CN109030955A - A kind of portable fluid dielectric constant measurement system based on SIW - Google Patents
A kind of portable fluid dielectric constant measurement system based on SIW Download PDFInfo
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- CN109030955A CN109030955A CN201810516870.2A CN201810516870A CN109030955A CN 109030955 A CN109030955 A CN 109030955A CN 201810516870 A CN201810516870 A CN 201810516870A CN 109030955 A CN109030955 A CN 109030955A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2617—Measuring dielectric properties, e.g. constants
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Abstract
The present invention discloses a kind of portable fluid dielectric constant measurement system based on SIW.The dielectric constant information of phase-locked loop circuit extracting liq of the system using traditional resonant cavity perturbation method as measurement method and by a reaction type voltage controlled oscillator of the connection based on substrate integration wave-guide SIW resonator.Wherein, SIW resonator is inserted into a quartz transistor by centre to place testing liquid, reaction type voltage controlled oscillator based on connection SIW is used to extract the relationship between oscillation frequency shifts and dielectric constant, the offset of frequency of oscillation is converted to finally by phase-locked loop circuit the offset of voltage, thus by simple measurement voltage signal come the information of Measuring Dielectric Constant.Vector network analyzer ability Measuring Dielectric Constant is relied on relative to existing resonant cavity measuring technique, the present invention eliminates the dependence to large-scale experiment equipment under the premise of guaranteeing accuracy, greatly reduces the cost of measurement.
Description
Technical field
The invention belongs to microwave and millimeter wave circuits and intelligent sensing technology field, propose a kind of disengaging vector network analysis
The portable fluid dielectric constant measurement system that instrument relies on.
Background technique
The measurement of material dielectric constant is since it is in aerospace, new material development, gas-liquid monitoring and biomedicine etc.
The potential using value of aspect and receive more and more attention.Wherein, based on the media defect detection method of microwave technology, due to
Its distinctive non-contact and lossless characteristic is more popular in recent years.Currently, microwave permittivity measurement method mainly includes
There are lumped-circuit method, Transmission line method, resonant cavity perturbation method, free-space Method etc..Wherein, resonant cavity perturbation method be it is the most frequently used and
A kind of accurate method, it is usually that dielectric material is put into resonant cavity, to disturb the intracorporal field distribution of chamber.By to humorous
The measurement of vibration frequency offset, can be calculated the dielectric constant of material.Under normal conditions, more accurate in order to measure, need height
The resonator of quality factor, traditional high quality factor resonator such as metal waveguide structure can be competent at this requirement well,
It is widely used in liquid dielectric measurement, but also haves the shortcomings that volume is big, it is integrated to be difficult to.Substrate integration wave-guide (SIW) is humorous
Shake a kind of planar waveguide of the chamber as high quality factor, and the present invention is applied to the measurement of liquid dielectric, is having
There is good circuit compatibility with circuit while higher sensitivity.
In addition, resonant cavity perturbation method needs the size for being put into front and back resonance frequency shift by measuring medium to measure dielectric
The measurement of constant, resonance frequency needs bulky, expensive vector network analyzer to go to complete.But vector network
Analyzer causes inconvenient for use, and cost is excessively high, so there is an urgent need to get rid of its use.
Therefore, above-mentioned two o'clock, which becomes, restricts an important factor for this method is widely applied.In face of the huge need of portable use
It asks, it is necessary to try to eliminate the dependence to large-scale experiment equipment vector network analyzer.Therefore, just in relation to dielectric constant measurement
The formula bootstrap of taking has become academic and industry research hotspot in recent years.How quickly, Jie of material is accurately measured
Electric constant and effectively by its control errors in a certain range, for industrial detection, scientific research is all significant.
Summary of the invention
In view of this, facing challenge the purpose of the invention is to overcome the above-mentioned difficulty being previously mentioned, proposing one kind
It is different from the novel portable microwave permittivity measurement method of traditional measurement mode.
The system includes connecting the voltage controlled oscillator VCO of substrate integration wave-guide (abbreviation SIW) resonant cavity and by the VCO structure
At phase-locked loop circuit PLL composition.
