CN115979323A - Instrument detection method and system based on instrument detection system - Google Patents

Abstract

This application provides an instrument inspection method and system based on an instrument inspection system. The instrument inspection system includes inspected equipment and standard equipment, and the inspected equipment is connected to the standard equipment to form a detection circuit. During the inspection process, a forward measurement is first performed , and then perform reverse measurement on at least a part of the equipment in the detection circuit, and then eliminate the contact potential difference in the detection circuit according to the results of the forward measurement and the reverse measurement. The method and instrument detection system provided by this application only need to adjust the power supply direction during the detection process, without multiple access or removal of equipment, and can eliminate the contact potential difference without measuring it, thereby improving the elimination The accuracy of the error.

Description

Instrument detection method and system based on instrument detection system

technical field

The application belongs to the field of measurement verification, and in particular relates to an instrument detection method and system based on an instrument detection system.

Background technique

Used in the fields of pressure, temperature, process, etc., with instrumentation equipment that emits voltage signals and/or measures voltage signals, such as transmitters, sensors, meters used with sensors or probes, calibrator, etc., in Calibration is required before leaving the factory or before use, so as to obtain accurate indications in actual use.

When calibrating the tested equipment, it is necessary to use wires to electrically connect the tested equipment with the standard equipment. Specifically, if the tested channel of the tested equipment is used to send out voltage signals, it needs to be connected with a higher measurement Accurate standard equipment is electrically connected. If the tested channel of the tested equipment is used to measure voltage signals, it needs to be electrically connected to standard equipment that can generate higher-precision voltage signals.

However, generally speaking, the material connected into the passage in the tested equipment and the standard equipment is different from the material of the wire, therefore, a contact potential difference is often formed in the detection circuit. The contact potential difference is the potential difference generated between two different metals in a circuit where they are in contact with each other. Specifically, it is due to the difference in the ability of electrons in two different metals to pass through each other at the junction, resulting in uneven distribution of electrons on both sides of the interface. The side lacking electrons is positively charged, and the side with excess electrons is negatively charged. When reaching After dynamic equilibrium, the potential difference established on the metal junction is the contact potential difference.

For example, when the channel under test generates a voltage signal and transmits it to the standard device, the actual voltage U _S on the standard device is shown in the following formula I:

U _S ＝U _T +Δu _L Formula I

Among them, U _S represents the actual voltage on the standard equipment, U _T represents the actual voltage at the channel to be tested, and Δu _L represents the contact potential difference. Generally, Δu _L is much smaller than the division value of the channel under test and can be ignored. However, in the field of microelectric voltage detection, due to the small voltage signal to be measured, higher accuracy is required. For example, the range is only 0-10mV, Δu _L may reach the scale value of the channel to be tested, therefore, Δu _L cannot be ignored, especially for the field of metrology and calibration, the requirements for measurement accuracy are relatively high, and the deviation caused by Δu _L is even greater. Compensation is required.

There is a solution in the prior art. Before connecting the tested equipment to the detection circuit, the calibration standard equipment with the same function as the tested equipment is connected to the detection circuit to form a detection circuit with the original standard equipment, so that the Δu _L Carry out direct measurement. After the measurement is completed, remove the calibration standard equipment, connect the tested equipment to the detection circuit, and then compensate the actual measured value of the tested equipment according to the aforementioned Δu _L measurement results. However, since this scheme needs to test the calibration standard equipment once, and then test the tested equipment again, it will not only double the detection amount, but also need to switch between the standard equipment and the tested equipment, especially, For batch testing where the number of instruments to be tested is on the order of hundreds or more, this solution is difficult to realize automatic operation, which seriously restricts the testing speed.

Contents of the invention

In order to solve the problems existing in the prior art, the application provides an instrument detection method and system based on the instrument detection system, the instrument detection system includes a main control system and at least one detection circuit, and the detection circuit includes standard equipment connected to The main control system controls the standard equipment and the tested equipment to perform at least two rounds of detection, wherein, in the first round of detection, the signal generating device applies a first signal to the detection circuit, and the signal measurement The device detects the first signal to obtain a first measurement result, the signal generating device is any one of the standard device and the tested device, and the signal measuring device is the standard device and the tested device The other one; in the second round of detection, the signal generating device applies a second signal to the detection circuit, and the signal measuring device detects the second signal to obtain a second measurement result, and the second signal is opposite to the first signal; The contact potential difference is calculated based on the first signal, the first measurement result, the second signal and the second measurement result, and then the test result of the tested equipment is corrected. The method can realize automatic detection of the tested equipment in the The contact potential difference in the detection circuit does not need to introduce standard inspection equipment, simplifies the operation, and saves a lot of time and cost in the process of testing a large number of tested equipment.

The purpose of this application is to provide the following aspects:

In a first aspect, the present application provides an instrument detection method based on an instrument detection system, the instrument detection system includes a main control system and at least one detection circuit, the detection circuit includes a first standard device, and the first standard device includes One of the first signal generating device or the first signal measuring device, the instrument inspection system is used to detect the first inspected device, the first inspected device includes the first signal generating device or the Another one of the first signal measuring devices, the instrument detection method includes: controlling the first signal generating device to apply a first electrical signal to the detection circuit, and the first signal measuring device measures the first electrical signal signal, acquire the first measurement result, and send the first measurement result to the main control system; control the first signal generation device to apply a second electrical signal to the detection circuit, and the first signal measurement device measures the the second electrical signal, obtain a second measurement result, and send the second measurement result to the main control system, wherein the second electrical signal is opposite to the first electrical signal; the main control system according to the The first measurement result and the second measurement result calculate the contact potential difference of the detection circuit; the main control system detects the first device under inspection based on the detection circuit, obtains the first detection result, and according to the contact The potential difference compensates for the first detection result.

In the method provided by the present application, two electrical signals in opposite directions are applied to the detection circuit, and a measurement result is obtained for each electrical signal. Ideally, the difference between the two measurement results is twice After the contact potential difference is determined, the tested equipment can be tested according to the test task, and the test result can be obtained, and then the test result can be corrected according to the contact potential difference, so as to realize the test without additional inspection standard equipment In the case of online acquisition of the contact potential difference of the tested equipment in the detection circuit, on the one hand, it greatly simplifies the operation of determining the contact potential difference, and on the other hand, it can also avoid the difference between the test standard equipment and the tested equipment. error. It can be understood that the step of testing the tested equipment and determining the contact potential difference can be interchanged, that is, the tested equipment can be tested according to the test task first, and then determined according to the method provided in this application after the test is completed. The contact potential difference of the device under test in the detection circuit.

In combination with the meter testing method described in the first aspect, the controlling the first signal generating device to apply a first electrical signal to the detection circuit includes: controlling the first signal generating device to be directly connected to the detection circuit, The first signal generating device generates the first electrical signal; the controlling the first signal generating device to apply the second electrical signal to the detection circuit includes: controlling the first signal generating device to be reversely connected to The detection circuit, the first signal generating device generates the first electrical signal.

In this application, by switching the connection direction, it can be made that when the first signal generating device generates the same electrical signal and no signal error is introduced, the detection circuit passes an opposite electrical signal, thereby further improving the contact potential difference. Measurement accuracy.

In combination with the meter testing method described in the first aspect, the controlling the first signal measuring device to measure the first electrical signal includes: controlling the first signal measuring device to be directly connected to the detection circuit, the first A signal measurement device measures the electrical signal transmitted by the detection circuit; the first signal measurement device measures the second electrical signal, including: controlling the first signal measurement device to be reversely connected to the detection circuit A circuit, the first signal measuring device measures the electrical signal transmitted by the detection circuit.

In this application, by switching the connection direction, on the one hand, the opposite electrical signal actually passes through the detection circuit, which is convenient to eliminate the influence of the signal itself in the calculation; on the other hand, the electrical signal actually measured by the first signal measuring device is very close to , will not introduce signal errors, thereby further improving the measurement accuracy of the contact potential difference.

In combination with the meter testing method described in the first aspect, the first standard equipment includes the first signal generating device and the second signal measuring device, and the meter testing system is also used to test the second tested device, so The second checked device includes a second signal generating device, and the instrument detection method further includes: controlling the second checked device to be connected to the detection circuit, the second checked device generates a third electrical signal, and controlling The first device under test is directly connected to the detection circuit, the first device under test measures the electrical signal transmitted by the detection circuit, obtains a third measurement result, and sends the third measurement result to the main control system. As a result of the measurement, the third electrical signal is the same as the first electrical signal; the second tested device is controlled to be reversely connected to the detection circuit, the second tested device generates the third electrical signal, and the control The first device under test is directly connected to the detection circuit, the first device under test measures the electrical signal transmitted by the detection circuit, obtains a fourth measurement result, and sends the fourth measurement result to the main control system. Measurement results: control the second tested device to be directly connected to the detection circuit, the second tested device generates the third electrical signal, and the first standard device measures the electrical signal transmitted by the detection circuit , acquire the fifth measurement result, send the fifth measurement result to the main control system; control the second tested device to be reversely connected to the detection circuit, and the second tested device generates the third electrical signal, the first standard device measures the electrical signal transmitted by the detection circuit, obtains the sixth measurement result, and sends the sixth measurement result to the main control system; the main control system according to the first electrical signal, said second electrical signal, said third electrical signal, said first measurement, said second measurement, said third measurement, said fourth measurement, said fifth measurement As a result, the sixth measurement result calculates the contact potential difference of the detection circuit.

