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CN116028373A - Project quality monitoring method and device, electronic equipment and storage medium - Google Patents

Project quality monitoring method and device, electronic equipment and storage medium Download PDF

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Publication number
CN116028373A
CN116028373A CN202310118483.4A CN202310118483A CN116028373A CN 116028373 A CN116028373 A CN 116028373A CN 202310118483 A CN202310118483 A CN 202310118483A CN 116028373 A CN116028373 A CN 116028373A
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actual
defect
determining
actual defect
value
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贾希贝
施金华
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Beijing Baidu Netcom Science and Technology Co Ltd
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Beijing Baidu Netcom Science and Technology Co Ltd
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Priority to CN202310118483.4A priority Critical patent/CN116028373A/en
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Abstract

The disclosure provides a project quality monitoring method, a project quality monitoring device, electronic equipment and a storage medium, relates to the technical field of computers, in particular to the technical fields of software development test, big data processing and the like, and can be applied to scenes such as software project development and the like. The specific implementation scheme comprises the following steps: at least one quality test is carried out on the target item by using the test script within a preset period, so that at least one test result of the target item is obtained; determining at least one actual defect of the target item in a preset period based on at least one test result; determining the development difficulty value of the target project and the severity level of each actual defect; based on the development difficulty value and the severity level of each actual defect, a quality value of the target project is determined.

Description

Project quality monitoring method and device, electronic equipment and storage medium
Technical Field
The disclosure relates to the technical field of computers, in particular to the technical fields of software development testing, big data processing and the like, and can be applied to scenes such as software project development and the like.
Background
In the existing quality monitoring method of the software product, the quality of the functional point and the nonfunctional point of the software is generally only considered, specifically, the functional point or the nonfunctional point which does not meet the design specification or normal use habit is defined as an actual defect of the software product, and the quality of the software is measured through the single-dimension actual defect to detect the quality of the product. However, in some delivery scenarios of item-level software systems, the result of measuring the quality of an item through the above-mentioned single-dimensional actual defect cannot objectively reflect the quality condition in the actual delivery scenario of the item.
Disclosure of Invention
The disclosure provides a project quality monitoring method, a project quality monitoring device, electronic equipment and a storage medium.
According to a first aspect of the present disclosure, there is provided a method of item quality monitoring, the method comprising:
at least one quality test is carried out on the target item by using the test script within a preset period, so that at least one test result of the target item is obtained;
determining at least one actual defect of the target item in a preset period based on at least one test result;
determining the development difficulty value of the target project and the severity level of each actual defect;
based on the development difficulty value and the severity level of each actual defect, a quality value of the target project is determined.
According to a second aspect of the present disclosure, there is provided a project quality monitoring apparatus including a project testing module, a defect determining module, a defect information determining module, and a quality determining module;
the project test module is used for carrying out quality test on a target project at least once by using a test script within a preset period to obtain at least one test result of the target project;
the defect determining module is used for determining at least one actual defect of the target item in a preset period based on the at least one test result; the defect information determining module is used for determining the development difficulty value of the target project and the severity level of each actual defect;
The quality determination module is used for determining a quality value of the target project based on the development difficulty value and the severity level of each actual defect.
According to a third aspect of the present disclosure, there is provided an electronic device comprising: at least one processor; and a memory communicatively coupled to the at least one processor; wherein the memory stores instructions executable by the at least one processor to enable the at least one processor to perform the method of the first aspect.
According to a fourth aspect of the present disclosure, there is provided a non-transitory computer readable storage medium storing computer instructions for causing a computer to perform the method according to the first aspect.
According to a fifth aspect of the present disclosure, there is provided a computer program item comprising a computer program which, when executed by a processor, implements the method according to the first aspect.
It should be understood that the description in this section is not intended to identify key or critical features of the embodiments of the disclosure, nor is it intended to be used to limit the scope of the disclosure. Other features of the present disclosure will become apparent from the following specification.
The beneficial effects that this disclosure provided technical scheme brought are:
according to the project quality monitoring method provided by the embodiment of the disclosure, the quality of the project is measured based on the two dimensions of the actual defect and the development difficulty of the project, so that the quality condition of the project can be more accurately determined, and more targeted improvement measures can be facilitated to be taken for the project.
Drawings
The drawings are for a better understanding of the present solution and are not to be construed as limiting the present disclosure. Wherein:
FIG. 1 shows a flow diagram of a project quality monitoring method provided by the present disclosure;
FIG. 2 is a flow chart illustrating the severity level of an actual defect provided by the present disclosure;
FIG. 3 illustrates a specific use flow chart of one project quality monitoring method provided by the present disclosure;
FIG. 4 shows a schematic flow chart of an item quality monitoring apparatus provided by the present disclosure;
FIG. 5 shows a schematic flow chart of another item quality monitoring apparatus provided by the present disclosure;
fig. 6 shows a schematic block diagram of an example electronic device that may be used to implement the present disclosure.
