the signal receiving part.
2. The electromagnetic subsurface near field measurement device according to claim 1, wherein the electromagnetic subsurface near field measurement device has an initial installed state, and when the electromagnetic subsurface near field measurement device is in the initial installed state, both the geometric center and the central axis of the signal emitting element and the measured sample are located on the same straight line parallel to the table top; the geometric center of the signal receiving element is positioned on a normal line of the geometric center of the measured sample.
3. The electromagnetic super-surface near-field measurement device according to claim 1, further comprising a wave absorbing member provided on both front and rear sides of the sample to be measured, the mesa, a side of the signal receiving member facing away from the bracket, and a peripheral side of the mechanical arm.
4. The electromagnetic subsurface near field measurement device of any one of claims 1-3, wherein the robotic arm is a six axis robotic arm; the signal receiving element is a waveguide antenna or a probe antenna.
5. An electromagnetic super-surface near-field measurement method, characterized in that an electromagnetic super-surface near-field measurement apparatus according to any one of claims 1 to 4 is employed, comprising:
the method comprises the steps that initial positions of a signal transmitting piece, a measured sample and a signal receiving piece are adjusted to enable the electromagnetic super-surface near-field measuring device to be in an initial installation state, the initial positions of the signal transmitting piece, the measured sample and the signal receiving piece are adjusted, initial horizontal heights of the signal transmitting piece, the measured sample and the signal receiving piece are adjusted, and when the electromagnetic super-surface near-field measuring device is in the initial installation state, the geometric centers and the central axes of the signal transmitting piece and the measured sample are all located on the same straight line parallel to the table top; the geometric center of the signal receiving element is positioned on a normal line of the geometric center of the measured sample;
setting a near field measurement frequency point, an array length and width and a stepping distance, and establishing an array lattice Am X Bn, wherein the array lattice is positioned on a plane perpendicular to the central lines of the signal receiving piece and the tested sample;
Moving the signal receiving part to an initial test point through a mechanical arm, and recording first data of the signal receiving part;
moving the signal receiving part to the next test point through the mechanical arm again, and recording second data of the signal receiving part;
repeating the moving and stepping processes until the scanning of the Am X Bn array points is completed, and recording the data corresponding to the signal receiving piece at each test point.
6. The electromagnetic subsurface near field measurement method according to claim 5, wherein after adjusting the initial positions of the signal transmitting member, the sample under test and the signal receiving member, further comprising:
the signal transmitting piece and the signal receiving piece are respectively positioned at two opposite sides of the tested sample so as to perform transmission performance near-field test;
or adjusting the signal transmitting piece and the signal receiving piece to be positioned on the same side of the tested sample at the same time so as to perform the reflection performance near-field test.
7. The method of claim 6, wherein the adjusting the initial level of the signal transmitting member, the sample under test and the signal receiving member comprises:
the first height displacement frame and the second height displacement frame are adjusted through the laser alignment rope instrument so as to calibrate the geometric centers of the signal transmitting piece and the measured sample and the central axis to be positioned on a plane parallel to the table top;
The horizontal displacement frame is adjusted through the laser alignment rope instrument, so that the geometric centers and the central axes of the signal transmitting piece and the measured sample are positioned on a straight line parallel to the table top;
and adjusting the position of the signal receiving part through the laser alignment instrument and the mechanical arm so that the geometric center of the signal receiving part is positioned on a normal line of the geometric center of the measured sample.
8. The electromagnetic subsurface near field measurement method according to claim 7, wherein after adjusting the initial positions of the signal transmitting member, the sample under test and the signal receiving member, further comprising: rotating a rotating table to enable an incident electromagnetic signal sent by the signal transmitting piece and a plane where the tested sample is located to form a preset included angle;
when the transmission performance is measured, the horizontal rotation angle theta of the signal receiving part is adjusted through the mechanical arm, so that the signal receiving part is perpendicular to the measured sample, the mechanical arm is moved according to coordinate transformation so that the relative position and the horizontal height of the signal receiving part and the measured sample are kept unchanged, and the signal receiving part and the signal transmitting part are positioned on two opposite sides of the measured sample;
Or when the reflection performance is measured, the horizontal rotation angle pi-theta of the signal receiving part is regulated by the mechanical arm, so that the signal receiving part is vertical to the measured sample, the mechanical arm is moved according to coordinate transformation, the position of the signal receiving part after regulation and the position of the signal receiving part before regulation are symmetrical relative to the measured sample, and the signal receiving part and the signal transmitting part are positioned on the same side of the measured sample.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310446737.5A CN116539966B (en) | 2023-04-14 | 2023-04-14 | Electromagnetic super-surface near-field measurement device and electromagnetic super-surface near-field measurement method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202310446737.5A CN116539966B (en) | 2023-04-14 | 2023-04-14 | Electromagnetic super-surface near-field measurement device and electromagnetic super-surface near-field measurement method |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN116539966A CN116539966A (en) | 2023-08-04 |
