CN116245055A - Effective random test vector determining system based on time sequence type coverage database - Google Patents
Effective random test vector determining system based on time sequence type coverage database Download PDFInfo
- Publication number
- CN116245055A CN116245055A CN202211174195.2A CN202211174195A CN116245055A CN 116245055 A CN116245055 A CN 116245055A CN 202211174195 A CN202211174195 A CN 202211174195A CN 116245055 A CN116245055 A CN 116245055A
- Authority
- CN
- China
- Prior art keywords
- coverage
- time
- mth
- point
- database
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 215
- 239000013598 vector Substances 0.000 title claims abstract description 69
- 238000004088 simulation Methods 0.000 claims description 35
- 238000000034 method Methods 0.000 claims description 25
- 238000013461 design Methods 0.000 claims description 17
- 238000004590 computer program Methods 0.000 claims description 16
- 238000012795 verification Methods 0.000 description 14
- 230000008569 process Effects 0.000 description 13
- 238000013507 mapping Methods 0.000 description 10
- 238000012545 processing Methods 0.000 description 8
- 238000010586 diagram Methods 0.000 description 3
- 238000012163 sequencing technique Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000012804 iterative process Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F30/00—Computer-aided design [CAD]
- G06F30/30—Circuit design
- G06F30/32—Circuit design at the digital level
- G06F30/33—Design verification, e.g. functional simulation or model checking
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Evolutionary Computation (AREA)
- Geometry (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
The invention relates to an effective random test vector determining system based on a time sequence type coverage database, which is used for realizing the steps E1, and acquiring coverage information records corresponding to each coverage point in a second preset coverage point set corresponding to an mth random test case; step E2, determining a time sequence { T } x ，T x+1 ，…，T y‑1 ,T y } and D j Test vector start time v of (2) x j And test vector endpoint time v y j ，T x As the starting point time, T y For the end time T y ，x<y; step E3, obtaining the first coverage time index of the coverage time field as T i Is denoted as T i Corresponding coverage point increment F of (2) i Generate { F x ，F x+1 ，…F y‑1 ，F y -a }; step E4, v x j And v y j D with corresponding coverage point increment not being 0 j Is determined to be a valid random test vector. The book is provided withThe invention improves the efficiency of regression testing and reduces the cost of regression testing.
Description
Technical Field
The invention relates to the technical field of digital circuit verification, in particular to an effective random test vector determining system based on a time sequence type coverage database.
Background
In the digital circuit verification process, multiple test cases are usually required to perform regression testing to obtain a coverage database, and coverage rate is obtained based on the coverage database to verify the digital circuit. And the traditional coverage database only records whether the coverage points are covered or not, and then the fusion of a plurality of databases is obtained through regression test to obtain the overall coverage rate of the design. However, due to the huge data volume, the existing coverage database does not record the coverage time corresponding to the coverage point, and only the coverage database can know whether the coverage point is covered or not, and the coverage time corresponding to the coverage point cannot be obtained, so that the prior art at least has the following technical problems:
(1) The number of the regression test cases of the digital circuit is large, a large amount of computing resources are required to be consumed, and an effective simulation time period cannot be determined based on the traditional coverage database, so that a large amount of computing resources are used for invalid simulation, the regression test time is long, and the regression test efficiency is low.
(2) The use of random constraints to generate test vectors is a common method for digital circuit simulation verification, but most of the random constraints to generate a large number of test vectors do not contribute to the improvement of coverage rate, and the test vectors contributing to the coverage rate cannot be determined based on a traditional coverage database, so that regression test time is long.
(3) For digital circuits, regression testing is very difficult to debug, and a traditional overlay database cannot provide accurate debugging information in a legal way, often requires engineers to guess the starting point and starting time of debugging according to experience and error conditions, and if the guessing is wrong, multiple attempts are needed, so that a great deal of time is consumed, the debugging efficiency is low, and the cost is high.
Disclosure of Invention
The invention aims to provide an effective random test vector determining system based on a time sequence type coverage database, which is used for determining an effective random test vector corresponding to a test case based on time corresponding to a coverage point, so that the regression test efficiency is improved, and the regression test cost is reduced.
The invention provides an effective random test vector determining system based on a time sequence type coverage database, which comprises a pre-generated mth time sequence type coverage database, a processor and a memory storing a computer program, wherein the value range of M is 1 to M, M is the total number of random test cases corresponding to a digital circuit to be tested, and the mth time sequence type coverage database is used for storing a first coverage point corresponding to the mth random test caseThe method comprises the steps that a coverage information record of each coverage point in a set is formed, the first coverage point set is a subset of a complete set of the coverage points of the digital circuit to be tested, the coverage information record comprises a coverage point identification field and a coverage time field, the coverage time field is used for storing a coverage time index corresponding to the coverage point, each coverage time index corresponds to one simulation time, the coverage time field is provided with the same coverage initial value, and the coverage initial value indicates that the corresponding coverage point is not covered; the mth random test case comprises P random test vectors, D j For the j-th random test vector, j has a value ranging from 1 to P and D j+1 Based on D j Randomly generating;
when the processor executes the computer program, the following steps are implemented:
E1, acquiring a coverage information record corresponding to each coverage point in a preset second coverage point set corresponding to an mth random test case from the mth time sequence type coverage database, wherein the second coverage point set is a subset of the first coverage point set;
step E2, determining a time sequence { T } according to the coverage information records corresponding to all coverage points in the second coverage point set x ，T x+1 ，…，T y-1 ,T y } and D j Test vector start time v of (2) x j And test vector endpoint time v y j ，T i The ith simulation time, i has a value range of x to y, T x As the starting point time, T y For the end time T y ，x<y,v x j And v y j Belongs to { T ] x ，T x+1 ，…，T y-1 ,T y }；
Step E3, acquiring a first coverage time index T in the coverage time field from the coverage information records corresponding to all coverage points in the second coverage point set i Is denoted as T i Corresponding coverage point increment F of (2) i Generate { F x ，F x+1 ，…F y-1 ，F y }；
Step E4, based on { T ] x ，T x+1 ，…，T y-1 ,T y }、{F x ，F x+1 ，…F y-1 ，F y Will v x j And v y j D with corresponding coverage point increment not being 0 j And determining the effective random test vector, and constructing an effective random test vector set corresponding to the mth random test case.
Compared with the prior art, the invention has obvious advantages and beneficial effects. By means of the technical scheme, the effective random test vector determining system based on the time sequence type coverage database can achieve quite technical progress and practicality, has wide industrial utilization value, and has at least the following advantages:
According to the invention, the effective random test vector set corresponding to each mth random test case can be obtained, and in the subsequent regression test, each mth test case only needs to execute the effective random test vector set without executing the ineffective random test vectors, so that the useless regression test operation time is reduced, the regression test efficiency is improved, and the verification efficiency of the digital circuit is further improved.
