CN102183491A - Detecting device for internal structure of jewelry - Google Patents
Detecting device for internal structure of jewelry Download PDFInfo
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- CN102183491A CN102183491A CN2011100463692A CN201110046369A CN102183491A CN 102183491 A CN102183491 A CN 102183491A CN 2011100463692 A CN2011100463692 A CN 2011100463692A CN 201110046369 A CN201110046369 A CN 201110046369A CN 102183491 A CN102183491 A CN 102183491A
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Abstract
The invention is suitable for a detecting technique for the internal structure of jewelry and particularly provides a non-contact detecting device for the internal structure of the jewelry. The detecting device provided by the invention comprises a light source component, an optical splitter, a reference arm reflector, a photoelectric detector, a signal processing analyzer, a reference arm reflector scanning device and a sample device arm light beam scanning device, wherein the reference arm reflector is fixed on the reference arm reflector scanning device which can make a reciprocating motion; the optical connection exists between the light source component and the input end of the optical splitter, between the two output ends of the optical splitter and the reference arm reflector as well as the jewelry to be measured and between the interference light output end of the optical splitter and the photoelectric detector; and the output end of the photoelectric detector is connected with the electric signal processing analyzer. The detecting device provided by the invention utilizes an optical interference principle to interfere the weak back scattered light and strong reference light of the internal structure of the jewelry, detects the internal structure of the jewelry through detecting interference light signals and greatly improves the detection signal-to-noise ratio and the sensitivity.
Description
Technical field
The present invention relates to a kind of non-contact type jewel internal-structure pick-up unit.
Background technology
To jewel internal-structure, particularly the detection method to the inner structure of opaque or translucent jewelry is problem demanding prompt solution in the jewelry detection range always.Jewel internal-structure detection method of the prior art is the indirect detection method of representative just like relative method, x radiation exposure method generally and is the direct method of measurement of representative with the arbitration law.For example, in the pearl layer thickness to pearl detects, according to cultured pearl classification standard GB/T18781-2002, cultured pearl by the pearl layer thickness be divided into special thick, thick, in, thin, five grades as thin as a wafer, the measuring method of pearl layer thickness mainly contains following three kinds: one, relative method, its principle is: oneself knows the standard model of pearl layer thickness to utilize a cover, adopt the illumination of intense light irradiation bright lamp or optical fiber lamp, under 10 times of magnifieres or gemolite, test sample and standard model are compared, determine the pearl layer thickness rank of test sample.Two, roentgenography.Oneself knows the standard model of pearl layer thickness to utilize a cover, and sample and standard model are put on the X-ray machine photograph platform simultaneously, takes radioscopy than comparison film, the pearl layer thickness of comparison and definite sample on photo.Three, the direct method of measurement (arbitration law) is cut test sample, polish open from the centre, measures the pearl layer thickness with measuring microscope, measures three maximum ga(u)ges and three minimum thickness of nacre at least, and gets its mean value, determines pearl layer thickness rank.
In the above-mentioned technology, method one and method two belong to indirect measurement, can't obtain the exact value of pearl layer thickness.Method three then belongs to destructive to be measured, and must destroy test sample.
As can be seen, also there is not a kind of non-contact type measuring method of directly, jewelry not being destroyed in the prior art.
Summary of the invention
Technical matters to be solved by this invention is to provide a kind of jewel internal-structure pick-up unit, is intended to realize jewelry is carried out directly and the non-contact type jewelry not destroyed is measured.