Detailed Description
Exemplary embodiments of the present disclosure are described below in conjunction with the accompanying drawings, which include various details of the embodiments of the present disclosure to facilitate understanding, and should be considered as merely exemplary. Accordingly, one of ordinary skill in the art will recognize that various changes and modifications of the embodiments described herein can be made without departing from the scope and spirit of the present disclosure. Also, descriptions of well-known functions and constructions are omitted in the following description for clarity and conciseness.
It should be appreciated that in embodiments of the present disclosure, the character "/" generally indicates that the context associated object is an "or" relationship. The terms "first," "second," and the like are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated.
In the related art, a quality monitoring method of a software product generally only needs to consider the quality of functional points and nonfunctional points of the software itself, specifically, functional points or nonfunctional points which do not meet design specifications or normal usage habits are defined as actual defects of the software product, and the quality of the software product is measured through the actual defects of a single dimension to detect the quality of the product. However, in some delivery scenarios of item-level software systems, the result of measuring the quality of an item through the above-mentioned single-dimensional actual defect cannot objectively reflect the quality condition in the actual delivery scenario of the item. Specifically, in the actual delivery scenario of the project-level software system, the practical drawbacks are not only to consider the functional and nonfunctional requirements of the software design, but also to consider the factors of different complexity of different projects, compliance with acceptance criteria, compliance with project cost requirements, compliance with project progress requirements, and the like. Thus, existing quality methods of software are not suitable for the actual delivery scenario of project-level software systems.
According to the project quality monitoring method provided by the embodiment of the disclosure, the quality of the project is measured based on the two dimensions of the actual defect and the development difficulty of the project, so that the quality condition of the project can be more accurately determined, and more targeted improvement measures can be facilitated to be taken for the project.
The method may be performed by a terminal device, or by a computer, or by a server, or by other devices having data processing capabilities. The subject of execution of the method is not limited herein. In some embodiments, the execution body of the project quality monitoring method provided in the embodiments of the present disclosure may be a terminal device (such as a vehicle-mounted computer) on a host vehicle.
Optionally, the terminal device may be a mobile phone, a tablet computer, a wearable device, a vehicle-mounted device, an augmented reality (augmented reality, AR)/Virtual Reality (VR) device, a notebook computer, an ultra-mobile personal computer (UMPC), a netbook, a personal digital assistant (personal digital assistant, PDA), or the like, and the specific type of the terminal device is not limited in the embodiments of the present disclosure.
In some embodiments, the server may be a single server, or may be a server cluster formed by a plurality of servers. In some implementations, the server cluster may also be a distributed cluster. The present disclosure is not limited to a specific implementation of the server.
The following is an exemplary description of the project quality monitoring method provided in the present disclosure.
Fig. 1 shows a flow chart of a method for monitoring quality of an item provided by the present disclosure, as shown in fig. 1, the method may mainly include the following steps:
s110: and carrying out at least one quality test on the target item by using the test script within a preset period to obtain at least one test result of the target item.
S120: based on at least one test result, at least one actual defect of the target item existing in the preset period is determined.
Here, the target project is a development project of the software system, and the quality of the target project needs to be continuously monitored during the development process. Specifically, the target item may be a single item, or the target item may be a collection of multiple items, that is, the target item may include multiple sub-items, and the multiple sub-items may be items having a specific feature, for example, the multiple sub-items all have a certain industry feature, and the industries may include finance, automobiles, electronic commerce, medicine, and the like, and of course, the industries may be further subdivided.
It will be appreciated that a longer development time is typically required for a project, so that the quality of the marked project may be periodically measured in quality during the development of the project, that is, S110 to S140 may be performed every preset time. For example, the development start time of the target item may be used as a monitoring start node, a plurality of monitoring nodes are determined according to a preset time interval from the monitoring start node, the time between adjacent monitoring nodes is a monitoring period, and each time a monitoring node is reached, at least one quality test is performed on the target item by using a test script, a test result of each quality test is obtained, and then at least one actual defect of the target item in the preset period is determined based on the at least one test result. It can be understood that, for each test result, if the test result indicates that the test of the target item passes, it is determined that the target item has no defect for the current test content; if the test result indicates that the test of the target item is not passed, determining that the target item has defects aiming at the test content.
It should be noted that, in the embodiment of the present disclosure, on the basis of defining the problem of a functional point or a non-functional point of the software system itself in the target project, which does not conform to the design specification or the normal usage habit, as an actual defect, the problem of not conforming to the acceptance standard of the contractual agreement, the problem of affecting the project cost, the problem of affecting the project progress, and the problem of unsatisfactory customer feedback may be defined as actual defects.
