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CN114189280A - Method for multi-wavelength band-to-band light test of optical time domain reflectometer - Google Patents

Method for multi-wavelength band-to-band light test of optical time domain reflectometer Download PDF

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CN114189280A
CN114189280A CN202111487202.XA CN202111487202A CN114189280A CN 114189280 A CN114189280 A CN 114189280A CN 202111487202 A CN202111487202 A CN 202111487202A CN 114189280 A CN114189280 A CN 114189280A
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optical fiber
wavelength
testing
data processing
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CN114189280B (en
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马连升
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Shandong Guangke Electronic Technology Co ltd
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    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B10/00Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/07Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
    • H04B10/071Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using a reflected signal, e.g. using optical time domain reflectometers [OTDR]
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02ATECHNOLOGIES FOR ADAPTATION TO CLIMATE CHANGE
    • Y02A90/00Technologies having an indirect contribution to adaptation to climate change
    • Y02A90/10Information and communication technologies [ICT] supporting adaptation to climate change, e.g. for weather forecasting or climate simulation

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

The invention discloses a method for testing multi-wavelength band light of an optical time domain reflectometer, belonging to the technical field of optical fiber communication.A tested optical fiber is respectively connected into different testing branches through a first optical switch unit under the control of a data processing unit, and filters with different wavelength characteristics are arranged in the different testing branches; detecting whether light exists in the detected optical fiber through a photoelectric detector; if the light exists, the pulse laser does not emit light, and the data processing unit marks the optical signal in the measured optical fiber as the light with the wavelength of the filter; if no optical signal is detected, the optical power emitted by the pulse laser is transmitted into the optical fiber to be detected through the optical splitter or the circulator, and the optical signal returned by Rayleigh scattering of the optical fiber is collected by the photoelectric detector and is transmitted to the data processing unit for processing, so that the physical characteristic of the optical fiber to be detected at the wavelength is detected. The invention not only realizes the test of the tested optical fiber with light test; and can identify whether light exists in the measured optical fiber and the wavelength of the optical signal.

