CN114550629A - Display panel and test method - Google Patents

Abstract

The present application relates to the field of display technology, and provides a display panel and a testing method. The display panel includes a drive circuit, a printed circuit board, a gate line, a source line, and a test portion. The display panel is provided with a display area. The drive circuit and the test portion are all arranged on the peripheral side of the display area. In the display area, the drive circuits are arranged on opposite sides of the display area; the gate lines and the source lines are evenly arranged in the display area along different directions, and the two ends of the gate lines are respectively connected to the drive circuits on both sides; the printed circuit board is connected to several Test parts, wherein at least two test parts are connected to source lines or drive circuits. During the test, the test parts of the two printed circuit boards are connected to the source to test the source signal, and the two test parts are respectively connected to the driving circuits on both sides to test the gate signal, including the end gate signal, to The technical problem that the terminal gate signal and the source signal cannot be measured in the prior art is solved.

Description

Display panel and test method

technical field

The present application belongs to the field of display technology, and more particularly, relates to a display panel and a testing method.

Background technique

With the continuous development of display technology, display panels with high refresh rates are favored by more and more users, but display panels with high refresh rates require a higher charging rate to meet the needs of daily use, especially for larger display panels. Therefore, before the display panel leaves the factory, it is necessary to accurately measure the waveform of the terminal gate and the waveform of the source to judge the charging condition.

The current measurement method is to set a test section on the gate at the beginning. When the gate signal at the beginning needs to be measured, the gate at the beginning is connected to the gateless drive circuits on both sides by welding, and the test on the printed circuit board is passed. The section carries out the measurement of the corresponding gate signal.

However, the disadvantage of the above measurement method is that the terminal gate signal with poor signal cannot be measured; in addition, since there is no test part designed for the source, the corresponding source signal cannot be measured, especially the charging effect is generally poor. middle source.

SUMMARY OF THE INVENTION

The purpose of the embodiments of the present application is to provide a display panel and a testing method. By connecting the gate line, the printed circuit board, and the driving circuit to form a loop structure, a loop structure is formed between the source line and the printed circuit board, so as to solve the problem of existing The technical problem that the end gate signal and the source signal cannot be measured in the technology.

In order to achieve the above purpose, an embodiment of the first aspect of the present application provides a display panel, including a drive circuit, a printed circuit board, a gate line, a source line, and a test portion, the display panel is provided with a display area, and the drive The circuit and the testing part are both arranged on the peripheral side of the display area, the gate line and the source line are both arranged in the display area, and the driving circuit is arranged on opposite sides of the display area; The gate line and the source line are evenly arranged in the display area along different directions, and both ends of the gate line are respectively connected to the driving circuits on both sides; the printed circuit board is connected to a number of test parts, At least two of the test parts are connected to the source line or to the drive circuit.

Optionally, both ends of the gate line are respectively provided with a first connection portion, and the first connection portion is connected to the driving circuit on the corresponding side; one end of the source line is provided with a second connection portion; The test part is connected to the second connection part or connected to the first connection parts on both sides respectively.

Optionally, the first connection part extends out of the first test wire, and the end of the first test wire away from the first connection part is the first test end; the second connection part extends out of the second test wire , the end of the second test wire away from the second connection part is the second test end; the test part includes a first test part, a second test part, and a third test part; the first test part corresponds to the The source electrode of the test is arranged, the first test part is connected to the second connection part of the source line; the second test part and the third test part are respectively located at both ends of the printed circuit board, and the first test part is located at both ends of the printed circuit board. Two test terminals are arranged adjacent to the second test part, and a plurality of the first test terminals are respectively arranged adjacent to the second test part and the third test part; the second test terminal is connected to the second test part, Or the two first test terminals are respectively connected to the second test part and the third test part.

Optionally, the gate line includes a first gate line, the first gate line is arranged at one end of the display area close to the printed circuit board; a second gate line, the second gate line The line is set at one end of the display area away from the printed circuit board; both ends of the first gate line and the second gate line are provided with the first test terminal, and the first gate line The pole line and the first test terminal on the same side of the second gate line are disposed adjacent to each other.

Optionally, the source line includes a first source line, the first source line is provided in the middle of the display area, and one end of the first source line is provided with the second connection portion, The second test wire extends from the second connection portion, and one end of the second test wire away from the second connection portion is the second test end.