S130: the development difficulty value of the target project and the severity level of each actual defect are determined.
In the disclosed embodiments, the development difficulty value is used to reflect the scale and complexity of the target project. Alternatively, the development difficulty value of the target item may include a contract amount of the target item, and when the target item includes a plurality of sub-items, the development difficulty value of the target item may include a sum of contract amounts of the plurality of sub-items.
Of course, the development difficulty value may be other types of reference values, or the development difficulty value may be a fusion value of the contract amount (or the sum of contract amounts) and other types of reference values. For example, a reference value may be determined according to the service difficulty of the customer corresponding to the target item, where the reference value is proportional to the service difficulty of the customer.
Alternatively, the development difficulty value may be determined according to the project attribute. The corresponding relation between the different project attributes and the development difficulty reference values can be preset, when the development difficulty values of the different project attributes and the development difficulty reference values are determined for the target project, the corresponding development difficulty reference values can be determined according to the target project attributes, and the development difficulty values of the target project are determined according to the determined development difficulty reference values. Specifically, according to the determined development difficulty reference value, the development difficulty value of the target project may include: and determining a correction coefficient according to the target project attribute, and calculating according to the correction coefficient and the development difficulty reference value to obtain a development difficulty value.
In the disclosed embodiments, a plurality of severity levels of the actual defect may be pre-classified, for example, the severity levels of the actual defect may include 5 levels of deadly, severe, critical, general, and mild. The method for determining the severity level of the actual defect will be further described later, and will not be described here.
S140: based on the development difficulty value and the severity level of each actual defect, a quality value of the target project is determined.
Here, the quality value is used to reflect the quality condition of the target item, and the smaller the quality value, the higher the quality of the target item. A conversion relationship between the quality value of the target item and the development difficulty value and the severity level of each actual defect may be predetermined in the embodiments of the present disclosure, and the quality value may be determined based on the conversion relationship. In the above conversion relation, the quality value is proportional to the severity level of the actual defect, and the quality value is inversely proportional to the development difficulty value.
The development difficulty of the project is included in the quality assessment, the quality of the project is measured based on two dimensions of the actual defect and the development difficulty of the project, the quality condition of the project can be reflected more objectively, and more targeted improvement measures can be taken for the project.
Optionally, in some embodiments, S140 may include: calculating an actual defect severity value of the target item based on the severity level of each actual defect; and determining the ratio of the actual defect severity value to the development difficulty value as the quality value of the target project.
Here, the quality value is proportional to the actual defect severity value, specifically, the greater the actual defect severity value, the greater the ratio of the actual defect severity value to the development difficulty value, the greater the quality value, and the lower the quality of the project. Meanwhile, the quality value is inversely proportional to the development difficulty value, specifically, the larger the development difficulty value is, the smaller the ratio of the actual defect severity value to the development difficulty value is, the smaller the quality value is, and the higher the quality of the project is. Because the development difficulty of different projects is different, the higher the development difficulty is, the higher the probability and the quantity of actual defects of the projects are, the development difficulty value is introduced, the ratio of the actual defect serious value to the development difficulty value is used as the quality value of the projects, the quality of the projects with different development difficulty can be evaluated in a balanced manner, and the quality condition of the projects with different development difficulty is objectively reflected.
Alternatively, an actual defect coefficient may be configured for each severity level in advance, and the actual defect severity value of the target item may be calculated based on the actual defect coefficient corresponding to the severity level of each actual defect. Here, the level of the severity level is proportional to the actual defect coefficient, that is, the higher the severity level is, the greater the actual defect coefficient corresponding to the severity level is. For example, the actual defect coefficient of the deadly level is 1, the actual defect coefficient of the severity level is 0.2, the actual defect coefficient of the importance level is 0.1, the actual defect coefficient of the general level is 0.05, and the actual defect coefficient of the slight level is 0.02.
Specifically, in the embodiment of the disclosure, when calculating the actual defect severity value of the target item based on the severity level of each actual defect, the actual defect number corresponding to each severity level may be determined based on the severity level of each actual defect; calculating an actual defect severity sub-value corresponding to each severity level based on the actual defect number corresponding to each severity level and a preset actual defect coefficient; and determining the sum of the actual defect severity sub-values corresponding to the severity levels as the actual defect severity value of the target item. For example, the actual defect number of the deadly level is 5, the actual defect number of the critical level is 7, the actual defect number of the important level is 2, the actual defect number of the general level is 1, the actual defect number of the slight level is 8, and the mass value= (5×1+7×0.2+2×0.1+1×0.05+8×0.02)/the contract amount.
