CN109752394A - A kind of display screen defect high-precision detecting method and system - Google Patents
A kind of display screen defect high-precision detecting method and system Download PDFInfo
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- CN109752394A CN109752394A CN201910081145.1A CN201910081145A CN109752394A CN 109752394 A CN109752394 A CN 109752394A CN 201910081145 A CN201910081145 A CN 201910081145A CN 109752394 A CN109752394 A CN 109752394A
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Abstract
The application discloses a kind of display screen defect high-precision detecting method and system, and method includes obtaining global image, determines defect area；Extract the bright dark information of defect area；Defective locations are shot in the focus image of different layers, determine the specific layer position where defect；Defective products judgement is carried out to defect according to detection benchmark；System includes low precision gray scale camera, processor, high-precision color camera and display；The present processes and system pass through high-precision color camera and locally carry out high-precision shooting to defective locations, the sub-pixel-level image procossing of defective locations part can be achieved, introduce simulation point module simultaneously to determine bright spot brightness, by carrying out precise quantification to undesirable level, guarantee and the defect detected after actually detected Comparison of standards are correct, avoid erroneous detection.
Description
Technical field
This application involves defect detecting technique field more particularly to a kind of display screen defect high-precision detecting method and it is
System.
Background technique
With the continuous improvement of people's living standards, the quality requirement of display screen is also gradually promoted, it is at the same time, right
Higher requirement is also faced in the defects detection of display screen.Display screen is made of numerous pixels, wherein each pixel
Point all includes R (red), three G (green), B (indigo plant) sub-pixels (also referred to as drawing element), by adjusting the sub-pixel of tri- kinds of different colours of RGB
Brightness indicate various colors.
Common display screen defect can be roughly divided into three kinds of point, line, color spot defects according to its form.Wherein, class defect is put
It is a kind of defect most commonly seen in display screen, dim spot, bright spot and foreign matter can be roughly classified into.Dim spot is often dark point, complete white
Under picture, if any sub-pixel does not work in 3 points of RGB, which is known as dim spot；Bright spot is the point being always on, in completely black picture
Under, if any sub-pixel lights in 3 points of RGB, which is known as bright spot；Foreign matter is in glass cover-plate, backlight layer or polarisation
The chaff interferents such as non-erasable dust, lousiness present in the interlayers such as piece can be divided into bright foreign matter and dark according to visible picture type
Foreign matter, wherein bright foreign matter is in black picture as it can be seen that dark foreign matter is visible in white picture.In actual industrial production, the form of bright dim spot
Be it is diversified, have different determinating references.The detection of dim spot is come generally according to its number, distance and connection form
Determine；For bright spot detection in addition to will be to its number, distance, outside connection form is determined, it is also necessary to brightness degree of progress
Amount, it is however generally that, brightness is considered as non-defective unit lower than the bright spot of certain threshold value, ignores it；And for the judgement of foreign matter mainly according to it
Size and apart from determining, is usually considered defective products if size is beyond a certain standard.
Currently, most of detection devices carry out global shooting to display screen frequently with gray scale camera, compared according to neighborhood
Method detects bright dark defect and calculates its contrast and dimension information, rule of thumb sets contrast and size threshold, if
Then it is considered bad beyond threshold value, otherwise it is assumed that being non-defective unit.Such detection system is based on pixel and carries out image procossing, can be preferably
It detects most of grade defects, but requires higher micron order defect to seem helpless detection accuracy, Wu Fayu
The detection benchmark of market demands is aligned.It is in particular in following three aspects: one, when to DSD dark spot defect detect, if
Global gray scale is carried out using conventional detection devices and adopts figure, and the fine morphological feature of dim spot can not be seen from image, i.e., can not be sentenced
Disconnected dim spot out is to connect dim spots apart from dim spot or two, it is difficult to achieve the purpose that precise measurement；Two, when being detected to bright spot, by
Do not have a colouring information in gray scale camera, and human eye is different for the susceptibility of red green, when luminance difference relatively when, very
Hardly possible differentiates its undesirable level, and measurement accuracy is caused to decline；Three, when for foreign bodies detection, gray scale camera is unable to measure out foreign matter
Specific location causes the display screen that can be reprocessed to be mistaken for scrap, results in waste of resources.