Description

Method for multi-wavelength band-to-band light test of optical time domain reflectometer
Technical Field
The invention belongs to the technical field of optical fiber communication, and particularly relates to a method for testing multi-wavelength band light of an optical time domain reflectometer.
Background
An optical time-domain reflectometer (OTDR) provides an internal view of the fiber and is capable of calculating fiber length, attenuation, break point, total return loss and fusion, connection and total loss. The OTDR sends short pulses of light into the fiber. Light scattering occurs in the optical fiber due to interruption factors such as connectors, fusion points, bends, and faults. The OTDR will then detect and analyze the backscattered signal. The signal strength is measured for a particular time interval and used to represent the event characteristics.
The optical time domain reflectometer mainly relates to the field of optical fiber communication, has higher use frequency and is mainly used for construction, opening and maintenance of optical networks in the field of optical fiber communication. The wavelength selection condition of the optical time domain reflectometer is generally the same as the operating wavelength in the optical communication network, and the optical fiber to be tested cannot carry optical signals in the test process. In an actual process, a dual-wavelength OTDR without a filtering function is generally used for opening and maintaining, and at this time, an optical signal cannot exist in a measured optical fiber. If the optical test is carried out, the wavelength of the transmitted light in the optical fiber network is unknown, and the OTDR with a single wavelength band filtering function of 1625nm or 1650nm is generally selected for testing; knowing the wavelength in the optical fiber network, the OTDR test of the band filtering function of other single wavelength is generally selected, such as 1310nm light transmission in the optical network, and the OTDR test of the band filtering function of 1550 nm.
However, with The rapid development of FTTH (fiber To The Home), GPON or EPON is widely used, where downstream signals in an optical fiber network are 1550nm or 1490nm and upstream signals are 1310nm, and at this time, OTDR with only 1625nm or 1650nm wavelength can be selected for maintenance.
The existing OTDR has the filtering test function only with single wavelength, and if the wavelength is unknown in the maintained optical network, the single wavelength filtering test OTDR with 1310nm and 1550nm cannot be used, and the single wavelength OTDR with 1625nm can be used, but the cost is too high.
Therefore, in the field of optical fiber communication technology, there is still a need for research and improvement of optical time domain reflectometer, which is also a research focus and emphasis in the field of optical fiber communication technology at present, and is the starting point of the present invention.
Disclosure of Invention
Therefore, the technical problem to be solved by the invention is as follows: the method for testing the optical time domain reflectometer by the multi-wavelength band light is provided, not only can the physical characteristics of the tested optical fiber be tested by the band light, but also has a multi-wavelength testing function.
In order to solve the technical problems, the technical scheme of the invention is as follows: a method for multi-wavelength band-ready optical test of an optical time domain reflectometer, the optical time domain reflectometer comprises N test branches and a first optical switch unit for connecting an optical fiber to be tested into different test branches, N is a positive integer greater than or equal to 2, the test branches comprise a filter and an optical splitter or a circulator which are connected together, the pass band characteristic of the filter on the same test branch is the same as the characteristic of the optical splitter or the circulator, one port of the optical splitter or the circulator is connected with a pulse laser, the wavelength characteristic of the filter on the same test branch is the same as the wavelength characteristic of the pulse laser, the wavelength characteristics of the filter on different test branches are different, the other port of the optical splitter or the circulator is connected with an optical fiber wavelength division multiplexer unit or a second optical switch unit for converting the light of different test branches into a photoelectric detector, the first optical switch unit, the pulse laser, the photoelectric detector and the optical fiber wavelength division multiplexer unit or the second optical switch unit are all connected with a data processing unit;
during testing, the data processing unit sends out a control command to control the first optical switch unit to connect the tested optical fiber into a filter of a testing branch, and meanwhile, the data processing unit detects whether light exists in the tested optical fiber through the photoelectric detector, if light exists, the data processing unit controls a pulse laser on the testing branch not to emit light, and the testing branch does not carry out testing; if the photoelectric detector does not detect an optical signal, the data processing unit controls the pulse laser on the testing branch to emit light, and meanwhile, the photoelectric detector collects an optical signal returned by Rayleigh scattering of the optical fiber and sends the optical signal to the data processing unit for processing, so that the purpose that the pulse laser on the testing branch detects the physical characteristic of the tested optical fiber at the wavelength is achieved;
and then the data processing unit controls the first optical switch unit to connect the tested optical fiber into the filter of the next testing branch, and the test is continued until all the testing branches are tested.
