CN103487502B - The eddy current array probe of detection of complex conductive structure surfaces defect and system - Google Patents
The eddy current array probe of detection of complex conductive structure surfaces defect and system Download PDFInfo
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- CN103487502B CN103487502B CN201310446770.4A CN201310446770A CN103487502B CN 103487502 B CN103487502 B CN 103487502B CN 201310446770 A CN201310446770 A CN 201310446770A CN 103487502 B CN103487502 B CN 103487502B
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Abstract
The invention discloses eddy current array probe and the system of detection of complex conductive structure surfaces defect, the eddy current array probe of detection of complex conductive structure surfaces defect, is made up of multiple eddy current probe, described multiple eddy current probes by horizontal and vertical be arranged in latticed; Mechanical elasticity structure is provided with between two adjacent eddy current probes; Be provided with drive coil and sensor in the bottom of each eddy current probe towards the one side on detected material surface, around drive coil and sensor, non-emissive or receive direction is all provided with screen layer; The present invention can the existence of detection of complex conductive structure surfaces defect, and can judge its quantity, direction and the shape information such as length and width, the degree of depth according to signal characteristic.
Description
Technical field
The present invention relates to a kind of eddy current probe and detection system thereof of Non-Destructive Testing, particularly relate to eddy current array probe and the system of detection of complex conductive structure surfaces defect.
Background technology
Some crucial and complex-shaped metal parts, the crackle occurred as the surface such as engine blade, airframe or sub-surface or defect, may cause engine to lose efficacy or aviation accident.The various detection methods such as Magnetic testing, Liquid penetrant testing, Magnetic Flux Leakage Inspecting have been widely used in the detection of crackle and defect and have obtained good effect.In order to assessment apparatus structural safety, require the information such as the quantity of the defects such as the complicated metal structure surface crackle of acquisition, position and shape.But the methods such as Liquid penetrant testing are not high to the recognition capability of defect, the information such as the crack depth for assessing the defect order of severity can not be obtained.
EDDY CURRENT is a kind of use Dynamic Non-Destruction Measurement very widely, working mechanism follows electromagnetic induction principle, when the drive coil being connected with exchange current is near conductor material, alternating magnetic field will be produced in conductor material, be called Primary field, this alternating magnetic field induces vortex flow at conductive surface simultaneously.Vortex flow in conductor also can produce magnetic field, is called secondary magnetic field.If conductor structure surface exists the defects such as crackle, the change of vortex flow will be caused, thus the secondary magnetic field that vortex flow is produced also changes, cause magnetic test coil institute sensing electric signals to change.Just can judge existence and the order of severity of conductor material surface imperfection accordingly.Vortex flow detects has the excellent properties such as speed is fast, effects on surface defect qualitative is sensitive.Tradition unicoil probe can only single-point scanning, and detection larger area being carried out to all standing is wasted time and energy very much, and easy undetected major defect.Require EDDY CURRENT to cover at present and fast detect various complex-shaped parts surface, as the various complex-shaped mechanical part such as dovetail groove, gear of the blade of aircraft engine, airframe riveted structure, steam turbine, nuclear power station heat exchanging pipe, motor car engine, rotor.And when detecting, requiring probe and detected member in tight contact, avoiding lift-off to change the impact caused, rapidly and efficiently complete Detection task, therefore need to improve eddy detection technology and solve the problems referred to above.
Summary of the invention
The object of the invention is to the deficiency in order to overcome above-mentioned technology, a kind of eddy current array probe and system of detection of complex conductive structure surfaces defect are provided.
The technical solution adopted for the present invention to solve the technical problems is:
The eddy current array probe of detection of complex conductive structure surfaces defect, is made up of multiple eddy current probe, described multiple eddy current probes by horizontal and vertical be arranged in latticed; Mechanical elasticity structure is provided with between two adjacent eddy current probes; Be provided with drive coil and sensor in the bottom of each eddy current probe towards the one side on detected material surface, around drive coil and sensor, non-emissive or receive direction is all provided with screen layer;
Further, described eddy current probe is rectangular shape;
Further, be at least provided with laterally and longitudinal two through holes at each eddy current probe and thing to be detected surface parallel direction, passed by mechanical elasticity structure, connect and strain or loosen said multiple probe assembly;
Further, the described mechanical elasticity structure spring-like that the material such as metal or rubber can be adopted to make or wire elasticity thing;
Further, described mechanical elasticity structure has flexibility, when being placed into definite shape thing to be detected and being surperficial, the mechanical elasticity structure between eddy current probe can be flexible to adapt to and to cover corresponding shape thing surface to be detected under the effect of exerting pressure of probe assembly gravity or blister cavities;
Further, described mechanical elasticity structure also has certain rigidity, and when placing, eddy current probe entirety can keep own form and integrality;
Further, every a line of described eddy current probe and two terminations of row, respectively have one by being adsorbed onto the device of detected material surface and fixing eddy current probe;
Further, be provided with a blister cavities device above described eddy current probe, above blister cavities device, have pipeline;
Further, described flexible blister cavities device lower surface is connected with each eddy current probe upper surface;
Further, described sensor can be coil, leakage field sensor, Hall element, giant magneto-resistance sensor;
Further, described each eddy current probe has one deck wearing layer to play the effect of protection probe towards the surface of detected material;
Further, the system of detection of complex conductive structure surfaces defect, comprises a flexible eddy current probe array that can be adapted to detected parts surface three dimension shape, controlled vortex flow scanning probe moves and gather the detection data of sensor and send into the controller of signal processor, an analyzing defect signal with the processor of the form display of figure or image.