Summary of the invention
The application provides a kind of display screen defect high-precision detecting method and system, to solve measurement accuracy in the prior art
Problem low, accuracy is poor, and the application is based on high-precision color camera and locally carries out high-precision shooting to defective locations, it can
It realizes the sub-pixel-level image procossing of defective locations part, while introducing simulation point module to determine bright spot brightness, pass through
Precise quantification is carried out to undesirable level, guarantee and the defect detected after actually detected Comparison of standards are correct, avoid erroneous detection.
This application provides a kind of display screen defect high-precision detecting methods, including obtain global image, determine defect area
Domain；
Extract the bright dark information of defect area；
Defective locations are shot in the focus image of different layers, determine the specific layer position where defect；
Defective products judgement is carried out to defect according to detection benchmark.
Optionally, described to include: to defect progress defective products judgement according to detection benchmark when defect is DSD dark spot defect
The connection form of analyzing defect；
If the connection form of defect is to be determined as non-defective unit apart from dim spot；If the connection form of defect is two company's dim spots,
It is determined as defective products.
Optionally, described to include: to defect progress defective products judgement according to detection benchmark when defect is fleck defect
The color of analyzing defect simultaneously calculates brightness, obtains the first brightness value；
Shoot the simulation point image of same color according to the color of defect, and the brightness of calculating simulation point image obtains the
Two brightness values；
First brightness value is compared with the second brightness value；If the first brightness value is greater than the second brightness value, it is determined as
Defective products；If the first brightness value is less than or equal to the second brightness value, it is determined as non-defective unit.
Optionally, described to include: to defect progress defective products judgement according to detection benchmark when defect is foreign matter defect
Set theoretical foreign matter size threshold value；
It calculates actual measurement foreign matter size and carries out morphological analysis；
Actual measurement foreign matter size is compared with theoretical foreign matter size threshold value；If surveying foreign matter size exceeds theoretical foreign matter ruler
Very little threshold value, then be determined as defective products.
Optionally, the theoretical foreign matter size threshold value includes width threshold value, area threshold, gabarit threshold value；It is described to survey
Foreign matter size is compared with theoretical foreign matter size threshold value
The width value, area value, gabarit value surveyed in foreign matter size are compared with theoretical size threshold value respectively, if its
Any one of beyond theoretical foreign matter size threshold value, then be determined as defective products.
Optionally, the shooting defective locations include: in the focus image of different layers
Defective locations are shot in the image of liquid crystal layer；
Defective locations are shot in the image of empty N layers of coke；
Defective locations are shot in empty coke-N layers of image.
Optionally, the bright dark information includes bright dim spot number, connection form and foreign matter image.
The embodiment of the present application also provides a kind of display screen defect high-precision detection system, including low precision gray scale camera,
Processor, high-precision color camera and display；
The low precision gray scale camera for obtaining global image from display screen to be detected, and global image is sent to
Processor；
The processor, for determining defect area, and extract the bright dark information of defect area according to global image；
The high-precision color camera is sent out for shooting defective locations in the focus image of different layers, and by focus image
It send to processor；
The processor is also used to determine the specific layer position where defect according to focus image；According to detection benchmark to scarce
It is trapped into the judgement of row defective products；
The display, for showing that global image, defect area and defective products determine result.
From the above technical scheme, this application provides a kind of display screen defect high-precision detecting method and system, sides
Method includes obtaining global image, determines defect area；Extract the bright dark information of defect area；Defective locations are shot in different layers
Focus image determines the specific layer position where defect；Defective products judgement is carried out to defect according to detection benchmark；System includes low
Precision gray scale camera, processor, high-precision color camera and display；The present processes and system pass through the colored phase of high-precision
Machine is to the progress high-precision shooting of defective locations part, it can be achieved that the sub-pixel-level image procossing of defective locations part, introduces simultaneously
Point module is simulated to determine bright spot brightness, by carrying out precise quantification to undesirable level, is guaranteed and actually detected standard pair
The defect detected than after is correct, avoids erroneous detection.
Detailed description of the invention
In order to illustrate more clearly of the technical solution of the application, letter will be made to attached drawing needed in the embodiment below
Singly introduce, it should be apparent that, for those of ordinary skills, without any creative labor,
It is also possible to obtain other drawings based on these drawings.