In this application, for the situation that the first signal generating device and the first signal measuring device cannot be reversely connected to the detection circuit, if the first device under test is a signal measuring device, the reverse connection can be introduced The second standard equipment (signal measuring device) of the detection circuit is used to determine the contact potential difference between any two devices in the detection circuit, so as to determine the contact potential difference of the detected device in the detection circuit.

In combination with the meter testing method described in the first aspect, the first standard equipment includes the first signal measuring device and the third signal generating device, and the meter testing system is also used for testing the third tested device, so The third tested device includes a third signal measuring device, and the instrument detection method further includes: controlling the first tested device to be directly connected to the detection circuit, the first tested device generates a fourth electrical signal, and controlling The third tested device is directly connected to the detection circuit, the third tested device measures the electrical signal transmitted by the detection circuit, obtains a seventh measurement result, and sends the seventh measured result to the main control system. As a result of the measurement, the fourth electrical signal is the same as the first electrical signal; the first tested device is controlled to be connected to the detection circuit, the first tested device generates a fifth electrical signal, and the first tested device is controlled to The three tested devices are reversely connected to the detection circuit, the third tested device measures the electrical signal transmitted by the detection circuit, obtains an eighth measurement result, and sends the eighth measurement result to the main control system , wherein the fifth electrical signal is the same as the second electrical signal; the first standard device is controlled to apply the fourth electrical signal to the detection circuit, and the third tested device is controlled to be connected to the a detection circuit, wherein the third tested device measures the electrical signal transmitted by the detection circuit, obtains a ninth measurement result, and sends the ninth measurement result to the main control system; controls the first standard device to The detection circuit applies the fifth electrical signal to control the third tested device to be reversely connected to the detection circuit, the third tested device measures the electrical signal transmitted by the detection circuit, and obtains the tenth Measurement results, sending the tenth measurement result to the main control system; the main control system according to the first electrical signal, the second electrical signal, the fourth electrical signal, the fifth electrical signal , the first measurement result, the second measurement result, the seventh measurement result, the eighth measurement result, the ninth measurement result and the tenth measurement result calculate the contact potential difference of the detection circuit .

In this application, for the situation that the first signal generating device and the first signal measuring device cannot be reversely connected to the detection circuit, if the first detected device is a signal generating device, the reverse connection can be introduced Determine the contact potential difference between any two devices in the detection circuit based on the third standard device (signal generating device) of the detection circuit, so as to determine the contact potential difference of the detected device in the detection circuit.

In combination with the instrument detection method described in the first aspect, the detection of the first detected device based on the detection circuit includes determining at least one first detection point according to the first detected device; controlling the generation of the first signal The device applies an electrical signal to the detection circuit according to the first detection point; the first signal measurement device measures the electrical signal of the detection circuit to obtain the first detection result; according to the compensated first A detection result and the first detection point are used to detect the first device under inspection.

In combination with the meter detection method described in the first aspect, the first standard device is the first signal generating device, and the meter detection system is also used to detect the fourth tested device, and the fourth tested device As a signal generating device, the instrument detection method further includes: the detection of the first detected device includes determining that the first detected device has a first allowable error; based on the fourth detected device The device determines at least one second detection point, the second detection point is within the measurement range of the fourth tested device and the first tested device, and the allowable error of the fourth tested device is greater than the first allowable error; the first standard device applies an electrical signal to the detection circuit according to the second detection point, the first device under test measures the electrical signal of the detection circuit, obtains a second detection result, and sends The main control system sends the second detection result; the fourth detected device applies an electrical signal to the detection circuit according to the second detection point, and the first detected device applies an electrical signal to the detection circuit signal to measure, obtain a third detection result, and send the third detection result to the main control system; based on the second detection point, the second detection result and the third detection result, the fourth The tested equipment is tested.

In this application, in the process of batch detection of multiple detected devices, the same batch of detected devices (signal generating devices) can be used to assist in determining where the first detected device (signal measuring device) is located. The contact potential difference in the detection circuit.

In combination with the meter detection method described in the first aspect, the first standard device is the first signal measuring device, and the meter detection system is also used to detect the fifth device under test, and the fifth device under test It is a signal measurement device, and the instrument detection method further includes: the detection of the first detected device includes determining that the first detected device has a first allowable error; based on the fifth detected device The device determines at least one third detection point, the third detection point is within the measurement range of the fifth tested device and the first tested device, and the allowable error of the fifth tested device is greater than the first allowable error; the first tested device applies an electrical signal to the detection circuit according to the third detection point, the first standard device measures the electrical signal of the detection circuit, obtains a fourth detection result, and sends The main control system sends the fourth detection result; the first detected device applies an electrical signal to the detection circuit according to the third detection point, and the fifth detected device applies an electrical signal to the detection circuit measure the signal, obtain the fifth detection result, and send the fifth detection result to the main control system; based on the three detection points, the fourth detection result and the fifth detection result, the fifth detected result Inspection equipment for inspection.

In this application, in the process of batch detection of a plurality of detected devices, the same batch of detected devices (signal measurement devices) can be used to assist in determining where the first detected device (signal generating device) is located. The contact potential difference in the detection circuit.

In the second aspect, the present application also provides a computer-readable storage medium, on which computer instructions are stored, and when the instructions are executed by a processor, the steps of the instrument detection method described in the first aspect above are realized.

In a third aspect, the present application also provides a meter detection device, the detection device includes: at least one processor; and a memory connected in communication with the at least one processor; wherein, the memory stores information that can be used by the one Instructions executed by a processor, the instructions are executed by the at least one processor, so that the at least one processor executes the instrument detection method described in the first aspect above.

In a fourth aspect, the present application also provides a main control system, the main control system is applied to an instrument detection system, and the main control system is configured to send a first generation control signal to the first signal generation device, and send a first generation control signal to the detection circuit Sending a first connection control signal, so that the first signal generating device is electrically connected to the detection circuit, and applies a first electrical signal to the detection circuit, and the first signal generating device is the first standard device or the first One of the devices under test; at least partly simultaneously with the first generation control signal and the first connection control signal, sending the first measurement control signal to the first signal measurement device, and sending the second connection control signal to the detection circuit control signal, so that the first signal measurement device is electrically connected to the detection circuit, and measures the first electrical signal transmitted by the detection circuit to generate a first measurement result, and the first signal measurement device It is the other of the first standard device or the first tested device; sending a second generation control signal to the first signal generating device, and sending a third connection control signal to the detection circuit, so that the first signal generating device Electrically connected to the detection circuit, and applying a second electrical signal to the detection circuit, the second electrical signal is opposite to the first electrical signal; at least partly at the same time as the second generation control signal and the first Three connection control signals, sending a second measurement control signal to the first signal measuring device, and sending a fourth connection control signal to the detection circuit, so that the first signal measurement device is electrically connected to the detection circuit, and the Measure the second electrical signal transmitted by the detection circuit to generate a second measurement result; obtain the first measurement result and the second measurement result from the first signal measurement device; according to the first measurement result calculating the contact potential difference of the detection circuit with the second measurement result; storing the contact potential difference, obtaining a first detection result, and compensating the first detection result according to the contact potential difference, and the first detection result is Based on the measurement information generated by the detection circuit detecting the first device under inspection.

In the fifth aspect, the present application also provides a meter detection system, the meter detection system includes a detection circuit, the detection circuit includes a first standard device, and the first standard device is a first signal generation device or a first signal measurement Any of the devices, the instrument detection system is used to detect the first device to be tested, and the first device to be tested is the first signal generating device or the other of the first signal measuring device One, during at least one measurement process, the detection circuit is electrically connected to the first signal generation device and the first signal measurement device, so that the first signal generation device applies a first electrical signal to the detection circuit , the first signal measurement device measures the first electrical signal to generate a first measurement result; during at least another measurement process, the detection circuit is electrically connected to the first signal generation device and the first signal measurement device, so that the first signal generating device applies a second electrical signal to the detection circuit, and the first signal measuring device measures the second electrical signal to generate a second measurement result, and the first measurement result and The second measurement result is used to calculate the contact potential difference of the detection circuit; at least in one detection process, the detection circuit is electrically connected to the first standard device and the first device to be tested for The first detected device is detected to generate a first detection result, and the contact potential difference is used to compensate the first detection result.

Compared with the prior art, the instrument detection system provided by this application includes the tested equipment and standard equipment, such as standard voltmeter, standard ammeter, etc., and the tested equipment is connected with the standard equipment to form a detection circuit. The method provided by this application In the detection process, first conduct a forward measurement on the tested equipment, and then perform a reverse measurement on at least a part of the equipment in the detection circuit, including the tested equipment and/or standard equipment, and then according to the results of the forward measurement and the results of the reverse measurement Results The contact potential difference in the detection circuit was eliminated, so that more accurate detection results were obtained. The method and instrument detection system provided by this application can be realized only by changing the power supply direction during the detection process, without the need to connect or remove the device multiple times, reducing the complexity of the operation, and, in the case of not measuring the contact potential difference It can be eliminated, thereby improving the accuracy of eliminating errors.

Description of drawings

Fig. 1 shows a schematic diagram of a detection circuit;

FIG. 2 shows a flowchart of a method for eliminating detection line errors provided by the present application.