In the embodiment of the disclosure, the actual defect weighted sum values of different severity levels can represent the quality performance of the project at the time of delivery, and under the condition of a certain contract amount, the smaller the actual defect weighted sum values of different severity levels are, the more sufficient the test before delivery is represented, the fewer the actual defect number left in the delivery phase is, the lower the severity level is, the lower the quality risk of the project is, and the higher the quality of the project is represented; a larger contract amount indicates a larger scale and/or higher complexity of the project, and a larger contract amount indicates a better overall quality performance of the project under the criteria of a certain actual defect weighted sum value of different severity levels. The lower the quality value, the higher the quality of the item can be represented.
According to the embodiment of the disclosure, the type of the actual defect and at least one cost parameter caused by the type of the actual defect can be used as an evaluation basis for evaluating the serious condition of the actual defect, and the determined serious grade based on the evaluation data of multiple dimensions is more in line with the actual condition. Specifically, fig. 2 shows a schematic flow chart of a severity level of an actual defect provided by the present disclosure, and as shown in fig. 2, the flow may mainly include the following steps:
S210: the type of actual defect is determined.
Here, the types of the actual defects may be divided in advance according to the severity of the actual defects. Alternatively, the actual defects may be classified into one type of actual defects, two types of actual defects, three types of actual defects, and the like, and the same type of actual defects have the same severity. For example, regarding the importance degree of the functional point corresponding to the actual defect as the severity degree of the actual defect, the severity degree of the actual defect may be determined according to the importance degree of the contract content to the actual defect, and then the type of the actual defect is determined based on the severity degree of the actual defect.
S220: at least one cost parameter resulting from the actual defect is determined.
Here, the cost parameter is a quantization of the loss caused. Since the project is generally sensitive to cost and development progress, the cost parameters can include cost increment caused by the actual defect and/or delay time caused by the actual defect, and the severity of the actual defect in the project can be reflected more objectively by taking the cost parameters as the basis for determining the severity of the actual defect.
S230: and determining the severity level of the actual defect based on the type and cost parameters corresponding to the actual defect.
Here, the severity level of the actual defect is proportional to both the severity of the type and the cost parameter. That is, the higher the severity of the type of actual defect, the higher the severity level of the actual defect; the larger the cost parameter of the actual defect, the higher the severity level of the actual defect.
Optionally, in some embodiments, S230 may include: invoking defect attribute data of the target item from a preset storage location, wherein the defect attribute data comprises importance of each potential defect of the target item; determining target potential defects with the same type as the actual defects from the defect attribute data, and taking the importance of the target potential defects as the importance corresponding to the actual defects; determining a weight coefficient corresponding to each cost parameter; calculating the importance corresponding to each cost parameter based on the parameter value and the weight coefficient of each cost parameter; and determining the severity level of the actual defect based on the importance level corresponding to the actual defect and the importance level corresponding to each cost parameter. Here, the importance of the actual defect is a quantification of the severity of the actual defect, and the higher the severity of the actual defect is, the greater the importance of the actual defect is. The weight coefficient corresponding to the cost parameter can represent the importance degree of the cost parameter, and the larger the weight coefficient corresponding to the cost parameter is, the more important the cost parameter is. According to the embodiment of the disclosure, the type of the actual defect and the importance degree of the corresponding cost parameter are subjected to numerical quantification, and the severity level of the actual defect is determined in a numerical calculation mode, so that the determination process is more direct and objective, and the severity level of each actual defect can be accurately distinguished.
Here, it is possible to determine in advance a plurality of types of defects that may occur to the target item before the target item is developed, define the defects that may occur to the target item as potential defects, configure a corresponding importance level for each type of potential defects, and then generate defect attribute data including the importance level of each potential defect of the target item. The importance degree corresponding to the potential defects and the weight coefficient corresponding to the cost parameter are respectively related to at least one of the type of the target item, the demand preference of the client and the contract content. For example, if the customer is very sensitive to the lead time of the project in the contractual context, the weight coefficient of the cost parameter, delay time caused by the actual defect, may be set to a larger value; alternatively, if the requirement of a certain type of item on the login time is high, the importance of the actual defect corresponding to the login function may be set to a high value. The type of the target item, the demand preference of the client and the contract content are all data practically related to the actual condition of the target item, and the importance degree of the type of the actual defect and the corresponding cost parameter is quantified by the data, so that the quantified result can more accurately reflect the importance degree of the type of the actual defect and the corresponding cost parameter.
In some embodiments of the present disclosure, the item quality monitoring method further comprises: acquiring quality values of a target item in a plurality of periods; determining a quality value change trend of the target item based on the quality values of the target item in a plurality of periods; based on the trend of the quality value change of the target item, a quality improvement measure of the target item is determined. Specifically, when the quality value of the target item is in a decreasing trend, the quality of the item is indicated to be good, otherwise, the quality of the item is indicated to be bad, attention needs to be paid, and measures need to be taken to improve the quality. After the relevant quality improvement measures are implemented, the effect brought by taking the quality improvement action can be checked by the system, the action scheme is continuously corrected, and finally the aim of quality improvement is fulfilled. If the quality value of the item continuously maintains a certain value and fluctuates, the quality is stable, and a detailed analysis is required to be performed to determine whether a quality improvement point exists.
Fig. 3 shows a specific usage flowchart of a method for monitoring project quality provided by the present disclosure, in fig. 3, a project a is the target project, where the project a may be a single software development project, and the project a may also include multiple sub-projects of the software development. Project a starts delivery, i.e., it starts development, and at this time, periodically measures the quality of project a, for example, the actual defects of the delivery software of project a and the contract amount of project a are obtained through project-level testing, the actual defect severity value of project a is calculated based on the severity level of each actual defect, and the ratio of the actual defect severity value to the development difficulty value is determined as the quality value (PQI) of project a. The trend of the quality value is determined by the quality value of the item a measured through a plurality of cycles, the trend of the quality value is analyzed to formulate a quality improvement scheme (i.e., quality improvement measure) for the item a, and the development process of the item a is improved based on the quality improvement scheme.
Based on the same principle as the project quality monitoring method described above, an embodiment of the present disclosure provides a project quality monitoring apparatus, and fig. 4 shows a schematic diagram of the project quality monitoring apparatus provided by the present disclosure, and as shown in fig. 4, the project quality monitoring apparatus 400 includes a project testing module 410, a defect determining module 420, a defect information determining module 430, and a quality determining module 440.
The project testing module 410 is configured to perform at least one quality test on a target project using a test script in a preset period, so as to obtain at least one test result of the target project;
a defect determining module 420, configured to determine, based on at least one test result, at least one actual defect existing in the target item within a preset period;
the defect information determining module 430 is configured to determine a development difficulty value of the target project and a severity level of each actual defect;
the quality determination module 440 is configured to determine a quality value for the target project based on the development difficulty value and the severity level of each actual defect.
According to the project quality monitoring device provided by the embodiment of the disclosure, the quality of the project is measured based on the two dimensions of the actual defect and the development difficulty of the project, so that the quality condition of the project can be more accurately determined, and more targeted improvement measures can be facilitated to be taken for the project.
In some embodiments of the present disclosure, the defect information determination module 430 determines the severity level of each actual defect by:
determining the type of the actual defect;
determining at least one cost parameter caused by the actual defect;
and determining the severity level of the actual defect based on the type and cost parameters corresponding to the actual defect.
In some embodiments of the present disclosure, the defect information determining module 430 is specifically configured to, when configured to determine a severity level of an actual defect based on a type and cost parameter corresponding to the actual defect:
invoking defect attribute data of the target item from a preset storage location, wherein the defect attribute data comprises importance of each potential defect of the target item;
determining target potential defects with the same type as the actual defects from the defect attribute data, and taking the importance of the target potential defects as the importance corresponding to the actual defects;
determining a weight coefficient corresponding to each cost parameter;
calculating the importance corresponding to each cost parameter based on the parameter value and the weight coefficient of each cost parameter;
and determining the severity level of the actual defect based on the importance level corresponding to the actual defect and the importance level corresponding to each cost parameter.
In some embodiments of the present disclosure, the importance corresponding to the potential defect, the weight coefficient corresponding to the cost parameter, and at least one of the type of the target item, the demand preference of the customer, and the contractual content are determined.
In some embodiments of the present disclosure, the cost parameter includes an increase in cost due to the actual defect and/or a delay time due to the actual defect.
In some embodiments of the present disclosure, the quality determination module 440, when used to determine a quality value for a target item based on a development difficulty value and a severity level of each actual defect, is specifically to:
calculating an actual defect severity value of the target item based on the severity level of each actual defect;
and determining the ratio of the actual defect severity value to the development difficulty value as the quality value of the target project.
In some embodiments of the present disclosure, the quality determination module 440, when used to calculate the actual defect severity value for the target item based on the severity level of each actual defect, is specifically to:
determining the number of the actual defects corresponding to each serious grade based on the serious grade of each actual defect;
calculating an actual defect severity sub-value corresponding to each severity level based on the actual defect number corresponding to each severity level and a preset actual defect coefficient;
And determining the sum of the actual defect severity sub-values corresponding to the severity levels as the actual defect severity value of the target item.
In some embodiments of the present disclosure, the development difficulty value of the target project includes a contract amount for the target project;
in some embodiments of the present disclosure, the target project includes a plurality of sub-projects, and the development difficulty value of the target project includes a sum of contract amounts for the plurality of sub-projects.
Fig. 5 shows a schematic diagram of another item quality monitoring apparatus provided by the present disclosure, where, as shown in fig. 5, the item quality monitoring apparatus 400 further includes a quality improvement module 450, where the quality improvement module 450 is configured to:
acquiring quality values of a target item in a plurality of periods;
determining a quality value change trend of the target item based on the quality values of the target item in a plurality of periods;
based on the trend of the quality value change of the target item, a quality improvement measure of the target item is determined.
It can be understood that the above modules of the project quality monitoring apparatus in the embodiments of the present disclosure have functions of implementing the corresponding steps of the project quality monitoring method described above. The functions can be realized by hardware, and can also be realized by executing corresponding software by hardware. The hardware or software includes one or more modules corresponding to the functions described above. The modules may be software and/or hardware, and each module may be implemented separately or may be implemented by integrating multiple modules. For the functional description of each module of the above-mentioned item quality monitoring device, reference may be specifically made to the corresponding description of the above-mentioned item quality monitoring method, which is not repeated herein.
In the technical scheme of the disclosure, the acquisition, storage, application and the like of the related user personal information all conform to the regulations of related laws and regulations, and the public sequence is not violated.
According to an embodiment of the disclosure, the disclosure further provides an electronic device, a readable storage medium, a computer program item.
In an exemplary embodiment, an electronic device includes: at least one processor; and a memory communicatively coupled to the at least one processor; wherein the memory stores instructions executable by the at least one processor to enable the at least one processor to perform the method as described in the above embodiments. The electronic device may be the computer or server described above.
In an exemplary embodiment, the readable storage medium may be a non-transitory computer readable storage medium storing computer instructions for causing a computer to perform the method according to the above embodiment.
In an exemplary embodiment, the computer program item comprises a computer program which, when executed by a processor, implements a method according to the above embodiments.
Fig. 6 illustrates a schematic block diagram of an example electronic device 600 that may be used to implement embodiments of the present disclosure. Electronic devices are intended to represent various forms of digital computers, such as laptops, desktops, workstations, personal digital assistants, servers, blade servers, mainframes, and other appropriate computers. The electronic device may also represent various forms of mobile devices, such as personal digital processing, cellular telephones, smartphones, wearable devices, and other similar computing devices. The components shown herein, their connections and relationships, and their functions, are meant to be exemplary only, and are not meant to limit implementations of the disclosure described and/or claimed herein.
As shown in fig. 6, the electronic device 600 includes a computing unit 601 that can perform various appropriate actions and processes according to a computer program stored in a Read Only Memory (ROM) 602 or a computer program loaded from a storage unit 608 into a Random Access Memory (RAM) 603. In the RAM 603, various programs and data required for the operation of the device 600 may also be stored. The computing unit 601, ROM 602, and RAM 603 are connected to each other by a bus 604. An input/output (I/O) interface 605 is also connected to bus 604.
A number of components in the electronic device 600 are connected to the I/O interface 605, including: an input unit 606 such as a keyboard, mouse, etc.; an output unit 607 such as various types of displays, speakers, and the like; a storage unit 608, such as a magnetic disk, optical disk, or the like; and a communication unit 609 such as a network card, modem, wireless communication transceiver, etc. The communication unit 609 allows the electronic device 600 to exchange information/data with other devices through a computer network, such as the internet, and/or various telecommunication networks.
The computing unit 601 may be a variety of general and/or special purpose processing components having processing and computing capabilities. Some examples of computing unit 601 include, but are not limited to, a Central Processing Unit (CPU), a Graphics Processing Unit (GPU), various specialized Artificial Intelligence (AI) computing chips, various computing units running machine learning model algorithms, a Digital Signal Processor (DSP), and any suitable processor, controller, microcontroller, etc. The computing unit 601 performs the various methods and processes described above, such as the item quality monitoring method. For example, in some embodiments, the item quality monitoring method may be implemented as a computer software program tangibly embodied on a machine-readable medium, such as storage unit 608. In some embodiments, part or all of the computer program may be loaded and/or installed onto the electronic device 600 via the ROM602 and/or the communication unit 609. When the computer program is loaded into RAM 603 and executed by the computing unit 601, one or more steps of the item quality monitoring method described above may be performed. Alternatively, in other embodiments, the computing unit 601 may be configured to perform the item quality monitoring method by any other suitable means (e.g. by means of firmware).
Various implementations of the systems and techniques described here above can be implemented in digital electronic circuitry, integrated circuit systems, field Programmable Gate Arrays (FPGAs), application Specific Integrated Circuits (ASICs), application Specific Standard Programming (ASSPs), systems On Chip (SOCs), load programmable logic devices (CPLDs), computer hardware, firmware, software, and/or combinations thereof. These various embodiments may include: implemented in one or more computer programs, the one or more computer programs may be executed and/or interpreted on a programmable system including at least one programmable processor, which may be a special purpose or general-purpose programmable processor, that may receive data and instructions from, and transmit data and instructions to, a storage system, at least one input device, and at least one output device.
Program code for carrying out methods of the present disclosure may be written in any combination of one or more programming languages. These program code may be provided to a processor or controller of a general purpose computer, special purpose computer, or other programmable data processing apparatus such that the program code, when executed by the processor or controller, causes the functions/operations specified in the flowchart and/or block diagram to be implemented. The program code may execute entirely on the machine, partly on the machine, as a stand-alone software package, partly on the machine and partly on a remote machine or entirely on the remote machine or server.
In the context of this disclosure, a machine-readable medium may be a tangible medium that can contain, or store a program for use by or in connection with an instruction execution system, apparatus, or device. The machine-readable medium may be a machine-readable signal medium or a machine-readable storage medium. The machine-readable medium may include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing. More specific examples of a machine-readable storage medium would include an electrical connection based on one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.
To provide for interaction with a user, the systems and techniques described here can be implemented on a computer having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to a user; and a keyboard and pointing device (e.g., a mouse or trackball) by which a user can provide input to the computer. Other kinds of devices may also be used to provide for interaction with a user; for example, feedback provided to the user may be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user may be received in any form, including acoustic input, speech input, or tactile input.
The systems and techniques described here can be implemented in a computing system that includes a background component (e.g., as a data server), or that includes a middleware component (e.g., an application server), or that includes a front-end component (e.g., a user computer having a graphical user interface or a web browser through which a user can interact with an implementation of the systems and techniques described here), or any combination of such background, middleware, or front-end components. The components of the system can be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: local Area Networks (LANs), wide Area Networks (WANs), and the internet.
The computer system may include a client and a server. The client and server are typically remote from each other and typically interact through a communication network. The relationship of client and server arises by virtue of computer programs running on the respective computers and having a client-server relationship to each other. The server may be a cloud server, a server of a distributed system, or a server incorporating a blockchain.
It should be appreciated that various forms of the flows shown above may be used to reorder, add, or delete steps. For example, the steps recited in the present disclosure may be performed in parallel, sequentially, or in a different order, provided that the desired results of the disclosed aspects are achieved, and are not limited herein.
The above detailed description should not be taken as limiting the scope of the present disclosure. It will be apparent to those skilled in the art that various modifications, combinations, sub-combinations and alternatives are possible, depending on design requirements and other factors. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present disclosure are intended to be included within the scope of the present disclosure.

Claims (20)

1. A method of item quality monitoring, the method comprising:
at least one quality test is carried out on a target item by using a test script within a preset period, so that at least one test result of the target item is obtained;
determining at least one actual defect of the target item in a preset period based on the at least one test result;
determining a development difficulty value of the target project and a severity level of each of the actual defects;
And determining a quality value of the target project based on the development difficulty value and the severity level of each of the actual defects.
2. The method of claim 1, wherein the severity level of each of the actual defects is determined by:
determining the type of the actual defect;
determining at least one cost parameter caused by the actual defect;
and determining the severity level of the actual defect based on the type corresponding to the actual defect and the cost parameter.
3. The method of claim 2, wherein the determining the severity level of the actual defect based on the type corresponding to the actual defect and the cost parameter comprises:
invoking defect attribute data of the target item from a preset storage location, wherein the defect attribute data comprises importance of each potential defect of the target item;
determining target potential defects with the same type as the actual defects from the defect attribute data, and taking the importance of the target potential defects as the importance corresponding to the actual defects;
determining a weight coefficient corresponding to each cost parameter;
calculating the importance corresponding to each cost parameter based on the parameter value of each cost parameter and the weight coefficient;
And determining the severity level of the actual defect based on the importance degree corresponding to the actual defect and the importance degree corresponding to each cost parameter.
4. A method according to claim 3, wherein the importance level corresponding to the potential defect and the weight coefficient corresponding to the cost parameter are respectively related to at least one of the type of the target item, the demand preference of the customer and the contract content.
5. The method of claim 2, wherein the cost parameter comprises an increase in cost caused by the actual defect and/or a delay time caused by the actual defect.
6. The method of any of claims 1-5, wherein the determining a quality value for the target item based on the development difficulty value and a severity level of each of the actual defects comprises:
calculating an actual defect severity value for the target item based on the severity level of each of the actual defects;
and determining the ratio of the actual defect severity value to the development difficulty value as the quality value of the target project.
7. The method of claim 6, wherein said calculating an actual defect severity value for said target item based on a severity level of each of said actual defects comprises:
Determining the number of the actual defects corresponding to each of the severity levels based on the severity level of each of the actual defects;
calculating an actual defect severity sub-value corresponding to each severity level based on the actual defect number corresponding to each severity level and a preset actual defect coefficient;
and determining the sum of the actual defect severity sub-values corresponding to the severity levels as the actual defect severity value of the target item.
8. The method of any of claims 1-7, wherein the development difficulty value of the target project comprises a contract amount for the target project;
alternatively, the target project includes a plurality of sub-projects, and the development difficulty value of the target project includes a sum of contract amounts of the plurality of sub-projects.
9. The method of any of claims 1-8, further comprising:
acquiring quality values of the target item in a plurality of periods;
determining a quality value change trend of the target item based on the quality values of the target item in a plurality of periods;
and determining a quality improvement measure of the target item based on the quality value change trend of the target item.
10. An item quality monitoring device, the device comprising:
The project testing module is used for carrying out quality test on a target project at least once in a preset period by using a testing script to obtain at least one testing result of the target project;
the defect determining module is used for determining at least one actual defect of the target item in a preset period based on the at least one test result;
the defect information determining module is used for determining the development difficulty value of the target project and the severity level of each actual defect;
and the quality determining module is used for determining the quality value of the target project based on the development difficulty value and the severity level of each actual defect.
11. The apparatus of claim 10, wherein the defect information determining module determines the severity level of each of the actual defects by:
determining the type of the actual defect;
determining at least one cost parameter caused by the actual defect;
and determining the severity level of the actual defect based on the type corresponding to the actual defect and the cost parameter.
12. The apparatus of claim 11, wherein the defect information determining module, when configured to determine the severity level of the actual defect based on the type corresponding to the actual defect and the cost parameter, is specifically configured to:
Invoking defect attribute data of the target item from a preset storage location, wherein the defect attribute data comprises importance of each potential defect of the target item;
determining target potential defects with the same type as the actual defects from the defect attribute data, and taking the importance of the target potential defects as the importance corresponding to the actual defects;
determining a weight coefficient corresponding to each cost parameter;
calculating the importance corresponding to each cost parameter based on the parameter value of each cost parameter and the weight coefficient;
and determining the severity level of the actual defect based on the importance degree corresponding to the actual defect and the importance degree corresponding to each cost parameter.
13. The apparatus of claim 12, wherein the importance level corresponding to the actual defect, the weight coefficient corresponding to the cost parameter, and at least one of the type of the target item, the demand preference of the customer, and the contract content are determined.
14. The apparatus of claim 11, wherein the cost parameter comprises an increase in cost due to the actual defect, a delay time due to the actual defect.
15. The apparatus according to any one of claims 10-14, wherein the quality determination module, when configured to determine the quality value of the target item based on the development difficulty value and the severity level of each of the actual defects, is configured to:
calculating an actual defect severity value for the target item based on the severity level of each of the actual defects;
and determining the ratio of the actual defect severity value to the development difficulty value as the quality value of the target project.
16. The apparatus of claim 15, wherein the quality determination module, when configured to calculate an actual defect severity value for the target item based on a severity level of each of the actual defects, is configured to:
determining the number of the actual defects corresponding to each of the severity levels based on the severity level of each of the actual defects;
calculating an actual defect severity sub-value corresponding to each severity level based on the actual defect number corresponding to each severity level and a preset actual defect coefficient;
and determining the sum of the actual defect severity sub-values corresponding to the severity levels as the actual defect severity value of the target item.
17. The apparatus of any of claims 10-16, wherein the development difficulty value of the target project comprises a contract amount for the target project;
Alternatively, the target project includes a plurality of sub-projects, and the development difficulty value of the target project includes a sum of contract amounts of the plurality of sub-projects.
18. An electronic device, comprising: at least one processor; and a memory communicatively coupled to the at least one processor;
wherein the memory stores instructions executable by the at least one processor to enable the at least one processor to perform the method of any one of claims 1-9.
19. A non-transitory computer readable storage medium storing computer instructions for causing a computer to perform the method of any one of claims 1-9.
20. A computer program item comprising a computer program which, when executed by a processor, implements the method according to any one of claims 1-9.
CN202310118483.4A 2023-02-03 2023-02-03 Project quality monitoring method and device, electronic equipment and storage medium Pending CN116028373A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202310118483.4A CN116028373A (en) 2023-02-03 2023-02-03 Project quality monitoring method and device, electronic equipment and storage medium

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202310118483.4A CN116028373A (en) 2023-02-03 2023-02-03 Project quality monitoring method and device, electronic equipment and storage medium

Publications (1)

Publication Number Publication Date
CN116028373A true CN116028373A (en) 2023-04-28

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