CN106952671A - It is good to draw the device and method that plasma time parameter is measured under clean refined magnetic well structure - Google Patents
It is good to draw the device and method that plasma time parameter is measured under clean refined magnetic well structure Download PDFInfo
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Abstract
The present invention provides the good device and method for drawing and plasma time parameter being measured under clean refined magnetic well structure；Comprise the following steps：Step A10：Before plasma enters magnetic well, it is that electric probe is powered, starts to obtain the analog current corresponding to 4 electric probes, and export real-time I t characteristic curves；Step A20：Calculating plasma is introduced into electric probe initial current I during magnetic well space0；Step A30：According to real-time I t characteristic curves, calculate four electric probes and flow through the maximum time t of electric current1、t2、t3、t4, the time that as plasma enters inside magnetic well via chute coil；Step A40：The maximum time t of electric current is flowed through according to the obtained electric probes of step A301、t2、t3、t4, carry out calculating plasma filling time Tf；Step A50：According to the I calculated in step A200, calculating plasma slip timeStep A60：According to the plasma filled time T calculated in step A40f, and the plasma slip time calculated in step A50Calculating plasma confinement time Tc。
Description
Technical Field
The invention relates to the field of plasma parameter measurement, in particular to a device and a method for measuring plasma time parameters under a Jia-La-Al magnetic trap structure, and particularly relates to a device and a method for measuring plasma filling time and plasma confinement time in a strong confinement magnetic field.
Background
At present, fossil energy reserves are limited; and, if fossil energy is used, the environment is increasingly seriously damaged. Therefore, nuclear power is one of the main approaches to solving the energy problem. Compared with the nuclear fission which has less raw material reserves and generates unmanageable reflective wastes, the nuclear fusion has rich raw material reserves and has light environmental pollution, so that the controllable thermonuclear fusion reaction device is vigorously developed in various countries.
The core problem of controlled thermonuclear fusion is the confinement of plasma at high temperature using a magnetic field with a special structure, and several magnetic confinement methods such as a suspended dipole (LDX), a Reversed Field Pinch (RFP), a tokamak, a starburst device, etc. have been proposed internationally so far. Compared with magnetic confinement devices such as Tokamak devices and star simulators, the magnetic confinement device serving as a non-Tokamak magnetic confinement elegant magnetic confinement device has the advantages of simple structure, small volume, low manufacturing cost, capability of automatically inhibiting the exchange instability of plasma and the like.
The magnetic trap is used as a core part of the Jia La Jie ya type magnetic confinement device, the plasma is confined in a magnetic field space generated by the magnetic trap, and the measurement of plasma parameters is the basis of the magnetic confinement research of the plasma, which has great significance for the theoretical research and practice of thermonuclear fusion reaction. The filling time and the confinement time of the plasma after entering the magnetic trap through the chute coil are important parameters of the plasma, and have great significance for researching the whole controlled thermonuclear fusion process.
In the prior art, a method for measuring plasma time parameters under a Jia-La magnetic trap structure is shown in FIG. 1. The prior art shown in fig. 1 only illustrates that values of confinement time and filling time can be measured by uniformly distributing 12 electric probes on a circumference of a magnetic trap coil plane R of 280mm, and the number of the electric probes cannot be optimized.
Therefore, how to design a device and a method for measuring the filling time and the confinement time after the plasma enters the magnetic trap in the multi-pole magnetic trap device makes the measurement reliable, real-time and accurate, reduces the number of electric probes during the measurement, optimizes the measurement system, ensures the measurement accuracy, reduces the influence of the electric probes on the plasma filling inside the magnetic trap, and becomes the subject of the research efforts of all parties.
Disclosure of Invention
The invention mainly aims to provide a device and a method for measuring plasma time parameters under a good-Lajiya magnetic trap structure. Compared with the prior art, the device and the method have the advantages of reliable, real-time and accurate measurement, reduced number of electric probes, optimized measurement system, guaranteed measurement accuracy and reduced influence of the electric probes on plasma filling inside the magnetic trap.
In order to achieve the purpose, the invention provides a device for measuring plasma time parameters under a good Lajieya magnetic trap structure, wherein plasma in the whole magnetic trap space is confined in an annular region between an inner blind eel coil and an outer blind eel coil, the diameter of the inner blind eel coil is 40cm, and the diameter of the outer blind eel coil is 70 cm; the device comprises an electric probe and signal acquisition circuit (1), a signal conditioning circuit (2), a data acquisition system (3) and a PC (personal computer) (4) which are connected in sequence; wherein,
the electric probe and signal acquisition circuit (1) comprises an electric probe measurement module and a signal acquisition module; the electric probe measuring module comprises 4 electric probes (1-1, 1-2, 1-3 and 1-4), the electric probes (1-1, 1-2, 1-3 and 1-4) are uniformly distributed on a circumference with the radius of 275mm between an inner blind eel coil and an outer blind eel coil in the clockwise direction, wherein the electric probe 1-1 is arranged at the axis position of the chute coil; one end of each of 4 electric probes (1-1, 1-2, 1-3 and 1-4) is connected with the plasma (G), the other end of each electric probe is connected with one end of one divider resistor (1-5), the other end of each divider resistor (1-5) is connected with the anode of a common direct current power supply (1-6), and the cathode of the common direct current power supply (1-6) is connected with a current-limiting resistor and then connected with the plasma (G); the signal acquisition module is used for acquiring voltage waveforms on the voltage dividing resistors (1-5) and further acquiring analog current I on each voltage dividing resistor (1-5)i(t) outputting real-time I-t characteristic curves of the 4 electric probes;
signal conditioning circuit (2): amplifying and filtering the analog current measured by the electric probe and the signal acquisition circuit (1), and outputting an analog signal;
data acquisition system (3): the device comprises an A/D conversion module and a data cache module; the A/D conversion module converts the analog signal output by the signal conditioning circuit (2) into a digital signal, and the data caching module caches the data; the data acquisition system (3) outputs a digital signal;
PC (4): the system comprises a digital filtering module, a data storage module and an image and data analysis module which are connected in sequence; the digital filtering module is used for filtering the digital signals output by the data acquisition system (3) and removing noise in the A/D conversion process; the data storage module is used for storing the filtered and de-noised measurement data into a specified database; and the image and data analysis module is used for calculating the plasma time parameter according to the data obtained from the data storage module.
In order to achieve the above object, the present invention further provides a method for measuring a plasma time parameter under a well-cleaned magnetic trap structure, wherein the method comprises the following steps:
step A10:
before the plasma enters the magnetic trap, the electric probe is electrified, and the analog current I on each divider resistor (1-5) is collectedi(t) outputting real-time I-t characteristic curves of the 4 electric probes;
step A20:
calculating to obtain the initial current I of the electric probe when the plasma does not enter the magnetic trap space according to the real-time I-t characteristic curve of the electric probe measured in the step A100；
Step A30:
according to the real-time I-t characteristic curve of the electric probe measured in the step A10, the time t of the maximum current flowing through the four electric probes (1-1, 1-2, 1-3 and 1-4) is calculated according to the formula 11、t2、t3、t4T here1、t2、t3、t4Namely the time that the plasma enters the magnetic trap through the chute coil;
step A40:
the maximum time t of the current flowing through the electric probe is obtained according to the step A301、t2、t3、t4Calculating the plasma filling time T under the magnetic trap structure according to the formula 2f；
Step A50:
according to I calculated in the step A200Calculating the electrical resistivity according to equation 3Needle current reverts to I0Time ofNamely the time for the plasma to escape from the weak magnetic field area;
step A60:
according to the plasma filling time T under the magnetic trap structure calculated in the step A40fAnd the time for the plasma to escape from the low magnetic field region, calculated in step A50Calculating the plasma confinement time T under the magnetic trap structure according to the formula 4c；
The invention has the beneficial technical effect of providing the device and the method for measuring the plasma time parameter under the structure of the elegant magnetic trap. In consideration of a weak magnetic field area and plasma density distribution in a specific good Lajieya magnetic trap, through deep understanding of plasma time parameter measurement in the magnetic trap, the invention reduces the number of electric probes, optimizes a measurement system, simultaneously ensures the measurement accuracy and reduces the influence of the electric probes on plasma filling in the magnetic trap.
Drawings
FIG. 1 is a schematic diagram of a prior art arrangement of electrical probes in the plane of a magnetic trap coil;
FIG. 2 is a schematic diagram of the overall structure of an apparatus for measuring plasma time parameters under a Jia-La magnetic trap structure according to the present invention;
figure 3 is a schematic diagram of an electrical probe module in the electrical probe and signal acquisition module 1 provided by the present invention;
figure 4 is a schematic diagram of a signal acquisition module in the electrical probe and signal acquisition module 1 provided by the present invention;
FIG. 5 is a geometric structure diagram of a simulation model of the Jia La Ji ya magnetic trap in COMSOL finite element simulation software;
FIG. 6 is a magnetic induction distribution plot of a half-section of a magnetic trap through a central axis;
figure 7 is a schematic view of a plasma confined in an annular region between an inner and outer blind eel coil;
FIG. 8 is a schematic view of ray OA in the radial direction of the outer blindeel coil;
FIG. 9 is a schematic diagram of the distribution of magnetic induction on the OA line obtained by simulation analysis of FIG. 8;
FIG. 10 is a schematic illustration of the plasma density profile obtained from FIG. 9 at different times;
FIG. 11 is a schematic view of the device structure of a magnetic confinement device of the Jialargeya type;
fig. 12 is a schematic diagram showing a relative positional relationship between the chute coil and the magnetic trap in the practical halya-type magnetic confinement apparatus.
Detailed Description
The principles and features of the present invention will be clearly and completely described in the following detailed description of the embodiments of the invention, taken in conjunction with the accompanying drawings, which are incorporated in and constitute a part of this specification, and it is to be understood that the embodiments are merely illustrative of the invention and do not limit the scope of the invention.
As shown in fig. 2, the present invention further provides a device for measuring a plasma time parameter under the brazilian magnetic well structure, which particularly relates to measuring a plasma time parameter under the brazilian magnetic well structure, and particularly relates to measuring a plasma filling time and a confinement time in a strong confinement magnetic field. The device comprises an electric probe and signal acquisition circuit 1, a signal conditioning circuit 2, a data acquisition system 3 and a PC 4 which are connected in sequence.
The electric probe and signal acquisition circuit 1 comprises an electric probe measurement module and a signal acquisition module. In the electric probe and signal acquisition circuit 1, the electric probe measures the connection relationship between the module and the signal acquisition module, as shown in fig. 4. In the invention, the electric probe and the signal acquisition circuit 1 are used for combining the electric probe made of tungsten wires with an analog circuit and measuring the relevant time parameters of the plasma. As shown in fig. 4: one end of each of the 4 electric probes is powered by the same direct current power supply 1-6; a single electric probe 1-1, 1-2, 1-3 or 1-4 respectively forms a loop with a voltage dividing resistor 1-5, a common direct current power supply 1-6 and plasma G. One end of each of 4 electric probes 1-1, 1-2, 1-3 and 1-4 is connected with a plasma G, the other end of each electric probe is connected with one end of a divider resistor 1-5, the other end of each divider resistor 1-5 is connected with the anode of a common direct current power supply 1-6, and the cathode of each common direct current power supply 1-6 is connected with a current-limiting resistor and then connected with the plasma G. The four voltage meters in fig. 4 are respectively connected to the positions of the four voltage dividing resistors, where the dividing ratio is greater than 0.5. In the voltage dividing resistor in fig. 4, since the current value is small when the plasma does not enter the magnetic trap space, the value of the voltage dividing resistor is not excessively large, preferably, between several ohms and several tens of ohms.
The schematic diagram of the signal acquisition module of the electric probe and signal acquisition circuit 1 is shown in fig. 4: the signal acquisition module is an analog signal acquisition circuit. The signal acquisition module acquires the voltage waveforms on the voltage dividing resistors 1-5 and sends the voltage waveforms to the upper computer for data processing and analysis and calculation. The signal acquisition module is used for acquiring voltage waveforms on the voltage dividing resistors (1-5), and further acquiring analog currents I on each voltage dividing resistor (1-5) according to the voltage waveforms and the ohm law that U-IRi(t) and outputting real-time I-t characteristic curves of the 4 electric probes.
In fig. 4, the current limiting resistors connected in series with the common dc power supplies 1-6 are used to limit the current and prevent excessive current during plasma filling. Preferably, the current limiting resistance is several tens of ohms.
In fig. 4, a further ammeter is connected in series with the current limiting resistor. The ammeter is used for detecting the current of a circuit and is matched with the four voltmeters to ensure the acquisition of I-t signals.
The signal acquisition module only acquires the quantity of relevant time parameters measured by the electric probes, namely only the current change curves corresponding to 4 electric probes, namely the real-time I-t characteristic curves, need to be acquired. The hardware connection mode and the acquisition principle of the signal acquisition module are realized around the purpose. The function of the signal acquisition module is to express the motion condition of the plasma in the magnetic trap in the form of analog signals. When the space around one electric probe is filled with plasma, the plasma in the space around the electric probe escapes, and the voltage real-time waveform (the maximum value or the minimum value) can be measured through the circuit, so that the purpose of calculating time parameters subsequently is achieved. The signal acquisition module of the electric probe and signal acquisition circuit 1 not only measures an analog value of voltage/current, but also measures the value of the voltage/current in real time, and is used for generating a curve of the voltage/current changing along with time so as to calculate the relevant time parameter of the plasma. Specifically, when plasma is in the space around the electric probe, the measured current value is the largest; the current is measured to be minimal after the plasma has escaped from the confinement region.
The electric probe of the invention is made of tungsten wire with the diameter of 1.5mm or 0.3 mm. The invention further reduces the occupied volume of the electric probe, and reduces the contact area of the electric probe and the plasma on the premise of not influencing the current collection of the plasma, thereby reducing the influence of the magnetic field generated by the current of the electric probe on the magnetic field distribution in the magnetic trap space. In addition, the reduction of the diameter of the tungsten filament can reduce the manufacturing cost of the electric probe, and the using amount of the ceramic sleeve outside the electric probe is saved.
The electric probe and signal acquisition circuit 1 includes an electric probe measurement module, as shown in fig. 3: consists of 4 electric probes 1-1, 1-2, 1-3 and 1-4 made of tungsten wires. Structurally, the 4 electric probes are installed and distributed in the plane where the magnetic trap coil is located, the 4 electric probes are uniformly distributed on the circumference with the radius of 275mm between the inner blind eel coil and the outer blind eel coil in the clockwise direction, and the adjacent electric probes are 90 degrees with each other. In principle, the invention uses averaging to measure the relevant time parameter. According to the invention, on the circumference of 275mm in radius between the inner blind eel coil and the outer blind eel coil, the filling time and the restraining time of the plasma are obtained through 4 electric probes which are uniformly distributed. And obtaining a real-time I-t characteristic curve through the electric probe and the signal acquisition circuit 1.
FIG. 3 is a schematic diagram of the installation distribution of the electric probes in the plane of the magnetic trap coil, 4 electric probes 1-1, 1-2, 1-3 and 1-4 with 90-degree intervals are installed on the circular section, and the thinking process of determining the installation positions of the electric probes is carried out by the following three steps:
in the first step, in order to determine the spatial position for installing the electric probe, the magnetic induction intensity and the plasma density distribution of the optimal-Larga magnetic trap space are determined.
Establishing a coil simulation model of the magnetic trap of the Jia-La-Lu-Ji-Lu in COMSOL finite element simulation software, as shown in FIG. 5; in the COMSOL finite element simulation software, determining the magnetic induction intensity distribution of the optimal Lajiya magnetic trap space by setting relevant parameters of the blind eel coil, as shown in FIG. 6; and analyzing the density distribution of the plasma on the cross section of the magnetic trap. Generally speaking, the first step is beneficial to determining the specific spatial position of the installation of the electric probe in the third step, thereby ensuring the accuracy of the measured parameters.
The second step is that: and determining a weak magnetic field area in which the plasma is confined according to the plasma density distribution in the magnetic trap space determined in the first step.
According to the density distribution of the plasma on the cross section of the magnetic trap determined in the first step, the analysis results in: the weak magnetic field region of the magnetic trap space exists in the annular region between the inner and outer blind eel coils, and the plasma in the whole magnetic trap space is confined in the annular region between the inner and outer blind eel coils, as shown in fig. 6. And (3) analyzing the distribution condition of the plasma density in the annular region by using finite element software, and further analyzing to obtain: the particle density in the middle region of the annular region is substantially equal. In a second step, the low field region in which the plasma is confined is determined from the simulation results in the COMSOL finite element simulation software.
And determining the confined area after the plasma enters the magnetic trap, and providing theoretical guidance for determining the number and the installation position of the electric probes required by measurement in the third step.
In the second step, specifically, the analysis process of the simulation result in the first step is as follows:
figure 7 is a schematic view of the plasma confined in the annular region between the inner and outer blind eel coils. In fig. 7, a radial OA of the outer cecum coil is selected, as shown in fig. 8. The simulation analysis of fig. 8 gave a distribution diagram of the magnetic induction intensity (magnetic flux density) on the OA line, as shown in fig. 9.
As can be seen from fig. 9, a "U" shaped magnetic field is generated between the inner and outer blind eel coils of the magnetic trap, i.e. the weak magnetic field region inside the magnetic trap. And then plasma density distributions at different times are obtained, as shown in fig. 10. FIG. 10 is a schematic diagram of the plasma density distribution obtained from FIG. 9 at different times, and is a screenshot in COMSOL software. Wherein the unit e-6 represents 1. mu.s; the unit e-5 represents 10. mu.s. Fig. 10 a), b), c) and d) show plasma density distributions at time points of 1 μ s, 3 μ s, 10 μ s and 30 μ s, respectively. As can be seen from the 4 diagrams (a), (b), (c) and (d) of fig. 10, the plasma gradually concentrates on the middle weak magnetic field region of the inner and outer ceva coils and the circumference of the ceva coil with the passage of time. Thus, the annular region where the plasma is confined between the inner and outer blind eel coils can be determined.
The third step: determining the number and the installation position of the electric probes required for measurement according to the plasma distribution condition of the whole weak magnetic field region determined in the second step and by considering the space configuration of the weak magnetic field region;
the electric probe is installed in the middle section of the annular weak magnetic field area, and 4 electric probes which are spaced by 90 degrees in pairs are selected and installed for accurately measuring time parameters.
The third step is closely related to the first and second steps. As described in the second step, the weak magnetic field area distribution of the magnetic trap space and the plasma confined area have been obtained. Therefore, in combination with the geometric dimensions of the inner ceeel coil (diameter 40cm) and the outer ceeel coil (diameter 70cm), and in combination with the magnetic trap structure of fig. 5, it was determined that the electrical probe was mounted on a circumference between the inner ceeel coil and the outer ceeel coil with a radius of 275 mm. And considering factors such as measurement accuracy, minimum electric probe interference, rapid data processing introduction and the like, 4 electric probes are determined to be installed and uniformly distributed on a ring with the radius of 275mm of the optimal Lajia magnetic trap structure according to 90-degree interval angles, and the ring is used for obtaining a required real-time I-t characteristic curve and preparing for subsequent analysis and calculation. Because the electric probes which are 180 degrees in pairs are mutually matched for measurement, the electric probes in the invention must be uniformly distributed.
The electric probes and the electric probes in the signal acquisition circuit 1 are selected to be distributed on a circumference with a radius of 275mm for the following reasons: in the COMSOL finite element simulation software, the Jia La Jie ya magnetic trap model is shown in FIG. 5-the geometry of the magnetic trap simulation model. By setting relevant parameters of the blind eel coil for simulation, a semi-section magnetic induction intensity distribution cloud picture of the magnetic trap passing through the central axis is obtained, and is shown in figure 6, namely the magnetic induction intensity distribution of the magnetic trap space. As can be seen from fig. 6, the weak magnetic field region is located in the annular region between the inner and outer blinder coils. The plasma is confined to an annular region within this region. A schematic of the plasma confined annular region is shown in figure 7. In order to accurately measure the filling time and the confinement time of the plasma entering the magnetic trap space, the invention places the electric probe at the central position of the weak magnetic field area in the magnetic trap space. Therefore, the diameter of the blind eel coil in the magnetic trap is 40cm, and the diameter of the blind eel coil outside is 70cm, becauseObviously, the electric probe and the electric probe in the signal acquisition circuit 1 are arranged on the radiusIs 275mm circumference.
The measurement mode of 4 electric probes is selected by the electric probe and signal acquisition circuit 1 for the following reasons: the presence of the electrical probe can have an effect on the diffusion of plasma in the magnetic trap. If more than 5 electric probes are used, not only can the data acquisition and processing be complicated and difficult, but also the magnetic field generated around the electric probes can influence the magnetic field distribution condition of the magnetic trap space, so that the diffusion of the surrounding plasma is influenced, and the measured time parameters are distorted; and 2-3 electric probes can not meet the aim of accurate measurement (only one group of time parameters can be obtained, and errors cannot be reduced). The invention aims to accurately measure the filling time and the confinement time of the plasma, so that after comprehensive consideration, 4 electric probes are selected by the electric probe and signal acquisition circuit 1.
The 4 electric probes of the electric probe and signal acquisition circuit 1 are uniformly distributed on the circumference with the radius of 275 mm. Compared with the prior art, the invention reduces the number of electric probes, provides a measuring method and optimizes the measuring position. Wherein the number of the electric probes is reduced, so that the interference of the electric probes on plasmas in the magnetic trap is greatly reduced. The technical blank is filled by the measurement method. And the optimization of the measurement position enables the filling time and the constraint time to be more accurate.
The signal conditioning circuit 2: the signal conditioning circuit 2 is arranged between the electric probe and signal acquisition circuit 1 and the data acquisition system 3, amplifies and filters the analog current signal detected by the electric probe and signal acquisition circuit 1, and outputs an analog signal; the signal is better matched with AD conversion and the influence of external noise on the signal is removed. The signal conditioning circuit 2 enables the acquired signals to meet the input requirements of the PCI board card in the data acquisition system 3, and reduces the interference of large disturbance on analog quantity signals. For the actually measured parameters, a signal conditioning circuit 2 is provided in order to perform processing optimization for the acquired signals. The amplifying circuit and the filter circuit (passive filter) are set in order to cooperate with a PCI board card in the data acquisition system 3.
The data acquisition system 3: PCI board card. The data acquisition system 3 comprises an A/D conversion module and a data cache module, wherein the A/D conversion module converts an analog signal output by the signal conditioning circuit 2 into a digital signal which can be uploaded to the PC 4, and the data can be cached based on a high sampling rate. Since the confinement time of the plasma in the well-cleaned magnetic trap is in the order of ms, the data acquisition system 3 is required to have high sampling rate, high resolution, high accuracy and high stability. Therefore, the data acquisition system 3 of the present invention is mainly realized by a PCI board card (high-speed data acquisition card) which contains an a/D conversion and data cache system, so that an a/D conversion circuit does not need to be additionally designed. When the plasma parameter acquisition system works, the plasma parameter acquisition system mainly works through software configuration, and hardware connection of the data acquisition system in the traditional sense is reduced, so that the aim of acquiring the plasma parameters is fulfilled. Before the PCI board card is used, the hardware connection of the PCI board card is completed. When the signal processing circuit works, signals processed by the signal conditioning circuit 2 are transmitted to the data acquisition system 3, software controls A/D conversion and data storage, digital quantity obtained after the A/D conversion is temporarily stored in an FIFO or an RAM in a PCI board card, and then the digital quantity is transmitted to an internal memory of the PC 4 through a PCI bus or other computer buses. In a word, the data acquisition system 3 is an integrated system with strong operability, and has a good application prospect in the measurement of time parameters of the plasma of the well-cleaned elegant magnetic trap. The invention first puts the data buffer module into the measuring circuit in the technical field.
The PC machine 4: the plasma time parameter analysis system comprises a digital filtering module, a data storage module and an image and data analysis module which are sequentially connected, and the PC 4 is used for filtering and storing digital signals output by the data acquisition system 3 and analyzing and calculating plasma time parameters. And the digital filtering module is used for filtering the digital signals output by the data acquisition system 3 and removing the influence of noise in the A/D conversion process on parameter measurement. And the data storage module is used for storing the filtered and de-noised measurement data into a specified database, and the database is used for storing, managing and inquiring the sampling data. The image and data analysis module is used for analyzing and calculating plasma time parameters by using related software (LabView, MATLAB and the like) according to the data obtained from the data storage module; and completing the display of the I-t curve and the data analysis calculation. The use process is as follows-firstly, the digital filtering module receives data from the data acquisition system 3(PCI board card, high-speed data acquisition card), designs a digital filtering algorithm by using relevant software (LabView and the like), and filters and removes noise for digital signals; then, the data storage module stores the filtering data; and finally, generating an image from the filtered data in an image and data analysis module, designing a corresponding analysis algorithm on a PC (personal computer), and calculating according to a time parameter calculation formula. Finally, the filling time and the restraining time of the plasma are obtained.
The image and data analysis module comprises an image analysis module and a data analysis module; the image analysis module is used for displaying an I-t curve, a simulation result and each time parameter; the data analysis module comprises an analog current acquisition submodule, an initial current calculation submodule, an entry time calculation submodule, a filling time calculation submodule, an escape time calculation submodule and a constraint time calculation submodule which are sequentially connected, wherein:
the analog current acquisition submodule comprises:
before plasma enters a magnetic trap, an electric probe is electrified, and the analog current I on each divider resistor 1-5 is collectedi(t) outputting real-time I-t characteristic curves of the 4 electric probes;
an initial current calculation submodule:
calculating to obtain the initial current I of the electric probe when the plasma does not enter the magnetic trap space according to the real-time I-t characteristic curve of the electric probe measured by the analog current acquisition submodule0；
An entry time calculation submodule:
according to the real-time I-t characteristic curve of the electric probe measured by the analog current acquisition submodule and according to a formula 1, the time t of the four electric probes 1-1, 1-2, 1-3 and 1-4 with the maximum flowing current is calculated1、t2、t3、t4T here1、t2、t3、t4Namely the time that the plasma enters the magnetic trap through the chute coil;
wherein, Ii(t) is an I-t characteristic function expression of each electric probe (1-1, 1-2, 1-3, 1-4); when the ith (i is 1, 2, 3, 4) electric probe 1-1, 1-2, 1-3, 1-4 is selected, the method utilizesThe differential algorithm of (1) calculates the time when the derivative of the ith electric probe to the time t is zero, namely the time t when the current flowing through the electric probe is maximum1、t2、t3、t4；
A filling time calculation submodule:
calculating the maximum time t of the electric probe flowing current obtained by the submodule according to the entering time1、t2、t3、t4Calculating the plasma filling time T under the magnetic trap structure according to the formula 2f；
An escape time calculation submodule:
i calculated by the calculation submodule according to the initial current0Calculating the return of the current of the electric probe to I according to the formula 30Time ofNamely the time for the plasma to escape from the weak magnetic field area;
wherein, Ii(t) is an I-t characteristic function expression of the electric probes 1-1, 1-2, 1-3 and 1-4 at different installation positions; when the ith (i is 1, 2, 3, 4) electric probe 1-1, 1-2, 1-3, 1-4 is selected, the method utilizesDetermining the ith electrical probe current I (t) to return to I0I.e. the time t at which the plasma escapes from the ith electrical probe location in the region of weak magnetic fieldi *；
A constraint time calculation submodule:
calculating the plasma filling time T under the magnetic trap structure according to the filling time calculation submodulefAnd the time for the plasma to escape from the low magnetic field region, calculated in step A50Calculating the plasma confinement time T under the magnetic trap structure according to the formula 4c；
Calculating the time difference between the plasma escape time and the plasma filling time for each electric probe; taking the maximum value of the time difference between the plasma escape time and the plasma filling time obtained at the positions of 4 electric probes 1-1, 1-2, 1-3 and 1-4I.e. the confinement time T of the plasmac。
The invention provides a method for measuring plasma filling time and confinement time under a Jia La Ji ya magnetic trap structure, which comprises the following steps:
step A10:
before plasma enters the magnetic trap through the chute coil, the electric probe is electrified to work. The device for measuring the plasma time parameter under the well-cleaned magnetic trap structure shown in fig. 2 starts to obtain the analog currents corresponding to the 4 electric probes, and outputs the real-time I-t characteristic curves of the 4 electric probes.
Step a10 relates to a time domain control system of the yalagariant device, by which the energizing time of each part (plasma gun, full plasma channel, chute coil, magnetic trap) can be controlled, thereby ensuring the accuracy of the measurement of the time parameters related to the plasma. The time domain control system can be realized by programming related software (LabView, MATLAB and the like).
Step A20:
before the plasma enters the magnetic trap, electrifying the electric probe, and calculating to obtain the initial current I of the electric probe when the plasma does not enter the magnetic trap space according to the real-time I-t characteristic curve of the electric probe measured in the step A100。
Step a20 is an initial data acquisition, where the current passing in the electrical probe is very small when the plasma is not entering the magnetic trap. According to the subsequent steps, the obtained real-time I-t characteristic curve of the electric probe is utilized, and an MATLAB programming averaging algorithm is combined to obtain the initial current value I of the electric probe0。
Step A20 calculates the beginning of the I-t characteristic curve in real time and does not take into account the actual I-t characteristic function. In addition, step A20 only needs to obtain the initial current value (for reference in subsequent judgment of plasma confinement time), and does not need to obtain the I-t characteristic function expression. Thus calculating the later obtained Ii(t) is not a representation of the I-t characteristic function of the electrical probe at different mounting locations.
Step A30:
according to the real-time I-t characteristic curves of the 4 electric probes 1-1, 1-2, 1-3 and 1-4 collected in the step A10, calculating the maximum time t of the currents flowing through the four electric probes 1-1, 1-2, 1-3 and 1-4 according to the formula 11、t2、t3、t4T here1、t2、t3、t4Namely the time that the plasma enters the magnetic trap through the chute coil;
the plasma enters the magnetic trap through the chute coil, and the real-time I-t characteristic curve of the electric probes 1-1, 1-2, 1-3 and 1-4 when the plasma enters the magnetic trap space is measured by utilizing the larger potential difference formed by the space potential of the plasma and the potential of the electric probes when the plasma passes through the electric probes. The method for judging that the plasma enters the magnetic trap through the chute coil is as follows: according to the invention, 4 electric probes are arranged in a circular ring area with the radius of 275mm in the magnetic trap, and the electric probe 1-1 is arranged at the axial line position in the chute coil, so that when plasma enters the magnetic trap through the chute coil, the current of a real-time I-t characteristic curve measured by the electric probe 1-1 is remarkably increased, and the time when the current starts to increase is the time when the plasma enters the magnetic trap. Therefore, the 4 electric probes 1-1, 1-2, 1-3 and 1-4 are uniformly distributed on the circumference at intervals of 90 degrees by taking the electric probe 1-1 as a reference.
An understanding of the "position of the axis in the chute coil" is shown in FIGS. 11-12. FIG. 11 is a schematic view of the device structure of a magnetic confinement device of the Jialargeya type; FIG. 11 shows a high voltage pulse power supply system; 12 is a plasma gun; 13 is a full plasma channel; 14 are magnetic wells. The chute coil is the last part of the full plasma channel 13, and the main function of the chute coil is to weaken the magnetic induction intensity on the plasma incident line, so that the plasma can be smoothly injected into the magnetic trap 14. Fig. 12 is a schematic diagram showing a relative positional relationship between the chute coil and the magnetic trap in the practical halya-type magnetic confinement apparatus. The 'central axis of the chute coil' used for determining the position of the electric probe 1-1 in the invention is the incident line in fig. 12, and the angle formed between the central axis of the inner blind eel and the central axis of the outer blind eel is the 'incident angle theta'. In the invention, the installation position of the electric probe 1-1 can be uniquely determined and determined by two conditions of the position of the central axis of the chute coil and the radius R of 275 mm. In the invention, the other 3 electric probes 1-2, 1-3 and 1-4 are uniformly distributed on the circumference with the radius of 275mm between the inner blind eel coil and the outer blind eel coil at intervals of 90 degrees in turn in the clockwise direction by taking the electric probe 1-1 as a reference.
According to the real-time I-t characteristic curves obtained by the electric probes 1-1, 1-2, 1-3 and 1-4, calculating the maximum time t of the current flowing through the electric probes 1-1, 1-2, 1-3 and 1-41、t2、t3、t4(obtained by upper computer data analysis software by setting a differential algorithm), taking the time corresponding to the maximum value of the current as the time when the plasma passes through the electric probe, and calculating the maximum time when the electric probe 1-1, 1-2, 1-3 and 1-4 flows through the current after the plasma enters the magnetic trap according to a formula 1;
the implication of equation 1 is: i isi(t) is an I-t characteristic function expression of the electric probes 1-1, 1-2, 1-3 and 1-4 at different installation positions. When selecting the i (i is 1, 2, 3, 4) th electric probe (1-1, 1-2, 1-3, 1-4), the method utilizesThe differential algorithm of (1) calculates the time when the derivative of the ith electric probe to the time t is zero, namely the time t when the current flowing through the electric probe is maximum1、t2、t3、t4。
Step a30 found the time for the plasma to pass through 4 electrical probes, which laid the foundation for calculating the plasma fill time in the magnetic trap. Step a30 is a key step in the present invention.
Step A40:
the maximum time t of the current flowing through the electric probe is obtained according to the step A301、t2、t3、t4Calculating the plasma filling time T under the magnetic trap structure according to the formula 2f；
And after the plasma enters the weak magnetic field area of the magnetic trap, the plasma is analyzed and obtained to diffuse along the clockwise direction and the anticlockwise direction from the incident position, and the plasma passing time difference of the two electric probes positioned in the diameter direction is used as the filling time of the plasma in the magnetic trap space. To ensure accuracy, the average of the two measurements is taken and the plasma fill time T is calculated according to equation 2f；
Equation 2 in step a40 is set forth according to the measurement principles set forth in the present invention. The plasma fill time in step a40 was calculated by a preprogrammed algorithm in the PC. For example, the measurement of the plasma time parameter in step A40 may be implemented in LabView or MATLAB software.
Step A40 is a continuation of step A30. After the time that the plasma passes through each electric probe is measured in the step A30, the plasma filling time is obtained in the step A40 through a corresponding upper computer algorithm. Step A40 calculates the filling time of the plasma, and provides reference for the subsequent analysis of parameters such as the plasma filling speed.
The prior art only proposes that the filling time of the plasma can be measured by using 12 electric probes, and does not provide a specific measurement method and a specific measurement formula.
There are associations between the steps of the present invention, such as: to calculate the filling time of the plasma in step A40, we first determine the time t at which the plasma enters the interior of the magnetic trap via the chute coil in step A301、t2、t3、t4And finally, calculating the filling time by using a related calculation formula under the condition that the space at the far end of the magnetic trap is filled with the plasma.
Step A50:
according to I calculated in the step A200Calculating the return of the current of the electric probe to I according to the formula 30Time ofNamely the time for the plasma to escape from the weak magnetic field area;
over time, the plasma escapes from the region of low magnetic field confinement due to collisions between the plasmas and other factors acting in concert. After the plasma is separated from the weak magnetic field area of the magnetic trap due to collision and cyclotron motion, the space potential of the weak magnetic field is sharply reduced, the potential difference between the space potential and the electric probe is rapidly reduced, and the current of the electric probe is restored to the initial value I0. The PC calculates the time of the plasma escaping from the weak magnetic field area according to the formula 3, namely the electric probe current returns to I0The time of (d);
the implication of equation 3 is: i isi(t) is an I-t characteristic function expression of the electric probes 1-1, 1-2, 1-3 and 1-4 at different installation positions. When selecting the i (i is 1, 2, 3, 4) th electric probe (1-1, 1-2, 1-3, 1-4), the method utilizesDetermining the ith electrical probe current I (t) to return to I0I.e. the time t at which the plasma escapes from the ith electrical probe location in the region of weak magnetic fieldi *. The calculation method is designed by combining the actual measurement condition.
In the invention, step A50 obtains the escape time of plasma in the magnetic trap spaceThis provides the required parameters for calculating the magnetic trap plasma confinement time. Formula 3 in step a50 is reasonable and simple.
Step A60:
according to the plasma filling time T under the magnetic trap structure calculated in the step A40fAnd the plasma calculated in step A50Time of daughter escape from weak field regionCalculating the plasma confinement time T under the magnetic trap structure according to the formula 4c；
The plasma confinement time is the difference between the escape time and the plasma fill time. According to the method, the plasma confinement time in the step A60 is calculated by using an advanced computer precision algorithm aiming at the real-time I-t characteristic curve measured by each electric probe, so that the accuracy of the calculation result is ensured. The maximum of the time difference obtained by the 4 electrical probes was taken to ensure that the plasma was completely escaped from the magnetic trap.
The implication of equation 4 is: for each electrical probe, the time difference between the plasma escape time and the plasma fill time was calculated. The plasma filling time T under the magnetic trap structure calculated in the step A40f. The time of plasma escaping from the weak magnetic field area is calculated in A50In order to ensure that the plasma completely escapes from the magnetic trap space, the invention takes the maximum value of the time difference between the plasma escape time and the plasma filling time obtained at the positions of 4 electric probes 1-1, 1-2, 1-3 and 1-4As confinement time T of the plasmac. The method is simple and easy to understand, and can intuitively reflect the confinement time parameter of the plasma.
Step A60 realizes the measurement of the plasma confinement time, and the measurement of the time parameter is more accurately completed through the correlation difference operation and the comparison operation. Step a60 is a core step, and the calculation formula 4 is proposed in conjunction with the measurement method.
The foregoing description is intended to be illustrative rather than limiting, and it will be appreciated by those skilled in the art that many modifications, variations or equivalents may be made without departing from the spirit and scope of the invention as defined in the appended claims.
Claims (7)
1. A device for measuring plasma time parameters under a Jialargeya magnetic trap structure is characterized in that a plasma in the whole magnetic trap space is confined in an annular region between an inner blind eel coil and an outer blind eel coil, wherein the diameter of the inner blind eel coil is 40cm, and the diameter of the outer blind eel coil is 70 cm;
the device for measuring the plasma time parameter under the Jia La Ji ya magnetic trap structure is characterized by comprising an electric probe, a signal acquisition circuit (1), a signal conditioning circuit (2), a data acquisition system (3) and a PC (personal computer) machine (4) which are sequentially connected; wherein,
the electric probe and signal acquisition circuit (1) comprises an electric probe measurement module and a signal acquisition module; the electric probe measuring module comprises 4 electric probes (1-1, 1-2, 1-3 and 1-4), the electric probes (1-1, 1-2, 1-3 and 1-4) are uniformly distributed on a circumference with the radius of 275mm between an inner blind eel coil and an outer blind eel coil in the clockwise direction, wherein the electric probe 1-1 is arranged at the axis position of the chute coil; one end of each of 4 electric probes (1-1, 1-2, 1-3 and 1-4) is connected with the plasma (G), the other end of each electric probe is connected with one end of one divider resistor (1-5), the other end of each divider resistor (1-5) is connected with the anode of a common direct current power supply (1-6), and the cathode of the common direct current power supply (1-6) is connected with a current-limiting resistor and then connected with the plasma (G); the signal acquisition module is used for acquiring voltage waveforms on the voltage dividing resistors (1-5) and further acquiring analog current I on each voltage dividing resistor (1-5)i(t) outputting real-time I-t characteristic curves of the 4 electric probes;
signal conditioning circuit (2): amplifying and filtering the analog current measured by the electric probe and the signal acquisition circuit (1), and outputting an analog signal;
data acquisition system (3): the device comprises an A/D conversion module and a data cache module; the A/D conversion module converts the analog signal output by the signal conditioning circuit (2) into a digital signal, and the data caching module caches the data; the data acquisition system (3) outputs a digital signal;
PC (4): the system comprises a digital filtering module, a data storage module and an image and data analysis module which are connected in sequence; the digital filtering module is used for filtering the digital signals output by the data acquisition system (3) and removing noise in the A/D conversion process; the data storage module is used for storing the filtered and de-noised measurement data into a specified database; and the image and data analysis module is used for calculating the plasma time parameter according to the data obtained from the data storage module.
2. The apparatus for measuring a plasma time parameter under a grazian magnetic trap structure as claimed in claim 1, wherein: the electric probe is a tungsten wire with the diameter of 1.5 mm.
3. The apparatus for measuring a plasma time parameter under a grazian magnetic trap structure as claimed in claim 1, wherein: the electric probe is a tungsten wire with the diameter of 0.3 mm.
4. The apparatus for measuring a plasma time parameter under a grazian magnetic trap structure as claimed in claim 1, wherein: the data acquisition system (3) is a PCI board card.
5. The apparatus for measuring a plasma time parameter under a grazian magnetic trap structure as claimed in claim 1, wherein: the data buffer module is FIFO or RAM.
6. The apparatus for measuring a plasma time parameter under a grazian magnetic trap structure as claimed in claim 1, wherein: the image and data analysis module comprises an image analysis module and a data analysis module; the image analysis module is used for displaying an I-t curve, a simulation result and each time parameter; the data analysis module comprises an analog current acquisition submodule, an initial current calculation submodule, an entry time calculation submodule, a filling time calculation submodule, an escape time calculation submodule and a constraint time calculation submodule which are sequentially connected, wherein:
the analog current acquisition submodule comprises:
before the plasma enters the magnetic trap, the electric probe is electrified, and the analog current I on each divider resistor (1-5) is collectedi(t) outputting real-time I-t characteristic curves of the 4 electric probes;
an initial current calculation submodule:
calculating to obtain the initial current I of the electric probe when the plasma does not enter the magnetic trap space according to the real-time I-t characteristic curve of the electric probe measured by the analog current acquisition submodule0；
An entry time calculation submodule:
electric probe measured by analog current acquisition submoduleCalculating the time t when the maximum current flows through the four electric probes (1-1, 1-2, 1-3 and 1-4) according to the formula 1 by using a real-time I-t characteristic curve1、t2、t3、t4T here1、t2、t3、t4Namely the time that the plasma enters the magnetic trap through the chute coil;
wherein, Ii(t) is an I-t characteristic function expression of each electric probe (1-1, 1-2, 1-3, 1-4); when selecting the i (i is 1, 2, 3, 4) th electric probe (1-1, 1-2, 1-3, 1-4), the method utilizesThe differential algorithm of (1) calculates the time when the derivative of the ith electric probe to the time t is zero, namely the time t when the current flowing through the electric probe is maximum1、t2、t3、t4；
A filling time calculation submodule:
calculating the maximum time t of the electric probe flowing current obtained by the submodule according to the entering time1、t2、t3、t4Calculating the plasma filling time T under the magnetic trap structure according to the formula 2f；
An escape time calculation submodule:
i calculated by the calculation submodule according to the initial current0Calculating the return of the current of the electric probe to I according to the formula 30Time ofTime for plasma to escape from the region of low magnetic fieldNamely the time for the plasma to escape from the weak magnetic field area;
wherein, when selecting the i (i is 1, 2, 3, 4) th electric probe (1-1, 1-2, 1-3, 1-4), the method utilizesDetermining the ith electrical probe current I (t) to return to I0I.e. the time t at which the plasma escapes from the ith electrical probe location in the region of weak magnetic fieldi *；
A constraint time calculation submodule:
calculating the plasma filling time T under the magnetic trap structure according to the filling time calculation submodulefAnd the time for the plasma to escape from the low magnetic field region, calculated in step A50Calculating the plasma confinement time T under the magnetic trap structure according to the formula 4c；
Calculating the time difference between the plasma escape time and the plasma filling time for each electric probe; taking the maximum value of the time difference between the plasma escape time and the plasma filling time obtained at the positions of 4 electric probes (1-1, 1-2, 1-3 and 1-4)I.e. the confinement time T of the plasmac。
7. A method for measuring a plasma time parameter under a Zealand magnetic trap configuration for use in an apparatus according to any of claims 1-6, comprising the steps of:
step A10:
before the plasma enters the magnetic trap, the electric probe is electrified, and the analog current I on each divider resistor (1-5) is collectedi(t) outputting real-time I-t characteristic curves of the 4 electric probes;
step A20:
according to the real-time I-t characteristic curve of the electric probe measured in the step A10, calculating to obtain the initial current I of the electric probe when the plasma does not enter the magnetic trap space0；
Step A30:
according to the real-time I-t characteristic curve of the electric probe measured in the step A10, the time t of the maximum current flowing through the four electric probes (1-1, 1-2, 1-3 and 1-4) is calculated according to the formula 11、t2、t3、t4T here1、t2、t3、t4Namely the time that the plasma enters the magnetic trap through the chute coil;
wherein, Ii(t) is an I-t characteristic function expression of each electric probe (1-1, 1-2, 1-3, 1-4); when selecting the i (i is 1, 2, 3, 4) th electric probe (1-1, 1-2, 1-3, 1-4), the method utilizesThe differential algorithm of (1) calculates the time when the derivative of the ith electric probe to the time t is zero, namely the time t when the current flowing through the electric probe is maximum1、t2、t3、t4；
Step A40:
the maximum time t of the current flowing through the electric probe is obtained according to the step A301、t2、t3、t4Calculating the plasma filling time T under the magnetic trap structure according to the formula 2f；
Step A50:
according to I calculated in the step A200Calculating the return of the current of the electric probe to I according to the formula 30Time ofNamely the time for the plasma to escape from the weak magnetic field area;
wherein, when selecting the i (i is 1, 2, 3, 4) th electric probe (1-1, 1-2, 1-3, 1-4), the method utilizesDetermining the ith electrical probe current I (t) to return to I0I.e. the time t at which the plasma escapes from the ith electrical probe location in the region of weak magnetic fieldi *；
Step A60:
according to the plasma filling time T under the magnetic trap structure calculated in the step A40fAnd the time for the plasma to escape from the low magnetic field region, calculated in step A50Calculating the plasma confinement time T under the magnetic trap structure according to the formula 4c；
Calculating the time difference between the plasma escape time and the plasma filling time for each electric probe; taking the maximum value of the time difference between the plasma escape time and the plasma filling time obtained at the positions of 4 electric probes (1-1, 1-2, 1-3 and 1-4)I.e. the confinement time T of the plasmac。
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