CN105355633B - 制作阵列基板的方法和阵列基板 - Google Patents
制作阵列基板的方法和阵列基板 Download PDFInfo
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Abstract
一种制作阵列基板的方法,包括如下步骤:形成第一功能层,所述第一功能层包括多个阵列基板区域,相邻的阵列基板区域之间具有连接区域;在每个阵列基板区域上形成多个导电部分,导电部分从阵列基板区域延伸到相应的连接区域,导电部分的末端在连接区域电连接至电容线,使得两个相邻的阵列基板区域之间的两个电容线彼此面对并形成第一电容元件;在第一功能层上形成多个第二功能层以形成多个阵列基板;以及在连接区域切割相邻的阵列基板,并切除阵列基板之间的电容线,从而形成多个独立的阵列基板。本发明还提供一种根据该制作方法制作的阵列基板。通过形成电容元件,可以增加形成在导电部分上的电荷释放通道,并存储在导电部分上产生的多余的电荷,降低电弧放电和烧坏导电部分的几率。
Description
技术领域
本发明的实施例涉及一种制作阵列基板的方法,尤其涉及一种通过切割工艺利用单个基板制作多个阵列基板的方法和利用该方法制作的阵列基板。
背景技术
现有技术中,显示装置的液晶面板主要包括阵列基板、与阵列基板对置的彩膜基板、以及设置在彩膜基板和阵列基板之间的液晶层。制作阵列基板的方法主要包括以下步骤:在基板的显示区域形成栅极、与栅极电连接的栅线,在基板的周边线路区域形成共用导线;之后,利用等离子增强化学气相沉积(Plasma Enhanced Chemical Vapor Deposition(PECVD))工艺形成栅极绝缘层;在栅极绝缘层上形成有源层;利用包括刻蚀工艺的构图工艺形成源极和漏极的图案。
在上述步骤中,在利用PECVD工艺形成栅极绝缘层和有源层、以及通过干刻蚀(dryetch)工序形成源极和漏极图案的过程中,由于执行PECVD工艺真空设备等离子体无法保证绝对均匀,加之阵列基板的设计布线的不同,布置在阵列基板的外围的周边线路区域中的密集的金属导线容易发生异常的弧光放电,并烧毁已形成的栅线和数据线,从而造成最终显示面板的产品不良或基板破裂,增大了产品不良率。
在一种解决方案中,通过变更测试导线的线宽,能部分改善弧光放电和烧毁栅线和数据线的状况,但这样会导致出现临近的金属线发生异常放电,引起产品不良和碎片。而且,周边线路区域的设计空间有限,测试导线和共用导线的线宽调整范围受到限制,无法完全防止异常放电发生。
发明内容
本发明的实施例提供一种制作阵列基板的方法和利用该方法制作的阵列基板,可以降低电弧放电和烧坏导电部分的几率。
根据本发明一个发明的实施例,
提供一种制作阵列基板的方法,包括如下步骤:
一种制作阵列基板的方法,其特征在于,包括如下步骤:
形成第一功能层,所述第一功能层包括多个阵列基板区域,相邻的阵列基板区域之间具有连接区域;
在每个所述阵列基板区域上成多个导电部分,所述导电部分从所述阵列基板区域延伸到相应的连接区域,所述导电部分的末端在所述连接区域电连接至电容线,使得两个相邻的阵列基板区域之间的两个电容线彼此面对并形成第一电容元件;
在形成所述导电部分和电容线的第一功能层上形成多个第二功能层以形成多个阵列基板;以及
在连接区域切割相邻的阵列基板,并切除所述阵列基板之间的电容线根据本发明的一种实施例的制作阵列基板的方法,每个所述电容线形成为弯曲的形状。
根据本发明的一种实施例的制作阵列基板的方法,每个所述电容线形成有镂空区域。
根据本发明的一种实施例的制作阵列基板的方法,所述镂空区域包括多个一体连接的网格或者条形栅。
根据本发明的一种实施例的制作阵列基板的方法,所述导电部分包括:
每个所述阵列基板区域的导电部分包括:
多个第一导电部分,与所述阵列基板区域的一个第一电容元件的电容线电连接;以及
多个第二导电部分,与所述阵列基板区域的另一个第一电容元件的电容线电连接。
根据本发明的一种实施例的制作阵列基板的方法,在每个所述阵列基板区域上形成多个导电部分的步骤中,进一步形成与所述第一导电部分或者第二导电部分电连接的连接线,两个相邻的阵列基板区域的连接线通过第二电容元件耦合。