The foregoing description is only an overview of the present invention, and is intended to be implemented in accordance with the teachings of the present invention, as well as the preferred embodiments thereof, together with the following detailed description of the invention, given by way of illustration only, together with the accompanying drawings.
Drawings
FIG. 1 is a schematic diagram of determining a simulation termination time corresponding to a test case based on a time-series coverage database according to an embodiment of the present invention;
FIG. 2 is a schematic diagram of determining an effective execution area corresponding to a test case based on a time-series coverage database according to an embodiment of the present invention;
FIG. 3 is a schematic diagram of determining an intent of a valid random test vector set based on a time-sequential coverage database according to an embodiment of the present invention;
Fig. 4 is a flowchart of regression testing and debugging based on a time-series coverage database according to an embodiment of the present invention.
Detailed Description
In order to further describe the technical means and effects adopted for achieving the preset purpose of the present invention, the following detailed description refers to the specific implementation of a regression testing system based on a time-series coverage database and the effects thereof according to the present invention with reference to the accompanying drawings and the preferred embodiments.
The existing coverage database of the digital circuit only records whether the coverage points are covered or not, but not records the coverage point time, on one hand, the coverage database has huge data volume, and if each coverage point records the coverage time, a large amount of resources are required to process a larger amount of data, so that the verification efficiency of the digital circuit can be reduced. On the other hand, in the prior art, there is no way to optimize the regression test or the regression debugging based on the coverage time, and therefore, the first embodiment provides a time-series coverage database acquisition technology, and as an embodiment, the digital circuit may be specifically a digital circuit for chip design, verification, and the like.
Example 1
An embodiment provides a regression testing system based on a time sequence type coverage database, which comprises an mth time sequence type coverage database, a processor and a memory storing a computer program, wherein the value range of M is 1 to M, and M is the total number of test cases corresponding to a digital circuit to be tested. The mth time sequence type coverage database is used for storing coverage information records of each coverage point in a first coverage point set corresponding to the mth test case, and the first coverage point set is a subset of the whole set of coverage points of the digital circuit to be tested. It should be noted that, because the digital circuit is complex, the composition modules are more, the data volume is large, and each test case may only verify for part of the composition modules of the digital circuit, therefore, only the coverage points needing to be concerned are set to form the first coverage point set to generate the corresponding mth time sequence type coverage database, the data volume of the mth time sequence type coverage database is reduced, and the data processing efficiency is improved.
The coverage information record comprises a coverage point identification field and a coverage time field, the coverage time field is used for storing coverage time indexes corresponding to the coverage points, each coverage time index corresponds to one simulation time, the coverage time fields are provided with the same coverage initial value, the coverage initial value indicates that the corresponding coverage points are not covered, for example, the coverage initial value can be set to 0. It should be noted that, the mth time sequence type coverage database may directly arrange the coverage information records according to a preset sequence, and update the corresponding coverage time field later. The coverage information records may also be generated one by one according to the coverage sequence, and the manner of generating the time sequence type coverage database by using the coverage information record data structure falls within the protection scope of the present invention, which is not limited herein. It can be understood that the time-series coverage database according to the embodiment of the present invention refers to a coverage database containing coverage time information.
When the processor executes the computer program, the following steps are implemented:
and G1, inputting the mth test case into a digital circuit to be tested for operation.
Step G2, when the digital circuit to be detected is monitored to generate a coverage event, acquiring current coverage event information;
And G3, analyzing the current coverage event information to obtain a current coverage point identifier, and if the current coverage point identifier belongs to a first coverage point set, obtaining corresponding current coverage time, and executing the step G4.
And G4, filling in a coverage time index corresponding to the current coverage time into a coverage time field of a coverage information record corresponding to the current coverage point identifier in the mth time sequence type coverage database.
And G5, after the running of the mth test case is finished, generating the mth time sequence coverage database.
And G6, determining the effective regression time of the mth test case based on the mth time sequence type coverage database.
It can be understood that, for any mth test case, the corresponding mth time sequence coverage database can be generated through the steps G1-G5, and then the effective regression time of the mth test case is obtained through the step G6, and in the subsequent regression test, the mth test case is configured to be executed only in the corresponding effective regression time, so that the efficiency of the regression test is improved.
As an embodiment, the system further includes a time index mapping table, where the time index mapping table is configured to store mapping relationships between the overlay time information and the overlay time index, and a data length of the overlay time index is smaller than a data length of the overlay time information, for example, the overlay time is 10, and the corresponding overlay time index is set to 1; the coverage time is 112, and the corresponding coverage time index is set to 2; the coverage time is 150, the corresponding coverage time index is set to 3, etc., so that the data amount stored in the coverage time field can be greatly reduced, and the data processing efficiency is improved, and the step G3 further includes:
And step G31, if the current coverage time has a corresponding coverage time index in the time index mapping table, executing step G4, otherwise, executing step G4 after adding the coverage time index corresponding to the current coverage time in the time index mapping table.
It will be appreciated that the same overlay time corresponds to a unique time index, and that in a simulation of the same test case, one overlay point may be overlaid multiple times at different overlay times, and thus may correspond to multiple time indexes. Different coverage points may be covered at the same time such that different coverage points correspond to the same coverage time index. If one of the overlay point clocks is not overlaid, the overlay time field is always an overlay initial value.
As an embodiment, the coverage time field is configured to store a coverage time index number threshold G, and in step G3, if the current coverage point identifier belongs to the first coverage point set, the method further includes:
and G32, judging whether the coverage time field corresponding to the current coverage point identifier stores G coverage time indexes, if so, not storing the coverage time indexes into the corresponding coverage information record, otherwise, executing to acquire the corresponding current coverage time, and executing the step G4.
For example, G may be set to 3, so that at most 3 coverage time indexes are recorded in each coverage information record, and the coverage is not recorded any more after the coverage, so that the size of the time-sequence coverage database is further reduced, and it is understood that the value of G may be set according to the specific application requirement.
Regression testing is usually an iterative process, and in some application scenarios, the coverage rate has reached a certain value, and only the points that are not covered in part of the modules are further verified later, so that the coverage point in the whole component module in the digital circuit is not required to be used as a first coverage point set, the range of the first coverage point set can be further reduced, and the data volume of the m-th time sequence type coverage database is further reduced. As an embodiment, the system further comprises a reference database, wherein the reference database stores a coverage record corresponding to a first coverage point set, the coverage record is used for recording whether the coverage point has been covered, the first coverage point set is a subset of a complete set of coverage points of the digital circuit to be tested, and when the processor executes the computer program, the following steps are further implemented:
step G10, taking a set of coverage points corresponding to a preset target module of the design to be tested as a fourth coverage point set, wherein the preset target module is a component part of the design to be tested;
And G20, judging whether the coverage points in the fourth coverage point set are covered in the reference database one by one, if so, deleting the coverage points from the fourth coverage point set, and generating a first coverage point set.