Optionally, the second test end is arranged adjacent to the second test portion, the two start end test ends are respectively arranged adjacent to the second test portion and the third test portion, and the two end test ends are arranged adjacent to each other. They are respectively arranged adjacent to the second test part and the third test part; the second test end is connected to the second test part, or the two start-end test ends are respectively connected to the second test part and the third test part, or The two end test terminals are respectively connected to the second test part and the third test part.

Optionally, both ends of the gate line are respectively welded to the drive circuits on both sides, and the printed circuit board is connected with a number of test parts, wherein two of the test parts are welded to the source electrode or welded respectively. the drive circuits on both sides.

Optionally, both the first connection part and the second connection part include an indium tin oxide structure, and the indium tin oxide structure is provided with a plurality of hole structures.

Optionally, both the first connection part and the second connection part include an indium tin oxide structure, the gate line and the driving circuit are connected through the indium tin oxide structure, and the test part and the source The pole lines are conducted through the indium tin oxide structure. An embodiment of the second aspect of the present application provides a test method, implemented by using the display panel described in any one of the above, the test method includes connecting two ends of a gate line to a drive circuit on a corresponding side; connecting two ends of a printed circuit board A test part to the source line or the driver circuit on the corresponding side.

The beneficial effects of the display panel and the testing method provided by the present application are: compared with the prior art, in the non-testing state, the testing part of the printed circuit board is disconnected from the source line and the gate line, respectively, and in the test source In the case of the electrode signal and the gate signal, the present application forms a loop between the printed circuit board and the source line by connecting the two test parts of the printed circuit board to the source line to test the source signal, and the two test parts are connected. The gate lines are connected to the drive circuits on both sides respectively, and the gate lines are connected to the drive circuits on both sides, so that a loop is formed between the gate lines, the drive circuit, and the printed circuit board to test the gate signal, including the terminal gate signal, to solve the problem of existing The technical problem that the end gate signal and the source signal cannot be measured in the technology.

Description of drawings

In order to illustrate the technical solutions in the embodiments of the present application more clearly, the following briefly introduces the accompanying drawings that need to be used in the description of the embodiments or the prior art. Obviously, the drawings in the following description are only for the present application. In some embodiments, for those of ordinary skill in the art, other drawings can also be obtained according to these drawings without any creative effort.

FIG. 1 is a schematic structural diagram of a display panel provided by a first embodiment of the present application;

Fig. 2 is an enlarged view of the test portion and its surrounding structure marked by the dotted frame in Fig. 1;

FIG. 3 is a schematic structural diagram of a display panel provided by a second embodiment of the present application;

Fig. 4 is an enlarged view of the third test portion and its surrounding structure marked by the dotted frame in Fig. 3;

Fig. 5 is the schematic diagram of the first connecting portion and its surrounding structure marked by the dotted line frame in Fig. 3;

FIG. 6 is a schematic structural diagram of a display panel provided by a third embodiment of the present application;

7 is an enlarged view of the test portion and its surrounding structures marked by the dotted frame in FIG. 6;

FIG. 8 is a schematic structural diagram of a display panel according to a fourth embodiment of the present application;

Fig. 9 is an enlarged view of the test portion and its surrounding structure marked by the dotted line frame in Fig. 8;

10 is an interlayer structure diagram of a display panel in the application;

FIG. 11 is a flowchart of a testing method provided by an embodiment of the present application.

Among them, each reference sign in the figure:

1. Display area; 2. Gate line; 21. Second gate line; 22. First gate line; 3. Source line; 31. Middle source electrode; 4. Driving circuit; 5. Printed circuit board; 6. Test part; 61, First test part; 62, Second test part; 63, Third test part; 71, First connection part; 711, Start end connection part; 712, End connection part; 72, Second connection part; 81. The first test terminal;

811, start end test end; 812, end end test end; 82, second test end; 9, indium tin oxide structure; 10, hole structure; 11, transparent conductive layer; 12, passivation layer; 13, second metal layer; 14. The first metal layer; 15. The insulating layer; 16. The base substrate.

Detailed ways

In order to make the technical problems, technical solutions and beneficial effects to be solved by the present application clearer, the present application will be described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application, but not to limit the present application.

It should be noted that when an element is referred to as being "fixed to" or "disposed on" another element, it can be directly on the other element or indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or indirectly connected to the other element.

