CN103454508B - Four-way over-current over-voltage protection tester - Google Patents
Four-way over-current over-voltage protection tester Download PDFInfo
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- CN103454508B CN103454508B CN201210172828.6A CN201210172828A CN103454508B CN 103454508 B CN103454508 B CN 103454508B CN 201210172828 A CN201210172828 A CN 201210172828A CN 103454508 B CN103454508 B CN 103454508B
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Abstract
A kind of four-way over-current over-voltage protection tester includes housing (10), at least four detection interface (20) in housing (10) surface configuration; also including the testing circuit (30) being arranged in housing (10), controlling the control circuit (40) of this testing circuit and connect the power supply unit (50) of described control circuit (40), described at least four detection interface (20) connects described testing circuit (30) and control circuit (40) respectively.Because can test 4 products simultaneously, test dials torsion son switch without employee and reaches corresponding test request, so test speed is greatly improved, can reach 8 times of separate unit manual testing.Test speed improves 8 times, and employee's fatigue strength reduces 80%, has significantly saved cost for production.
Description
Technical field
The present invention relates to detection technique, automatically test particularly to small-power adapter PCBA.
Background technology
At present being typically all single-piece for the detection of small-power adapter PCBA board to detect, this detection is loaded down with trivial details due to wiring complexity, relatively time-consuming arduously, so, efficiency is not high, during mass detection, needs large quantities of testing staff, and efficiency ratio is relatively low.
Content of the invention
The present invention provides a kind of four-way over-current over-voltage protection tester, uses and can test 4 pieces of PCBA simultaneously, and testing procedure one step completes, and solves the technical problem that in prior art, testing efficiency is low.
The present invention solves above-mentioned technical problem and this four-way over-current over-voltage protection tester providing includes housing, at least four detection interface arranging at surface of shell; also including the testing circuit being arranged in housing, the control circuit controlling this testing circuit and the power supply unit connecting described control circuit, described at least four detection interface connects described testing circuit and control circuit respectively.
Because can test 4 products simultaneously, test dials torsion son switch without employee and reaches corresponding test request, so test speed is greatly improved, can reach 8 times of separate unit manual testing.Test speed improves 8 times, and employee's fatigue strength reduces 80%, has significantly saved cost for production.
Brief description
Fig. 1 is the side view of tester.Fig. 2 is the front end figure of tester.Fig. 3 is front-end product testing jig figure.Fig. 4 is tester circuit theory diagram.Fig. 5 is test philosophy wiring diagram.
Detailed description of the invention
In conjunction with above-mentioned accompanying drawing 1 to accompanying drawing 5, specific embodiments of the present invention are described.
This four-way over-current over-voltage protection tester includes housing the 10th, at least four detection interface 20 of housing 10 surface configuration; also include that the 30th, the testing circuit being arranged in housing 10 controls the control circuit 40 of this testing circuit and the power supply unit 50 connecting described control circuit 40; described at least four detection interface 20 connects described testing circuit 30 and control circuit 40 respectively; this tester also includes display unit 60 and the push-button unit 70 connecting described testing circuit 30 respectively, and described display unit 60 is 12864 type LCD displays.Described testing circuit 30 connects voltage sampling unit 31 and the current sampling unit 32 of each detection interface 20, also include the single-chip microcomputer U1 that the D/A switch unit 33 being connected with described voltage sampling unit 31 and current sampling unit 32 is connected with this D/A switch unit 33, also include the A/D converter 34 connecting each detection interface 20 and described single-chip microcomputer U1.Described testing circuit 30 also includes band and carries circuit 35 and the second drive circuit 36, described band carries circuit 35 and is connected between described each detection interface 20 and current sampling unit 32, and described second drive circuit 36 is connected on described band and carries between circuit 35 and A/D converter 34.Described control circuit 40 includes being connected to metal-oxide-semiconductor equal with detection interface quantity on each detection interface 20, described metal-oxide-semiconductor is the MOSEFT pipe of 60A, single-chip microcomputer U1 is connected by short-circuit switch unit 41 and first drive circuit 42 of series connection after the gate connected in parallel of each metal-oxide-semiconductor, also include voltage switching unit 43, this voltage switching unit 43 one end connects each detection interface 20, other end connects described first drive circuit 42, the variable power supply that described power supply unit 50 is, described single-chip microcomputer U1 controls power supply unit 50 by voltage switching unit 43 and inputs the different voltage of at least two.Described voltage switching unit 43 uses the auxiliary reclay switch test input voltage of parallel connection, and the different voltage of described at least two includes 90V and 264V.Described D/A switch unit 33 is 24 8 passage D/A chips of LTC2408 type；Described A/D converter 34 is 16 A/D chips of MAX541 type；Single-chip microcomputer U1 is 12C5A60S2 type single-chip microcomputer.
The tester structure division of the present invention includes head end test shelf structure and testing cassete structure.Testing cassete structure includes two kinds of voltage input AC sockets of 90VAC, 264VAC, an AC accessory power outlet, 1 12864LCD display screen, 1 buzzer, 6 arrange button, 3 LED lights, load is connected by 24PIN connector, and testing and control uses 4PIN connector.Testing jig structure includes the PCBA rest area of corresponding model, tests power input socket, and p-wire exports, test button, reset key.Testing cassete circuit part includes that automatic short circuit module, load-strap carry module, channel control module, and model selection, result show.Band is set by button and carries step number (maximum 9 steps), test pattern (CC and CV), test voltage (maximum 48V), test electric current (maximum 10A), work step testing time (0.1S-9.9S), product supply voltage (90V and 264V), channel selecting (4 passages), OVP selects (optocoupler is the need of short circuit), can test 4 pieces of PCBA simultaneously, and one-touch completing is tested.Small-power adapter generally uses just humorous formula translation circuit, and circuit generally uses opto-coupled feedback to regulate pwm chip, if feedback there is a problem, the output voltage of product will export with transformer high-conversion rate, beyond the requirement to power supply source for the client.So intentional short-circuit feedback input is tested output voltage and can be produced injury to the product of user.The present invention designs a kind of circuit with 4 channel electron load meter functions, it is taken on load regulation function by the MOSEFT pipe of 4 60A, using MAX541 D/A chip output test parameter signal to be controlled MOSEFT pipe after amplifier amplification, electric current feeds back to amplifier input by sampling resistor and contrasts with D/A signal.The input test voltage of product is changed by the auxiliary reclay of 2 10A, by its action of Single-chip Controlling, optocoupler short circuit is formed 4 passages by the auxiliary reclay of 4 1A, by its action of Single-chip Controlling, voltage, electric current gather data feeding single-chip microcomputer by 24 8 passage A/D chips and enter row operation.Inserting AC90V and the AC264V power supply needed for product in input socket respectively, tester power supply meets AC220V, and the AC power supplies of output is external to the test AC input of PCBA testing jig.
Above content is to combine concrete preferred embodiment further description made for the present invention, it is impossible to assert the present invention be embodied as be confined to these explanations.For general technical staff of the technical field of the invention, without departing from the inventive concept of the premise, some simple deduction or replace can also be made, all should be considered as belonging to protection scope of the present invention.
Claims (8)
1. a four-way over-current over-voltage protection tester; it is characterized in that: this tester includes housing (10), at least four detection interface (20) in housing (10) surface configuration; also including the testing circuit (30) being arranged in housing (10), controlling the control circuit (40) of this testing circuit and connect the power supply unit (50) of described control circuit (40), described at least four detection interface (20) connects described testing circuit (30) and control circuit (40) respectively；Described testing circuit (30) connects voltage sampling unit (31) and the current sampling unit (32) of each detection interface (20), also include the single-chip microcomputer U1 that the D/A switch unit (33) being connected with described voltage sampling unit (31) and current sampling unit (32) is connected with this D/A switch unit (33), also include the A/D converter (34) connecting each detection interface (20) and described single-chip microcomputer U1；Described control circuit (40) includes being connected to the upper metal-oxide-semiconductor equal with detection interface quantity of each detection interface (20), single-chip microcomputer U1 is connected by short-circuit switch unit (41) and first drive circuit (42) of series connection after the gate connected in parallel of each metal-oxide-semiconductor, also include voltage switching unit (43), this voltage switching unit (43) one end connects each detection interface (20), and other end connects described first drive circuit (42).
2. four-way over-current over-voltage protection tester according to claim 1; it is characterized in that: described testing circuit (30) also includes band and carries circuit (35) and the second drive circuit (36); described band carries circuit (35) and is connected between described each detection interface (20) and current sampling unit (32), and described second drive circuit (36) is connected on described band and carries between circuit (35) and A/D converter (34).
3. four-way over-current over-voltage protection tester according to claim 1, it is characterised in that: this tester also includes display unit (60) and the push-button unit (70) connecting described testing circuit (30) respectively.
4. four-way over-current over-voltage protection tester according to claim 1, it is characterised in that: the variable power supply that described power supply unit (50) is, described single-chip microcomputer U1 is by the different voltage of voltage switching unit (43) control power supply unit (50) input at least two.
5. four-way over-current over-voltage protection tester according to according to any one of Claims 1-4, it is characterised in that: described D/A switch unit (33) is 24 8 passage D/A chips of LTC2408 type；Described A/D converter (34) is 16 A/D chips of MAX541 type；Single-chip microcomputer U1 is 12C5A60S2 type single-chip microcomputer.
6. four-way over-current over-voltage protection tester according to claim 1, it is characterised in that: described voltage switching unit (43) uses auxiliary reclay switch test input voltage in parallel, and the different voltage of described at least two includes 90V and 264V.
7. four-way over-current over-voltage protection tester according to claim 3, it is characterised in that: described display unit (60) is 12864 type LCD displays.
8. four-way over-current over-voltage protection tester according to claim 1 or 6, it is characterised in that: described metal-oxide-semiconductor is the MOSEFT pipe of 60A.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201210172828.6A CN103454508B (en) | 2012-05-30 | 2012-05-30 | Four-way over-current over-voltage protection tester |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201210172828.6A CN103454508B (en) | 2012-05-30 | 2012-05-30 | Four-way over-current over-voltage protection tester |
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| CN103454508A CN103454508A (en) | 2013-12-18 |
| CN103454508B true CN103454508B (en) | 2016-10-05 |
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Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103792445B (en) * | 2014-01-16 | 2017-01-25 | 厦门立林电气控制技术有限公司 | Fully intelligent electric power overcurrent protection tester |
| CN105067902B (en) * | 2015-07-07 | 2019-08-16 | 艾德克斯电子（南京）有限公司 | A kind of OVP of extension, short-circuit test circuit and test method |
| CN105467164A (en) * | 2015-12-10 | 2016-04-06 | 国家电网公司 | A discharging rod special-purpose case with an electrical test apparatus |
| CN108680848A (en) * | 2018-06-14 | 2018-10-19 | 山东阅芯电子科技有限公司 | Second grade power circulation test method and device |
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| US6625557B1 (en) * | 1998-07-10 | 2003-09-23 | Ltx Corporation | Mixed signal device under test board interface |
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| US7516374B2 (en) * | 2005-08-29 | 2009-04-07 | Via Technologies Inc. | Testing circuit and related method of injecting a time jitter |
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Effective date of registration: 20200420 Address after: 518000 floor 1-6, No.1, Huaji workshop, No.180 Jianhui Road, Hualian community, Longhua street, Longhua District, Shenzhen City, Guangdong Province Patentee after: Luhua Zhifu Electronics (Shenzhen) Co., Ltd Address before: 518000, Shenzhen, Guangdong, Baoan District Longhua Street big wave South Road Sanlian Industrial Zone, Hua Arts crafts emporium Patentee before: Roofer Technology (Shenzhen) Co.,Ltd. |
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