Through the steps G10-G20, the range of the first coverage point set can be further reduced on the basis of ensuring the verification of the target coverage point, so that the data volume of the m-th time sequence coverage database is further reduced, and the data processing efficiency is improved.
As another embodiment, the fourth set of coverage points may also be directly used as the first set of coverage points.
Preferably, the first set of coverage points is a proper subset of the complete set of coverage points of the digital circuit under test.
According to the first embodiment, a time sequence type coverage database containing coverage time information can be constructed for each test case, regression test time of each test case is optimized based on the time sequence type coverage database, and the debugging process of regression test can be optimized, so that the regression test efficiency of the digital circuit is improved.
Embodiment II,
On the basis of constructing the time sequence type coverage database in the first embodiment, the second embodiment further provides a specific optimization scene: the step G5 may specifically include:
Step S1, acquiring a coverage information record corresponding to each coverage point in a second coverage point set corresponding to an mth test case from the mth time sequence type coverage database, wherein the second coverage point set is a subset of the first coverage point set.
In the process of optimizing the regression test of the mth test case, the coverage information record corresponding to each coverage point in the second coverage point set to be further analyzed can be further selected from the first coverage point set, so that the data processing amount is further reduced. It will be appreciated that the second set of coverage points may be equal to the first set of coverage points or may be a proper subset of the set of coverage points, depending on the particular application requirements. Preferably, the second set of coverage points is a proper subset of said first set of coverage points.
Step S2, determining a time sequence { T } according to the coverage information records corresponding to all coverage points in the second coverage point set x ，T x+1 ，…，T y-1 ,T y }，T i The ith simulation time, i has a value range of x to y, T x As the starting point time, T y For the end time T y ，x<y。
Wherein T is x ，T x+1 ，…，T y-1 ,T y And sequencing according to the sequence of the coverage time.
Step S3, acquiring a first coverage time index T in a coverage time field from the coverage information records corresponding to all coverage points in the second coverage point set i Is denoted as T i Corresponding coverage point increment F of (2) i Generate { F x ，F x+1 ，…F y-1 ，F y }。
Step S4, based on { T } x ，T x+1 ，…，T y-1 ,T y }、{F x ，F x+1 ，…F y-1 ，F y Determining simulation termination time T corresponding to mth test case to be tested z Z satisfies F z Not equal to 0, and F z+1 To F y Are all equal to 0, x<z≤y。
As an embodiment, the step S1 further includes:
s0, acquiring a starting time T corresponding to the mth test case from the mth time sequence coverage database x And end time T y If T y -T x >T u ,T u For a preset execution time threshold, then determining T through steps S51-S54 z Otherwise, directly connect T y Is determined as T z 。
It can be understood that, when the simulation time of the mth test case is shorter and smaller than the preset execution time threshold, the test time does not need to be further optimized. T (T) u And setting according to specific application requirements.
As an embodiment, the step S4 may specifically include:
and S41, establishing a coordinate system by taking the simulation time as an X axis and the coverage point identification increment as a vertical axis.
Step S42, based on { F ] x ，F x+1 ，…F y-1 ，F y Sum { T } x ，T x+1 ，…，T y-1 ,T y Drawing a coverage point identification incremental curve;
each (T) i ,F i ) Form a corresponding coordinate point positioned at T x And T y And is not in { T ] x ，T x+1 ，…，T y-1 ,T y The increment of coverage point corresponding to simulation time in the } is 0 based on T x And T y And fitting all coordinate points corresponding to the coordinate points to obtain a coverage point identification incremental curve. It should be noted thatThe total amount curve (not drawn in fig. 1) of the coverage point marks corresponding to each simulation time can be drawn at the same time, so that the T can be determined more intuitively z 。
Step S43, determining T based on the coverage point identification increment curve z 。
As shown in the example of FIG. 1, T can be intuitively determined based on the coverage point identification increment curve z 。
As a preferred embodiment, the step S43 includes:
step S431, obtaining a fluctuation area { E } based on the coverage point identification increment curve 1 ，E 2 ，…E N },E 1 ，E 2 ，…E N Arranged in time sequence E n For the N-th fluctuation area, the value range of N is 1 to N, N is more than or equal to 1, E n The corresponding starting period is T a n The end point period is T b n 。
Step S432, if the arbitrary n value satisfies T b n+1 -T a n ≤T d ,T d For a preset first interval time threshold, then T is set b N Is determined as T z 。
T is the same as d Is set according to the specific application requirement, if n does not satisfy T b n+1 -T a n ≤T d The regression testing may be further optimized using the method of embodiment three.
As an embodiment, the step S4 further includes:
s5, inputting M test cases into the current design to be tested and executing, and executing the mth test case to the corresponding T z And when the test case is executed, stopping the execution of the mth test case, and generating a current mth time sequence type coverage database corresponding to the mth test case.
And S6, fusing all the current m-th time sequence type coverage databases to generate coverage corresponding to the current design to be tested.
It should be noted that, the specific implementation process of each mth time sequence type coverage database in the second embodiment is directly implemented by adopting the technical details in the first embodiment, which is not described herein.
It should be noted that, through the steps described in the second embodiment, the simulation termination time T corresponding to each mth test case can be obtained z In the subsequent regression test, each mth test case is executed until the corresponding simulation termination time T z The method can be terminated, reduces the operation time of the useless regression test, and improves the efficiency of the regression test, thereby improving the verification efficiency of the digital circuit.
Third embodiment,
If the value of any n meets T b n+1 -T a n ≤T d ,T d For the preset first interval time threshold, T can be determined directly in the manner described in embodiment one z And optimizing the regression test. But if there is n which does not satisfy T b n+1 -T a n ≤T d In the middle, too many useless regression tests may be performed, and on the basis of this, the third embodiment proposes a way to further optimize the regression tests.
The third embodiment provides an effective execution area determining system based on a time sequence type coverage database, which comprises a pre-generated mth time sequence type coverage database, a processor and a memory storing a computer program, wherein the value range of M is 1 to M, M is the total number of test cases corresponding to a digital circuit to be tested, the mth time sequence type coverage database is used for storing coverage information records of each coverage point in a first coverage point set corresponding to the mth test case, the first coverage point set is a subset of a complete set of coverage points of the digital circuit to be tested, the coverage information records comprise coverage point identification fields and coverage time fields, the coverage time fields are used for storing coverage time indexes corresponding to the coverage points, each coverage time index corresponds to one simulation time, the coverage time fields are provided with the same coverage initial values, and the coverage initial values represent that the corresponding coverage points are not covered.
When the processor executes the computer program, the following steps are implemented:
and C1, acquiring a coverage information record corresponding to each coverage point in a second coverage point set corresponding to an mth test case from the mth time sequence type coverage database, wherein the second coverage point set is a subset of the first coverage point set.
It should be noted that, in the process of optimizing the regression test of the mth test case, the coverage information record corresponding to each coverage point in the second coverage point set that needs to be further analyzed may be further selected from the first coverage point set, so as to further reduce the data processing amount, and it may be understood that the second coverage point set may be equal to the first coverage point set, or may be a proper subset of the coverage point set, according to the specific application requirement. Preferably, the second set of coverage points is a proper subset of said first set of coverage points.
Step C2, determining a time sequence { T } according to the coverage information records corresponding to all coverage points in the second coverage point set x ，T x+1 ，…，T y-1 ,T y }，T i The ith simulation time, i has a value range of x to y, T x As the starting point time, T y For the end time T y ，x<y。
Wherein T is x ，T x+1 ，…，T y-1 ,T y And sequencing according to the sequence of the coverage time.
Step C3, acquiring the first coverage time index T in the coverage time field from the coverage information records corresponding to all coverage points in the second coverage point set i Is denoted as T i Corresponding coverage point increment F of (2) i Generate { F x ，F x+1 ，…F y-1 ，F y }。
Step C4, based on { T ] x ，T x+1 ，…，T y-1 ,T y }、{F x ，F x+1 ，…F y-1 ，F y Determining an effective execution area { W } corresponding to an mth test case to be tested 1 ，W 2 ，…W K }，W k For the kth effective execution area, K has a value ranging from 1 to K, W k Including corresponding execution areasDomain start time t x k And execution area end time t y k ，W k The increment of the coverage point corresponding to each simulation time is larger than 0, or the time interval of the increment of the coverage point continuously equal to 0 is smaller than a preset second interval time threshold.
As an embodiment, the system further includes an mth execution state database, where the execution state database is configured to store execution state information corresponding to each simulation time of the digital circuit under test based on the mth test case, and after the step C4 further includes:
step C5, obtaining t from the mth execution state database x k Corresponding execution state information as W k Execution start point state information execution W of (a) k 。
As an embodiment, the step C4 includes:
and C41, establishing a coordinate system by taking the simulation time as an X axis and the coverage point identification increment as a vertical axis.
Step C42, based on { F ] x ，F x+1 ，…F y-1 ，F y Sum { T } x ，T x+1 ，…，T y-1 ,T y Drawing a coverage point identification delta curve.
Each (T) i ,F i ) Form a corresponding coordinate point positioned at T x And T y And is not in { T ] x ，T x+1 ，…，T y-1 ,T y The increment of coverage point corresponding to simulation time in the } is 0 based on T x And T y And fitting all coordinate points corresponding to the coordinate points to obtain a coverage point identification incremental curve.
Step C43, determining { W } based on the coverage point identification incremental curve 1 ，W 2 ，…W K }。
As an embodiment, the step C43 includes:
step C431, obtaining a fluctuation area { E } based on the coverage point identification increment curve 1 ，E 2 ，…E N },E 1 ，E 2 ，…E N Arranged in time sequence，E n For the N-th fluctuation area, the value range of N is 1 to N, N is more than or equal to 1, E n The corresponding starting period is T a n The end point period is T b n 。
Step C432, if T b n+1 -T a n ≤T d ,T d For a preset third interval time threshold, which is smaller than the preset third interval time threshold, E n And E is n+1 Dividing into one effective execution area, otherwise dividing into two effective execution areas to generate { W ] 1 ，W 2 ，…W K }。
It should be noted that, the total amount curve of the coverage point marks corresponding to each simulation time can be drawn at the same time, so { W ] can be determined more intuitively 1 ，W 2 ，…W K }. Preferably, K is less than or equal to 3, as in the example shown in fig. 2, curve 1 represents a coverage point identification increment curve, curve 2 represents a coverage point identification total amount curve, and 3 oval-marked areas are { W determined based on the coverage point identification increment curve 1 ，W 2 ，…W K }。
As an embodiment, the step C1 further includes:
step C0, obtaining the starting time T corresponding to the mth test case from the mth time sequence coverage database x And end time T y If T y -T x >T u ,T u For the preset execution time threshold, determining { W ] through steps C1-C4 1 ，W 2 ，…W K }。
It can be understood that, when the simulation time of the mth test case is shorter and smaller than the preset execution time threshold, the test time does not need to be further optimized. T (T) u And setting according to specific application requirements.
As an embodiment, the step C5 further includes:
step C6, inputting M test cases into the current design to be tested and executing, if the mth test case has the corresponding { W } 1 ，W 2 ，…W K Based on W }, then k Execution start point state information of (1), from t x k Beginning to execute the mth test case and executing to t y k When ending execution of W k Generating a current mth time sequence type coverage database corresponding to the mth test case; otherwise, directly executing the mth test case, and generating a current mth time sequence type coverage database corresponding to the mth test case;
and C7, fusing all the current m-th time sequence type coverage databases to generate coverage corresponding to the current design to be tested.
It should be noted that, in the third embodiment, the specific implementation process of each mth time sequence type coverage database is directly implemented by adopting the technical details in the first embodiment, which is not described herein.
It should be noted that, through the steps described in the third embodiment, the effective execution area { W) corresponding to each mth test case may be obtained 1 ，W 2 ，…W K In the subsequent regression test, each mth test case only executes the corresponding effective execution area { W } 1 ，W 2 ，…W K And the operation time of the useless regression test is reduced, and the efficiency of the regression test is improved, so that the verification efficiency of the digital circuit is improved.
Fourth embodiment,
The digital circuit verification further comprises using random constraints to generate test vectors to simulate the digital circuit verification, inputting one test vector to the digital circuit to run, each test vector randomly generating a next test vector to run, the next test vector continuing to randomly generate a further test vector, and so on. However, some test vectors may not contribute to the regression test, so that random test verification can be optimized, based on which the present invention proposes embodiment four.
A fourth embodiment provides an effective random test vector determining system based on a time-sequence coverage database, including a pre-generated mth time-sequence coverage database, a processor and a memory storing a computer program, where M ranges from 1 to M, and M is a random number corresponding to a digital circuit to be tested The method comprises the steps that a machine test case total number is stored in an mth time sequence type coverage database, wherein the mth time sequence type coverage database is used for storing coverage information records of each coverage point in a first coverage point set corresponding to an mth random test case, the first coverage point set is a subset of a digital circuit coverage point complete set to be tested, the coverage information records comprise coverage point identification fields and coverage time fields, the coverage time fields are used for storing coverage time indexes corresponding to the coverage points, each coverage time index corresponds to one simulation time, the coverage time fields are provided with the same coverage initial value, and the coverage initial value indicates that the corresponding coverage point is not covered; the mth random test case comprises P random test vectors, D j For the j-th random test vector, j has a value ranging from 1 to P and D j+1 Based on D j And (5) randomly generating.