In addition, the terms "first" and "second" are only used for descriptive purposes, and should not be construed as indicating or implying relative importance or implying the number of indicated technical features. Thus, a feature defined as "first" or "second" may expressly or implicitly include one or more of that feature. In the description of the present application, "plurality" means two or more, unless otherwise expressly and specifically defined.

In the prior art, the existing measurement method cannot measure the terminal signal and the source signal in the display panel, especially the middle source with poor charging effect. In the technical solution provided in this application, the source signal is tested by connecting the test parts of the two printed circuit boards to the source, and the two test parts are respectively connected to the driving circuits on both sides to test the gate signal, In order to solve the technical problems existing in the prior art.

first embodiment

Referring to FIG. 1 , the display panel provided by the first embodiment of the present application will be described. As shown in FIG. 1 , an embodiment of the present application provides a display panel, including a driving circuit 4 , a printed circuit board 5 , a gate line 2 , and a source line 3 , the display panel is provided with a display area 1 , a driving circuit 4 , a test The parts 6 are all disposed on the peripheral side of the display area 1 , and the gate lines 2 and the source lines 3 are all disposed in the display area 1 .

The driving circuits 4 are arranged on opposite sides of the display area 1 .

The gate line 2 and the source line 3 are uniformly arranged in the display area 1 along different directions respectively, and the two ends of the gate line 2 are respectively connected to the driving circuits 4 on both sides.

The printed circuit board 5 is connected to several test parts 6 , wherein at least two test parts 6 are connected to the source line 3 or the drive circuit 4 .

For the gate signal test, the gate signal is usually transmitted from the printed circuit board 5 to the gate line 2 through the drive circuit 4. Therefore, when testing the gate signal, the gate line 2 needs to be connected to the drive circuits 4 on both sides. The printed wiring board 5 connects the drive circuits 4 on both sides. Specifically, the printed circuit board 5 is connected with a number of test parts 6 , wherein two test parts 6 are respectively connected to the driving circuits 4 on both sides, and both ends of the gate line 2 are respectively connected to the driving circuits 4 on both sides.

For the test of the source signal, it is necessary to connect the source signal by the two test parts 6 respectively. In addition, the test unit 6 for testing the source signal and the test unit 6 for testing the gate signal may be different test units 6 .

In an embodiment, an enlarged view of the connecting portion 6 and its surrounding structures is shown in FIG. 2 , and the lines adjacent to the connecting portion 6 are the lead lines of the gate line 2 and the lead lines of the source line 3 respectively.

In one embodiment, both ends of the gate line 2 are respectively welded to the drive circuits 4 on both sides, and the printed circuit board 5 is connected with a plurality of test parts 6 , wherein the two test parts 6 are welded to the source electrode 3 or welded to the two sides respectively. the drive circuit 4. The connection of metals by laser welding is simple and easy to operate, and the success rate is high.

In one embodiment, the driving circuit 4 is a gateless driving circuit. The oscilloscope can be connected to the printed circuit board 5 to display the waveform of the signal, observe and test the waveform, so as to judge the condition of the source signal or the gate signal.

The display panel in this embodiment can detect the gate signal and the source signal respectively, and satisfy the test of the gate signal and the source signal at the same time.

Second Embodiment

Referring to FIG. 3 , the display panel provided by the second embodiment of the present application will be described. As shown in FIG. 3 , both ends of the gate line 2 are respectively provided with a first connection part 71, and the first connection part 71 is connected to the driving circuit 4 on the corresponding side; one end of the source line 3 is provided with a second connection part 72; two tests The part 6 connects the second connecting part 72 or the first connecting part 71 on both sides respectively.

By arranging the first connection part 71 and the second connection part 72 , an interface is provided for the test part 6 , which facilitates the access of the test part 6 and simplifies and saves wiring.

In this embodiment, as shown in FIG. 4 , which is an enlarged view of the third test portion 63 and its surrounding structure, the first connection portion 71 extends out of the first test wire, and the first test wire is far away from the first connection portion 71 One end is the first test end 81; the second connection part 72 extends out of the second test wire, and the end of the second test wire away from the second connection part 72 is the second test end 82; the test part 6 includes the first test part 61, The second test part 62, the third test part 63; the first test part 61 is set corresponding to the source to be tested, the first test part 61 is connected to the second connection part 72 of the source line 3; the second test part 62, the third The test portions 63 are respectively located at both ends of the printed circuit board 5, the second test ends 82 are arranged adjacent to the second test portion 62, and a plurality of first test ends 81 are respectively arranged adjacent to the second test portion 62 and the third test portion 63; The second test terminal 82 is connected to the second test part 62 , or the two first test terminals 81 are respectively connected to the second test part 62 and the third test part 63 .

