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CN109406443A - Composite insulator void defects method of discrimination, detection method, device and storage medium - Google Patents

Composite insulator void defects method of discrimination, detection method, device and storage medium Download PDF

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Publication number
CN109406443A
CN109406443A CN201811097089.2A CN201811097089A CN109406443A CN 109406443 A CN109406443 A CN 109406443A CN 201811097089 A CN201811097089 A CN 201811097089A CN 109406443 A CN109406443 A CN 109406443A
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void defects
composite insulator
echo
scanning
internal reflection
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CN201811097089.2A
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CN109406443B (en
Inventor
刘建军
张建国
周志成
陈大兵
李成钢
杨立恒
胡鹏
张晓琴
郭东亮
伍旺松
张中浩
梅红伟
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State Grid Corp of China SGCC
State Grid Jiangsu Electric Power Co Ltd
Shenzhen Graduate School Tsinghua University
Electric Power Research Institute of State Grid Jiangsu Electric Power Co Ltd
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State Grid Corp of China SGCC
State Grid Jiangsu Electric Power Co Ltd
Shenzhen Graduate School Tsinghua University
Electric Power Research Institute of State Grid Jiangsu Electric Power Co Ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G01N21/3586Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation by Terahertz time domain spectroscopy [THz-TDS]

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  • Spectroscopy & Molecular Physics (AREA)
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Abstract

The invention discloses a kind of composite insulator void defects method of discrimination, detection method, device and storage medium, the void defects method of discrimination includes: the surface reflection Terahertz echo and internal reflection Terahertz echo for acquiring composite insulator;The phase difference of gauging surface reflected terahertz hereby echo and internal reflection Terahertz echo;Calculate the Amplitude Ration of internal reflection Terahertz echo caused by previous THz wave scanning element and current THz wave scanning element;Internal air gap defect estimation is carried out to the composite insulator in conjunction with preset void defects criterion according to the phase difference, Amplitude Ration.Composite insulator void defects method of discrimination, detection method, device and storage medium provided by the invention, it is calculated by the Terahertz echo analysis to composite insulator and realizes composite insulator internal air gap defect estimation, it can accurately identify internal air gap defect, help to safeguard safe operation of electric network.

Description

Composite insulator void defects method of discrimination, detection method, device and storage medium
Technical field
The present invention relates to Terahertz technical field of nondestructive testing more particularly to a kind of composite insulator void defects differentiation sides Method, detection method, device and storage medium.
Background technique
Existing electric power composite insulator generally includes external jacket and internal core rod.External jacket generally uses silicon rubber Material is mainly used for insulation, environmental resistance;Internal core rod is set in external jacket, and generally cylindric solid construction is generally adopted With the epoxy resin composite material of glass fiber reinforcement, it is mainly used for bearing pulling force, while also has insulation performance.
In composite insulator manufacturing process and operational process, the interface of external jacket and internal core rod may occur point Layer is to form void defects, and this void defects can generate shelf depreciation, prolonged office under the action of high voltage electric field Portion's electric discharge will lead to the problems such as fracture or breakdown occur for composite insulator, influence safe operation of electric network.Therefore in composite insulator Before coming into operation, it is necessary to internal air gap defects detection is carried out to it, to exclude security risk.
Existing defect detecting technique includes ultrasonic detection technology and X-ray Testing Technology in the prior art, but due to multiple The epoxy resin composite material that interior insulator plug is glass fiber reinforcement is closed, there are the interfaces of a variety of high molecular materials, pass The detection techniques such as ultrasonic wave, the ray of system decay and interfere it is excessive due to, in detection composite insulator internal air gap etc. There are precision when defect it is low, discrimination is poor the problems such as.
Summary of the invention
It is an object of the invention to overcome deficiency in the prior art, a kind of composite insulator void defects differentiation side is provided Method, detection method, device and storage medium can significantly improve the void defects accuracy of identification of composite insulator.
In order to achieve the above objectives, the present invention adopts the following technical solutions realization:
In a first aspect, the present invention provides a kind of composite insulator void defects method of discrimination, which comprises
Acquire the surface reflection Terahertz echo and internal reflection Terahertz echo of composite insulator;
The phase difference of gauging surface reflected terahertz hereby echo and internal reflection Terahertz echo;
Calculate internal reflection Terahertz echo caused by previous THz wave scanning element and current THz wave scanning element Amplitude Ration;
According to the phase difference, Amplitude Ration in conjunction with preset void defects criterion in composite insulator progress Portion's void defects differentiate.
