CN109029288B - Reflective large-gradient aspheric surface and free-form surface detection device and method based on DMD wave-front sensing technology - Google Patents
Reflective large-gradient aspheric surface and free-form surface detection device and method based on DMD wave-front sensing technology Download PDFInfo
- Publication number
- CN109029288B CN109029288B CN201810822721.9A CN201810822721A CN109029288B CN 109029288 B CN109029288 B CN 109029288B CN 201810822721 A CN201810822721 A CN 201810822721A CN 109029288 B CN109029288 B CN 109029288B
- Authority
- CN
- China
- Prior art keywords
- dmd
- free
- wavefront
- measured
- aspheric surface
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000001514 detection method Methods 0.000 title claims abstract description 33
- 238000000034 method Methods 0.000 title claims abstract description 29
- 238000005516 engineering process Methods 0.000 title claims abstract description 15
- 238000003384 imaging method Methods 0.000 claims abstract description 20
- 230000004075 alteration Effects 0.000 claims abstract description 16
- 238000005259 measurement Methods 0.000 claims abstract description 15
- 230000003287 optical effect Effects 0.000 claims abstract description 15
- 230000001678 irradiating effect Effects 0.000 claims 1
- 238000013461 design Methods 0.000 abstract description 2
- 238000010586 diagram Methods 0.000 description 6
- 238000005498 polishing Methods 0.000 description 5
- 238000005305 interferometry Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 238000003491 array Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 230000003321 amplification Effects 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 210000000887 face Anatomy 0.000 description 1
- 238000001093 holography Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 210000001747 pupil Anatomy 0.000 description 1
- 238000004441 surface measurement Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
Description
技术领域technical field
本发明属于先进光学制造与检测领域,特别涉及一种基于DMD波前传感技术的反射式大陡度非球面及自由曲面检测装置和方法。The invention belongs to the field of advanced optical manufacturing and detection, and in particular relates to a reflection type large-steepness aspheric surface and free-form surface detection device and method based on DMD wavefront sensing technology.
背景技术Background technique
现代光学系统正向着小型化与高性能方向发展。光学系统中应用非球面甚至自由曲面不但可以简化系统结构,而且还可以提高系统性能。20世纪80年代以来,非球面广泛应用于航天相机、天文望远系统、红外遥感系统等。而光学自由曲面的设计自由度更大,变量个数多,表面自由度变化大,结构灵活,可以突破传统光学元器件的限制,在校正几乎所有像差的同时简化系统结构,有着良好的应用前景。然而,非球面和自由曲面在几何形状上的特殊性使得它的加工制造显得十分困难。作为加工的前提,大陡度非球面以及自由曲面的检测同样面临着巨大的难题。Modern optical systems are developing towards miniaturization and high performance. The application of aspheric surfaces and even free-form surfaces in optical systems can not only simplify the system structure, but also improve system performance. Since the 1980s, aspheric surfaces have been widely used in aerospace cameras, astronomical telescopic systems, and infrared remote sensing systems. The optical free-form surface has a greater degree of freedom in design, a large number of variables, a large change in the surface degree of freedom, and a flexible structure, which can break through the limitations of traditional optical components, and simplify the system structure while correcting almost all aberrations. It has a good application. prospect. However, the special geometry of aspheric and free-form surfaces makes its fabrication very difficult. As the premise of processing, the detection of large-steep aspheric surfaces and free-form surfaces also faces huge difficulties.
目前针对非球面和自由曲面在加工过程中的不同阶段发展出了对应的检测技术。如在粗磨阶段的面形轮廓法,在精磨和粗抛光阶段的几何光线检测法,以及在抛光后期的干涉测量法。对于大陡度非球面以及自由曲面测量,轮廓测量比如三坐标的精度较低,一般只能达到亚微米量级,并且坐标测量对于大口径非球面测量极为耗时;而干涉法虽然有高精度、非接触、全视场的优点。但是对于每一个被测件都要设计对应的补偿器或者计算全息(CGH),这都要额外采用大量的辅助光学组件,致使结构复杂,公差要求严格,装调误差也会影响检测精度。另外对非球面度较大的器件,计算全息板上所要绘制的条纹很密,这使得制作变的更加复杂,且费用昂贵;几何光线法,比如哈特曼波前测量法相对干涉测量法动态范围较大,相对坐标测量精度较高,因此经常作为衔接非球面光学件在精磨和初抛光阶段的检测难题。然而,对于陡度较大的非球面和自由曲面,传统的哈特曼传感器在动态范围以及横向分辨率上都比较有限。因此,迫切需要发展一种针对大口径,高次非球面以及自由曲面的光学检测方法。At present, corresponding detection technologies have been developed for aspheric surfaces and free-form surfaces at different stages in the processing process. Such as the surface profile method in the rough grinding stage, the geometric light detection method in the fine grinding and rough polishing stages, and the interferometry method in the later stage of polishing. For the measurement of large-steep aspheric surfaces and free-form surfaces, the accuracy of profile measurement such as three-coordinates is low, generally only reaching the sub-micron level, and coordinate measurement is extremely time-consuming for large-diameter aspheric surface measurement; while the interferometry method has high precision , non-contact, full field of view advantages. However, a corresponding compensator or computational holography (CGH) must be designed for each DUT, which requires a large number of additional auxiliary optical components, resulting in complex structure, strict tolerance requirements, and installation and adjustment errors will also affect the detection accuracy. In addition, for devices with large asphericity, the fringes to be drawn on the calculation holographic plate are very dense, which makes the fabrication more complicated and expensive; geometric light methods, such as Hartmann wavefront measurement, are dynamic relative to interferometry. The range is large and the relative coordinate measurement accuracy is high, so it is often used as a detection problem for connecting aspheric optics in the fine grinding and initial polishing stages. However, for steep aspheric and free-form surfaces, traditional Hartmann sensors are limited in dynamic range and lateral resolution. Therefore, it is urgent to develop an optical detection method for large-diameter, high-order aspheric surfaces and free-form surfaces.
本发明利用波前探测技术,原理上属于几何光线法。与传统的哈特曼波前传感器相比,采用了序列式扫描波前的技术,对待测波前分区域进行成像,这样大大提高了波前探测的动态范围。另外,由于本发明中采用微反射阵列DMD来对波前进行分割扫描,所以其横向分辨率也将会得到极大的提升。The invention utilizes the wavefront detection technology, and belongs to the geometric ray method in principle. Compared with the traditional Hartmann wavefront sensor, the sequential scanning wavefront technology is used to image the subregions of the wavefront to be measured, which greatly improves the dynamic range of wavefront detection. In addition, since the micro-reflection array DMD is used to divide and scan the wavefront in the present invention, its lateral resolution will also be greatly improved.
发明内容SUMMARY OF THE INVENTION
本发明的目的是提供一种基于DMD波前传感技术的反射式大陡度非球面及自由曲面检测装置和方法,该方法利用DMD对被测波前进行分区域反射,经成像透镜后成像在探测器上。通过成像点位置的探测计算出子波前的斜率,经过后期的斜率积分算法得到波前相位。通过与理论非球面在光线追迹软件中的理论波像差对比,计算出最终的面形结果。The purpose of the present invention is to provide a reflective type large-steep aspheric surface and free-form surface detection device and method based on DMD wavefront sensing technology. on the detector. The slope of the wavefront is calculated by detecting the position of the imaging point, and the wavefront phase is obtained through the later slope integration algorithm. The final surface shape result is calculated by comparing it with the theoretical wave aberration of the theoretical aspheric surface in the ray tracing software.
本发明的技术方案是:一种基于DMD波前传感技术的反射式大陡度非球面及自由曲面检测装置,所述装置包括:The technical scheme of the present invention is: a reflection type large-steep aspheric surface and free-form surface detection device based on DMD wavefront sensing technology, the device includes:
一维电控平台,用于带动激光光源精确移动到不同的离轴位置或光轴位置;One-dimensional electronic control platform is used to drive the laser light source to precisely move to different off-axis positions or optical axis positions;
激光器,用于产生高功率,频率稳定的激光光束;Lasers for generating high-power, frequency-stabilized laser beams;
准直透镜,用于将激光器发出的锥形光束准直为平行光;The collimating lens is used to collimate the conical beam emitted by the laser into parallel light;
分光棱镜,用于将一部分平行光反射至聚焦透镜;所述分光棱镜还用于将被测非球面或自由曲面反射回来的被测波前投射至望远扩束系统;The beam splitter prism is used to reflect a part of the parallel light to the focusing lens; the beam splitter prism is also used to project the measured wavefront reflected from the measured aspheric surface or free-form surface to the telescopic beam expander system;
聚焦透镜,用于将分光棱镜反射回的平行光束聚焦后照射到被测非球面或自由曲面上,聚焦透镜还用于将被非球面或自由曲面反射回的光束准直并补偿球差项后形成实际被测波前;The focusing lens is used to focus the parallel beam reflected by the beam splitter and then irradiate it on the measured aspheric or free-form surface. The focusing lens is also used to collimate the beam reflected by the aspheric or free-form surface and compensate for the spherical aberration term. Form the actual measured wavefront;
望远扩束系统,用于将系统的光束尺寸放缩到与DMD尺寸一样,以最大程度利用DMD阵列;Telescopic beam expander system, which is used to scale the beam size of the system to the same size as the DMD to maximize the utilization of the DMD array;
微反射镜阵列DMD,用“开”状态子镜阵列分割被测波前,并分区域将分割后的被测子波前序列式反射到成像透镜;被测波前的其它部分经由DMD处于“关”状态的子镜反射被暗盒吸收;The micro-mirror array DMD uses the sub-mirror array in the "on" state to divide the measured wavefront, and sequentially reflects the divided measured sub-wavefront to the imaging lens; other parts of the measured wavefront are in the "on" state through DMD. The sub-mirror reflection in the "off" state is absorbed by the cassette;
成像透镜,用于将DMD反射的子波前成像到探测器上;an imaging lens for imaging the wavefront reflected by the DMD onto the detector;
探测器,用于成像子波前,并记录成像点位置;a detector for imaging the wavefront and recording the position of the imaging point;
暗盒,用于接收DMD“关”状态子镜阵列反射的另外一部分子波前。A cassette for receiving another part of the wavefront reflected by the sub-mirror array in the "off" state of the DMD.
其中,所述的聚焦透镜F数大于被测非球面及自由曲面的F数。Wherein, the F-number of the focusing lens is greater than the F-number of the measured aspheric surface and free-form surface.
其中,所述的望远扩束系统放大比率为其中D为系统光瞳大小,这里由准直透镜决定,d为DMD尺寸的短边长度。Among them, the amplification ratio of the telephoto beam expander system is: Where D is the pupil size of the system, which is determined by the collimating lens here, and d is the length of the short side of the DMD size.
其中,所述的探测器可以是CCD相机,也可以是位置探测器(Position SensitiveDevice,PSD)Wherein, the detector may be a CCD camera or a position detector (Position Sensitive Device, PSD)
一种基于DMD波前传感技术的反射式大陡度非球面及自由曲面检测方法,所述检测方法基于所述的一种基于DMD波前传感技术的反射式大陡度非球面及自由曲面检测装置,所述方法包括:A reflective large-steepness aspheric surface and free-form surface detection method based on DMD wavefront sensing technology, the detection method is based on the reflective large-steepness aspheric surface and free-form surface based on DMD wavefront sensing technology A curved surface detection device, the method includes:
S1、首先对整个装置进行标定得到标定文件;S1. First, calibrate the entire device to obtain a calibration file;
S2、在Zemax光线追迹软件中建模,得到待测非球面及自由曲面的理论波像差;S2. Modeling in Zemax ray tracing software to obtain the theoretical wave aberration of the aspheric surface and free-form surface to be measured;
S3、利用标定文件进行实验测量,得到的实验结果减去Zemax中得到的理论波像差就是待测非球面及自由曲面的面形误差。S3. Use the calibration file to perform experimental measurement. The obtained experimental result minus the theoretical wave aberration obtained in Zemax is the surface error of the aspheric surface and the free-form surface to be measured.