The third test portion 63 is disposed adjacent to the start end test end 811 , the second test end 82 and the end end test end 812 respectively. By arranging the second test terminal 82 adjacent to the third test part 63 , and a plurality of first test terminals 81 are respectively arranged adjacent to the third test part 63 and the third test part 63 , it is convenient to measure the gate signal and the source electrode respectively. signal to test. When the source signal needs to be tested, the third test part 63 is connected to the second test terminal 82 to test the source signal; when the gate signal needs to be tested, the third test part 63 is connected to the second test terminal 82 and the second test terminal 82 respectively. The three test terminals are connected to test the gate signal.

The first testing part 61 is provided corresponding to the source line 3 to be tested, and the first testing part 61 is the testing part 6 close to the source line 3 to be tested, which can save wiring and keep the wiring regular. Similarly, the second testing part 62 and the third testing part 63 are located at two ends of the printed circuit board 5 respectively, close to the first connecting part 71 , which can save wiring and keep the wiring regular.

Specifically, in this embodiment, the gate line 2 includes a first gate line 22 and a second gate line 21, and both ends of the first gate line 22 and the second gate line 21 are provided with There is the first test portion 61, and the first test portion 61 on the same side of the first gate line 22 and the second gate line 21 is disposed adjacently, and the first test end 81 includes a start end test end 811 and end test end 812.

The first gate line 22 is disposed at one end of the display area 1 close to the printed circuit board 5 , the first connection portion 71 includes a start end connection portion 711 , and both ends of the first gate line 22 pass through the start end connection portion 711 and the drive circuits on both sides respectively. 4. Connection, the first test line includes a start-end test line, the start-end test line extends from the start-end connecting part 711 , and the end of the start-end test line far from the start-end connecting part 711 is the start-end test end 811 .

The second gate line 21 is disposed at one end of the display area 1 away from the printed circuit board 5 . The first connecting portion 71 includes an end connecting portion 712 . Both ends of the second gate line 21 are connected to the driving circuits on both sides through the end connecting portion 712 respectively. 4. Connection, the first test line includes an end test line, the end test line extends from the end connection part 712 , and the end of the end test line away from the end connection part 712 is the end test end 812 .

Usually, the signal is transmitted from the first gate line 22 to the second gate line 21 . Therefore, the signal of the second gate line 21 is relatively weak, which is particularly important for testing the second gate line 21 . By testing the first gate lines 22 and the second gate lines 21 on both sides of the initial display area 1, the condition of the gate signals in the display panel can be fully reflected.

The source line 3 includes a first source line 31 , the first source line 31 is arranged in the middle of the display area 1 , and one end of the first source line 31 is provided with a second connection portion 72 , and the second connection portion 72 protrudes with a The second test wire, one end of the second test wire away from the second connection portion 72 is the second test end 82 .

The source signal is transmitted to the first source line 31 from the sources on both sides. Therefore, the middle source signal is usually weak, and it is particularly important to test the middle source signal. The test of the middle source signal can better reflect the situation of the source signal.

In this embodiment, the first test portion 61 is connected to the first source line 31 , the second test terminal 82 is disposed adjacent to the second test portion 62 , and the two start-end test terminals 811 are connected to the second test portion 62 and the third test portion 62 . The two end test ends 812 are respectively arranged adjacent to the second test part 62 and the third test part 63; the second test end 82 is connected to the second test part 62, or two of the The start end test end 811 is respectively connected to the second test part 62 and the third test part 63 , or the two end end test ends 812 are respectively connected to the second test part 62 and the third test part 63 .

This setting method can facilitate the printed circuit board 5 to test the start gate signal, the end gate signal and the source signal respectively. When the source signal needs to be tested, the second test part 62 is connected to the second test terminal 82 to test the source signal; when the start gate signal needs to be tested, the start test terminal 811 is respectively connected with the second test terminal 82 and the first test terminal 82. The three test terminals are connected to test the gate signal of the start terminal; when the terminal gate signal needs to be tested, the terminal test terminal 812 is respectively connected to the second test terminal 82 and the third test terminal to test the terminal gate signal. Generally, the printed circuit board 5 is only connected to one gate line 2 or one source line 3 at the same time for signal testing.

