CN103537453B - 一种蓝宝石衬底晶片抛光后的超声清洗方法 - Google Patents
一种蓝宝石衬底晶片抛光后的超声清洗方法 Download PDFInfo
- Publication number
- CN103537453B CN103537453B CN201310362912.9A CN201310362912A CN103537453B CN 103537453 B CN103537453 B CN 103537453B CN 201310362912 A CN201310362912 A CN 201310362912A CN 103537453 B CN103537453 B CN 103537453B
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- Prior art keywords
- ultrasonic cleaning
- cleaning
- time
- ultrasonic
- frequency
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- 238000004506 ultrasonic cleaning Methods 0.000 title claims abstract description 82
- 239000000758 substrate Substances 0.000 title claims abstract description 58
- 238000000034 method Methods 0.000 title claims abstract description 38
- 229910052594 sapphire Inorganic materials 0.000 title claims abstract description 28
- 239000010980 sapphire Substances 0.000 title claims abstract description 28
- 238000004140 cleaning Methods 0.000 claims abstract description 75
- 238000007254 oxidation reaction Methods 0.000 claims abstract description 27
- 230000003647 oxidation Effects 0.000 claims abstract description 25
- 239000004094 surface-active agent Substances 0.000 claims abstract description 23
- 239000002738 chelating agent Substances 0.000 claims abstract description 21
- 239000007788 liquid Substances 0.000 claims abstract description 18
- 229910003460 diamond Inorganic materials 0.000 claims abstract description 15
- 239000010432 diamond Substances 0.000 claims abstract description 15
- 239000000463 material Substances 0.000 claims description 43
- MUJOIMFVNIBMKC-UHFFFAOYSA-N fludioxonil Chemical compound C=12OC(F)(F)OC2=CC=CC=1C1=CNC=C1C#N MUJOIMFVNIBMKC-UHFFFAOYSA-N 0.000 claims description 32
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 28
- 239000012530 fluid Substances 0.000 claims description 27
- 239000008367 deionised water Substances 0.000 claims description 26
- 229910021641 deionized water Inorganic materials 0.000 claims description 26
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 claims description 24
- 238000005498 polishing Methods 0.000 claims description 21
- -1 polyoxyethylene Polymers 0.000 claims description 15
- 229920003171 Poly (ethylene oxide) Polymers 0.000 claims description 12
- 125000005233 alkylalcohol group Chemical group 0.000 claims description 12
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 12
- 229910052737 gold Inorganic materials 0.000 claims description 12
- 239000010931 gold Substances 0.000 claims description 12
- 239000004480 active ingredient Substances 0.000 claims description 5
- 239000002904 solvent Substances 0.000 claims description 5
- 229910021642 ultra pure water Inorganic materials 0.000 claims description 4
- 239000012498 ultrapure water Substances 0.000 claims description 4
- 239000002245 particle Substances 0.000 abstract description 14
- 239000012535 impurity Substances 0.000 abstract description 8
- 239000002184 metal Substances 0.000 abstract description 7
- 229910052751 metal Inorganic materials 0.000 abstract description 7
- 238000005516 engineering process Methods 0.000 abstract description 6
- 229910021645 metal ion Inorganic materials 0.000 abstract description 6
- 238000004377 microelectronic Methods 0.000 abstract description 3
- 238000005868 electrolysis reaction Methods 0.000 abstract description 2
- 238000002604 ultrasonography Methods 0.000 abstract 2
- 239000000243 solution Substances 0.000 description 22
- 239000000203 mixture Substances 0.000 description 8
- 239000002253 acid Substances 0.000 description 7
- 238000004519 manufacturing process Methods 0.000 description 7
- 229910002601 GaN Inorganic materials 0.000 description 5
- 235000011180 diphosphates Nutrition 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000003912 environmental pollution Methods 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 238000011109 contamination Methods 0.000 description 3
- 239000005416 organic matter Substances 0.000 description 3
- 230000003746 surface roughness Effects 0.000 description 3
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 2
- MHAJPDPJQMAIIY-UHFFFAOYSA-N Hydrogen peroxide Chemical compound OO MHAJPDPJQMAIIY-UHFFFAOYSA-N 0.000 description 2
- CPLXHLVBOLITMK-UHFFFAOYSA-N Magnesium oxide Chemical compound [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 2
- 229910019142 PO4 Inorganic materials 0.000 description 2
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 2
- 239000007864 aqueous solution Substances 0.000 description 2
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 2
- 230000000536 complexating effect Effects 0.000 description 2
- XPPKVPWEQAFLFU-UHFFFAOYSA-J diphosphate(4-) Chemical compound [O-]P([O-])(=O)OP([O-])([O-])=O XPPKVPWEQAFLFU-UHFFFAOYSA-J 0.000 description 2
- 239000003792 electrolyte Substances 0.000 description 2
- 230000007613 environmental effect Effects 0.000 description 2
- 239000007800 oxidant agent Substances 0.000 description 2
- 229910052760 oxygen Inorganic materials 0.000 description 2
- 239000001301 oxygen Substances 0.000 description 2
- NBIIXXVUZAFLBC-UHFFFAOYSA-K phosphate Chemical compound [O-]P([O-])([O-])=O NBIIXXVUZAFLBC-UHFFFAOYSA-K 0.000 description 2
- 239000010452 phosphate Substances 0.000 description 2
- 230000002000 scavenging effect Effects 0.000 description 2
- 239000002002 slurry Substances 0.000 description 2
- 238000009736 wetting Methods 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 239000006061 abrasive grain Substances 0.000 description 1
- 230000003213 activating effect Effects 0.000 description 1
- 235000011114 ammonium hydroxide Nutrition 0.000 description 1
- 238000000137 annealing Methods 0.000 description 1
- 238000010923 batch production Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000000740 bleeding effect Effects 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000001569 carbon dioxide Substances 0.000 description 1
- 229910002092 carbon dioxide Inorganic materials 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 229910052593 corundum Inorganic materials 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000006056 electrooxidation reaction Methods 0.000 description 1
- 239000006260 foam Substances 0.000 description 1
- 238000000227 grinding Methods 0.000 description 1
- 239000000395 magnesium oxide Substances 0.000 description 1
- VUZPPFZMUPKLLV-UHFFFAOYSA-N methane;hydrate Chemical compound C.O VUZPPFZMUPKLLV-UHFFFAOYSA-N 0.000 description 1
- 239000003960 organic solvent Substances 0.000 description 1
- 230000033116 oxidation-reduction process Effects 0.000 description 1
- 230000001590 oxidative effect Effects 0.000 description 1
- 150000002978 peroxides Chemical class 0.000 description 1
- 239000002957 persistent organic pollutant Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 229910001845 yogo sapphire Inorganic materials 0.000 description 1
- 239000011787 zinc oxide Substances 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
- B08B3/10—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration
- B08B3/12—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration by sonic or ultrasonic vibrations
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
- B08B3/08—Cleaning involving contact with liquid the liquid having chemical or dissolving effect
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
Claims (6)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201310362912.9A CN103537453B (zh) | 2013-08-20 | 2013-08-20 | 一种蓝宝石衬底晶片抛光后的超声清洗方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
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CN201310362912.9A CN103537453B (zh) | 2013-08-20 | 2013-08-20 | 一种蓝宝石衬底晶片抛光后的超声清洗方法 |
Publications (2)
Publication Number | Publication Date |
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CN103537453A CN103537453A (zh) | 2014-01-29 |
CN103537453B true CN103537453B (zh) | 2015-06-10 |
Family
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Family Applications (1)
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CN201310362912.9A Expired - Fee Related CN103537453B (zh) | 2013-08-20 | 2013-08-20 | 一种蓝宝石衬底晶片抛光后的超声清洗方法 |
Country Status (1)
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CN (1) | CN103537453B (zh) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN104259132B (zh) * | 2014-07-29 | 2016-09-07 | 蓝思科技股份有限公司 | 一种蓝宝石晶片清洗工艺 |
FR3034252B1 (fr) | 2015-03-24 | 2018-01-19 | Soitec | Procede de reduction de la contamination metallique sur la surface d'un substrat |
CN105903694A (zh) * | 2016-04-27 | 2016-08-31 | 上海超硅半导体有限公司 | 大尺寸蓝宝石衬底退火前的清洗及背面不良返工方法 |
CN107717640A (zh) * | 2016-08-10 | 2018-02-23 | 云南民族大学 | 一种超声波辅助研磨抛光的方法 |
CN110449397A (zh) * | 2018-05-08 | 2019-11-15 | 蓝思科技股份有限公司 | 一种蓝宝石镜片清洗方法 |
CN109821810A (zh) * | 2018-12-28 | 2019-05-31 | 江苏澳洋顺昌集成电路股份有限公司 | 一种蓝宝石衬底片成品清洗工艺 |
CN109755106B (zh) * | 2019-01-11 | 2021-05-11 | 北京半导体专用设备研究所(中国电子科技集团公司第四十五研究所) | 一种晶圆清洗方法 |
CN111063609A (zh) * | 2019-12-18 | 2020-04-24 | 武汉百臻半导体科技有限公司 | 一种半导体芯片清洗方法 |
CN111185433B (zh) * | 2020-01-14 | 2020-12-29 | 江苏京晶光电科技有限公司 | 可开盒即用的蓝宝石晶片清洗工艺 |
CN112871849B (zh) * | 2020-12-29 | 2022-08-12 | 北京天科合达半导体股份有限公司 | 一种去除碳化硅晶片表面颗粒的清洗方法 |
CN114613697A (zh) * | 2022-03-09 | 2022-06-10 | 青岛浩瀚全材半导体有限公司 | 降低半导体衬底晶片表面颗粒的清洗方法 |
CN114472341B (zh) * | 2022-04-19 | 2022-07-08 | 天通控股股份有限公司 | 一种铌酸锂单面抛光片的清洗方法 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH063831A (ja) * | 1992-06-19 | 1994-01-14 | Canon Inc | 導電性支持体の洗浄方法 |
CN1822905A (zh) * | 2003-06-06 | 2006-08-23 | P.C.T.系统公司 | 用兆频声波能量处理基片的方法和设备 |
CN1895798A (zh) * | 2006-06-23 | 2007-01-17 | 天津晶岭微电子材料有限公司 | 液晶显示屏电化学清洗方法 |
WO2010021405A1 (ja) * | 2008-08-20 | 2010-02-25 | 株式会社カイジョー | 超音波洗浄装置 |
-
2013
- 2013-08-20 CN CN201310362912.9A patent/CN103537453B/zh not_active Expired - Fee Related
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH063831A (ja) * | 1992-06-19 | 1994-01-14 | Canon Inc | 導電性支持体の洗浄方法 |
CN1822905A (zh) * | 2003-06-06 | 2006-08-23 | P.C.T.系统公司 | 用兆频声波能量处理基片的方法和设备 |
CN1895798A (zh) * | 2006-06-23 | 2007-01-17 | 天津晶岭微电子材料有限公司 | 液晶显示屏电化学清洗方法 |
WO2010021405A1 (ja) * | 2008-08-20 | 2010-02-25 | 株式会社カイジョー | 超音波洗浄装置 |
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CN103537453A (zh) | 2014-01-29 |
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TR01 | Transfer of patent right |
Effective date of registration: 20160119 Address after: 698 No. 330095 Jiangxi city of Nanchang Province, high tech Industrial Development Zone, North Road Patentee after: JIANGXI EAST OCEAN SAPPHIRE OPTOELECTRONICS TECHNOLOGY CO.,LTD. Address before: 314300 Salt Road 12, Wuyuan industrial area, Haiyan County, Zhejiang, Jiaxing Patentee before: Zeng Xiqiang |
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Denomination of invention: Method for ultrasonic cleaning of polished sapphire substrate wafer Effective date of registration: 20190619 Granted publication date: 20150610 Pledgee: JIANGXI WEIJIA CHUANGZHAN ENTERPRISE MANAGEMENT Co.,Ltd. Pledgor: JIANGXI EAST OCEAN SAPPHIRE OPTOELECTRONICS TECHNOLOGY CO.,LTD. Registration number: 2019360000018 |
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Effective date of registration: 20200923 Address after: 330000 Room 908, Building A, Madison Square Commercial Office Building, 228 Jinggangshan Avenue, Qingyunpu District, Nanchang City, Jiangxi Province (9th floor) Patentee after: JIANGXI WEIJIA CHUANGZHAN ENTERPRISE MANAGEMENT Co.,Ltd. Address before: 698 No. 330095 Jiangxi city of Nanchang Province, high tech Industrial Development Zone, North Road Patentee before: JIANGXI EAST OCEAN SAPPHIRE OPTOELECTRONICS TECHNOLOGY Co.,Ltd. |
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Effective date of registration: 20201009 Address after: 330000 Room 908, Building A, Madison Square Commercial Office Building, 228 Jinggangshan Avenue, Qingyunpu District, Nanchang City, Jiangxi Province (9th floor) Patentee after: JIANGXI WEIJIA CHUANGZHAN ENTERPRISE MANAGEMENT Co.,Ltd. Address before: 698 No. 330095 Jiangxi city of Nanchang Province, high tech Industrial Development Zone, North Road Patentee before: JIANGXI EAST OCEAN SAPPHIRE OPTOELECTRONICS TECHNOLOGY Co.,Ltd. |
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CF01 | Termination of patent right due to non-payment of annual fee | ||
CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20150610 |