CN105808405B - A kind of high-performance pipeline ADC frequency domain parameter assessment system based on SoPC - Google Patents
A kind of high-performance pipeline ADC frequency domain parameter assessment system based on SoPC Download PDFInfo
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Abstract
Description
技术领域technical field
本发明属于集成电路测试领域,涉及一种基于SoPC的高性能流水线ADC频域参数评估系统。The invention belongs to the field of integrated circuit testing and relates to a SoPC-based high-performance pipeline ADC frequency domain parameter evaluation system.
背景技术Background technique
随着微电子技术和数字信号处理技术的快速发展,模数转换器(Analog-to-digital Converter,ADC)作为连接模拟世界和数字系统的接口,其作用越来越明显。其中高性能流水线ADC以其高速高精度的特点在军用雷达通信等信号处理领域的应用日渐广泛;作为系统的核心部件,ADC的频域特性往往直接决定了系统性能。不过,受制造工艺等诸多外界因素的影响,高性能流水线ADC的实际参数性能很难达到设计的理想值,因此为保证ADC的性能满足要求,有必要对其进行性能评估。With the rapid development of microelectronics technology and digital signal processing technology, the role of analog-to-digital converter (Analog-to-digital Converter, ADC) as an interface connecting the analog world and digital systems is becoming more and more obvious. Among them, the high-performance pipeline ADC is widely used in signal processing fields such as military radar communication due to its high speed and high precision; as the core component of the system, the frequency domain characteristics of the ADC often directly determine the system performance. However, due to the influence of many external factors such as the manufacturing process, the actual parameter performance of the high-performance pipeline ADC is difficult to achieve the ideal value of the design. Therefore, in order to ensure that the performance of the ADC meets the requirements, it is necessary to perform performance evaluation on it.
目前,国外公司对高性能流水线ADC的性能评估大都基于专用的自动化评估设备,例如NI公司的PXIe系列测量评估系统、ADI公司的专用ADC性能评估系统,此类设备价格高昂、操作复杂,往往使项目的设备成本和人力成本过高,且随着流水线ADC的性能不断提升,其性能评估需要评估系统具备更高的处理能力。单片机和DSP(Digital SignalProcessor)等编程器件能够简化性能参数评估流程。不过基于单片机的评估系统,其时钟频率较低,无法满足高性能流水线ADC速度快、分辨率高、产生样本数大的特点;DSP具备高速处理能力、强大而又灵活的接口和通信能力,但同时也存在控制不足等弱点,浪费了DSP宝贵的运算资源。FPGA因其时钟频率快、控制灵活、接口资源丰富等特点,能够满足系统需求。因此,构建以FPGA为载体,实现基于SoPC的高性能流水线ADC性能评估系统具有重要的实践意义。At present, foreign companies mostly evaluate the performance of high-performance pipeline ADCs based on dedicated automatic evaluation equipment, such as NI’s PXIe series measurement evaluation system and ADI’s dedicated ADC performance evaluation system. Such equipment is expensive and complicated to operate. The equipment cost and labor cost of the project are too high, and as the performance of the pipeline ADC continues to improve, its performance evaluation requires the evaluation system to have higher processing power. Programming devices such as microcontrollers and DSP (Digital Signal Processor) can simplify the performance parameter evaluation process. However, the evaluation system based on single-chip microcomputer has a low clock frequency, which cannot meet the characteristics of high-performance pipeline ADC with fast speed, high resolution, and large number of samples; DSP has high-speed processing capabilities, powerful and flexible interfaces and communication capabilities, but At the same time, there are also weaknesses such as insufficient control, which wastes valuable computing resources of DSP. Due to its fast clock frequency, flexible control, and rich interface resources, FPGA can meet the system requirements. Therefore, it is of great practical significance to construct a SoPC-based high-performance pipeline ADC performance evaluation system with FPGA as the carrier.
发明内容Contents of the invention
鉴于现有技术存在的不足,本发明的目的旨在提供一种基于SoPC的高性能流水线ADC频域参数评估系统,可以实现数据采集、数据降速、搬运存储等功能,利用模块化方法使得不同指标的ADC能够在一个共同的样本采集和处理SoPC上进行实际的频域参数评估。In view of the deficiencies in the prior art, the purpose of the present invention is to provide a SoPC-based high-performance pipeline ADC frequency domain parameter evaluation system, which can realize functions such as data acquisition, data deceleration, handling and storage, and utilize modular methods to make different The indexed ADC enables the actual frequency domain parameter evaluation on a common sample acquisition and processing SoPC.
本发明通过如下技术方案实现:The present invention realizes through following technical scheme:
一种以SoPC为控制核心的高性能流水线ADC频域参数评估系统,其特征在于:包括样本采集和处理SoPC、待评估ADC芯片子板、图形界面控制端、信号源与时钟源。所述样本采集和处理SoPC包含Microblaze处理器、串口通信模块、异步FIFO模块、DMA控制器、DDR3存储器及子板接口。所述样本采集和处理SoPC与所述待评估ADC芯片子板相连进行逻辑控制、样本采集和处理,与所述图形界面控制端相连进行通信与频域参数评估。所述待评估ADC芯片子板包括待评估ADC芯片、模拟输入电路、时钟管理电路及母板接口,接受信号源与时钟源产生的信号作为输入采样信号与时钟信号。所述图形界面控制端,包括串口通信模块、参数评估模块、数据存储模块,主要实现与所述样本采集和处理SoPC的双向通信与控制。评估步骤为:Microblaze处理器通过子板接口配置所述待评估ADC芯片子板进行样本采集,利用异步FIFO模块缓存来自所述待评估ADC芯片子板的样本,通过DMA控制器将样本存储至DDR3存储器,随后将样本送至所述图形界面控制端进行参数评估。A high-performance pipelined ADC frequency-domain parameter evaluation system with SoPC as the control core is characterized in that it includes a sample collection and processing SoPC, an ADC chip sub-board to be evaluated, a graphical interface control terminal, a signal source and a clock source. The sample collection and processing SoPC includes a Microblaze processor, a serial port communication module, an asynchronous FIFO module, a DMA controller, a DDR3 memory and a sub-board interface. The sample collection and processing SoPC is connected to the ADC chip sub-board to be evaluated for logic control, sample collection and processing, and connected to the graphical interface control terminal for communication and frequency domain parameter evaluation. The ADC chip sub-board to be evaluated includes an ADC chip to be evaluated, an analog input circuit, a clock management circuit, and a motherboard interface, and accepts signals generated by the signal source and the clock source as input sampling signals and clock signals. The graphical interface control terminal includes a serial port communication module, a parameter evaluation module, and a data storage module, and mainly realizes two-way communication and control with the sample collection and processing SoPC. The evaluation steps are: the Microblaze processor configures the sub-board of the ADC chip to be evaluated for sample collection through the sub-board interface, uses the asynchronous FIFO module to buffer the samples from the sub-board of the ADC chip to be evaluated, and stores the samples to DDR3 through the DMA controller memory, and then send the sample to the graphical interface control terminal for parameter evaluation.
附图说明Description of drawings
图1是本发明提供的基于SoPC的高性能流水线ADC频域参数评估系统的结构示意图。FIG. 1 is a schematic structural diagram of a SoPC-based high-performance pipeline ADC frequency-domain parameter evaluation system provided by the present invention.
图2是本发明提供的数据存储路径示意图。Fig. 2 is a schematic diagram of a data storage path provided by the present invention.
图3是本发明提供的待评估ADC芯片子板功能模块示意图。Fig. 3 is a schematic diagram of functional modules of the ADC chip sub-board to be evaluated provided by the present invention.
图4是本发明提供的控制评估流程示意图。Fig. 4 is a schematic diagram of the control evaluation flow provided by the present invention.
图5是本发明提供的控制端评估界面示意图。Fig. 5 is a schematic diagram of the evaluation interface of the control terminal provided by the present invention.
具体实施方式Detailed ways
下面结合具体附图和实施案例对本发明作进一步说明。The present invention will be further described below in conjunction with specific drawings and implementation examples.
本发明的实施方式涉及一种基于SoPC的高性能流水线ADC频域参数评估系统,如图1所示,该平台至少包括:样本采集和处理SoPC、待评估ADC芯片子板、图形界面控制端、信号源与时钟源。具体步骤如下:Microblaze处理器通过子板接口配置待评估子板进行样本采集,利用异步FIFO模块缓存来自待评估ADC芯片子板的样本,通过DMA控制器将样本存储至DDR3存储器,随后将样本送至图形界面控制端进行参数评估。Embodiments of the present invention relate to a SoPC-based high-performance pipelined ADC frequency-domain parameter evaluation system. As shown in FIG. Signal source and clock source. The specific steps are as follows: the Microblaze processor configures the daughter board to be evaluated through the daughter board interface to collect samples, uses the asynchronous FIFO module to buffer the samples from the daughter board of the ADC chip to be evaluated, stores the samples to the DDR3 memory through the DMA controller, and then sends the samples to Go to the GUI control terminal for parameter evaluation.