In one embodiment, both the first connection portion 71 and the second connection portion 72 include an indium tin oxide structure 9 , and a passivation layer 12 below the indium tin oxide structure 9 is provided with a plurality of hole structures 10 . The first connecting portion 71 and its surrounding structure are shown in FIG. 5 , the gate line 2 and the driving circuit 4 are connected to each other through the first connecting portion 71 , and the first connecting portion 71 extends out of the first test terminal 81 . The indium tin oxide structure 9 has good electrical conductivity and stability, is convenient for welding, and has a high welding success rate. In one embodiment, the hole structure 10 is a PV hole. The second connecting portion 72 has the same structure and function as the first connecting portion 71 .

In the non-test state, the first metal layer 14 and the second metal layer 13 are insulated and isolated from each other by the insulating layer 15 . In the test state, as shown in FIG. 10 , holes are drilled through the passivation layer 12 to form the hole structure 10 , the transparent conductive layer 11 includes an ITO structure, and the transparent conductive layer 11 covers the first metal layer 14 , the second metal layer 13 , the insulating layer 15 to connect the first metal layer 14 and the second metal layer 13, the gate line 2 is located in the first metal layer 14, and the second metal layer 13 is located in the driving circuit 4, so that the first metal layer 14 and the second metal layer The layer 13 communicates to the communication of the gate line 2 with the driver circuit 4 . The above layer structures are all disposed on the base substrate 16 . The printed wiring board 5 and its test portion 6 are arranged at intervals from the above layer structure. The display panel in this embodiment can detect the start gate signal, the end gate signal and the source signal respectively, while satisfying the test of the start gate signal, the end gate signal and the source signal.

Third Embodiment

Referring to FIG. 6 , the display panel provided by the third embodiment of the present application will be described. As shown in FIG. 6 , both ends of the gate line 2 are respectively provided with first connection parts 71 , and the first connection parts 71 are connected to the driving circuit 4 on the corresponding side. As shown in FIG. 7 , which is an enlarged view of the structure around the connecting portion 6 in this embodiment, the first test ends 81 extending from the first connecting portion 71 are respectively disposed adjacent to the two testing portions 6 . When the gate signal needs to be measured, the first test terminals 81 are respectively laser welded to the two test parts 6 .

This embodiment can test any gate signal, including the end gate signal.

Fourth Embodiment

Referring to FIG. 8 , the display panel provided by the fourth embodiment of the present application will be described. As shown in FIG. 8 , the source line 3 is provided with a second connection portion 72 . As shown in FIG. 9 , which is an enlarged view of the structure around the connection portion 6 in this embodiment, the second connection portion 72 extends out of the second connection portion 72 . The test terminal 82 is disposed adjacent to the test portion 6 , and the first test terminal 81 is connected to the second connection portion 72 . When the source signal needs to be measured, the second test terminal 82 is soldered to the test portion 6 .

This embodiment can test any source signal, including the middle source signal.

In the display panel provided by the present application, in the non-test state, the test portion 6 of the printed circuit board 5 is disconnected from the source line 3 and the gate line 2 respectively. When testing the source signal and the gate signal, the present application By connecting the two test parts 6 of the printed circuit board 5 to the source line 3, a loop is formed between the printed circuit board 5 and the source line 3 to test the source signal, and the two test parts 6 are respectively connected to two The drive circuit 4 on the side, the gate line 2 is connected to the drive circuit 4 on both sides, so that a loop is formed between the gate line 2, the drive circuit 4, and the printed circuit board 5 to test the gate signal, including the end gate signal, to solve the problem. There is a technical problem that the terminal gate signal and the source signal cannot be measured in the prior art.

Referring to FIG. 11 , a test method for a display panel provided by an embodiment of the present application will be described. The test method is implemented by using any of the above display panels. This test method includes:

Step 101, connecting both ends of the gate line 2 to the driving circuit 4 on the corresponding side;

Step 102 , connect the two test parts 6 of the printed circuit board 5 to the source line 3 or the driving circuit 4 on the corresponding side.