Detailed ways

Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numerals in different drawings refer to the same or similar elements unless otherwise indicated. The implementations described in the following exemplary examples do not represent all implementations consistent with the present invention. Rather, they are merely examples of approaches consistent with aspects of the invention as recited in the appended claims.

The method for eliminating detection line errors and the instrument detection system provided by the present application will be described in detail below through specific embodiments.

First, a brief introduction to the usage scenarios of this solution.

According to different functions, instrumentation equipment can be divided into at least the following two categories, one is used to generate signals, specifically used for voltage signals or current signals, called signal generating equipment; the other is used for measuring signals, specifically used Used to measure voltage or current values, it is called signal measuring equipment.

According to different roles in the testing process, instrumentation equipment can be divided into at least the following two categories, one is the testing object, which is called the tested equipment, and can also be called the tested instrument; the other is used to provide standard values, Call it standard equipment.

It can be understood that the tested device can be either a signal generating device or a signal measuring device, and similarly, the standard device can also be a signal generating device or a signal measuring device.

Usually, the function of the tested equipment is different from that of the standard equipment, so after determining the contact potential difference between the tested equipment and the detection circuit, the test result of the tested equipment can be directly corrected

In this application, according to the general understanding of those skilled in the art, there is a corresponding relationship between the standard equipment and the tested equipment. Specifically, the standard equipment has a higher accuracy. Compared with the standard equipment, the tested The detection equipment has low accuracy, so it can be considered that the indication value of the standard equipment is the real value. The standard equipment can cover at least part of the range of the equipment under inspection. The standard equipment is used as the signal generating equipment, and the equipment under inspection is the signal generator. Taking measuring equipment as an example, the range of the signal generated by the standard equipment is 1 ~ 5mV, and the measurement range of the tested equipment is 0 ~ 3mV, so that the standard equipment can generate a standard signal for testing the tested equipment or the signal generated by the tested equipment. The detected signal is measured.

Corresponding to the standard equipment, it is considered that the tested equipment itself has a systematic error, that is, it has a relatively low accuracy. For the convenience of description, in the following examples, it is assumed that the tested equipment has a systematic error Δu _T , and, in Before the calibration of the tested equipment, the systematic error value of the tested equipment cannot be determined.

In this application, it is assumed that the systematic error of the tested equipment has a relatively good linear variation.

For a small number of standard equipment, it has the above two functions at the same time, that is, it can generate standard signals and can also be used for standard measurement, but in the case of access, it only opens a single function, that is, only one of the above two functions can be selected turned on, but not at the same time.

Fig. 1 shows the schematic diagram of the meter detection system used in this application, as shown in Fig. 1, the meter detection system includes a main control system and at least one detection circuit, the main control system is used to control the Each device may also process the test result of the device under test connected to the detection circuit.

Usually, the detection circuit is used to connect the tested equipment and the corresponding standard equipment. In the process of batch testing, since there are multiple tested equipment, the types of each tested equipment may be different, so there may be multiple standard equipment. , these standard equipment and the equipment to be tested can be connected by the same detection circuit. Correspondingly, a switch/on-off switch or similar devices will be configured in the detection circuit, so that at a certain moment, only one signal generating device is activated in the detection circuit. and a signal measuring device.

It can be understood that the detection circuit also includes necessary components forming the circuit, such as signal wires and power wires. In the present application, the signal line is used to transmit signals between the main control system and each device, including control signals and data signals, and the power line is used to provide electric energy for each device.

In the present application, the contact potential difference in the detection circuit is generated based on the material of the connecting line, and its direction does not change with the change of the current direction.

This application is made to solve the inherent deviation factor of the detection circuit, which is the contact potential difference. Therefore, this application mainly describes how to measure and eliminate the means of contact potential difference. This does not mean that this application excludes other technical means to solve measurement errors. In fact, , the solution of this application can be combined with other methods of solving measurement errors in the prior art. For example, if a solution is designed in the prior art to solve the signal deviation caused by impedance, due to the impedance and contact potential difference Belonging to different deviation factors, therefore, this prior art solution can be combined with the present application, that is, it is allowed to use multiple compensation values to compensate the measurement result, so that the reliability of the measurement result is higher.

In addition, it should be noted that in this application, the detection circuit includes at least the following two purposes, the first is to determine the contact potential difference of the device under test in the detection circuit, and the second is to determine the contact potential difference of the device under test according to the The test task of the configuration of the inspected device is used to test the inspected device.

In this application, standard equipment has the following characteristics. Standard equipment is generally tested and verified by higher-level standard equipment. Therefore, its measurement results have higher reliability and can be considered as true values. At the same time, from the measurement and detection From the point of view, the accuracy of the standard equipment is generally higher than the accuracy of the tested equipment, that is, the allowable error of the standard equipment is smaller than the allowable error of the tested equipment. In some cases, the allowable error of the standard equipment is the allowable error of the tested equipment. 1/2, 1/3, 1/4 or less of the error.

In this application, signal generating equipment refers to equipment capable of generating electrical signals, including but not limited to calibrator, process instrument, transmitter, sensor, signal standard, etc., and signal measuring equipment refers to equipment capable of measuring electrical signals. Equipment, including but not limited to calibrators, process instruments, meters (of measuring instruments), etc.

Fig. 2 shows a flow chart of an instrument detection method based on the instrument detection system provided by the present application. In this example, the detection circuit: includes a first standard device, and the first standard device is the first signal generating device or the first Any one of the signal measuring devices, the instrument detection system is used to detect the first tested device, and the first tested device is the first signal generating device or the first signal measuring device The other, that is, if the first standard device is the first signal generating device, then the first tested device is the first signal measuring device, on the contrary, if the first standard device is the first signal measuring device, then the first The tested device is the first signal generating device. As shown in Figure 2, the method includes the following steps S001 to S004:

Step S001, controlling the first signal generating device to apply a first electrical signal to the detection circuit, the first signal measuring device measures the first electrical signal, obtains a first measurement result, and sends it to the main control system The first measurement result.

In this example, the first electrical signal is an electrical signal that matches the first device under test. Specifically, if the first device under test is a voltage generation or voltage measurement device, the first The electrical signal is a voltage signal; if the first device under test is a current generating or current measuring device, then the first electrical signal is a current signal.

In this application, the term "apply" refers to providing an electrical signal to the detection circuit, so that for the first signal generating device, it can make the value of the electrical signal passing through the detection circuit within its capability. is the target electrical signal value, if the first signal generating device is a standard device, the electrical signal it generates is theoretically equal to the target electrical signal value (in the case of reverse connection, it is just the opposite), if the first electrical signal generating device is the tested device, Due to the error of the tested equipment itself, the application at this time is only the electrical signal that the tested equipment thinks has produced the target electrical signal value, but in fact this electrical signal may have deviations from the real value. In addition, due to factors such as contact potential difference , the signal value of the electrical signal applied by the signal generating device may deviate from the signal value generated by it after passing through the detection circuit.

It can be understood that the first electrical signal is within the range of the first standard device and the first device under test.

In this example, the first measurement result is a result of the first electrical signal being acted on by the contact potential difference.

Step S002, controlling the first signal generating device to apply a second electrical signal to the detection circuit, the first signal measuring device measures the second electrical signal, obtains a second measurement result, and sends it to the main control system The second measurement result, wherein the second electrical signal is opposite to the first electrical signal.

In this example, the second electrical signal and the first electrical signal are equal in value and opposite in direction.

In this example, the second measurement result is a result of the action of the second electrical signal and the contact potential difference.

In this example, the contact potential difference acting on the second telecommunication signal and the contact potential difference acting on the first electric signal have the same direction and are equal in value.

In this example, applying the second electrical signal can be implemented in many different ways, for example, it can be implemented by reversely connecting the first signal generating device to the detection circuit, etc. Specifically, it can be implemented as follows Other examples are shown.

Step S003, the main control system calculates the contact potential difference of the detection circuit according to the first measurement result and the second measurement result.

In this example, the electrical signal forming the first measurement result is the same in magnitude as the electrical signal forming the second measurement result, and its direction is opposite, and the mathematical expression is an opposite number, while the contact potential difference in the secondary measurement is equal in magnitude and direction Likewise, the mathematical representation is an equal number, based on which the contact potential difference can be calculated mathematically.

Step S004, the main control system detects the first detected device based on the detection circuit, obtains a first detection result, and compensates the first detection result according to the contact potential difference.

In this example, the detection is performed according to the test task corresponding to the first device, and the obtained test result is also affected by the contact potential difference. Therefore, the contact potential difference can be determined according to the contact potential difference determined in steps S101 to S103. Compensation, so that the test results are more accurate.

It can be understood that, the method for compensating the test result in this step may adopt any method for compensating the test result of the tested device in the prior art.

It can be understood that the contact potential difference can be compensated to the measurement result obtained by the signal measuring device, or can be compensated to the signal generated by the signal generating device. Generally, the contact potential difference is compensated to the signal generating device.

In the method provided by the present application, two electrical signals in opposite directions are applied to the detection circuit, and a measurement result is obtained for each electrical signal. Ideally, the difference between the two measurement results is twice After the contact potential difference is determined, the tested equipment can be tested according to the test task, and the test result can be obtained, and then the test result can be corrected according to the contact potential difference, so as to realize the test without additional inspection standard equipment In the case of online acquisition of the contact potential difference of the tested equipment in the detection circuit, on the one hand, it greatly simplifies the operation of determining the contact potential difference, and on the other hand, it can also avoid the difference between the test standard equipment and the tested equipment. error. It can be understood that the step of testing the tested equipment and determining the contact potential difference can be interchanged, that is, the tested equipment can be tested according to the test task first, and then determined according to the method provided in this application after the test is completed. The contact potential difference of the device under test in the detection circuit.

