CN102221450A - Tracking-pointing deviation measurement device for laser system - Google Patents
Tracking-pointing deviation measurement device for laser system Download PDFInfo
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- CN102221450A CN102221450A CN 201110096311 CN201110096311A CN102221450A CN 102221450 A CN102221450 A CN 102221450A CN 201110096311 CN201110096311 CN 201110096311 CN 201110096311 A CN201110096311 A CN 201110096311A CN 102221450 A CN102221450 A CN 102221450A
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Abstract
The invention discloses a tracking-pointing deviation measurement device for a laser system, comprising a diffuse reflection screen, a beacon source, a small hole, a narrowband filter plate, an imaging lens and a CCD (charge coupled device). Lasers emitted by the laser system are in vertical normal incidence on the diffuse reflection screen of a target; the small hole is arranged at the central position of the diffuse reflection screen; the beacon source is arranged right behind the small hole; the laser system tracks the beacon source behind the small hole and emits the lasers by aiming at the beacon source; the narrowband filter plate, the imaging lens and the CCD are arranged in sequence at the positions where incident lasers and scattering lasers form an angle of 1 to 10 degrees; an imaging system consisting of the CCD and the imaging lens forms a clear and whole image on a facula on the diffusion reflection screen; and a data processing system calculates the position deviation of the mass center of the facula and the small hole, thus obtaining the tracking-pointing deviation of the laser system. The tracking-pointing deviation measurement device for the laser system has low cost and a simple structure and can be used conveniently.
Description
Technical field
The invention belongs to laser system optical parameter measurement field, be specifically related to a kind of laser system with taking aim at the deviation measurement mechanism.Be used for laser system, follow with CCD Laser Measurement system at target spot and take aim at deviation.
Background technology
In laser system, the important indicator that deviation is a measurement laser system performance is taken aim in following of laser system.At present, known laser system is made up of photodetection target, data handling system, beacon light source with taking aim at the deviation measurement mechanism.The beacon light source places photodetection target side, and laser system is followed the tracks of the beacon light source, and emission laser radiation photodetection target, calculates laser system with taking aim at deviation by data handling system.But this kind measuring method can only be measured the laser beam position after the biasing, and the result of measurement has comprised with taking aim at the sum of errors biased error, and directly following of Laser Measurement system taken aim at deviation.And the measurement mechanism complex structure, volume and weight is bigger, uses inconvenience, and cost is also higher.
Summary of the invention
For the deficiency that overcomes the prior art complex structure, uses inconvenience and can not directly measure, the invention provides a kind of measurement mechanism of taking aim at precision of following in the direct Laser Measurement of target spot system.
Laser system of the present invention is with taking aim at the deviation measurement mechanism, and characteristics are, described measurement mechanism places the target spot of laser system, and described measurement mechanism comprises narrow band pass filter, imaging lens, CCD, data handling system, beacon light source, diffuse reflection screen, aperture.The diffuse reflection screen is with respect to positive vertical placement of the emission laser of laser system, and centre-height is identical with the centre-height of the emission laser of laser system.Diffuse reflection screen center is provided with an aperture, and the beacon light source places the aperture dead astern.The beacon light source of laser system after to aperture followed the tracks of, and aiming beacon light emitted laser, emitted laser impinges perpendicularly on the diffuse reflection screen of target spot, narrow band pass filter, imaging lens, the angle that CCD is arranged on the incident laser of diffuse reflection screen and scattering laser is 1 ° to 10 ° position, narrow band pass filter is connected with imaging lens by screw thread, guarantee only to have the light of the emission optical maser wavelength of laser system to enter CCD, imaging lens directly is connected with CCD, imaging lens becomes the picture of complete display with the hot spot that the imaging system that CCD forms is shielded diffuse reflection, take aim at deviation thereby the position deviation of data handling system calculating facula mass center and aperture obtains following of laser system.
The emission laser that described diffuse reflection screen is of a size of laser system (1) arrives 1.1 times to 10 times of spot size on the diffuse reflection screen of target spot.
Described hole diameter is 1/50 to 1/20 of the spot diameter on the laser system emitted laser arrival diffuse reflection screen.
The detection sensitivity of described beacon light-source brightness and laser system is complementary.
The detecting band of described beacon light source spectral characteristic and laser system is complementary.
It is pointolite that described beacon light source passes through behind the aperture.
Described CCD response wave length and laser system emission optical maser wavelength are complementary.
The emission optical maser wavelength of passing through wavelength and laser system of described narrow band pass filter is complementary.
Described beacon light source centre-height is identical with diffuse reflection screen centre-height.
Described CCD centre-height is identical with diffuse reflection screen centre-height.
Laser system of the present invention in laser system, is taken aim at deviation at target spot with following of CCD Laser Measurement system with taking aim at the deviation measurement mechanism.The vertical normal incidence of laser system emitted laser is to the diffuse reflection screen of target spot, diffuse reflection screen center is provided with an aperture, the beacon light source places the aperture dead astern, the beacon light source of laser system after to aperture followed the tracks of, and aiming beacon light emitted laser, narrow band pass filter, imaging lens, the angle that CCD is arranged on the incident laser of diffuse reflection screen and scattering laser is 1 ° to 10 ° position, narrow band pass filter directly is connected with imaging lens, guarantee only to have the light of laser system emitted laser wavelength to enter CCD, CCD becomes the picture of complete display with the hot spot that the imaging system that imaging lens is formed is shielded diffuse reflection, data handling system is calculated the position deviation of facula mass center and aperture, obtains following of laser system and takes aim at deviation.Laser system of the present invention is with taking aim at the deviation measurement mechanism, and directly following of Laser Measurement system taken aim at deviation, and equipment cost is cheap, simple in structure, and volume is little in light weight, is easy to carry about with one, carries and launch, and is easy for operation.
Description of drawings
Fig. 1 is that laser system of the present invention is with the structural representation of taking aim at the deviation measurement mechanism.
Among the figure, 1. 5. beacon light sources, 6. scattering lasers, 7. narrow band pass filters, 8. imaging lens 9.CCD, 10. data handling systems are shielded in 4. diffuse reflections of laser system 2. incident lasers 3. apertures.
Embodiment
The invention will be further described below in conjunction with accompanying drawing.
Embodiment
Fig. 1 is that laser system of the present invention is with taking aim at deviation measurement mechanism structural representation.Among Fig. 1, laser system of the present invention comprises aperture 3, diffuse reflection screen 4, beacon light source 5, narrow band pass filter 7, imaging lens 8, CCD9 and data handling system 10 with taking aim at the deviation measurement mechanism.Laser system of the present invention places the laser system target spot that laser system is measured with taking aim at deviation with taking aim at the deviation measurement mechanism.Target spot is 2km apart from the distance of laser system 1.The emission laser that diffuse reflection screen 4 is of a size of laser system 1 arrive 10 times of spot size on the diffuse reflections screen 4 of target spot.Diffuse reflection is shielded 4 centers one aperture 3 is set, hole diameter be on the diffuse reflection screen 4 the reception spot diameter 1/20.Beacon light source 5 places aperture 3 dead asterns, and narrow band pass filter 7 directly is connected with imaging lens 8 by screw thread, guarantees only to have the laser of scattering laser 6 wavelength to enter CCD9.Imaging lens 8 is by directly being connected with CCD with screw thread that the CCD9 interface is complementary.Imaging lens 8 and CCD9 form imaging system, regulate the position of imaging system, and imaging lens 8 is 10 meters to the distance of diffuse reflection screen 4, and the angle α of incident laser 2 and scattering laser 6 is 7 °.The incident laser 2 vertical normal incidences of laser system 1 emission are to diffuse reflection screen 4, the imaging system that imaging lens 8 and CCD9 form to the laser facula on the diffuse reflection screen 4 become complete clearly as, data handling system is carried out data processing to imaging facula, calculates following of laser system and takes aim at deviation.
Claims (10)
1. a laser system is with taking aim at the deviation measurement mechanism, it is characterized in that: described measurement mechanism comprises aperture (3), diffuse reflection screen (4), beacon light source (5), narrow band pass filter (7), imaging lens (8), CCD(9), data handling system (10), diffuse reflection screen (4) places the laser system front, diffuse reflection screen (4) center is provided with an aperture (3), beacon light source (5) places aperture (3) dead astern, is disposed with narrow band pass filter (7), imaging lens (8) and CCD(9) on the light path of scattering laser (6).
2. laser system as claimed in claim 1 is characterized in that with taking aim at the deviation measurement mechanism: the emission laser that described diffuse reflection screen (4) is of a size of laser system (1) arrives 1.1 times to 10 times of spot size on the diffuse reflection screen (4) of target spot.
3. laser system as claimed in claim 1 is characterized in that with taking aim at the deviation measurement mechanism: described aperture (3), diffuse reflection screen (4), beacon light source (5), narrow band pass filter (7), imaging lens (8), CCD(9) centre-height identical with the centre-height of laser system (1).
4. laser system as claimed in claim 1 is characterized in that with taking aim at the deviation measurement mechanism: described diffuse reflection screen (4) is with respect to positive vertical placement of the emission laser of laser system (1).
5. laser system as claimed in claim 1 is with taking aim at the deviation measurement mechanism, and it is characterized in that: the detection sensitivity of described beacon light source (5) brightness and laser system (1) is complementary.
6. laser system as claimed in claim 1 is with taking aim at the deviation measurement mechanism, and it is characterized in that: the detecting band of described beacon light source (5) spectral characteristic and laser system (1) is complementary.
7. laser system as claimed in claim 1 is characterized in that with taking aim at the deviation measurement mechanism: described aperture (3) diameter be laser system (1) emitted laser arrive spot diameter on the diffuse reflection screen (4) 1/50 to 1/20.
8. laser system as claimed in claim 1 is with taking aim at the deviation measurement mechanism, and it is characterized in that: the emission optical maser wavelength of passing through wavelength and laser system (1) of described narrow band pass filter (7) is complementary.
9. laser system as claimed in claim 1 is with taking aim at the deviation measurement mechanism, and it is characterized in that: described CCD(9) the emission optical maser wavelength of response wave length and laser system (1) is complementary.
10. laser system as claimed in claim 1 is characterized in that: described narrow band pass filter (7), imaging lens (8), CCD(9 with taking aim at the deviation measurement mechanism) the angle α that is arranged on incident laser (2) and scattering laser (6) is 1 ° to 10 ° position.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201110096311 CN102221450B (en) | 2011-04-18 | 2011-04-18 | Tracking-pointing deviation measurement device for laser system |
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| Application Number | Priority Date | Filing Date | Title |
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| CN 201110096311 CN102221450B (en) | 2011-04-18 | 2011-04-18 | Tracking-pointing deviation measurement device for laser system |
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| CN102221450A true CN102221450A (en) | 2011-10-19 |
| CN102221450B CN102221450B (en) | 2013-01-02 |
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| CN 201110096311 Expired - Fee Related CN102221450B (en) | 2011-04-18 | 2011-04-18 | Tracking-pointing deviation measurement device for laser system |
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Cited By (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102735431A (en) * | 2012-06-21 | 2012-10-17 | 中国兵器工业第二0五研究所 | Method for measuring sight line stabilizing accuracy of photoelectric sight-stabilizing system |
| CN104034511A (en) * | 2014-06-12 | 2014-09-10 | 中国科学院上海技术物理研究所 | Detecting method for photoelectric tracking performance |
| CN107367721A (en) * | 2017-07-31 | 2017-11-21 | 天津大学 | A kind of pose measuring apparatus for dynamic pose measurement |
| CN108152013A (en) * | 2017-12-28 | 2018-06-12 | 西安应用光学研究所 | Electro-optical system pointing accuracy measuring device light path adjusting process |
| CN110455498A (en) * | 2019-07-04 | 2019-11-15 | 湖北航天技术研究院总体设计所 | A kind of composite shaft pointing system performance testing device and test method |
| CN110806307A (en) * | 2019-11-19 | 2020-02-18 | 中国兵器装备集团自动化研究所 | Method for rapidly detecting stability precision of photoelectric sight-stabilizing system |
| CN111336983A (en) * | 2019-12-24 | 2020-06-26 | 哈尔滨新光光电科技股份有限公司 | Dynamic tracking and aiming method and system for optical system |
| CN112013953A (en) * | 2020-07-09 | 2020-12-01 | 北京工业大学 | Light beam directivity deviation calculation system of laser device bar |
| CN114235149A (en) * | 2021-11-30 | 2022-03-25 | 中国科学院合肥物质科学研究院 | Laser measurement system and method based on CCD reflection imaging method |
| CN116147891A (en) * | 2023-01-04 | 2023-05-23 | 北京东方锐镭科技有限公司 | Laser aiming precision measuring equipment |
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| EP0893704A2 (en) * | 1997-07-25 | 1999-01-27 | TRW Inc. | Imaging system with optical filter for scattered laser radiation |
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Cited By (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102735431B (en) * | 2012-06-21 | 2014-11-05 | 中国兵器工业第二0五研究所 | Method for measuring sight line stabilizing accuracy of photoelectric sight-stabilizing system |
| CN102735431A (en) * | 2012-06-21 | 2012-10-17 | 中国兵器工业第二0五研究所 | Method for measuring sight line stabilizing accuracy of photoelectric sight-stabilizing system |
| CN104034511A (en) * | 2014-06-12 | 2014-09-10 | 中国科学院上海技术物理研究所 | Detecting method for photoelectric tracking performance |
| CN104034511B (en) * | 2014-06-12 | 2016-03-30 | 中国科学院上海技术物理研究所 | A kind of photoelectric tracking method for testing performance |
| CN107367721A (en) * | 2017-07-31 | 2017-11-21 | 天津大学 | A kind of pose measuring apparatus for dynamic pose measurement |
| CN107367721B (en) * | 2017-07-31 | 2023-06-13 | 天津大学 | Pose measuring device for dynamic pose measurement |
| CN108152013A (en) * | 2017-12-28 | 2018-06-12 | 西安应用光学研究所 | Electro-optical system pointing accuracy measuring device light path adjusting process |
| CN110455498A (en) * | 2019-07-04 | 2019-11-15 | 湖北航天技术研究院总体设计所 | A kind of composite shaft pointing system performance testing device and test method |
| CN110806307B (en) * | 2019-11-19 | 2021-05-04 | 中国兵器装备集团自动化研究所 | Method for rapidly detecting stability precision of photoelectric sight-stabilizing system |
| CN110806307A (en) * | 2019-11-19 | 2020-02-18 | 中国兵器装备集团自动化研究所 | Method for rapidly detecting stability precision of photoelectric sight-stabilizing system |
| CN111336983A (en) * | 2019-12-24 | 2020-06-26 | 哈尔滨新光光电科技股份有限公司 | Dynamic tracking and aiming method and system for optical system |
| CN112013953A (en) * | 2020-07-09 | 2020-12-01 | 北京工业大学 | Light beam directivity deviation calculation system of laser device bar |
| CN112013953B (en) * | 2020-07-09 | 2023-06-20 | 北京工业大学 | Beam directivity deviation calculation system of laser bar |
| CN114235149A (en) * | 2021-11-30 | 2022-03-25 | 中国科学院合肥物质科学研究院 | Laser measurement system and method based on CCD reflection imaging method |
| CN114235149B (en) * | 2021-11-30 | 2024-02-27 | 中国科学院合肥物质科学研究院 | Laser measurement system and method based on CCD reflection imaging method |
| CN116147891A (en) * | 2023-01-04 | 2023-05-23 | 北京东方锐镭科技有限公司 | Laser aiming precision measuring equipment |
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| CN102221450B (en) | 2013-01-02 |
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