CN102323042A - Method for accurately measuring reflectivity of weak fiber bragg grating - Google Patents
Method for accurately measuring reflectivity of weak fiber bragg grating Download PDFInfo
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- CN102323042A CN102323042A CN201110264452A CN201110264452A CN102323042A CN 102323042 A CN102323042 A CN 102323042A CN 201110264452 A CN201110264452 A CN 201110264452A CN 201110264452 A CN201110264452 A CN 201110264452A CN 102323042 A CN102323042 A CN 102323042A
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Abstract
The invention discloses a method accurately measuring reflectivity of a weak fiber bragg grating. The method comprises the steps of: 1, connecting a broadband light source with a port 1 of a 3dB coupler; 2, connecting a port 2 of the 3dB coupler with one end of the weak fiber bragg grating; 3, connecting a port 3 of the 3dB coupler with a spectrometer; 4, cutting the other end of the weak fiber bragg grating to obtain a flat end face; and 5, setting the resolution ratio of the spectrometer, scanning wavelength of the weak fiber bragg grating by the spectrometer to obtain a reflection spectrum of the weak fiber bragg grating, and calculating the reflectivity of the weak fiber bragg grating according to the height of a reflection peak in the spectrum.
Description
Technical field
The present invention relates to the spectral measurement field; Particularly accurately measure the method for the fine optical grating reflection rate of the low light level; This method adopts spectrometer and wideband light source to combine, and through the special processing to the fiber grating end face, can realize the accurate measurement to the fine optical grating reflection rate of the low light level.
Background technology
In fields such as Fibre Optical Sensor, fiber laser, optical fiber communications, fiber grating is widely used as conventional optical passive component.According to different demands corresponding dissimilar fiber gratings; Need cut the toe bragg grating like common sensing; The fiber grating that need have antiradar reflectivity based on the interfere type Fibre Optical Sensor of fiber grating; Distributed feedback optical fiber laser needs phase-shifted grating, and distributed-reflector laser needs the grating equity of a pair of high reflectance and antiradar reflectivity coupling.In these were used, it all was important key index that rejection ratio etc. is touched on fiber grating reflectivity, three dB bandwidth, limit, and wherein the measurement of reflectivity is more basic.The size of accurate measurement of reflectivity is most important for optical design.
For the measurement of fiber grating reflectivity, generally adopt following three kinds of methods:
One, adopt tunable laser and light power meter, the length scanning through tunable laser comes measuring optical fiber grating transmission spectrum and then calculates reflectivity.This method operation relative complex, the reflectivity range that can accurately measure is about 20%-99.9999%, and the wavelength resolution minimum can reach 0.1pm, is suitable for the measurement of high reflection fiber grating.
Two, adopt wideband light source and spectrometer, calculate reflectivity through single measurement fiber grating transmission spectrum.This method is simple to operation, and the reflectivity range that can accurately measure is about 20%-99.99%, and the wavelength resolution minimum can reach 10pm, is widely used in the measurement of conventional fiber grating.
Three, adopt tunable laser and spectrometer, come measuring optical fiber grating transmission spectrum and then calculate reflectivity through the synchronous waves long scan.This method operation is the most complicated; But can accurate measurement of reflectivity wider, be about 20%-99.99999%, the wavelength resolution minimum can reach 0.1pm; Be suitable for high especially reflection and have the measurement of meticulous wavelength characteristic fiber grating, like phase-shifted grating etc.
Above-mentioned three kinds of methods all are based on the size that transmission spectrum comes measurement of reflectivity, and computing formula does
T wherein
DBThe degree of depth for grating transmission spectrum two-story valley.The calculated value of reflectivity is along with T
DBReduce and reduce.Because wideband light source itself has certain uneven degree and power swing, when adopting this method to measure low light level fibre grating, will introduce than mistake, be difficult to accurate measuring optical fiber grating reflection rate.For example, be 10% fiber grating for reflectivity, T
DBValue should be 0.46dB, when the output power of wideband light source exist+/-during the shake of 0.1dB, T
DBMeasured value exist+/-fluctuation of 0.1dB, according to the aforementioned calculation formula, the reflectance value that will cause calculating changes to 8.0% from 12.1%, relative error is respectively 20.1% and 20%.
Summary of the invention
Fundamental purpose of the present invention is to provide a kind of method that can accurately measure the fine optical grating reflection rate of the low light level, composes through the measuring optical fiber grating reflection and realizes albedo measurement, reduces the measuring error of existing method.
For achieving the above object, the technical scheme that the present invention adopts is following:
The method of the fine optical grating reflection rate of a kind of accurate measurement low light level, this method comprises:
Step 1: wideband light source is connected with the port one of three-dB coupler;
Step 2: fine grating one end of the port 2 and the low light level of three-dB coupler is connected;
Step 3: the port 3 of three-dB coupler is connected with spectrometer;
Step 4: the other end of cutting optical fibre grating obtains flat end face;
Step 5: the resolution of spectrometer is set, and spectrometer carries out length scanning to the fine grating of the low light level, obtains the fine grating reflection spectrum of the low light level, calculates the fine grating reflection rate of the low light level according to the height of reflection peak in the spectrum.