SoPC所述样本采集和处理SoPC包含Microblaze处理器、串口通信模块、异步FIFO模块、DMA控制器、DDR3存储器及子板接口。Microblaze处理器是应用于Xilinx FPGA的嵌入式软核,作为样本采集和处理SoPC的控制核心,通过AXI4总线接口控制样本采集和处理SoPC的其他部分,具体包括控制待评估ADC芯片子板,用于和图形界面控制端进行通信,同时控制异步FIFO模块、DMA控制器、DDR3存储器进行样本存储。子板接口用于扩展样本采集和处理SoPC的I/O,分别与样本采集和处理SoPC和待评估ADC芯片子板的母板接口连接,由68个用户定义的单端信号或者34个用户定义的差分对、串行收发器对、时钟构成,用于支持待评估ADC芯片子板到样本采集和处理SoPC的数据传输。串口通信模块,采用USB-UART接口实现,其中USB口与图形界面控制端连接,UART与所述样本采集和处理SoPC相连,用于图形界面控制端与所述样本采集和处理SoPC之间的通信以及调试。SoPC由于待评估ADC芯片子板样本采集时的时钟频率与所述样本采集和处理SoPC的AXI4总线速率无法匹配,因此需要异步FIFO模块缓存高速时域状态待评估ADC芯片子板产生的样本以符合AXI4总线速率。DMA控制器在样本采集过程中接管Microblaze处理器进行数据传输,用于控制异步FIFO模块至DDR存储器的存储通道,以便能够让Microblaze处理器能够从繁重的数据搬运中解放出来;DDR3存储器除了为代码提供运行空间外,还用于存储待评估ADC芯片子板产生的样本。样本从产生到存储的路径如图2所示:时钟源产生的单端模拟信号进入模拟输入电路生成模拟差分信号,随后进入待评估ADC芯片,进行A/D转换后输出数字差分信号,经过一定的延迟后组合成最终所需的数字数据;经过异步FIFO模块缓存后,通过DMA控制器送入DDR3存储器中。每块待评估ADC芯片子板都有各自的DMA通道,存在多个待评估ADC芯片时,只需为每个待评估ADC芯片添加各自的专属通道即可。The sample acquisition and processing of the SoPC SoPC includes a Microblaze processor, a serial port communication module, an asynchronous FIFO module, a DMA controller, a DDR3 memory and a sub-board interface. The Microblaze processor is an embedded soft core applied to Xilinx FPGA. As the control core of sample collection and processing SoPC, it controls sample collection and processing other parts of SoPC through the AXI4 bus interface, including controlling the ADC chip sub-board to be evaluated, which is used for Communicate with the graphical interface control terminal, and simultaneously control the asynchronous FIFO module, DMA controller, and DDR3 memory for sample storage. The sub-board interface is used to expand the I/O of the sample acquisition and processing SoPC, and is respectively connected to the motherboard interface of the sample acquisition and processing SoPC and the ADC chip sub-board to be evaluated. It is defined by 68 user-defined single-ended signals or 34 user-defined The differential pair, serial transceiver pair, and clock structure are used to support the data transmission from the daughter board of the ADC chip to be evaluated to the sample acquisition and processing SoPC. The serial port communication module is implemented by a USB-UART interface, wherein the USB port is connected to the graphical interface control terminal, and the UART is connected to the sample collection and processing SoPC for communication between the graphical interface control terminal and the sample collection and processing SoPC and debugging. Since the clock frequency of the SoPC sample collection of the ADC chip sub-board to be evaluated cannot match the AXI4 bus rate of the sample collection and processing SoPC, an asynchronous FIFO module is required to cache the samples generated by the high-speed time domain state of the ADC chip sub-board to be evaluated to meet AXI4 bus speed. The DMA controller takes over the Microblaze processor for data transmission during the sample collection process, and is used to control the storage channel from the asynchronous FIFO module to the DDR memory, so that the Microblaze processor can be freed from heavy data handling; DDR3 memory is not only for the code In addition to providing a running space, it is also used to store the samples generated by the daughter board of the ADC chip to be evaluated. The path from sample generation to storage is shown in Figure 2: the single-ended analog signal generated by the clock source enters the analog input circuit to generate an analog differential signal, and then enters the ADC chip to be evaluated for A/D conversion to output a digital differential signal. After the delay, it is combined into the final required digital data; after being buffered by the asynchronous FIFO module, it is sent to the DDR3 memory through the DMA controller. Each sub-board of the ADC chip to be evaluated has its own DMA channel. When there are multiple ADC chips to be evaluated, it is only necessary to add its own dedicated channel for each ADC chip to be evaluated.
所述待评估ADC芯片子板的功能模块连接关系如图3所示,包含待评估ADC芯片、模拟输入电路、时钟管理电路;所述待评估ADC芯片子板通过母板接口与所述样本采集和处理SoPC相连,接收来自信号源与时钟源的信号作为采样信号与时钟信号;模拟输入电路,作为待评估ADC芯片的缓冲器,由信号发生器经滤波后输入高纯度的单端模拟信号,经过模拟输入电路的转换、放大后输出差分信号至待评估ADC芯片进行A/D转换;时钟管理电路,与待评估ADC芯片和时钟源相连,为待评估ADC芯片提供可编程的时钟信号。The functional module connection relationship of the ADC chip sub-board to be evaluated is as shown in Figure 3, including an ADC chip to be evaluated, an analog input circuit, and a clock management circuit; the ADC chip sub-board to be evaluated is connected to the sample collection through a motherboard interface It is connected with the processing SoPC and receives the signals from the signal source and the clock source as the sampling signal and the clock signal; the analog input circuit is used as the buffer of the ADC chip to be evaluated, and the signal generator inputs the high-purity single-ended analog signal after filtering, After being converted and amplified by the analog input circuit, the differential signal is output to the ADC chip to be evaluated for A/D conversion; the clock management circuit is connected to the ADC chip to be evaluated and the clock source, and provides a programmable clock signal for the ADC chip to be evaluated.
所述图形界面控制端采用Labview开发,包括串口通信模块、评估模块、数据存储模块,用于和所述样本采集和处理SoPC进行通信、数据的采集、传输及性能评估,其控制流程如图4所示。串口通信模块初始化、进行相关通信参数设置后,此时图形界面控制端和所述样本采集和处理SoPC开始通信,若接收到所述样本采集和处理SoPC准备完毕的信号,就可以在图形界面控制端的图形界面进行随后的操作;图形界面控制端具体界面如图5所示,程序启动前,需要设置数据采样的相关设置,包括转换精度、采样率、评估算法等;启动程序后,等待所述待评估ADC芯片子板初始化成功的信息,随着采样数据的接收时域图部分会显示相应正弦波图,点击性能评测即可完成频域特性评估。The graphical interface control terminal is developed by Labview, including a serial port communication module, an evaluation module, and a data storage module, which are used to communicate with the sample collection and processing SoPC, data collection, transmission and performance evaluation, and its control flow is shown in Figure 4 shown. After the serial port communication module is initialized and the relevant communication parameters are set, the graphical interface control terminal and the sample collection and processing SoPC start to communicate at this time. If the signal that the sample collection and processing SoPC is ready is received, it can be controlled on the graphical interface The graphical interface of the terminal is used for subsequent operations; the specific interface of the graphical interface control terminal is shown in Figure 5. Before the program starts, relevant settings for data sampling need to be set, including conversion accuracy, sampling rate, evaluation algorithm, etc.; after starting the program, wait for the described To evaluate the successful initialization of the ADC chip sub-board, the corresponding sine wave diagram will be displayed along with the received time domain diagram of the sampled data, and the frequency domain characteristic evaluation can be completed by clicking on the performance evaluation.
最后说明的是,以上实施例仅用以说明本发明的技术方案而非限制,尽管参照较佳实施例对本发明进行了详细说明,本领域的普通技术人员应当理解,可以对本发明的技术方案进行修改或者等同替换,而不脱离本发明技术方案的宗旨和范围,其均应涵盖在本发明的权利要求范围当中。Finally, it is noted that the above embodiments are only used to illustrate the technical solutions of the present invention without limitation. Although the present invention has been described in detail with reference to the preferred embodiments, those of ordinary skill in the art should understand that the technical solutions of the present invention can be carried out Modifications or equivalent replacements without departing from the spirit and scope of the technical solution of the present invention shall be covered by the claims of the present invention.
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