Second aspect, the present invention provides a kind of composite insulator void defects discriminating gears, comprising:
Acquisition module: for acquiring the surface reflection Terahertz echo and internal reflection Terahertz echo of composite insulator;
Phase difference calculating module: the phase for gauging surface reflected terahertz hereby echo and internal reflection Terahertz echo Difference;
Amplitude Ration computing module: for calculating caused by previous THz wave scanning element and current THz wave scanning element The Amplitude Ration of internal reflection Terahertz echo;
Discrimination module: it is used for according to the phase difference, Amplitude Ration in conjunction with preset void defects criterion to described multiple It closes insulator and carries out internal air gap defect estimation.
The third aspect the present invention also provides a kind of composite insulator void defects discriminating gear, including processor and is deposited Storage media;
The storage medium is for storing instruction;
The processor according to described instruction for being operated to execute the step of method according to claim 1 or claim 2 Suddenly.
Fourth aspect, the present invention provides a kind of computer readable storage mediums, are stored thereon with computer program, the journey The step of first aspect the method is realized when sequence is executed by processor.
5th aspect, the present invention provides a kind of composite insulator void defects detection methods, which comprises
Tested composite insulator void defects are differentiated using method described in first aspect;
When differentiation result is to calculate the time required to being incident to void defects according to THz wave there are when internal air gap defect Depth locating for void defects;
The height of void defects is calculated the time required to passing through void defects according to THz wave;
According to the internal reflection Terahertz echo curve of the air-gap-free defect area of tested composite insulator, there are void defects The internal reflection Terahertz echo curve in region, determines the circumferential direction and axial dimension of void defects.
6th aspect, the present invention provides a kind of composite insulator void defects detection devices, comprising: described in second aspect Discriminating gear, further includes:
Depth calculation module: when differentiation result is to be incident to air gap there are when internal air gap defect according to THz wave and lack Depth locating for void defects is calculated the time required to falling into;
Height computing module: for calculating the height of void defects the time required to passing through void defects according to THz wave;
Scale determining module: for being returned according to the internal reflection Terahertz for the air-gap-free defect area for being tested composite insulator Wave profile, the internal reflection Terahertz echo curve for having void defects region, determine the circumferential direction and axial dimension of void defects.
7th aspect the present invention also provides a kind of composite insulator void defects detection device, including processor and is deposited Storage media;
The storage medium is for storing instruction;
The processor is used for the step of being operated according to described instruction to execute according to first aspect the method.
Eighth aspect, the present invention provides a kind of computer readable storage mediums, are stored thereon with computer program, special The step of sign is, first aspect the method is realized when which is executed by processor.
Based on the above-mentioned technical proposal, composite insulator void defects method of discrimination provided by the invention, detection method, device And storage medium, it is calculated by the Terahertz echo analysis to composite insulator and realizes that composite insulator internal air gap defect is sentenced Not;And by further can accurately detect void defects present position, week to the analytical calculation of Terahertz echo curve To and axial dimension, the spatial distribution of defect area can be accurately obtained and to defective locations and size with the shape of space curve figure Formula is intuitively shown, is facilitated equipment operation maintenance personnel and is judged whether defect severity, assessment equipment under test performance meet the requirements.
Detailed description of the invention
Fig. 1 is the signal for generating Terahertz echo in the embodiment of the present invention using the THz wave scanning compound inslation period of the day from 11 p.m. to 1 a.m Figure;
Fig. 2 is the cross-sectional view that compound inslation subsample is detected in the embodiment of the present invention;
Fig. 3 is that composite insulator sample defects position and the echo ratio without defective locations are detected in the embodiment of the present invention Compared with figure;
Fig. 4 is that composite insulator sample defects ranged space curve is detected in the embodiment of the present invention;
In figure: 1, external jacket;2, internal core rod;3, void defects.
Specific embodiment
The invention will be further described below in conjunction with the accompanying drawings.Following embodiment is only used for clearly illustrating the present invention Technical solution, it is clear that the described embodiments are merely a part of the embodiments of the present invention, rather than whole embodiments, cannot It is limited the scope of the invention with this.