Wherein this wideband light source is spontaneous radiation light source and emitting semiconductor diode.
Wherein the flat end face of the fine grating of this low light level is realized by the fiber cut cutter, and cutting angle is less than 0.5 degree.
Wherein the value of the resolution of this spectrometer is less than the three dB bandwidth of the fine grating of the low light level.
The invention has the advantages that, overcome tradition and measured the big problem of the fine optical grating reflection rate error of the low light level based on transmission spectrum, can accurate measurement of reflectivity less than the fine grating of 20% the low light level, remedy traditional measurement method in the deficiency of measuring on the antiradar reflectivity fiber grating.
Description of drawings
For further specifying concrete technology contents of the present invention, below in conjunction with instance and accompanying drawing the present invention is done a detailed description, wherein:
Fig. 1 is the process flow diagram synoptic diagram of the method for the fine optical grating reflection rate of the accurate measurement low light level provided by the invention;
Fig. 2 is the index path synoptic diagram of the method for the fine optical grating reflection rate of the accurate measurement low light level provided by the invention;
Fig. 3 is according to the embodiment of the invention, the fine optical grating reflection spectrogram of the low light level that records;
Fig. 4 is the fine grating transmission spectrum of the low light level that adopts traditional wideband light source and the spectrometer method of combining to record.
Embodiment
Please with reference to Fig. 1 and Fig. 2, the present invention provides the method for the fine optical grating reflection rate of a kind of accurate measurement low light level, and this method comprises:
Step 1: the port one of wideband light source 1 with three-dB coupler 2 is connected, and this wideband light source 1 is spontaneous radiation light source and emitting semiconductor diode;
Step 2: fine grating 3 one ends of the port 2 and the low light level of three-dB coupler 2 are connected;
Step 3: the port 3 of three-dB coupler 2 is connected with spectrometer 4;
Step 4: the other end of cutting optical fibre grating 3, obtain flat end face, the flat end face of the fine grating 3 of this low light level is realized that by the fiber cut cutter cutting angle is less than 0.5 degree;
Step 5: the resolution that spectrometer 4 is set; The value of the resolution of this spectrometer 4 is less than the three dB bandwidth of the fine grating of the low light level; The fine grating 3 of 4 pairs of low light levels of spectrometer carries out length scanning, obtains the reflectance spectrum of the fine grating 3 of the low light level, calculates the reflectivity of the fine grating 3 of the low light level according to the height of reflection peak in the spectrum.
Please with reference to Fig. 2; Fig. 2 is the index path of the method for the fine optical grating reflection rate of the accurate measurement low light level provided by the invention; Wideband light source 1 links to each other with the port one of three-dB coupler 2, and the port 2 of three-dB coupler 2 is connected with an end of the fine grating 3 of the low light level, and the port 3 of three-dB coupler is connected with spectrometer 4.
Please refer to Fig. 3, Fig. 3 is according to the embodiment of the invention, the fine optical grating reflection spectrum of the low light level that records, and embodiment specifically may further comprise the steps:
Step 1: wideband light source (the desk-top ASE light source of bright light science and technology) links to each other with the port one of general commercial three-dB coupler;
Step 2: the port 2 of three-dB coupler is linked to each other with an end of the fine grating of the low light level of self manufacture;
Step 3: the port 3 and the spectrometer 4 (ando AQ6317B) of three-dB coupler are connected;
Step 4: adopt the other end of the fine grating of fiber cut cutter (rattan storehouse CT30) the cutting low light level, (rattan storehouse 50S) observes the fiber end face situation through heat sealing machine, and having obtained cutting angle is the flat end face of 0.1 degree.This smooth fiber end face is 4% for the reflectivity of light wave in the 1530nm-1550nm wavelength coverage, for measuring the fine grating reflection rate of the low light level benchmark is provided;
The resolution that spectrometer is set in the step 3 is 10pm, and much smaller than the three dB bandwidth (about 100pm) of the fine grating of the low light level, ordinate amplitude and the horizontal ordinate to spectrometer is provided with according to actual needs, records the reflectance spectrum (Fig. 3) of fiber grating, according to formula
Calculating the fine grating reflection rate of this low light level is 10.28%, wherein R
DB=4.1dB is the height of reflection peak, even exist+/-deviation of reading of 0.1dB, the relative error of reflectivity also has only 2.3% and 2.2%.In this step, the setting of spectrometer resolution is very important for the fine grating reflection rate of the correct measurement low light level, requires the resolution of spectrometer to be less than the three dB bandwidth of fiber grating.
For the advantage of the fine optical grating reflection rate of the low light level provided by the invention measuring method is described, Fig. 4 has provided the fine grating transmission spectrum of the low light level that adopts traditional wideband light source and the spectrometer method of combining to record, according to formula
Calculate the fine grating reflection rate of this low light level, wherein T
DBHeight for the transmission spectrum two-story valley.Because T
DBBe worth lessly, can't accurately read, and then can't accurately obtain the fine grating reflection rate of this low light level, can only provide T
DBThe big probable value of reflectivity corresponding during ≈ 0.4dB is 8.8%, for+/-deviation of reading of 0.1dB, the relative error of reflectivity is respectively 22.3% and 23.9%.Through contrast, will find that the fine optical grating reflection rate of the low light level provided by the invention measuring method will be far superior to classic method on degree of accuracy.
Above-described specific embodiment; The object of the invention, technical scheme and beneficial effect have been carried out further explain, and institute it should be understood that the above is merely specific embodiment of the present invention; Be not limited to the present invention; All within spirit of the present invention and principle, any modification of being made, be equal to replacement, improvement etc., all should be included within protection scope of the present invention.
Claims (4)
1. method of accurately measuring the fine optical grating reflection rate of the low light level, this method comprises:
Step 1: wideband light source is connected with the port one of three-dB coupler;
Step 2: fine grating one end of the port 2 and the low light level of three-dB coupler is connected;
Step 3: the port 3 of three-dB coupler is connected with spectrometer;
Step 4: the other end of cutting optical fibre grating obtains flat end face;
Step 5: the resolution of spectrometer is set, and spectrometer carries out length scanning to the fine grating of the low light level, obtains the fine grating reflection spectrum of the low light level, calculates the fine grating reflection rate of the low light level according to the height of reflection peak in the spectrum.
2. the method for the fine optical grating reflection rate of the accurate measurement low light level according to claim 1, wherein this wideband light source is spontaneous radiation light source and emitting semiconductor diode.
3. the method for the fine optical grating reflection rate of the accurate measurement low light level according to claim 1, wherein the flat end face of the fine grating of this low light level is realized by the fiber cut cutter, cutting angle is less than 0.5 degree.
4. the method for the fine optical grating reflection rate of the accurate measurement low light level according to claim 1, wherein the value of the resolution of this spectrometer is less than the three dB bandwidth of the fine grating of the low light level.
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102829958A (en) * | 2012-08-10 | 2012-12-19 | 中国电子科技集团公司第四十一研究所 | Method for accurately measuring reflectivity of fiber Bragg grating |
| CN103471812A (en) * | 2013-07-15 | 2013-12-25 | 武汉理工大学 | Weak-grating detection device and detection method thereof |
| CN104792502A (en) * | 2015-04-29 | 2015-07-22 | 重庆大学 | Weak fiber grating reflectivity measurement method |
| CN107764514A (en) * | 2016-08-22 | 2018-03-06 | 南京理工大学 | A kind of low reflective grid reflectivity device for accurately measuring of high-capacity optical fiber laser |
| CN117268708A (en) * | 2023-11-21 | 2023-12-22 | 苏州英谷激光有限公司 | Parameter testing method and device for reflection spectrum flat-top type polarization-preserving chirped fiber grating |
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| CN101476900A (en) * | 2009-01-19 | 2009-07-08 | 冷劲松 | Time division multiplexing optical fiber sensing method and apparatus |
| CN101520346A (en) * | 2009-04-17 | 2009-09-02 | 电子科技大学 | Fiber bragg grating temperature detection system |
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| JP2006084292A (en) * | 2004-09-15 | 2006-03-30 | Kansai Electric Power Co Inc:The | Rotor physical quantity measuring method, and rotor physical quantity measuring device |
| CN101479577A (en) * | 2006-05-23 | 2009-07-08 | Itf实验室 | Method for monitoring and measuring optical properties of device in polarization maintaining fibers by using reference fiber Bragg grating and fiber components manufactured thereby |
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN102829958A (en) * | 2012-08-10 | 2012-12-19 | 中国电子科技集团公司第四十一研究所 | Method for accurately measuring reflectivity of fiber Bragg grating |
| CN103471812A (en) * | 2013-07-15 | 2013-12-25 | 武汉理工大学 | Weak-grating detection device and detection method thereof |
| CN103471812B (en) * | 2013-07-15 | 2016-12-28 | 武汉理工大学 | Weak-grating detection device and detection method thereof |
| CN104792502A (en) * | 2015-04-29 | 2015-07-22 | 重庆大学 | Weak fiber grating reflectivity measurement method |
| CN104792502B (en) * | 2015-04-29 | 2017-12-08 | 重庆大学 | A kind of method for measuring reflectivity of weak fiber bragg grating |
| CN107764514A (en) * | 2016-08-22 | 2018-03-06 | 南京理工大学 | A kind of low reflective grid reflectivity device for accurately measuring of high-capacity optical fiber laser |
| CN117268708A (en) * | 2023-11-21 | 2023-12-22 | 苏州英谷激光有限公司 | Parameter testing method and device for reflection spectrum flat-top type polarization-preserving chirped fiber grating |
| CN117268708B (en) * | 2023-11-21 | 2024-02-09 | 苏州英谷激光有限公司 | Parameter testing method and device for reflection spectrum flat-top type polarization-preserving chirped fiber grating |
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Application publication date: 20120118 |