CN109450433B - Double-circuit integrated circuit trimming device - Google Patents
Double-circuit integrated circuit trimming device Download PDFInfo
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- CN109450433B CN109450433B CN201810871521.2A CN201810871521A CN109450433B CN 109450433 B CN109450433 B CN 109450433B CN 201810871521 A CN201810871521 A CN 201810871521A CN 109450433 B CN109450433 B CN 109450433B
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- 238000009966 trimming Methods 0.000 title claims abstract description 38
- 238000012360 testing method Methods 0.000 claims abstract description 76
- 239000004065 semiconductor Substances 0.000 claims abstract description 6
- 230000003213 activating effect Effects 0.000 claims abstract description 4
- 230000003287 optical effect Effects 0.000 claims description 47
- 230000000087 stabilizing effect Effects 0.000 claims description 20
- 239000003990 capacitor Substances 0.000 claims description 10
- 238000010586 diagram Methods 0.000 description 13
- 238000000034 method Methods 0.000 description 5
- 230000004913 activation Effects 0.000 description 4
- 238000007664 blowing Methods 0.000 description 4
- 230000008054 signal transmission Effects 0.000 description 4
- 230000033228 biological regulation Effects 0.000 description 2
- 238000002485 combustion reaction Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
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- H03K19/0075—Fail-safe circuits by using two redundant chains
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Abstract
The invention discloses a two-way integrated circuit trimming device, which comprises a main circuit and an auxiliary circuit with different resolutions, wherein the main circuit and the auxiliary circuit respectively comprise and are sequentially connected, and a switch control circuit is used for receiving a switch signal so as to generate and output a control instruction according to the switch signal; the integrated control chip generates a gating signal according to the control instruction; the burning and adjusting selection circuit generates a square wave signal according to the gating signal and outputs the square wave signal from the test end; the square wave signal sequentially comprises a pre-starting time sequence, an activating time sequence, a fuse selection time sequence and a burning and adjusting time sequence; when the square wave signal is positioned in the fuse selection time sequence, the burning and adjusting selection circuit outputs a selection code to be connected with a corresponding fuse in the semiconductor chip; when the square wave signal is in the burning and adjusting sequence, the burning and adjusting selection circuit continuously outputs the square wave signal with high level to the corresponding fuse wire so as to blow the fuse wire. Has the advantages that: the electric parameters in the compensation circuit can be simultaneously trimmed through two paths, so that the electric parameters can be manually trimmed and matched with a testing machine.
Description
Technical Field
The invention relates to the technical field of integrated circuits, in particular to a double-circuit integrated circuit trimming device.
Background
In the process of manufacturing an integrated circuit, when the circuit is designed, the circuit is perfectly simulated, and the matching of the device is perfectly combined according to the process model of the actually manufactured wafer manufacturer, however, the desired matching effect cannot be finally achieved.
At present, for example, a single integrated circuit includes tens of thousands, hundreds of thousands, even millions, and tens of millions of NMOS or PMOS transistors; so many 1um to 1um MOS transistors are put together, and the output magnitude can reach ten to dozens of MV magnitude. Multiple tests verify that the threshold difference among the MOS tubes obeys normal distribution.
Thus, in the prior art, there is no way to achieve a high accuracy for a certain parameter by simply increasing the area of each integrated circuit, and also to deviate the parameters of the integrated chip from the predetermined ranges after fabrication.
Disclosure of Invention
To address the above-mentioned problems in the prior art, a two-way integrated circuit trimming apparatus is now provided.
The specific technical scheme is as follows:
a two-way integrated circuit trimming device comprises a main road and an auxiliary road which are distributed in a mirror image manner; the main path includes:
the main switch control circuit is used for receiving a switch signal so as to generate and output a control instruction according to the switch signal;
the output end of the main switch control circuit is respectively connected with the 22 nd pin to the 26 th pin of the integrated control chip; the integrated control chip generates a gating signal according to the control instruction;
the input end of the main burning and adjusting selection circuit is respectively connected with the No. 2 pin and the No. 3 pin of the integrated control chip; the main burning and adjusting selection circuit generates a square wave signal according to the gating signal and outputs the square wave signal from the main testing end; the square wave signal sequentially comprises a pre-starting time sequence, an activating time sequence, a fuse selection time sequence and a burning and adjusting time sequence;
when the square wave signal is positioned in the fuse selection time sequence, the main burning modulation selection circuit outputs a selection code to be connected with a corresponding fuse in the semiconductor chip; when the square wave signal is in the burning and adjusting time sequence, the main burning and adjusting selection circuit continuously outputs the square wave signal with high level to the corresponding fuse wire so as to fuse the fuse wire.
Preferably, the main switch control circuit at least includes five main switch control branches, and each main switch control branch includes:
a first switch connected to a first power supply;
the input end of the first optical coupler is connected with the first switch through a first resistor, and the output end of the first optical coupler is connected with a 26 th pin of the integrated control chip;
the second resistor is connected between the output end of the first optocoupler and the first power supply;
the first indicator light is connected between the first power supply and a 27 th pin of the integrated control chip through a third resistor;
and the second indicator light is connected between the first power supply and the 28 th pin of the integrated control chip through a fourth resistor.