其中,所述步骤S1中的装置标定方法如下:Wherein, the device calibration method in the step S1 is as follows:
在聚焦透镜的后焦点位置放置一块平面镜,通过横向电控平台控制激光器处于不同的离轴量,进而可以通过平面镜引入不同倾斜量的平面波前,记录并形成标定文件。A plane mirror is placed at the rear focus position of the focusing lens, and the laser is controlled at different off-axis values through the horizontal electronic control platform, and then plane wavefronts with different inclinations can be introduced through the plane mirror to record and form calibration files.
本发明的原理在于:一种基于DMD波前传感技术的反射式大陡度非球面及自由曲面检测装置,包括一维电控平台、激光器、准直透镜、分光棱镜、聚焦透镜、望远扩束系统、微反射镜阵列DMD、成像透镜、CCD相机、暗盒。所述检测装置针对反射式大陡度非球面光学件。The principle of the invention is: a reflective type large-steep aspheric surface and free-form surface detection device based on DMD wavefront sensing technology, comprising a one-dimensional electronic control platform, a laser, a collimating lens, a beam splitting prism, a focusing lens, a telephoto Beam expander system, micro-mirror array DMD, imaging lens, CCD camera, cassette. The detection device is aimed at a reflective large-steep aspherical optical element.
检测反射式大陡度非球面面形的具体步骤如下:The specific steps for detecting a reflective large-steep aspheric surface are as follows:
1)根据光源情况,设定DMD子镜阵列大小并编写DMD子镜阵列扫描方式。1) According to the light source, set the size of the DMD sub-mirror array and write the scanning mode of the DMD sub-mirror array.
2)在聚焦透镜的后焦点位置放置一块平面镜,通过横向电控平台精确控制激光器处于不同的离轴位置,进而可以通过平面镜引入不同倾斜量(倾斜角度)的平面波前,记录测量结果并形成标定文件。2) A plane mirror is placed at the back focus position of the focusing lens, and the laser is precisely controlled at different off-axis positions through the horizontal electronic control platform, and then plane wavefronts with different tilt amounts (tilt angles) can be introduced through the plane mirror, and the measurement results can be recorded and formed. document.
3)在Zemax等光线追迹软件中建模,得到待测非球面及自由曲面在成像面上的理论波像差。3) Modeling in ray tracing software such as Zemax to obtain the theoretical wave aberration of the aspheric surface and free-form surface to be measured on the imaging surface.
4)利用标定文件进行实验测量,得到的实验结果减去Zemax中得到的理论波像差就是待测非球面及自由曲面的面形误差。4) Use the calibration file to perform the experimental measurement, and the obtained experimental result minus the theoretical wave aberration obtained in Zemax is the surface error of the aspheric surface and free-form surface to be measured.
如图2所示,所述的设定DMD子镜阵列大小并编写DMD子镜阵列扫描方式有以下几种方案:以DMD尺寸1024*768为例:其中AperturePosX和AperturePosY分别表示扫描范围的中心位置坐标;SuperPixelAmountX和SuperPixelAmountY分别表示子镜阵列在X和Y方向的数量;SuperPixelPitch表示扫描时相邻两个子镜阵列中心点的距离;SuperPixelLength表示子镜阵列的长度。左上扫描方式表示DMD子镜单元尺寸等于扫描运动距离的情况;右上扫描方式表示DMD子镜单元尺寸小与扫描运动距离的情况;左下扫描方式表示DMD子镜单元尺寸大于扫描运动距离的情况;右下扫描方式表示DMD扫描范围不在中心位置情况。As shown in Figure 2, there are several schemes for setting the size of the DMD sub-mirror array and writing the scanning method of the DMD sub-mirror array: Take the DMD size of 1024*768 as an example: AperturePosX and AperturePosY respectively represent the center position of the scanning range Coordinates; SuperPixelAmountX and SuperPixelAmountY represent the number of sub-mirror arrays in the X and Y directions respectively; SuperPixelPitch represents the distance between the center points of two adjacent sub-mirror arrays during scanning; SuperPixelLength represents the length of the sub-mirror array. The upper left scanning mode indicates the case where the size of the DMD sub-mirror unit is equal to the scanning motion distance; the upper right scanning mode indicates the case that the size of the DMD sub-mirror unit is smaller than the scanning motion distance; the lower left scanning mode indicates the case that the size of the DMD sub-mirror unit is greater than the scanning motion distance; right The downward scanning mode indicates that the DMD scanning range is not in the center position.
所述的通过横向电控平台精确控制激光器处于不同的离轴位置,通过聚焦透镜后焦点位置平面镜引入不同倾斜量(倾斜角度)的平面波前,参考光路如图3。离轴量的最大幅值代表系统能检测非球面或自由曲面面形的最大梯度。The laser is precisely controlled at different off-axis positions through the lateral electric control platform, and the plane wavefronts with different inclinations (inclination angles) are introduced through the rear focus position plane mirror of the focusing lens. The reference optical path is shown in Figure 3. The maximum off-axis magnitude represents the maximum gradient the system can detect for an aspheric or free-form surface.
所述的在Zemax等光线追迹软件中建模,得到待测非球面及自由曲面在成像面上的理论波像差。通过把被测非球面或者自由曲面面形的理论表达式输入Zemax等光线追迹软件,可以得到系统光线追迹模型如图5。The model is modeled in ray tracing software such as Zemax, and the theoretical wave aberration of the aspheric surface and free-form surface to be measured on the imaging surface is obtained. By inputting the theoretical expression of the measured aspheric or free-form surface into ray tracing software such as Zemax, the system ray tracing model can be obtained as shown in Figure 5.
本发明与现有技术相比的优点在于:The advantages of the present invention compared with the prior art are:
(1)与轮廓面形的坐标测量相比,本发明所述的方法具有全口径、非接触、精度高以及检测效率高等优点;(1) Compared with the coordinate measurement of the contour surface, the method of the present invention has the advantages of full aperture, non-contact, high precision and high detection efficiency;
(2)与几何光线法相比,具有动态范围大,横向分辨率高的优点;(2) Compared with the geometric ray method, it has the advantages of large dynamic range and high lateral resolution;
(3)与基于补偿器和CGH的干涉测量相比具有结构简单,成本低、通用性强的优点。(3) Compared with interferometry based on compensator and CGH, it has the advantages of simple structure, low cost and strong versatility.
(4)本发明较好的平衡了检测系统性能、检测成本和检测效率。(4) The present invention better balances the performance of the detection system, the detection cost and the detection efficiency.
(5)本发明为大陡度非球面及自由曲面面形从精磨到初抛光阶段的通用检测方案,这是现有方法所不具备的。(5) The present invention is a general detection scheme for the large-steep aspheric surface and the free-form surface shape from the fine grinding to the initial polishing stage, which is not available in the existing methods.
附图说明Description of drawings
图1为本发明一实施例的检测装置构成示意图;FIG. 1 is a schematic structural diagram of a detection device according to an embodiment of the present invention;
图2为本发明一实施例的DMD扫描方式示意图;2 is a schematic diagram of a DMD scanning method according to an embodiment of the present invention;
图3为本发明一实施例的系统标定光路示意图;3 is a schematic diagram of a system calibration optical path according to an embodiment of the present invention;
图4为本发明一实施例的系统标定方法示意图;4 is a schematic diagram of a system calibration method according to an embodiment of the present invention;
图5为本发明一实施例的系统Zemax模型示意图;5 is a schematic diagram of a system Zemax model according to an embodiment of the present invention;
图6为本发明一实施例的待测非球面理论像差示意图。FIG. 6 is a schematic diagram of a theoretical aspherical aberration to be measured according to an embodiment of the present invention.
具体实施方式Detailed ways
下面结合附图及具体实施方式详细介绍本发明。The present invention will be described in detail below with reference to the accompanying drawings and specific embodiments.
如图1所示,本实施示例的一种基于DMD波前传感技术的反射式大陡度非球面及自由曲面检测装置,一维电控平台11,用于带动激光光源精确移动到不同的离(光)轴位置;As shown in FIG. 1 , a reflective type large-steep aspheric and free-form surface detection device based on DMD wavefront sensing technology in this embodiment, a one-dimensional
激光器1,用于产生高功率,频率稳定的激光光束;
准直透镜2,用于将激光器1发出的锥形光束准直为平行光;The
分光棱镜3,用于将一部分平行光反射至聚焦透镜4;所述分光棱镜3还用于将被测非球面或自由曲面5反射回来的被测波前投射至望远扩束系统6;The
聚焦透镜4,用于将分光棱镜3反射回的平行光束聚焦后照射到被测非球面或自由曲面5上,聚焦透镜4还用于将被非球面或自由曲面5反射回的光束准直(补偿球差项)后形成实际被测波前;The focusing
望远扩束系统6,用于将系统的光束尺寸放缩到与DMD尺寸一样,以最大程度利用DMD阵列;Telescopic
微反射镜阵列DMD 7,用“开”状态子镜阵列分割被测波前,并分区域将分割后的被测子波前序列式反射到成像透镜8;被测波前的其它部分经由DMD 7处于“关”状态的子镜反射被暗盒10吸收。The
成像透镜8,用于将DMD 7反射的子波前成像到探测器9上;The
探测器9,用于成像子波前,并记录成像点位置;a
暗盒10,用于接收DMD 7“关”状态子镜阵列反射的另外一部分子波前。The
本发明装置的测量过程和检测步骤如下:The measurement process and detection steps of the device of the present invention are as follows:
第一步:根据光源情况,设定DMD子镜阵列大小并编写DMD子镜阵列扫描方式。比如图2中第一种扫描方式。Step 1: According to the light source, set the size of the DMD sub-mirror array and write the scanning method of the DMD sub-mirror array. For example, the first scanning method in Figure 2.
第二步:在聚焦透镜4的后焦点位置放置一块平面镜,通过一维电控平台11(横向电控平台)控制激光器处于不同的离轴量,比如0、2mm、2mm、3mm、4mm、5mm、6mm、7mm进而可以通过平面镜引入不同倾斜量(倾斜角度)的平面波前,如图3记录测量结果并形成标定文件。Step 2: Place a plane mirror at the back focus position of the focusing
第三步:在Zemax等光线追迹软件中建模,假设待测非球面的模型光路如图5所示。通过光线追迹可以得到待测非球面及自由曲面在成像面上的理论波像差,如图6所示。Step 3: Modeling in ray tracing software such as Zemax, assuming that the model optical path of the aspheric surface to be measured is shown in Figure 5. The theoretical wave aberration of the aspheric surface and free-form surface to be measured on the imaging surface can be obtained by ray tracing, as shown in Figure 6.
第四步:利用标定文件进行实验测量,通过如图4所示标定方法得到的标定后的实验结果,减去Zemax中得到的理论波像差就是待测非球面及自由曲面的面形误差。Step 4: Use the calibration file to perform experimental measurement. The calibrated experimental results obtained by the calibration method shown in Figure 4, minus the theoretical wave aberration obtained in Zemax is the surface error of the aspheric surface and free-form surface to be measured.
该方法装置结构简单,搭建容易,成本低廉,检测周期短,为大口径非球面主镜抛光阶段和最终镜面参数测量提供了一种有效的检验手段。The method has the advantages of simple structure, easy construction, low cost and short detection period, and provides an effective inspection method for the polishing stage of the large-diameter aspherical primary mirror and the measurement of the final mirror surface parameters.
以上所述,仅为本发明中的具体实施方式,但本发明的保护范围并不局限于此,任何熟悉该技术的人在本发明所揭露的技术范围内的局部修改或替换,都应涵盖在本发明的包含范围之内。The above are only specific embodiments of the present invention, but the protection scope of the present invention is not limited to this, and any partial modification or replacement within the technical scope disclosed by the present invention by anyone familiar with the technology shall cover within the scope of the present invention.
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810822721.9A CN109029288B (en) | 2018-07-25 | 2018-07-25 | Reflective large-gradient aspheric surface and free-form surface detection device and method based on DMD wave-front sensing technology |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201810822721.9A CN109029288B (en) | 2018-07-25 | 2018-07-25 | Reflective large-gradient aspheric surface and free-form surface detection device and method based on DMD wave-front sensing technology |
Publications (2)
Publication Number | Publication Date |
---|---|
CN109029288A CN109029288A (en) | 2018-12-18 |
CN109029288B true CN109029288B (en) | 2020-10-16 |
Family
ID=64644869
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201810822721.9A Active CN109029288B (en) | 2018-07-25 | 2018-07-25 | Reflective large-gradient aspheric surface and free-form surface detection device and method based on DMD wave-front sensing technology |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN109029288B (en) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110133845A (en) * | 2019-04-26 | 2019-08-16 | 中国科学院上海光学精密机械研究所 | A Design Method of Freeform Surface Wavefront Compensation Element Used in Laser System |
CN111351965A (en) * | 2020-03-02 | 2020-06-30 | 信联智翊科技(苏州)有限公司 | Extended multi-order free-form surface detection method |
CN113238373B (en) * | 2021-07-12 | 2021-10-12 | 沂普光电(天津)有限公司 | Laser scanning unit and laser printer |
CN113776460B (en) * | 2021-09-03 | 2023-04-11 | 中国科学院长春光学精密机械与物理研究所 | Method and device for detecting surface shape of optical free-form surface reflector |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101278874A (en) * | 2007-12-28 | 2008-10-08 | 中国科学院光电技术研究所 | A Transmissive Hartmann Measuring Instrument for Intraocular Lens Aberration |
CN101278867A (en) * | 2007-12-28 | 2008-10-08 | 中国科学院光电技术研究所 | A reflective artificial lens aberration Hartmann measuring instrument |
CN101285735A (en) * | 2008-05-28 | 2008-10-15 | 中国科学院光电技术研究所 | A Hartmann sensor that expands the dynamic range by separating the overall tilt of the wavefront |
CN102462485A (en) * | 2010-11-18 | 2012-05-23 | 沈阳理工大学 | Human eye optical system modulation transfer function detector based on wavefront aberration |
CN102937421A (en) * | 2012-10-29 | 2013-02-20 | 南通大学 | Real-time detection method of symmetrical optical non-spherical face of rotary shaft |
CN103308187A (en) * | 2013-06-05 | 2013-09-18 | 中国科学院国家天文台南京天文光学技术研究所 | High-frequency Shack-Hartmann wave-front measuring device and measuring method thereof |
-
2018
- 2018-07-25 CN CN201810822721.9A patent/CN109029288B/en active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101278874A (en) * | 2007-12-28 | 2008-10-08 | 中国科学院光电技术研究所 | A Transmissive Hartmann Measuring Instrument for Intraocular Lens Aberration |
CN101278867A (en) * | 2007-12-28 | 2008-10-08 | 中国科学院光电技术研究所 | A reflective artificial lens aberration Hartmann measuring instrument |
CN101285735A (en) * | 2008-05-28 | 2008-10-15 | 中国科学院光电技术研究所 | A Hartmann sensor that expands the dynamic range by separating the overall tilt of the wavefront |
CN102462485A (en) * | 2010-11-18 | 2012-05-23 | 沈阳理工大学 | Human eye optical system modulation transfer function detector based on wavefront aberration |
CN102937421A (en) * | 2012-10-29 | 2013-02-20 | 南通大学 | Real-time detection method of symmetrical optical non-spherical face of rotary shaft |
CN103471521A (en) * | 2012-10-29 | 2013-12-25 | 南通大学 | Method capable of fast and accurately detecting optical aspheric surface in real time |
CN103308187A (en) * | 2013-06-05 | 2013-09-18 | 中国科学院国家天文台南京天文光学技术研究所 | High-frequency Shack-Hartmann wave-front measuring device and measuring method thereof |
Non-Patent Citations (2)
Title |
---|
师亚萍等.提高夏克_哈特曼波前传感器光斑质心的定位精度.《激光与光电子学进展》.2017,正文第1、4节及图1. * |
提高夏克_哈特曼波前传感器光斑质心的定位精度;师亚萍等;《激光与光电子学进展》;20171231;正文第1、4节及图1 * |
Also Published As
Publication number | Publication date |
---|---|
CN109029288A (en) | 2018-12-18 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN105423948B (en) | The device of aspheric surface is detected using the stitching interferometer of distorting lens | |
CN109029288B (en) | Reflective large-gradient aspheric surface and free-form surface detection device and method based on DMD wave-front sensing technology | |
CN110726381B (en) | An optical free-form surface full-band aberration detection system and detection method | |
CN101240999B (en) | An interferometric device and method for a large optical plane | |
CN100507488C (en) | Aspheric mirror diffraction image detection method and device | |
CN104930971B (en) | Partial compensation lens and detected surface alignment device and alignment method in non-null detection | |
CN102589416A (en) | Wavelength scanning interferometer and method for aspheric measurement | |
JP3162355B2 (en) | Surface shape measurement method and device | |
US20190271532A1 (en) | Method for measuring a spherical-astigmatic optical surface | |
CN111076898B (en) | A method for measuring the optical axis of aspheric mirror with laser tracker and CGH | |
CN104374334A (en) | Free-form surface morphology three-dimensional measurement method and device | |
CN102236260A (en) | Wave aberration correction system and method | |
CN112964455B (en) | Wave aberration splicing measuring device and method for large-numerical-aperture objective lens | |
KR20110065365A (en) | Aspherical measuring method and apparatus | |
CN108827596A (en) | One kind being applied to the novel common phase detection method of sectional type spliced telescope and device | |
CN108050937A (en) | The detection method and device of optical elements of large caliber intermediate frequency error | |
CN118111355A (en) | A method for detecting the surface shape of large-aperture high-order convex aspheric surfaces | |
JPS6361925A (en) | Method and device for analyzing interference fringe | |
CN114137736B (en) | Large-aperture optical element adjusting device and adjusting method thereof | |
CN113624157B (en) | Large-deviation aspheric surface double-light-path detection system based on local aberration compensation | |
US8294904B2 (en) | Fizeau lens having aspheric compensation | |
JPH0448201A (en) | Interference measuring instrument | |
Adapa | The application of wavefront sensing methods to optical surface metrology | |
CN116642432B (en) | Aspherical surface shape detection method and apparatus | |
CN113465540A (en) | Phase shifting method for aperture plate for pinhole point diffraction interferometry system |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |