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CN103199023A - System-level photoelectric structure and manufacturing method thereof - Google Patents

System-level photoelectric structure and manufacturing method thereof Download PDF

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Publication number
CN103199023A
CN103199023A CN2013100540664A CN201310054066A CN103199023A CN 103199023 A CN103199023 A CN 103199023A CN 2013100540664 A CN2013100540664 A CN 2013100540664A CN 201310054066 A CN201310054066 A CN 201310054066A CN 103199023 A CN103199023 A CN 103199023A
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CN
China
Prior art keywords
system unit
photoelectric cell
light
glue material
photoconductive structure
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Pending
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CN2013100540664A
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Chinese (zh)
Inventor
谢明勋
韩政男
洪盟渊
刘欣茂
李宗宪
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Epistar Corp
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Epistar Corp
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Priority to CN2013100540664A priority Critical patent/CN103199023A/en
Publication of CN103199023A publication Critical patent/CN103199023A/en
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/18High density interconnect [HDI] connectors; Manufacturing methods related thereto
    • H01L24/23Structure, shape, material or disposition of the high density interconnect connectors after the connecting process
    • H01L24/24Structure, shape, material or disposition of the high density interconnect connectors after the connecting process of an individual high density interconnect connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/18High density interconnect [HDI] connectors; Manufacturing methods related thereto
    • H01L2224/23Structure, shape, material or disposition of the high density interconnect connectors after the connecting process
    • H01L2224/24Structure, shape, material or disposition of the high density interconnect connectors after the connecting process of an individual high density interconnect connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48135Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip
    • H01L2224/48137Connecting between different semiconductor or solid-state bodies, i.e. chip-to-chip the bodies being arranged next to each other, e.g. on a common substrate
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/12Passive devices, e.g. 2 terminal devices
    • H01L2924/1204Optical Diode
    • H01L2924/12041LED
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/14Integrated circuits
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/30107Inductance
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/3025Electromagnetic shielding

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Led Device Packages (AREA)

Abstract

The invention provides a system-level photoelectric structure and a manufacturing method thereof. The manufacturing method of the system-level photoelectric structure at least comprises the steps of providing a temporary substrate, providing a plurality of photoelectric elements which are not packaged and connected on the substrate, forming a plurality of path areas, providing stickiness glue materials which are filled in the path areas and covered on the photoelectric elements which are not packaged, providing a permanent substrate which is combined with the plurality of photoelectric elements which are not packaged through the stickiness glue materials, and removing the temporary substrate.

Description

System-level photoconductive structure and preparation method thereof
The application is that application number is 201010002185.1, and the applying date is on January 13rd, 2010, and denomination of invention is divided an application for the application for a patent for invention of " system-level photoconductive structure and preparation method thereof ".
Technical field
The present invention relates to a kind of electro-optical system, relate to a kind of luminescent system with conformability especially.
Background technology
The encapsulating structure of photoelectric cell such as light-emitting diode mainly originates from complicated single-chip package flow process.Feng Zhuan photoelectric cell again in conjunction with other electronic components, as electric capacity, inductance etc., and/or non-electronic component, can not form electro-optical system after encapsulation.
Yet under electric consumers miniaturization and lightening development trend, the exploitation of photoelectric cell is also towards littler package dimension.Wherein, wafer-level package (Chip-Level Package; CLP) be one of the expectation mode of semiconductor and photoelectric cell package design.
Summary of the invention
According to the embodiment of the invention, system-level photoconductive structure and preparation method thereof is provided, its manufacture method step comprises at least: temporary substrate is provided; A plurality of not packaged photoelectronic elements are provided, are connected on the substrate, and form a plurality of aisle district; The viscous adhesive material is provided, fills up the aisle district and cover photoelectric cell; Provide permanent substrate, by a plurality of photoelectric cells of viscous adhesive material bonding; And remove temporary substrate.
Description of drawings
Fig. 1 shows package structure for LED;
Fig. 2 A to Fig. 2 D shows the manufacture method according to the electro-optical system of the embodiment of the invention;
Fig. 3 shows the schematic diagram according to the electro-optical system of the embodiment of the invention;
Fig. 4 shows according to the system unit of the embodiment of the invention and the schematic diagram of carrier;
Fig. 5 shows according to the system unit of the embodiment of the invention and the schematic diagram of Submount;
Fig. 6 (a) is to the electrical connection schematic diagram of Fig. 6 (c) demonstration according to system unit in the electro-optical system of the embodiment of the invention;
Fig. 7 (a) is to the electrical connection schematic diagram of Fig. 7 (c) demonstration according to system unit in the electro-optical system of another embodiment of the present invention;
Fig. 8 (a) is to the electrical connection schematic diagram of Fig. 8 (c) demonstration according to system unit in the electro-optical system of further embodiment of this invention;
Fig. 9 A to Fig. 9 D shows the manufacture method according to the electro-optical system of another embodiment of the present invention;
Figure 10 (a) is to the electrical connection schematic diagram of Figure 10 (c) demonstration according to system unit in the electro-optical system of the embodiment of the invention;
Figure 11 shows the schematic diagram according to subgroup in the electro-optical system of the embodiment of the invention;
Figure 12 (a) is to the electric connection framework of Figure 12 (d) demonstration according to the subgroup of the embodiment of the invention;
Figure 13 shows the electric connection framework according to the subgroup of another embodiment of the present invention;
Figure 14 (a) is to the dimensional drawing of Figure 14 (b) demonstration according to the triangular web unit of the embodiment of the invention;
Figure 15 (a) is to the configuration mode of Figure 15 (d) demonstration according to the electro-optical system medium wavelength transition material of the embodiment of the invention;
Figure 16 (a) is to the configuration mode of Figure 16 (d) demonstration according to the electro-optical system medium wavelength transition material of another embodiment of the present invention;
Figure 17 (a) is to the configuration mode of Figure 17 (b) demonstration according to the electro-optical system medium wavelength transition material of further embodiment of this invention;
Figure 18 (a) is to the configuration mode of Figure 18 (c) demonstration according to the electro-optical system medium wavelength transition material of the embodiment of the invention;
Figure 19 (a) is to the configuration mode of Figure 19 (d) demonstration according to the electro-optical system medium wavelength transition material of another embodiment of the present invention;
Figure 20 (a) is to the configuration mode of Figure 20 (d) demonstration according to the electro-optical system medium wavelength transition material of further embodiment of this invention;
Figure 21 (a) is to the configuration schematic diagram of Figure 21 (b) demonstration according to system unit in the electro-optical system of the embodiment of the invention;
Figure 22 (a) shows according to the electro-optical system of the embodiment of the invention or the configuration schematic diagram of subgroup to Figure 22 (f);
Figure 23 A to Figure 23 E is manufacturing process structural representation of the present invention;
Figure 24 A to Figure 24 G is manufacturing process structural representation of the present invention;
Figure 25 A and Figure 25 B are the manufacturing process structural representation of the embodiment of the invention;
Figure 26 is the manufacturing process structural representation of the embodiment of the invention; And
Figure 27 is the manufacturing process structural representation of the embodiment of the invention.
Description of reference numerals
10: carrier, temporary substrate 60: electrically connect
10a: outer body 60a: lead
10b: outer body 60b: the inner connection
20: layer, structure, the first articulamentum 60b ': isolated area
30: system unit, photoelectric cell 60c: circuit carrier
301: electrode 601: scolder
302: 70: the second articulamentums of semiconductor epitaxial layers
303: substrate 70 ': the second articulamentum
304: aisle district 701: passage
305: 80: the first reflector of expansion electrode
40: material, viscous adhesive material 100: electro-optical system
50: Submount, permanent substrate 100a: subgroup
50 ': substrate 100b: subgroup
50a: knitting layer 100c: subgroup
501: little pyramid 200: package structure for LED
Embodiment
As illustrated in Fig. 2 A ~ Fig. 2 D, be summarized as follows according to the manufacture method of the electro-optical system 100 of embodiments of the invention: two or a plurality of system unit 30 tentatively be disposed on the carrier 10; Utilize material 40 to keep the spatial relationship of 30 of each system units; System unit 30 and carrier 10 are separated; And the electric connection 60 of setting up 30 of system units on demand.Only execution sequence or the selection of above steps are not limited to this, and the user is when complying with actual manufacturing environment or condition arrangement.
In detail, the electro-optical system 100 according to embodiments of the invention comprises that two or more system unit 30 is to form transmission, the switching network (network) of luminous energy and electric energy.System unit 30 is arranged in network, and light or motor one at least is provided.For example, electro-optical system 100 can receive signal, electric energy with output light, or receives light with output electric energy, signal.On using, electro-optical system 100 can be used for illumination, image demonstration, image identification, image recasting, electric power output, data storage, machining etc.
Particularly, electro-optical system 100 for light-emitting diode (LED), photodiode (photodiode), photo resistance (photoresister), laser (laser), infrared emitter (infrared emitter), and the system unit 30 of solar cell tool photoelectricity functions such as (solar cell) at least one integrated (integration), make up, pile up.In addition, electro-optical system 100 is still optionally held the system unit 30 of non-photoelectricity functions such as resistance, electric capacity, inductance, diode, integrated circuit.
Carrier 10 provides growth, carrying basis for system unit 30.The candidate material one is including but not limited to germanium (Ge), GaAs (GaAs), indium phosphorus (InP), sapphire (Sapphire), carborundum (SiC), silicon (Si), lithium aluminate (LiAlO 2), zinc oxide (ZnO), gallium nitride (GaN), aluminium nitride (AlN), metal, glass, composite material (Composite), diamond, CVD diamond, bore carbon (Diamond-Like Carbon with class; DLC) etc.
In an embodiment of the present invention, the complete or primary structure of one or two above system units 30 is finished on carrier 10.Particularly, carrier 10 is as the basis of formation of this system unit 30.For example, one or two above system units 30 by chemical deposition, physical deposition, plating, synthesize, self assembly methods such as (self-assembly) is formed on the carrier 10.In addition, except above-mentioned manufacture method, cutting, grinding, polishing, photoetching, etching, heat treatment etc. also optionally are applied to finish among the system unit 30.
System unit 30 according to embodiments of the invention is optoelectronic semiconductor, and its generation type is for passing through epitaxial growth multi-lager semiconductor layer on the growth substrate as carrier 10.If plural system unit 30 is formed on the common substrate, 30 of adjacent system unit can be by forming groove or insulation layer to reach electrical, physical separation.Only the electrical layout (electrical layout) of 30 of system units still can utilize innerly connect, outside connect or its two reach.Pertinent literature can be referring to this case applicant's Taiwan patent No. 434917 and I249148 number, and it also is cited as the part of this case.
Particularly, the system unit 30 minimum electrically layers of the first electrical layer, converter section and second that comprise.First electrically layer and second electrically layer be each other at least two parts electrically, polarity or alloy is different or respectively in order to semi-conducting material single or multiple lift that electronics and hole are provided (" multilayer " refer to two-layer or two-layer more than, as follows.), its electrical selection can for p-type, n type, and the i type in both combinations at least arbitrarily.Switch site is in the first electrical layer and second electrically between the layer, the zone that may change or be brought out conversion for electric energy and luminous energy.Electric energy changes or brings out the light able one for example is light-emitting diode, LCD, Organic Light Emitting Diode; Luminous energy changes or brings out electric able one for example is solar cell, photodiode.
System unit 30 according to another embodiment of the present invention is light-emitting diode, and its luminous frequency spectrum can be adjusted by the physics or the tincture that change semiconductor monolayer or multilayer.Material commonly used for example is AlGaInP (AlGaInP) series, aluminum indium gallium nitride (AlGaInN) series, zinc oxide (ZnO) series etc.The structure example of converter section is in this way: single heterojunction structure (single heterostructure; SH), double-heterostructure (double heterostructure; DH), bilateral double-heterostructure (double-side double heterostructure; DDH) or multi layer quantum well (multi-quantum well; MQW).Moreover the logarithm of adjusting quantum well can also change emission wavelength.
In embodiments of the present invention, one or two above system units 30 were finished before being fixed on the carrier 10, that is carrier 10 and system unit 30 originally are separation independent of one another before setting up association.Particularly, carrier 10 is as the support of this system unit 30.For example, one or two above system units 30 are fixed on the carrier 10 by connection means such as glue, metal, pressure, heat.Pertinent literature can be referring to this case applicant's Taiwan patent No. 311287, No. 456058, No. 474034, and No. 493286, and it also is cited as the part of this case.In addition, in the process of setting up connection, can adopt machinery or manual type system unit 30 is positioned on the carrier 10.
As shown in Figure 3, finish or half-done electro-optical system 100 can optionally further be joined with outer body.This outer body can be connected to the arbitrary one-sided or both sides of electro-optical system 100.In several embodiment, electro-optical system 100 is joined with the outside and the outer body 10a with electric connection 60; Electro-optical system 100 is to join with respect to the outside and the outer body 10b that electrically connect 60; Perhaps electro-optical system 100 electrically connects 60 the outside and opposite side thereof the two and outer body 10a, 10b and joins to have.Only electro-optical system 100 with joining of outer body be not limited to above aspect, arbitrary outer surface of electro-optical system 100 all can be integrated mutually with suitable outer body.Particularly, outer body is the combination in any of unit, member, device, system, structure, composition or above-mentioned selection.For example, outer body is substrate, and its material can select as described above that carrier, circuit are integrated, electro-optical system, active element, passive component, circuit element is integrated or tool etc.
In an embodiment of the present invention, 10 of system unit 30 and carriers still are formed with one deck or structure 20, as shown in Figure 4.This layer or structure 20 expections can reach the usefulness of short-term or long-term coupling part or whole system unit 30 and carrier 10.At this, " short-term " refer to the time early than or just in the manufacturing of electro-optical system 100, send to or time point that deblocking is finished; " for a long time " time of referring to be later than electro-optical system 100 manufacturing, send to or time point that deblocking is finished, in other words, 10 of system unit 30 and carriers are not necessity to be separated.Particularly, this layer or structure 20 for example are the combination in any of colloid, adhesive tape, metal single layer, the multiple layer of metal, alloy, semiconductor, anchor clamps or above-mentioned selection.In addition, layer or structure 20 are more optionally included reflection, antireflection, electric current resistance barrier, diffusion barrier, stress relax slow, heat conduction, function such as heat insulation in except having linkage function.For example, comprise reflecting surface, be positioned at the last intermediary layer between system unit 30 and reflecting surface and be positioned at reflecting surface in layer or the structure 20 and the following intermediary layer of 10 of carriers.Intermediary layer can have above-mentioned other functions except reflection function at the same time or separately under last intermediary layer reached, concrete as functions such as connection, diffusion barrier.
In another embodiment of the present invention, system unit 30 and material 40 more can engage with Submount 50, as shown in Figure 5.This joint may be implemented among Fig. 2 A~Fig. 2 D before or after arbitrary step.Preferably, this joint is implemented on after the material 40 importing manufacturing process, after the step as Fig. 2 B, Fig. 2 C or Fig. 2 D.If time carrier 50 namely engages with system unit 30 and material 40, then can provide an intermediate structure comparatively reliably for subsequent technique after the step of Fig. 2 B.Submount 50 can also can be pressurization means, heater means or its combination with reference to the explanation of earlier figures 4 with the juncture of system unit 30.Particularly, knitting layer 50a is formed between time carrier 50 and the system unit 30 to reach and engages its two purpose.
In addition; knitting layer 50a is except having linkage function; more optionally include reflection, antireflection, electric current resistance barrier, diffusion barrier, stress relax slow, heat conduction, function such as heat insulation in; yet; reaching not to be necessity by add ons of these functions can also utilize means such as the composition of adjusting Submount 50 itself, geometry, processing mode to reach.For example, at least one exiting surface at Submount 50 forms reflection, refraction, scattering, optically focused, collimation, masking structure.The face that this exiting surface for example is the face that joins with system unit 30, join with material 40, the face that joins with surrounding medium.Particularly, reflection, refraction, scattering, optically focused, masking structure for example are one at least in the minute surface, regular male and fomale(M﹠F), irregular male and fomale(M﹠F), high index of refraction difference interface, photonic crystal, concavees lens, convex lens, Fresnel lens (Fresnel lens), light tight.
Fig. 6 illustration is according to the electrical connection aspect of at least two system units 30 in the electro-optical system 100 of the embodiment of the invention.At this, system unit 30 has two towards equidirectional electrode 301, and the concrete system unit 30 of this structure for example is light-emitting diode, more specifically, for being formed at insulator, sapphire for example, on light-emitting diode.Among the figure (a), 30 of two system units connect both positive and negative polarity by lead 60a and form electrical series connection; Among the figure (b), 30 of two system units connect anodal formation by lead 60a and electrically connect; Among the figure (c), 30 of two system units connect negative pole by lead 60a and form electric connection.
Fig. 7 illustration is according to the electrical connection aspect of at least two system units 30 in the electro-optical system 100 of another embodiment of the present invention.Concrete execution mode can be with reference to the explanation of figure 6.Only in present embodiment, the electrical connection that system unit is 30 is reached by form the inner 60b of connection on system unit 30.A kind of generation type of the inner 60b of connection is to form isolated area 60b ' back deposit metallic material on the setting regions of system unit 30.
Fig. 8 illustration is according to the electrical connection aspect of at least two system units 30 in the electro-optical system 100 of further embodiment of this invention.Among figure (a) and the figure (b), the electrode of system unit 30 301 is adjusted or is continued to roughly the same position, as close to or just in the position on material 40 surfaces.Among Fig. 8 (a), 30 of two system units pass through to electrically connect 60, and for example: lead 60a or the inner 60b that connects connect both positive and negative polarity and form electrical series connection; Among the figure (b), 30 of two system units are by electrically connecting 60, for example: lead 60a or the inner 60b that connects connect electrode 301 and form in the figure left sides one of electric connection shown in three kinds of equivalent circuit diagrams.Among the figure (c), two system units 30 are connected to circuit carrier 60c and become the part of electric network.
