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CN103048497A - Multimeter pen and multimeter with pen - Google Patents

Multimeter pen and multimeter with pen Download PDF

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Publication number
CN103048497A
CN103048497A CN 201110308591 CN201110308591A CN103048497A CN 103048497 A CN103048497 A CN 103048497A CN 201110308591 CN201110308591 CN 201110308591 CN 201110308591 A CN201110308591 A CN 201110308591A CN 103048497 A CN103048497 A CN 103048497A
Authority
CN
China
Prior art keywords
negative
multimeter
conductive layer
joint
positive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN 201110308591
Other languages
Chinese (zh)
Inventor
刘浩龙
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitac Technology Kunshan Co Ltd
Original Assignee
Mitac Technology Kunshan Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitac Technology Kunshan Co Ltd filed Critical Mitac Technology Kunshan Co Ltd
Priority to CN 201110308591 priority Critical patent/CN103048497A/en
Publication of CN103048497A publication Critical patent/CN103048497A/en
Pending legal-status Critical Current

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Abstract

The invention provides a multimeter pen and a multimeter with the pen. A slot is arranged in the socket of a multimeter body. A positive wiring terminal and a negative wiring terminal are arranged in the slot. The multimeter pen is provided with a connector which can integrally arrange a positive pen line and a negative pen line. A positive conducting layer and a negative conducting layer which are isolated through an insulating layer are arranged in the insulating shell of the connector. The positive conducting layer and the negative conducting layer are respectively connected with the positive pen line and the negative pen line. The front end of the connector is a socket-connecting end. A positive conducting electrode and a negative conducting electrode which can be electrically connected with the positive wiring terminal and the negative wiring terminal in the slot in a contact way are arranged on the socket-connecting end. By ingeniously improving the structures of the multimeter and the multimeter pen, the connecting structure between the multimeter and the multimeter pen is simplified and the multimeter pen can be used for measurement after one-step socket connection only; and since the two pen lines are integrally arranged, the two pen lines can be prevented from being twisted with each other and even being knotted with each other, and the two pen lines are also convenient to collect.

Description

A kind of multitester probe and the multimeter with this test pencil
[technical field]
The present invention relates to the design and fabrication technology of measuring instrument, the multimeter that refers in particular to a kind of multitester probe and have this test pencil.
[background technology]
Multimeter is widely used in measuring resistance, electric current, and voltage, transistor characteristics etc. are the standing survey instruments of electrician and electronic technology personnel.The test pencil of existing multimeter is equipped with two independent multitester probes and two independent jacks; two multitester probes need to be inserted respectively during use in the corresponding jack; therefore more loaded down with trivial details in the operation; and when taking in two test pencils that separate independently of one another, also usually can lose the wherein situation of a test pencil; and the wire of two tangle ups must be made in order separately first because of the long normal phenomenon that is intertwined even ties a knot of the wire of two test pencils so that when taking through being everlasting and just can carry out follow-up operation; not only time-consuming but also wasted user's energy, cause inconvenience.
Therefore the test pencil structure of existing multimeter haves much room for improvement.
[summary of the invention]
For problems of the prior art, the object of the invention is to overcome above-mentioned weak point of the prior art, the multimeter that a kind of multitester probe is provided and has this test pencil is realized taking and take in test pencil by the test pencil line is set with uniting two into one, is utilized test pencil to carry out all purposes eaily of test operation.
For reaching above-mentioned purpose, the invention provides a kind of multitester probe, be applied to a multimeter, this multimeter has jack, just be provided with in this jack, negative connection terminal, wherein, this multitester probe has just, the joint that negative test pencil line unites two into one and arranges, just have in the insulation crust of this joint, negative conductive layer, this just, separate with insulation course between the negative conductive layer, this just, negative conductive layer at the tail end place of this joint and this just, negative test pencil line links to each other respectively, the front end of this joint is the inserted terminal in this jack that is used for inserting on the multimeter, be provided with on this inserted terminal can with this jack in just, negative connection terminal contacts and just is electrically connected, negative conductive electrode, this is just, negative conductive electrode respectively with this just, negative conductive layer is conducted.
Preferably, this positive and negative conductive layer in this joint from inside to outside and wherein a conductive layer arrange as the interval around another conductive layer and take this insulation course.
Preferably, separate with insulation course between this positive and negative conductive electrode.
Preferably, the part section of this positive and negative test pencil line is arranged in the same insulated hull.
For reaching above-mentioned purpose, the present invention also provides a kind of multimeter, comprise multimeter body and multitester probe, this multimeter body front is provided with a display screen, wherein, on this multimeter body a socket is set also, offer a jack on this socket, just be provided with in this jack, negative connection terminal, this multitester probe has just, the joint that negative test pencil line unites two into one and arranges, just have in the insulation crust of this joint, negative conductive layer, this just, separate with insulation course between the negative conductive layer, this just, negative conductive layer at the tail end place of this joint and this just, negative test pencil line links to each other respectively, the front end of this joint is the inserted terminal in this jack that is used for inserting on the multimeter, be provided with on this inserted terminal can with this jack in just, negative connection terminal contacts and just is electrically connected, negative conductive electrode, this is just, negative conductive electrode respectively with this just, negative conductive layer is conducted.
Preferably, this positive and negative conductive layer in this joint from inside to outside and wherein a conductive layer arrange as the interval around another conductive layer and take this insulation course.
Preferably, separate with insulation course between this positive and negative conductive electrode.
Preferably, the part section of this positive and negative test pencil line is arranged in the same insulated hull.
Preferably, also be provided with a ground terminal in this socket.
Compared with prior art, the present invention can reach following beneficial effect:
Because multitester probe is provided with just, the joint that negative test pencil line unites two into one and arranges, and be equipped with the jack of the inserted terminal insertion that supplies this joint at multimeter, in joint is inserted into jack, by on the joint just, negative electrode and jack are interior just, negative connection terminal contacts and realizes being electrically connected, by the ingenious improvement to multimeter and this body structure of test pencil, simplified syndeton between the two, the action of only need once pegging graft can bring into use test pencil to measure, and, two test pencil lines unite two into one arranges the phenomenon that can prevent that it from mutually twining even occurring tiing a knot, and also is convenient to take in.
[description of drawings]
Fig. 1 is the structural representation that this multitester probe in the preferred embodiments of the present invention is inserted in multimeter.
Fig. 2 is the structural representation of the socket of this multimeter in the preferred embodiments of the present invention.
Fig. 3 is the structural representation of the joint of this multitester probe in the preferred embodiments of the present invention.
Fig. 4 is the diagrammatic cross-section of the joint of this multitester probe in the preferred embodiments of the present invention.
Among the figure: 1. multimeter body, 2. multitester probe, 11. display screens, 12. socket, 21. positive test pencil lines, 22. negative test pencil lines, 23. joint, 121. jacks, 122. negative connection terminals, 123. positive connection terminal, 124. ground terminals, 231. positive conductive layers, 232. negative conductive layer, 233. positive electrodes, 234. negative electrodes, 235. insulation course, 236. insulation crusts, 237. solder joints.
[embodiment]
Below in conjunction with the drawings and specific embodiments the present invention is described in further detail:
Among Fig. 1, has a display screen 11 on the multimeter body 1, one socket 12, socket 12 offers a jack 121, multitester probe 2 has positive test pencil line 21 and negative test pencil line 22, with this just, negative test pencil line 21,22 joints 23 that unite two into one and arrange, the front end of this joint 23 is that inserted terminal is inserted in the jack 121, this just, negative test pencil line 21,22 part section is arranged in the same insulated hull, in the present embodiment, with two test pencil lines 21,22 sections near joint 23 wrap in together with same insulated hull, to avoid separately part long and the phenomenon of two tangled up and knotted occurs, the needs when measuring can touch the measured signal point that keeps at a certain distance away for two test pencil heads can reserving enough length near the part of test pencil head certainly.In addition, the positive and negative test pencil line 21 described in the present embodiment, 22 is distinguished with red, black color when concrete the application usually.
Fig. 2 has drawn the structural representation of the socket 12 of this multimeter, and among the figure, jack 121 inserts for the inserted terminal of multitester probe 2, is provided with negative connection terminal 122, positive connection terminal 123 and ground terminal 124 in this jack 121.
Please in conjunction with consulting Fig. 3 and shown in Figure 4, has positive conductive layer 231 in the insulation crust 236 of the joint 23 of this multitester probe 2, negative conductive layer 232, this just, negative conductive layer 231,232 in this joint 23 from inside to outside and wherein a conductive layer arrange as the interval around another conductive layer and take this insulation course 235, this just, negative conductive layer 231,232 at the tail end place of this joint 23 by two solder joints 237 respectively with this just, negative test pencil line 21,22 link to each other, the front end of joint 23 has the inserted terminal in the jack 121 that is used for inserting on the multimeter, be provided with positive conductive electrode 233 on this inserted terminal, negative conductive electrode 234, in the inserted terminal insertion jack 121 of joint 23, just be positioned at jack 121, negative connection terminal 122,123 respectively with just, negative electrode 233,234 contact and are electrically connected, and just, negative conductive electrode 233,234 again respectively with this just, negative conductive layer 231,232 are conducted, just, negative test pencil line will be by the electric current of test pencil head acquisition, the signals such as voltage are through just, negative conductive layer transfers in the multimeter, thereby display screen can demonstrate the relevant readings of this signal.
Above embodiment has only expressed the specific embodiment of the present invention; it describes comparatively concrete and detailed; but can not therefore be interpreted as the restriction to the protection domain of patent of the present invention; should be noted that; for the person of ordinary skill of the art; without departing from the inventive concept of the premise, can also make some distortion and improvement, these all belong to the protection domain of patent of the present invention.Therefore the protection domain of patent of the present invention should be as the criterion with claims.

Claims (9)

1. multitester probe, be applied to a multimeter, this multimeter has jack, just be provided with in this jack, negative connection terminal, it is characterized in that: this multitester probe has just, the joint that negative test pencil line unites two into one and arranges, just have in the insulation crust of this joint, negative conductive layer, this just, separate with insulation course between the negative conductive layer, this just, negative conductive layer at the tail end place of this joint and this just, negative test pencil line links to each other respectively, the front end of this joint is the inserted terminal in this jack that is used for inserting on the multimeter, be provided with on this inserted terminal can with this jack in just, negative connection terminal contacts and just is electrically connected, negative conductive electrode, this is just, negative conductive electrode respectively with this just, negative conductive layer is conducted.
2. a kind of multitester probe as claimed in claim 1 is characterized in that: this positive and negative conductive layer in this joint from inside to outside and wherein a conductive layer arrange as the interval around another conductive layer and take this insulation course.
3. a kind of multitester probe as claimed in claim 1 is characterized in that: separate with insulation course between this positive and negative conductive electrode.
4. a kind of multitester probe as claimed in claim 1, it is characterized in that: the part section of this positive and negative test pencil line is arranged in the same insulated hull.
5. multimeter, comprise multimeter body and multitester probe, this multimeter body front is provided with a display screen, it is characterized in that, on this multimeter body a socket is set also, offer a jack on this socket, just be provided with in this jack, negative connection terminal, this multitester probe has just, the joint that negative test pencil line unites two into one and arranges, just have in the insulation crust of this joint, negative conductive layer, this just, separate with insulation course between the negative conductive layer, this just, negative conductive layer at the tail end place of this joint and this just, negative test pencil line links to each other respectively, the front end of this joint is the inserted terminal in this jack that be used for to insert on the multimeter, be provided with on this inserted terminal can with this jack in just, negative connection terminal contacts and just is electrically connected, negative conductive electrode, this is just, negative conductive electrode respectively with this just, negative conductive layer is conducted.
6. a kind of multimeter as claimed in claim 5 is characterized in that: this positive and negative conductive layer in this joint from inside to outside and wherein a conductive layer arrange as the interval around another conductive layer and take this insulation course.
7. a kind of multimeter as claimed in claim 5 is characterized in that: separate with insulation course between this positive and negative conductive electrode.
8. a kind of multimeter as claimed in claim 5, it is characterized in that: the part section of this positive and negative test pencil line is arranged in the same insulated hull.
9. a kind of multimeter as claimed in claim 5 is characterized in that: also be provided with a ground terminal in this socket.
CN 201110308591 2011-10-13 2011-10-13 Multimeter pen and multimeter with pen Pending CN103048497A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 201110308591 CN103048497A (en) 2011-10-13 2011-10-13 Multimeter pen and multimeter with pen

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 201110308591 CN103048497A (en) 2011-10-13 2011-10-13 Multimeter pen and multimeter with pen

Publications (1)

Publication Number Publication Date
CN103048497A true CN103048497A (en) 2013-04-17

Family

ID=48061211

Family Applications (1)

Application Number Title Priority Date Filing Date
CN 201110308591 Pending CN103048497A (en) 2011-10-13 2011-10-13 Multimeter pen and multimeter with pen

Country Status (1)

Country Link
CN (1) CN103048497A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108872668A (en) * 2018-04-28 2018-11-23 中国神华能源股份有限公司 multimeter
CN109782042A (en) * 2019-02-21 2019-05-21 蒙丽桃 A kind of portable type electric power detection device that grafting is stable

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108872668A (en) * 2018-04-28 2018-11-23 中国神华能源股份有限公司 multimeter
CN109782042A (en) * 2019-02-21 2019-05-21 蒙丽桃 A kind of portable type electric power detection device that grafting is stable

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PB01 Publication
C02 Deemed withdrawal of patent application after publication (patent law 2001)
WD01 Invention patent application deemed withdrawn after publication

Application publication date: 20130417