The invention has the beneficial effects as follows: the present invention can detect that all size differs, complex-shaped conductive structure surfaces whether defectiveness, eddy current probe can the existence of multiple defect in detection of complex conductive structure surfaces certain area by once moving scanning, and can judge its quantity, direction and the shape information such as length and width, the degree of depth according to signal characteristic.
Accompanying drawing explanation
Fig. 1 is structural representation of the present invention;
Fig. 2 is upward view of the present invention;
Fig. 3 for from Fig. 2 indicate the sectional view of the present invention that 1B-1B direction looks over;
Fig. 4 is by the interconnective schematic diagram of mechanical elasticity structure between eddy current probe;
Fig. 5 is the schematic diagram that the present invention is applied to face of cylinder defects detection;
Fig. 6 is the sectional view that the present invention is applied to convex surface defects detection;
Fig. 7 is the diagrammatic cross-section that the present invention is applied to concave surface defects detection;
Fig. 8 is the diagrammatic cross-section that the present invention is applied to groove defect detection;
Fig. 9 is the schematic diagram that the present invention is applied to the detection of spherical member external defects;
Figure 10 is the schematic diagram that the present invention is applied to the detection of conical object external defects;
Figure 11 is the schematic diagram that the present invention is applied to pyramid external surface of objects defects detection;
Figure 12 is detection system schematic diagram of the present invention.
Embodiment
The technological means realized to make the present invention, creation characteristic, reaching object and effect is easy to understand, below in conjunction with diagram and specific embodiment, setting forth the present invention further.
As shown in Figure 1, the eddy current array probe of detection of complex conductive structure surfaces defect, be made up of multiple eddy current probe (101), eddy current probe (101) is rectangular shape, eddy current probe (101) is by composition eddy current probe array (100) arranged in horizontal and vertical, the horizontal and vertical of each eddy current probe (101) is provided with through hole (102), each eddy current probe (101) is interconnected by through hole (102) by mechanical elasticity structure (103) between the transverse direction of eddy current probe (101) and longitudinal direction, can when detecting difformity parts make it tighten up in mechanical elasticity structure (103) termination by constriction device (110) or loosen as required, the flexible member that mechanical elasticity structure (103) can adopt the spring assembly shown in elastica or Fig. 4 (109) etc. to have retractility connects, position is fixedly connected with mechanical elasticity structure (103) at eddy current probe (101), have and can hold mechanical elasticity structure (103) and shrink the through hole (102) deposited, different mechanical elasticity structure (103) can be adopted between eddy current probe (101) to connect, its object is all in order to when reality detects, eddy current probe (101) surrounding is made to reduce gap each other, reduce not by region area that eddy current probe (101) covers, and make each eddy current probe (101) perpendicular with the body structure surface of detected material.Each eddy current probe (101) below is provided with drive coil (104) and sensor (105), sensor (105) can adopt coil, leakage field sensor, Hall element, giant magneto-resistance sensor, except the surface of emission or receiving plane, other each faces all conductively-closed structures (108) shielded, to reduce the impact of undesired signal on eddy current probe (101).Eddy current probe array (100) top is provided with flexible blister cavities (106) and is connected with eddy current probe (101), flexible blister cavities (106) can inject liquid by pipeline (107) or gas reaches increase pressure, makes eddy current probe array (100) and detected body structure surface perpendicular and the effect of close contact, minimizing lift-off.Eddy current probe array (100) often two ends that are capable or that often arrange has fixing and telecontrol equipment (111), can fix eddy current probe (101) and move eddy current probe array (100) when scanning.