Fig. 1 is a kind of flow chart of display screen defect high-precision detecting method provided by the present application；
Fig. 2 is the decomposition step figure of step S4 in method provided by the present application；
Fig. 3 is a kind of structural schematic diagram of display screen defect high-precision detection system provided by the present application；
Fig. 4 is a kind of overhaul flow chart of display screen defect high-precision detection system provided by the present application.
Specific embodiment
It is a kind of flow chart of display screen defect high-precision detecting method provided by the present application referring to Fig. 1；
As shown in Figure 1, the embodiment of the present application provides a kind of display screen defect high-precision detecting method, comprising:
S1: global image is obtained, determines defect area；In the present embodiment, it is detected for obtaining the object of global image
Entire display screen screen, such as mobile phone, computer, electronics are called out the stops, TV, remote controler, are directed to the screen size of measurand,
Suitable image acquisition equipment is chosen, adaptively with once shooting global image, increase image obtain efficiency as far as possible.It needs
Illustrate, the main function of step S1 in the present embodiment are as follows: the approximate location for obtaining bright DSD dark spot defect in image rapidly is used in combination
Defect area, which demarcates, to be come, and screening effect is played for the shooting of subsequent high-precision, therefore, in order to more quickly determine defect area
Domain, and equipment cost is reduced, traditional low precision gray scale camera or tool can be selected in the image acquisition equipment used in step S1
There are other equipment of similar function.
Further, the defects of the present embodiment region refers to the image range with certain area comprising defect,
Since defect is likely to be present in any position of detected display screen screen, and may be simultaneously present in display screen screen multiple
Defect, so the defect area on entire display screen there may be multiple, and the size of each defect area may have
It is different.When therefore dividing defect area, for the ease of the precise measurement of everywhere defect area, it should guarantee everywhere defect as far as possible
It is filled as far as possible by defect point in region.Assuming that defect point is closer at two, then can will be divided into same defect area at two；It is false
If separated by a distance between defect point at two, then defect point at two cannot be made to be in same defect area, and should drawn respectively
It is divided into a defect area；
It further,, can be taking human as laying down a regulation after having divided defect area for the ease of the analysis management of data
Each defect area is numbered by number, such as defect area 1, defect area 2 ... etc..
S2: the bright dark information of defect area is extracted；After having divided multiple defect areas according to the rough position of defect, need
The bright dark information of everywhere defect area is acquired, bright dark information herein mainly includes bright dim spot number, connection form
And foreign matter image etc..Since defect area is when dividing, one or two kinds of defects may be included, it is therefore desirable to count each defect
Different accurate detection schemes is respectively adopted for different types of bright dark information for subsequent in the bright dark information in region.
In addition, bright dark information is after acquiring respectively, it, can be with the more intuitive way table such as list for the ease of management
Show, such as: " defect area 1- bright spot 3-has bright foreign matter, defect area 2- bright spot 1-without bright foreign matter " or " defect area
1- dim spot 4-apart from 2-two company's dim spots 1 of dim spot-without dark foreign matter, defect area 2- dim spot 2-apart from dim spot 2-have it is dark
Foreign matter ".
Further, the bright dark information in the present embodiment is not limited to above- mentioned information, can also include the position of bright dim spot
Location information etc. where information (using coordinate representation), region, locks rapidly the defect area that will be shot convenient for high-precision camera
Domain increases treatment effeciency；Likewise, above- mentioned information can also be same as with other information one list expression, facilitate operator into
The subsequent operating procedure of row.
By step S1 and S2, it is determined that the defects of each defect area and each defect area of acquisition type, for essence
Really judge whether the defects of each defect area meets the judgement of defective products, needs colored by carrying out high-precision to defect area
Camera is locally shot, as shown in step S3,
S3: shooting defective locations determine the specific layer position where defect in the focus image of different layers；Due to aforementioned step
The position that defect area is had determined that in rapid, maximumlly reduces coverage, therefore higher using precision in this step
Color camera when, that is, avoid the other region losses caused by camera of shooting, also can defect to shooting area it is more smart
True judgement.Specifically, shooting defective locations can be chosen respectively when high-precision color camera shoots different layers foreign matter image
In liquid crystal layer, in N layers of empty coke and in empty coke-N layers of image, by being compared and analyzed to the image after shooting, to determine
Foreign matter is to be present in liquid crystal layer or be present in backlight layer, and then can determine if foreign matter is present in backlight layer, can be led to
It crosses and reprocesses removing, if foreign matter is present in liquid crystal layer, may be determined as defective products by subsequent again.
S4: defective products judgement is carried out to defect according to detection benchmark.It is directed to different types of defect, is needed by different
The judgement that benchmark carries out defective products is detected, and to obtain higher detection accuracy, the detection benchmark for needing formulation finer,
However, traditional detection method is low due to shooting precision, so that not being able to satisfy testing result but even if having formulated higher benchmark
It is aligned completely with detection benchmark, detection benchmark is caused to lose effectiveness；It is colored that high-precision is used by step S3 in this present embodiment
Camera shooting, can make shooting result have with compared with the matched ability of high detection benchmark, therefore, it is determined that result more really has
Effect.
It referring to fig. 2, is the decomposition step figure of step S4 in method provided by the present application；
Further, in a kind of possible embodiments, when defect type difference, realize that the process of step S4 can lead to
Cross diversified forms realization；
For example, when defect is DSD dark spot defect, it is described to include: to defect progress defective products judgement according to detection benchmark
S411: the connection form of analyzing defect；Connection form mainly includes connecting dim spot apart from dim spot and two.Wherein, according to
The detection benchmark of formulation is different, can be defined as the dim spot that the distance between two dim spots meet some distance range apart from dim spot
When being divided into three to five pixels between combination, such as two dim spots of setting, one is constituted apart from dim spot, before this
It puts, the pixel that three to five pixels are spaced between some dim spot is constituted with the dim spot apart from dim spot.And two
Even dim spot is not intended to limit it and forms number, it is assumed that has multiple dim spots (can define in certain interval between each other
To be spaced in zero to three pixel), then all dim spots for meeting the range of definition constitute two company's dim spots.
S412: if the connection form of defect is to be determined as non-defective unit apart from dim spot；If the connection form of defect is two even dark
Point, then be determined as defective products.In a kind of setting for detecting benchmark of the present embodiment, by judge the connection form of DSD dark spot defect into
And judge whether it is defective products, and it is the undesirable level based on defect to formulate, since the defect of two company's dim spots is more concentrated,
It will be understood that the undesirable level of this defect type is higher, that is, it is determined as defective products；So will avoid passing by high-precision detection
The case where detection method of uniting apart from dim spot for being determined as defective products, display screen being caused to be scrapped in advance.
For another example, described to include: to defect progress defective products judgement according to detection benchmark when defect is fleck defect
S421: the color of analyzing defect simultaneously calculates brightness, obtains the first brightness value；The detection of bright spot largely relies on
Its brightness, in the actual production process, the light transmittance of difference screen are different, cause human eye to the bright defect of same grayscale on different screens
Visibility also have different.In traditional detection method, since gray scale camera does not have colouring information, when the two to compare
When luminance difference is smaller, only it is difficult to differentiate its undesirable level with sensing capability of the human eye to brightness.By using in this present embodiment
Color camera effectively reduces brightness value metric difficulty, and then improves the precision of detection.For example, false in same defect area
If existing simultaneously a bright red spot and a green bright spot, if shot using gray scale camera, and gray scale intensities are used simultaneously
It detects benchmark to compare, since sensitivity of the human eye to color is different, it is difficult to which whether both accurate judgements are defective products, and are used
The color camera of the present embodiment is shot, and under the premise of knowing defect color, can choose the Benchmark brightness of corresponding color to divide
Not Shi Shi brightness ratio pair, comparison result is more acurrate.
In addition, in the present embodiment quantifying the brightness value of fault location bright spot, the first brightness value is obtained, numeric ratio pair is used
Instead of eye recognition, also testing result will be made more accurate.
S422: the simulation point image of same color, and the brightness of calculating simulation point image are shot according to the color of defect, is obtained
To the second brightness value；In the present embodiment, in order to guarantee the detection accuracy of bright spot, simulation point is introduced as detection benchmark, simulates point
For the bright spot simulated on the screen in advance, bright spot includes three kinds of RGB, and the position of bright spot is fixed, simulation point and bright spot
The form of defect is consistent, and the brightness value simulated a little can be configured according to different manufacturers benchmark requirement, it is considered that can be set to
Human eye is visible with sightless critical luminance.
S423: the first brightness value is compared with the second brightness value；If the first brightness value is greater than the second brightness value, that is, recognize
It is exceeded for the brightness of the bright spot, then it is determined as defective products；If the first brightness value is less than or equal to the second brightness value, it is determined as good
Product can ignore the fleck defect.
It is all that captured in real-time is corresponding current aobvious when one piece of display screen of every detection in addition, in order to further ensure detection accuracy
The simulation point image of bright spot color in display screen, and using its brightness as the luminance threshold for determining the display screen fleck defect；When more
After changing the display screen of detection, still need to re-shoot simulation point image.
For another example, described to include: to defect progress defective products judgement according to detection benchmark when defect is foreign matter defect
S431: theoretical foreign matter size threshold value is set；Before examinations process, need to formulate foreign matter defect in detection base
Standard, i.e. specification have been more than a certain restriction threshold value, that is, determine that the foreign matter defect is defective products；
Further, theoretical foreign matter size threshold value may include width threshold value, area threshold, gabarit threshold value etc., specific limit
Fixed Dimension Types are formulated according to actual needs by producer, and this is not restricted.
S432: it calculates actual measurement foreign matter size and carries out morphological analysis；Because foreign matter comes in every shape, calculated to simplify
Process, it is necessary to size calculating be carried out based on morphological analysis, to obtain more accurately surveying foreign matter size.
S433: actual measurement foreign matter size is compared with theoretical foreign matter size threshold value；If surveying foreign matter size beyond theory
Foreign matter size threshold value, then be determined as defective products.
Further, when theoretical foreign matter size threshold value be equipped with it is multiple when, the method also includes:
S434: the width value, area value, gabarit value surveyed in foreign matter size are compared with theoretical size threshold value respectively
Compared with if any one of its is determined as defective products beyond theoretical foreign matter size threshold value；Opposite, when all Xiang Jun are less than
When theoretical foreign matter size threshold value, then it is determined as non-defective unit.
From the above technical scheme, this application provides a kind of display screen defect high-precision detecting methods, including obtain
Global image determines defect area；Extract the bright dark information of defect area；Shoot defective locations different layers focus image,
Determine the specific layer position where defect；Defective products judgement is carried out to defect according to detection benchmark；The present processes pass through height
Accurate color camera locally carries out high-precision shooting to defective locations, it can be achieved that at the sub-pixel-level image of defective locations part
Reason, while introducing and simulating point module to determine bright spot brightness, by carrying out precise quantification to undesirable level, guarantee and reality
The defect detected after examination criteria comparison is correct, avoids erroneous detection.
It is a kind of structural schematic diagram of display screen defect high-precision detection system provided by the present application referring to Fig. 3.
From the figure 3, it may be seen that the embodiment of the present application also provides a kind of display screen defect high-precision detection system, including low precision
Gray scale camera 2, processor 4, high-precision color camera 3 and display 5；
The low precision gray scale camera 2 for obtaining global image from display screen 1 to be detected, and global image is sent
To processor 4；
The processor 4, for determining defect area 11, and extract the bright dark letter of defect area 11 according to global image
Breath；
The high-precision color camera 3 is sent out for shooting defective locations in the focus image of different layers, and by focus image
It send to processor 4；
The processor 4 is also used to determine the specific layer position where defect according to focus image；According to detection benchmark pair
Defect carries out defective products judgement；
The display 5, for showing that global image, defect area 11 and defective products determine result.
It referring to fig. 4, is a kind of overhaul flow chart of display screen defect high-precision detection system provided by the present application.
As shown in Figure 4, the detection process of detection system provided by the present application are as follows: treated first with low precision gray scale camera 2
Detection display screen 1 is shot, and obtains global image, and global image is sent in processor 4；Processor 4 receives the overall situation
After image, the bright dark attribute of the defects of global image and analyzing defect is first extracted, then the location information of defect is sent to height
In accurate color camera 3 and display 5, defective locations are shown in display 5；High-precision color camera 3 receives scarce
After sunken location information, the high-precision under different focal length is carried out to defective locations and is shot, the defect image under different focal length is obtained
And it sends back in processor 4；Then it, then by processor 4 by calculating to analyze determines foreign matter place layer, and is sentenced according to defect image
Whether disconnected is defective products；The deterministic process of specific defective products are as follows: progress foreign matter defect dipoles first, according to preset theoretical ruler
Very little threshold value, if actual measurement size is greater than theoretical size threshold value, is directly determined as defective products compared with surveying size；If actual measurement
Size is not greater than theoretical size threshold value, then carries out the judgement of next step；And then the judgement for carrying out bright dim spot, if it is dim spot
When defect, then by analyzing its form, and judge whether DSD dark spot defect is defective products according to specified detection benchmark；If it is bright
When point defect, first have to shoot the simulation point image of corresponding color by analyzing bright spot color, bright spot brightness and mould will surveyed
Quasi- point brightness is compared, if actual measurement bright spot brightness is higher than simulation point brightness, is determined as defective products；It is on the contrary then to ignore this bright
Point defect；Finally, when all defect region 11 detection process after the completion of, will test result by summarizing display in display 5.
As shown from the above technical solution, the embodiment of the present application provides a kind of display screen defect high-precision detection system；Packet
Include low precision gray scale camera, processor, high-precision color camera and display；The system of the application passes through high-precision color camera
High-precision shooting locally is carried out to defective locations, it can be achieved that defective locations part sub-pixel-level image procossing, while introducing mould
Intend point module to determine bright spot brightness, by carrying out precise quantification to undesirable level, guarantees and actually detected Comparison of standards
The defect detected afterwards is correct, avoids erroneous detection.
Field technical staff after considering the specification and implementing the invention disclosed here, will readily occur to of the invention other
Embodiment.This application is intended to cover any variations, uses, or adaptations of the invention, these modifications, purposes or
Adaptive change follow general principle of the invention and including the undocumented common knowledge in the art of the present invention or
Conventional techniques.The description and examples are only to be considered as illustrative, and true scope and spirit of the invention are by following power
Benefit requires to point out.
It should be understood that the present invention is not limited to the precise structure already described above and shown in the accompanying drawings, and
And various modifications and changes may be made without departing from the scope thereof.The scope of the present invention is limited only by the attached claims.
Claims (8)
1. a kind of display screen defect high-precision detecting method, which is characterized in that the described method includes:
Global image is obtained, determines defect area；
Extract the bright dark information of defect area；
Defective locations are shot in the focus image of different layers, determine the specific layer position where defect；
Defective products judgement is carried out to defect according to detection benchmark.
2. a kind of display screen defect high-precision detecting method according to claim 1, which is characterized in that when defect is dim spot
It is described to include: to defect progress defective products judgement according to detection benchmark when defect
The connection form of analyzing defect；
If the connection form of defect is to be determined as non-defective unit apart from dim spot；If the connection form of defect is two company's dim spots, determine
For defective products.
3. a kind of display screen defect high-precision detecting method according to claim 1, which is characterized in that when defect is bright spot
It is described to include: to defect progress defective products judgement according to detection benchmark when defect
The color of analyzing defect simultaneously calculates brightness, obtains the first brightness value；
The simulation point image of same color, and the brightness of calculating simulation point image are shot according to the color of defect, and it is bright to obtain second
Angle value；
First brightness value is compared with the second brightness value；If the first brightness value is greater than the second brightness value, it is determined as bad
Product；If the first brightness value is less than or equal to the second brightness value, it is determined as non-defective unit.
4. a kind of display screen defect high-precision detecting method according to claim 1, which is characterized in that when defect is foreign matter
It is described to include: to defect progress defective products judgement according to detection benchmark when defect
Set theoretical foreign matter size threshold value；
It calculates actual measurement foreign matter size and carries out morphological analysis；
Actual measurement foreign matter size is compared with theoretical foreign matter size threshold value；If surveying foreign matter size exceeds theoretical foreign matter size threshold
Value, then be determined as defective products.
5. a kind of display screen defect high-precision detecting method according to claim 4, which is characterized in that the theory foreign matter
Size threshold includes width threshold value, area threshold, gabarit threshold value；It is described will actual measurement foreign matter size and theoretical foreign matter size threshold value into
Row relatively includes:
The width value, area value, gabarit value surveyed in foreign matter size are compared with theoretical size threshold value respectively, if wherein appointing
Meaning one beyond theoretical foreign matter size threshold value, is then determined as defective products.
6. a kind of display screen defect high-precision detecting method according to claim 1, which is characterized in that the shooting defect
Position includes: in the focus image of different layers
Defective locations are shot in the image of liquid crystal layer；
Defective locations are shot in the image of empty N layers of coke；
Defective locations are shot in empty coke-N layers of image.
7. a kind of display screen defect high-precision detecting method according to claim 1, which is characterized in that the bright dark information
Including bright dim spot number, connection form and foreign matter image.
8. a kind of display screen defect high-precision detection system, which is characterized in that the detection system includes low precision gray scale camera,
Processor, high-precision color camera and display；
Global image for obtaining global image from display screen to be detected, and is sent to processing by the low precision gray scale camera
Device；
The processor, for determining defect area, and extract the bright dark information of defect area according to global image；
The high-precision color camera is sent to for shooting defective locations in the focus image of different layers, and by focus image
Processor；
The processor is also used to determine the specific layer position where defect according to focus image；According to detection benchmark to defect into
Row defective products determines；
The display, for showing that global image, defect area and defective products determine result.
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| CN111208148A (en) * | 2020-02-21 | 2020-05-29 | 凌云光技术集团有限责任公司 | Dig hole screen light leak defect detecting system |
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| WO2021189259A1 (en) * | 2020-03-24 | 2021-09-30 | 京东方科技集团股份有限公司 | Oled screen point defect determination method and apparatus, storage medium and electronic device |
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| WO2022042521A1 (en) * | 2020-08-31 | 2022-03-03 | 京东方科技集团股份有限公司 | Detection method and detection apparatus of display screen |
| CN114383815A (en) * | 2021-12-13 | 2022-04-22 | 长春希达电子技术有限公司 | Method for rapidly detecting pixel out-of-control point of display screen |
| CN114519714A (en) * | 2022-04-20 | 2022-05-20 | 中导光电设备股份有限公司 | Method and system for judging smudgy defect of display screen |
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Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104749184A (en) * | 2013-12-31 | 2015-07-01 | 研祥智能科技股份有限公司 | Automatic optical detection method and automatic optical detection system |
| CN104933978A (en) * | 2015-07-02 | 2015-09-23 | 京东方科技集团股份有限公司 | Detection method and detection apparatus for display panel |
| CN105300308A (en) * | 2015-11-26 | 2016-02-03 | 凌云光技术集团有限责任公司 | Depth measuring method and system based on shallow depth of field imaging |
| CN108344749A (en) * | 2018-02-11 | 2018-07-31 | 凌云光技术集团有限责任公司 | A method of liquid crystal display defect layered weighting is carried out based on two-sided array camera |
| WO2018229709A1 (en) * | 2017-06-14 | 2018-12-20 | Camtek Ltd. | Automatic defect classification |
-
2019
- 2019-01-28 CN CN201910081145.1A patent/CN109752394B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104749184A (en) * | 2013-12-31 | 2015-07-01 | 研祥智能科技股份有限公司 | Automatic optical detection method and automatic optical detection system |
| CN104933978A (en) * | 2015-07-02 | 2015-09-23 | 京东方科技集团股份有限公司 | Detection method and detection apparatus for display panel |
| CN105300308A (en) * | 2015-11-26 | 2016-02-03 | 凌云光技术集团有限责任公司 | Depth measuring method and system based on shallow depth of field imaging |
| WO2018229709A1 (en) * | 2017-06-14 | 2018-12-20 | Camtek Ltd. | Automatic defect classification |
| CN108344749A (en) * | 2018-02-11 | 2018-07-31 | 凌云光技术集团有限责任公司 | A method of liquid crystal display defect layered weighting is carried out based on two-sided array camera |
Cited By (26)
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|---|---|---|---|---|
| CN112255973A (en) * | 2019-07-02 | 2021-01-22 | 库卡机器人(广东)有限公司 | Target detection method, detection terminal and storage medium in industrial production system |
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| CN110880171A (en) * | 2019-10-30 | 2020-03-13 | 联想(北京)有限公司 | Detection method of display device and electronic equipment |
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| CN114519714A (en) * | 2022-04-20 | 2022-05-20 | 中导光电设备股份有限公司 | Method and system for judging smudgy defect of display screen |
| CN114519714B (en) * | 2022-04-20 | 2022-07-26 | 中导光电设备股份有限公司 | Method and system for judging smudgy defect of display screen |
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| CN116013189A (en) * | 2022-09-26 | 2023-04-25 | 领先光学技术(江苏)有限公司 | Brightness correction process and device for Mini LED/Micro LED screen |
| CN116013189B (en) * | 2022-09-26 | 2023-10-17 | 领先光学技术(江苏)有限公司 | Mini LED/Micro LED screen brightness correction method and device |
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