As an improvement, when the first optical switch unit connects the optical fiber to be tested to a filter of a test branch, and the data processing unit detects an optical signal in the optical fiber to be tested through the photodetector, it proves that the wavelength of the light transmitted in the optical fiber to be tested is the wavelength of the filter, and the data processing unit marks the optical signal in the optical fiber to be tested as the light with the wavelength of the filter.
As a refinement, the first optical switch unit comprises a single or multiple 1 x 2 optical switches.
As an improvement, the optical fiber wavelength division multiplexer unit includes a single or a plurality of optical fiber wavelength division multiplexers; the second optical switch unit includes a single or a plurality of 1 x 2 optical switches.
After the technical scheme is adopted, the invention has the beneficial effects that:
under the control of the data processing unit, the optical fiber to be tested is respectively connected into different testing branches through the first optical switch unit, and filters with different wavelength characteristics are arranged in the different testing branches, so that the light with the wavelength can only pass through each testing branch, and the light with other wavelengths is filtered; when the tested optical fiber is connected into a test branch, a photoelectric detector is used for detecting whether light exists in the tested optical fiber; if the light exists, the data processing unit controls the pulse laser on the testing branch circuit not to emit light, and the testing branch circuit does not carry out testing; if the photoelectric detector does not detect an optical signal, the optical power emitted by the pulse laser is emitted into the tested optical fiber through the optical splitter or the circulator, and is collected into the photoelectric detector through the optical fiber wavelength division multiplexer unit or the second optical switch unit, and the photoelectric detector transmits the optical signal collected by the optical fiber Rayleigh scattering return to the data processing unit for processing, so that the pulse laser on the test branch detects the physical characteristic of the tested optical fiber at the wavelength and can identify whether the tested optical fiber has light; after all the test branches are tested, the multi-wavelength detection of the tested optical fiber is realized.
When the first optical switch unit connects the tested optical fiber to the filter of a testing branch, and the data processing unit detects that an optical signal exists in the tested optical fiber through the photoelectric detector, the optical wavelength transmitted in the tested optical fiber is proved to be the wavelength of the filter, and the data processing unit marks the optical signal in the tested optical fiber to be the light with the wavelength of the filter, so that the wavelength of the optical signal in the tested optical fiber can be identified.
In conclusion, the method for the optical time domain reflectometer to test the multi-wavelength band light not only realizes the physical characteristic of the optical fiber to be tested in the band light test, but also has the function of testing the multi-wavelength; and can identify whether light exists in the tested optical fiber and the wavelength of the optical signal in the tested optical fiber.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below. It should be apparent that the drawings in the following description are merely exemplary, and that other embodiments can be derived from the drawings provided by those of ordinary skill in the art without inventive effort.
The structures, ratios, sizes, and the like shown in the present specification are only used for matching with the contents disclosed in the specification, so that those skilled in the art can understand and read the present invention, and do not limit the conditions for implementing the present invention, so that the present invention has no technical significance, and any structural modifications, changes in the ratio relationship, or adjustments of the sizes, without affecting the functions and purposes of the present invention, should still fall within the scope covered by the contents disclosed in the present invention.
FIG. 1 is a block diagram of an embodiment of an optical time domain reflectometer for multi-wavelength bandpass optical testing in accordance with the present invention;
FIG. 2 is a flowchart of a method for testing each test branch in a method for multi-wavelength band-pass optical testing of an optical time domain reflectometer according to an embodiment of the present invention;
FIG. 3 is a block diagram of a dual wavelength optical time domain reflectometer capable of optical testing in an embodiment of the present invention;
in the figure: 10. testing the branch circuit; 101. a filter; 1011. a 1310nm filter; 1012. a 1550nm filter; 102. a beam splitter or circulator; 1021. a 1310nm optical splitter or 1310nm circulator; 1022. a 1550nm optical splitter or 1550nm circulator; 103. a pulsed laser; 1031. a 1310nm pulsed laser; 1032. a 1550nm pulsed laser; 20. a first optical switch unit; 30. a photodetector; 40. an optical fiber wavelength division multiplexer unit or a second optical switch unit; 50. a data processing unit.
Detailed Description
The present invention is described in terms of particular embodiments, other advantages and features of the invention will become apparent to those skilled in the art from the following disclosure, and it is to be understood that the described embodiments are merely exemplary of the invention and that it is not intended to limit the invention to the particular embodiments disclosed. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