Feedback network of the SIW resonant cavity as voltage controlled oscillator VCO in phase-locked loop circuit PLL；
Preferably, voltage controlled oscillator VCO is reaction type structure；
The phase-locked loop circuit PLL is well-known technique；
The SIW resonant cavity is equidistantly to be arranged using metallization VIA to replace conventional metals wave in the dielectric substrate
The wave guide wall led, medium upper and lower surface use metal covering, form the upper and lower surface of waveguide, when metallization VIA arrangement away from
From within a certain range (1/10th or less of operation wavelength), in the structure electromagnetic propagation characteristic in metal waveguide
Propagation characteristic it is almost the same.Therefore SIW greatly reduces volume while having conventional waveguide high quality factor characteristic,
And plane is easily integrated.
Working principle: resonator is as a kind of passive device for generating resonance frequency, by inside it or being placed above
Differing dielectric constant εrTesting medium can change its frequency response, the variation of this frequency response causes the reaction type VCO
The variation of phase relation, to obtain different frequencies of oscillation.A kind of circuit of the PLL as stable oscillation stationary vibration frequency, can pass through
It exports feedback voltage and VCO is fixed on fixed frequency, so as to which the variation of original dielectric constant is corresponded to changing for voltage value
Become.Therefore the control available dielectric constant size of voltage is measured by voltmeter, to avoid vector network point
The use of analyzer.
Preferred phase-locked loop pll circuit is constructed using ADI company chip, and chip effective integration decimal frequency divider reflects
Phase device, multiple phaselocked loop inner function modules such as charge pump.
Compared with the prior art, the present invention by improve measurement method greatly reduce measurement liquid dielectric at
This, improves the convenience used.
Detailed description of the invention
Fig. 1 is the portable dielectric constant measurement system structure diagram of this example 1.
Fig. 2 is the SIW overall structure and parameter mark figure of this example 1.
Fig. 3 is the reaction type VCO circuit topological structure of the connection SIW resonator in this example 1.
Fig. 4 is phase offset (the ∠ S of SIW resonator when placing different dielectric material in this example 1 in a glass tube21
(SIW) and (- ∠ S21(Circuit) analogous diagram of relationship varying with frequency.
Fig. 5 be in this example 1 oscillation frequency shifts with the simulation point and line chart of change in dielectric constant.
Fig. 6 is liquid dielectric and feedback voltage matched curve figure in 1 checkout procedure of this example.
In figure: 1. varactor Cv；2. test port；3. metal throuth hole；4. nonmetallic through-hole；5. input port； 6.
Output port；7. medium substrate.
Specific embodiment
Following is a specific embodiment of the present invention in conjunction with the accompanying drawings, technical scheme of the present invention will be further described,
However, the present invention is not limited to these examples.
Referring to Fig. 1, the portable dielectric constant measurement system of embodiment is that the reaction type VCO of connection SIW resonant cavity is constituted
PLL circuit.
The reaction type VCO circuit of the connection SIW resonant cavity includes SIW resonant cavity, first to fourth microstrip line, electricity
Hold C3-C5, resistance R2, field-effect tube, varactor Cv (1)；
SIW resonant cavity is by medium substrate (7) and is arranged in the metal layer of medium substrate upper and lower surface；In medium substrate
And several metal throuth holes (3) are provided on the periphery of upper layer and lower layer metal layer, and bosom position be provided with one it is nonmetallic
Through-hole, for placing testing medium；Port there are three driveing at the edge of medium substrate, these three ports are 50 Europe, are made respectively
For input port (5), output port (6), test port (2)；Design parameter is as shown in the table.Wherein dielectric-slab uses
Rogers RT/duroid 5870。
| Parameters | W1 | W2 | L1 | L2 | S | R |
| Unit(mm) | 3 | 2.32 | 12 | 7 | 1 | 16 |
The test port (2) of SIW resonant cavity is connect with one end of varactor Cv (1), and the other end of varactor Cv (1) is made
For the output end of PLL circuit；The input port (5) of SIW resonant cavity is connect with one end of the 4th microstrip line, the 4th microstrip line
The other end is connect with one end of capacitance C5, and the other end of capacitance C5 is connect with one end of third microstrip line, and third is micro-
The drain electrode of the other end and field-effect tube with line connects, the source electrode ground connection of field-effect tube, the grid of field-effect tube and the second micro-strip
One end connection of one end, capacitor C3 of line, the other end of capacitor C3 are connect with one end of resistance R2, another termination of resistance R2
The other end on ground, the second microstrip line is connect with one end of capacitance C4, the other end of capacitance C4 and the first microstrip line
One end connection, the other end of the first microstrip line are connect with one end of the output port (6) of SIW resonant cavity, the 5th microstrip line, the
Output end of the other end of five microstrip lines as reaction type VCO circuit；
PLL circuit include connect the reaction type VCO circuit of SIW resonant cavity, ADF4157 chip (is integrated with frequency divider, reflects
The modules such as phase device and charge pump), low-pass filter, wherein low-pass filter includes capacitor C1-C2, resistance R1；It is humorous to connect SIW
The output end of reaction type VCO circuit of vibration chamber is connect with the signal input pin of ADF4157 chip, the signal of ADF4157 chip
Output end as PLL circuit after output pin is connect with one end of one end of capacitor C1, capacitor C2, the other end of capacitor C1
Ground connection, the other end of capacitor C2 are connect with one end of resistance R2, the other end ground connection of resistance R2.The wherein output end of PLL circuit
Connect the voltmeter for test.Another signal input pin of ADF4157 chip connects with reference to crystal oscillator, generates for subsequent VCO
Output signal and with reference to crystal oscillator output signal carry out frequency comparison.
When in the nonmetallic through-hole in the center that testing medium is placed on SIW resonant cavity (in the strongest place of electromagnetic field), VCO
Frequency of oscillation can change, ADF4157 can be compared to the VCO output signal generated and with reference to crystal oscillator, and be exported
Controlling voltage, (the control voltage is that the output signal that VCO is generated is related with the frequency difference of the output signal with reference to crystal oscillator, is
The routine techniques that existing technical staff is grasped) VCO is fed back to, so that VCO returns to initial oscillation；PLL output simultaneously
Control voltage is measured by voltmeter.
Fig. 2 gives the circuit topological structure of reaction type SIW VCO.The oscillator passes through electrical length point by SIW resonator
It Wei not θg1, θg2, θg3And θg450 Ω microstrip lines be connected to field-effect tube grid and drain electrode constitute.The test of SIW resonator
Port connects a varactor, for adjusting SIW resonance frequency and connecting PLL voltage output.It is whole at frequency of oscillation
The gain of a loop is greater than 1 (0dB), and makes the phase of entire loop by adjusting the size of first to fourth microstrip line electrical length
Position offset is 2 π N (wherein N random natural number).Therefore in frequency f0The stable oscillation stationary vibration at place, amplitude conditions and phase
Condition is as follows:
|GA(f0)|*|LS(ε'r,f0)|≥1 (1)
ΦA(f0)+ΦF(ε'r,f0The π N of)=2, N=(0,1,2......) (2)
GAAnd LSThe respectively Insertion Loss of the gain of amplifier and SIW resonator.ΦAAnd ΦFRespectively amplifier and feed back to
The phase offset on road.Different frequencies of oscillation can be obtained by different phase conditions, and the dielectric constants of different detected materials can be with
It obtains different resonant states and then obtains different phase conditions.The present embodiment exists the frequency of oscillation of different liquids material
Associative simulation is carried out in HFSS and ADS to analyze the relationship of dielectric constant and frequency of oscillation.Fig. 3 illustrates placement different dielectric
Phase offset (the ∠ S of SIW resonator when material21(SIW) and (- ∠ S21(Circuit) relationship varying with frequency, wherein
∠S21(Circuit) circuit part includes the phase offset of amplifier and microstrip line.The value of intersection point between these straight lines is
Frequency of oscillation.Work as εr' when increasing, the condition for meeting loop zero phase deviates down, therefore continuous frequency of oscillation can reflect
Continuous dielectric constant values out.The value of dielectric constant is estimated so as to the variation by determining frequency of oscillation.Fig. 4 is provided
Simulation point and line charts of the oscillation frequency shifts with change in dielectric constant.
The measurement of oscillation frequency shifts needs to realize by PLL circuit.Shown in low pass filter design parameter following table.
When measurement, frequency of oscillation is locked in f by configuring ADF chip first0Place.f0Not place liquid dielectric material
When frequency of oscillation, at this time control voltage be 0 V.When being put into testing liquid dielectric material, initial oscillation will down partially
It moves, but PLL passes through output control voltage VcSystem frequency can be readjusted back to lock state, at this time varactor both ends electricity
Pressure, i.e. VCO control voltage change, measure the feedback voltage by digital voltmeter, can calculate testing liquid dielectric
The value of constant.