| CN116539966B true CN116539966B (en) | 2024-02-27 |
Family
ID=87442698
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202310446737.5A Active CN116539966B (en) | 2023-04-14 | 2023-04-14 | Electromagnetic super-surface near-field measurement device and electromagnetic super-surface near-field measurement method |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN116539966B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117665414B (en) * | 2024-01-31 | 2024-04-26 | 深圳大学 | Near field measurement method, device, terminal and readable storage medium |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7791355B1 (en) * | 2007-10-30 | 2010-09-07 | The United States Of America As Represented By The Secretary Of The Air Force | Near field free space anisotropic materials characterization |
| CN103969215A (en) * | 2014-05-15 | 2014-08-06 | 中国石油大学(北京) | Terahertz time-domain spectroscopy system and measurement method thereof |
| CN106442389A (en) * | 2016-08-22 | 2017-02-22 | 中国电子科技集团公司第四十研究所 | Multifunctional terahertz spectrum and imaging measurement module and measurement methods thereof |
| CN108663578A (en) * | 2018-04-28 | 2018-10-16 | 上海交通大学 | Reflection for microwave/millimeter wave frequency range vortex electromagnetic wave and transmission test device |
| CN109085585A (en) * | 2018-09-29 | 2018-12-25 | 厦门大学 | The acquisition of microwave and millimeter wave three-dimensional near-field data and imaging system |
| CN112858794A (en) * | 2021-01-22 | 2021-05-28 | 北京大学 | System and method for measuring scattering parameters of ultrathin reflection-type electromagnetic super surface |
| WO2022096460A1 (en) * | 2020-11-03 | 2022-05-12 | Nil Technology Aps | Folded optical paths incorporating metasurfaces |
| CN114487618A (en) * | 2022-01-27 | 2022-05-13 | 北京航空航天大学 | Composite material low-frequency electromagnetic parameter equivalent extraction device and method |
| CN115378515A (en) * | 2022-07-11 | 2022-11-22 | 华南理工大学 | Test system and test method for intelligent reflecting surface |
| CN218767124U (en) * | 2022-05-20 | 2023-03-28 | 苏州益谱电磁科技有限公司 | Phased array antenna test system |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11646805B2 (en) * | 2020-07-27 | 2023-05-09 | Raytheon Company | Advanced radio frequency bidirectional reflectance distribution function measurement device |
-
2023
- 2023-04-14 CN CN202310446737.5A patent/CN116539966B/en active Active
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7791355B1 (en) * | 2007-10-30 | 2010-09-07 | The United States Of America As Represented By The Secretary Of The Air Force | Near field free space anisotropic materials characterization |
| CN103969215A (en) * | 2014-05-15 | 2014-08-06 | 中国石油大学(北京) | Terahertz time-domain spectroscopy system and measurement method thereof |
| CN106442389A (en) * | 2016-08-22 | 2017-02-22 | 中国电子科技集团公司第四十研究所 | Multifunctional terahertz spectrum and imaging measurement module and measurement methods thereof |
| CN108663578A (en) * | 2018-04-28 | 2018-10-16 | 上海交通大学 | Reflection for microwave/millimeter wave frequency range vortex electromagnetic wave and transmission test device |
| CN109085585A (en) * | 2018-09-29 | 2018-12-25 | 厦门大学 | The acquisition of microwave and millimeter wave three-dimensional near-field data and imaging system |
| WO2022096460A1 (en) * | 2020-11-03 | 2022-05-12 | Nil Technology Aps | Folded optical paths incorporating metasurfaces |
| CN112858794A (en) * | 2021-01-22 | 2021-05-28 | 北京大学 | System and method for measuring scattering parameters of ultrathin reflection-type electromagnetic super surface |
| CN114487618A (en) * | 2022-01-27 | 2022-05-13 | 北京航空航天大学 | Composite material low-frequency electromagnetic parameter equivalent extraction device and method |
| CN218767124U (en) * | 2022-05-20 | 2023-03-28 | 苏州益谱电磁科技有限公司 | Phased array antenna test system |
| CN115378515A (en) * | 2022-07-11 | 2022-11-22 | 华南理工大学 | Test system and test method for intelligent reflecting surface |
Also Published As
| Publication number | Publication date |
|---|---|
| CN116539966A (en) | 2023-08-04 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN116539966B (en) | Electromagnetic super-surface near-field measurement device and electromagnetic super-surface near-field measurement method | |
| US5119105A (en) | M&A for performing near field measurements on a dish antenna and for utilizing said measurements to realign dish panels | |
| US5365241A (en) | Method and apparatus for performing planar near-field antenna measurement using bi-polar geometry | |
| CN201266180Y (en) | Measuring apparatus for reflection index of wave suction material | |
| CN116047436A (en) | Near-field amplitude-phase calibration method, system and equipment for active phased array radar antenna | |
| CN215894766U (en) | Sliding type compact range air interface test equipment | |
| CN108562801A (en) | A kind of array antenna test system and its test method | |
| CN114001666B (en) | Terahertz scanning imaging device suitable for large-scale complex curved surface object | |
| CN106405256B (en) | A kind of test and compensation method of the scattering of planar near-field darkroom | |
| CN113125101A (en) | Five-degree-of-freedom probe clamping device for pneumatic probe calibration | |
| KR20160074229A (en) | Method of Measuring the Display and Device of Measuring the Display | |
| CN104037486B (en) | Accurate single station microwave dark room test system antenna holder | |
| CN217931823U (en) | Combined type near-field far-field antenna test system | |
| CN109541324A (en) | Element antenna phase center measurement method in a kind of battle array based on Compact Range | |
| JP4099367B2 (en) | Method for calibrating and aligning multiple multi-axis motion stages for optical alignment with planar waveguide devices and systems | |
| US20140104092A1 (en) | Radiation signal measurement system for millimeter wave transceivers | |
| CN206178127U (en) | Accurate running gear and calbiration system of antenna / field probe extrapolation calibration usefulness | |
| CN115542024A (en) | Antenna pattern near field measurement method | |
| CN216051957U (en) | Multifunctional antenna test system | |
| CN219085119U (en) | Multi-band free space test system adopting plane scanning | |
| CN112578327A (en) | Calibration method, equipment and storage medium of spherical scanning test system | |
| JP2013083455A (en) | Radio wave measuring apparatus and radio wave measuring method | |
| CN220019687U (en) | Outdoor low-cost antenna radiation characteristic test platform | |
| CN211740264U (en) | Multi-degree-of-freedom photoelectric correlation sensor testing device | |
| CN221007862U (en) | Radar test system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |