CN107622007A - Application testing method and device - Google Patents
Application testing method and device Download PDFInfo
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- CN107622007A CN107622007A CN201610555124.5A CN201610555124A CN107622007A CN 107622007 A CN107622007 A CN 107622007A CN 201610555124 A CN201610555124 A CN 201610555124A CN 107622007 A CN107622007 A CN 107622007A
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Abstract
This application discloses application testing method and device.One embodiment of methods described includes：The candidate's test case set tested application is obtained, wherein, subfunction is applied using including at least one, it is each corresponding with the test case for being tested using subfunction this using subfunction；From at least one application subfunction set that test is ready to use in using determination in subfunction, wherein, include using subfunction set at least one of following：The application subfunction for the predetermined number chosen according to the order of number the defects of application subfunction from more to less；Application subfunction with maximum loss desired value, maximum loss desired value are to carry out analysis according to the historical defect data of application subfunction to draw；Test case set corresponding with application subfunction set is obtained from candidate's test case set；It is corresponding with being tested using test case set.The embodiment, which realizes, is imbued with targetedly application test.
Description
Technical field
The application is related to field of computer technology, and in particular to technical field of measurement and test, more particularly to application testing method and
Using test device.
Background technology
After the basic function of an application is completed, it can also increase application new function.New function code is incorporated to original
After having code, original function can generally be had an impact, there is acceptable influence, also there is the influence for having a strong impact on original function.
In order to ensure the normal use of original function, influence of the New function to original function is reduced as far as possible, after New function code is incorporated to,
Regression test must be carried out to application.
However, it is existing application test mode be typically by tester rule of thumb with test object the characteristics of, selection
Test case corresponding to test case corresponding to the major function of application or repertoire is tested application, so as to deposit
It is under-utilized in the historical defect data of function, the problem of using test lack of targeted.
The content of the invention
The purpose of the application is to propose a kind of improved application testing method and device, to solve background above technology department
Divide the technical problem mentioned.
In a first aspect, this application provides a kind of application testing method, methods described includes：Obtain and application is tested
Candidate's test case set, wherein, the application include it is at least one apply subfunction, each using subfunction be used for pair
The test case that this is tested using subfunction is corresponding；Determine to be ready to use in test from least one application subfunction
Application subfunction set, wherein, the application subfunction set includes at least one of following：The defects of according to application subfunction
The application subfunction for the predetermined number that the order of number from more to less is chosen；Application subfunction with maximum loss desired value, institute
It is to carry out analysis according to the historical defect data of application subfunction to draw to state maximum loss desired value；Test and use from the candidate
Test case set corresponding with the application subfunction set is obtained in example set；Using the test case set to described
Using being tested.
In certain embodiments, it is described from it is described it is at least one using subfunction in determine be ready to use in test application son
After function set, methods described also includes：Duplicate removal processing is carried out to the application subfunction set, generates each sub- work(of application
Can unduplicated application subfunction set；Obtained from candidate's test case set and unduplicated apply subfunction with described
Test case set corresponding to set.
In certain embodiments, obtained described from candidate's test case set and unduplicated application
After test case set corresponding to function set, methods described also includes：Duplicate removal processing is carried out to the test case set,
Generate the unduplicated test case set of each test case；The application is entered using the unduplicated test case set
Row test.
In certain embodiments, candidate's test case set includes at least one of following：It is pre-stored within local
Candidate's test case set, candidate's test use cases compile in collaboration with the candidate's test use cases stored in the terminal being written on thereon
Close.
In certain embodiments, it is described that test bag is carried out to the application using the unduplicated test case set
Include：The terminal being mounted thereon to the application sends the unduplicated test case set for described in terminal utilization
Unduplicated test case set is tested the application.
Second aspect, this application provides one kind to apply test device, and described device includes：First acquisition unit, configuration
For obtaining the candidate's test case set tested application, wherein, the application applies subfunction including at least one,
It is each corresponding with the test case for being tested using subfunction this using subfunction；Determining unit, it is configured to
From at least one application subfunction set that test is ready to use in using determination in subfunction, wherein, it is described to apply subfunction
Set includes at least one of following：The application for the predetermined number chosen according to the order of number the defects of application subfunction from more to less
Subfunction；Application subfunction with maximum loss desired value, the maximum loss desired value are going through according to application subfunction
History defective data carries out what analysis was drawn；Second acquisition unit, be configured to from candidate's test case set obtain with
Test case set corresponding to the application subfunction set；Test cell, it is configured to utilize the test case set pair
The application is tested.
In certain embodiments, described device also includes：First generation unit, it is configured to apply set of sub-functions to described
Close and carry out duplicate removal processing, generate each unduplicated application subfunction set of application subfunction；And the second acquisition unit
It is corresponding with the unduplicated application subfunction set to be further configured to the acquisition from candidate's test case set
Test case set.
In certain embodiments, described device also includes：Second generation unit, it is configured to the test case set
Duplicate removal processing is carried out, generates the unduplicated test case set of each test case；And the test cell further configures
For being tested using the unduplicated test case set the application.
In certain embodiments, candidate's test case set includes at least one of following：It is pre-stored within local
Candidate's test case set, candidate's test use cases compile in collaboration with the candidate's test use cases stored in the terminal being written on thereon
Close.
In certain embodiments, the test cell is further configured to：The terminal being mounted thereon to the application
The unduplicated test case set is sent so that the terminal is answered described using the unduplicated test case set
With being tested.
The application testing method and device that the application provides, by determining to answer from least one application subfunction of application
Tested by the use of more than number the defects of subfunction using subfunction with the application subfunction with maximum loss desired value as being ready to use in
Application subfunction set, obtained in the candidate test case set then tested from acquisition application and be ready to use in test
Application subfunction set corresponding to test case set, it is finally corresponding with being tested using test case set, so as to have
Effect make use of the historical defect data using subfunction, realizes and is imbued with targetedly application test.
Brief description of the drawings
By reading the detailed description made to non-limiting example made with reference to the following drawings, the application's is other
Feature, objects and advantages will become more apparent upon：
Fig. 1 is that the application can apply to exemplary system architecture figure therein；
Fig. 2 is the flow chart according to one embodiment of the application testing method of the application；
Fig. 3 is the flow chart according to another embodiment of the application testing method of the application；
Fig. 4 is the structural representation according to one embodiment using test device of the application；
Fig. 5 is adapted for the structural representation of the computer system of the server for realizing the embodiment of the present application.
Embodiment
The application is described in further detail with reference to the accompanying drawings and examples.It is understood that this place is retouched
The specific embodiment stated is used only for explaining related invention, rather than the restriction to the invention.It also should be noted that in order to
Be easy to describe, illustrate only in accompanying drawing to about the related part of invention.
It should be noted that in the case where not conflicting, the feature in embodiment and embodiment in the application can phase
Mutually combination.Describe the application in detail below with reference to the accompanying drawings and in conjunction with the embodiments.
Fig. 1 shows the exemplary system of the embodiment of the application testing method that can apply the application or application test device
System framework 100.
As shown in figure 1, system architecture 100 can include terminal device 101,102,103, network 104 and server 105.
Network 104 between terminal device 101,102,103 and server 105 provide communication link medium.Network 104 can be with
Including various connection types, such as wired, wireless communication link or fiber optic cables etc..
User can be interacted with using terminal equipment 101,102,103 by network 104 with server 105, to receive or send out
Send message etc..Various telecommunication customer end applications, such as terminal device security classes can be installed on terminal device 101,102,103
Using, shopping class application, searching class application, Code Edit class instrument etc..
Terminal device 101,102,103 can have display screen and the various electronic equipments of support code editor, bag
Include but be not limited to smart mobile phone, tablet personal computer, E-book reader, MP3 player (Moving Picture Experts
Group Audio Layer III, dynamic image expert's compression standard audio aspect 3), MP4 (Moving Picture
Experts Group Audio Layer IV, dynamic image expert's compression standard audio aspect 4) it is player, on knee portable
Computer and desktop computer etc..
Server 105 can be to provide the server of various services, such as to being write on terminal device 101,102,103
Test case provides the background test server supported.Background test server can enter to test case set for getting etc.
The processing such as row analysis, and application is tested using result (such as test case set after screening).
It should be noted that the application testing method that the embodiment of the present application is provided typically is performed by server 105, accordingly
Ground, it is generally positioned at using test device in server 105.
It should be understood that the number of the terminal device, network and server in Fig. 1 is only schematical.According to realizing need
Will, can have any number of terminal device, network and server.
With continued reference to Fig. 2, the flow 200 of one embodiment of application testing method according to the application is shown.It is described
Application testing method, comprise the following steps：
Step 201, the candidate's test case set tested application is obtained.
In the present embodiment, the electronic equipment (such as server shown in Fig. 1) of application testing method operation thereon can
To obtain the candidate's test case set tested application, wherein, above-mentioned application can include at least one sub- work(of application
Can, each corresponding with the test case for being tested using subfunction this using subfunction, above-mentioned test case is
One group of test input, execution condition and the expected results worked out for some special objective, to test some Program path
Or examine whether meet some particular demands.As an example, above-mentioned application can include multiple functions, such as：User management work(
Energy, commodity settlement function etc., above-mentioned commodity settlement function can apply subfunction comprising multiple, for example, calculating business in shopping cart
The function of product price, payment function etc., then, calculate the function of commodity price in shopping cart and be used for calculating business in shopping cart
The test case that the function of product price is tested is corresponding, and payment function is used with the test for being tested payment function
Example is corresponding.
In some optional implementations of the present embodiment, above-mentioned candidate's test case set can be pre-stored within
State in electronic equipment, when testing above-mentioned application, above-mentioned electronic equipment can be carried out directly from local obtain to application
Candidate's test case set of test；Above-mentioned candidate's test case be stored in above-mentioned candidate's test case write with thereon
Terminal device in, when testing above-mentioned application, above-mentioned electronic equipment can pass through wired connection mode or wireless
The terminal device that connected mode is write from tester using its progress test case obtains the candidate tested application and surveyed
Example set on probation.It is pointed out that above-mentioned radio connection can include but is not limited to 3G/4G connections, WiFi connections, indigo plant
Tooth connection, WiMAX connections, Zigbee connections, UWB (ultra wideband) connections and other currently known or future open
The radio connection of hair.
Step 202, from least one application subfunction set that test is ready to use in using determination in subfunction.
In the present embodiment, determined at least one application subfunction that above-mentioned electronic equipment can include from above-mentioned application
The application subfunction set tested above-mentioned application is ready to use in, wherein, the sub- work(of application in the above-mentioned set using subfunction
Can be able to be answering for the predetermined number of the order selection according to number the defects of applying subfunction within a predetermined period of time from more to less
With subfunction, in the defects of drawbacks described above number is recorded in above-mentioned application management system；Application in the above-mentioned set using subfunction
Subfunction can also be the application subfunction for having maximum loss desired value, wherein, above-mentioned maximum loss desired value can be root
Carry out what analysis was drawn according to the historical defect data in management system the defects of being recorded in above-mentioned application.
In the present embodiment, above-mentioned electronic equipment can obtain above-mentioned answer from management system the defects of above-mentioned application first
Each historical defect data using subfunction；Afterwards, above-mentioned historical defect data can be analyzed, determines each application
The latent defect data of function, wherein, above-mentioned latent defect data can include serious latent defect number and not serious potential
Defect counts, the influence degree that drawbacks described above management system can be according to defect to application subfunction, in advance by latent defect point
For serious latent defect and not serious latent defect, above-mentioned serious latent defect can prevent above-mentioned application subfunction from realizing it
The defects of function, for example, in shopping class application, the defects of can will be unable to commodity being added to shopping cart, is divided into serious latent
In defect；It is then possible to the quantity for realizing each total quantity using the step of subfunction and committed step is obtained, using sub- work(
At least one step can be included, above-mentioned committed step can be the step of determining to realize using the function of subfunction；Afterwards, utilize
The total quantity of above-mentioned steps subtracts the quantity of above-mentioned committed step, obtains the quantity of non-key step, recycles above-mentioned key step
Rapid quantity divided by the total quantity of above-mentioned steps, determine it is each there is the probability of major defect using subfunction, recycle above-mentioned
The quantity of non-key step divided by the total quantity of above-mentioned steps, determine each the probability of non-critical defects occur using subfunction；
Then, calculate above-mentioned serious latent defect number and be multiplied by the above-mentioned probability for major defect occur and above-mentioned not serious latent defect number
Mesh is multiplied by the above-mentioned probability sum for non-critical defects occur, determines each expected shortfall using subfunction；Finally, tool is chosen
There is the application subfunction of maximum loss desired value.
As an example, above-mentioned electronic equipment determine the serious latent defect number of the first application subfunction for 1, it is not serious latent
Defect counts be 2, second application subfunction serious latent defect number be 2, not serious latent defect number be the 5, the 3rd
Serious latent defect number using subfunction is 4, not serious latent defect number is 2；Afterwards, obtain and realize the first application
The total quantity of the step of function is 5, the quantity of committed step is 1, then the first probability for occurring major defect using subfunction is
0.2, the probability for non-critical defects occur is 0.8, and the total quantity for obtaining the step of realizing the second application subfunction is 2, key step
Rapid quantity is 1, then the probability that major defect occurs in the first application subfunction is 0.5, and the probability for non-critical defects occur is
0.5, the total quantity for obtaining the step of realizing the 3rd application subfunction is 10, the quantity of committed step is 3, then first applies sub- work(
The probability that major defect can occur is 0.3, and the probability for non-critical defects occur is 0.7；Then, the first application subfunction is calculated
Serious latent defect number 1 is multiplied by the probability 0.2 for major defect occur, and with not serious latent defect number 2 to be multiplied by appearance not serious
The sum of probability 0.8 of defect, the expected shortfall for determining the first application subfunction is 1.8, calculates the tight of the second application subfunction
Weight latent defect number 2 is multiplied by the probability 0.5 for major defect occur and not serious latent defect number 5 is multiplied by and not serious lack occurs
The sunken sum of probability 0.5, the expected shortfall for determining the first application subfunction is 3.5, calculates the serious of the 3rd application subfunction
Latent defect number 4 is multiplied by the probability 0.3 for major defect occur and not serious latent defect number 2 is multiplied by and non-critical defects occurs
The sum of probability 0.7, determine the 3rd application subfunction expected shortfall be 2.6；Finally, choosing has maximum loss desired value
The second of 3.5 applies subfunction.
In the present embodiment, after above-mentioned application increases function, above-mentioned electronic equipment can obtain increased answer first
With subfunction to above-mentioned using original disturbance degree using subfunction；Afterwards, can be from management system the defects of above-mentioned application
The middle each historical defect data using subfunction for obtaining above-mentioned application；It is then possible to analyze above-mentioned historical defect data and
Above-mentioned disturbance degree, determine each latent defect data using subfunction.
Step 203, test case set corresponding with application subfunction set is obtained from candidate's test case set.
In the present embodiment, obtained in candidate's test case set that above-mentioned electronic equipment can obtain from step 201
Test case set corresponding with the application subfunction set determined in step 202.
Step 204, the application is tested using the test case set.
In the present embodiment, above-mentioned electronic equipment can utilize the test case set obtained in step 203 to answer above-mentioned
With being tested.
In some optional implementations of the present embodiment, above-mentioned electronic equipment can be mounted thereon to above-mentioned application
Terminal device send above-mentioned test case set for above-mentioned terminal device using above-mentioned test case set to above-mentioned application
Tested.
With further reference to Fig. 3, it illustrates the flow 300 of another of application testing method embodiment.The application test
The flow 300 of method, comprises the following steps：
Step 301, the candidate's test case set tested application is obtained.
In the present embodiment, the electronic equipment (such as server shown in Fig. 1) of application testing method operation thereon can
To obtain the candidate's test case set tested application, wherein, above-mentioned application can include at least one sub- work(of application
Can, each corresponding with the test case for being tested using subfunction this using subfunction, above-mentioned test case is
One group of test input, execution condition and the expected results worked out for some special objective, to test some Program path
Or examine whether meet some particular demands.
In some optional implementations of the present embodiment, above-mentioned candidate's test case set can be pre-stored within
State in electronic equipment, when testing above-mentioned application, above-mentioned electronic equipment can be carried out directly from local obtain to application
Candidate's test case set of test；Above-mentioned candidate's test case be stored in above-mentioned candidate's test case write with thereon
Terminal device in, when testing above-mentioned application, above-mentioned electronic equipment can pass through wired connection mode or wireless
The terminal device that connected mode is write from tester using its progress test case obtains the candidate tested application and surveyed
Example set on probation.
