CN106679937A - Test system for semiconductor laser units - Google Patents
Test system for semiconductor laser units Download PDFInfo
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- CN106679937A CN106679937A CN201710121370.4A CN201710121370A CN106679937A CN 106679937 A CN106679937 A CN 106679937A CN 201710121370 A CN201710121370 A CN 201710121370A CN 106679937 A CN106679937 A CN 106679937A
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- semiconductor laser
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- test system
- power
- laser
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
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- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Semiconductor Lasers (AREA)
Abstract
The invention relates to a test system for semiconductor laser units. The test system comprises a plurality of drive modules and a master control module, wherein the drive modules are used for driving a plurality of semiconductor laser units, and the master control module is used for giving an enable signal of the drive modules according to laser power needing to be obtained and the laser power of each semiconductor laser unit so as to start or stop the drive modules so that the total power of the semiconductor laser units driven by the started drive modules can reach the laser power needing to be obtained. By means of the test system, the semiconductor laser units can be combined according to the laser power needing to be obtained and the laser power of each semiconductor laser unit, a semiconductor laser unit capable of outputting different levels of laser power is obtained, and then a research and development test is conducted on the obtained semiconductor laser unit; it is not needed to independently design corresponding power sources or control systems for the semiconductor laser units with the specific laser power, and thus the research and development efficiency is improved.
Description
Technical field
The present invention relates to the research and development field tests of laser instrument, more particularly to a kind of test system of semiconductor laser.
Background technology
Semiconductor laser technology is the focus of laser technology research in recent years, on the one hand, semiconductor laser can be only
The fields such as laser acquisition, illumination and spectrographic detection are on the spot applied to, on the other hand, semiconductor laser can be solid as other
The pumping source of body laser.
However, generally requiring to wait specific laser work(in the R＆D process for carrying out high power semiconductor lasers at present
Follow-up opticator exploitation can be just carried out after the completion of the power supply of the semiconductor laser of rate and related Control System test, i.e.,
The research and development test of semiconductor laser so that the R＆D cycle of semiconductor laser is long, and efficiency is low.
The content of the invention
Based on this, it is necessary to provide a kind of test system of semiconductor laser, can partly leading to different laser powers
Body laser carries out research and development test, improves efficiency of research and development.
A kind of test system of semiconductor laser, including：
Several drive modules, for driving several semiconductor lasers；
Main control module, for the laser power that obtains as needed and the respective laser of described several semiconductor lasers
Power, provides the enable signal of several drive modules, to be switched on or off each drive module so that the driving mould of unlatching
The power that the semiconductor laser of block driving is total can reach the laser power for needing and obtaining.
The test system of above-mentioned semiconductor laser, including several drive modules, for driving several quasiconductors to swash
Light device, and main control module, the laser power and described several semiconductor lasers for obtaining as needed is respective sharp
Luminous power, provides the enable signal of several drive modules, to be switched on or off each drive module so that the driving of unlatching
The power that the semiconductor laser of module drive is total can reach the laser power for needing and obtaining；The test system can basis
Multiple semiconductor lasers are combined by laser power and the respective laser power of semiconductor laser that needs are obtained, are obtained
To the semiconductor laser of the different laser powers of output, and then research and development test is carried out to it, without the need for for specific laser power partly
The individually designed corresponding power supply of conductor laser and control system, improve efficiency of research and development.
Wherein in one embodiment, also include：
Communication module, input connects the main control module, and outfan connects respectively each drive module, described for setting up
Main control module and several drive modules communication connection, the main control module by the communication module be given described in several
The enable signal of drive module.
Wherein in one embodiment, also include：
Signal acquisition module, input connects respectively each drive module, and outfan connects the main control module, for gathering
The characteristic parameter of the semiconductor laser.
Wherein in one embodiment, the main control module be additionally operable to according to the characteristic parameter judge it is described partly lead it is sharp
When light body is abnormal, light leak protection, overheat protector, and over-voltage over-current protection are carried out to it.
Wherein in one embodiment, also include：
Alarm module, connects the main control module, in semiconductor laser exception described in the master control module judges
When, send corresponding warning reminding.
Wherein in one embodiment, also include：
Power supply interface module, input connection external power source, outfan connects respectively each drive module.
Wherein in one embodiment, also including bundling device, for swashing of sending described several semiconductor lasers
Light carries out conjunction beam.
Wherein in one embodiment, the main control module is additionally operable to set the test electric current of each semiconductor laser.
Wherein in one embodiment, the communication module is connected respectively by bus with each drive module.
Wherein in one embodiment, the signal acquisition module is connected respectively by bus with each drive module.
Description of the drawings
Fig. 1 is the system construction drawing of the test system of semiconductor laser in an embodiment；
Fig. 2 is the system construction drawing of the test system of semiconductor laser in another embodiment.
Specific embodiment
Referring to Fig. 1, Fig. 1 is the system construction drawing of the test system of semiconductor laser in an embodiment.
In the present embodiment, the test system of the semiconductor laser includes several drive modules 11 and main control module
10。
Several drive modules 11 are used to drive several semiconductor lasers 20.
One semiconductor laser 20 is driven by a single drive module 11, exports the semiconductor laser of certain power
Device 20 is needed to its individually designed power supply and related Control System, can just make its normal work.
Main control module 10 is used for the laser power for obtaining as needed and described several semiconductor lasers 20 are respective
Laser power, provides the enable signal of several drive modules 11, to be switched on or off each drive module 11 so that open
The total power of semiconductor laser 20 that drives of drive module 11 can reach the laser power for needing and obtaining.
When the semiconductor laser for needing to obtain predetermined power, and when research and development test is carried out to it, can be default according to this
Several semiconductor lasers 20 are combined and are obtained by power and several respective laser powers of semiconductor laser 20.
For example, the semiconductor laser that laser power is 5KW, the laser work(of each semiconductor laser 20 are if desired obtained
Rate is 1KW, while driving 5 such semiconductor lasers 20, the laser of output is carried out to close the laser that beam is obtained 5KW
Power.
The laser power of each semiconductor laser 20 can be the same or different, and to realize more flexible combination, obtain
Scope more complete, bigger laser power.And then the semiconductor laser to predetermined power is tested, such as whether go out light, essence
On be to by synthesis realize that each semiconductor laser 20 of the predetermined power is tested.
Referring to Fig. 2, the quantity of semiconductor laser 20 is 3 in the test system of the semiconductor laser, is not limited to 3
It is individual.
Wherein in one embodiment, the test system of the semiconductor laser also includes communication module 13, and input connects
The main control module 10 is connect, outfan connects respectively each drive module 11, for setting up the main control module 10 and several drives
The communication connection of dynamic model block 11, the main control module 10 provides several drive modules 11 by the communication module 13
Enable signal.
Wherein in one embodiment, the communication module 13 is connected by bus with each drive module 11.So that master control mould
Block 10 can be realized to the synchronous enabled of each drive module 11, accelerate the speed of service of the test system.
The enable signal of each drive module 11 is given to each drive module 11 by main control module 10 by communication module 13, together
When provide the test electric current of each semiconductor laser 20, and different drives are provided according to each drive module 11 of the test current control
Streaming current, to control semiconductor laser 20 different power are exported, and meet the driving demand of different semiconductor lasers 20.
Wherein in one embodiment, the test system of the semiconductor laser also includes signal acquisition module 14, input
End connects respectively each drive module 11, and outfan connects the main control module 10, for gathering the semiconductor laser 20
Characteristic parameter.
This feature parameter includes laser current signal, light leak signal, laser energy signal, the temperature of semiconductor laser 20
Signal etc..
Wherein in one embodiment, main control module 10 is additionally operable to judged described partly to lead laser according to the characteristic parameter
When the body of device 20 is abnormal, light leak protection, overheat protector, and over-voltage over-current protection are carried out to it.
Wherein in one embodiment, the test system of the semiconductor laser also includes alarm module 15, and connection is described
Main control module 10, carries for when the main control module 10 judges that the semiconductor laser 20 is abnormal, sending corresponding warning
Wake up.Different abnormal conditions send corresponding warning reminding, such as voice, display lamp.
On the one hand features described above parameter can be used to realize the protection of noise spectra of semiconductor lasers 20 that another aspect can conduct
The performance test results of semiconductor laser 20, and then realize the comprehensively research and development test of noise spectra of semiconductor lasers 20.
Wherein in one embodiment, signal acquisition module 14 is connected respectively by bus with each drive module 11.Can be with
Realize being gathered while multiple signals so that main control module 10 can simultaneously get the feature ginseng of each semiconductor laser 20
Number, and then realize synchronous protection.
Wherein in one embodiment, the test system of the semiconductor laser also includes power supply interface module 16, input
End connection external power source, outfan connects respectively each drive module 11.
Wherein in one embodiment, the test system of the semiconductor laser also includes bundling device 12, for will be described
The laser that several semiconductor lasers 20 send carries out conjunction beam.To obtain carrying out the output of each semiconductor laser 20
Laser power after superposition.
Additionally, each semiconductor laser 20 can also work independently, to realize that the research and development of the semiconductor laser 20 are tested.
Meanwhile, can be after the test of each semiconductor laser 20 passes through, the laser power for obtaining as needed and each semiconductor laser
20 laser power, is combined to each semiconductor laser 20, and the semiconductor laser of different laser powers is obtained by closing beam
Device.
The test system of above-mentioned semiconductor laser, in the research and development test phase of semiconductor laser, can be as needed
Multiple semiconductor lasers 20 are combined by the laser power for obtaining and the respective laser power of each semiconductor laser 20,
Obtain exporting the semiconductor laser of different laser powers by closing beam, while the feature by gathering each semiconductor laser 20
Parameter is tested the semiconductor laser obtained after the combination, and provides protection mechanism, in order to avoid damage each semiconductor laser
Device 20.The test system can realize that multi-path laser is exported, and high-power laser be obtained, while can also individually export swashing all the way
Light, it is easy to control flexibly the semiconductor laser of default laser power to be obtained by way of enabling and combining simultaneously, up may be used
To increase the quantity of semiconductor laser 20, and then increase laser power, obtain high-power semiconductor laser, down can be with
Compatible low power semiconductor laser.Need not be specific laser power the individually designed corresponding power supply of semiconductor laser and
Just research and development test is carried out to it after control system, shorten semiconductor laser, especially high-power semiconductor laser
The research and development testing time, improve efficiency of research and development.
Each technical characteristic of embodiment described above can be combined arbitrarily, to make description succinct, not to above-mentioned reality
Apply all possible combination of each technical characteristic in example to be all described, as long as however, the combination of these technical characteristics is not deposited
In contradiction, the scope of this specification record is all considered to be.
Embodiment described above only expresses the several embodiments of the present invention, and its description is more concrete and detailed, but and
Can not therefore be construed as limiting the scope of the patent.It should be pointed out that for one of ordinary skill in the art comes
Say, without departing from the inventive concept of the premise, some deformations and improvement can also be made, these belong to the protection of the present invention
Scope.Therefore, the protection domain of patent of the present invention should be defined by claims.
Claims (10)
1. a kind of test system of semiconductor laser, it is characterised in that include：
Several drive modules, for driving several semiconductor lasers；
Main control module, for the laser power that obtains as needed and the respective laser work(of described several semiconductor lasers
Rate, provides the enable signal of several drive modules, to be switched on or off each drive module so that the drive module of unlatching
The power that the semiconductor laser of driving is total can reach the laser power for needing and obtaining.
2. the test system of semiconductor laser according to claim 1, it is characterised in that also include：
Communication module, input connects the main control module, and outfan connects respectively each drive module, for setting up the master control
The communication connection of module and several drive modules, the main control module provides described several drivings by the communication module
The enable signal of module.
3. the test system of semiconductor laser according to claim 1, it is characterised in that also include：
Signal acquisition module, input connects respectively each drive module, and outfan connects the main control module, described for gathering
The characteristic parameter of semiconductor laser.
4. the test system of semiconductor laser according to claim 3, it is characterised in that the main control module is additionally operable to
When judging that the semiconductor laser is abnormal according to the characteristic parameter, light leak protection, overheat protector, and mistake are carried out to it
Pressure overcurrent protection.
5. the test system of semiconductor laser according to claim 4, it is characterised in that also include：
Alarm module, connects the main control module, for when semiconductor laser described in the master control module judges is abnormal, sending out
Go out corresponding warning reminding.
6. the test system of semiconductor laser according to claim 1, it is characterised in that also include：
Power supply interface module, input connection external power source, outfan connects respectively each drive module.
7. the test system of semiconductor laser according to claim 1, it is characterised in that also including bundling device, be used for
The laser that described several semiconductor lasers send is carried out into conjunction beam.
8. the test system of semiconductor laser according to claim 1, it is characterised in that the main control module is additionally operable to
Set the test electric current of each semiconductor laser.
9. the test system of semiconductor laser according to claim 2, it is characterised in that the communication module is by total
Line is connected respectively with each drive module.
10. the test system of semiconductor laser according to claim 3, it is characterised in that the signal acquisition module
It is connected with each drive module respectively by bus.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710121370.4A CN106679937A (en) | 2017-03-02 | 2017-03-02 | Test system for semiconductor laser units |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201710121370.4A CN106679937A (en) | 2017-03-02 | 2017-03-02 | Test system for semiconductor laser units |
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| Publication Number | Publication Date |
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| CN106679937A true CN106679937A (en) | 2017-05-17 |
Family
ID=58861467
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201710121370.4A Pending CN106679937A (en) | 2017-03-02 | 2017-03-02 | Test system for semiconductor laser units |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108919138A (en) * | 2018-05-14 | 2018-11-30 | 南京理工大学 | Power source of semiconductor laser test device and method |
| CN109596564A (en) * | 2018-10-12 | 2019-04-09 | 上海禾赛光电科技有限公司 | A kind of laser control device, array and control method |
| CN110057548A (en) * | 2019-03-28 | 2019-07-26 | 苏州创鑫激光科技有限公司 | A kind of measuring system and method |
| CN110907144A (en) * | 2019-12-19 | 2020-03-24 | 成都英飞睿技术有限公司 | Energy test system of pulse laser |
| WO2020248931A1 (en) * | 2019-06-11 | 2020-12-17 | 苏州创鑫激光科技有限公司 | Myriawatt-level ultra-high power full fiber continuous fiber laser system |
| CN115189774A (en) * | 2022-06-29 | 2022-10-14 | 武汉光迅科技股份有限公司 | Marshallable optical module and using method |
Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6676304B1 (en) * | 2001-01-11 | 2004-01-13 | Ciena Corporation | Optical module testing system |
| JP2007271589A (en) * | 2006-03-31 | 2007-10-18 | Eudyna Devices Inc | Testing system, control method therefor, and testing device |
| CN204030263U (en) * | 2014-06-13 | 2014-12-17 | 鞍山华科大激光科技有限公司 | High power pulse can scissor type solid state laser |
| CN204067850U (en) * | 2013-07-02 | 2014-12-31 | 江苏天元激光科技有限公司 | A kind of beam merging apparatus of semiconductor laser tube core |
| CN204666336U (en) * | 2015-05-15 | 2015-09-23 | 北京光电技术研究所 | Semiconductor laser test macro |
| CN106063055A (en) * | 2014-02-25 | 2016-10-26 | 株式会社藤仓 | Fiber laser device and method for detecting abnormality thereof |
| CN205790916U (en) * | 2016-05-31 | 2016-12-07 | 中国工程物理研究院激光聚变研究中心 | Super continuous spectrums laser generator |
| CN106452569A (en) * | 2016-12-13 | 2017-02-22 | 无锡市德科立光电子技术有限公司 | Multi-backup OTDR optical amplification device with shared light source and control method |
-
2017
- 2017-03-02 CN CN201710121370.4A patent/CN106679937A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6676304B1 (en) * | 2001-01-11 | 2004-01-13 | Ciena Corporation | Optical module testing system |
| JP2007271589A (en) * | 2006-03-31 | 2007-10-18 | Eudyna Devices Inc | Testing system, control method therefor, and testing device |
| CN204067850U (en) * | 2013-07-02 | 2014-12-31 | 江苏天元激光科技有限公司 | A kind of beam merging apparatus of semiconductor laser tube core |
| CN106063055A (en) * | 2014-02-25 | 2016-10-26 | 株式会社藤仓 | Fiber laser device and method for detecting abnormality thereof |
| CN204030263U (en) * | 2014-06-13 | 2014-12-17 | 鞍山华科大激光科技有限公司 | High power pulse can scissor type solid state laser |
| CN204666336U (en) * | 2015-05-15 | 2015-09-23 | 北京光电技术研究所 | Semiconductor laser test macro |
| CN205790916U (en) * | 2016-05-31 | 2016-12-07 | 中国工程物理研究院激光聚变研究中心 | Super continuous spectrums laser generator |
| CN106452569A (en) * | 2016-12-13 | 2017-02-22 | 无锡市德科立光电子技术有限公司 | Multi-backup OTDR optical amplification device with shared light source and control method |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN108919138A (en) * | 2018-05-14 | 2018-11-30 | 南京理工大学 | Power source of semiconductor laser test device and method |
| CN109596564A (en) * | 2018-10-12 | 2019-04-09 | 上海禾赛光电科技有限公司 | A kind of laser control device, array and control method |
| CN110057548A (en) * | 2019-03-28 | 2019-07-26 | 苏州创鑫激光科技有限公司 | A kind of measuring system and method |
| WO2020248931A1 (en) * | 2019-06-11 | 2020-12-17 | 苏州创鑫激光科技有限公司 | Myriawatt-level ultra-high power full fiber continuous fiber laser system |
| CN110907144A (en) * | 2019-12-19 | 2020-03-24 | 成都英飞睿技术有限公司 | Energy test system of pulse laser |
| CN115189774A (en) * | 2022-06-29 | 2022-10-14 | 武汉光迅科技股份有限公司 | Marshallable optical module and using method |
| CN115189774B (en) * | 2022-06-29 | 2023-05-23 | 武汉光迅科技股份有限公司 | Light module capable of grouping and use method |
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