If the first signal generating device can be reversely connected to the detection circuit, the solution of the present application can be as shown in the first and second embodiments below.

Embodiment one

In this embodiment, the method of measuring the contact potential difference is given through S101-S103.

The first signal generating device is the first standard device, and the first signal measuring device is the first tested device, and the first standard device can be switchably connected directly and reversely to the detection circuit is used, then:

In step S101, the first signal generating device applying the first electrical signal to the detection circuit may specifically be: the first standard device is directly connected to the detection circuit and generates the first electrical signal.

Specifically, the relationship between the first measurement result and the first electrical signal satisfies the following formula 1-1:

U _N11 +Δu _L1 ＝U _R11 +Δu _T11 Formula 1-1

Wherein, U _N11 represents the standard indication value of the standard voltage generated by the first standard equipment in this step, that is, the first electrical signal;

Δu _L1 represents the contact potential difference of the detection circuit connecting the first standard equipment and the first tested equipment;

U _R11 represents the actual indication value of the first device under test, that is, the first measurement result;

Δu _T11 represents the measurement error of the first device under test when measuring the first electrical signal.

In this embodiment, in step S102, the first signal generating device applying the second electrical signal to the detection circuit may specifically be: the first standard device is reversely connected to the detection circuit and generates the first an electrical signal.

Specifically, the relationship between the second measurement result and the second electrical signal satisfies the following formula 1-2:

-U _N11 +Δu _L1 ＝U _R12 +Δu _T12 Formula 1-2

Wherein, U _N11 represents the standard indication value that the standard equipment produces the standard voltage in this step, that is, the first electrical signal, so -U _N11 is the second electrical signal;

Δu _L1 represents the contact potential difference of the first device under test in the detection circuit, which is the same as in formula 1-1 because the connection line remains unchanged;

U _R12 represents the actual indication value of the tested equipment, that is, the second measurement result;

Δu _T12 represents the measurement error of the first device under test when measuring the second electrical signal.

Furthermore, when the first device under test is relatively stable, its measurement error is in a state of uniform distribution, that is, the relationship between Δu _T12 and Δu _T11 satisfies the following formula 1-3:

Δu _T11 ＝-Δu _T12 Formula 1-3

In step S103, the above formula 1-1 and formula 1-2 are added to get:

U _N11 +Δu _L1 -U _N11 +Δu _L1 ＝U _R11 +Δu _T11 +U _R12 +Δu _T12 Formula 1-4

Further processing of the above formula 1-4 in conjunction with the above formula 1-3 can obtain the following formula 1-5:

It can be understood that, in this embodiment, the measurement order of applying the forward signal S101 and applying the reverse signal S102 can be reversed.

Embodiment two

This embodiment has the same equipment basis as Embodiment 1, the first signal generating device is the first standard device, and the first signal measuring device is the first tested device, which is different from Embodiment 1 Furthermore, the first tested device can be switched to be used in the detection circuit in direct and reverse connection, therefore, this embodiment can solve the technical problem independently of the first embodiment, and can also be combined with the first embodiment Solving technical problems, taking the joint solution of technical problems as an example, through further improvement of S201-S203, the method of measuring contact potential difference is given.

The first signal generating device is the first standard device, and the first signal measuring device is the first tested device, and the first standard device can be reversely connected to the detection circuit for use ,but:

In step S201, the first signal generating device applying a first electrical signal to the detection circuit may specifically be: the first standard device is directly connected to the detection circuit and generates the first electrical signal.

This embodiment also includes that the first signal measuring device measures the first electrical signal, specifically, the first device under test is directly connected to the detection circuit and measures the first electrical signal.

Specifically, the relationship between the first measurement result and the first electrical signal satisfies Formula 2-1:

U _N11 +Δu _L1 ＝U _R11 +Δu _T11 Formula 2-1

Wherein, U _N11 represents the standard indication value of the standard voltage generated by the first standard equipment in this step, that is, the first electrical signal;

Δu _L1 represents the contact potential difference of the detection circuit connecting the first standard equipment and the first tested equipment;

U _R11 represents the actual indication value of the first device under test, that is, the first measurement result;

Δu _T11 represents the measurement error of the first device under test when measuring the first electrical signal.

Step S202, the first signal generating device applying the second electrical signal to the detection circuit may specifically be: the first standard device is reversely connected to the detection circuit and generates the first electrical signal.

Specifically, the relationship between the second measurement result and the second electrical signal satisfies the following formula 2-2:

-U _N11 +Δu _L1 ＝-(U _R12 +Δu _T12 ) Formula 2-2

Wherein, U _N11 represents the standard indication value that the standard equipment produces the standard voltage in this step, that is, the first electrical signal, so -U _N11 is the second electrical signal;

Δu _L1 represents the contact potential difference of the first device under test in the detection circuit, which is the same as in formula 1-1 because the connection line remains unchanged;

U _R12 represents the actual indication value of the tested equipment, that is, the second measurement result;

Δu _T12 represents the measurement error of the first device under test when measuring the second electrical signal.

Further, U _R11 and U _R12 are both measurements of the first electrical signal, and there is a very small difference between them due to the existence of the contact potential difference. At the same or similar measurement points, the systematic error of the first device under test remains unchanged, that is The relationship between Δu _T12 and Δu _T11 satisfies the following formula 2-3:

Δu _T11 = Δu _T12 Formula 2-3

Step S203, add the above formula 2-1 and formula 2-3 to get:

U _N11 +Δu _L1 -U _N11 +Δu _L1 = U _R11 +Δu _T11 -U _R12 -Δu _T12 Formula 2-4

Further processing of the above formula 2-4 can obtain the following formula 2-5:

It can be understood that, in this embodiment, the measurement order of the forward measurement S201 and the reverse measurement S202 can be exchanged.

Embodiment three

In this embodiment, the method of measuring the contact potential difference is given through S301-S303.

The first signal generating device is the first tested device, and the first signal measuring device is the first standard device, and the first tested device can be reversely connected to the detection circuit Use then:

In step S301, the first signal generating device applying the first electrical signal to the detection circuit may specifically be: the first device under test is directly connected to the detection circuit and generates the first electrical signal.

Specifically, the relationship between the first measurement result and the first electrical signal satisfies the following formula 3-1:

U _R11 +Δu _T11 +Δu _L1 ＝U _N11 formula 3-1

Among them, U _R11 represents the indication value of the electrical signal generated by the first device under inspection mentioned in this step, that is, the first electrical signal;

Δu _L1 represents the contact potential difference of the detection circuit connecting the first device under test and the first standard device;

U _N11 represents the actual indication value of the first standard equipment detection U _R11 , that is, the first measurement result;

Δu _T11 represents the systematic error of the first device under test when generating the first electrical signal.

In this embodiment, in step S302, the first signal generating device applying the second electrical signal to the detection circuit may specifically be: the first device under test is reversely connected to the detection circuit and generates the first electrical signal.

Specifically, the relationship between the second measurement result and the second electrical signal satisfies the following formula 3-2:

-(U _R12 +Δu _T12 )+Δu _L1 ＝U _N12 Formula 3-2

Wherein, U _R12 represents the indication value of the electrical signal generated by the first device under inspection in this step, that is, the first electrical signal;

U _N12 represents the actual indication value of the first standard equipment detection U _R22 , that is, the second measurement result;

Δu _L1 represents the contact potential difference of the detection circuit connecting the first device under test and the first standard device;

Δu _T12 represents the systematic error of the first device under test when generating the second electrical signal.

Further, both U _R11 and U _R12 are the values of the first electrical signal. Since the generated signals are the same, the system error of the first device under test remains unchanged, and the relationship between Δu _T11 and Δu _T12 satisfies the following formula 3-3 :

Δu _T11 = Δu _T12 Formula 3-3

In step S303, the above formula 3-1 and formula 3-2 are added to get:

U _R11 +Δu _T11 -U _R12 -Δu _T12 +Δu _L1 +Δu _L1 = U _N11 +U _N12 Formula 3-4

The above formula 3-4 is processed in conjunction with the above formula 3-3, and the following formula 3-5 can be obtained:

It can be understood that, in this embodiment, the measurement order of the forward measurement and the reverse measurement may be exchanged.

In this application, for the first signal generating device that can be reversely connected to the detection circuit, no matter whether the first signal generating device is the first standard device or the first tested device, the The first signal generating device is reversely connected to the detection circuit, so as to apply a second signal opposite to the first signal to the detection circuit, thereby simplifying the operation of determining the contact potential difference to the greatest extent.

Embodiment four

In this embodiment, it has the same equipment foundation as that of Embodiment 3, the first signal generating device is the first tested device, and the first signal measuring device is the first standard device, and the third embodiment The difference is that, further, the first tested device can be switched to be used in the detection circuit in forward and reverse connection, therefore, the first standard device can be used in the detection circuit in reverse connection, therefore, this implementation Example can solve technical problems independently with embodiment three, and can also be combined with embodiment three to jointly solve technical problems. Taking joint solution to technical problems as an example, below, S401-S403 provides the method of separately implementing this embodiment to measure contact potential difference method.

In step S401, the measuring of the first electrical signal by the first signal measuring device may specifically be: the first standard device is directly connected to the detection circuit and measures the first electrical signal.

Specifically, the relationship between the first measurement result and the first electrical signal satisfies the following formula 4-1:

U _R11 +Δu _T11 +Δu _L1 ＝U _N11 Formula 4-1

Wherein, U _R11 represents the indication value of the voltage signal generated by the first device under test, that is, the first electrical signal;

Δu _T11 represents the systematic error when the first device under test corresponds to the first electrical signal;

Δu _L1 represents the contact potential difference of the first device under test in the detection circuit;

U _N11 represents the indicated value of the voltage signal detected by the first standard device during the forward measurement, that is, the first measurement result.

In step S402, the measuring of the second electrical signal by the first signal measuring device may specifically be: the first standard device is reversely connected to the detection circuit and measures the second electrical signal.

Specifically, the relationship between the second measurement result and the second electrical signal satisfies the following formula 4-2:

(U _R12 +Δu _T12 )+Δu _L1 ＝-U _N12 Formula 4-2

Wherein, _UR12 represents the indication value of the voltage signal generated by the first device under test, that is, the second electrical signal;

Δu _T12 represents the systematic error when the first device under test corresponds to the second electrical signal;

Δu _L1 represents the contact potential difference of the first device under test in the detection circuit;

U _N12 represents the standard indication value measured by the first standard equipment during the reverse measurement process, that is, the second measurement result.

As mentioned above, in this embodiment, the relationship between U _R11 and U _R12 satisfies the following formula 4-3:

U _R11 ＝-U _R12 Formula 4-3

Furthermore, when the first tested device is relatively stable, its measurement error is uniformly distributed, and the relationship between Δu _T11 and Δu _T12 satisfies the following formula 4-4:

Δu _T11 = -Δu _T12 Formula 4-4

In S403 of this embodiment, combined with the above formula 4-3 and formula 4-4, the above formula 4-1 and formula 4-2 are respectively summed and subtracted to obtain the following formula 4-5:

In this embodiment, if the voltage signal generated by the device under test is the target voltage value, it can be calculated according to formula 4-5 to obtain the standard value ( _UR41 +Δu _T41 ) of the voltage signal generated by the device under test , the difference between the standard indication value and the inspected indication value is the systematic error of the inspected equipment.

If the voltage signal generated by the tested equipment is not the target voltage value, it can be calculated according to formula 4-5 to obtain the contact potential difference Δu _L1 of the detection line. Further, when the standard equipment detects the target voltage subsequently, the standard measuring instrument can be calculated The difference between the indicated value and the contact potential difference, so as to obtain the true value of the voltage signal generated by the tested equipment.

It can be understood that, in the actual detection process, if both the first signal generating device and the first signal measuring device can be reversely connected to the detection circuit, any one of the first to fourth embodiments can be selected according to actual needs implement.

In the actual detection process, on the basis of the first and fourth embodiments described above, if the first device under test is not allowed to be reversely connected to the detection circuit, in this case, the application can use the second device under test to help determine the contact potential difference between any two devices in the detection circuit, thereby determining the contact potential difference between the first device to be tested and the first standard device in the detection circuit, wherein the first standard device It should have both a signal generating device and a signal measuring device, and the second checked device and the first checked device are respectively a signal generating device and a signal measuring device.

In this case, the solution of the present application can be as shown in the following example five and example six.

Embodiment five

In this embodiment, the first standard equipment includes a first signal generating device and a signal measuring device, and the first tested device is a first signal measuring device, and the detection circuit is determined by means of a second tested device The contact potential difference between any two devices in the device, so as to determine the contact potential difference of the first device under test in the detection circuit, wherein the second device under test is also a signal generating device, specifically including the following steps S501 to step S507:

In order to facilitate the description in the process of S501-S507, for the reverse connection of standard equipment to the detection circuit, if the corresponding signal is still within the range of the standard signal in the case of direct connection, the standard equipment can also be connected directly.

Step S501, the first standard device is directly connected to the detection circuit and generates a first electrical signal, the first device under test is directly connected to the detection circuit and measures, obtains a first measurement result, and sends to the main control system sending said first measurement result;

Specifically, the relationship between the first measurement result and the first electrical signal satisfies the following formula 5-1:

U _N11 +Δu _L1 ＝U _R11 +Δu _T11 Formula 5-1

Among them, U _R11 represents the indication value of the first tested equipment;

Δu _T11 represents the error of the first device under test in this measurement;

Δu _L1 represents the contact potential difference of the detection circuit between the first standard equipment and the first tested equipment;

U _N11 represents the signal value of the first standard equipment, that is, the first electrical signal.

Step S502, the first standard device is reversely connected to the detection circuit, the first standard device generates a first electrical signal, the first device under test is directly connected to the detection circuit and measured, and a second measurement result is obtained , sending the second measurement result to the main control system;

Specifically, the relationship between the first measurement result and the first electrical signal satisfies the following formula 5-2:

-U _N12 +Δu _L1 ＝U _R12 +Δu _T12 Formula 5-2

Among them, U _R12 represents the indication value of the first tested equipment;

Δu _T12 represents the error of the first tested equipment in this measurement;

Δu _L1 represents the contact potential difference, which is the same as in formula 5-1;

U _N12 represents the signal value of the first standard equipment, that is, the first electrical signal.

Step S503, the second detected device is directly connected to the detection circuit and generates a third electrical signal, the first detected device is directly connected to the detection circuit and measures, obtains a third measurement result, and sends to the main control The system transmits the third measurement result, the third electrical signal being the same as the first electrical signal.

Specifically, the relationship between the third measurement result and the third electrical signal satisfies the following formula 5-3:

U _R21 +Δu _T21 +Δu _L2 = U _R13 +Δu _T13 Formula 5-3

Among them, _UR21 represents the signal indication value of the second device under test, that is, the first electrical signal;

Δu _T21 represents the error of the second tested equipment in this measurement;

Δu _L2 represents the contact potential difference of the detection circuit between the second tested device and the first tested device;

U _R13 represents the indication value of the first tested equipment;

Δu _T13 represents the error of the first device under test in this measurement. Since _UR13 and _UR11 are very close, Δu _T13 =Δu _T11 .

Step S504, the second detected device is reversely connected to the detection circuit and generates the third electrical signal, the first detected device is directly connected to the detection circuit and measured, obtains a fourth measurement result, and sends the The main control system sends the fourth measurement result.

Specifically, the relationship between the fourth measurement result and the third electrical signal satisfies the following formula 5-4:

-(U _R21 +Δu _T21 )+Δu _L2 ＝U _R14 +Δu _T14 Formula 5-4

Among them, _UR21 represents the signal indication value of the second tested equipment, which is the same as formula 5-3;

Δu _T21 represents the error of the second tested device in this measurement, since the second tested device corresponds to the same main signal in the two measurements, it is the same as formula 5-3;

Δu _L2 represents the contact potential difference, which is the same as in formula 5-3;

U _R14 represents the indication value of the first tested equipment;

Δu _T14 represents the error of the first device under test in this measurement. Since the measurement of the first device under test in this measurement and the measurement in S502 correspond to very close main signals, Δu _T14 and Δu _T12 are the same.

Step S505, the second tested device is directly connected to the detection circuit and generates a fourth electrical signal, the first standard device performs a measurement, obtains a fifth measurement result, and sends the fifth measurement result to the main control system As a result, the fourth electrical signal is identical to the first electrical signal.

Specifically, the relationship between the fifth measurement result and the fourth electrical signal satisfies the following formula 5-5:

U _R21 +Δu _T21 +Δu _L3 ＝U _N15 formula 5-5

Among them, _UR21 represents the signal indication value of the second tested equipment, which is the same as formula 5-3;

Δu _T21 represents the error of the second tested equipment in this measurement, which is the same as formula 5-3;

Δu _L3 represents the contact potential difference of the detection circuit between the second tested device and the first standard device;

U _N15 represents the measurement result of the first standard equipment, that is, the fifth measurement result.

Step S506, the second tested device is reversely connected to the detection circuit and generates the fourth electrical signal, the second standard device performs measurement, acquires a sixth measurement result, and sends the Sixth measurement result.

Specifically, the relationship between the sixth measurement result and the fourth electrical signal satisfies the following formula 5-6:

-(U _R21 +Δu _T21 )+Δu _L3 ＝U _N16 Formula 5-6

Among them, _UR21 represents the signal indication value of the second tested equipment, which is the same as formula 5-3;

Δu _T21 represents the error of the second tested equipment in this measurement, which is the same as formula 5-3;

Δu _L3 represents the contact potential difference, which is the same as in formula 5-5;

U _N16 represents the measurement result of the first standard equipment, that is, the sixth measurement result.

Step S507, the main control system according to the first electrical signal, the second electrical signal, the third electrical signal, the fourth electrical signal, the first measurement result, the second measurement result, the third measurement result, the fourth measurement result , the fifth measurement result, and the sixth measurement result calculate the contact potential difference of the detection circuit.

Furthermore, for the first tested device and the second tested device, since both are connected through the detected detection circuit, for the same detection system, different detection circuits are generally not additionally configured Therefore, the contact potential difference of the detection circuit between the two will cancel each other because of the symmetry of the connection structure, that is, Δu _L2 can be ignored.

The above-mentioned S501-S506 obtains six equations, corresponding to five unknowns Δu _L1 , Δu _L3 , Δu _T11 = Δu _T13 , Δu _T12 = Δu _T14 and Δu _T21 , and the unknowns are less than the number of equations, and the equations can be obtained by solving the equations The value of the contact potential difference, that is, the value of the contact potential difference of the detection circuit, for example, the following formula 5-7 and formula 5-8:

Embodiment six

In this embodiment, the first standard device includes a first signal measuring device and a signal generating device, the first tested device is a signal generating device, and the accuracy of the first tested device is lower than that of the first The accuracy of the standard equipment, the instrument detection system is also used to detect the third tested equipment, the third tested equipment is a signal measurement equipment, and its detection accuracy is lower than that of the first standard equipment.

In this embodiment, the instrument detection method further includes the following steps S601 to S607:

Step S601, the first detected device is directly connected to the detection circuit and generates a fifth electrical signal, the third detected device is directly connected to the detection circuit and measures, obtains a seventh measurement result, and sends to the main control The system sends the seventh measurement result, and the fifth electrical signal is the same as the first electrical signal.

Specifically, the relationship between the seventh measurement result and the fifth electrical signal satisfies the following formula 6-1:

U _R11 +Δu _T11 +Δu _L1 = U _R31 +Δu _T31 Formula 6-1

Wherein, U _R11 represents the indicated value of the voltage generated by the first device under test mentioned in this step, that is, the first electrical signal;

Δu _L1 represents the contact potential difference between the first checked device and the third checked device in the detection circuit;

U _R31 represents the actual indication value of the third device under test, that is, the seventh measurement result;

Δu _T11 represents the systematic error of the first tested equipment;

Δu _T31 represents the systematic error of the third device under test.

Step S602, the first tested device is directly connected to the detection circuit and generates a sixth electrical signal, the third tested device is reversely connected to the detection circuit and measures, obtains an eighth measurement result, and sends to the master The control system sends the eighth measurement result, wherein the sixth electrical signal is the same as the second electrical signal.

Specifically, the relationship between the eighth measurement result and the sixth electrical signal satisfies the following formula 6-2:

U _R12 +Δu _T12 +Δu _L1 ＝-(U _R32 +Δu _T32 ) Formula 6-2

Wherein, U _R12 represents the indicated value of the voltage generated by the first device under test mentioned in this step, that is, the second electrical signal;

Δu _L1 represents the contact potential difference, which is the same as formula 6-1;

U _R32 represents the actual indication value of the third device under test, that is, the eighth measurement result;

Δu _T12 represents the systematic error of the first tested equipment;

Δu _T32 represents the systematic error of the third tested device, and since _UR32 and _UR31 are very close, Δu _T32 is equal to Δu _T31 .

Step S603, the first standard device applies the fifth electrical signal to the detection circuit, the third device under test is directly connected to the detection circuit and measures, obtains a ninth measurement result, and sends it to the main control system sending the ninth measurement result.

Specifically, the relationship between the ninth measurement result and the fifth electrical signal satisfies the following formula 6-3:

U _N11 +Δu _L2 ＝U _R33 +Δu _T33 Formula 6-3

Wherein, U _N11 represents the value of the electrical signal output by the first standard equipment, that is, the first electrical signal;

Δu _L2 represents the contact potential difference of the detection circuit between the first standard equipment and the third tested equipment;

U _R33 represents the actual indication value of the third device under test, that is, the ninth measurement result;

Δu _T33 represents the systematic error of the third tested device, and since _UR33 and _UR31 are very close, Δu _T33 is equal to Δu _T31 .

Step S604, the first standard device applies the sixth electrical signal to the detection circuit, the third device under test is reversely connected to the detection circuit and measures, obtains a tenth measurement result, and sends to the main control The system sends said tenth measurement.

Specifically, the relationship between the tenth measurement result and the sixth electrical signal satisfies the following formula 6-4:

U _N12 +Δu _L2 ＝-(U _R34 +Δu _T34 ) Formula 6-4

Wherein, U _N12 represents the value of the electrical signal output by the first standard equipment, that is, the second electrical signal;

Δu _L2 represents the contact potential difference of the detection circuit between the first standard equipment and the third tested equipment;

U _R34 represents the actual indication value of the third device under test, that is, the ninth measurement result;

Δu _T34 represents the systematic error of the third tested device, and since _UR34 and _UR31 are very close, Δu _T34 is equal to Δu _T31 .

Step S605, the first device under test is directly connected to the detection circuit to apply the first electrical signal, the first standard device performs measurement, and obtains a first measurement result, which satisfies the following formula 6-5:

U _R13 +Δu _T13 +Δu _L3 ＝U _N11 Formula 6-5

Among them, U _N11 represents the measurement indication value of the first standard equipment, that is, the first measurement result;

Δu _L3 represents the contact potential difference of the detection circuit between the first tested device and the first standard device;

U _R13 represents the actual indication value of the first device under test, that is, the first electrical signal;

Δu _T13 represents the systematic error of the first device under test, and since _UR13 and _UR11 are very close, Δu _T13 is equal to Δu _T11 .

Step S606, the first device under test is directly connected to the detection circuit to apply the second electrical signal, the first standard device performs measurement, and obtains a second measurement result, which satisfies the following formula 6-6:

U _R14 +Δu _T14 +Δu _L3 ＝U _N12 Formula 6-6

Wherein, U _N12 represents the measured indication value of the first standard equipment, i.e. the second measured result;

Δu _L3 represents the contact potential difference of the detection circuit between the first tested device and the first standard device;

U _R14 represents the actual indication value of the first device under test, that is, the second electrical signal;

Δu _T14 represents the systematic error of the first device under test, and since _UR14 and _UR12 are very close, Δu _T14 is equal to Δu _T12 .

Step S607, the main control system according to the first electrical signal, the second electrical signal, the fifth electrical signal, the sixth electrical signal, the first measurement result, the second measurement result, the seventh measurement result, the eighth electrical signal The measurement results, the ninth measurement result and the tenth measurement result calculate the contact potential difference of the detection circuit.

Furthermore, for the first tested device and the third tested device, since both are connected through the detected detection circuit, for the same detection system, different detection circuits are generally not additionally configured Material, therefore, the contact potential difference of the detection circuit between the two will cancel each other due to the symmetry of the connection structure

The above S601-S606 obtains six equations, which correspond to five unknowns. By solving the equations, the unknowns are less than the number of equations, and the value of the contact potential difference can be obtained, that is, the value of the contact potential difference of the detection circuit. For example, the following formula 6-7 and 6-8:

It can be understood that the order of step S601 to step S606 in this embodiment can be changed.

In this application, the same batch of inspected devices can also be used to assist in determining the contact potential difference of the first inspected device in the detection circuit, as shown in the seventh and eighth embodiments below.

Embodiment seven

In this embodiment, if the first standard device is the first signal generating device, and another fourth tested device that is also the signal generating device needs to be detected, since the detection circuit transmits a detection signal at the same time, and This embodiment provides a solution to the inability to measure the first standard equipment and the fourth tested equipment at the same time.

Firstly, detecting the first detected device based on the detection circuit includes determining at least one first detection point according to the first detected device; controlling the first signal generating device to The detection circuit applies an electrical signal; the first signal measuring device measures the electrical signal of the detection circuit to obtain the first detection result; according to the compensated first detection result and the first detection point, detecting the first device under inspection, and determining that the first device under inspection has a first allowable error.

Based on the foregoing process, it can be understood that the first tested device is tested first, and at the same time it is determined that the measured error of the first tested device is less than or equal to the first allowable error, so that it is determined that the first tested device is at least within a short period accuracy within.

After that, use the first checked equipment to detect the fourth checked equipment, including:

Firstly, at least one second detection point is determined based on the fourth detected device, the second detection point is within the range of the fourth detected device and the first detected device, and the fourth detected device The allowable error of the device is greater than the first allowable error; in this way, the first checked device can meet the temporary testing requirement for the fourth checked device.

There may be one or more second detection points, and two detection processes are performed for each second detection point.

One of the detection process, the first standard device applies an electrical signal to the detection circuit according to the second detection point, and the first tested device measures the electrical signal of the detection circuit to obtain a second detection result , sending the second detection result to the main control system;

In the second detection process, the fourth detected device applies an electrical signal to the detection circuit according to the second detection point, and the first detected device measures the electrical signal of the detection circuit to obtain a third detection As a result, the third detection result is sent to the master control system.

Based on one of the aforementioned detection processes and the second detection process, two sets of corresponding detection data can be obtained. One set of detection data includes a standard electrical signal (derived from the first standard equipment) and a second detection result (derived from the first standard equipment) A detected device), another set of detection data includes a detected signal (from the fourth detected device) and a third detection result (from the first detected device).

Subsequent processing can be carried out, including:

The fourth detected device is detected based on the second detection point, the second detection result, and the third detection result.