When the processor executes the computer program, the following steps are implemented:
and E1, acquiring a coverage information record corresponding to each coverage point in a preset second coverage point set corresponding to the mth random test case from the mth time sequence type coverage database, wherein the second coverage point set is a subset of the first coverage point set.
It should be noted that, in the process of optimizing the regression test of the mth test case, the coverage information record corresponding to each coverage point in the second coverage point set that needs to be further analyzed may be further selected from the first coverage point set, so as to further reduce the data processing amount, and it may be understood that the second coverage point set may be equal to the first coverage point set, or may be a proper subset of the coverage point set, according to the specific application requirement. Preferably, the second set of coverage points is a proper subset of said first set of coverage points.
Step E2, determining a time sequence { T } according to the coverage information records corresponding to all coverage points in the second coverage point set x ，T x+1 ，…，T y-1 ,T y } and D j Test vector start time v of (2) x j And test vector endpoint time v y j ，T i The ith simulation time, i has a value range of x to y, T x As the starting point time, T y For the end time T y ，x<y,v x j And v y j Belongs to { T ] x ，T x+1 ，…，T y-1 ,T y }。
Wherein T is x ，T x+1 ，…，T y-1 ,T y And sequencing according to the sequence of the coverage time.
Step E3, acquiring a first coverage time index T in the coverage time field from the coverage information records corresponding to all coverage points in the second coverage point set i Is denoted as T i Corresponding coverage point increment F of (2) i Generate { F x ，F x+1 ，…F y-1 ，F y }。
Step E4, based on { T ] x ，T x+1 ，…，T y-1 ,T y }、{F x ，F x+1 ，…F y-1 ，F y Will v x j And v y j D with corresponding coverage point increment not being 0 j And determining the effective random test vector, and constructing an effective random test vector set corresponding to the mth random test case.
As an embodiment, the step E4 includes:
and E41, establishing a coordinate system by taking the simulation time as an X axis and the coverage point identification increment as a vertical axis.
Step E42, based on { F x ，F x+1 ，…F y-1 ，F y Sum { T } x ，T x+1 ，…，T y-1 ,T y Drawing a coverage point identification delta curve.
It should be noted that each (T i ,F i ) Form a corresponding coordinate point positioned at T x And T y And no longer { T ] x ，T x+1 ，…，T y-1 ,T y The increment of coverage point corresponding to simulation time in the } is 0 based on T x And T y And fitting all coordinate points corresponding to the coordinate points to obtain a coverage point identification incremental curve.
Step E43, based on theThe coverage point identification delta curve will v x j And v y j D with corresponding coverage point increment not being 0 j Is determined to be a valid random test vector.
It should be noted that, the total amount curve of the coverage point marks corresponding to each simulation time can be drawn at the same time, so that the effective random test vector can be determined more intuitively. As shown in the example of fig. 3, in fig. 3, curve 1 represents an incremental curve of coverage point identification, curve 2 represents a total amount curve of coverage point identification, test vector 1, test vector 2, test vector 3, test vector 5, and test vector 7 are valid random test vectors, and the other test vectors are invalid test vectors.
As an embodiment, the step E1 further includes:
step E0, obtaining the starting time T corresponding to the mth test case from the mth time sequence coverage database x And end time T y If T y -T x >T u ,T u And (3) determining a corresponding effective random test vector set through steps E1-E4 for a preset execution time threshold.
It can be understood that when the simulation time of the mth random test case is shorter and smaller than the preset execution time threshold, the test time does not need to be further optimized. T (T) u And setting according to specific application requirements.
As an embodiment, the step E4 further includes:
e5, if the mth random test case has a corresponding effective random test vector set, inputting random test vectors in the effective random test vector set in the mth random test case into the current design to be tested for execution, and generating a current mth time sequence coverage database corresponding to the mth random test case; otherwise, directly executing the mth random test case, and generating a current mth time sequence type coverage database corresponding to the mth test case.
It should be noted that, the random test vectors in the effective random test vector set are respectively and independently input into the current design to be tested for execution, and no sequence limitation exists.
And E6, fusing all the current m-th time sequence type coverage databases to generate coverage corresponding to the current design to be tested.
It should be noted that, in the fourth embodiment, the specific implementation process of each mth time sequence type coverage database is directly implemented by adopting the technical details in the first embodiment, which is not described herein.
It should be noted that, through the steps described in the fourth embodiment, an effective random test vector set corresponding to each mth random test case can be obtained, and in the subsequent regression test, each mth test case only needs to execute the effective random test vector set, and no invalid random test vector is required to be executed, so that useless regression test operation time is reduced, regression test efficiency is improved, and verification efficiency of the digital circuit is improved.
Fifth embodiment (V),
The existing coverage database of the digital circuit only records whether the coverage points are covered or not, when the regression test has problems, debugging clues cannot be accurately provided, even if a certain coverage point of the two regression tests displays coverage, no problem at the coverage point cannot be accurately described, because the coverage time is possibly different, but the existing coverage database cannot reflect the coverage time. In addition, in the prior art, engineers who have a great knowledge about the digital circuit need to make a pre-judgment, find a debugging starting point module, and continuously track, but in some cases, a plurality of modules may be tracked to determine the problem point, even a plurality of modules still cannot determine the problem point, so that the debugging efficiency is low.
A fifth embodiment provides a regression testing and debugging system based on a time-series coverage database, which comprises a processor and a memory storing a computer program, wherein when the processor executes the computer program, the following steps are implemented as shown in fig. 4:
and F1, if the current regression test of the digital circuit fails, taking the current digital circuit data as a first digital circuit, and taking the digital circuit data which corresponds to the first digital circuit and is closest to the current moment and has successful historical regression test as a second digital circuit.
It should be noted that, during the regression test, the digital circuit may be adjusted, and thus, the digital circuit data corresponding to different times may be different.
And F2, setting the same first coverage point set for the first digital circuit and the second digital circuit, wherein the first coverage point set is a subset of the whole coverage point set of the digital circuit to be tested, and the first digital circuit and the second digital circuit are digital circuit data corresponding to different times of the digital circuit to be tested.
