CN108037436A - A kind of method of heavy current pulse test - Google Patents
A kind of method of heavy current pulse test Download PDFInfo
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- CN108037436A CN108037436A CN201711293272.5A CN201711293272A CN108037436A CN 108037436 A CN108037436 A CN 108037436A CN 201711293272 A CN201711293272 A CN 201711293272A CN 108037436 A CN108037436 A CN 108037436A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
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- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
A kind of improved heavy current pulse test method, this method are improved on the basis of heavy current pulse method of testing, are transplanted in STS8208 mixed signal test systems and are tested；Test condition burst length and duty cycle are set as a certain numerical value, you can cover the test of existing ic power devices output current；Apply assigned voltage in the power end of test device, provide the pulse excitation source of setting in device input, load provides virtual earth using two-way power voltage current source；Equally apply assigned voltage in the power end of test device, provide setting pulse excitation source in device input, load provides virtual earth using two-way power voltage current source.The present invention expands application range, while solve the problems, such as easily to burn device during ic power devices test from the test that can only be widened originally to discrete semiconductor testing to ic power devices.Power device, driver suitable for integrated circuit etc. export the test of high current.
Description
Technical field
The present invention relates to the test of electric current, it particularly relates to the test method of heavy current pulse.
Technical background
Heavy current pulse method of testing be in order to avoid measurement when due to device heating causes measurement error and propose one
Kind of discrete semiconductor testing method, in former test method the predetermined pulse time be not more than 10ms, largest duty cycle 2%, in this scope
Interior, pulse must be grown to the ability and required accurate precision for being enough adequacy test equipment, be as short as being enough to avoid generating heat.It is this
The it is proposed of test method, solves the test problem of semi-conductor discrete device output high current.
But former test method is only applicable to semi-conductor discrete device, using with limitation；Burst length and duty cycle are equal
For empirical parameter, provided without specific targets.On the one hand different types of device output current is inconsistent, and fever is also different；
On the other hand, each side index such as the power supply time delay of different test equipments, precision is inconsistent, can also influence device output electricity
The test of stream.
Integrated circuit progressively replaces discrete device, and the power device output current in integrated circuit is increasing, and test is difficult
Degree increase, thus improve heavy current pulse method of testing, be incorporated into it is necessary in the test of integrated circuit.
The application part that heavy current pulse involved in Chinese patent database is tested has：No. 031163459《The big electricity of nanosecond pulse
The test device and method of stream》, No. 2011102200579《A kind of semiconductor device test system pulse high current amplitude calibration
Device》, No. 2012100740420《Integrated circuit high-voltage great-current test device》, No. 2015103386554《One kind is used for
Super-current power unit tests the power module circuitry of system》, No. 2017100220289《A kind of Bulk current injection method test dress
Put》Deng.These patented technologies can't solve the problem that original test method is applied to integrated circuit testing, there is no at present
Corresponding application part.
The content of the invention
The present invention is intended to provide a kind of improved heavy current pulse test method, makes it to test the defeated of discrete device
Go out electric current, can also test the output current of power device in integrated circuit, widen use scope.
Present invention is generally directed to target be pulse testing method limitation and uncertainty.According to the specific of test system
Performance indicator, quantifies test condition burst length and duty cycle.
The peak anode current test method of power device is in existing integrated circuit：According to the typical case electricity of product
Road figure builds peripheral test circuit, and load uses power-adjustable resistance, such as power amplifier.Apply specified supply voltage and
After input signal, it is also necessary to adjust the resistance value of load resistance, when being close to be shorted to ground, measure its output current.This survey
The shortcomings that method for testing, is that the size of load resistance is difficult to control：Dead short can cause device to burn, load resistance is not small enough
Measurement can be caused inaccurate again.
To realize subject invention, the heavy current pulse test method that inventor provides is the base in heavy current pulse method of testing
It is improved on plinth, is transplanted in STS8208 mixed signal test systems and is tested；Specific practice is：
STS8208 mixed signal test systems contain test main frame, tetra- road time control units of QTMU, FPVI two-ways power electricity
The test modules such as current voltage source, AWG arbitrary waveform generator, burst length precision reach 10ns, and electric current can reach 20A；Herein
On the basis of, heavy current pulse method of testing is improved, is that test condition burst length and duty cycle are set as a certain numerical value, then
Test can cover the test of the output current of existing ic power devices；Equally apply rule in the power end of test device
Constant voltage, provides the pulse excitation source of setting, load provides empty using two-way power voltage current source in device input
Ground；Equally apply assigned voltage in the power end of test device, setting pulse excitation source, load are provided in device input
Two-way power voltage current source can be used to provide virtual earth.
The improved test philosophy of power operational amplifier is：PVI can provide 50V floatings source and virtual earth, and AWG can be provided
The pulse excitation of precision 10ns；Consider that all power devices and equipment were powered, after the time delay of driving source, when setting pulse
Between be 500us, duty cycle 2%, this not only met device can normal transient work, but also meet that device will not generate heat；These conditions
After quantization, it can meet the test of the output current of most power devices.
When all signals, voltage are normal, closure switch K；At this time, output terminal is shorted to the ground of PVI, and the ground of PVI belongs to
There are the impedance of infinity in virtual earth, inside, will not burn device, and can reach the condition for being shorted to ground, and measuring accuracy is small to arrive PA
Level, greatly to 20A, meets the electrical characteristic requirements of product manual.Switch is disconnected after the completion of test.
The present invention is improved on the basis of heavy current pulse method of testing, can only be in the survey in discrete device from before
The test of ic power devices is widened in examination, expands application range, while solve ic power devices test
Shi Rongyi burns the problem of device.The advantages of invention is：1. solves the application limitation for pulse test of throwing oneself on the ground；2. solves collection
The problem tested into circuit power device output current, reduces the crash rate of product；3. all high-current devices can be directed to
Test, only need to change supply voltage and impulse amplitude, can be achieved with output current test.Suitable for the power device of integrated circuit
Part, driver etc. export the test of high current.
Brief description of the drawings
Fig. 1 is original FH544 power operational amplifiers output short circuit current test philosophy figure；Fig. 2 surveys for pulse excitation
Examination method block diagram；Fig. 3 is the test philosophy figure of power operational amplifier pulse excitation；Fig. 4 is FX2110 driver test philosophy figures,
Fig. 5 is power operational amplifier test philosophy figure；Fig. 6 is power MOSFET test philosophy figures.
Embodiment
Pass through the following example embodiment that the present invention will be described in detail：
Embodiment 1：FX2110 drivers output short circuit current is tested, such as Fig. 4
FX2110 drivers output current is 2A, and according to the test condition on FX2110 databooks, supply voltage 15V can be with
There is provided by plurality of voltages current source, constant 15V DC voltages, precision 0.1mV can be provided.The device drives for binary channels
Dynamic device, completes the test of FX2110, you can meets the test of the output short circuit current of such most of device.
It is 150ns or so according to the time delay of device, the burst length remains set to 500us, duty cycle 2%, signal
Input terminal will continuous input pulse signal, when detecting that output terminal is normal, closure switch, test output current, work as detection
To after output short circuit current, switch is disconnected, completes electrical testing.The test of the project is identified by third party to be approved.
Embodiment 2：FH541 power operational amplifiers output current is tested, such as Fig. 5
The output peak point current of power operational amplifier is larger, and device heating is very fast, traditional test methods, device overwork
Time can exceed 10S, cause device seriously to generate heat and burn, ultimate failure rate is higher.Improved heavy current pulse test
Method can be fully solved this problem., can be with by programming from figure 5 it can be seen that output terminal is directly connected to the other end of power supply
There is provided virtually, during test, avoid device heating completely, but can accurate measurement device output short circuit current.By reference
Databook, the continuous impulse that input terminal provides are duty cycle 2%, and burst length 500us, when detecting that output is normal, closes
Switch；After completing test, switch is disconnected.The improvement of this test, considerably reduces the crash rate of product test, can be complete
The short circuit current flow test of this kind of product of coverage power operational amplifier.The test of the product is applying for that third party identifies.
3 FX9024 P-channel power MOSFET drain currents of embodiment are tested, such as Fig. 6
FX9024 belongs to semi-conductor discrete device, and original test method can also test drain current, but the test developed
Plate and test program have specificity, can only test this product.Improved test method, can cover all PMOS
Drain current test, practicality is more extensive.Metal-oxide-semiconductor belongs to three terminal device, source ground connection, and drain electrode connects negative supply, and grid connects
Pulse signal, impulse amplitude are more than threshold voltage, it is recognized that the opening time of this device is shorter from databook,
2% duty cycle, the burst length of 500uS enough devices open work and complete the test of drain current.The leakage of such device
Electrode current is not belonging to short circuit current flow, but device opens the output current of work, does not burn the risk of device.Fig. 6 is
FX9024 test philosophy figures, as seen from the figure, test philosophy is relatively simple, and the test board and test program of design can cover this
The test of a kind of product, testing between different product only needs to change supply voltage and impulse amplitude and can complete.
Analyzed by the high-current test of three of the above different type product, it may be determined that the burst length（500uS）And account for
Empty ratio（2%）, the test condition after quantization can cover the testing currents of most products, and the test of same class product only needs
A test board and test test program are developed, largely reduces testing cost.
Claims (2)
1. a kind of improved heavy current pulse test method, it is characterised in that this method is on the basis of heavy current pulse method of testing
On be improved, be transplanted in STS8208 mixed signal test systems and tested；Specific practice is：
STS8208 mixed signal test systems contain test main frame, tetra- road time control units of QTMU, FPVI two-ways power electricity
The test modules such as current voltage source, AWG arbitrary waveform generator, burst length precision reach 10ns, and electric current can reach 20A；Herein
On the basis of, heavy current pulse method of testing is improved, is that test condition burst length and duty cycle are set as a certain numerical value, then
Test covers the test of the output current of existing ic power devices；Equally apply regulation in the power end of test device
Voltage, provides the pulse excitation source of setting, load provides virtual earth using two-way power voltage current source in device input；
Equally apply assigned voltage in the power end of test device, provide setting pulse excitation source in device input, load is adopted
Virtual earth is provided with two-way power voltage current source.
2. the method as described in claim 1, it is characterised in that the AWG can provide the pulse excitation of precision 10ns；Consider institute
There are power device and equipment to power, after the time delay of driving source, set the burst length as 500us, duty cycle 2%, this was both
Meet device can normal transient work, and meet that device will not generate heat；After these conditions quantify, it can meet most work(
The test of the output current of rate device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711293272.5A CN108037436A (en) | 2017-12-08 | 2017-12-08 | A kind of method of heavy current pulse test |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711293272.5A CN108037436A (en) | 2017-12-08 | 2017-12-08 | A kind of method of heavy current pulse test |
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| CN108037436A true CN108037436A (en) | 2018-05-15 |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102226831A (en) * | 2011-03-25 | 2011-10-26 | 南通富士通微电子股份有限公司 | Chip testing method and testing circuit of lithium battery protective chip |
| CN103487745A (en) * | 2013-09-30 | 2014-01-01 | 贵州航天计量测试技术研究所 | Automatic testing circuit of transforming amplifier and testing method |
| CN203479987U (en) * | 2013-09-30 | 2014-03-12 | 贵州航天计量测试技术研究所 | Automatic test circuit for conversion amplifier |
| CN106841856A (en) * | 2017-01-03 | 2017-06-13 | 航天科工防御技术研究试验中心 | A kind of high power three-phase bridge driver test device |
-
2017
- 2017-12-08 CN CN201711293272.5A patent/CN108037436A/en active Pending
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102226831A (en) * | 2011-03-25 | 2011-10-26 | 南通富士通微电子股份有限公司 | Chip testing method and testing circuit of lithium battery protective chip |
| CN103487745A (en) * | 2013-09-30 | 2014-01-01 | 贵州航天计量测试技术研究所 | Automatic testing circuit of transforming amplifier and testing method |
| CN203479987U (en) * | 2013-09-30 | 2014-03-12 | 贵州航天计量测试技术研究所 | Automatic test circuit for conversion amplifier |
| CN106841856A (en) * | 2017-01-03 | 2017-06-13 | 航天科工防御技术研究试验中心 | A kind of high power three-phase bridge driver test device |
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