The present invention realizes like this, a kind of jewel internal-structure pick-up unit, comprise light source assembly, optical splitter, the reference arm catoptron, photodetector, the signal processing analysis device, reference arm scanning mirror device and sample device arm light-beam scanner, wherein, the reference arm catoptron is fixed on the reference arm scanning mirror device that can move back and forth, between light source assembly and the optical splitter input end, between two output terminals of optical splitter and reference arm catoptron and the jewelry to be measured, all adopt optics to be connected between the interference light output terminal of optical splitter and the photodetector, the photodetector output terminal connects electric signal Treatment Analysis device;
The light that described light source assembly sends is divided into reference arm light beam and sample arm light beam two bundles by described optical splitter, and wherein, the reference arm light beam is to described reference arm catoptron, and the sample ami light beam is to jewelry to be measured; When described reference arm scanning mirror, produce change in optical path length and modulation, from the back-scattering light of the inner different depth of jewelry with turn back to the stack of described optical splitter place from the reflected light of described reference arm catoptron and interfere, produce interference light signal; Described interference light signal penetrates the back from described optical splitter and is received by described photodetector, and converts the interference light electric signal to; Described signal processing analysis device receives described interference light electric signal, through amplifying, handle the one dimension reflective light intensity signal that obtains the inner depth direction of jewelry; Described sample device arm light-beam scanner obtains pearl layer two dimensional image after jewelry is scanned.
The present invention utilizes principle of optical interference, and the back-scattering light and the stronger reference light generation of very weak jewel internal-structure are interfered, and surveys the structure of jewelry inside by surveying interference light signal, has improved detection signal-to-noise ratio and sensitivity greatly.Whole testing process utilizes optical means that the jewelry internal imaging is realized, is a kind of noncontact, not damaged, high-resolution detection technique.
Description of drawings
Fig. 1 is a principle schematic of the present invention;
Fig. 2 is a jewel internal-structure pick-up unit embodiment synoptic diagram of the present invention;
Fig. 3 is a signal processing analysis device theory diagram among Fig. 2 embodiment;
Fig. 4 obtains pearl pearl tomographic image among Fig. 2 embodiment.
Embodiment
In order to make purpose of the present invention, technical scheme and advantage clearer,, the present invention is further elaborated below in conjunction with drawings and Examples.Should be appreciated that specific embodiment described herein only in order to explanation the present invention, and be not used in qualification the present invention.
Each step can realize in the following manner in the detection method of the jewel internal-structure among the present invention.Make up an optics Michelson interferometer: the light that light source sends is divided into reference arm light beam and sample arm light beam two bundles by optical splitter, and wherein, the reference arm light beam is to catoptron, and the sample ami light beam is to jewelry to be measured; When the reference arm scanning mirror, produce change in optical path length and modulation, from the back-scattering light of the inner different depth of jewelry with turn back to the stack of optical splitter place from the reflected light of reference arm catoptron and interfere, produce interference light signal; Described interference light signal penetrates the back from optical splitter and is received by photodetector, and converts the interference light electric signal to; The signal processing analysis device receives described interference light electric signal, through amplifying, handling, can obtain the one dimension reflective light intensity signal of the inner depth direction of jewelry, and then obtain jewel internal-structure.Can obtain two-dimentional intuitively jewelry internal optics sectioning image behind the sample device arm beam flying jewelry to be measured.
The pick-up unit of the jewel internal-structure among the present invention can be realized by following embodiment.
As shown in Figure 1, the jewel internal-structure pick-up unit mainly comprises: light source assembly 1, optical splitter 2, reference arm catoptron 3, photodetector 5, signal processing analysis device 6, reference arm scanning mirror device 7 and sample device arm light-beam scanner 8, wherein, between light source assembly 1 and optical splitter 2 input ends, between 2 two output terminals of optical splitter and reference arm catoptron 3 and the jewelry to be measured 4, all adopt optics to be connected between the interference light output terminal of optical splitter 2 and the photodetector 5, photodetector 5 output terminals connect electric signal Treatment Analysis device 6.
Wherein, light source assembly 1 is the low light source of temporal coherence, and its coherent length is between 0.5 micron to 1 centimetre, contains illuminating part and driving circuit thereof, can be super-radiance light emitting diode or light emitting diode or infraluminescence pipe etc.
Optical splitter 2 can adopt Amici prism or plated film light splitting piece or optical fiber coupling apparatus etc.
In Fig. 2 embodiment, light source assembly 1 contains illuminating part and driving circuit thereof, it is that 1310 nanometers, power are that the optical fiber lotus root of 5 milliwatts is closed super-radiance light emitting diode that illuminating part is selected wavelength for use, light source driving circuit adopts by automatic current control (Auto current control, ACC) circuit-formed general constant-current source driver.Optical splitter 2 employing splitting ratios are 50% to 50% two inputs, two output optical fibre coupling apparatus, and the collimating apparatus that this optical fiber coupling apparatus connects optical fiber 12,13 adopts gradient-index lens.The input end of described two inputs, two output optical fibre coupling apparatus is connected with semiconductor laser by optical fiber 11, two output terminals of two input two output optical fibre coupling apparatus pass through optical fiber 12,13 directive reference arm catoptron 3 and jewelry to be measured 4 respectively through the two-beam of collimation, turn back to two inputs, two output optical fibre coupling apparatus by optical fiber 12,13 respectively from the reflected light of reference arm catoptron 3 and the back-scattering light of jewelry to be measured; The interference light output terminal of two inputs, two output optical fibre coupling apparatus is connected with photodetector 5 by optical fiber 14, and photodetector 5 output terminals connect electric signal Treatment Analysis device 6.
Photodetector 5 is selected the InGaAs photodiode of band prime amplifier for use, also can adopt avalanche diode or CCD device etc.
Reference arm catoptron 3 comprises gold-plated catoptron, and this catoptron is fixed on the reference arm scanning mirror device 7 that can move back and forth.The moved back and forth frequency of reference arm catoptron can be several hertz to the hundreds of hertz, and reference arm scanning mirror device 7 can pass through piezoelectric ceramic devices, motorized precision translation stage, vibrating motor, linear electric motors, voice coil motor driving.Motorized precision translation stage in this example drives the reference arm catoptron and moves, and changes the light path of reference path.
Sample device arm light-beam scanner 8 can be an optical scan vibration lens, also can realize scanning by servomotor, is scanning galvanometer in this example.
Light source assembly 1 produces the light of strength of stability, the light lotus root of this intensity stabilization is closed an into input end of optical fiber coupling apparatus (promptly as two inputs, two output optical fibre coupling apparatus), pressed certain splitting ratio (as 50%: 50%) beam split by the optical fiber coupling apparatus, two output terminal outgoing at the optical fiber coupling apparatus, a branch of directive oscillatory type reference mirror after collimating, another beam is to jewelry to be measured; The back-scattering light that goes back from jewelry backscattering to be measured will meet at the optical fiber coupling apparatus with the reflected light that reflects back from the oscillatory type reference mirror and interfere.
With reference to Fig. 3, signal processing analysis device 6 comprises amplifying circuit, filtering circuit, analog to digital converter and computing machine, wave filter is connected in amplification circuit output end, and the output of filtering circuit connects the input end of analog to digital converter, and the digital output end of analog to digital converter connects input end and computer.Amplifying circuit can select for use the OP27 operational amplifier of Burr-Brown company to realize, filtering circuit is selected the YE3790A of Jiangsu Lianneng Electronic Technology Co., Ltd. type bandpass filter etc. for use, analog to digital converter can select for use the PCI-6111 pattern of NI company to count capture card etc., and the computing machine that is used for the Treatment Analysis signal is selected A 100 type computing machines of TCL company etc. for use.Signal processing analysis device 6 also can be made up of single-chip microcomputer, amplifying circuit, filtering circuit and analog to digital conversion circuit etc.
In conjunction with the pick-up unit among Fig. 2, with as an example, jewel internal-structure detection method of the present invention is further specified the detection of pearl pearl layer thickness:
Produce the light of strength of stability by the super-radiance light emitting diode of light source 1, be coupled to two inputs, two output optical fibre coupling apparatus 2 by optical fiber 11;
Two inputs, two output optical fibre coupling apparatus 2 are divided into two bundles with the light of this strength of stability, and are a branch of by optical fiber 12 directive reference arm catoptrons 3, and another bundle is by optical fiber 13 directives pearl 4 to be measured; Meeting at optical fiber coupling apparatus 2 with the reflected light that reflects back from reference arm catoptron 3 from the back-scattering light of pearl to be measured interferes, and the interference light signal of generation is coupled to photodetector 5 by optical fiber 14;
Photodetector 5 converts the interference light signal that receives to the interference light electric signal, delivers to signal processing analysis device 6;
In signal processing analysis device 6, this interference light electric signal is amplified, after the filtering, analog to digital conversion, by computing machine and to this interferometric signal analysis, obtains one dimension depth light intensity signal, further provide pearl layer thickness value.By obtaining pearl layer two dimensional image as shown in Figure 4 after 8 scannings of sample device arm light-beam scanner, can intuitively measure the pearl layer thickness.
The above only is preferred embodiment of the present invention, not in order to restriction the present invention, all any modifications of being done within the spirit and principles in the present invention, is equal to and replaces and improvement etc., all should be included within protection scope of the present invention.
Claims (7)
1. jewel internal-structure pick-up unit, it is characterized in that: comprise light source assembly, optical splitter, the reference arm catoptron, photodetector, the signal processing analysis device, reference arm scanning mirror device and sample device arm light-beam scanner, wherein, the reference arm catoptron is fixed on the reference arm scanning mirror device that can move back and forth, between light source assembly and the optical splitter input end, between two output terminals of optical splitter and reference arm catoptron and the jewelry to be measured, all adopt optics to be connected between the interference light output terminal of optical splitter and the photodetector, the photodetector output terminal connects electric signal Treatment Analysis device;
The light that described light source assembly sends is divided into reference arm light beam and sample arm light beam two bundles by described optical splitter, and wherein, the reference arm light beam is to described reference arm catoptron, and the sample ami light beam is to jewelry to be measured; When described reference arm scanning mirror, produce change in optical path length and modulation, from the back-scattering light of the inner different depth of jewelry with turn back to the stack of described optical splitter place from the reflected light of described reference arm catoptron and interfere, produce interference light signal; Described interference light signal penetrates the back from described optical splitter and is received by described photodetector, and converts the interference light electric signal to; Described signal processing analysis device receives described interference light electric signal, through amplifying, handle the one dimension reflective light intensity signal that obtains the inner depth direction of jewelry; Described sample device arm light-beam scanner obtains pearl layer two dimensional image after jewelry is scanned.
2. jewel internal-structure pick-up unit as claimed in claim 1 is characterized in that, described light source assembly is the low light source of temporal coherence, and coherent length is between 0.5 micron to 1 centimetre.
3. jewel internal-structure pick-up unit as claimed in claim 1 or 2 is characterized in that described light source assembly comprises illuminating part and driving circuit thereof, and this illuminating part is super-radiance light emitting diode or light emitting diode or infraluminescence pipe.
4. jewel internal-structure pick-up unit as claimed in claim 1 is characterized in that, described optical splitter is Amici prism or plated film light splitting piece or optical fiber coupling apparatus.
5. jewel internal-structure pick-up unit as claimed in claim 1 is characterized in that, described photodetector is photodiode or avalanche diode or CCD device.
6. jewel internal-structure pick-up unit as claimed in claim 1, it is characterized in that, described signal processing analysis device comprises amplifying circuit, filtering circuit, analog to digital converter and computing machine, wave filter is connected in amplification circuit output end, the output of filtering circuit connects the input end of analog to digital converter, and the digital output end of analog to digital converter connects input end and computer.
7. jewel internal-structure pick-up unit as claimed in claim 1 is characterized in that, connects by optical fiber between each assembly, detects light in order to conduction.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011100463692A CN102183491A (en) | 2006-03-14 | 2006-03-14 | Detecting device for internal structure of jewelry |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2011100463692A CN102183491A (en) | 2006-03-14 | 2006-03-14 | Detecting device for internal structure of jewelry |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNA2006100575466A Division CN1815192A (en) | 2006-03-14 | 2006-03-14 | Jewel internal-structure detection method and apparatus |
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| CN102183491A true CN102183491A (en) | 2011-09-14 |
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| CN2011100463692A Pending CN102183491A (en) | 2006-03-14 | 2006-03-14 | Detecting device for internal structure of jewelry |
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Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103983492A (en) * | 2014-05-29 | 2014-08-13 | 温新续 | Jade nondestructive detection sample model and manufacturing method thereof |
| CN104990500A (en) * | 2015-07-03 | 2015-10-21 | 郑州轻工业学院 | Apparatus and method for detecting size and refractive index of material in diamond anvil cell |
| CN106932363A (en) * | 2017-03-10 | 2017-07-07 | 南京市计量监督检测院 | A kind of diamond purity detecting system and method |
| CN114034658A (en) * | 2022-01-11 | 2022-02-11 | 中国矿业大学(北京) | Device and method for detecting sandstone degree of dolomite |
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| US5321501A (en) * | 1991-04-29 | 1994-06-14 | Massachusetts Institute Of Technology | Method and apparatus for optical imaging with means for controlling the longitudinal range of the sample |
| JP2003185416A (en) * | 2001-12-18 | 2003-07-03 | Teishin Boeki Kk | Method and apparatus for measurement of film thickness thereof |
| US20050103840A1 (en) * | 2001-12-20 | 2005-05-19 | Boles Julian D. | Anti-fraud apparatus and method for protecting valuables |
| CN1694644A (en) * | 2002-06-28 | 2005-11-09 | Oti眼技术股份有限公司 | Optical mapping apparatus with adjustable depth resolution and multiple functionality |
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2006
- 2006-03-14 CN CN2011100463692A patent/CN102183491A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5321501A (en) * | 1991-04-29 | 1994-06-14 | Massachusetts Institute Of Technology | Method and apparatus for optical imaging with means for controlling the longitudinal range of the sample |
| JP2003185416A (en) * | 2001-12-18 | 2003-07-03 | Teishin Boeki Kk | Method and apparatus for measurement of film thickness thereof |
| US20050103840A1 (en) * | 2001-12-20 | 2005-05-19 | Boles Julian D. | Anti-fraud apparatus and method for protecting valuables |
| CN1694644A (en) * | 2002-06-28 | 2005-11-09 | Oti眼技术股份有限公司 | Optical mapping apparatus with adjustable depth resolution and multiple functionality |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103983492A (en) * | 2014-05-29 | 2014-08-13 | 温新续 | Jade nondestructive detection sample model and manufacturing method thereof |
| CN104990500A (en) * | 2015-07-03 | 2015-10-21 | 郑州轻工业学院 | Apparatus and method for detecting size and refractive index of material in diamond anvil cell |
| CN104990500B (en) * | 2015-07-03 | 2017-08-25 | 郑州轻工业学院 | Mass volume and the device and method of refractive index in a kind of detection diamond anvil cell |
| CN106932363A (en) * | 2017-03-10 | 2017-07-07 | 南京市计量监督检测院 | A kind of diamond purity detecting system and method |
| CN114034658A (en) * | 2022-01-11 | 2022-02-11 | 中国矿业大学(北京) | Device and method for detecting sandstone degree of dolomite |
| CN114034658B (en) * | 2022-01-11 | 2022-05-03 | 中国矿业大学(北京) | Device and method for detecting sandstone degree of dolomite |
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Application publication date: 20110914 |