The two test parts 6 are connected to the source line 3 or the corresponding drive circuit 4 to perform signal testing on the source line 3 or the gate line 2 respectively, including the terminal gate signal, and the terminal gate cannot be tested after solving the problem of the prior art. Technical problems of pole signal and source signal.

Specifically, connect both ends of the gate line 2 to the drive circuit 4 on the corresponding side by laser welding;

The two test parts 6 of the printed wiring board 5 are connected to the source line 3 or the driving circuit 4 on the corresponding side by laser welding.

The connection by laser welding is easy to operate and has a high success rate.

In other embodiments, the testing part 6 can be soldered to the middle source signal or the end gate signal, so as to test the middle source signal and the end gate signal respectively. The above descriptions are only preferred embodiments of the present application and are not intended to limit the present application. Any modifications, equivalent replacements and improvements made within the spirit and principles of the present application shall be included in the protection of the present application. within the range.

Claims (10)

1. The utility model provides a display panel, includes drive circuit, printed wiring board, gate line, source line, test section, display panel is equipped with the display area, drive circuit the test section all locates display area week side, the gate line with the source line is all located the display area, its characterized in that:

the driving circuit is arranged on two opposite sides of the display area;

the gate lines and the source lines are respectively and uniformly arranged in the display area along different directions, and two ends of each gate line are respectively connected with the driving circuits on two sides;

the printed circuit board is connected with a plurality of test parts, wherein at least two test parts are connected with the source electrode line or the driving circuit.

2. The display panel of claim 1, wherein:

two ends of the grid line are respectively provided with a first connecting part, and the first connecting parts are connected with the driving circuits on the corresponding sides;

the two testing parts can be respectively connected with the first connecting parts at two sides.

3. The display panel of claim 2, wherein:

one end of the source line is provided with a second connecting part, and the two testing parts are connected with the second connecting part.

4. The display panel of claim 3, wherein:

the first connecting part extends out of a first testing line, and one end of the first testing line, which is far away from the first connecting part, is a first testing end;

a second test end is arranged at one end of the second test line far away from the second connecting part;

the test part comprises a first test part, a second test part and a third test part;

the first test part is arranged corresponding to the source electrode to be tested, and the first test part is connected with the second connecting part of the source electrode line;

the second testing part and the third testing part are respectively positioned at two ends of the printed circuit board, the second testing end is adjacent to the second testing part, and the plurality of first testing ends are respectively adjacent to the second testing part and the third testing part;

the second testing end is connected with the second testing part, or the two first testing ends are respectively connected with the second testing part and the third testing part.

5. The display panel of claim 4, wherein: the gate line comprises

The first gate line is arranged at one end, close to the printed circuit board, of the display area;

the second gate line is arranged at one end, far away from the printed circuit board, of the display area;

the two ends of the first gate line and the second gate line are respectively provided with the first testing end, and the first testing ends on the same side of the first gate line and the second gate line are arranged adjacently.

6. The display panel of claim 4, wherein: the source line comprises

The first source line is arranged in the middle of the display area, the second connecting portion is arranged at one end of the first source line, the second testing line extends out of the second connecting portion, and the second testing end is arranged at one end, far away from the second connecting portion, of the second testing line.

7. The display panel according to any one of claims 4 to 6, wherein:

the second testing end is arranged adjacent to the second testing part, the two starting end testing ends are respectively arranged adjacent to the second testing part and the third testing part, and the two tail end testing ends are respectively arranged adjacent to the second testing part and the third testing part;

the second testing end is connected with the second testing part, or the two starting end testing ends are respectively connected with the second testing part and the third testing part, or the two tail end testing ends are respectively connected with the second testing part and the third testing part.

8. The display panel of claim 1, wherein: the two ends of the grid line are respectively welded on the driving circuits on the two sides, the printed circuit board is connected with a plurality of testing parts, and the two testing parts are respectively welded on the source electrode or the driving circuits on the two sides.

9. The display panel according to claim 2 or 3, wherein the first connection portion and the second connection portion each include an indium tin oxide structure, the gate line and the driver circuit are connected through the indium tin oxide structure, and the test portion and the source line are connected through the indium tin oxide structure.

10. A testing method implemented using a display panel according to any one of claims 1-9, the testing method comprising:

a driving circuit for connecting two ends of the gate line to corresponding sides;

connecting two test portions of the printed wiring board to the source line or the driver circuit on the corresponding side.

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