Specifically, since the second detection result and the third detection result originate from the same detected device and correspond to almost the same signal value, the detected errors contained in the second detection result and the third detection result are the same According to this, the second detection result can be used to evaluate or compensate the third detection result. The evaluation method includes, according to the second detection result and the standard electrical signal (that is, the second detection point), judging whether the difference between the two It complies with the aforementioned first allowable error, and if so, it can directly output the second detection point and the third detection result as the detection data for the fourth tested device, and the compensation method includes calculating the second detection result and the second detection point Deviation, so as to determine the deviation of the first tested equipment at the second detection point, and then compensate the deviation into the third detection result, according to the third detection result after compensation and the second detection point, the fourth tested device to test.

Embodiment eight

In this embodiment, if the first standard device is the first signal measuring device, and another fifth tested device that is also the signal measuring device needs to be detected, since the detection circuit transmits a detection signal at the same time, and The first standard device and the fifth tested device cannot be measured at the same time, and this embodiment provides a solution.

Firstly, detecting the first detected device based on the detection circuit includes determining at least one first detection point according to the first detected device; controlling the first signal generating device to The detection circuit applies an electrical signal; the first signal measuring device measures the electrical signal of the detection circuit to obtain the first detection result; according to the compensated first detection result and the first detection point, detecting the first device under inspection, and determining that the first device under inspection has a first allowable error.

After that, use the first checked equipment to detect the fifth checked equipment, including:

Firstly, at least one third detection point is determined based on the fifth detected device, the third detection point is within the range of the fifth detected device and the first detected device, and the fifth detected device The allowable error of the device is greater than the first allowable error; in this way, the first checked device can meet the temporary testing requirement for the fifth checked device.

There may be one or more third detection points, and for each third detection point, two detection processes are performed.

In one of the detection processes, the first device under test applies an electrical signal to the detection circuit according to the third detection point, and the first standard device measures the electrical signal of the detection circuit to obtain a fourth detection result , sending the fourth detection result to the main control system;

In the second detection process, the first detected device applies an electrical signal to the detection circuit according to the third detection point, and the fifth detected device measures the electrical signal of the detection circuit to obtain a fifth detection As a result, sending the fifth detection result to the main control system;

Based on one of the aforementioned detection processes and the second detection process, two sets of corresponding detection data can be obtained. One set of detection data includes a detected electrical signal (from the first detected device) and a standard measurement result (the fourth The detection result is derived from the first standard equipment), and another set of detection data includes a detected electrical signal (also derived from the first detected device) and a fifth detection result (derived from the fourth detected device).

Subsequent processing can be carried out, including:

The fifth detected device is detected based on the third detection point, the fourth detection result, and the fifth detection result.

Specifically, since the detected electrical signals of the two sets of detected data come from the same detected device and correspond to almost the same signal value, the signal errors in the two groups of detected electrical signals are the same, accordingly, The fourth detection result can be used to evaluate or compensate the fifth detection result. The evaluation method includes, according to the detected electrical signal (that is, the third detection point) and the fourth detection result, judging whether the difference between the two meets the aforementioned first One allowable error, if it is met, the third detection point and the fifth detection result can be directly output as the detection data for the fourth tested equipment, and the compensation method includes calculating the deviation between the fourth detection result and the third detection point, so as to determine The deviation of the first tested device at the third detection point is compensated to the third detection point, and the fifth tested device is detected according to the compensated third detection point and the fifth detection result.

In addition, the present application also provides a computer-readable storage medium, on which computer instructions are stored, and when the instructions are executed by a processor, the steps of the instrument detection method described in the first aspect above are realized.

In addition, the present application also provides a meter testing device, which includes: at least one processor; and a memory connected to the at least one processor in communication; wherein, the memory stores information that can be used by the one processor Executable instructions, the instructions are executed by the at least one processor, so that the at least one processor executes the instrument detection method described in the first aspect above.

In addition, the present application also provides a main control system, the main control system is applied to the instrument detection system, the main control system is configured to send a first generation instruction to the first signal generation device, and the first generation instruction It is used to instruct the first signal generating device to apply a first electrical signal to the detection circuit; to send a first measurement instruction to the first signal measurement device, and the first measurement instruction is used to instruct the first signal measurement device to measure the A first electrical signal, acquiring a first measurement result; sending a second generating instruction to the first signal generating device, where the second generating instruction is used to instruct the first signal generating device to apply a second electrical signal to the detection circuit signal, the second electrical signal is opposite to the first electrical signal; send a second measurement instruction to the first signal measurement device, and the second measurement instruction is used to instruct the first signal measurement device to measure the The second electrical signal, obtaining a second measurement result; calculating the contact potential difference of the detection circuit according to the first measurement result and the second measurement result; sending a third generation instruction to the first signal generating device, and sending a third generation instruction to the first signal generating device, The first signal measuring device sends a third measurement instruction, obtains a first detection result, and compensates the first detection result according to the contact potential difference, and the first detected device is the first signal generating device or the Any one of the first signal measuring equipment, the first signal generating equipment or the other one of the first signal measuring equipment is a standard equipment.

In another case, the main control system is applied to an instrument detection system, and the main control system is configured to send the first generation control signal to the first signal generation device, and send the first connection control signal to the detection circuit, so that , the first signal generating device is electrically connected to the detection circuit, and applies a first electrical signal to the detection circuit, and the first signal generating device is one of the first standard device or the first tested device; at least partly simultaneously with said first generation control signal and said first connection control signal, sending a first measurement control signal to a first signal measuring device and a second connection control signal to said detection circuit, so that said first A signal measurement device is electrically connected to the detection circuit, and measures the first electrical signal transmitted by the detection circuit to generate a first measurement result. The first signal measurement device is a first standard device or a first The other of the detected devices; sending a second generation control signal to the first signal generating device, and sending a third connection control signal to the detection circuit, so that the first signal generating device is electrically connected to the detection circuit, And apply a second electrical signal to the detection circuit, the second electrical signal is opposite to the first electrical signal; at least partially simultaneously generate the second control signal and the third connection control signal to the first The signal measurement device sends a second measurement control signal, and sends a fourth connection control signal to the detection circuit, so that the first signal measurement device is electrically connected to the detection circuit, and the first signal measurement device transmitted to the detection circuit Perform measurement on two electrical signals to generate a second measurement result; obtain the first measurement result and the second measurement result from the first signal measurement device; calculate according to the first measurement result and the second measurement result The contact potential difference of the detection circuit; storing the contact potential difference, obtaining the first detection result, and compensating the first detection result according to the contact potential difference, the first detection result is based on the detection circuit The measurement information generated by the detection performed by the first device under inspection.

In addition, the present application also provides a meter detection system, the meter detection system includes a detection circuit, the detection circuit includes a first standard device, and the first standard device is the first signal generation device or the first signal measurement device In any one of the above, the instrument inspection system is used to detect the first inspected equipment, and the first inspected equipment is the first signal generating equipment or the other one of the first signal measuring equipment, The first signal generating device is used to apply a first electrical signal to the detection circuit; the first signal measuring device is used to measure the first electrical signal to obtain a first measurement result, and send the first electrical signal to the main control system The first measurement result; the first signal generating device is also used to apply a second electrical signal to the detection circuit, the second electrical signal is opposite to the first electrical signal; the first signal measuring device is also used to measure the second electrical signal to obtain a second measurement result, and send the second measurement result to the main control system, so that the main control system calculates the second measurement result according to the first measurement result and the second measurement result The contact potential difference of the detection circuit, and the first detection result is compensated according to the contact potential difference, and the first detection result is a detection result obtained by detecting the first device under inspection based on the detection circuit.

In another case, the instrument detection system includes a detection circuit, and the detection circuit includes a first standard device, and the first standard device is one of a first signal generating device or a first signal measuring device, and the The instrument detection system is used to detect the first tested equipment, the first tested equipment is the first signal generating equipment or the other one of the first signal measuring equipment; in at least one measurement process, the The detection circuit is electrically connected to the first signal generation device and the first signal measurement device, so that the first signal generation device applies a first electrical signal to the detection circuit, and the first signal measurement device measures The first electrical signal generates a first measurement result; during at least another measurement process, the detection circuit is electrically connected to the first signal generating device and the first signal measuring device, so that the first signal The generating device applies a second electrical signal to the detection circuit, and the first signal measuring device measures the second electrical signal to generate a second measurement result, and the first measurement result and the second measurement result are used for calculating The contact potential difference of the detection circuit; at least in one detection process, the detection circuit is electrically connected to the first standard device and the first tested device for detecting the first tested device, A first detection result is generated, and the contact potential difference is used to compensate the first detection result.

The description is not to be read as a limitation of the application. Those skilled in the art understand that without departing from the spirit and scope of the present application, various equivalent replacements, modifications or improvements can be made to the technical solutions and implementations of the present application, all of which fall within the scope of the present application. The scope of protection of the present application is subject to the appended claims.

Claims (11)

1. A meter detection method based on a meter detection system, wherein the meter detection system comprises a main control system and at least one detection circuit, the detection circuit comprises a first standard device, the first standard device comprises one of a first signal generation device or a first signal measurement device, the meter detection system is used for detecting a first detected device, the first detected device comprises the other one of the first signal generation device or the first signal measurement device, and the meter detection method comprises:

controlling the first signal generating equipment to apply a first electric signal to the detection circuit, measuring the first electric signal by the first signal measuring equipment, acquiring a first measuring result, and sending the first measuring result to the master control system;

controlling the first signal generating device to apply a second electrical signal to the detection circuit, wherein the first signal measuring device measures the second electrical signal, obtains a second measurement result, and sends the second measurement result to the master control system, and the second electrical signal is opposite to the first electrical signal;

the main control system calculates the contact potential difference of the detection circuit according to the first measurement result and the second measurement result;

and the main control system detects the first detected equipment based on the detection circuit to obtain a first detection result, and compensates the first detection result according to the contact potential difference.