Preferably, the main combustion adjusting selection circuit includes:
the input end of the second optical coupler is connected to the No. 2 pin of the integrated circuit chip through a fifth resistor;
the first end of the voltage stabilizing chip is connected with a cable interface and is connected with a second power supply, the second end of the voltage stabilizing chip is connected with the output end of the second optocoupler through a sixth resistor, and the third end of the voltage stabilizing chip is connected with the ground terminal;
the input end of the third optical coupler is connected with the 3 rd pin of the integrated circuit chip through a seventh resistor, and the output end of the third optical coupler is connected with the first end of the voltage stabilizing chip through an eighth resistor;
the grid electrode of the first switch tube is connected with the output end of the second optocoupler, the source electrode of the first switch tube is connected with the first power supply, and the drain electrode of the first switch tube is connected with a main test end through a first diode;
a grid electrode of the second switch tube is connected with the output end of the third optocoupler, a source electrode of the second switch tube is connected with the second power supply, and a drain electrode of the second switch tube is connected with the main test end through a second diode;
the power supply indicator lamp is connected between the first end of the voltage stabilizing chip and the grounding end through a ninth resistor;
the tenth resistor is connected between the main test end and the first end of the voltage stabilizing chip;
and the first capacitor is connected between the main test end and the first end of the voltage stabilizing chip.
Preferably, the accessory includes:
the output end of the auxiliary switch control circuit is respectively connected with the 14 th pin to the 18 th pin of the integrated control chip;
and the auxiliary burning and adjusting selection circuit is connected with the main burning and adjusting selection circuit through the cable interface, and the input end of the auxiliary burning and adjusting selection circuit is connected with the 6 th pin and the 7 th pin of the integrated control chip.
Preferably, the auxiliary switch control circuit at least includes five auxiliary switch control branches, and each auxiliary switch control branch includes:
the second switch is connected with the first power supply;
the input end of the fourth optical coupler is connected with the second switch through an eleventh resistor, and the output end of the fourth optical coupler is connected with an 18 th pin of the integrated control chip;
and the twelfth resistor is connected between the output end of the fourth optocoupler and the first power supply.
Preferably, the auxiliary burning adjustment selection circuit includes:
the input end of the fifth optical coupler is connected to a pin 6 of the integrated circuit chip through a thirteenth resistor, and the output end of the fifth optical coupler is connected with the first power supply through a fourteenth resistor;
the input end of the sixth optical coupler is connected with the 7 th pin of the integrated circuit chip through a fifteenth resistor, and the output end of the sixth optical coupler is connected with the cable interface through a sixteenth resistor;
a grid electrode of the third switch tube is connected with the output end of the fifth optocoupler, a source electrode of the third switch tube is connected with the first power supply, and a drain electrode of the third switch tube is connected with an auxiliary test end through a third diode;
a grid electrode of the fourth switch tube is connected with the output end of the sixth optocoupler, a source electrode of the fourth switch tube is connected with the second power supply, and a drain electrode of the fourth switch tube is connected with the auxiliary test end through a fourth diode;
the seventeenth resistor is connected between the auxiliary test end and the cable interface;
and the second capacitor is connected between the auxiliary test end and the cable interface.
Preferably, the 19 th pin and the 8 th pin of the integrated control chip are respectively connected with a ground terminal;
and the 20 th pin of the integrated control chip is connected with the first power supply.
Preferably, a burning modulation value table is pre-coded and set in the main burning modulation selection circuit, and the burning modulation value table is used for judging a corresponding burning modulation object in the fuse selection time sequence;
and the main burning and adjusting selection circuit continuously outputs the square wave signal with high level, and the fuse wire corresponding to the burning and adjusting object is blown out according to the burning and adjusting truth table.
Preferably, the first power supply is 5V;
the second power supply is 7V.
Preferably, when the burning object is at least two fuses, the main test terminal and the auxiliary test terminal are both used simultaneously.
The technical scheme of the invention has the beneficial effects that: by adopting the main road and the auxiliary road which are distributed in a mirror image mode, the electric parameters in the compensation circuit can be trimmed and adjusted through the double paths simultaneously, the trimming and adjusting requirements of integrated circuits on the market can be met, manual trimming and adjusting can be carried out, and meanwhile the electric parameters can be matched with a testing machine, so that the consistency of the number of trimming and adjusting samples can be judged and managed.
Drawings
Embodiments of the present invention will now be described more fully hereinafter with reference to the accompanying drawings. The drawings are, however, to be regarded as illustrative and explanatory only and are not restrictive of the scope of the invention.
FIG. 1 is a schematic diagram of a current test of a two-way IC trimming apparatus according to the present invention;
FIG. 2 is a diagram of a trimming circuit for a dual-channel IC trimming apparatus according to the present invention;
FIG. 3 is a diagram of a test port operation vector according to the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that the embodiments and features of the embodiments may be combined with each other without conflict.
The invention is further described with reference to the following drawings and specific examples, which are not intended to be limiting.
The invention comprises a two-way integrated circuit trimming device, which comprises a main road and an auxiliary road which are distributed in a mirror image manner; the main path includes:
the main switch control circuit 1 is used for receiving a switch signal, generating and outputting a control instruction according to the switch signal;
the output end of the main switch control circuit 1 is respectively connected with the 22 nd pin to the 26 th pin of the integrated control chip 2; the integrated control chip 2 generates a gating signal according to the control instruction;
the input end of the main burning adjusting selection circuit 3 is respectively connected with the No. 2 pin and the No. 3 pin of the integrated control chip 2; the main burning modulation selection circuit 3 generates a square wave signal according to the gating signal and outputs the square wave signal from a main TEST terminal TEST 1; the square wave signal sequentially comprises a pre-starting time sequence T1, an activating time sequence T2, a fuse selection time sequence T3 and a burning time sequence T4;
when the square wave signal is at the fuse selection timing T3, the main burning modulation selection circuit 3 outputs a selection code to connect the corresponding fuse in the semiconductor chip; when the square wave signal is at the burning timing T4, the main burning selection circuit 3 continuously outputs the high level square wave signal to the corresponding fuse to blow the fuse.
According to the technical scheme of the two-way integrated circuit trimming device, as shown in the combined drawings of fig. 1, 2 and 3, the two-way integrated circuit trimming device is combined with a trimming circuit diagram through a current test schematic diagram, wherein a main circuit and an auxiliary circuit which are in mirror image distribution are adopted, and the electric parameters in a compensating circuit can be trimmed through two ways at the same time, so that the trimming requirement of integrated circuits on the market can be met, the trimming can be manually performed, and meanwhile, the matching with a testing machine can be performed, so that the consistency of the number of trimming samples can be judged and managed;
specifically, the main circuit and the auxiliary circuit are distributed in a mirror image manner, and when the burning and adjusting objects are at least two fuses, the main TEST terminal TEST1 and the auxiliary TEST terminal TEST2 of the main circuit and the auxiliary circuit are used simultaneously;
furthermore, the main circuit comprises a main switch control circuit 1, an integrated control chip 2 and a main modulation selection circuit 3, wherein the main switch control circuit 1 is used for receiving a switch signal so as to generate and output a control instruction according to the switch signal; the integrated control chip 2 generates a gating signal according to the control instruction; the main burning modulation selection circuit 3 generates a square wave signal according to the gating signal and outputs the square wave signal from a main TEST terminal TEST 1;
further, the square wave signal sequentially includes a pre-start timing T1, an activation timing T2, a fuse selection timing T3, and a burn-in timing T4; when the square wave signal is at the fuse selection timing T3, the main burning modulation selection circuit 3 outputs a selection code to connect the corresponding fuse in the semiconductor chip; when the square wave signal is at the burning timing T4, the main burning selection circuit 3 continuously outputs the high level square wave signal to the corresponding fuse to blow the fuse.
In a preferred embodiment, the main switch control circuit 1 comprises at least five main switch control branches 10, each main switch control branch 10 comprising:
a first switch SW1 connected to a first power source VC 1;
the input end of the first optical coupler T1 is connected with the first switch SW1 through a first resistor R1, and the output end of the first optical coupler T1 is connected with the 26 th pin of the integrated control chip 2;
the second resistor R2 is connected between the output end of the first optocoupler T1 and the first power supply VC 1;
a first indicator LED1 connected between the first power source VC1 and the 27 th pin of the integrated control chip 2 through a third resistor R3;
a second indicator LED2 connected between the first power source VC1 and the 28 th pin of the integrated control chip 2 through a fourth resistor R4.
Specifically, the main switch control circuit 1 includes: the first switches SW1, SW2, SW3, SW4 and SW5 mainly play a role in triggering and switching on; the first optocoupler T1 mainly plays a role in signal transmission, further receives a switching signal, and generates and outputs a control command according to the switching signal, wherein the first power supply VC1 is 5V; the first indicator light LED1 and the second indicator light LED2 are working indicator lights for displaying the on state of each switch control branch;
further, the input end of the first optocoupler T1 includes a light emitting diode, the cathode of the light emitting diode is connected to the ground GND, and the anode of the light emitting diode is connected to the first switch SW1 through the first resistor R1; the output end of the first optical coupler T1 includes a light-sensing amplifier, the emitting end of the light-sensing amplifier is connected to the ground GND, and the collector of the light-sensing amplifier is connected to the 26 th pin of the integrated control chip 2.
It should be noted that the main switch control circuit 1 at least includes five main switch control branches 10, and electronic components, such as switches, optocouplers, and resistors, included in each main switch control branch 10 are the same, as shown in fig. 1, and are not described herein again.
In a preferred embodiment, the main combustion tuning selection circuit 3 comprises:
a second optical coupler T2, an input end of the second optical coupler T2 is connected to the 2 nd pin of the integrated circuit chip 11 through a fifth resistor R5;
a voltage stabilizing chip U1, a first end U10 of the voltage stabilizing chip U1 is connected to a cable interface BNC and connected to a second power source VC2, a second end U11 of the voltage stabilizing chip U1 is connected to an output end of the second optocoupler T2 through a sixth resistor R6, and a third end U12 of the voltage stabilizing chip U1 is connected to a ground end GND;
the input end of the third optical coupler T3 is connected with the 3 rd pin of the integrated circuit chip 11 through a seventh resistor R7, and the output end of the third optical coupler T3 is connected with the first end U10 of the voltage stabilizing chip U1 through an eighth resistor R8;
a first switch tube Q1, a gate of the first switch tube Q1 is connected to an output end of the second optocoupler T2, a source of the first switch tube Q1 is connected to a first power source VC1, and a drain of the first switch tube Q1 is connected to a main TEST end TEST1 through a first diode D1;
a second switch tube Q2, a gate of the second switch tube Q2 is connected to an output end of the third optocoupler T3, a source of the second switch tube Q2 is connected to the second power source VC2, and a drain of the second switch tube Q2 is connected to the main TEST end TEST1 through a second diode D1;
a power indicator LED3 connected between the first terminal U10 of the voltage regulation chip U1 and the ground GND through a ninth resistor R9;
a tenth resistor R10 connected between the main TEST terminal TEST1 and the first terminal U10 of the voltage regulation chip U1;
a first capacitor C1 is connected between the main TEST terminal TEST1 and the first terminal U10 of the voltage regulator chip U1.
Specifically, the second optocoupler T2 and the third optocoupler T3 play a role in signal transmission, the voltage stabilizing chip U1 plays a role in voltage stabilization, the first switching tube Q1 and the second switching tube Q2 play a switching role, and the power indicator LED3 displays a power on state, wherein the second power source VC2 is 7V;
furthermore, the main TEST terminal TEST1 outputs a 1-5kHz square wave signal, and if the burning objects are at least two fuses, the main TEST terminal TEST1 and the auxiliary TEST terminal TEST2 of the main circuit and the auxiliary circuit are both used simultaneously, and the maximum burning current can be provided to be 100 mA.
In a preferred embodiment, the accessory includes:
the output end of the auxiliary switch control circuit 4 is respectively connected with the 14 th pin to the 18 th pin of the integrated control chip 2;
and the auxiliary burning adjusting selection circuit 5 is connected with the main burning adjusting selection circuit 3 through a cable interface BNC, and the input end of the auxiliary burning adjusting selection circuit 5 is connected with the 6 th pin and the 7 th pin of the integrated control chip 2.
Specifically, the auxiliary path and the main path are distributed in a mirror image mode, the electric parameters in the compensation circuit can be trimmed through the two paths simultaneously, the trimming requirements of the integrated circuits on the market can be met, manual trimming can be conducted, and meanwhile the electric parameters can be matched with a testing machine, so that the consistency of the number of trimming samples can be judged and managed.
In a preferred embodiment, the auxiliary switch control circuit 4 comprises at least five auxiliary switch control branches 40, each auxiliary switch control branch 40 comprising:
a second switch SW6 connected to the first power supply VC 1;
an input end of the fourth optocoupler T4 is connected with the second switch SW6 through an eleventh resistor R11, and an output end of the fourth optocoupler T4 is connected with an 18 th pin of the integrated control chip 2;
and the twelfth resistor R12 is connected between the output end of the fourth optocoupler T4 and the first power supply VC 1.
Specifically, the auxiliary switch control circuit 4 includes: the second switches SW6, SW7, SW8, SW9 and SW10 mainly play a role in triggering and switching on; the fourth optical coupler T4 mainly plays a role of signal transmission, further enables a switching signal to be received, and generates and outputs a control command according to the switching signal, wherein the first power supply VC1 is 5V.
In a preferred embodiment, the auxiliary firing selection circuit 5 includes:
a fifth optical coupler T5, an input end of the fifth optical coupler T5 is connected to the 6 th pin of the integrated circuit chip 11 through a thirteenth resistor R13, and an output end of the fifth optical coupler T5 is connected to the first power source VC1 through a fourteenth resistor R14;
the input end of the sixth optocoupler T6 is connected with the 7 th pin of the integrated circuit chip 11 through a fifteenth resistor R15, and the output end of the sixth optocoupler T6 is connected with the cable interface BNC through a sixteenth resistor R16;
a third switch tube Q3, a gate of the third switch tube Q3 is connected to an output end of the fifth optocoupler T5, a source of the third switch tube Q3 is connected to the first power source VC1, and a drain of the third switch tube Q3 is connected to an auxiliary TEST end TEST2 through a third diode D3;
a fourth switch tube Q4, a gate of the fourth switch tube Q4 is connected to an output end of the sixth optocoupler T6, a source of the fourth switch tube Q4 is connected to the second power source VC2, and a drain of the fourth switch tube Q4 is connected to the auxiliary TEST end TEST2 through a fourth diode D4;
a seventeenth resistor R17 connected between the auxiliary TEST terminal TEST2 and the cable interface BNC;
and a second capacitor C2 connected between the auxiliary TEST terminal TEST2 and the cable interface BNC.
Specifically, the fifth optical coupler T5 and the sixth optical coupler T6 play a role in signal transmission, the third switching tube Q3 and the fourth switching tube Q4 play a role in switching, and the second power supply VC2 is 7V;
furthermore, the auxiliary burning-adjusting selection circuit 5 is connected with the main burning-adjusting selection circuit 3 through a cable interface BNC, the auxiliary TEST end TEST2 outputs a square wave signal of 1-5kHz, and if the burning-adjusting objects are at least two fuses, the main TEST end TEST1 and the auxiliary TEST end TEST2 of the main circuit and the auxiliary circuit are used simultaneously, and meanwhile, the maximum burning-adjusting current can be provided to be 100 mA.
In a preferred embodiment, the 19 th pin and the 8 th pin of the integrated control chip 2 are respectively connected to the ground GND;
the 20 th pin of the integrated control chip 2 is connected with a first power supply VC 1.
Specifically, the model of the integrated control chip 2 is PIC16F876, the integrated control chip 2 is a connection junction between the main circuit and the auxiliary circuit, and the integrated control chip 2 generates the gating signal according to the control instruction output by the main switch control circuit 1.
In a preferred embodiment, the main burning tone selecting circuit 3 is pre-coded with a burning tone truth table for determining the corresponding burning tone object in the fuse selecting sequence;
the main burning adjustment selection circuit 3 continuously outputs a high-level square wave signal, and fuses the corresponding fuse of the burning adjustment object according to the burning adjustment truth table.
Specifically, as shown in fig. 1, 2, and 3, a chip with model CL1570 adopts a fuse blowing mode to adjust the current precision of an output terminal OUT, the output terminal OUT supplies a 5V direct current source through an analog channel, the output terminal OUT is connected to a ground terminal GND and a filter capacitor 104, a main TEST terminal TEST1 is connected to a ground terminal 102 and a filter capacitor 102, at this time, OUT is 2.5V, and the current flowing into the output terminal OUT is tested and recorded as IOUT 1;
further, the square wave signal sequentially comprises a pre-start timing T1, an activation timing T2, a fuse selection timing T3 and a burn-in timing T4, specifically, the level of the pre-start timing T1 is 4.5 to 5V, the level of the activation timing T2 is 6.5 to 7V, the first square wave high level of the fuse selection timing T3 is 6.5 to 7V, the square wave high level is 4.5 to 5V thereafter, and the high level of the burn-in timing T4 is 5 to 7V;
specifically, when the square wave signal is at the fuse selection timing T3, the main debug selection circuit 3 outputs a selection code to connect the corresponding fuse in the semiconductor chip; before selecting the fuses, the voltage of the activation timing T2 is 6.5-7V, wherein the first fuse corresponds to F1 in the burning and adjusting value table, the second fuse corresponds to F2 in the burning and adjusting value table, the third fuse corresponds to F3 in the burning and adjusting value table, and the fuse at the enabling end corresponds to Fn in the burning and adjusting value table, wherein the burning and adjusting value table is as follows;
further, when the square wave signal is at the burning modulation timing T4, the main burning modulation selection circuit 3 continuously outputs the square wave signal of high level, fuses corresponding to the burning modulation object according to the burning modulation truth table, and when the selected fuse starts to be burned, the signal of the main TEST terminal TEST1 is removed after 100 ms; when all fuses are burned out and then power is cut off, it is particularly noted that when each fuse is burned out, the fuse at the enable terminal must be burned out.
In a preferred embodiment, the two-way ic trimming apparatus combines a current test schematic diagram with a trimming circuit diagram, as shown in fig. 1, 2 and 3, the test and fuse burning trimming process specifically includes: firstly, testing a current test, wherein an output end OUT of a CL1570 chip is grounded to a filter capacitor of 102, at the moment, OUT is 2.5V, the current flowing into the output end OUT is tested and recorded as IOUT1, and if IOUT1 is not less than 144mA or IOUT1 is not more than 108mA, the chip belongs to an abnormal chip and is not in a process design range, the chip is judged to be FAIL and is discarded;
further, during current burning, when the test value 108mA of the CL1570 chip is not less than IOUT1 not more than 144mA, a proper burning mode is selected according to the K value (K is 120/IOUT1) to carry out burning, wherein the generation of the actual test value and the burning scheme comprises the following steps:
when the 117.6mA is less than or equal to IOUT1 is less than or equal to 122.4mA, the CL1570 chip only needs to blow the fuse Fn at the enabling end;
when the IOUT1 is more than or equal to 115.2mA and less than or equal to 117.6mA, the CL1570 chip firstly blows the second fuse F2 and then blows the fuse Fn at the enable end;
when the IOUT1 is more than or equal to 115.2mA and less than or equal to 117.6mA, the CL1570 chip blows the first fuse F1 and then blows the fuse Fn at the enabling end;
when the IOUT1 is more than or equal to 108mA and less than or equal to 115.2mA, the CL1570 chip simultaneously blows the second fuse F2 and the first fuse F1, and then blows the fuse Fn at the enabling end;
when the 122.4mA is not less than IOUT1 not less than 127.2mA, the CL1570 chip firstly blows the third fuse F3 and then blows the fuse Fn at the enable end;
when the IOUT1 is not less than 127.2mA and not more than 132mA, the CL1570 chip simultaneously blows the third fuse F3 and the first fuse F1, and then blows the fuse Fn at the enable end;
when the 132mA is not less than IOUT1 not less than 136.8mA, the CL1570 chip simultaneously blows the third fuse F3 and the second fuse F2, and then blows the fuse Fn at the enabling end;
when the voltage of the IOUT1 is more than or equal to 136.8mA and less than or equal to 144mA, the CL1570 chip simultaneously blows the third fuse F3, the second fuse F2 and the first fuse F1, and then blows the fuse Fn at the enabling end;
further, the current burning function is tested and verified, the output end OUT of the CL1570 chip is grounded to 104 filter capacitors, OUT is 2.5V, and the current flowing into the output end OUT of the CL1570 chip is tested to be IOUT 2;
furthermore, if the 117.6mA is less than or equal to IOUT1 is less than or equal to 122.4mA, the burning adjustment is successful; if the IOUT1 is less than or equal to 117.6mA or the IOUT1 is more than or equal to 122.4mA, indicating that the burning and adjusting are unsuccessful, and carrying out the current burning and adjusting again.
In a preferred embodiment, as shown in fig. 1, 2, and 3, when a manual burning mode is adopted, when the inflow current of the output end OUT of the CL1570 chip is 117.6mA and IOUT1 are both equal to or less than 122.4mA, the switch SW corresponding to the enable end fuse is turned on, at this time, a high level signal is transmitted to the instruction of the integrated control chip 2 through the first optical coupler T1, the first resistor R1, and the second resistor R2, and the integrated control chip 2 sends OUT a series of pulses within 100mS of receiving the instruction to drive the second optical coupler T2, the third optical coupler T3, the first switch tube Q1, and the second switch tube Q2, so that the main TEST end TEST1 operates according to the operation vector diagram, and only needs to blow the enable end fuse;
similarly, when the inflow current of the output end OUT of the CL1570 chip is 115.2mA or more and IOUT1 or more and 117.6mA or less, the switch SW corresponding to the second fuse is turned on first, the time keeps 5mS continuously, then the switch SW corresponding to the enable end is turned on, a high level signal is transmitted to the instruction of the integrated control chip 2 through the first optical coupler T1, the first resistor R1 and the second resistor R2, and the integrated control chip 2 sends a series of pulses within 100mS of the instruction, so as to drive the second optical coupler T2, the third optical coupler T3, the first switching tube Q1 and the second switching tube Q2, so that the main TEST end TEST1 and the auxiliary TEST end TEST2 work according to the operation vector diagram, and the second fuse and the enable end fuse are blown;
further, by analogy, when the inflow current of the output end OUT of the CL1570 chip is 108mA or more and IOUT1 or more and 144mA or less, the switch of the corresponding fuse is turned on, at this time, a high-level signal is transmitted to an instruction of the integrated control chip 2 through the first optocoupler T1, the first resistor R1 and the second resistor R2, and the integrated control chip 2 sends a series of pulses within 100mS of the instruction received, so as to drive the second optocoupler T2, the third optocoupler T3, the first switching tube Q1 and the second switching tube Q2, so that the main TEST end TEST1 and the auxiliary TEST end TEST2 work according to a schematic operation vector diagram, and the purpose of blowing the fuse is achieved;
it should be noted that the setting of the fuse programming waveform required to be generated by the main TEST terminal TEST1 in the main programming circuit 12 and the auxiliary TEST terminal TEST2 in the auxiliary programming circuit 21 may be simulated by the integrated control chip 2 in advance, and then the programmer writes executable codes to the integrated control chip 2 for programming, which is not described herein again.
In a preferred embodiment, as shown in fig. 1, 2, and 3, when a TEST machine and a trimming device are linked, when the inflow current of the output end OUT of the CL1570 chip is 117.6mA or less and IOUT1 or less and 122.4mA or less, the switch SW corresponding to the fuse at the enable end is automatically turned on through program control, at this time, a high level signal is transmitted to the instruction of the integrated control chip 2 through the first optical coupler T1, the first resistor R1, and the second resistor R2, and the integrated control chip 2 sends a series of pulses within 100mS of the received instruction to drive the second optical coupler T2, the third optical coupler T3, the first switch tube Q1, and the second switch tube Q2, so that the main TEST end TEST1 operates according to an operation vector diagram, and only needs to blow the fuse at the enable end; after the operation is finished, the testing machine and the trimming device are reset to the initial state;
similarly, when the inflow current of the output end OUT of the CL1570 chip is 115.2mA or more and IOUT1 or more and 117.6mA or less, the switch SW corresponding to the second fuse is turned on first through program control, and 5mS is maintained, then the switch SW corresponding to the enable end fuse is turned on through process sequence control, a high level signal is transmitted to the instruction of the integrated control chip 2 through the first optical coupler T1, the first resistor R1 and the second resistor R2, and the integrated control chip 2 sends OUT a series of pulses within 100mS of receiving the instruction to drive the second optical coupler T2, the third optical coupler T3, the first switch tube Q1 and the second switch tube Q2, so that the main TEST end TEST1 and the auxiliary TEST end TEST2 work according to a running vector diagram, and the purpose of blowing the second fuse and the enable end fuse is achieved; after the operation is finished, the testing machine and the trimming device are reset to the initial state;
further, by analogy, when the inflow current of the output end OUT of the CL1570 chip is 108mA or more and IOUT1 or more and 144mA or less, the switch of the corresponding fuse is controlled by a program, at this time, a high-level signal is transmitted to an instruction of the integrated control chip 2 through the first optocoupler T1, the first resistor R1 and the second resistor R2, and the integrated control chip 2 sends a series of pulses within 100mS of the instruction received, so as to drive the second optocoupler T2, the third optocoupler T3, the first switching tube Q1 and the second switching tube Q2, so that the main TEST end TEST1 and the auxiliary TEST end TEST2 work according to a schematic operation vector diagram, and the purpose of blowing the fuse is achieved; after the operation is finished, the testing machine and the trimming device are reset to the initial state.
It should be noted that the switch SW corresponding to the fuse at the enable terminal is pre-written by the integrated control chip 2 and then automatically controlled by a program, which is not described herein again.
While the invention has been described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes in form and detail may be made therein without departing from the spirit and scope of the invention.
Claims (9)
1. A two-way integrated circuit trimming device is characterized by comprising a main circuit and an auxiliary circuit; the main path includes:
the main switch control circuit is used for receiving a switch signal so as to generate and output a control instruction according to the switch signal;
the integrated control chip is of a type PIC16F876, and the output end of the main switch control circuit is respectively connected to pins 22 to 26 of the integrated control chip; the integrated control chip generates a gating signal according to the control instruction;
the input end of the main burning and adjusting selection circuit is respectively connected with the No. 2 pin and the No. 3 pin of the integrated control chip; the main burning and adjusting selection circuit generates a square wave signal according to the gating signal and outputs the square wave signal from the main testing end; the square wave signal sequentially comprises a pre-starting time sequence, an activating time sequence, a fuse selection time sequence and a burning and adjusting time sequence;
when the square wave signal is positioned in the fuse selection time sequence, the main burning modulation selection circuit outputs a selection code to be connected with a corresponding fuse in the semiconductor chip; when the square wave signal is positioned in the burning and adjusting time sequence, the main burning and adjusting selection circuit continuously outputs the square wave signal with high level to the corresponding fuse wire so as to fuse the fuse wire;
the main switch control circuit includes five main switch control branch roads at least, and each way the main switch control branch road includes:
the first switch is connected with a first power supply and used for outputting the switching signal;
the input end of the first optical coupler is connected with the first switch through a first resistor, and the output end of the first optical coupler is connected with a 26 th pin of the integrated control chip;
the second resistor is connected between the output end of the first optocoupler and the first power supply;
the accessory road comprises:
the output end of the auxiliary switch control circuit is respectively connected with the 14 th pin to the 18 th pin of the integrated control chip and used for receiving a switch signal so as to generate and output a control instruction according to the switch signal;
and the auxiliary burning and adjusting selection circuit is connected with the main burning and adjusting selection circuit through a cable interface, and the input end of the auxiliary burning and adjusting selection circuit is connected with the 6 th pin and the 7 th pin of the integrated control chip and used for generating a square wave signal according to a gating signal and outputting the square wave signal from the main testing end.
2. The dual-channel integrated circuit trimming apparatus of claim 1, further comprising:
the first indicator light is connected between the first power supply and a 27 th pin of the integrated control chip through a third resistor;
and the second indicator light is connected between the first power supply and the 28 th pin of the integrated control chip through a fourth resistor.
3. The dual-channel ic trimming apparatus of claim 2, wherein the main burn-in selection circuit comprises:
the input end of the second optical coupler is connected to the No. 2 pin of the integrated control chip through a fifth resistor;
the first end of the voltage stabilizing chip is connected with the cable interface, the second end of the voltage stabilizing chip is connected with the output end of the second optocoupler through a sixth resistor, and the third end of the voltage stabilizing chip is connected with a ground end;
the input end of the third optical coupler is connected with the 3 rd pin of the integrated control chip through a seventh resistor, and the output end of the third optical coupler is connected with the first end of the voltage stabilizing chip through an eighth resistor;
the grid electrode of the first switch tube is connected with the output end of the second optocoupler, the source electrode of the first switch tube is connected with the first power supply, and the drain electrode of the first switch tube is connected with a main test end through a first diode;
a grid electrode of the second switch tube is connected with the output end of the third optocoupler, a source electrode of the second switch tube is connected with a second power supply, and a drain electrode of the second switch tube is connected with the main test end through a second diode;
the power supply indicator lamp is connected between the first end of the voltage stabilizing chip and the grounding end through a ninth resistor;
the tenth resistor is connected between the main test end and the first end of the voltage stabilizing chip;
and the first capacitor is connected between the main test end and the first end of the voltage stabilizing chip.
4. The dual-channel ic trimming apparatus of claim 3, wherein the auxiliary switch control circuit comprises at least five auxiliary switch control circuits, each of the auxiliary switch control branches comprising:
the second switch is connected with the first power supply;
the input end of the fourth optical coupler is connected with the second switch through an eleventh resistor, and the output end of the fourth optical coupler is connected with an 18 th pin of the integrated control chip;
and the twelfth resistor is connected between the output end of the fourth optocoupler and the first power supply.
5. The dual-channel ic trimming apparatus of claim 1, wherein the auxiliary burn-in selection circuit comprises:
the input end of the fifth optical coupler is connected to the 6 th pin of the integrated control chip through a thirteenth resistor, and the output end of the fifth optical coupler is connected with the first power supply through a fourteenth resistor;
the input end of the sixth optical coupler is connected with the 7 th pin of the integrated control chip through a fifteenth resistor, and the output end of the sixth optical coupler is connected with the cable interface through a sixteenth resistor;
a grid electrode of the third switch tube is connected with the output end of the fifth optocoupler, a source electrode of the third switch tube is connected with the first power supply, and a drain electrode of the third switch tube is connected with an auxiliary test end through a third diode;
a grid electrode of the fourth switch tube is connected with the output end of the sixth optocoupler, a source electrode of the fourth switch tube is connected with a second power supply, and a drain electrode of the fourth switch tube is connected with the auxiliary test end through a fourth diode;
the seventeenth resistor is connected between the auxiliary test end and the cable interface;
and the second capacitor is connected between the auxiliary test end and the cable interface.
6. The dual-channel ic trimming apparatus according to claim 1, wherein the 19 th pin and the 8 th pin of the ic are respectively connected to ground terminals;
and the 20 th pin of the integrated control chip is connected with the first power supply.
7. The dual-channel IC trimming apparatus according to claim 5, wherein the main burning selection circuit is pre-encoded with a burning modulation value table for determining the corresponding burning modulation object in the fuse selection timing sequence;
and the main burning and adjusting selection circuit continuously outputs the square wave signal with high level, and the fuse wire corresponding to the burning and adjusting object is blown out according to the burning and adjusting truth table.
8. The dual-channel IC trimming apparatus according to claim 3 or 5, wherein the first power supply is 5V;
the second power supply is 7V.
9. The dual-channel IC trimming apparatus according to claim 7, wherein the main test terminal and the auxiliary test terminal are both used simultaneously when the burning objects are at least two fuses.
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| CN201810871521.2A CN109450433B (en) | 2018-08-02 | 2018-08-02 | Double-circuit integrated circuit trimming device |
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| CN2599747Y (en) * | 2002-12-03 | 2004-01-14 | 比亚迪股份有限公司 | Resistance regulating device in integrated circuit |
| CN105470159A (en) * | 2015-11-17 | 2016-04-06 | 无锡中微腾芯电子有限公司 | Method for monitoring fuse burning yield rate in chip test |
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| DE10022767C2 (en) * | 2000-05-10 | 2002-03-28 | Infineon Technologies Ag | Address generator for generating addresses for an on-chip trim circuit |
| AUPR987002A0 (en) * | 2002-01-10 | 2002-01-31 | Australian Concrete Edging Pty Ltd | An automated gear selection mechanism |
| US7760008B2 (en) * | 2008-10-28 | 2010-07-20 | Avago Technologies Ecbu Ip (Singapore) Pte. Ltd. | Digital trimming in a microelectronic device |
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| CN2599747Y (en) * | 2002-12-03 | 2004-01-14 | 比亚迪股份有限公司 | Resistance regulating device in integrated circuit |
| CN105470159A (en) * | 2015-11-17 | 2016-04-06 | 无锡中微腾芯电子有限公司 | Method for monitoring fuse burning yield rate in chip test |
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Denomination of invention: A dual path integrated circuit tuning device Granted publication date: 20220805 Pledgee: China Minsheng Banking Corp Shanghai branch Pledgor: SHANGHAI SIMAT MICROELECTRONICS TECHNOLOGY CO.,LTD. Registration number: Y2024310000318 |
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