A method for multi-wavelength band-pass optical testing of an optical time domain reflectometer, as shown in fig. 1, the optical time domain reflectometer includes N test branches 10 and a first optical switch unit 20 for connecting an optical fiber to be tested to different test branches, where N is a positive integer greater than or equal to 2, and preferably, the first optical switch unit 20 includes a single or multiple optical switches 1 × 2. The test branch 10 comprises a filter 101 and an optical splitter or circulator 102 connected together, the passband characteristic of the filter 101 on the same test branch is the same as that of the optical splitter or circulator 102, one port of the optical splitter or circulator 102 is connected with a pulse laser 103, the wavelength characteristic of the filter 101 on the same test branch is the same as that of the pulse laser 103, the wavelength characteristics of the filters 101 on different test branches are different, and the other port of the optical splitter or circulator 102 is connected with a fiber wavelength division multiplexer unit or a second optical switch unit 40 for converting the light of different test branches into the photodetector 30, preferably, the fiber wavelength division multiplexer unit comprises a single or a plurality of fiber wavelength division multiplexers WDM; the second optical switch unit comprises single or multiple 1 x 2 optical switches; the first optical switch unit 20, the pulse laser 103, the photodetector 30, and the fiber wavelength division multiplexer unit or the second optical switch unit 40 are all connected to the data processing unit 50.
The splitter or circulator 102 functions to inject the emitted light of the pulse laser 103 into the measured optical fiber and receive the reflected optical signal from the measured optical fiber.
The function of the above-mentioned optical fiber wavelength division multiplexer unit or second optical switch unit 40 is to transmit the optical signals on different test branches into the photodetector 30.
The data processing unit 50 is preferably a processor, and functions to control the first optical switch unit 20, detect whether there is an optical signal in the photodetector 30, control the pulse laser 103 to emit an optical pulse, process the optical signal received by the photodetector 30, and analyze the optical signal.
During testing, with reference to fig. 1 and fig. 2, the data processing unit 50 sends a control command to control the first optical switch unit 20 to connect the tested optical fiber to the filter 101 of a testing branch, and meanwhile, the data processing unit 50 detects whether there is light in the tested optical fiber through the photodetector 30, if there is light, the data processing unit 50 controls the pulse laser 103 on the testing branch not to emit light, and the testing branch does not perform testing, which proves that the wavelength of light transmitted in the tested optical fiber is the wavelength of the filter, and the data processing unit marks the optical signal in the tested optical fiber as the light with the wavelength of the filter; if the photodetector 30 does not detect an optical signal, the data processing unit 50 controls the pulse laser 103 on the test branch to emit light, and the photodetector 30 collects an optical signal returned by rayleigh scattering of the optical fiber and sends the optical signal to the data processing unit 50 for processing, so that the pulse laser 103 on the test branch detects the physical characteristic of the measured optical fiber at the wavelength; then the data processing unit 50 controls the first optical switch unit 20 to connect the tested optical fiber to the filter of the next testing branch, and the test is continued until all the testing branches are tested.
After the test of the invention is finished, in the analysis result, the number of the wavelengths contained in the tested optical fiber and the numerical value of the wavelengths are displayed, and the test result of the test branch without the wavelengths in the tested optical fiber is displayed at the same time. If the wavelength of the test branch is covered in the tested optical fiber, only the wavelength value of the tested optical fiber is displayed, and the optical time domain reflectometer with other wavelengths is adopted for measurement.
Under the control of the data processing unit 50, the optical fiber to be tested is respectively connected into different testing branches through the first optical switch unit 20, and filters 101 with different wavelength characteristics are arranged in the different testing branches, so that the light with the wavelength can only pass through each testing branch, and the light with other wavelengths is filtered; when the tested optical fiber is connected to a test branch, the photoelectric detector 30 detects whether light exists in the tested optical fiber; if light exists, the data processing unit 50 controls the pulse laser 103 on the testing branch not to emit light, the testing branch does not perform testing, at this time, it is proved that the wavelength of light transmitted in the tested optical fiber is the wavelength of the filter, and the data processing unit 50 marks the optical signal in the tested optical fiber as the light with the wavelength of the filter, so the invention also has the functions of identifying whether light exists in the tested optical fiber and identifying the wavelength of the optical signal in the tested optical fiber; if the photodetector 30 does not detect an optical signal, the optical power emitted by the pulse laser 103 is emitted into the measured optical fiber through the optical splitter or circulator 102, and finally collected into the photodetector 30 through the optical fiber wavelength division multiplexer unit or the second optical switch unit 40, and the photodetector 30 delivers the optical signal returned by the rayleigh scattering of the collected optical fiber to the data processing unit 50 for processing, so that the physical characteristic of the measured optical fiber detected by the pulse laser at the wavelength on the test branch is achieved; after all the test branches are tested, the multi-wavelength detection of the tested optical fiber is realized.
Since the transmission in most optical fibers is 1310nm or 1550nm, and the transmission is relatively few, the following test takes 1310nm or 1550nm as a transmission wavelength in the optical fiber to be tested.
A method for dual wavelength bandable optical testing of an optical time domain reflectometer, as shown in fig. 3, the optical time domain reflectometer comprises two test branches and a first optical switch unit 20 for connecting a tested optical fiber to different test branches, preferably, the first optical switch unit 20 is a single 1 × 2 optical switch. One of the test branches includes a 1310nm filter 1011 and a 1310nm optical splitter or a 1310nm circulator 1021 connected together, one port of the 1310nm optical splitter or the 1310nm circulator 1021 is connected with a 1310nm pulse laser 1031, the other test branch includes a 1550nm filter 1012 and a 1550nm optical splitter or a 1550nm circulator 1022 connected together, one port of the 1550nm optical splitter or the 1550nm circulator 1022 is connected with a 1550nm pulse laser 1032, the other port of the 1310nm optical splitter or the 1310nm circulator 1021, the 1550nm optical splitter or the 1310nm circulator 1022 is connected with an optical fiber wavelength division multiplexer unit or a second optical switch unit 40 for converting the light of different test branches into the light in the photoelectric detector 30, preferably, the optical fiber wavelength division multiplexer unit includes a single optical fiber wavelength division multiplexer WDM; the second optical switch unit comprises a single 1 x 2 optical switch; the first optical switch unit 20, the 1310nm pulse laser 1031, the 1550nm pulse laser 1032, the photodetector 30, and the optical fiber wavelength division multiplexer unit or the second optical switch unit 40 are all connected to the data processing unit 50.
During testing, the data processing unit 50 sends a control command to control the first optical switch unit 20 to connect the tested optical fiber to the test branch with the 1310nm filter 1011, and meanwhile, the data processing unit 50 detects whether light exists in the tested optical fiber through the photoelectric detector 30, if light exists in the tested optical fiber, the data processing unit 50 controls the 1310nm pulse laser 1031 not to emit light, the test branch does not perform testing, at this time, it is proved that the optical wavelength transmitted in the tested optical fiber is 1310nm, and the data processing unit 50 marks the optical signal in the tested optical fiber as light with the 1310nm wavelength; if the photodetector 30 does not detect the optical signal, the data processing unit 50 controls the 1310nm pulse laser 1031 to emit light, and the photodetector 30 collects the optical signal returned by rayleigh scattering of the optical fiber and sends the optical signal to the data processing unit 50 for processing, so as to detect the physical characteristic of the detected optical fiber at the wavelength of 1310 nm.
Then the data processing unit 50 controls the first optical switch unit 20 to connect the measured optical fiber to the test branch with the 1550nm filter, and at the same time, the data processing unit 50 detects whether there is light in the measured optical fiber through the photodetector 30, if there is light, the data processing unit 50 controls the 1550nm pulse laser 1032 not to emit light, the test branch does not perform the test, at this time, it proves that the optical wavelength transmitted in the measured optical fiber is 1550nm, and the data processing unit 50 marks the optical signal in the measured optical fiber as the light with the 1550nm wavelength; if the photodetector 30 does not detect the optical signal, the data processing unit 50 controls the 1550nm pulse laser 1032 to emit light, and the photodetector 30 collects the optical signal returned by rayleigh scattering of the optical fiber and sends the optical signal to the data processing unit 50 for processing, so as to detect the physical characteristic of the measured optical fiber at the wavelength of 1550 nm.
It should be noted that, if there are 1310nm and 1550nm light in the detection fiber, the data processing unit will simultaneously display that two wavelengths are detected, the emission of the 1310nm pulse laser 1031 and 1550nm pulse laser 1032 will be stopped, and if the detected fiber is other wavelength optical signal (wavelength outside the bandwidth range of the filter), both 1310nm/1550nm wavelengths can be tested.
In conclusion, the method for the optical time domain reflectometer to test the multi-wavelength band light not only realizes the physical characteristic of the optical fiber to be tested in the band light test, but also has the function of testing the multi-wavelength; and can identify whether light exists in the tested optical fiber and the wavelength of the optical signal in the tested optical fiber.
Although the invention has been described in detail above with reference to a general description and specific examples, it will be apparent to one skilled in the art that modifications or improvements may be made thereto based on the invention. Accordingly, such modifications and improvements are intended to be within the scope of the invention as claimed.

Claims (4)

1. A method for multi-wavelength band-ready optical test of an optical time domain reflectometer is characterized in that the optical time domain reflectometer comprises N test branches and a first optical switch unit for connecting an optical fiber to be tested into different test branches, N is a positive integer greater than or equal to 2, the test branches comprise a filter and an optical splitter or a circulator which are connected together, the pass band characteristic of the filter on the same test branch is the same as the characteristic of the optical splitter or the circulator, one port of the optical splitter or the circulator is connected with a pulse laser, the wavelength characteristic of the filter on the same test branch is the same as the wavelength characteristic of the pulse laser, the wavelength characteristics of the filters on different test branches are all different, the other port of the optical splitter or the circulator is connected with an optical fiber wavelength division multiplexer unit or a second optical switch unit for converting the light of different test branches into an optical fiber wavelength division multiplexer unit or a second optical switch unit in a photoelectric detector, the first optical switch unit, the pulse laser, the photoelectric detector and the optical fiber wavelength division multiplexer unit or the second optical switch unit are all connected with a data processing unit;
during testing, the data processing unit sends out a control command to control the first optical switch unit to connect the tested optical fiber into a filter of a testing branch, and meanwhile, the data processing unit detects whether light exists in the tested optical fiber through the photoelectric detector, if light exists, the data processing unit controls a pulse laser on the testing branch not to emit light, and the testing branch does not carry out testing; if the photoelectric detector does not detect an optical signal, the data processing unit controls the pulse laser on the testing branch to emit light, and meanwhile, the photoelectric detector collects an optical signal returned by Rayleigh scattering of the optical fiber and sends the optical signal to the data processing unit for processing, so that the purpose that the pulse laser on the testing branch detects the physical characteristic of the tested optical fiber at the wavelength is achieved;
and then the data processing unit controls the first optical switch unit to connect the tested optical fiber into the filter of the next testing branch, and the test is continued until all the testing branches are tested.
2. The method for multi-wavelength band-ready optical testing of optical time domain reflectometry according to claim 1, wherein when the first optical switch unit connects the optical fiber under test to the filter of a test branch, and the data processing unit detects the presence of an optical signal in the optical fiber under test through the photodetector, it is verified that the wavelength of the light transmitted in the optical fiber under test is the wavelength of the filter, and the data processing unit marks the optical signal in the optical fiber under test as the light of the wavelength of the filter.
3. The method for optical time domain reflectometry multi-wavelength band-ready optical testing as in claim 1 wherein the first optical switch unit comprises a single or multiple 1 x 2 optical switches.
4. The method for optical time domain reflectometry multi wavelength band optical testing according to claim 1, wherein the optical fiber wavelength division multiplexer unit comprises a single or multiple optical fiber wavelength division multiplexers; the second optical switch unit includes a single or a plurality of 1 x 2 optical switches.
CN202111487202.XA 2021-12-08 2021-12-08 Multi-wavelength banded light testing method for optical time domain reflectometer Active CN114189280B (en)

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Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014183412A1 (en) * 2013-05-17 2014-11-20 国家电网公司 Multi-parameter distributed optical fiber sensing apparatus
EP3346250A1 (en) * 2017-01-06 2018-07-11 Sterlite Technologies Ltd Method and system for differentiating macro-bend losses from splice and connector losses in fiber-optic links
CN111162835A (en) * 2019-12-03 2020-05-15 浙江杰昆科技有限公司 Optical time domain reflectometer
CN112054839A (en) * 2020-08-11 2020-12-08 武汉光迅科技股份有限公司 OTDR (optical time Domain reflectometer), test system, test method and storage medium

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2014183412A1 (en) * 2013-05-17 2014-11-20 国家电网公司 Multi-parameter distributed optical fiber sensing apparatus
EP3346250A1 (en) * 2017-01-06 2018-07-11 Sterlite Technologies Ltd Method and system for differentiating macro-bend losses from splice and connector losses in fiber-optic links
CN111162835A (en) * 2019-12-03 2020-05-15 浙江杰昆科技有限公司 Optical time domain reflectometer
CN112054839A (en) * 2020-08-11 2020-12-08 武汉光迅科技股份有限公司 OTDR (optical time Domain reflectometer), test system, test method and storage medium

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