It should be appreciated that THz wave, which enters another medium from a kind of medium, necessarily leads to Terahertz echo.The present invention is real Vertical incidence scanning acquisition can be carried out to composite insulator by THz wave by applying the Terahertz echo in example, and terahertz is used in scanning Hereby wave waveform has 2 wave crests and 2 troughs, and frequency range is 0.1~2THz, spectral resolution 0.357GHz.This field Technical staff is it is to be understood that the penetration power of the scanning THz wave can pass through in the entrance of external jacket 1 of composite insulator Portion's plug 2, but it is not enough to penetrate the entire internal core rod 2 of composite insulator, it is specific as shown in Figure 1, scanning THz wave A0 When carrying out vertical circumferential scanning to composite insulator, air-gap-free defect area only generates two kinds of Terahertz echoes, specifically includes: by The surface reflection Terahertz echo A that external jacket 1 reflectsr1With the internal reflection Terahertz echo reflected by internal core rod 2 Ar2;There is void defects region then can and to be merely able to generate three kinds of Terahertz echoes, specifically includes: being reflected by external jacket 1 Surface reflection Terahertz echo Ar1, the internal reflection Terahertz echo A that is reflected by 3 outer surface of void defectsr3(i.e. terahertz Generated internal reflection Terahertz echo when hereby wave injects void defects 3 from external jacket 1) and by 3 inner surface of void defects The internal reflection Terahertz echo A reflectedr4(i.e. THz wave is injected internal anti-caused by internal core rod 2 from void defects 3 Penetrate Terahertz echo).
Composite insulator void defects method of discrimination provided in an embodiment of the present invention, includes the following steps:
Step 101: acquiring the surface reflection Terahertz echo and internal reflection Terahertz echo of composite insulator;
Step 102: the phase difference of gauging surface reflected terahertz hereby echo and internal reflection Terahertz echo;
For there are the region of internal air gap defect, void defects surfaces externally and internally will generate a kind of internal reflection terahertz respectively Hereby echo should calculate separately the phase difference of surface reflection Terahertz echo and two kinds of internal reflection Terahertz echoes;
Step 103: calculating internal reflection caused by previous THz wave scanning element and current THz wave scanning element too The Amplitude Ration of hertz echo.
Since the refractive index of air and the refractive index of silastic material are different, so THz wave is injected from silastic material The internal reflection Terahertz echo that void defects generate injects epoxy resin composite wood from silastic material compared to THz wave Expect that the amplitude of the internal reflection Terahertz echo generated can mutate.
Step 104: according to the phase difference, Amplitude Ration in conjunction with preset void defects criterion to the compound inslation Son carries out internal air gap defect estimation.
As shown in Figure 1, THz wave generates echo, the reflection coefficient of echo in the meeting of heterogeneous interface(n′1Refractive index, n' for the 1st kind of material2For the refractive index of the 2nd kind of material, A0For incident Terahertz Wave amplitude, Ar1For the Terahertz echo amplitude of the 1st kind of material).When composite insulator is there are when internal air gap defect, due to air Refractive index be less than the refractive index of silastic material, therefore in air-silicon rubber interface echo Ar1With silicon rubber-air gap interface Echo Ar2It will appear 180 ° of phase of reversion.
Therefore, void defects criterion described in step 104 include:
Phase difference=± 180 ° and there are Amplitude Rations if it existsThen determine current THz wave Scanning element is there are internal air gap defect, in formula: n1Refractive index, n for air2For the refraction for being tested composite insulator external jacket Rate, n3For the refractive index for being tested composite insulator internal core rod;Otherwise, it is determined that internal gas is not present in current THz wave scanning element Gap defect.
Specifically, being 1 according to air refraction, silicon rubber refractive index is 1.886, epoxy resin refractive index is 2.289, meter Calculation obtains Amplitude Ration=3.65.
Composite insulator void defects discriminating gear provided in an embodiment of the present invention, can be used for executing compound inslation above-mentioned Sub- void defects method of discrimination, comprising:
Acquisition module: for acquiring the surface reflection Terahertz echo and internal reflection Terahertz echo of composite insulator;
Phase difference calculating module: the phase for gauging surface reflected terahertz hereby echo and internal reflection Terahertz echo Difference;
Amplitude Ration computing module: for calculating caused by previous THz wave scanning element and current THz wave scanning element The Amplitude Ration of internal reflection Terahertz echo;
Discrimination module: it is used for according to the phase difference, Amplitude Ration in conjunction with preset void defects criterion to described multiple It closes insulator and carries out internal air gap defect estimation.
The embodiment of the invention also provides a kind of composite insulator void defects discriminating gears, including processor and storage to be situated between Matter;
The storage medium is for storing instruction;
The processor according to described instruction for being operated to execute aforementioned composite insulator void defects differentiation side The step of method.
The embodiment of the invention also provides a kind of computer readable storage mediums, are stored thereon with computer program, the journey The step of aforementioned composite insulator void defects method of discrimination is realized when sequence is executed by processor.