And F3, respectively inputting the mth test case into the first digital circuit and the second digital circuit for operation, generating a reference mth time sequence type coverage database corresponding to the first digital circuit and a target mth time sequence type coverage database corresponding to the second digital circuit, wherein the reference mth time sequence type coverage database and the target mth time sequence type coverage database are both used for storing coverage information records of each coverage point in a first coverage point set corresponding to the mth test case, and the coverage information records comprise coverage point identification fields and coverage time fields.
And F4, comparing coverage time fields corresponding to each first coverage point in the reference mth time sequence type coverage database and the target mth time sequence type coverage database, and taking coverage information records with different coverage time fields as candidate coverage information records.
And F5, acquiring a candidate coverage information record with the earliest coverage time of the coverage time field record as a target coverage information record.
And F6, determining the debugging ending time and the debugging ending signal based on the target coverage information record, and debugging the first digital circuit based on the debugging ending time and the debugging ending signal.
It should be noted that, through step F1-step F6, the coverage point with the earliest problem and the time of coverage can be determined, and the corresponding input signal can accurately determine the debugging range based on the above information, and debug the first digital circuit in the debugging range, thereby improving the debugging efficiency and accuracy.
As an embodiment, the system further includes a digital circuit database for storing digital circuit data for which the historical regression test is successful, and the step F1 includes:
and F1, acquiring the digital circuit data which corresponds to the first digital circuit and is closest to the current moment and is successfully subjected to historical regression testing from the digital circuit database as the second digital circuit.
It can be understood that the digital circuit database stores the digital circuit data with successful regression test and the corresponding time information, and when the digital circuit fails, the digital circuit data with successful historical regression test, which corresponds to the first digital circuit and is closest to the current moment, can be rapidly obtained from the digital circuit database as the second digital circuit.
As an embodiment, the coverage time field is configured to store coverage time indexes corresponding to coverage points, where each coverage time index corresponds to a simulation time, and the coverage time field is set to a same coverage initial value, and the coverage initial value indicates that the corresponding coverage point is not covered.
As an embodiment, the step F3 includes:
and F31, inputting the mth test case into an L digital circuit for operation, wherein L is equal to 1 or 2.
That is, the manner in which the time-sequential coverage database is generated for the first digital circuit and the second digital circuit is the same.
And F32, when the occurrence of the coverage event of the L-th digital circuit is monitored, acquiring the current coverage event information.
And F33, analyzing the current coverage event information to obtain a current coverage point identifier, and if the current coverage point identifier belongs to the first coverage point set, obtaining a corresponding current coverage time, and executing the step F34.
Step F34, if l=1, filling the coverage time index corresponding to the current coverage time into the coverage time field of the coverage information record corresponding to the current coverage point identifier in the reference mth time sequence type coverage database; if l=2, filling in a coverage time index corresponding to the current coverage time into a coverage time field of a coverage information record corresponding to the current coverage point identifier in the target mth time sequence type coverage database.
And F35, after the running of the mth test case is finished, generating the reference mth time sequence type coverage database and the target mth time sequence type coverage database.
As an embodiment, the system further includes a time index mapping table, where the time index mapping table is configured to store mapping relationships between overlay time information and overlay time indexes, and the data length of the overlay time indexes is smaller than the data length of the overlay time information, so that the setting can greatly reduce the amount of data stored in the overlay time field and improve the processing efficiency, and the step F33 further includes:
and step F330, if the current coverage time has a corresponding coverage time index in the time index mapping table, executing the step F34, otherwise, executing the step F34 after adding the coverage time index corresponding to the current coverage time in the time index mapping table.
It will be appreciated that the same overlay time corresponds to a unique time index, and that in a single policy for the same test case, one overlay point may be overlaid multiple times at different overlay times, and thus may correspond to multiple time indexes. Different coverage points may be covered at the same time such that different coverage points correspond to the same coverage time index. If one of the overlay point clocks is not overlaid, the overlay time field is always an overlay initial value.
As an embodiment, the coverage time field is configured to store a coverage time index number threshold G, and in step F33, if the current coverage point identifier belongs to the first coverage point set, the method further includes:
and F331, judging whether G coverage time indexes are stored in the coverage time field corresponding to the current coverage point identifier, if so, not storing the coverage time indexes in the corresponding coverage information record, otherwise, executing to acquire the corresponding current coverage time, and executing the step F34.
For example, G may be set to 3, so that at most 3 coverage time indexes are recorded in each coverage information record, and the coverage is not recorded any more in the subsequent coverage, so that the size of the time sequence coverage database is further reduced, and it is understood that the value of G may be set according to the specific application requirement.
Regression testing is generally an iterative process, and in some application scenarios, the coverage rate has reached a certain value, and then only points which are not covered in part of the modules may be further verified, so that the coverage point in the whole component module in the digital circuit is not required to be used as a first coverage point set, the range of the first coverage point set can be further reduced, and the data volume of the mth time sequence type coverage database can be further reduced. As an embodiment, the system further comprises a reference database, wherein the reference database stores coverage records corresponding to a third coverage point set, and the third coverage point set is a subset of the total set of coverage points of the digital circuit to be tested, and when the processor executes the computer program, the following steps are further implemented:
Step F100, taking a set of coverage points corresponding to a preset target module of the design to be tested as a fourth coverage point set, wherein the preset target module is a component part of the design to be tested;
and F200, judging whether the coverage points in the fourth coverage point set are covered in the reference database one by one, if so, deleting the coverage points from the fourth coverage point set, and generating a first coverage point set.
Through the steps F100-F200, the range of the first coverage point set can be further reduced on the basis of ensuring the verification of the target coverage point, the data volume of the mth time sequence coverage database is further reduced, and the data processing efficiency is improved.
Preferably, the first set of coverage points is a proper subset of the complete set of coverage points of the digital circuit under test.
As an embodiment, the step F6 includes:
and F61, determining the earliest time in the coverage time field corresponding to the target coverage information record as the debugging ending time.
And F62, determining an input signal corresponding to the coverage point mark corresponding to the target coverage information record at the debugging ending time as a debugging ending signal.
And step F63, determining a composition module in the first digital circuit where the coverage point corresponding to the target coverage information record is located and the first digital circuit is associated as a target debugging module.
F64, rerun the first digital circuit to the debugging ending time, inputting a corresponding debugging ending signal, generating a waveform corresponding to a target debugging module, and debugging the first digital circuit according to the waveform corresponding to the target debugging module.
The debugging range can be accurately determined through the steps F61-F64, and the debugging efficiency is improved.
In addition, in step F3, when the mth test case is input into the first digital circuit and the second digital circuit respectively, the regression test scheme that has been optimized in the second embodiment, the third embodiment or the fourth embodiment may be adopted to perform simulation, so as to further obtain the reference mth time-sequence type coverage database and the target mth time-sequence type coverage database, and specific implementation details of the second embodiment, the third embodiment or the fourth embodiment are not described herein again. It should be noted that, the specific implementation procedure of the mth time-sequence coverage database, which is not mentioned in the fifth embodiment, already mentioned in the first embodiment, may also be applicable to the fifth embodiment, and will not be described herein.
In the fifth embodiment, by determining the coverage point at which the problem occurs earliest and the time at which the coverage occurs, and the corresponding input signal, the debugging range can be accurately determined based on the above information, and the first digital circuit is debugged in the debugging range, thereby improving the debugging efficiency and accuracy.
It should be noted that some exemplary embodiments are described as a process or a method depicted as a flowchart. Although a flowchart depicts steps as a sequential process, many of the steps may be implemented in parallel, concurrently, or with other steps. Furthermore, the order of the steps may be rearranged. The process may be terminated when its operations are completed, but may have additional steps not included in the figures. The processes may correspond to methods, functions, procedures, subroutines, and the like.
The present invention is not limited to the above-mentioned embodiments, but is intended to be limited to the following embodiments, and any modifications, equivalents and modifications can be made to the above-mentioned embodiments without departing from the scope of the invention.
Claims (8)
1. A time sequence type coverage database-based effective random test vector determination system is characterized in that,
the method comprises the steps of generating an mth time sequence coverage database, a processor and a memory storing a computer program in advance, wherein the value range of M is 1 to M, M is the total number of random test cases corresponding to a digital circuit to be tested, the mth time sequence coverage database is used for storing coverage information records of each coverage point in a first coverage point set corresponding to the mth random test cases, the first coverage point set is a subset of a complete set of the coverage points of the digital circuit to be tested, the coverage information records comprise coverage point identification fields and coverage time fields, the coverage time fields are used for storing coverage time indexes corresponding to the coverage points, each coverage time index corresponds to one simulation time, the coverage time fields are provided with the same coverage initial values, and the coverage initial values represent that the corresponding coverage points are not covered; the mth random test case comprises P random test vectors, D j For the j-th random test vector, j has a value ranging from 1 to P and D j+1 Based on D j Randomly generating;
when the processor executes the computer program, the following steps are implemented:
E1, acquiring a coverage information record corresponding to each coverage point in a preset second coverage point set corresponding to an mth random test case from the mth time sequence type coverage database, wherein the second coverage point set is a subset of the first coverage point set;
step E2, determining a time sequence { T } according to the coverage information records corresponding to all coverage points in the second coverage point set x ，T x+1 ，…，T y-1 ,T y } and D j Test vector start time v of (2) x j And test vector endpoint time v y j ，T i The ith simulation time, i has a value range of x to y, T x As the starting point time, T y For the end time T y ，x<y,v x j And v y j Belongs to { T ] x ，T x+1 ，…，T y-1 ,T y }；
Step E3, acquiring a first coverage time index T in the coverage time field from the coverage information records corresponding to all coverage points in the second coverage point set i Is denoted as T i Corresponding coverage point increment F of (2) i Generate { F x ，F x+1 ，…F y-1 ，F y }；
Step E4, based on { T ] x ，T x+1 ，…，T y-1 ,T y }、{F x ，F x+1 ，…F y-1 ，F y Will v x j And v y j D with corresponding coverage point increment not being 0 j And determining the effective random test vector, and constructing an effective random test vector set corresponding to the mth random test case.
2. The system of claim 1, wherein the system further comprises a controller configured to control the controller,
the step E4 includes:
e41, establishing a coordinate system by taking simulation time as an X axis and taking a coverage point identification increment as a vertical axis;
Step E42, based on { F x ，F x+1 ，…F y-1 ，F y Sum { T } x ，T x+1 ，…，T y-1 ,T y Drawing a coverage point identification incremental curve;
step E43, marking the increment curve based on the coverage points to obtain v x j And v y j D with corresponding coverage point increment not being 0 j Is determined to be a valid random test vector.
3. The system of claim 1, wherein the system further comprises a controller configured to control the controller,
the step E1 is also preceded by the following steps:
step E0, obtaining the starting time T corresponding to the mth test case from the mth time sequence coverage database x And end time T y If T y -T x >T u ,T u And (3) determining a corresponding effective random test vector set through steps E1-E4 for a preset execution time threshold.
4. The system of claim 1, wherein the system further comprises a controller configured to control the controller,
the step E4 further comprises the following steps:
e5, if the mth random test case has a corresponding effective random test vector set, inputting random test vectors in the effective random test vector set in the mth random test case into the current design to be tested for execution, and generating a current mth time sequence coverage database corresponding to the mth random test case; otherwise, directly executing the mth random test case, and generating a current mth time sequence type coverage database corresponding to the mth test case;
and E6, fusing all the current m-th time sequence type coverage databases to generate coverage corresponding to the current design to be tested.
5. The system of claim 1, wherein the system further comprises a controller configured to control the controller,
when the processor executes the computer program, the following steps are also implemented:
s10, inputting an mth test case into the digital circuit for operation;
step S20, when the digital circuit to be detected is monitored to generate a coverage event, acquiring current coverage event information;
step S30, analyzing the current coverage event information to obtain a current coverage point identifier, if the current coverage point identifier belongs to the first coverage point set, obtaining a corresponding current coverage time, and executing step S40;
step S40, filling in a coverage time index corresponding to the current coverage time into a coverage time field of a coverage information record corresponding to the current coverage point identifier in the mth time sequence type coverage database;
and S50, after the running of the mth test case is finished, generating the mth time sequence coverage database.
6. The system of claim 5, wherein the system further comprises a controller configured to control the controller,
the system further comprises a reference database, wherein the reference database stores coverage records corresponding to a third coverage point set, the third coverage point set is a subset of the whole set of coverage points of the digital circuit to be tested, and when the processor executes the computer program, the following steps are further realized:
Step S100, taking a set of coverage points corresponding to a preset target module of the design to be tested as a fourth coverage point set, wherein the preset target module is a component part of the design to be tested;
and step 200, judging whether the coverage points in the fourth coverage point set are covered in the reference database one by one, if so, deleting the coverage points from the fourth coverage point set, and generating a first coverage point set.
7. The system of claim 1, wherein the system further comprises a controller configured to control the controller,
the first set of coverage points is a proper subset of the complete set of coverage points of the digital circuit to be tested.
