CN102790589A - Amplifier for measuring 1MHz common mode rejection ratios of high-resistance high-voltage differential probe - Google Patents
Amplifier for measuring 1MHz common mode rejection ratios of high-resistance high-voltage differential probe Download PDFInfo
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- CN102790589A CN102790589A CN2012103092608A CN201210309260A CN102790589A CN 102790589 A CN102790589 A CN 102790589A CN 2012103092608 A CN2012103092608 A CN 2012103092608A CN 201210309260 A CN201210309260 A CN 201210309260A CN 102790589 A CN102790589 A CN 102790589A
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Abstract
Disclosed is an amplifier for measuring 1MHz common mode rejection ratios of a high-resistance high-voltage differential probe. The amplifier comprises a pre-amplification unit, a frequency-selective amplification unit and two independent direct current supply voltage, wherein the two independent direct current supply voltage is connected with the pre-amplification unit and the frequency-selective amplification unit respectively and used for independently supplying power for the pre-amplification unit and the frequency-selective amplification unit respectively; the pre-amplification unit is used for providing preceding stage amplification times with preset ranges and amplifying signals and noises which are buried in noises; the frequency-selective amplification unit is connected with the pre-amplification unit and comprises an LC frequency-selective network and an amplification unit, the resonance centre frequency of the LC frequency-selective network is designed to be 1MHz, the amplification unit is composed of triodes, and the frequency-selective amplification unit is used for further amplifying 1MHz useful signals obtained by filtering. According to the amplifier for measuring the 1MHz common mode rejection ratios of the high-resistance high-voltage differential probe, the technical problem that common mode output voltage at high attenuation stage 1MHz frequency points of the high-resistance high-voltage differential probe can not be directly measured in prior art is solved.
Description
Technical field
The present invention relates to a kind of amplifier, particularly a kind of amplifier that is used to measure high resistant High Pressure Difference sub-probe 1MHz common-mode rejection ratio.
Background technology
Common-mode rejection ratio is one of key parameter of reflection high resistant High Pressure Difference sub-probe performance; High resistant High Pressure Difference sub-probe decay shelves level branch lower attenuation coefficient (* 20, * 50, * 100) and high attenuation coefficient (* 200, * 500, * 1000) two parts; According to the technical specification requirement, need provide the common-mode rejection ratio measurement result of high resistant High Pressure Difference sub-probe at 50Hz (60Hz), 1kHz, 10kHz, 100kHz, 1MHz Frequency point.Present high resistant standard source ability sine wave output frequency reaches 1MHz and output amplitude is maximum, has only FLUKE5700A, and the output level ability of its different frequency point is seen table 1.When measuring the common-mode rejection ratio of the high decay shelves of high resistant High Pressure Difference sub-probe level 1MHz Frequency point; Because high resistant standard source output amplitude is big inadequately; Therefore has only tens microvolts to hundreds of microvolt through the common mode output voltage amplitude behind the high resistant High Pressure Difference sub-probe; Buried in noise, on oscilloscope, be rendered as a line, so can't obtain the common-mode rejection ratio measured value of the high decay shelves of high resistant High Pressure Difference sub-probe level 1MHz Frequency point.
The output level capability list of table 1 high resistant standard source FLUKE 5700A different frequency point
| Frequency point | 50Hz(60Hz)、1kHz | 10kHz、100kHz | 1MHz |
| Exportable maximum level | 1000V | 200V | 20V |
Still incompetent at present realization high resistant High Pressure Difference sub-probe buries the amplifier of the 1MHz common mode output signal in noise.Existing amplifier can be realized the amplification to the 1MHz common-mode signal, but has also amplified noise simultaneously, and the result is still buried in noise.Existing filter has high frequency filter, intermediate-frequency filter, low pass filter.Not having centre frequency is the finished product filter of 1MHz.
Existing amplifier finished product is because performances such as input impedance, working band, amplifying power are different, do not have a specific aim that is suitable for to amplify and buried that the about hundreds of microvolt of amplitude, frequency are the amplifier of 1MHz useful signal in noise.Source Music, intercom etc.; At first its matched impedance is 50 ohm; Acceptance is from the faint high-frequency signal of antenna etc., because of the common mode output signal of high resistant High Pressure Difference sub-probe has high-impedance behavior, so existing scheme can't be applicable to the amplification of high resistant High Pressure Difference sub-probe common-mode signal; Secondly, the centre frequency of existing implementation frequency-selecting is the common-mode signal frequency-selecting poor effect of 1MHz at high band to centre frequency.
Summary of the invention
The object of the present invention is to provide a kind of amplifier that is used to measure high resistant High Pressure Difference sub-probe 1MHz common-mode rejection ratio, to solve the technical barrier that prior art can't directly be measured to the high decay shelves of high resistant High Pressure Difference sub-probe level 1MHz common mode output voltage.
The present invention is directed to the above-mentioned deficiency that prior art exists; Design a kind of amplifier that is used to measure high resistant High Pressure Difference sub-probe 1MHz common-mode rejection ratio; Develop an amplifier that can amplify the 1MHz common mode output signal that buries in noise targetedly, thereby realize the measurement of high resistant High Pressure Difference sub-probe 1MHz Frequency point common-mode rejection ratio smoothly.
The present invention realizes through following technical scheme:
A kind of amplifier that is used to measure high resistant High Pressure Difference sub-probe 1MHz common-mode rejection ratio comprises a pre-amplifier unit, a frequency-selecting amplifying unit and two independent direct current supply power voltages, wherein,
Said two independent direct current supply power voltages connect said pre-amplifier unit and said frequency-selecting amplifying unit respectively, are used for carrying out independently-powered respectively to said pre-amplifier unit and said frequency-selecting amplifying unit;
Said pre-amplifier unit: be used to provide the prime multiplication factor of the scope of preestablishing, the signal and the noise that will bury in noise amplify together;
Said frequency-selecting amplifying unit: connect pre-amplifier unit, comprise being designed to the amplifying unit that L C frequency-selective network that the resonance centre frequency is 1MHz and triode are formed, be used for that filtration is obtained the 1MHz useful signal and further amplify.
Preferably, inductance L in the said frequency-selecting amplifying unit
0With capacitor C
0Be combined into frequency-selective network, its resonance frequency is 1MHz, and the equiva lent impedance behind its resonance is as triode T
0Load, with the signal of further amplification 1MHz.
Preferably, said frequency-selecting amplifying unit also comprises R
4With R
5, R
4With R
5Be divider resistance, said direct current supply voltage passes through R
4With R
5, be triode T
0Dc offset voltage is provided.
Preferably, said pre-amplifier unit comprises negative feedback computing amplifying unit, R
0With R
1, R
0With R
1With negative feedback computing amplifying unit through the negative feedback combining structure, make it in wider frequency, have stable multiplication factor.
And negative feedback computing amplifying unit is low noise high bandwidth operational amplifier or transistor amplifier.
Preferably, said pre-amplifier unit also comprises R
2With R
3Be divider resistance, the positive-negative input end that is respectively negative feedback computing amplifying unit provides dc offset voltage.
This amplifier also comprises input coupling unit, output coupling unit, and said input coupling unit is provided with the input front end of pre-amplifier unit, and said output coupling unit is arranged on the output rear end of frequency-selecting amplifying unit.But also comprising the 3rd coupling unit, it is arranged between pre-amplifier unit and the frequency-selecting amplifying unit.
The present invention provides the method for measurement of another kind of high resistant High Pressure Difference sub-probe 1MHz Frequency point common-mode rejection ratio.
For lower attenuation coefficient 1/100 part; Make the positive and negative input of the paramount impedance contrast sub-probe of high impedance standard source FLUKE 5700A output 1MHz sine wave signal earlier; Its output level maximum can reach 20V, on digital oscilloscope, directly reads differential mode voltage peak-to-peak value measurement result V
D1Then the positive-negative input end short circuit of high impedance difference detector; High impedance standard source FLUKE 5700A output is remained unchanged, input between the short circuit input and public ground of high impedance difference detector, on digital oscilloscope, directly read common-mode voltage peak-to-peak value measurement result V
C1, calculate the common-mode rejection ratio CMRR of lower attenuation coefficient 1/100 part
1=20 * lg (V
D1/ V
C1);
For high attenuation coefficient 1/1000 part, record 1MHz differential mode voltage peak-to-peak value measuring voltage V as a result earlier
D2
Be arranged on lower attenuation coefficient 1/100 part, amplifier, the common-mode voltage peak-to-peak value measurement result V after obtaining amplifying are inserted in high resistant High Pressure Difference sub-probe rear end
Cg1, according to before obtain without amplifying common-mode voltage peak-to-peak value measurement result V
C1, can calculate the actual multiplication factor A=V of this amplifier corresponding to this high resistant High Pressure Difference sub-probe
Cg1/ V
C1
Be arranged on high attenuation coefficient 1/1000 part, amplifier, the common-mode voltage peak-to-peak value measurement result V after obtaining amplifying are inserted in high resistant High Pressure Difference sub-probe rear end
Cg2Thereby calculate the actual common-mode voltage peak-to-peak value measurement result V of 1MHz frequency place
C2=V
Cg2/ A;
Calculate the actual common-mode rejection ratio CMRR of this probe at high attenuation coefficient 1/1000 part 1MHz place
2=20 * 1g (V
D2/ V
C2).
The present invention is compared to prior art; Its advantage is: the amplifier that can amplify the 1MHz common mode output signal that buries in noise targetedly; First part is a high bandwidth low noise amplifying unit, and this amplifying unit will bury small-signal and the noise in noise etc. and amplify together.Second portion is an arrowband frequency-selecting amplifier section, and filtration is obtained the 1MHz useful signal, and further amplifies.Guarantee the good isolation design between prime amplification and the back level frequency-selecting simultaneously; Use power supply separately respectively through front and back stages; Eliminate interacting between the two-stage unit, thereby realize the measurement of high resistant High Pressure Difference sub-probe 1MHz Frequency point common-mode rejection ratio smoothly.
Description of drawings
Fig. 1 is used to measure the structural representation of the amplifier of high resistant High Pressure Difference sub-probe 1MHz common-mode rejection ratio for the present invention is a kind of;
Fig. 2 is used to measure the circuit diagram of the amplifier of high resistant High Pressure Difference sub-probe 1MHz common-mode rejection ratio for the present invention is a kind of;
Fig. 3 is used to measure the circuit diagram of the amplifier of high resistant High Pressure Difference sub-probe 1MHz common-mode rejection ratio for another kind of the present invention.
Fig. 4 measures for differential mode in the method for measurement of a kind of high resistant High Pressure Difference of the present invention sub-probe 1MHz Frequency point common-mode rejection ratio and connects sketch map.
Fig. 5 measures for common mode in the method for measurement of a kind of high resistant High Pressure Difference of the present invention sub-probe 1MHz Frequency point common-mode rejection ratio and connects sketch map.
Fig. 6 measures for the common mode that inserts amplifier in the method for measurement of a kind of high resistant High Pressure Difference of the present invention sub-probe 1MHz Frequency point common-mode rejection ratio and connects sketch map.
Embodiment
Below in conjunction with embodiment the present invention is elaborated, present embodiment has provided detailed execution mode being to implement under the prerequisite with technical scheme of the present invention, and non-limiting the present invention, and therefore, protection scope of the present invention is not limited to following embodiment.
See also Fig. 1 to Fig. 6, specify the present invention.
See also Fig. 1, a kind of amplifier that is used to measure high resistant High Pressure Difference sub-probe 1MHz common-mode rejection ratio comprises a pre-amplifier unit 12, a frequency-selecting amplifying unit 13 and two independent direct current supply power voltages, wherein,
Said two independent direct current supply power voltages connect said pre-amplifier unit 12 and said frequency-selecting amplifying unit 13 respectively, are used for carrying out independently-powered respectively to said pre-amplifier unit and said frequency-selecting amplifying unit;
Said pre-amplifier unit 12: be used to provide the prime multiplication factor of the scope of preestablishing, the signal and the noise that will bury in noise amplify together;
Said frequency-selecting amplifying unit 13: connect pre-amplifier unit 12, comprise being designed to the amplifying unit that LC frequency-selective network that the resonance centre frequency is 1MHz and triode are formed, be used for that filtration is obtained the 1MHz useful signal and further amplify.
With reference to Fig. 2, an a kind of example schematic that is used to measure the amplifier of high resistant High Pressure Difference sub-probe 1MHz common-mode rejection ratio.Comprise a pre-amplifier unit, a frequency-selecting amplifying unit and two independent direct current supply power voltage V
1, V
2
Pre-amplifier unit comprises that in this example, divider resistance comprises two R to some divider resistances and a low noise high bandwidth operational amplification circuit
2And R
3
Low noise high bandwidth operational amplification circuit comprises an amplifier input resistance R
0, an amplifier output resistance R
1And a low noise high bandwidth operational amplifier A, amplifier input resistance R
0And amplifier output resistance R
1Be connected with said low noise high bandwidth operational amplifier A negative feedback structure.V
1Be the direct current supply voltage of pre-amplifier unit, R
0With R
1With low noise high bandwidth operational amplifier A through the negative feedback combining structure, make it in wider frequency, have stable multiplication factor.Has big input dynamic range simultaneously.R
2With R
3Be divider resistance, the positive-negative input end that is respectively amplifier provides dc offset voltage.
Frequency-selecting amplifying unit: connect pre-amplifier unit, comprise being designed to the amplifying unit that LC frequency-selective network that the resonance centre frequency is 1MHz and triode are formed, be used for that filtration is obtained the 1MHz useful signal and further amplify.Inductance L in the frequency-selecting amplifying unit
0With capacitor C
0Be combined into frequency-selective network, its resonance frequency is 1MHz, and the equiva lent impedance behind its resonance is as triode T
0Load, with the signal of further amplification 1MHz.Said frequency-selecting amplifying unit also comprises R
4With R
5, R
4With R
5Be divider resistance, said direct current supply voltage passes through R
4With R
5, be triode T
0Dc offset voltage is provided.
Inductance L
0With capacitor C
0Be combined into frequency-selective network on the one hand, its resonance frequency is 1MHz, and the equiva lent impedance behind the resonance is as triode T on the other hand
0Load, further amplify the signal of 1MHz.V
2Direct current supply voltage for the frequency-selecting amplifying unit.
Inductance L
0With capacitor C
0The frequency-selective network of forming, the centre frequency f of its resonance
0Have following formula to obtain:
Wherein require f
0=1MHz is then according to selected capacitor C
0Capacitance, calculate inductance L
0Inductance value.This inductance can turn to inductance value (the about L that wants through with the manual coiling of enamelled wire
0The inductance value of value), in debug process, through changing the elasticity of coiling inductance, the resonance frequency centre frequency that makes frequency-selective network is 1MHz then.
The amplifier that is used to measure high resistant High Pressure Difference sub-probe 1MHz common-mode rejection ratio also comprises input coupling unit 11 and output coupling unit 14; Input coupling unit 11 is provided with the input front end of pre-amplifier unit 12, and said output coupling unit 14 is arranged on the output rear end of frequency-selecting amplifying unit 13.
In this example, input coupling unit 11 adopts input coupling capacitance C
1, output coupling unit 14 adopts output coupling capacitance C
3
Amplifier also comprises the 3rd coupling unit, and it is arranged between pre-amplifier unit 12 and the frequency-selecting amplifying unit 13.In this example, the 3rd coupling unit can adopt two-stage cascade coupling capacitance C
2
Input coupling capacitance C
1Be electrically connected at the input of pre-amplifier unit, two-stage cascade coupling capacitance C
2Be electrically connected between the input of output and frequency-selecting amplifying unit of pre-amplifier unit output coupling capacitance C
3Be electrically connected at the output of frequency-selecting amplifying unit.
With reference to Fig. 3, the present invention provides another kind to be used to measure the amplifier of high resistant High Pressure Difference sub-probe 1MHz common-mode rejection ratio.Negative feedback computing amplifying unit is a low noise high bandwidth operational amplifier among Fig. 2, and negative feedback computing amplifying unit passes through transistor amplifier among Fig. 3.Equally, this amplifying unit is through triode T
1And resistance R
1Combination.
The present invention provides the method for measurement of another kind of high resistant High Pressure Difference sub-probe 1MHz Frequency point common-mode rejection ratio.
With reference to Fig. 4; For lower attenuation coefficient 1/100 part; Make the positive and negative input of the paramount impedance contrast sub-probe of high impedance standard source FLUKE 5700A output 1MHz sine wave signal earlier, its output level maximum can reach 20V, on digital oscilloscope, directly reads differential mode voltage peak-to-peak value measurement result V
D1
With reference to Fig. 5; Then the positive-negative input end short circuit of high impedance difference detector; High impedance standard source FLUKE 5700A output is remained unchanged, input between the short circuit input and public ground of high impedance difference detector, on digital oscilloscope, directly read common-mode voltage peak-to-peak value measurement result V
C1, calculate the common-mode rejection ratio CMRR of lower attenuation coefficient 1/100 part
1=20 * lg (V
D1/ V
C1);
For high attenuation coefficient 1/1000 part, record 1MHz differential mode voltage peak-to-peak value measuring voltage V as a result earlier
D2
With reference to Fig. 6, be arranged on lower attenuation coefficient 1/100 part, amplifier, the common-mode voltage peak-to-peak value measurement result V after obtaining amplifying are inserted in high resistant High Pressure Difference sub-probe rear end
Cg1, according to before obtain without amplifying common-mode voltage peak-to-peak value measurement result V
C1, can calculate the actual multiplication factor A=V of this amplifier corresponding to this high resistant High Pressure Difference sub-probe
Cg1/ V
C1
Be arranged on high attenuation coefficient 1/1000 part, amplifier, the common-mode voltage peak-to-peak value measurement result V after obtaining amplifying are inserted in high resistant High Pressure Difference sub-probe rear end
Cg2Thereby calculate the actual common-mode voltage peak-to-peak value measurement result V of 1MHz frequency place
C2=V
Cg2/ A;
Calculate the actual common-mode rejection ratio CMRR of this probe at high attenuation coefficient 1/1000 part 1MHz place
2=20 * lg (V
D2/ V
C2).
The present invention is compared to prior art, and its advantage is: can amplify the amplifier of the 1MHz common mode output signal that buries in noise targetedly, thereby realize the measurement of high resistant High Pressure Difference sub-probe 1MHz Frequency point common-mode rejection ratio smoothly.
More than disclosedly be merely a specific embodiment of the present invention, but the present invention is not limited thereto, any those skilled in the art can think variation, all should drop in protection scope of the present invention.
Claims (9)
1. an amplifier that is used to measure high resistant High Pressure Difference sub-probe 1MHz common-mode rejection ratio is characterized in that, comprises a pre-amplifier unit, a frequency-selecting amplifying unit and two independent direct current supply power voltages, wherein,
Said two independent direct current supply power voltages connect said pre-amplifier unit and said frequency-selecting amplifying unit respectively, are used for carrying out independently-powered respectively to said pre-amplifier unit and said frequency-selecting amplifying unit;
Said pre-amplifier unit: be used to provide the prime multiplication factor of the scope of preestablishing, the signal and the noise that will bury in noise amplify together;
Said frequency-selecting amplifying unit: connect pre-amplifier unit, comprise being designed to the amplifying unit that LC frequency-selective network that the resonance centre frequency is 1MHz and triode are formed, be used for that filtration is obtained the 1MHz useful signal and further amplify.
2. the amplifier that is used to measure high resistant High Pressure Difference sub-probe 1MHz common-mode rejection ratio as claimed in claim 1 is characterized in that,
Inductance L in the said frequency-selecting amplifying unit
0With capacitor C
0Be combined into frequency-selective network, its resonance frequency is 1MHz, and the equiva lent impedance behind its resonance is as triode T
0Load, with the signal of further amplification 1MHz.
3. the amplifier that is used to measure high resistant High Pressure Difference sub-probe 1MHz common-mode rejection ratio as claimed in claim 2 is characterized in that said frequency-selecting amplifying unit also comprises R
4With R
5, R
4With R
5Be divider resistance, said direct current supply voltage passes through R
4With R
5, be triode T
0Dc offset voltage is provided.
4. the amplifier that is used to measure high resistant High Pressure Difference sub-probe 1MHz common-mode rejection ratio as claimed in claim 1 is characterized in that,
Said pre-amplifier unit comprises negative feedback computing amplifying unit, R
0With R
1, R
0With R
1With negative feedback computing amplifying unit through the negative feedback combining structure, make it in wider frequency, have stable multiplication factor.
5. the amplifier that is used to measure high resistant High Pressure Difference sub-probe 1MHz common-mode rejection ratio as claimed in claim 4 is characterized in that negative feedback computing amplifying unit is low noise high bandwidth operational amplifier or transistor amplifier.
6. the amplifier that is used to measure high resistant High Pressure Difference sub-probe 1MHz common-mode rejection ratio as claimed in claim 4 is characterized in that said pre-amplifier unit also comprises R
2With R
3Be divider resistance, the positive-negative input end that is respectively negative feedback computing amplifying unit provides dc offset voltage.
7. the amplifier that is used to measure high resistant High Pressure Difference sub-probe 1MHz common-mode rejection ratio as claimed in claim 1; It is characterized in that; Also comprise input coupling unit, output coupling unit; Said input coupling unit is provided with the input front end of pre-amplifier unit, and said output coupling unit is arranged on the output rear end of frequency-selecting amplifying unit.
8. measure the amplifier of high resistant High Pressure Difference sub-probe 1MHz common-mode rejection ratio like claim 1 or 7 described being used to, it is characterized in that also comprise the 3rd coupling unit, it is arranged between pre-amplifier unit and the frequency-selecting amplifying unit.
9. the method for measurement of a high resistant High Pressure Difference sub-probe 1MHz Frequency point common-mode rejection ratio is characterized in that:
For lower attenuation coefficient 1/100 part; Make the positive and negative input of the paramount impedance contrast sub-probe of high impedance standard source FLUKE 5700A output 1MHz sine wave signal earlier; Its output level maximum can reach 20V, on digital oscilloscope, directly reads differential mode voltage peak-to-peak value measurement result V
D1Then the positive-negative input end short circuit of high impedance difference detector; High impedance standard source FLUKE 5700A output is remained unchanged, input between the short circuit input and public ground of high impedance difference detector, on digital oscilloscope, directly read common-mode voltage peak-to-peak value measurement result V
C1, calculate the common-mode rejection ratio CMRR of lower attenuation coefficient 1/100 part
1=20 * lg (V
D1/ V
C1);
For high attenuation coefficient 1/1000 part, record 1MHz differential mode voltage peak-to-peak value measuring voltage V as a result earlier
D2, being arranged on lower attenuation coefficient 1/100 part, amplifier, the common-mode voltage peak-to-peak value measurement result V after obtaining amplifying are inserted in high resistant High Pressure Difference sub-probe rear end
Cg1, according to before obtain without amplifying common-mode voltage peak-to-peak value measurement result V
C1, can calculate the actual multiplication factor A=V of this amplifier corresponding to this high resistant High Pressure Difference sub-probe
Cg1/ V
C1, being arranged on high attenuation coefficient 1/1000 part, amplifier, the common-mode voltage peak-to-peak value measurement result V after obtaining amplifying are inserted in high resistant High Pressure Difference sub-probe rear end
Cg2Thereby calculate the actual common-mode voltage peak-to-peak value measurement result V of 1MHz frequency place
C2=V
Cg2/ A calculates the actual common-mode rejection ratio CMRR of this probe at high attenuation coefficient 1/1000 part 1MHz place
2=20 * lg (V
D2/ V
C2).
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210309260.8A CN102790589B (en) | 2012-08-27 | 2012-08-27 | Amplifier for measuring 1MHz common mode rejection ratios of high-resistance high-voltage differential probe |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210309260.8A CN102790589B (en) | 2012-08-27 | 2012-08-27 | Amplifier for measuring 1MHz common mode rejection ratios of high-resistance high-voltage differential probe |
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| CN105301534A (en) * | 2014-05-27 | 2016-02-03 | 上海辰光医疗科技股份有限公司 | Preamplifier for magnetic resonance imaging radio-frequency coils |
| TWI623757B (en) * | 2017-09-27 | 2018-05-11 | Chipone Technology Beijing Co Ltd | Detection device |
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| TWI623757B (en) * | 2017-09-27 | 2018-05-11 | Chipone Technology Beijing Co Ltd | Detection device |
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| Publication number | Publication date |
|---|---|
| CN102790589B (en) | 2015-04-29 |
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