2. The meter detecting method according to claim 1,

said controlling said first signal generating device to apply a first electrical signal to said detection circuit, comprising: controlling the first signal generating device to be connected to the detection circuit, wherein the first signal generating device generates the first electric signal;

said controlling said first signal generating device to apply a second electrical signal to said detection circuit, comprising: and controlling the first signal generating device to be reversely connected to the detection circuit, wherein the first signal generating device generates the first electric signal.

3. The meter detecting method according to claim 1,

the controlling the first signal measuring device to measure the first electrical signal includes: controlling the first signal measuring equipment to be connected with the detection circuit, wherein the first signal measuring equipment measures the electric signal transmitted by the detection circuit;

said first signal measuring device measuring said second electrical signal, comprising: and controlling the first signal measuring equipment to be reversely connected with the detection circuit, wherein the first signal measuring equipment measures the electric signal transmitted by the detection circuit.

4. The meter detection method according to claim 1 or 2, wherein the first standard device includes the first signal generation device and a second signal measurement device, the meter detection system is further configured to detect a second device under test, the second device under test includes a second signal generation device, and the meter detection method further includes:

controlling the second detected device to be connected to the detection circuit, wherein the second detected device generates a third electric signal, controlling the first detected device to be connected to the detection circuit, measuring the electric signal transmitted by the detection circuit by the first detected device to obtain a third measurement result, and sending the third measurement result to the master control system, wherein the third electric signal is the same as the first electric signal;

the second detected device is controlled to be reversely connected with the detection circuit, the second detected device generates the third electric signal and controls the first detected device to be normally connected with the detection circuit, the first detected device measures the electric signal transmitted by the detection circuit to obtain a fourth measurement result, and the fourth measurement result is sent to the master control system;

controlling the second detected device to be connected to the detection circuit, wherein the second detected device generates the third electrical signal, and the first standard device measures the electrical signal transmitted by the detection circuit to obtain a fifth measurement result and sends the fifth measurement result to the master control system;

the second detected device is controlled to be reversely connected to the detection circuit, the second detected device generates the third electric signal, the first standard device measures the electric signal transmitted by the detection circuit to obtain a sixth measurement result, and the sixth measurement result is sent to the master control system;

and the main control system calculates the contact potential difference of the detection circuit according to the first electric signal, the second electric signal, the third electric signal, the first measurement result, the second measurement result, the third measurement result, the fourth measurement result, the fifth measurement result and the sixth measurement result.

5. The meter detection method according to claim 1 or 3, wherein the first standard device includes the first signal measurement device and a third signal generation device, the meter detection system is further configured to detect a third device under test, the third device under test includes a third signal measurement device, and the meter detection method further includes:

controlling the first detected device to be connected to the detection circuit, wherein the first detected device generates a fourth electric signal, controlling the third detected device to be connected to the detection circuit, measuring the electric signal transmitted by the detection circuit by the third detected device to obtain a seventh measurement result, and sending the seventh measurement result to the master control system, wherein the fourth electric signal is the same as the first electric signal;

controlling the first detected device to be connected to the detection circuit, generating a fifth electric signal by the first detected device, controlling the third detected device to be connected to the detection circuit in a reverse manner, measuring the electric signal transmitted by the detection circuit by the third detected device to obtain an eighth measurement result, and sending the eighth measurement result to the master control system, wherein the fifth electric signal is the same as the second electric signal;

the first standard device is controlled to apply the fourth electric signal to the detection circuit, the third detected device is controlled to be connected to the detection circuit, the third detected device measures the electric signal transmitted by the detection circuit, a ninth measurement result is obtained, and the ninth measurement result is sent to the master control system;

the first standard device is controlled to apply the fifth electric signal to the detection circuit, the third detected device is controlled to be reversely connected to the detection circuit, the third detected device measures the electric signal transmitted by the detection circuit to obtain a tenth measurement result, and the tenth measurement result is sent to the master control system;

the master control system calculates the contact potential difference of the detection circuit according to the first electric signal, the second electric signal, the fourth electric signal, the fifth electric signal, the first measurement result, the second measurement result, the seventh measurement result, the eighth measurement result, the ninth measurement result and the tenth measurement result.

6. The meter detecting method according to any one of claims 1 to 3, wherein detecting the first device under test based on the detection circuit includes,

determining at least one first detection point according to the first detected equipment;

controlling the first signal generating device to apply an electrical signal to the detection circuit according to the first detection point;

the first signal measuring equipment measures the electric signal of the detection circuit to obtain the first detection result;

and detecting the first detected device according to the compensated first detection result and the first detection point.

7. The meter testing method of claim 6, wherein said first standard device is said first signal generating device, wherein said meter testing system is further adapted to test a fourth device under test, wherein said fourth device under test is a signal generating device, and wherein said meter testing method further comprises:

the detecting the first detected device comprises determining that the first detected device has a first allowable error;

determining at least one second detection point based on the fourth detected device, wherein the second detection point is within the range of the fourth detected device and the first detected device, and the allowable error of the fourth detected device is larger than the first allowable error;

the first standard equipment applies an electric signal to the detection circuit according to the second detection point, and the first detected equipment measures the electric signal of the detection circuit to obtain a second detection result and sends the second detection result to the master control system;

the fourth detected device applies an electric signal to the detection circuit according to the second detection point, the first detected device measures the electric signal of the detection circuit to obtain a third detection result, and the third detection result is sent to the master control system;

and detecting the fourth detected device based on the second detection point, the second detection result and the third detection result.

8. The meter testing method of claim 6, wherein said first standard device is said first signal measuring device, said meter testing system is further adapted to test a fifth device under test, said fifth device under test being a signal measuring device, said meter testing method further comprising:

the detecting the first detected device comprises determining that the first detected device has a first allowable error;

determining at least one third detection point based on the fifth detected device, wherein the third detection point is within the range of the fifth detected device and the first detected device, and the allowable error of the fifth detected device is larger than the first allowable error;

the first detected equipment applies an electric signal to the detection circuit according to the third detection point, the first standard equipment measures the electric signal of the detection circuit to obtain a fourth detection result, and the fourth detection result is sent to the master control system;

the first detected device applies an electric signal to the detection circuit according to the third detection point, and the fifth detected device measures the electric signal of the detection circuit to obtain a fifth detection result and sends the fifth detection result to the master control system;

and detecting the fifth detected device based on the three detection points, the fourth detection result and the fifth detection result.

9. A computer readable storage medium having stored thereon computer instructions which, when executed by a processor, carry out the steps of the meter detection method according to any of the preceding claims 1 to 8.

10. A master control system, for use in a meter testing system, the master control system being configured to,

sending a first generation control signal to a first signal generation device, sending a first connection control signal to a detection circuit, so that the first signal generation device is electrically connected to the detection circuit and applies a first electric signal to the detection circuit, wherein the first signal generation device is one of a first standard device or a first detected device;

at least partially simultaneously with the first generation control signal and the first connection control signal, sending a first measurement control signal to a first signal measurement device, and sending a second connection control signal to the detection circuit, so that the first signal measurement device is electrically connected to the detection circuit and measures the first electrical signal transmitted by the detection circuit to generate a first measurement result, wherein the first signal measurement device is the other one of the first standard device or the first detected device;

sending a second generation control signal to the first signal generation device, sending a third connection control signal to the detection circuit, so that the first signal generation device is electrically connected to the detection circuit and applies a second electrical signal to the detection circuit, wherein the second electrical signal is opposite to the first electrical signal;

at least partially simultaneously with the second generation control signal and the third connection control signal, sending a second measurement control signal to a first signal measurement device, and sending a fourth connection control signal to the detection circuit, so that the first signal measurement device is electrically connected to the detection circuit, and measures the second electrical signal transmitted by the detection circuit to generate a second measurement result;

obtaining the first measurement and the second measurement from the first signal measurement device;

calculating a contact potential difference of the detection circuit according to the first measurement result and the second measurement result;

and storing the contact potential difference, acquiring a first detection result, and compensating the first detection result according to the contact potential difference, wherein the first detection result is measurement information generated by detecting the first detected equipment based on the detection circuit.

11. A meter detection system is characterized by comprising a detection circuit, wherein the detection circuit comprises a first standard device, the first standard device is one of a first signal generation device and a first signal measurement device, the meter detection system is used for detecting a first detected device, and the first detected device is the other one of the first signal generation device and the first signal measurement device;

in at least one measurement process, the detection circuit is electrically connected to the first signal generating device and the first signal measuring device, so that the first signal generating device applies a first electric signal to the detection circuit, and the first signal measuring device measures the first electric signal to generate a first measurement result;

during at least one other measurement, the detection circuit is electrically connected to the first signal generating device and the first signal measuring device, so that the first signal generating device applies a second electric signal to the detection circuit, the first signal measuring device measures the second electric signal and generates a second measurement result, and the first measurement result and the second measurement result are used for calculating a contact potential difference of the detection circuit;

and in at least one detection process, the detection circuit is electrically connected to the first standard equipment and the first detected equipment and is used for detecting the first detected equipment to generate a first detection result, and the contact potential difference is used for compensating the first detection result.

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