As shown in Figure 5,6, for the present invention is to the schematic diagram of convex configuration defects detection and sectional view, Fig. 5 is that eddy current probe array (100) detects 1/4 cylindrical workpiece (202) surface, and Fig. 6 is the sectional view that eddy current probe array (100) detects semicolumn workpiece (203) surface.In Fig. 5, eddy current probe (101) is positioned over 1/4 cylindrical workpiece (202) surface, eddy current probe (101) is pressed laterally, longitudinally respectively along the circumferential and axial placement of cylinder (202), the mechanical elasticity structure (103) through through hole (102) is tightened up by constriction device (110), each eddy current probe (101) and cylinder (202) perpendicular can be made, make eddy current probe (101) lower end close contact measured workpiece (202), and eddy current probe (101) top presents certain angle each other due to the flexibility of cylindrical workpiece (202).Under flexible blister cavities (not shown in FIG.) and fixing and telecontrol equipment (111) are exerted pressure and acted on up, each eddy current probe (101) and cylindrical workpiece (202) intimate surface contact can be made, reduce lift-off interference.
Fig. 7 is the present invention is the schematic diagram that semicircular concave surface workpiece (302) carries out defects detection to xsect, eddy current probe (101) is positioned over concave surface workpiece (302) inside surface, eddy current probe (101) is by horizontal, longitudinally respectively along the circumferential and axial placement of concave surface workpiece (302), the mechanical elasticity structure (103) through through hole (102) is tightened up by constriction device (110), each eddy current probe (101) and concave surface workpiece (302) can be made perpendicular, eddy current probe (101) upper end close contact, and eddy current probe (101) below presents certain separation due to the flexibility of concave surface workpiece (302).The size of further reduction eddy current probe (101), can make the gap of eddy current probe (101) lower end reduce.Under flexible blister cavities (not shown in FIG.) and fixing and telecontrol equipment (111) institute apply pressure effect up, can make eddy current probe (101) and concave surface workpiece (302) close contact, minimizing lift-off is disturbed.
Fig. 8 is that the present invention carries out the schematic diagram of defects detection to fluted body workpiece (401); This fluted body workpiece (401) is inner cylindrical, and have the opening that less, general probe is difficult to go deep into its inside and detects.Application the present invention, utilize mechanical elasticity structure (103) the telescopic characteristic between eddy current probe (101), eddy current probe (101) is put into from fluted body workpiece (401) opening, be positioned over fluted body workpiece (401) inside surface, eddy current probe array (100) is by horizontal, longitudinally respectively along the circumferential and axial placement of fluted body workpiece (401), the mechanical elasticity structure (103) through through hole (102) is tightened up by constriction device (110), each eddy current probe (101) and fluted body workpiece (401) inside surface can be made perpendicular, eddy current probe (101) upper end and fluted body workpiece (401) inside surface close contact, and eddy current probe (101) below presents certain separation due to the flexibility of fluted body workpiece (401).As reduced the size of eddy current probe (101) further, can make to reduce with the spacing of detected fluted body workpiece (401) surface contact end between eddy current probe (101).Under flexible blister cavities (403) and fixing and telecontrol equipment (111) act on up, eddy current probe (101) and fluted body workpiece (401) close contact can be made, reduce lift-off interference.
Fig. 9 is that the present invention carries out the schematic diagram of defects detection to spherical work-piece (502) outside surface; This spherical work-piece (502), in spheroidal, is characterized in that surface does not have plane.This spherical work-piece of the traditional array more difficult detection of probe, can only detect separately at a location point, waste time and energy, and easily cause undetected.The present invention can carry out larger area to sphere and cover detection, eddy current probe (101) is placed on spherical work-piece (502) surface, the mechanical elasticity structure (103) through through hole (102) is tightened up by constriction device (110), each eddy current probe (101) and spherical work-piece (502) can be made perpendicular, eddy current probe (101) although upper end spacing is comparatively large, eddy current probe (101) below close-packed arrays and vertical spherical work-piece (502) all the time separately mutually.Under flexible blister cavities (not shown in FIG.) and fixing and telecontrol equipment (111) act on up, lift-off interference can be reduced further, make eddy current probe (101) and spherical work-piece (502) close contact.
Figure 10 is that the present invention carries out the schematic diagram of defects detection to pyramid type object (602) outside surface; This pyramid type object (602) conically, is characterized in that cross-sectional area is circle and size is change.The surface of the work of this variable cross section of the traditional array more difficult detection of probe, can only detect by single-point, wastes time and energy, easily cause undetected.Eddy current probe of the present invention (601) can carry out larger area to pyramid type object (602) and cover detection, eddy current probe (101) is longitudinally placed along pyramid type object (602) generatrix direction, the mechanical elasticity structure (103) through through hole (102) is tightened up by constriction device (110), each eddy current probe (101) and pyramid type object (602) can be made perpendicular, toward circular cone cross-sectional area augment direction, eddy current probe (101) upper end spacing strengthens, but eddy current probe (101) below close-packed arrays and the tapered object of vertical circular (602) all the time.Flexible blister cavities (not shown in FIG.) and fixing and telecontrol equipment (111) also can make eddy current probe (101) and pyramid type object (602) close contact under acting on up, reduce lift-off interference.