The present invention equally gives complete measurement result.In order to examine the accuracy of sensor, methanol, ethyl alcohol, diformazan
Benzene, ethyl acetate and ethylene glycol are applied in the inspection of the sensor.The checkout procedure is divided into three parts, step 1: by first
Alcohol, ethyl alcohol and ethylene glycol are put into the nonmetallic through-hole of the center sensor (conveniently for liquid medium placement, so in through hole
Place quartz glass tube) in, feedback voltage is measured respectively；Step 2: by these three liquid dielectrics and corresponding feedback
Voltage value, which is brought into MATLAB, fits dielectric constant voltage curve equation；Step 3: measuring dimethylbenzene and acetic acid second
The feedback voltage level of two kinds of liquid of ester, and bring the feedback voltage level of this five kinds of liquid into equation calculation and go out dielectric constant values, and
It is compared with standard value, calculates error.Fig. 6 gives the fitted calibration figure of feedback voltage and dielectric constant, fitting side
Journey is as follows:
VC=-0.02783 ε 'r 2+0.8002ε'r-0.7548
Following table gives the application condition of five kinds of liquid standard dielectric constant values and the measured value with the sensor.
| Testing liquid | Standard value | Measured value | Error |
| Dimethylbenzene | 2.53 | 2.57 | 1.6% |
| Ethyl alcohol | 5.38 | 5.49 | 2.0% |
| Ethyl acetate | 6.04 | 6.11 | 1.2% |
| Ethylene glycol | 9.19 | 9.02 | 1.8% |
| Methanol | 14.95 | 14.37 | 3.9% |
The above description of the embodiment is only used to help understand the method for the present invention and its core ideas.It should be pointed out that pair
For those skilled in the art, without departing from the principle of the present invention, can also in the present invention into
Row some improvements and modifications, these improvements and modifications also fall within the scope of protection of the claims of the present invention.To these embodiments
A variety of modifications be it will be apparent that General Principle defined herein can for those skilled in the art
To realize in other embodiments without departing from the spirit or scope of the present invention.Therefore, the present invention will not be limited
These embodiments shown in the application are formed on, and are to fit to consistent with principle disclosed in the present application and features of novelty
Widest scope.
Claims (5)
1. a kind of portable fluid dielectric constant measurement system based on SIW, it is characterised in that including substrate integration wave-guide resonance
Chamber and the phase-locked loop circuit PLL group for connecting the voltage controlled oscillator VCO of substrate integrated wave guide resonance chamber and being made of above-mentioned VCO
At；
Feedback network of the SIW resonant cavity as voltage controlled oscillator VCO in phase-locked loop circuit PLL；
The SIW resonant cavity is equidistantly to be arranged using metallization VIA to replace conventional metals waveguide in the dielectric substrate
Wave guide wall, medium upper and lower surface use metal covering, the upper and lower surface of waveguide are formed, when the spread length of metallization VIA is one
Determine within range, electromagnetic propagation characteristic is almost the same with the propagation characteristic in metal waveguide in the structure.
2. a kind of portable fluid dielectric constant measurement system based on SIW as described in claim 1, it is characterised in that voltage-controlled
Oscillator VCO is reaction type structure.
3. a kind of portable fluid dielectric constant measurement system based on SIW as described in claim 1, it is characterised in that metal
Change the spread length of via hole 1/10th or less of operation wavelength.
4. a kind of portable fluid dielectric constant measurement system based on SIW as described in claims 1 or 2 or 3, feature exist
In the reaction type VCO circuit of the connection SIW resonant cavity include SIW resonant cavity, first to fourth microstrip line, capacitor C3-C5,
Resistance R2, field-effect tube, varactor Cv (1)；
SIW resonant cavity is by medium substrate (7) and is arranged in the metal layer of medium substrate upper and lower surface；In medium substrate and
It is provided on the periphery of upper layer and lower layer metal layer several metal throuth holes (3), and is provided with a nonmetallic through-hole in bosom position,
For placing testing medium；Port there are three driveing at the edge of medium substrate, these three ports are 50 Europe, respectively as input
Port (5), output port (6), test port (2)；
The test port (2) of SIW resonant cavity is connect with one end of varactor Cv (1), and the other end of varactor Cv (1) is as PLL
The output end of circuit；The input port (5) of SIW resonant cavity is connect with one end of the 4th microstrip line, the other end of the 4th microstrip line
It is connect with one end of capacitance C5, the other end of capacitance C5 is connect with one end of third microstrip line, third microstrip line
The drain electrode of the other end and field-effect tube connects, the source electrode ground connection of field-effect tube, and the one of the grid of field-effect tube and the second microstrip line
One end connection at end, capacitor C3, the other end of capacitor C3 are connect with one end of resistance R2, the other end ground connection of resistance R2, and second
The other end of microstrip line is connect with one end of capacitance C4, and one end of the other end of capacitance C4 and the first microstrip line connects
It connects, the other end of the first microstrip line is connect with one end of the output port (6) of SIW resonant cavity, the 5th microstrip line, the 5th microstrip line
Output end of the other end as reaction type VCO circuit；
PLL circuit includes reaction type VCO circuit, the ADF4157 chip, low-pass filter for connecting SIW resonant cavity, wherein low pass filtered
Wave device includes capacitor C1-C2, resistance R1；Connect the output end and ADF4157 chip of the reaction type VCO circuit of SIW resonant cavity
The connection of signal input pin, the signal output pin of ADF4157 chip are made after connecting with one end of one end of capacitor C1, capacitor C2
The other end for the output end of PLL circuit, capacitor C1 is grounded, and the other end of capacitor C2 is connect with one end of resistance R2, resistance R2
The other end ground connection；Wherein voltmeter of the output termination of PLL circuit for test；Another signal of ADF4157 chip is defeated
Enter pin to connect with reference to crystal oscillator, carries out frequency comparison for the subsequent VCO output signal generated and with reference to the output signal of crystal oscillator.
5. a kind of implementation method of the portable fluid dielectric constant measurement system based on SIW as described in claim 1, special
Sign is that, in SIW resonant cavity electromagnetic field most strength placement testing medium, the frequency of oscillation of VCO changes, and PLL circuit passes through defeated
VCO is fixed on fixed frequency by feedback voltage out, so that the variation of original dielectric constant to be corresponded to the change of control voltage value；
The dielectric constant of testing medium is obtained by the control voltage of measurement PLL output.
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109581070A (en) * | 2019-01-30 | 2019-04-05 | 杭州电子科技大学温州研究院有限公司 | A kind of high loss material dielectric constant measurement method based on interference circuit |
| CN110133377A (en) * | 2019-05-10 | 2019-08-16 | 杭州电子科技大学 | For measuring the difference microwave remote sensor of magnetic media material dielectric constant and magnetic conductivity |
| CN110531165A (en) * | 2019-08-20 | 2019-12-03 | 杭州电子科技大学 | Novel high-precision dielectric constant test macro based on microwave remote sensor |
| CN112684259A (en) * | 2020-12-04 | 2021-04-20 | 西南大学 | Reentrant cavity sensor for measuring dielectric constant and magnetic conductivity of magnetic medium material |
| CN113614520A (en) * | 2019-03-29 | 2021-11-05 | 索尼半导体解决方案公司 | Substrate and material characterization method and device |
| EP4020798A1 (en) * | 2020-12-23 | 2022-06-29 | Carrier Corporation | Oscillator circuit comprising surface integrated waveguide resonator |
| CN116660668A (en) * | 2023-07-26 | 2023-08-29 | 中山香山微波科技有限公司 | Radio frequency oscillator, liquid electric parameter detection circuit and SAR test equipment |
| CN117949738A (en) * | 2024-03-22 | 2024-04-30 | 成都信息工程大学 | Portable ultra-wideband microwave dielectric measurement system |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101158702A (en) * | 2007-10-30 | 2008-04-09 | 电子科技大学 | Dielectric materials high-temperature complex dielectric constant measurement method based on terminal short circuit method |
| CN202383208U (en) * | 2011-11-04 | 2012-08-15 | 电子科技大学 | Apparatus for measuring high temperature complex dielectric constant of dielectric material |
| CN102868009A (en) * | 2012-09-07 | 2013-01-09 | 上海交通大学 | Integrated waveguide filter of medium loaded foldable substrate |
| CN104865449A (en) * | 2015-05-25 | 2015-08-26 | 电子科技大学 | Dielectric substrate measurement apparatus based on multi-resonant waveguide substrate integration vibration cavity method and method thereof |
| CN204885423U (en) * | 2015-06-25 | 2015-12-16 | 杭州电子科技大学 | Two circular polarized antenna of compound transmission line SIW of right -hand man |
| CN205657656U (en) * | 2016-05-10 | 2016-10-19 | 深圳市凯越翔电子有限公司 | Based on integrated waveguide technique voltage controlled oscillator of substrate |
| CN106654481A (en) * | 2016-11-30 | 2017-05-10 | 北京邮电大学 | Substrate integrated waveguide filter with independently adjustable double bands |
| CN107359403A (en) * | 2017-07-18 | 2017-11-17 | 东南大学 | A kind of low section directional diagram reconstructable substrate integration wave-guide electromagnetic horn |
-
2018
- 2018-05-25 CN CN201810516870.2A patent/CN109030955A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101158702A (en) * | 2007-10-30 | 2008-04-09 | 电子科技大学 | Dielectric materials high-temperature complex dielectric constant measurement method based on terminal short circuit method |
| CN202383208U (en) * | 2011-11-04 | 2012-08-15 | 电子科技大学 | Apparatus for measuring high temperature complex dielectric constant of dielectric material |
| CN102868009A (en) * | 2012-09-07 | 2013-01-09 | 上海交通大学 | Integrated waveguide filter of medium loaded foldable substrate |
| CN104865449A (en) * | 2015-05-25 | 2015-08-26 | 电子科技大学 | Dielectric substrate measurement apparatus based on multi-resonant waveguide substrate integration vibration cavity method and method thereof |
| CN204885423U (en) * | 2015-06-25 | 2015-12-16 | 杭州电子科技大学 | Two circular polarized antenna of compound transmission line SIW of right -hand man |
| CN205657656U (en) * | 2016-05-10 | 2016-10-19 | 深圳市凯越翔电子有限公司 | Based on integrated waveguide technique voltage controlled oscillator of substrate |
| CN106654481A (en) * | 2016-11-30 | 2017-05-10 | 北京邮电大学 | Substrate integrated waveguide filter with independently adjustable double bands |
| CN107359403A (en) * | 2017-07-18 | 2017-11-17 | 东南大学 | A kind of low section directional diagram reconstructable substrate integration wave-guide electromagnetic horn |
Non-Patent Citations (1)
| Title |
|---|
| 郭梦楚等: ""基于SIW的便携式介电常数测量系统设计", 《2018年全国微波毫米波会议》 * |
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| US12007424B2 (en) | 2019-03-29 | 2024-06-11 | Sony Semiconductor Solutions Corporation | Substrate and material characterisation method and device |
| CN113614520A (en) * | 2019-03-29 | 2021-11-05 | 索尼半导体解决方案公司 | Substrate and material characterization method and device |
| CN110133377A (en) * | 2019-05-10 | 2019-08-16 | 杭州电子科技大学 | For measuring the difference microwave remote sensor of magnetic media material dielectric constant and magnetic conductivity |
| CN110133377B (en) * | 2019-05-10 | 2021-05-25 | 杭州电子科技大学 | Differential microwave sensor for measuring dielectric constant and magnetic permeability of magnetic medium material |
| CN110531165A (en) * | 2019-08-20 | 2019-12-03 | 杭州电子科技大学 | Novel high-precision dielectric constant test macro based on microwave remote sensor |
| CN110531165B (en) * | 2019-08-20 | 2021-11-23 | 杭州电子科技大学 | Novel high-precision dielectric constant test system based on microwave sensor |
| CN112684259B (en) * | 2020-12-04 | 2022-04-22 | 西南大学 | Reentrant cavity sensor for measuring dielectric constant and magnetic conductivity of magnetic medium material |
| CN112684259A (en) * | 2020-12-04 | 2021-04-20 | 西南大学 | Reentrant cavity sensor for measuring dielectric constant and magnetic conductivity of magnetic medium material |
| EP4020798A1 (en) * | 2020-12-23 | 2022-06-29 | Carrier Corporation | Oscillator circuit comprising surface integrated waveguide resonator |
| US11641178B2 (en) | 2020-12-23 | 2023-05-02 | Carrier Corporation | Oscillator circuit |
| CN116660668A (en) * | 2023-07-26 | 2023-08-29 | 中山香山微波科技有限公司 | Radio frequency oscillator, liquid electric parameter detection circuit and SAR test equipment |
| CN116660668B (en) * | 2023-07-26 | 2023-10-20 | 中山香山微波科技有限公司 | Radio frequency oscillator, liquid electric parameter detection circuit and SAR test equipment |
| CN117949738A (en) * | 2024-03-22 | 2024-04-30 | 成都信息工程大学 | Portable ultra-wideband microwave dielectric measurement system |
| CN117949738B (en) * | 2024-03-22 | 2024-06-07 | 成都信息工程大学 | Portable ultra-wideband microwave dielectric measurement system |
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Application publication date: 20181218 |