Based on the above-mentioned technical proposal, composite insulator void defects method of discrimination provided by the invention, device and storage are situated between Matter is calculated by the Terahertz echo analysis to composite insulator and realizes composite insulator internal air gap defect estimation, Neng Goujing True ground identifies internal air gap defect, helps to safeguard safe operation of electric network.
Composite insulator void defects detection method provided in an embodiment of the present invention can use composite insulator above-mentioned Void defects method of discrimination carries out void defects differentiation, specifically comprises the following steps:
Step 201: acquiring the surface reflection Terahertz echo and internal reflection Terahertz echo of composite insulator;
Step 202: the phase difference of gauging surface reflected terahertz hereby echo and internal reflection Terahertz echo;
Step 203: calculating internal reflection caused by previous THz wave scanning element and current THz wave scanning element too The Amplitude Ration of hertz echo.
Step 204: according to the phase difference, Amplitude Ration in conjunction with preset void defects criterion to the compound inslation Son carries out internal air gap defect estimation.
Void defects criterion includes:
Phase difference=± 180 ° and there are Amplitude Rations if it existsThen determine current THz wave Scanning element is there are internal air gap defect, in formula: n1Refractive index, n for air2For the refraction for being tested composite insulator external jacket Rate, n3For the refractive index for being tested composite insulator internal core rod;Otherwise, it is determined that internal gas is not present in current THz wave scanning element Gap defect.
Step 205: when differentiating that result is there are when internal air gap defect, needed for being incident to void defects according to THz wave Time calculates depth locating for void defects, specific as follows:
In formula: L indicates depth locating for void defects;0.5·△t1Indicate that THz wave is incident to void defects and is taken Between;Δt1=t1-t0, t0Expression collect tested surface of composite insulator reflected terahertz hereby echo at the time of, t1Expression collects At the time of THz wave injects the internal reflection Terahertz echo generated when void defects;C indicates that THz wave is aerial Spread speed.
Step 206: the height of void defects is calculated the time required to passing through void defects according to THz wave, specific as follows:
H=0.5* Δ t2*c (2)
In formula: h indicates the height of void defects, 0.5* Δ t2The time required to indicating that THz wave passes through void defects;Δt2 =t2-t1, t1At the time of indicating that collecting THz wave injects the internal reflection Terahertz echo generated when void defects;t2Table At the time of showing that collecting THz wave projects the internal reflection Terahertz echo generated when void defects, c indicates that THz wave exists Spread speed in air.
Step 207: according to the internal reflection Terahertz echo curve of the air-gap-free defect area of tested composite insulator, having The internal reflection Terahertz echo curve in void defects region, determines the circumferential direction and axial dimension of void defects.
Wherein determine that the circumferential direction of void defects and the method for axial dimension specifically include:
S207a: the circumferential THz wave scanning of tested composite insulator progress is obtained according to default axial scan step-length and is produced Raw total internal reflection Terahertz echo curve group;
S207b: it is calculated in same scanning circumference in air-gap-free defect area according to internal reflection Terahertz echo curve The average value of portion's reflected terahertz hereby echo amplitude, and datum curve is generated according to average value;
S207c: the internal reflection Terahertz echo of each air-gap-free defect area scanning element in same scanning circumference is calculated The 2- norm of curve and datum curve, is denoted as set X;
S207d: with maximum value x in XmaxCorresponding internal reflection Terahertz echo curve is new datum curve, is calculated same The internal reflection Terahertz echo curve of each void defects sector scanning point and the 2- of new datum curve in one scanning circumference Norm is denoted as set Y;
S207e: by the element of the element of set X in same scanning circumference and set Y according to the scanning space of THz wave Sequence is ranked up, and the number of circumferentially continuous void defects sector scanning point and the product of default circumferential scanning step-length are that this is swept Retouch the circumferential scale that circumference corresponds to void defects;
Assuming that X={ x1,x2,……,xn, wherein xnIndicate the internal reflection of n-th of air-gap-free defect area scanning element too The 2- norm of hertz echo curve and the datum curve difference value vector in entire wavelength band, n are equal to nothing in same scanning circumference The total number of void defects sector scanning point;Y={ y1,y2,……,ym, wherein ymIndicate m-th of void defects sector scanning The reflection echo of external jacket (silastic material) and internal core rod (epoxide resin material) void defects interface is injected at point.
With the 2- norm of new datum curve difference value vector in entire wavelength band;According to the scanning space of THz wave Sequence after sequence sorts is { x1,x2,…xi,y1,y2... ym,xi+1…,xn, then the circumferential scale of void defects is m △ R, △ r are circumferential scanning step-length.
S207f: by the element of the element of the corresponding set X of all scanning circumference and set Y according to the scanning of THz wave Spatial order is ranked up, and the product of the number and default axial scan step-length of axially consecutive void defects sector scanning point is Void defects axial dimension.
The method of the circumferential direction and axial dimension that determine void defects is done further specifically combined with specific embodiments below It is bright.
As shown in Fig. 2, being the cross-sectional view for being detected compound inslation subsample, along the circumferential direction using THz wave It is scanned detection, each detection interval is 18 °, 20 points of detection in one week.It has detected after a week, has been axially moveable compound inslation Son, step-length 0.5mm, scanning area axial overall length are 8mm.
As shown in figure 3, being THz wave is vertically injected to composite insulator to be scanned according to default circumferential step-length to be obtained The Terahertz reflectogram taken, waveform indicated by a is to have Terahertz echo caused by void defects region in figure, indicated by b Waveform be Terahertz echo caused by air-gap-free defect area, the wave crest that " ☆ " is marked is that corresponding scanning element surface is anti- Terahertz echo is penetrated, the wave crest that " " is marked is that THz wave is injected inside caused by void defects too as external jacket Hertz echo, the wave crest that "○" is marked are THz wave internal Terahertz as caused by void defects injection internal core rod Echo, remaining wave crest are then reflection at peak of the THz wave inside composite insulator after multiple catadioptric.
According to Fig. 3, the time delay at the peak " ☆ " and the peak " " is 23.74ps, according to formula (1), it is contemplated that external jacket uses Silastic material, refractive index 1.6, is calculated as follows:
The depth that can get void defects is 2.2mm.
The time delay at the peak " " and "○" peak is that 9.8ps is calculated as follows according to formula (2):
H=0.5* Δ t2* c=0.5*9.8*3*10-4=0.00147mm
Can get void defects height is 1.47mm.
As shown in figure 4, the 2- norm of the Terahertz echo curve of zero defect each point and datum curve is most in a circumferential direction Big value is 0.30, and the 2- norm maximum value of the Terahertz echo curve of void defects position and datum curve is 0.80.Air gap Defect in circumferential range for the π of 1.10 π~1.45 between, i.e., 198 °~261 ° ranges since starting point, defect maximum time Wave position passes through void defects region in 2- norm image axial direction continuity from above at 225 °, it is known that the axial length of defect For 8mm.
Composite insulator void defects detection device provided in an embodiment of the present invention can be used for executing above-mentioned compound exhausted Edge void defects detection method, specifically includes:
Discriminating gear: for differentiating composite insulator with the presence or absence of internal air gap defect;
Depth calculation module: when differentiation result is to be incident to air gap there are when internal air gap defect according to THz wave and lack Depth locating for void defects is calculated the time required to falling into;
Height computing module: for calculating the height of void defects the time required to passing through void defects according to THz wave;
Scale determining module: for being returned according to the internal reflection Terahertz for the air-gap-free defect area for being tested composite insulator Wave profile, the internal reflection Terahertz echo curve for having void defects region, determine the circumferential direction and axial dimension of void defects.
Wherein, discriminating gear can carry out void defects differentiation using aforementioned composite insulator void defects method of discrimination, It can specifically include following module structure:
Acquisition module: for acquiring the surface reflection Terahertz echo and internal reflection Terahertz echo of composite insulator;
Phase difference calculating module: the phase for gauging surface reflected terahertz hereby echo and internal reflection Terahertz echo Difference;
Amplitude Ration computing module: for calculating caused by previous THz wave scanning element and current THz wave scanning element The Amplitude Ration of internal reflection Terahertz echo;
Discrimination module: it is used for according to the phase difference, Amplitude Ration in conjunction with preset void defects criterion to described multiple It closes insulator and carries out internal air gap defect estimation.
Discriminating gear can also use such as flowering structure, specifically:
Including processor and storage medium;
The storage medium is for storing instruction;
The processor according to described instruction for being operated to execute aforementioned composite insulator void defects differentiation side The step of method.
Wherein, the scale determining module includes:
It obtains module: being swept for obtaining the tested circumferential THz wave of composite insulator progress according to default axial scan step-length Total internal reflection Terahertz echo curve group caused by retouching;
Datum curve generation module: for being calculated in same scanning circumference according to internal reflection Terahertz echo curve without gas The average value of the internal reflection Terahertz echo amplitude of gap defect area, and datum curve is generated according to average value;
First 2- norm calculation module: for calculating in same scanning circumference in each air-gap-free defect area scanning element The 2- norm of portion's reflected terahertz hereby echo curve and datum curve, is denoted as set X;
2nd 2- norm calculation module: for maximum value x in XmaxCorresponding internal reflection Terahertz echo curve is new Datum curve, calculate it is same scanning circumference in each void defects sector scanning point internal reflection Terahertz echo curve with The 2- norm of new datum curve, is denoted as set Y;
Circumferential scale determining module: for by it is same scanning circumference in set X element and set Y element according to terahertz Hereby the scanning space sequence of wave is ranked up, the number and default circumferential scanning step-length of circumferentially continuous void defects sector scanning point Product be circumferential scale that the scanning circumference corresponds to void defects;
Axial dimension determining module: for by the element of the elements of the corresponding set X of all scanning circumference and set Y according to The scanning space sequence of THz wave is ranked up, the number of axially consecutive void defects sector scanning point and default axial scan The product of step-length is void defects axial dimension.
The embodiment of the invention also provides a kind of composite insulator void defects detection devices, including processor and storage to be situated between Matter;
The storage medium is for storing instruction;
The processor according to described instruction for being operated to execute aforementioned composite insulator void defects detection side The step of method.
The embodiment of the invention also provides a kind of computer readable storage mediums, are stored thereon with computer program, special The step of sign is, which realizes aforementioned composite insulator void defects detection method when being executed by processor.
Based on the above-mentioned technical proposal, composite insulator void defects detection method provided by the invention, device and storage are situated between Matter is calculated by the Terahertz echo analysis to composite insulator and realizes composite insulator internal air gap defect estimation, can not only It is enough accurately to identify internal air gap defect, the spatial distribution of defect area can also be accurately obtained and to defective locations and size It is shown with the formal intuition of space curve figure, facilitates equipment operation maintenance personnel and judge defect severity, assess equipment under test Whether can meet the requirements.
It should be understood by those skilled in the art that, embodiments herein can provide as method, system or computer program Product.Therefore, complete hardware embodiment, complete software embodiment or reality combining software and hardware aspects can be used in the application Apply the form of example.Moreover, it wherein includes the computer of computer usable program code that the application, which can be used in one or more, The computer program implemented in usable storage medium (including but not limited to magnetic disk storage, CD-ROM, optical memory etc.) produces The form of product.
The application is referring to method, the process of equipment (system) and computer program product according to the embodiment of the present application Figure and/or block diagram describe.It should be understood that every one stream in flowchart and/or the block diagram can be realized by computer program instructions The combination of process and/or box in journey and/or box and flowchart and/or the block diagram.It can provide these computer programs Instruct the processor of general purpose computer, special purpose computer, Embedded Processor or other programmable data processing devices to produce A raw machine, so that being generated by the instruction that computer or the processor of other programmable data processing devices execute for real The device for the function of being specified in present one or more flows of the flowchart and/or one or more blocks of the block diagram.
These computer program instructions, which may also be stored in, is able to guide computer or other programmable data processing devices with spy Determine in the computer-readable memory that mode works, so that it includes referring to that instruction stored in the computer readable memory, which generates, Enable the manufacture of device, the command device realize in one box of one or more flows of the flowchart and/or block diagram or The function of being specified in multiple boxes.
These computer program instructions also can be loaded onto a computer or other programmable data processing device, so that counting Series of operation steps are executed on calculation machine or other programmable devices to generate computer implemented processing, thus in computer or The instruction executed on other programmable devices is provided for realizing in one or more flows of the flowchart and/or block diagram one The step of function of being specified in a box or multiple boxes.
The above is only a preferred embodiment of the present invention, it is noted that for the ordinary skill people of the art For member, without departing from the technical principles of the invention, several improvement and deformations can also be made, these improvement and deformations Also it should be regarded as protection scope of the present invention.

Claims (13)

1. composite insulator void defects method of discrimination, which is characterized in that the described method includes:
Acquire the surface reflection Terahertz echo and internal reflection Terahertz echo of composite insulator;
The phase difference of gauging surface reflected terahertz hereby echo and internal reflection Terahertz echo;
Calculate the width of internal reflection Terahertz echo caused by previous THz wave scanning element and current THz wave scanning element Value ratio;
Internal gas is carried out to the composite insulator in conjunction with preset void defects criterion according to the phase difference, Amplitude Ration Gap defect estimation.
2. composite insulator void defects method of discrimination according to claim 1, which is characterized in that the void defects are sentenced Other condition includes:
If it exists phase difference=± 180 ° andThen determine current THz wave scanning Point is there are internal air gap defect, in formula: n1Refractive index, n for air2For the refractive index for being tested composite insulator external jacket, n3 For the refractive index for being tested composite insulator internal core rod;
Otherwise, it is determined that internal air gap defect is not present in current THz wave scanning element.
3. composite insulator void defects discriminating gear characterized by comprising
Acquisition module: for acquiring the surface reflection Terahertz echo and internal reflection Terahertz echo of composite insulator;
Phase difference calculating module: the phase difference for gauging surface reflected terahertz hereby echo and internal reflection Terahertz echo;
Amplitude Ration computing module: internal caused by previous THz wave scanning element and current THz wave scanning element for calculating The Amplitude Ration of reflected terahertz hereby echo;
Discrimination module: it is used for according to the phase difference, Amplitude Ration in conjunction with preset void defects criterion to described compound exhausted Edge carries out internal air gap defect estimation.
4. composite insulator void defects discriminating gear, which is characterized in that including processor and storage medium;
The storage medium is for storing instruction;
The processor is for the step of being operated according to described instruction to execute method according to claim 1 or claim 2.
5. computer readable storage medium is stored thereon with computer program, which is characterized in that when the program is executed by processor The step of realizing method as claimed in claim 1 or 2.
6. composite insulator void defects detection method, which is characterized in that the described method includes:
Tested composite insulator void defects are differentiated using method of any of claims 1 or 2;
When differentiation result is to calculate air gap the time required to being incident to void defects according to THz wave there are when internal air gap defect Depth locating for defect;
The height of void defects is calculated the time required to passing through void defects according to THz wave;
According to the internal reflection Terahertz echo curve of the air-gap-free defect area of tested composite insulator, there is void defects region Internal reflection Terahertz echo curve, determine the circumferential direction and axial dimension of void defects.
7. composite insulator void defects detection method according to claim 6, which is characterized in that counted using formula (1) Calculate depth locating for void defects:
In formula: L indicates depth locating for void defects;0.5·Δt1The time required to indicating that THz wave is incident to void defects;Δ t1=t1-t0, t0Expression collect tested surface of composite insulator reflected terahertz hereby echo at the time of, t1Expression collects Terahertz At the time of wave injects the internal reflection Terahertz echo generated when void defects;C indicates the aerial propagation speed of THz wave Degree;n2Indicate the refractive index of tested composite insulator external jacket.
8. composite insulator void defects detection method according to claim 6, which is characterized in that counted using formula (2) Calculate the height of void defects:
H=0.5* Δ t2*c (2)
In formula: h indicates the height of void defects, 0.5* Δ t2The time required to indicating that THz wave passes through void defects;Δt2= t2-t1, t1At the time of indicating that collecting THz wave injects the internal reflection Terahertz echo generated when void defects;t2It indicates At the time of the internal reflection Terahertz echo generated when collecting THz wave injection void defects, c indicates THz wave in sky Spread speed in gas.
9. composite insulator void defects detection method according to claim 6, which is characterized in that determine void defects Circumferential direction and the method for axial dimension include:
Tested composite insulator is obtained according to default axial scan step-length to carry out in whole caused by circumferential THz wave scanning Portion's reflected terahertz hereby echo curve group;
The internal reflection terahertz of air-gap-free defect area in same scanning circumference is calculated according to internal reflection Terahertz echo curve The hereby average value of echo amplitude, and datum curve is generated according to average value;
Calculate the internal reflection Terahertz echo curve and benchmark of each air-gap-free defect area scanning element in same scanning circumference The 2- norm of curve, is denoted as set X;
With maximum value x in XmaxCorresponding internal reflection Terahertz echo curve is new datum curve, calculates same scanning circumference The 2- norm of the internal reflection Terahertz echo curve of interior each void defects sector scanning point and new datum curve, is denoted as collection Close Y;
The element of set X in same scanning circumference and the element of set Y are arranged according to the scanning space sequence of THz wave Sequence, the number of circumferentially continuous void defects sector scanning point are that the scanning circumference is corresponding with the product of default circumferential scanning step-length The circumferential scale of void defects;
By the element of the elements of the corresponding set X of all scanning circumference and set Y according to THz wave scanning space sequentially into Row sequence, the number of axially consecutive void defects sector scanning point and the product of default axial scan step-length are void defects axis To scale.
10. composite insulator void defects detection device characterized by comprising discriminating gear described in claim 3 or 4, Further include:
Depth calculation module: when differentiation result is to be incident to void defects institute according to THz wave there are when internal air gap defect It takes time and calculates depth locating for void defects;
Height computing module: for calculating the height of void defects the time required to passing through void defects according to THz wave;
Scale determining module: for bent according to the internal reflection Terahertz echo for the air-gap-free defect area for being tested composite insulator Line, the internal reflection Terahertz echo curve for having void defects region, determine the circumferential direction and axial dimension of void defects.
11. composite insulator void defects detection device according to claim 10, which is characterized in that the scale determines Module includes:
It obtains module: scanning institute for obtaining the tested circumferential THz wave of composite insulator progress according to default axial scan step-length The total internal reflection Terahertz echo curve group of generation;
Datum curve generation module: it is lacked for calculating air-gap-free in same scanning circumference according to internal reflection Terahertz echo curve The average value of the internal reflection Terahertz echo amplitude in region is fallen into, and datum curve is generated according to average value;
First 2- norm calculation module: the inside for calculating each air-gap-free defect area scanning element in same scanning circumference is anti- The 2- norm for penetrating Terahertz echo curve and datum curve, is denoted as set X;
2nd 2- norm calculation module: for maximum value x in XmaxCorresponding internal reflection Terahertz echo curve is new base Directrix curve calculates the internal reflection Terahertz echo curve of each void defects sector scanning point in same scanning circumference and new The 2- norm of datum curve, is denoted as set Y;
Circumferential scale determining module: for by it is same scanning circumference in set X element and set Y element according to THz wave Scanning space sequence be ranked up, the number of circumferentially continuous void defects sector scanning point and multiplying for default circumferential scanning step-length Product is the circumferential scale that the scanning circumference corresponds to void defects;
Axial dimension determining module: for by the element of the elements of the corresponding set X of all scanning circumference and set Y according to terahertz Hereby the scanning space sequence of wave is ranked up, the number and default axial scan step-length of axially consecutive void defects sector scanning point Product be void defects axial dimension.
12. composite insulator void defects detection device, which is characterized in that including processor and storage medium;
The storage medium is for storing instruction;
The processor is used to operated according to described instruction to execute according to any one of claim 6~9 the method Step.
13. computer readable storage medium is stored thereon with computer program, which is characterized in that the program is executed by processor The step of any one of Shi Shixian claim 6~9 the method.
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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110554049A (en) * 2019-09-23 2019-12-10 清华大学深圳国际研究生院 composite insulator defect detection device and method based on terahertz wave, and medium
CN110579483A (en) * 2019-09-24 2019-12-17 清华大学深圳国际研究生院 Terahertz wave-based internal defect imaging device and method and readable storage medium
CN110609216A (en) * 2019-11-03 2019-12-24 西南交通大学 Motor train unit cable terminal fault positioning method
CN112241943A (en) * 2019-07-01 2021-01-19 云南电网有限责任公司玉溪供电局 Composite insulator detection method and system based on microwave imaging technology

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102680815A (en) * 2012-04-16 2012-09-19 中国南方电网有限责任公司超高压输电公司天生桥局 Method and system for detecting composite insulator interface
CN104458907A (en) * 2014-10-15 2015-03-25 南方电网科学研究院有限责任公司 Ultrasonic detection method and automatic rotary flaw detection device for composite insulator

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102680815A (en) * 2012-04-16 2012-09-19 中国南方电网有限责任公司超高压输电公司天生桥局 Method and system for detecting composite insulator interface
CN104458907A (en) * 2014-10-15 2015-03-25 南方电网科学研究院有限责任公司 Ultrasonic detection method and automatic rotary flaw detection device for composite insulator

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
L.CHENG ET AL.: "Research of Nondestructive Methods to Test Defects Hidden within Composite Insulators Based on THz Time-domain Spectroscopy Technology", 《IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION》 *
邢砾云: "航空泡沫芯材及夹层结构的太赫兹无损检测研究", 《中国博士学位论文全文数据库 工程科技Ⅱ辑》 *

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112241943A (en) * 2019-07-01 2021-01-19 云南电网有限责任公司玉溪供电局 Composite insulator detection method and system based on microwave imaging technology
CN110554049A (en) * 2019-09-23 2019-12-10 清华大学深圳国际研究生院 composite insulator defect detection device and method based on terahertz wave, and medium
CN110554049B (en) * 2019-09-23 2021-11-09 清华大学深圳国际研究生院 Composite insulator defect detection device and method based on terahertz wave, and medium
CN110579483A (en) * 2019-09-24 2019-12-17 清华大学深圳国际研究生院 Terahertz wave-based internal defect imaging device and method and readable storage medium
CN110579483B (en) * 2019-09-24 2021-09-07 清华大学深圳国际研究生院 Terahertz wave-based internal defect imaging device and method and readable storage medium
CN110609216A (en) * 2019-11-03 2019-12-24 西南交通大学 Motor train unit cable terminal fault positioning method

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