As illustrated in Fig. 9 A ~ Fig. 9 D, be summarized as follows according to the manufacture method of the electro-optical system 100 of another embodiment of the present invention: two or more system unit 30 tentatively is disposed on the carrier 10 and forms and electrically connects 60 in a side; Utilize material 40 to keep the spatial relationship of 30 of each system units; System unit 30 and carrier 10 are separated; And form at the opposite side of system unit 30 and to electrically connect 60.Only execution sequence or the selection of above steps are not limited to this, and the user is when complying with actual manufacturing environment or condition arrangement.In addition, electric connection 60 quantity of two system units, 30 both sides or position are only for illustration but not in order to limiting embodiments of the present invention among Fig. 9 D, and the user is when can be according to characteristic arrangement, the adjustment of circuit.In addition, do not showing under the conflict mutually, the explanation of aforementioned all embodiment can be the reference of present embodiment institute or uses.
Figure 10 illustration is according to the electrical connection aspect of at least two system units 30 in the electro-optical system 100 of the embodiment of the invention.Among the figure (a), two system units 30 disposes in the same way, and connect anodal respectively and negative pole forms parallel connection by electrically connecting 60, and the system unit 30 of thought reverse configuration also can form parallel connection by electrically connecting 60 suitable layout; Among the figure (b), two system units, 30 reverse configuration, and by electrically connecting 60 connection both positive and negative polarities formation reverse parallel connections, only the system unit 30 of configuration also can be by the suitable layout formation reverse parallel connection of electric connection 60 in the same way.Among the figure (c), two system units 30 are connected to circuit carrier 60c and become the part of electric network.
In embodiments of the present invention, system unit 30 groups that are restricted in the material 40 can further be divided into the subgroup that quantity equates or do not wait, as shown in figure 11, only number and the connected mode of system unit 30 only is illustration among the figure, non-in order to limit embodiments of the present invention, the system unit kenel that discloses among other embodiment in the application's case all can be present embodiment and adopts under not apparent conflict mutually.In addition, the electric connection mode of 30 of each system units can be with reference to other relevant embodiment of the present invention in the subgroup.Divide the means of subgroup and can select chemical formula, physics formula or its Combination application.The chemical formula means for example are etchings etc.Physics formula means for example are that machine cuts, grinding, laser cutting, water are cut, hot splitting, ultrasonic vibrations etc.The width of 30 materials 40 in adjacent system unit is preferably more than the machining tolerance of division means.
According to the electric connection framework of the subgroup of the embodiment of the invention as shown in figure 12, only the kenel of system unit only is illustration in the accompanying drawing, non-in order to limit embodiments of the present invention, the system unit kenel that discloses among other embodiment in the application's case all can be present embodiment and adopts under not conflicting mutually.Among the figure (a), electrically connect 60b and stride across on the electrode 301 and material 40 that isolated area 60b ' is set up in system unit 30.Among the figure (b), an end that electrically connects 60b is electrically connected to the electrode 301 of system unit 30, and the other end directly is set up on the material 40.Among the figure (c), electrically connect 60b and namely electrically connect with system unit 30 without electrode 301, and directly be set up on the material 40.Among the figure (d), electrically connect 60b and namely electrically connect with system unit 30 without electrode 301, and be set up on the material 40 after striding across isolated area 60b '.
As shown in figure 13, in embodiments of the present invention, electro-optical system 100 comprises two or more subgroup of assembling in the various dimensions mode.The quantity of system unit and connected mode respectively can be identical or different in each subgroup.For example, subgroup 100a and 100c and subgroup 100b stacked on top wherein, comprise four systems unit 30 among the subgroup 100a; Comprise a system unit 30 among the subgroup 100b; Comprise two system units 30 among the subgroup 100c.Can use scolder, elargol or other electric conducting materials that is suitable for to reach between subgroup is electrical connected.Yet non-between subgroup is necessity to form electric connection, and simple structural assembled relation also can be found in therebetween.Only kenel or the quantity of system unit 30 only be illustration in the accompanying drawing, and is non-in order to limit embodiments of the present invention, and the system unit kenel that discloses among other embodiment in the application's case and connected mode all can be present embodiment under conflicting mutually and adopt apparent.
Figure 14 (a) shows that subgroup reaches wherein triangular web unit 30 same width L2, L1 on one side.L1/L2 is defined as X, and 0.05≤X≤1, preferably, and 0.1≤X≤0.2,0.2≤X≤0.3,0.3≤X≤0.4,0.4≤X≤0.5,0.5≤X≤0.6,0.6≤X≤0.7,0.8≤X≤0.9 and/or 0.9≤X≤1.Particularly, L1/L2=260/600,580/1000.Figure 14 (b) shows that its profile presents trapezoidal according to the profile of the subgroup of the embodiment of the invention.The relation of trapezoidal each size is as follows: L2>L1, L2>L3.One or more system unit 30 position in subgroup as shown in the figure, precisely because can move arbitrarily with respect to the position on material 40 borders, that is at least one border of system unit 30 can touch or surpass the border of material 40 just.For example, system unit 30 can approach, contact or upper limb 40a and/or the lower edge 40b of outstanding material 40.
As shown in figure 15, in embodiments of the present invention, luminescent system, subgroup or system unit (being referred to as light source in the present embodiment) can be integrated mutually with material for transformation of wave length.Particularly, material for transformation of wave length can be made of independent material 40a, independent material 40b or the combination of material 40a and 40b.Particularly, material 40a is fluorescent powder, dyestuff, semi-conducting material or ceramic powder etc.; Material 40b is fluorescence block, sintering block, ceramic block, organic colloid or inorganic colloid etc.Material 40a can be in aforementioned light source technology or the two is integrated mutually with material 40, material 40b or its afterwards.For example, fluorescent powder can cover or be filled on the system unit 30 earlier with after material 40 mixes, and perhaps material for transformation of wave length can utilize modes such as applying, some glue, screen painting, deposition to be formed on the system unit 30.Among the figure (a), material 40a, material 40b or material 40a and 40b are disposed on the light direction of light source, preferably, are covered on the light source.Among the figure (b), material 40a mixes in material 40.Among the figure (c), the configuration mode of material 40a and 40b is aforementioned (a) and (b) combination of aspect.Among the figure (d), material 40a, material 40b or material 40a and 40b are disposed on the light direction of light source, but are not in direct contact with it, and preferably, join with material 40.
As shown in figure 16, luminescent system, subgroup or system unit (being referred to as light source in the present embodiment) send blue light, on it and the configuration material for transformation of wave length.The related embodiment of material for transformation of wave length can be with reference to the explanation of aforementioned Figure 15.Among the figure (a), but material for transformation of wave length transmitting green light or sodium yellow.Among the figure (b), material for transformation of wave length can be launched red light and sodium yellow.Among the figure (c), the material for transformation of wave length in zone emission sodium yellow, another regional material for transformation of wave length emission red light, and this two zone non-overlapping each other.Preferably, the sodium yellow zone is greater than region of red light.Among the figure (d), the material for transformation of wave length in zone emission sodium yellow, another regional material for transformation of wave length emission red light, and this two zone overlaid each other.Preferably, the sodium yellow zone than region of red light near light source.Particularly, in above-mentioned each aspect, each coloured light is produced after blue light excites by corresponding fluorescent powder or fluorescence block.
Shown in Figure 17 (a), part in luminescent system or the subgroup or several system units emission blue light, another part or several system unit emission red light, mix in the material 40 green or yellow fluorescence powder are arranged, preferably, the quantity of blue light system unit is less than the quantity of red light system unit, and for example, the quantity ratio of blue light system unit and red light system unit is at least N/1+N(N and belongs to any positive integer).Perhaps, the power ratio of blue light system unit and red light system unit is that N1/N2(N1 and N2 belong to any positive integer).Preferably, the power of blue light system unit is greater than the power of red light system unit, for example, and N1/N2=3.0/1.0,2.5/1.0,2.0/1.0,1.5/1.0 or 1.1/1.0.Shown in Figure 17 (b), system unit 30 emission blue lights in luminescent system, the subgroup, and mix in the material 40 redness and yellow fluorescence powder are arranged, preferably, redness and yellow fluorescence powder are disposed in the certain space in the material 40 equably, so non-homogeneous, gradually layer, discrete or alternating expression distribute and can also selectivity adopt.
Shown in Figure 18 (a), a part of system unit emission blue light in luminescent system or the subgroup, the system unit emission red light of another part mixes the yellow fluorescence powder with identical or different emission spectrum among material 40 and the 40b.Shown in Figure 18 (b), the system unit emission blue light of the effective or start in luminescent system or the subgroup mixes redness and yellow fluorescence powder that proper proportion is arranged among material 40 and the 40b.Shown in Figure 18 (c), the effective or actuating system unit emission blue light in luminescent system or the subgroup, mixing in the material 40 has the yellow fluorescence powder, and mixing among the material 40b has the red fluorescence powder.
Shown in Figure 19 (a), a part of system unit emission blue light in luminescent system or the subgroup, the system unit transmitting green light of a part, the system unit emission red light of a part.Shown in Figure 19 (b), a part of system unit emission blue light in luminescent system or the subgroup, the system unit emission red light of another part, material 40b is disposed on this two parts system unit, and mixes the green fluorescence powder is arranged.Shown in Figure 19 (c), a part of system unit emission blue light in luminescent system or the subgroup, the system unit emission red light of another part, material 40b is disposed on the blue light system unit, and mixes the green fluorescence powder is arranged.Shown in Figure 19 (d), a part of system unit emission blue light in luminescent system or the subgroup, the system unit emission red light of another part, material 40b is disposed on part or the local blue light system unit, and mixes the green fluorescence powder is arranged.
Shown in Figure 20 (a)~20(c), the effective or actuating system unit emission blue light in luminescent system or the subgroup.Among the figure (a), the material 40b in a zone mixes the green fluorescence powder, and another regional material 40b mixes the red fluorescence powder, and preferably, the green emitting phosphor body region is greater than the red fluorescence powder body region.Among the figure (b), the material 40b in a zone mixes the green fluorescence powder, and another regional material 40b mixes the red fluorescence powder, and this two zone overlaps each other, and preferably, short-wave long light-emitting zone longer wavelength light-emitting zone is near system unit.Among the figure (c), material 40b mixes redness and yellow fluorescence powder.Shown in Figure 20 (d), in luminescent system or the subgroup effectively or actuating system unit emission human eye can't perception ray, for example: ultraviolet ray.Comprise blueness, green, and the material 40b of red fluorescence powder be disposed on the system unit respectively.The big I of the area of this three part is according to efficient, fade characteristics, the thickness adjustment of corresponding fluorescent powder.
In above or follow-up all embodiment, in the application, the sodium yellow of blue light collocation proper proportion can produce cold white light; Sodium yellow and the red light of blue light collocation proper proportion can produce warm white.Blue light and ruddiness power ratio are about 2:1 ~ 5:1, for example: 2.5:1,3:1,3.5:1,4:1,4.5:1.The power ratio of green glow and gold-tinted is about 1:4.Only size and the configuring area of material 40 and 40b only are illustration in the accompanying drawing, and non-is unique execution mode of the present invention, and the user works as can be according to situation adjustment, exchange.In addition, do not have fluorescent powder be disposed at its go out system unit on the light path can also be optionally the two is covered by material 40, material 40b or its.Material 40 and/or material 40b and fluorescent powder collocation mode can also be replaced by fluorescence block, sintering block, ceramic block, dyestuff or its combination.
Electro-optical system or subgroup are except comprising the system unit 30 that can launch light, more can comprise one or more integrated circuit (IC), in order to controlling all or part of system unit 30, or as the circuit relay of all or part of system unit 30, shown in Figure 21 (a).Except integrated circuit, electro-optical system or subgroup more can connected system unit 30 '.In an embodiment, system unit 30 ' is electric power system, for example, and chemical cell, solar cell, fuel cell etc.In an embodiment, system unit 30 ' is transformation system, frequency conversion system, commutation system.Particularly, system unit 30 ' is switched power supply (Switched Mode Power Supply; SWMP), high frequency transformer.
The schematic diagram of several configuration kenels of Figure 22 (a)~Figure 22 (f) display light electric system or subgroup, wherein, system unit 30 is non-to be limited to be all light-emitting component, and one or two above system units 30 can be the unit of non-tool lighting function, person as described above or described in follow-up all embodiment.
Shown in Figure 23 A, in the manufacture method of the electro-optical system of foundation specific embodiments of the invention, at first provide carrier 10(also to be called temporary substrate in the present embodiment), the layer or the structure 20(that form upper and lower surface tool stickiness in mode such as rotation coating, evaporation or printing etc. on temporary substrate 10 also are called first articulamentum in the present embodiment), and can be by selecting place system (Pick ﹠amp; Place system) a plurality of not system unit 30(of encapsulation also are called photoelectric cell in the present embodiment) place and be connected on above-mentioned first articulamentum 20, and form a plurality of aisle district 304 at the interval region of a plurality of photoelectric cells 30, contraposition precision when wherein photoelectric cell 30 is placed mainly determines by selecting place system, for example, error is no more than 15 μ m.Wherein above-mentioned photoelectric cell 30 can be light-emitting diode, and its structure can comprise substrate 303, be formed on semiconductor epitaxial layers 302 and at least one electrode 301 on the substrate.Above-mentioned semiconductor epitaxial layers 302 can comprise first conductive-type semiconductor layer, active layer, and second conductive-type semiconductor layer.In addition, substrate 303 can optionally remove in manufacturing process, with the reduction system size.In a preferred embodiment, at least one electrode 301 of this photoelectric cell 30 contacts with above-mentioned first articulamentum 20.Above-mentioned a plurality of photoelectric cell 30 can send the light with identical or different wavelength, and its light emitting region can be from ultraviolet light to infrared ray.
The material of above-mentioned temporary substrate 10 can be selected from silica gel (silicone), glass, quartz, pottery, alloy or printed circuit board (PCB) (PCB); The material of above-mentioned first articulamentum 20 can be selected from adhesive tape, for example removes adhesive tape (UV release tape) for heat removes adhesive tape (thermal release tape), ultraviolet ray, chemistry removes adhesive tape (Chemical release tape), heat resistant adhesive tape or blue film; The material of the substrate 303 of above-mentioned photoelectric cell 30 can be selected from sapphire (Sapphire), carborundum (SiC), zinc oxide (ZnO), gallium nitride (GaN) or high thermal conductive substrates such as silicon, glass, quartz or pottery; The material of first conductive-type semiconductor layer of above-mentioned photoelectric cell 30, active layer and second conductive-type semiconductor layer comprises one or more material, is selected from gallium (Ga), aluminium (Al), indium (In), arsenic (As), phosphorus (P), nitrogen (N) and silicon (Si) and constitutes group.
Then, shown in Figure 23 B, provide material 40(to be specially the viscous adhesive material in the present embodiment) fill up the aisle district 304 of above-mentioned a plurality of photoelectric cell 30, and first articulamentum, 20 surfaces that cover above-mentioned a plurality of photoelectric cell 30 and do not covered by photoelectric cell.Wherein above-mentioned viscous adhesive material 40 can utilize modes such as rotation coating, printing or mold encapsulating to form, and viscous adhesive material 40 also can be elastomeric material, its material can be selected from silica gel (silicone rubber), silicones (silicone resin), silica gel, elastic polyurethane (elasticity PU), cellular polyurethane (porous PU), acrylic rubber (acrylic rubber) or die separation glue, as blue film or ultraviolet curing glue (UV glue).In the present embodiment, also can carry out glossing (polish process), make the having an even surface of above-mentioned a plurality of photoelectric cell 30, and allow above-mentioned photoelectric cell 30 surfaces can not produce the viscous adhesive material 40 of surplus (overflow) or depression.
Subsequently, shown in Figure 23 C, provide Submount 50(also to be called permanent substrate in the present embodiment), and it a plurality of photoelectric cell 30 with coating viscous adhesive material 40 engaged, this juncture can be heat pressing process.In a preferred embodiment, this permanent substrate 50 directly contacts with the substrate 303 of above-mentioned photoelectric cell 30.The material of above-mentioned permanent substrate 50 can be silica gel (silicone), glass, quartz, pottery, alloy or printed circuit board (PCB) (PCB).
Then, shown in Figure 23 D, can laser lift-off, modes such as heating separation gel film figure, dissolving glued membrane pattern remove electrode 301 and the part semiconductor epitaxial loayer 302 that exposes a plurality of photoelectric cells 30 behind above-mentioned temporary substrate 10, first articulamentum 20 and the part viscous adhesive material 40.
At last, shown in Figure 23 E, with the gold-tinted lead engage, the mode of wire-bonded forms and electrically connects 60(and be specially many leads in the present embodiment) electrode 301 to connect a plurality of photoelectric cells, with these a plurality of photoelectric cells 30 of connecting.Wherein the material of above-mentioned lead 60 can be gold, aluminium, alloy or multiple layer metal, to form system-level photoconductive structure.
Figure 24 A~Figure 24 G is the structural representation (wherein or components identical close with the embodiment of Figure 23 will be given identical label, and be as follows) of another specific embodiment manufacturing process according to the present invention.Shown in Figure 24 A, temporary substrate 10 is provided, on temporary substrate 10, form first articulamentum 20 of upper and lower surface tool viscosity in modes such as rotation coating, evaporation or printings, and can be by selecting place system (Pick ﹠amp; Place system) photoelectric cell 30 of a plurality of not encapsulation is placed and is connected on above-mentioned first articulamentum 20, and form a plurality of aisle district 304 at the interval region of a plurality of photoelectric cells 30, contraposition precision when wherein photoelectric cell is placed is limited to be no more than the admissible error of selecting place system, for example is no more than 15 μ m.Wherein above-mentioned photoelectric cell 30 can be light-emitting diode, and its structure can comprise substrate 303, be formed on semiconductor epitaxial layers 302 and at least one electrode 301 on the substrate.Above-mentioned semiconductor epitaxial layers 302 can comprise first conductive-type semiconductor layer, active layer, and second conductive-type semiconductor layer.In a preferred embodiment, at least one electrode 301 of this photoelectric cell 30 contacts with above-mentioned first articulamentum 20.Above-mentioned photoelectric cell 30 can send the light with identical or different wavelength, and its light emitting region can be from ultraviolet light to infrared ray.
The material of above-mentioned temporary substrate 10 can be selected from silica gel (silicone), glass, quartz, pottery, alloy or printed circuit board (PCB) (PCB); The material of above-mentioned first articulamentum 20 can be selected from adhesive tape, for example removes adhesive tape (UV release tape) for heat removes adhesive tape (thermal release tape), ultraviolet ray, chemistry removes adhesive tape (Chemical release tape), heat resistant adhesive tape, blue film or metal; The material of the substrate 303 of above-mentioned photoelectric cell 30 can be selected from sapphire (Sapphire), carborundum (SiC), zinc oxide (ZnO), gallium nitride (GaN) or high thermal conductive substrates such as silicon, glass, quartz, GaAs or pottery; The material of first conductive-type semiconductor layer of above-mentioned photoelectric cell 30, active layer and second conductive-type semiconductor layer comprises one or more material, is selected from gallium (Ga), aluminium (Al), indium (In), arsenic (As), phosphorus (P), nitrogen (N) and silicon (Si) and constitutes group.
In addition, shown in Figure 24 A, in system-level photoconductive structure of the present invention, also can coat each above-mentioned photoelectric cell 30 with fluorescent material P earlier.By the average lining of fluorescent material, a stable white light source can be provided, and the otherness of the white light of each photoelectric cell 30 on the technology after reducing.Wherein above-mentioned fluorescent material P can rotate coating, deposition, modes such as some glue, scraper or casting film encapsulating form.In another embodiment, above-mentioned a plurality of photoelectric cell 30 also can distinctly coat different fluorescent materials.In another embodiment, above-mentioned a plurality of photoelectric cells 30 also can optionally distinctly coat different fluorescent materials, but not all photoelectric cells 30 all coat, to blend different coloured light.For example in an embodiment, a plurality of photoelectric cells 30 can be blue light-emitting diode, and three photoelectric cells 30 in a plurality of photoelectric cells 30 are considered as one group, wherein the fluorescent material P that coats of first photoelectric cell can be the fluorescent material P that red fluorescence powder, second photoelectric cell coat and can be green emitting phosphor, and the 3rd photoelectric cell can not coat fluorescent material, sends white light with mixing.
Then, shown in Figure 24 B, the aisle district 304 that provides viscous adhesive material 40 to fill up above-mentioned a plurality of photoelectric cell 30, and first articulamentum, 20 surfaces that cover above-mentioned a plurality of photoelectric cell 30 and do not covered by photoelectric cell.Wherein above-mentioned viscous adhesive material 40 can utilize modes such as rotation coating, printing or mold encapsulating to form, and viscous adhesive material 40 can be elastomeric material, its material can be selected from silica gel (silicone rubber), silicones (silicone resin), silica gel, elasticity PU, porous PU, acrylic rubber (acrylic rubber) or die separation glue, as blue film or UV glue.In the present embodiment, also can carry out glossing (polish process), can make the having an even surface of above-mentioned a plurality of photoelectric cell 30, and allow above-mentioned photoelectric cell 30 surfaces can not produce the viscous adhesive material 40 of surplus (overflow) or depression.
Subsequently, shown in Figure 24 C, provide permanent substrate 50, and it a plurality of photoelectric cell 30 with coating viscous adhesive material 40 is engaged, this juncture can be heat pressing process.In a preferred embodiment, this permanent substrate 50 directly contacts with the substrate 303 of above-mentioned photoelectric cell 30.The material of above-mentioned permanent substrate 50 can be high grade of transparency substrates such as glass or quartz.
Then, shown in Figure 24 D, can laser lift-off, modes such as heating separation gel film figure, dissolving glued membrane pattern remove electrode 301 and the part semiconductor epitaxial loayer 302 that exposes a plurality of photoelectric cells 30 behind above-mentioned temporary substrate 10, first articulamentum 20 and the part viscous adhesive material 40.
Then, shown in Figure 24 E, the mode with plating or evaporation is connected a plurality of expansion electrodes (Fan-out electrode) 305 on the electrode 301 of a plurality of photoelectric cells.Wherein expand the area of electrode 305 greater than the electrode 301 of photoelectric cell, can increase the contraposition tolerance of follow-up encapsulation.In addition, owing to strengthen the area of expansion electrode 305, will more can be effectively thermal source be led on the substrates such as the metal of follow-up encapsulation or PCB.The material of above-mentioned expansion electrode can be gold, aluminium, alloy or multi-layer metal structure.
At last, shown in Figure 24 F ~ 24G, cut this a plurality of photoelectric cells, form each other tube core after, by at least one scolder (solder) 601 will it gluing to inferior carrier (submount) 60, to form system-level photoconductive structure.Above-mentioned inferior carrier 60 can be that lead frame (lead frame) or large scale are inlayed substrate (mounting substrate), with the circuit planning of convenient system-level photoconductive structure and improve its radiating effect.
It should be noted that, processing step among above-mentioned two embodiment is reference or combination mutually also, also optionally coat fluorescent material as the photoelectric cell among first embodiment, but or behind Figure 23 D also subsequent steps such as the making of hookup 24E expansion electrode, diced chip; In like manner, second embodiment also can be behind Figure 24 D the step of hookup 23E, be electrically connected a plurality of photoelectric cells with lead.
In addition, in another embodiment of the present invention, continue after Figure 23 B or Figure 24 B, shown in Figure 25 A, permanent substrate 50 can be provided, and after being bonded on this permanent substrate 50 on second articulamentum 70 earlier, it a plurality of photoelectric cell 30 with coating viscous adhesive material 40 is engaged, this juncture can be heat pressing process.Wherein the material of above-mentioned second articulamentum 70 can be SiO x, SiN x, silica gel (silicone).In another embodiment of the present invention, continue after Figure 23 B or Figure 24 B, shown in Figure 25 B, above-mentioned second articulamentum 70 also can be second articulamentum 70 ' that comprises a plurality of passages 701, the heat radiation of native system level photoelectric cell can be increased, and the wattage that to bear can be promoted.Wherein the material of above-mentioned passage 701 can be metal, as copper, aluminium, nickel or alloy.In addition, passage 701 can be identical materials with second articulamentum 70 ' also, for example sapphire, metal, silicon nitride, aluminium oxide.
In another embodiment of the present invention, continue after Figure 23 B or Figure 24 B, as shown in figure 26, permanent substrate 50 can be provided, and earlier this permanent substrate 50 is utilized the intermediary layer (not shown) to connect first reflector 80 earlier, rejoin after on second articulamentum 70, it a plurality of photoelectric cell 30 with coating viscous adhesive material 40 is engaged, this juncture can be heat pressing process.Wherein, the material of intermediary layer for example is SiO x, SiN x, silica gel (silicone) etc.The material in above-mentioned first reflector 80 can be metals such as silver, aluminium or platinum, perhaps is distributed Bragg reflector (the Distributed Bragg Reflector that is made up of dielectric medium or semiconductor; DBR).In the present embodiment, by the design in this first reflector 80, the light that can increase native system level photoconductive structure takes out efficient.
May cause lateral light loss and/or light extraction efficiency to reduce in order further to avoid above-mentioned a plurality of photoelectric cell 30 if put too closely, in another embodiment of the present invention, continue after Figure 23 B or Figure 24 B, as shown in figure 27, optional usefulness has the substrate 50 ' of little pyramid array (Micro-pyramid array).Wherein, this little pyramid array base palte 50 ' can utilize the conductor etching technology to make, and the form of a plurality of little pyramid 501 on the substrate can be polygonal wimble structures such as circular cone, pyrometric cone and quadrangular pyramid, and wherein the base angle of above-mentioned little pyramid 501 can be between 20 ~ 70 degree.In another embodiment, but the surface of above-mentioned little pyramid array base palte 50 ' also second reflector of coating tool high reflectance, for example metals such as silver, aluminium, platinum; In addition, the material of above-mentioned little pyramid array base palte 50 ' can be silica gel (silicone), glass, quartz, pottery, alloy or printed circuit board (PCB) (PCB), also can select for use highly heat-conductive material to increase the element reliability, its material can be copper, aluminium, pottery, silicon.The a plurality of photoelectric cells 30 of this little pyramid array base palte 50 ' with coating viscous adhesive material 40 can be engaged by contraposition (alignment) during making, this juncture can be heat pressing process.In the present embodiment, by the design of this little pyramid array base palte 50 ', the lateral light reflection of native system level photoconductive structure can be become forward light in order to increasing the light extraction efficiency.
Though more than each accompanying drawing only distinguish corresponding specific embodiment with explanation, yet, illustrated or the element that discloses among each embodiment, execution mode, design criterion, and know-why except showing mutually conflict, contradiction each other or being difficult to the common implementing, those skilled in the art are when complying with its required any reference, exchange, collocation, coordination or merging.
Though the present invention illustrated as above, so its be not in order to limit the scope of the invention, enforcement order or the material and technology method used.Modify and change, neither spirit of the present invention and the scopes of taking off for various being equal to that the present invention does.

Claims (10)

1. photoconductive structure comprises:
One or more photoelectric cell;
The glue material covers this one or more photoelectric cell;
A plurality of expansion electrodes are positioned at this photoelectric cell not by on the position and this glue material of this glue material covering; And
Inferior carrier is positioned at this glue material not by on the surface of these a plurality of expansion electrodes coverings, and has at least one exiting surface.
2. photoconductive structure as claimed in claim 1 also comprises these a plurality of photoelectric cells of electric connection.
3. photoconductive structure as claimed in claim 1 comprises that also material for transformation of wave length is positioned on the light direction of this one or more photoelectric cell, but does not directly contact with this one or more photoelectric cell.
4. photoconductive structure as claimed in claim 1 comprises that also material for transformation of wave length is positioned at this photoelectric cell not by on the surface of this glue material covering.
5. photoconductive structure as claimed in claim 1 comprises that also fluorescent powder is positioned among this glue material.
6. photoconductive structure as claimed in claim 1 also comprises knitting layer, between this glue material and this time carrier.
7. photoconductive structure as claimed in claim 1 also comprises the integrated circuit, electric power system, transformation system, frequency conversion system or the commutation system that are covered by this glue material.
8. photoconductive structure as claimed in claim 1 wherein has regular male and fomale(M﹠F), irregular male and fomale(M﹠F), photonic crystal, concavees lens, convex lens or Fresnel lens (Fresnel lens) on this exiting surface.
9. photoconductive structure as claimed in claim 1 wherein is formed with reflection, refraction, scattering, optically focused, collimation or masking structure on this exiting surface, and this exiting surface system is between this time carrier and this glue material or between this time carrier and the surrounding medium.
10. photoconductive structure as claimed in claim 1, wherein these a plurality of photoelectric cells can be launched at least two kinds of coloured light.
CN2013100540664A 2009-08-17 2010-01-13 System-level photoelectric structure and manufacturing method thereof Pending CN103199023A (en)

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US20130161667A1 (en) * 2011-12-21 2013-06-27 Phostek, Inc. Patterned reflective layer on dielectric layer for led array
US20130161654A1 (en) * 2011-12-21 2013-06-27 Phostek, Inc. Reflective layer on dielectric layer for led array
CN103426895A (en) * 2012-05-25 2013-12-04 华夏光股份有限公司 Light-emitting diode array and forming method thereof
WO2017008251A1 (en) * 2015-07-14 2017-01-19 Goertek. Inc Assembling method, manufacturing method, device and electronic apparatus of flip-die
CN106601899B (en) * 2016-12-20 2019-03-05 深圳市洁简达创新科技有限公司 A kind of packaging technology of LED display module
CN106784201A (en) * 2017-02-17 2017-05-31 江苏欧密格光电科技股份有限公司 A kind of LED module packagings method
WO2018223391A1 (en) * 2017-06-09 2018-12-13 Goertek. Inc Micro-led array transfer method, manufacturing method and display device
EP3614437B1 (en) 2018-08-22 2021-05-05 Lumileds LLC Semiconductor die
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US11322646B2 (en) 2019-01-18 2022-05-03 Innolux Corporation Light-emitting diode package and electronic device
CN111463332B (en) * 2019-01-18 2021-07-27 群创光电股份有限公司 Electronic device with light emitting diode package
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US6627477B1 (en) * 2000-09-07 2003-09-30 International Business Machines Corporation Method of assembling a plurality of semiconductor devices having different thickness
US7400037B2 (en) * 2004-12-30 2008-07-15 Advanced Chip Engineering Tachnology Inc. Packaging structure with coplanar filling paste and dice and with patterned glue for WL-CSP
US9024349B2 (en) * 2007-01-22 2015-05-05 Cree, Inc. Wafer level phosphor coating method and devices fabricated utilizing method
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Application publication date: 20130710