Step 302, from least one application subfunction set that test is ready to use in using determination in subfunction.
In the present embodiment, above-mentioned electronic equipment can determine to be ready to use in upper from above-mentioned at least one application subfunction
State using the application subfunction set tested, wherein, the application subfunction in the above-mentioned set using subfunction can be by
The application subfunction for the predetermined number that the order of the defects of impinging upon application subfunction in historical time section number from more to less is chosen, on
In the defects of it can be one month in the past to state historical time section, and drawbacks described above number is recorded in above-mentioned application management system；It is above-mentioned to answer
With can also be the application subfunction that has maximum loss desired value using subfunction in subfunction set, wherein, it is above-mentioned most
Big expected shortfall can be that the historical defect data according to the defects of being recorded in above-mentioned application in management system analyze
Go out.
Step 303, application set of sub-functions is closed and carries out duplicate removal processing, generate unduplicated application of each application subfunction
Function set.
In the present embodiment, above-mentioned electronic equipment can obtain application repeated in the above-mentioned set using subfunction first
Function；Afterwards, can delete above-mentioned repetition applies subfunction residue one using at least one in subfunction up to each
It is individual；Finally, each unduplicated application subfunction set of application subfunction can be generated.
As an example, the sub- work(of application for the predetermined number chosen according to the order of number the defects of application subfunction from more to less
Sub- work(can be applied for the first application subfunction, the 3rd application subfunction, the 6th application subfunction, the 7th application subfunction and the tenth
Can, the application subfunction with maximum loss desired value applies sub- work(for the second application subfunction, the 3rd using subfunction, the 5th
Energy, the 8th apply subfunction using subfunction and the tenth, should to the above-mentioned application subfunction set first using subfunction composition
With subfunction, the 3rd application subfunction, the 6th application subfunction, the 7th application subfunction, the tenth application subfunction, the second application
Subfunction, the 3rd application subfunction, the 5th application subfunction, the 8th application subfunction and the tenth application subfunction are carried out at duplicate removal
Reason, generate each unduplicated application set of sub-functions of application subfunction and be combined into the first application subfunction, the second application subfunction, the
Three application subfunctions, the 5th application subfunction, the 6th application subfunction, the 7th application subfunction, the 8th application subfunction and the
Ten apply subfunction.
Step 304, test corresponding with unduplicated application subfunction set is obtained from candidate's test case set to use
Example set.
In the present embodiment, obtained in candidate's test case set that above-mentioned electronic equipment can obtain from step 301
Test case set corresponding with the unduplicated application subfunction set generated in above-mentioned steps 303.
Step 305, duplicate removal processing is carried out to test case set, generates the unduplicated test use cases of each test case
Close.
In the present embodiment, above-mentioned electronic equipment can obtain repeats in the test case set of the acquisition of above-mentioned steps 304
Test case；Afterwards, at least one in the test case of above-mentioned repetition can be deleted until each test case is remaining
One；Finally, the unduplicated test case set of each test case can be generated.
Step 306, it is corresponding with being tested using unduplicated test case set.
In the present embodiment, above-mentioned electronic equipment can utilize the unduplicated test case set generated in step 305
Above-mentioned application is tested.
In some optional implementations of the present embodiment, above-mentioned electronic equipment can also be installed on it to above-mentioned application
On terminal device send above-mentioned unduplicated test case set so that above-mentioned terminal device utilizes above-mentioned unduplicated test
Use-case set is tested above-mentioned application.
From figure 3, it can be seen that compared with embodiment corresponding to Fig. 2, the flow of the application testing method in the present embodiment
300 highlight the step of carrying out duplicate removal to the conjunction of application set of sub-functions and test case set.Thus, the scheme of the present embodiment description
It can more to simplify the test case that application is tested, so as to realize more targeted application test.
With further reference to Fig. 4, as the realization to method shown in above-mentioned each figure, this application provides one kind application test dress
The one embodiment put, the device embodiment is corresponding with the embodiment of the method shown in Fig. 2, and the device specifically can apply to respectively
In kind electronic equipment.
As shown in figure 4, the application test device 400 described in the present embodiment includes：First acquisition unit 401, determining unit
402nd, second acquisition unit 403 and test cell 404.Wherein, first acquisition unit 401 is configured to obtain and application is surveyed
Candidate's test case set of examination, wherein, the application applies subfunction including at least one, each using subfunction with being used for
The test case tested using subfunction this is corresponding；Determining unit 402 is configured to from least one application
Determination is ready to use in the application subfunction set of test in subfunction, wherein, the application subfunction set includes following at least one
：The application subfunction for the predetermined number chosen according to the order of number the defects of application subfunction from more to less；Damaged with maximum
The application subfunction of desired value is lost, the maximum loss desired value is analyzed according to the historical defect data of application subfunction
Draw；Second acquisition unit 403 is configured to obtain from candidate's test case set applies set of sub-functions with described
Test case set corresponding to conjunction；Test cell 404 is configured to survey the application using the test case set
Examination.
In the present embodiment, it can obtain what application was tested using the first acquisition unit 401 of test device 400
Candidate's test case set, wherein, above-mentioned application can apply subfunction including at least one, each using subfunction with being used for
The test case tested using subfunction this is corresponding, and above-mentioned test case is one worked out for some special objective
Group test input, condition and expected results are performed, to test some Program path or to examine whether meet some particular needs
Ask.
In the present embodiment, at least one application subfunction that above-mentioned determining unit 402 can include from above-mentioned application
It is determined that the application subfunction set tested above-mentioned application is ready to use in, wherein, the application in the above-mentioned set using subfunction
Subfunction can be the predetermined number chosen according to the order of number the defects of applying subfunction within a predetermined period of time from more to less
Application subfunction, in the defects of drawbacks described above number is recorded in above-mentioned application management system；In the above-mentioned set using subfunction
Can also be the application subfunction for having maximum loss desired value using subfunction, wherein, above-mentioned maximum loss desired value can be with
Be according to be recorded in above-mentioned application the defects of management system in historical defect data carry out analysis draw.
In the present embodiment, the candidate that above-mentioned second acquisition unit 403 can obtain from above-mentioned first acquisition unit 401
Test case set corresponding with the application subfunction set determined in above-mentioned determining unit 402 is obtained in test case set.
In the present embodiment, above-mentioned test cell 404 can utilize the test obtained in above-mentioned second acquisition unit 403 to use
Example set is tested above-mentioned application.
In some optional implementations of the present embodiment, above-mentioned application test device 400 can also include the first life
Into unit (not shown), above-mentioned first generation unit can obtain the application repeated in the above-mentioned set using subfunction first
Subfunction；Afterwards, can delete above-mentioned repetition applies subfunction remaining using at least one in subfunction up to each
One；Finally, each unduplicated application subfunction set of application subfunction can be generated.Above-mentioned second acquisition unit 403 is also
Obtained in the candidate's test case set that can be obtained from above-mentioned first acquisition unit 401 and life in above-mentioned first generation unit
Into unduplicated application subfunction set corresponding to test case set.
In some optional implementations of the present embodiment, above-mentioned application test device 400 can also include the second life
Into unit (not shown), above-mentioned second generation unit can obtain the test case that above-mentioned second acquisition unit 403 obtains
The test case repeated in set；Afterwards, at least one in the test case of above-mentioned repetition can be deleted until each test
Use-case is remaining one；Finally, the unduplicated test case set of each test case can be generated.Above-mentioned test cell 404
Above-mentioned application can be tested using the unduplicated test case set generated in the second generation unit.
In some optional implementations of the present embodiment, above-mentioned candidate's test case set can be pre-stored within
State in electronic equipment, when testing above-mentioned application, above-mentioned electronic equipment can be carried out directly from local obtain to application
Candidate's test case set of test；Above-mentioned candidate's test case be stored in above-mentioned candidate's test case write with thereon
Terminal device in, when testing above-mentioned application, above-mentioned electronic equipment can pass through wired connection mode or wireless
The terminal device that connected mode is write from tester using its progress test case obtains the candidate tested application and surveyed
Example set on probation.
In some optional implementations of the present embodiment, above-mentioned test cell 404 can also be installed to above-mentioned application
It is above-mentioned unduplicated so that above-mentioned terminal device utilizes that terminal device thereon sends above-mentioned unduplicated test case set
Test case set is tested above-mentioned application.
Below with reference to Fig. 5, it illustrates suitable for for realizing the computer system 500 of the server of the embodiment of the present application
Structural representation.
As shown in figure 5, computer system 500 includes CPU (CPU) 501, it can be read-only according to being stored in
Program in memory (ROM) 502 or be loaded into program in random access storage device (RAM) 503 from storage part 508 and
Perform various appropriate actions and processing.In RAM503, also it is stored with system 500 and operates required various programs and data.
CPU501, ROM502 and RAM503 are connected with each other by bus 504.Input/output (I/O) interface 505 is also connected to bus
504。
I/O interfaces 505 are connected to lower component：Importation 506 including keyboard, mouse etc.；Penetrated including such as negative electrode
The output par, c 507 of spool (CRT), liquid crystal display (LCD) etc. and loudspeaker etc.；Storage part 508 including hard disk etc.；
And the communications portion 509 of the NIC including LAN card, modem etc..Communications portion 509 via such as because
The network of spy's net performs communication process.Driver 510 is also according to needing to be connected to I/O interfaces 505.Detachable media 511, such as
Disk, CD, magneto-optic disk, semiconductor memory etc., it is arranged on as needed on driver 510, in order to read from it
Computer program be mounted into as needed storage part 508.
Especially, in accordance with an embodiment of the present disclosure, it may be implemented as computer above with reference to the process of flow chart description
Software program.For example, embodiment of the disclosure includes a kind of computer program product, it includes being tangibly embodied in machine readable
Computer program on medium, above computer program bag contain the program code for being used for the method shown in execution flow chart.At this
In the embodiment of sample, the computer program can be downloaded and installed by communications portion 509 from network, and/or from removable
Medium 511 is unloaded to be mounted.
Flow chart and block diagram in accompanying drawing, it is illustrated that according to the system of the various embodiments of the application, method and computer journey
Architectural framework in the cards, function and the operation of sequence product.At this point, each square frame in flow chart or block diagram can generation
The part of one module of table, program segment or code, a part for above-mentioned module, program segment or code include one or more
For realizing the executable instruction of defined logic function.It should also be noted that some as replace realization in, institute in square frame
The function of mark can also be with different from the order marked in accompanying drawing generation.For example, two square frames succeedingly represented are actual
On can perform substantially in parallel, they can also be performed in the opposite order sometimes, and this is depending on involved function.Also
It is noted that the combination of each square frame and block diagram in block diagram and/or flow chart and/or the square frame in flow chart, Ke Yiyong
Function as defined in execution or the special hardware based system of operation are realized, or can be referred to specialized hardware and computer
The combination of order is realized.
Being described in unit involved in the embodiment of the present application can be realized by way of software, can also be by hard
The mode of part is realized.Described unit can also be set within a processor, for example, can be described as：A kind of processor bag
Include first acquisition unit, determining unit, second acquisition unit and test cell.Wherein, the title of these units is in certain situation
Under do not form restriction to the unit in itself.For example, first acquisition unit is also described as " obtaining candidate's test case
The unit of set ".
As on the other hand, present invention also provides a kind of nonvolatile computer storage media, the non-volatile calculating
Machine storage medium can be the nonvolatile computer storage media included in said apparatus in above-described embodiment；Can also be
Individualism, without the nonvolatile computer storage media in supplying terminal.Above-mentioned nonvolatile computer storage media is deposited
One or more program is contained, when said one or multiple programs are performed by an equipment so that the said equipment：Obtain
The candidate's test case set tested application, wherein, the application applies subfunction including at least one, each application
Subfunction is corresponding with the test case for being tested using subfunction this；From at least one application subfunction
It is determined that the application subfunction set of test is ready to use in, wherein, the application subfunction set includes at least one of following：According to should
The application subfunction for the predetermined number chosen with the order of number the defects of subfunction from more to less；With maximum loss desired value
Using subfunction, the maximum loss desired value is to carry out analysis according to the historical defect data of application subfunction to draw；From
Test case set corresponding with the application subfunction set is obtained in candidate's test case set；Utilize the test
Use-case set is tested the application.
Above description is only the preferred embodiment of the application and the explanation to institute's application technology principle.People in the art
Member should be appreciated that invention scope involved in the application, however it is not limited to the technology that the particular combination of above-mentioned technical characteristic forms
Scheme, while should also cover in the case where not departing from the inventive concept, carried out by above-mentioned technical characteristic or its equivalent feature
The other technical schemes for being combined and being formed.Such as features described above has similar work(with (but not limited to) disclosed herein
The technical scheme that the technical characteristic of energy is replaced mutually and formed.
Claims (10)
1. a kind of application testing method, it is characterised in that the method for testing includes：
The candidate's test case set tested application is obtained, wherein, the application applies subfunction including at least one,
It is each corresponding with the test case for being tested using subfunction this using subfunction；
From at least one application subfunction set that test is ready to use in using determination in subfunction, wherein, application
Function set includes at least one of following：The predetermined number chosen according to the order of number the defects of application subfunction from more to less
Using subfunction；Application subfunction with maximum loss desired value, the maximum loss desired value is according to using subfunction
Historical defect data carry out analysis and draw；
Test case set corresponding with the application subfunction set is obtained from candidate's test case set；
The application is tested using the test case set.
2. according to the method for claim 1, it is characterised in that determined described from least one application subfunction
It is ready to use in after the application subfunction set of test, methods described also includes：
Duplicate removal processing is carried out to the application subfunction set, each application is generated subfunction is unduplicated and apply set of sub-functions
Close；
Obtained from candidate's test case set and unduplicated apply the corresponding test use cases of subfunction set with described
Close.
3. according to the method for claim 2, it is characterised in that it is described from candidate's test case set obtain with
After test case set corresponding to the unduplicated application subfunction set, methods described also includes：
Duplicate removal processing is carried out to the test case set, generates the unduplicated test case set of each test case；
The application is tested using the unduplicated test case set.
4. according to the method for claim 3, it is characterised in that candidate's test case set includes following at least one
：
Local candidate's test case set is pre-stored within, candidate's test use cases are compiled in collaboration with to be deposited in the terminal being written on thereon
Candidate's test case set of storage.
5. according to the method for claim 4, it is characterised in that described to utilize the unduplicated test case set to institute
Stating includes using carrying out test：
The terminal being mounted thereon to the application sends the unduplicated test case set so that the terminal utilizes institute
Unduplicated test case set is stated to test the application.
6. one kind applies test device, it is characterised in that described device includes：
First acquisition unit, it is configured to obtain the candidate's test case set for testing application, wherein, the application bag
Include it is at least one apply subfunction, it is each relative with the test case for applying subfunction to be tested this using subfunction
Should；
Determining unit, it is configured to from least one application set of sub-functions that test is ready to use in using determination in subfunction
Close, wherein, the application subfunction set includes at least one of following：According to number from more to less suitable the defects of application subfunction
The application subfunction for the predetermined number that sequence is chosen；Application subfunction with maximum loss desired value, the maximum loss it is expected
Value is to carry out analysis according to the historical defect data of application subfunction to draw；
Second acquisition unit, it is configured to obtain from candidate's test case set and applies subfunction set corresponding with described
Test case set；
Test cell, it is configured to test the application using the test case set.
7. device according to claim 6, it is characterised in that described device also includes：
First generation unit, it is configured to carry out duplicate removal processing to the application subfunction set, generation is each to apply subfunction
Unduplicated application subfunction set；And
The second acquisition unit be further configured to from candidate's test case set obtain with it is described unduplicated
Using test case set corresponding to subfunction set.
8. device according to claim 7, it is characterised in that described device also includes：
Second generation unit, it is configured to carry out duplicate removal processing to the test case set, generates each test case and do not weigh
Multiple test case set；And
The test cell is further configured to test the application using the unduplicated test case set.
9. device according to claim 8, it is characterised in that candidate's test case set includes following at least one
：
Local candidate's test case set is pre-stored within, candidate's test use cases are compiled in collaboration with to be deposited in the terminal being written on thereon
Candidate's test case set of storage.
10. device according to claim 9, it is characterised in that the test cell is further configured to：
The terminal being mounted thereon to the application sends the unduplicated test case set so that the terminal utilizes institute
Unduplicated test case set is stated to test the application.
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| CN201610555124.5A CN107622007A (en) | 2016-07-14 | 2016-07-14 | Application testing method and device |
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| CN201610555124.5A CN107622007A (en) | 2016-07-14 | 2016-07-14 | Application testing method and device |
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Application publication date: 20180123 |