CN109187316B - A method for discriminating speckle steering of interferometric defocused images based on autocorrelation - Google Patents
A method for discriminating speckle steering of interferometric defocused images based on autocorrelation Download PDFInfo
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- CN109187316B CN109187316B CN201811037322.8A CN201811037322A CN109187316B CN 109187316 B CN109187316 B CN 109187316B CN 201811037322 A CN201811037322 A CN 201811037322A CN 109187316 B CN109187316 B CN 109187316B
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- 238000003384 imaging method Methods 0.000 claims abstract description 11
- 238000012850 discrimination method Methods 0.000 claims description 4
- 238000005259 measurement Methods 0.000 abstract description 8
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Abstract
本发明公开了一种基于自相关的干涉离焦像散斑转向判别方法，该方法包括以下步骤：步骤(1)、利用干涉粒子成像系统，获取任意转向下透明椭球粒子的干涉离焦像；步骤(2)、利用MATLAB对干涉离焦像进行自相关处理，对自相关处理的结果图像进行二值化处理，得到自相关处理的中心亮斑；步骤(3)、利用椭圆圈出亮斑，沿椭圆长轴方向画线得到亮斑转向；步骤(4)、步骤(3)中的亮斑转向即干涉离焦像散斑转向。本发明可以实现粒子干涉离焦像的散斑转向判别，进而实现粒子的转向判别，为复杂粒子场测量提供技术支持。
The invention discloses a method for discriminating the speckle turning of an interference defocused image based on autocorrelation. The method includes the following steps: Step (1), using an interference particle imaging system to obtain the interference defocus image of a transparent ellipsoid particle under arbitrary turning. ; Step (2), utilize MATLAB to carry out autocorrelation processing to the interference defocused image, carry out binarization processing to the result image of autocorrelation processing, obtain the center bright spot of autocorrelation processing; Step (3), utilize elliptical circle to highlight The bright spot turning is obtained by drawing a line along the direction of the long axis of the ellipse; the bright spot turning in steps (4) and (3) is the speckle turning of the interference defocused image. The invention can realize the speckle steering discrimination of the particle interference defocus image, and then realize the steering discrimination of the particles, and provide technical support for the complex particle field measurement.
Description
Technical Field
The invention relates to the technical field of measurement of ellipsoidal particles in an optical system, in particular to a method for distinguishing speckle turning of an interference defocused image of a complex particle.
Background
The interference particle imaging method has the advantages of high precision, wide measurement range, non-contact and the like, the research technology is mature, most of research objects are spherical particles with the same size, and the information such as the size, the movement speed, the concentration and the like of the particles can be obtained by processing the interference focusing image and the interference defocusing image. Suspended particles in the atmosphere contain a large number of non-spherical particles, the shape of the particles is close to an ellipsoid, the aspect ratio and the surface curvature and the steering of the ellipsoid particles can influence scattered light distribution, further influence the speckle distribution of interference defocused images, the change of particle steering causes the change of speckle steering of the interference defocused images, and the steering information of the ellipsoid particles can be obtained by analyzing the speckle steering of the interference defocused images, so that the speckle steering judgment of the interference defocused images has important significance in the measurement of the ellipsoid particles.
In the measurement of the transparent ellipsoid particles by using the interference particle imaging technology, patent CN103868831A proposes a cloud particle spectral distribution measurement method and measurement system, which uses an interference particle imaging system to collect an interference defocused image of particles and a depolarized interference defocused image, and distinguishes the phase state of the cloud particles by distinguishing the two images.
At present, no example for realizing speckle steering discrimination of the interference out-of-focus image through an autocorrelation algorithm exists.
Disclosure of Invention
On the basis of the prior art, the invention provides an interference defocused image speckle steering distinguishing method based on autocorrelation, which obtains speckle steering through autocorrelation processing of an interference defocused image and is suitable for measurement of transparent ellipsoid particles in an optical system.
The invention discloses an interference out-of-focus image speckle steering discrimination method based on autocorrelation, which comprises the following steps:
and 4, steering the bright spots in the step 3, namely steering the interference defocused image speckles.
The method can realize speckle turning discrimination of the interference defocused image of the transparent ellipsoid particles, further realize turning discrimination of the transparent ellipsoid particles, and provide technical support for complex particle field measurement.
Reference numerals
FIG. 1 is a flow chart of the interference out-of-focus image speckle steering discrimination method based on autocorrelation.
FIG. 2 is a block diagram of an example interference particle imaging system, wherein: 1. the device comprises a laser, 2, a microscope objective, 3, a spatial filter, 4, a collimating lens, 5, a first cylindrical mirror, 6, a second cylindrical mirror, 7, a glass slide, 8, an imaging lens, 9 and a CCD.
FIG. 3 is a schematic diagram of an interference defocused image and a processing result, wherein: (a) - (d) is a transparent ellipsoidal particle interference defocused image with different speckle steering; (e) - (h) is the result of autocorrelation processing of the interference defocused image; (i) - (l) a combined image of interferometric out-of-focus image speckle magnification and interferometric out-of-focus image autocorrelation bright spot magnification.
Detailed Description
Embodiments of the present invention will be described in further detail below with reference to the accompanying drawings.
Example 1: interference particle imaging system
An interference particle imaging system adopted by the invention is shown in figure 2, the wavelength of laser beam emitted by a laser 1 is 532nm, the maximum output power is 6W, the laser beam is expanded by a microscope objective lens 2, filtered by a spatial filter 3 and collimated by a collimating lens 4, and then compressed into a sheet-shaped laser beam with the thickness of 1mm by a first cylindrical mirror 5 and a second cylindrical mirror 6, an imaging lens 8 for collecting particle scattered light is a Nikon 50mm f/1.4D focusing lens, a receiving device 9 is a CCD with the pixel size of 6.45 mu m and the effective pixel number of 1384 multiplied by 1036, the scattering angle theta of the system is 90 degrees, the magnification of the system is 1.67, the object distance is 79.88mm, the image distance is 133.68mm, the particle to be detected is an ellipsoid particle obtained by stretching polystyrene spherical particle with the particle size of 80 mu m, and the axial ratio range of the long particle and the short particle of the ellipsoid is 1.5-2.5.
In the observation process, the particles are distributed on the glass slide 7 in any direction, and the glass slide is parallel to a receiving plane of the CCD9 positioned on the defocused image surface, so that the ellipsoid particles only have a deflection angle on the plane, and interference defocused images of the transparent ellipsoid particles under different speckle turning directions are collected.
Example 2: and (3) obtaining a processing result of the speckle turning of the transparent ellipsoid particle interference defocused image by adopting an autocorrelation processing algorithm, and comparing the processing result:
FIG. 3 is a schematic diagram of an interference defocused image and a processing result. Wherein: (a) - (d) is a transparent ellipsoidal particle interference defocused image with different speckle steering; (e) - (h) is the result of autocorrelation processing of the interference defocused image; (i) - (l) a combined image of interferometric out-of-focus image speckle magnification and interferometric out-of-focus image autocorrelation bright spot magnification. The interference defocused images of the ellipsoidal particles with different rotation directions are obtained to obtain interference images with different speckle rotation directions, representative speckles in the interference defocused images are taken as speckle rotation directions and marked out by dotted lines, and the autocorrelation result of the interference defocused images is taken and marked out by solid lines, and as can be seen from fig. 3, the autocorrelation bright spot rotation directions are the same as the speckle rotation directions of the interference defocused images.
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Citations (3)
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| CN101236465A (en) * | 2007-01-29 | 2008-08-06 | 立信科技股份有限公司 | Method for controlling speckle size and distribution state and optical system thereof |
| CN109100272A (en) * | 2018-04-24 | 2018-12-28 | 天津大学 | A kind of measurement method of transparent ellipsoidal particle direction and size |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| US20050258375A1 (en) * | 2004-01-26 | 2005-11-24 | Institut National De La Sante Et De La Recherche Medicale | Confocal laser scanning microscopy apparatus |
| JP4351108B2 (en) * | 2004-04-07 | 2009-10-28 | 日本電子株式会社 | SEM automatic aberration correction method and aberration automatic correction apparatus |
| US7773070B2 (en) * | 2004-05-21 | 2010-08-10 | Cypress Semiconductor Corporation | Optical positioning device using telecentric imaging |
| JP4874863B2 (en) * | 2007-05-07 | 2012-02-15 | 日本電子株式会社 | TEM defocus amount measurement method |
| CN103674791A (en) * | 2013-12-16 | 2014-03-26 | 天津大学 | Double beam irradiation-based interfering particle image measurement method |
| EP3350540B1 (en) * | 2015-09-17 | 2022-11-16 | Carl Zeiss Meditec, Inc. | Interferometry with pulse broadened laser diode |
| CN105866013A (en) * | 2016-05-26 | 2016-08-17 | 天津大学 | Spherical particle distinguishing method based on two laser interference imaging out-of-focus interference patterns |
| CN107656364B (en) * | 2017-11-16 | 2020-10-23 | 宁波舜宇仪器有限公司 | Microscopic imaging system and real-time focusing method thereof |
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| CN101236465A (en) * | 2007-01-29 | 2008-08-06 | 立信科技股份有限公司 | Method for controlling speckle size and distribution state and optical system thereof |
| CN101077296A (en) * | 2007-06-27 | 2007-11-28 | 浙江大学 | Transmission type quick-speed optical scan delay-line used for OCT balancing exploration |
| CN109100272A (en) * | 2018-04-24 | 2018-12-28 | 天津大学 | A kind of measurement method of transparent ellipsoidal particle direction and size |
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| Automatic acquisition of particle orientation by interferometric out-of-focus image;Sun, Jinlu 等;《OPTICS COMMUNICATIONS》;20210531;第486卷;第126795页 * |
| Determining speckle orientation of interferometric out-of-focus images;Sun Jinlu 等;《JOURNAL OF QUANTITATIVE SPECTROSCOPY & RADIATIVE TRANSFER》;20190331;第226卷;第73-80页 * |
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