8. The system of claim 1, wherein the system further comprises a controller configured to control the controller,
the second set of coverage points is a proper subset of the first set of coverage points.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211174195.2A CN116245055B (en) | 2022-09-26 | 2022-09-26 | Effective random test vector determining system based on time sequence type coverage database |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211174195.2A CN116245055B (en) | 2022-09-26 | 2022-09-26 | Effective random test vector determining system based on time sequence type coverage database |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN116245055A true CN116245055A (en) | 2023-06-09 |
| CN116245055B CN116245055B (en) | 2023-12-19 |
Family
ID=86633728
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202211174195.2A Active CN116245055B (en) | 2022-09-26 | 2022-09-26 | Effective random test vector determining system based on time sequence type coverage database |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN116245055B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116245057A (en) * | 2022-09-26 | 2023-06-09 | 上海合见工业软件集团有限公司 | Effective execution area determining system based on time sequence type coverage database |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001014365A (en) * | 1999-06-29 | 2001-01-19 | Toshiba Corp | Method for evaluating verification coverage of logic circuit |
| US20120221283A1 (en) * | 2011-02-28 | 2012-08-30 | Synopsys, Inc. | Method and apparatus for determining a subset of tests |
| US20130061191A1 (en) * | 2011-09-01 | 2013-03-07 | Fritz A. Boehm | Automated functional coverage for an integrated circuit design |
| US20150213174A1 (en) * | 2014-01-30 | 2015-07-30 | Mentor Graphics Corporation | Regression signature for statistical functional coverage |
| CN107480382A (en) * | 2017-08-21 | 2017-12-15 | 中国电子科技集团公司第五十四研究所 | A kind of Coverage- Driven verification method of Fast Convergent |
| CN110598305A (en) * | 2019-09-06 | 2019-12-20 | 北京华大九天软件有限公司 | Sensitivity analysis method for comparing scanning simulation increment of circuit |
| CN112666451A (en) * | 2021-03-15 | 2021-04-16 | 南京邮电大学 | Integrated circuit scanning test vector generation method |
| CN113608099A (en) * | 2020-05-28 | 2021-11-05 | 杭州芯讯科技有限公司 | Integrated circuit testing method and system |
| CN114676040A (en) * | 2022-02-18 | 2022-06-28 | 北京爱芯科技有限公司 | Test coverage verification method and device and storage medium |
-
2022
- 2022-09-26 CN CN202211174195.2A patent/CN116245055B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001014365A (en) * | 1999-06-29 | 2001-01-19 | Toshiba Corp | Method for evaluating verification coverage of logic circuit |
| US20120221283A1 (en) * | 2011-02-28 | 2012-08-30 | Synopsys, Inc. | Method and apparatus for determining a subset of tests |
| US20130061191A1 (en) * | 2011-09-01 | 2013-03-07 | Fritz A. Boehm | Automated functional coverage for an integrated circuit design |
| US20150213174A1 (en) * | 2014-01-30 | 2015-07-30 | Mentor Graphics Corporation | Regression signature for statistical functional coverage |
| CN107480382A (en) * | 2017-08-21 | 2017-12-15 | 中国电子科技集团公司第五十四研究所 | A kind of Coverage- Driven verification method of Fast Convergent |
| CN110598305A (en) * | 2019-09-06 | 2019-12-20 | 北京华大九天软件有限公司 | Sensitivity analysis method for comparing scanning simulation increment of circuit |
| CN113608099A (en) * | 2020-05-28 | 2021-11-05 | 杭州芯讯科技有限公司 | Integrated circuit testing method and system |
| CN112666451A (en) * | 2021-03-15 | 2021-04-16 | 南京邮电大学 | Integrated circuit scanning test vector generation method |
| CN114676040A (en) * | 2022-02-18 | 2022-06-28 | 北京爱芯科技有限公司 | Test coverage verification method and device and storage medium |
Non-Patent Citations (4)
| Title |
|---|
| SHASHIDHARA H. R ET AL.: "Test vector Generation using different logic regression method", 《2016 2ND INTERNATIONAL CONFERENCE ON APPLIED AND THEORETICAL COMPUTING AND COMMUNICATION TECHNOLOGY (ICATCCT)》, pages 736 - 742 * |
| 方琼等: "检入管理CIMS系统中的集合覆盖问题SCP研究", 《集成电路应用》, vol. 35, no. 07, pages 18 - 21 * |
| 王润: "粗粒度可重构电路的验证技术研究", 《中国优秀硕士学位论文全文数据库信息科技辑》, no. 1, pages 135 - 473 * |
| 郭江姗: "集成电路多类型故障测试向量集优化问题研究", 《中国优秀硕士学位论文全文数据库信息科技辑》, no. 8, pages 135 - 124 * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116245057A (en) * | 2022-09-26 | 2023-06-09 | 上海合见工业软件集团有限公司 | Effective execution area determining system based on time sequence type coverage database |
| CN116245057B (en) * | 2022-09-26 | 2023-12-19 | 上海合见工业软件集团有限公司 | Effective execution area determining system based on time sequence type coverage database |
Also Published As
| Publication number | Publication date |
|---|---|
| CN116245055B (en) | 2023-12-19 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN116245055B (en) | Effective random test vector determining system based on time sequence type coverage database | |
| CN116244169B (en) | Regression testing system based on time sequence type coverage database | |
| US7844929B2 (en) | Optimizing test code generation for verification environment | |
| CN116245056B (en) | Regression test debugging system based on time sequence type coverage database | |
| CN110221983A (en) | Test method, device, computer readable storage medium and computer equipment | |
| CN104021072A (en) | Machine and methods for evaluating failing software programs | |
| US20210117593A1 (en) | Configurable digital twin | |
| CN111177009A (en) | Script generation method and device, electronic equipment and storage medium | |
| CN114860586A (en) | Binary multi-executive software instrumentation method based on dynamic instrumentation | |
| CN116245057B (en) | Effective execution area determining system based on time sequence type coverage database | |
| CN117150995B (en) | Driving source code tracking method, electronic equipment and medium | |
| CN112859762B (en) | Control logic checking method and device, computer equipment and storage medium | |
| CN115757165A (en) | Automatic testing method, device, equipment and storage medium | |
| US3684871A (en) | Network plotting system | |
| CN113127804B (en) | Method and device for determining number of vehicle faults, computer equipment and storage medium | |
| CN117471504B (en) | GNSS baseband chip verification method, electronic equipment and medium | |
| CN102236729B (en) | The method of a kind of test function covering and device | |
| CN109945892B (en) | Online testing method for complex algorithm requirements of inertial navigation system | |
| JP3422478B2 (en) | Program creation device and program creation method | |
| CN111367816B (en) | Mobile test method and device, computer equipment and storage medium | |
| CN116909935B (en) | Chip joint simulation method, device and medium based on single processing module interface | |
| CN116756045B (en) | Application testing method and device, computer equipment and storage medium | |
| JP2001175318A (en) | Testing device for plant control device | |
| CN117150996B (en) | Method for determining problem source code generating burr signal, electronic equipment and medium | |
| CN108959091B (en) | Event sequence fault positioning method supporting constraint |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |