CN102095339B - Panel defect measuring scale for organic light-emitting display - Google Patents

Abstract

The invention discloses a panel defect measuring scale of an organic light-emitting display, which is used for measuring the panel defect of the organic light-emitting display, wherein the scale surface of the panel defect measuring scale of the organic light-emitting display is marked with defect patterns of an organic light-emitting display panel, and the defect patterns comprise seven types which are respectively used for measuring the edge defect of cut substrate glass, the edge defect of cut rear cover glass, the edge defect of bound substrate glass and a driving module, the edge defect of uncut substrate glass, the length of the width of glue line after lamination when the substrate is bonded with the rear cover glass, the surface defects of the substrate and the rear cover glass, and the display screen polaroid defect of the organic light-emitting display. The invention directly compares the defects on the OLED display panel with the defect pattern on the ruler surface, and if the projection boundary of the defects exceeds the area of the defect pattern, the defects are unusable. Compared with the prior art, the invention realizes the specialization of panel defect measurement, and has simple operation and small human error.

Description

Panel Defect Measuring Ruler for Organic Light-Emitting Displays

technical field

The invention relates to a measuring ruler, in particular to a measuring ruler for measuring panel defects of an organic light-emitting display.

Background technique

The panel defect measurement of organic light-emitting display (OLED) generally needs to measure several items: (1) measure the size of the defect at the corner of the OLED display substrate glass after cutting; (2) measure the corner of the OLED display back cover glass after cutting (3) measure the size of the defect at the edge where the OLED display substrate glass is bound to the IC (driver module); (4) measure the defect size at the other 3 edges of the OLED display substrate glass; (5) measure The width of the UV glue line after bonding the OLED display substrate and the back cover glass; (6) measuring the size of the surface defects (mainly pits) on the substrate and the back cover glass; (7) measuring the polarized light of the OLED display The defect size of the slice. When measuring in the traditional process, common measuring tools (such as meter rulers, protractors, etc.) are often used to measure the length and width of the defects on the substrate glass, back cover glass and polarizer to see if the length and width are within the specified standards. The defect is within the allowable range, so as to judge whether the panel for the organic light-emitting display is qualified.

However, using ordinary measurement tools to measure the panel defects of organic light-emitting displays (OLED displays), the standard data needs to be checked every time the measurement is made, and the measurement is inconvenient, with many measurement steps and large human errors. Therefore, there is an urgent need for a panel defect measurement tool that is easy to use and has little human error.

Contents of the invention

The object of the present invention is to provide a panel defect measuring ruler of an organic light-emitting display that is easy to use and has little human error.

In order to realize the purpose, the present invention discloses a panel defect measuring ruler for an organic light emitting display, which is used for measuring the panel defect of an organic light emitting display, and the organic light emitting display is marked on the ruler surface of the panel defect measuring ruler The defect pattern of the panel, the defect pattern includes the first defect pattern for measuring the defects at the corners of the cut substrate glass, the second defect pattern for measuring the defects at the corners of the cut back cover glass, and the measurement of the binding of the substrate glass and the drive module. The third defect pattern for the defects at the specified edge, the fourth defect pattern for measuring the defects at the uncut edge of the substrate glass, the length pattern for measuring the width of the glue line when the substrate and the back cover glass are bonded, and the measurement for the substrate and the fifth defect pattern for surface defects of the rear cover glass, and the sixth defect pattern for measuring the defects of the display screen polarizer of the organic light emitting display.

Preferably, the defect patterns are composed of a group of transparent defect patterns and a group of dark defect patterns. Using two sets of transparent and opaque patterns as defect patterns can better and more intuitively measure the defects of the OLED panel.

Preferably, the first defect pattern is a rectangle with a length of 2 mm and a width of 1.5 mm; the second defect pattern is a rectangle with a length of 2 mm and a width of 1.5 mm; the third defect pattern is a rectangle with a length of a rectangle with a length of 3 mm and a width of 0.5 mm; the fourth defect pattern is a rectangle with a length of 4 mm and a width of 1 mm; the length pattern is a strip shape with a length of 1.4 mm; the fifth defect pattern consists of Three parallel-arranged circles with diameters of 0.5mm, 1.0mm and 1.5mm respectively; the sixth defect pattern consists of five parallel-arranged circles with diameters of 0.05mm, 0.1mm, 0.15mm, 0.2mm and 0.3mm circular composition. The specifications and sizes of the above-mentioned defect patterns are obtained by analyzing and summarizing the experimental data in the OLED production process. Using the above-mentioned defect patterns can accurately measure whether the OLED display panel is usable.

Preferably, a scale is marked on the edge of the panel defect measuring ruler of the organic light emitting display. The present invention has the function of a commonly used length ruler, can be applied to various occasions, and can measure the defects of the panel more comprehensively.

Preferably, the panel defect measuring ruler of the organic light emitting display includes an angle ruler. The angle ruler is marked on the scale surface of the panel defect measuring ruler of the organic light emitting display, so that the present invention has the function of measuring angles, can be applied to various occasions, and can measure panel defects more comprehensively.

The defect pattern of the organic light emitting display panel is marked on the panel defect measuring ruler of the organic light emitting display of the present invention. The defect pattern is set by those skilled in the art through the analysis and summary of the experimental data in the OLED production process. When measuring the panel defect, directly The defect on the panel is compared with the corresponding defect pattern on the panel defect measuring ruler of the organic light-emitting display. If the boundary of the projection of the defect exceeds the area of the defect pattern, the OLED display is unusable, otherwise it is qualified. Compared with ordinary measuring tools such as length ruler and angle ruler in the prior art, the invention realizes the specialization of OLED display panel defect measurement, and has simple operation and small human error.

Description of drawings

FIG. 1 is a schematic diagram of a panel defect measuring ruler for an organic light emitting display according to the present invention.

FIG. 2 is an enlarged schematic view of part A in FIG. 1 .

FIG. 3 is an enlarged schematic view of part B in FIG. 1 .

Fig. 4 is a schematic diagram of defects of the substrate glass to be tested.

5a-5b are schematic diagrams of measuring defects using the present invention.

Detailed ways

In order to describe the technical content, structural features, achieved goals and effects of the present invention in detail, the following will be described in detail in conjunction with the embodiments and accompanying drawings.

Referring to Fig. 1, the panel defect measuring ruler 100 of the organic light-emitting display of the present invention is made of a transparent material, the edge is marked with a scale, and the upper right corner is marked with an angle meter (Angle meter) 10, compared with the prior art, the present invention The defect pattern of the organic light emitting display (OLED display) panel is marked on the ruler surface of the organic light emitting display panel defect measuring ruler 100 .

With reference to Fig. 1, described defect pattern comprises first defect pattern (EL CORNER) 11, is used for measuring the OLED display screen substrate glass corner defect after cutting, and described first defect pattern 11 comprises transparent defect pattern and dark defect pattern . Wherein, the first defect pattern 11 is a rectangle with a size of 2*1.5 mm. When measuring, the defect is compared with the first defect pattern 11 on the scale surface. If the projected boundary of the defect exceeds the area of the first defect pattern 11, is not available.

With reference to Fig. 1, described defect pattern comprises the second defect pattern (C/G CORNER) 12, is used for measuring the OLED display screen rear cover glass corner defect after cutting, and described second defect pattern 12 comprises transparent defect pattern and dark Defect patterns. Wherein, the second defect pattern 12 is a rectangle with a size of 2*1.5 mm. When measuring, the defect is compared with the second defect pattern 12 on the scale surface. If the projected boundary of the defect exceeds the area of the second defect pattern 12, is not available.

With reference to Fig. 1, described defect pattern comprises the 3rd defect pattern (PAD 3*0.5mm,) 13, is used for measuring the edge place defect of OLED display substrate glass and drive module (IC) bonding, and described 3rd defect The patterns 13 include transparent defect patterns and dark defect patterns. Wherein, the third defect pattern 13 is a rectangle with a size of 3*0.5 mm. When measuring, the defect is compared with the third defect pattern 13 on the scale surface. If the projected boundary of the defect exceeds the area of the third defect pattern 13, is not available.

With reference to Fig. 1, described defect pattern comprises the 4th defect pattern (Panel Side&Dummy Pad) 14, is used for measuring the defect at other 3 edge places of OLED display substrate glass, and the 4th defect pattern 14 comprises transparent defect pattern and dark defect pattern. Wherein, the fourth defect pattern 14 is a rectangle with a size of 4*1mm. When measuring, the defect is compared with the fourth defect pattern 14 on the scale surface. If the projected boundary of the defect exceeds the area of the fourth defect pattern 14, then unavailable.

With reference to Fig. 1, described defect pattern comprises length pattern (Resin Width) 15, is used for measuring the width after UV glue line is pressed when OLED display substrate and rear cover glass are bonded, and described length pattern 15 comprises transparent defect pattern and dark bug patterns. Wherein, the length pattern 15 is in the shape of a strip with a length of 1.4 mm. When measuring, if the width of the glue line is less than 1.4 mm marked on the measuring scale, it is not available.

Referring to FIG. 1 , the defect pattern includes a fifth defect pattern 16 for measuring surface defects (mainly pits) of the substrate and the rear cover glass, and the fifth defect pattern 16 includes a transparent defect pattern and a dark defect pattern. The fifth defect pattern 16 is composed of three parallel diameters of 0.5 mm, 1.0 mm and 1.5 mm. When measuring, the defect is compared with the fifth defect pattern 16 on the scale surface. If the defect Areas where the projection boundary exceeds the fifth defect pattern 16 are not available.

Referring to FIGS. 1-3 , the defect patterns include a sixth defect pattern 17 for measuring defects of OLED display polarizers, and the sixth defect pattern 17 includes a transparent defect pattern and a dark defect pattern. The sixth defect pattern 17 is composed of five circles arranged in parallel, and the diameters of the five circles are 0.05 mm, 0.1 mm, 0.15 mm, 0.2 mm and 0.3 mm respectively. During measurement, the defect is compared with the sixth defect pattern 17 on the scale surface, and if the projected boundary of the defect exceeds the area of the sixth defect pattern 17, it is not available.

With reference to Fig. 4, the schematic diagram of the defect of substrate glass 20, the defect 21 at the corner of the substrate glass after cutting is arranged on the substrate 20, the defect 22 at the other three edges of the substrate glass, the surface defect of the substrate glass (in the figure is Dimples) 23. Taking the defect 22 as an example, to measure the substrate glass 20, the transparent defect pattern of the first defect pattern 11 on the panel defect measuring ruler of the organic light emitting display of the present invention is placed on the defect 22 of the substrate glass 20, referring to FIG. 5a, if The projection boundary of defect 22 on the ruler plane exceeds the region of the transparent defect pattern of the fourth defect pattern 14, and the substrate glass 20 is unusable; with reference to FIG. In the region of the transparent defect pattern of 14, the defect 22 of the substrate glass 20 is within the allowable error. The measurement methods for defects on several other OLED display panels are similar to the measurement method for defect 21 described above, and will not be described in detail again.

What is disclosed above is only a preferred embodiment of the present invention, and of course it cannot limit the scope of rights of the present invention. Therefore, equivalent changes made according to the patent scope of the present invention still fall within the scope of the present invention.

Claims (5)

1. the panel defect dip stick of an OLED; The panel defect that is used for OLED is measured; It is characterized in that: indicate the defective pattern that the OLED panel is arranged on the chi face of the panel defect dip stick of said OLED; Said defective pattern comprises the first defective pattern of measuring the substrate glass edges and corners defective after the cutting, measure the back cover glass edges and corners defective after the cutting the second defective pattern, measure the edge defective that substrate glass and driver module bind the 3rd defective pattern, measure the 4th defective pattern of the uncut edge of substrate glass defective, the length pattern of width after the tree lace pressing when measuring substrate with the bonnet bonding glass, measure substrate and after the 5th defective pattern of surface imperfection of cover glass, and the 6th defective pattern of the display screen polaroid defective of measurement OLED.

2. the panel defect dip stick of OLED as claimed in claim 1 is characterized in that: said defective pattern is made up of one group of transparency defect pattern and one group of dark defective pattern.

3. the panel defect dip stick of OLED as claimed in claim 1 is characterized in that: the said first defective pattern is long 2 millimeters, wide 1.5 millimeters rectangle; The said second defective pattern is long 2 millimeters, wide 1.5 millimeters rectangle; Said the 3rd defective pattern is long 3 millimeters, wide 0.5 millimeter rectangle; Said the 4th defective pattern is long 4 millimeters, wide 1 millimeter rectangle; Said length pattern is long 1.4 millimeters band shape; Said the 5th defective pattern is made up of the circle that the diameter of three parallel arranged is respectively 0.5 millimeter, 1.0 millimeters and 1.5 millimeters; Said the 6th defective pattern is made up of the circle that the diameter of five parallel arranged is respectively 0.05 millimeter, 0.1 millimeter, 0.15 millimeter, 0.2 millimeter and 0.3 millimeter.

4. the panel defect dip stick of OLED as claimed in claim 1 is characterized in that: the edge of the panel defect dip stick of said OLED indicates has scale.

5. the panel defect dip stick of OLED as claimed in claim 1, it is characterized in that: the panel defect dip stick of said OLED comprises bevel protractor.

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