Figure 11 is the schematic diagram that the present invention detects pyramid type object (702) external defects; This pyramid type object (702), in pyramid, is characterized in that cross-sectional area is quadrilateral and size is change.The workpiece of traditional array probe more difficult detection this shape, can only each detect respectively, to waste time and energy, and easily undetected to seamed edge defect.The present invention can detect adjacent two faces of pyramid type object (702) arbitrary seamed edge simultaneously, eddy current probe array (100) is longitudinally placed along prismatic edges, the eddy current probe (101) of equal number is is respectively left and taken on seamed edge both sides, the mechanical elasticity structure (103) through through hole (102) is tightened up by constriction device (110), each eddy current probe (101) and pyramid type object (702) can be made perpendicular, along with pyramid type object (702) xsect increases, neighbouring vortices probe (101) upper end, seamed edge both sides spacing strengthens, but seamed edge is close to all the time in eddy current probe (101) below, and it is perpendicular with pyramid type object (702).Under flexible blister cavities (not shown in FIG.) and fixing and telecontrol equipment (111) act on up, eddy current probe (101) and pyramid type object (702) close contact can also be made further, reduce lift-off interference.
As shown in figure 12, in the present invention, eddy current probe array moves with a controlled vortex flow scanning probe and gathers the detection data of sensor and send into the controller of signal processor, an analyzing defect signal being connected with the processor of the form of figure or image display, eddy current probe can the existence of multiple defect in detection of complex conductive structure surfaces certain area by once moving scanning, and can judge its quantity, direction and the shape information such as length and width, the degree of depth according to signal characteristic.
More than show and describe ultimate principle of the present invention, principal character and advantage of the present invention.The technician of the industry should understand; the present invention is not restricted to the described embodiments; what describe in above-described embodiment and instructions just illustrates principle of the present invention; the present invention also has various changes and modifications without departing from the spirit and scope of the present invention, and these changes and improvements all fall in the claimed scope of the invention.Application claims protection domain is defined by appending claims and equivalent thereof.
Claims (7)
1. the eddy current array probe of detection of complex conductive structure surfaces defect, is made up of multiple eddy current probe, it is characterized in that: described multiple eddy current probes by horizontal and vertical be arranged in latticed; Mechanical elasticity structure is provided with between two adjacent eddy current probes; Be provided with drive coil and sensor in the bottom of each eddy current probe towards the one side on detected material surface, around drive coil and sensor, non-emissive or receive direction is all provided with screen layer.
2. the eddy current array probe of detection of complex conductive structure surfaces defect as claimed in claim 1, it is characterized in that: be at least provided with laterally and longitudinal two through holes at each eddy current probe and thing to be detected surface parallel direction, passed by mechanical elasticity structure, connect and strain or loosen described each eddy current probe.
3. the eddy current array probe of detection of complex conductive structure surfaces defect as claimed in claim 1 or 2, is characterized in that: the spring-like that described mechanical elasticity structure adopts metal or elastomeric material to make or wire elasticity thing.
4. the eddy current array probe of detection of complex conductive structure surfaces defect as claimed in claim 1 or 2, it is characterized in that: described mechanical elasticity structure has flexibility, when being placed into thing to be detected surface, the mechanical elasticity structure between eddy current probe can be flexible to adapt to and to cover corresponding shape thing surface to be detected under the effect of exerting pressure of eddy current probe gravity or blister cavities; Described mechanical elasticity structure also has rigidity, and when placing, eddy current probe entirety can keep own form and integrality.
5. the eddy current array probe of detection of complex conductive structure surfaces defect as claimed in claim 1, is characterized in that: every a line of described eddy current probe and two terminations of row, respectively has one by being adsorbed onto the device of detected material surface and fixing eddy current probe.
6. the eddy current array probe of detection of complex conductive structure surfaces defect as claimed in claim 1 or 2, is characterized in that: be provided with a blister cavities device above described eddy current probe, have pipeline above blister cavities device.
7. the eddy current array probe of detection of complex conductive structure surfaces defect as claimed in claim 1 or 2, is characterized in that: each eddy current probe has one deck wearing layer to play the effect of protection probe towards the surface of detected material.
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| CN201310446770.4A CN103487502B (en) | 2013-09-26 | 2013-09-26 | The eddy current array probe of detection of complex conductive structure surfaces defect and system |
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| CN201310446770.4A CN103487502B (en) | 2013-09-26 | 2013-09-26 | The eddy current array probe of detection of complex conductive structure surfaces defect and system |
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| CN103487502B true CN103487502B (en) | 2015-12-02 |
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Granted publication date: 20151202 Termination date: 20180926 |