根据本发明的一种实施例的制作阵列基板的方法,所述连接线、第二电容元件、电容线、第一导电部分和第二导电部分由相同的材料通过一次构图工艺中形成。
根据本发明的一种实施例的制作阵列基板的方法,所述第一功能层包括基板,所述第一导电部分为共用导线,所述第二导电部分为测试导线。
根据本发明的一种实施例的制作阵列基板的方法,在所述基板上设有栅线、与所述栅线电连接的薄膜晶体管的栅极、以及与所述栅极电连接的栅极焊接垫,所述第二导电部分电连接至所述栅极焊接垫,由相同的材料并通过一次构图工艺在所述基板上形成所述共用导线、电容线、栅线和与所述栅线电连接的栅极和栅极焊接垫。
根据本发明的一种实施例的制作阵列基板的方法,在形成所述导电部分和电容线的第一功能层上形成第二功能层以形成多个阵列基板的步骤包括:
在所述基板上形成覆盖所述共用导线、电容线、栅线、栅极和栅极焊接垫的栅极绝缘层,在所述栅极绝缘层中形成过孔;以及
在所述栅极绝缘层上由相同的材料并通过一次构图工艺形成测试导线、连接线和第二电容元件,所述测试导线通过所述过孔与所述栅极焊接垫电连接。
根据本发明的一种实施例的制作阵列基板的方法,在形成所述导电部分和电容线的第一功能层上形成第二功能层以形成多个阵列基板的步骤还包括:在所述栅极绝缘层之上依次形成源极和漏极、覆盖所述源极和漏极的钝化层、以及形成在所述钝化层上并通过钝化层中的过孔与所述漏极电连接的像素电极。
根据本发明的一种实施例的制作阵列基板的方法,在所述基板上设有栅线、与所述栅线电连接的薄膜晶体管的栅极、以及与所述栅极电连接的栅极焊接垫,所述测试导线电连接至所述栅极焊接垫,由相同的材料并通过一次构图工艺在所述基板上形成所述共用导线、电容线、测试导线、连接线、第二电容元件、栅线、栅极和栅极焊接垫。
根据本发明的一种实施例的制作阵列基板的方法,在形成所述导电部分和电容线的第一功能层上形成第二功能层以形成多个阵列基板的步骤包括:在所述基板上形成覆盖所述共用导线、栅线、栅极和栅极焊接垫的栅极绝缘层。
根据本发明另一方面的实施例,提供一种阵列基板,所述阵列基板由上述任一实施例所述的制作阵列基板的方法制成。
根据本发明上述实施例的制作阵列基板的方法和阵列基板,通过由两个相邻的阵列基板之间的两个电容线形成第一电容元件,可以增加形成在导电部分上的电荷释放通道,并存储在导电部分上产生的多余的电荷,降低电弧放电和烧坏导电部分的几率。
附图说明
为使本发明的目的、技术方案和优点更加清楚明白,以下结合具体实施例,并参照附图,对本发明作进一步的详细说明,其中:
图1是包括利用根据本发明的一种示例性实施例的方法制作的阵列基板的显示面板的立体示意图;
图2是利用根据本发明的一种示例性实施例的方法制作的一个阵列基板的平面示意图
图3是利用根据本发明的第一种示例性实施例的方法制作的多个阵列基板的平面示意图,其中多个阵列基板还未切割;
图4是根据本发明的第一种示例性实施例的电容元件的原理示意图;
图5是根据本发明的第二种示例性实施例的电容元件的原理示意图;
图6是根据本发明的第一种示例性实施例的电容元件的一个极板的平面示意图;
图7是根据本发明的第二种示例性实施例的电容元件的一个极板的平面示意图;
图8是根据本发明的第三种示例性实施例的电容元件的一个极板的平面示意图;以及
图9是利用根据本发明的另一种示例性实施例的方法制作的多个阵列基板的平面示意图,其中多个阵列基板还未切割。
具体实施方式
下面通过实施例,并结合附图,对本发明的技术方案作进一步具体的说明。在说明书中,相同或相似的附图标号指示相同或相似的部件。下述参照附图对本发明实施方式的说明旨在对本发明的总体发明构思进行解释,而不应当理解为对本发明的一种限制。
根据本发明总体上的发明构思,提供一种制作阵列基板的方法,包括如下步骤:形成第一功能层,所述第一功能层包括多个阵列基板区域,相邻的阵列基板区域之间具有连接区域;在每个所述阵列基板区域上形成多个导电部分,所述导电部分从所述阵列基板区域延伸到相应的连接区域,所述导电部分的末端在所述连接区域电连接至电容线,使得两个相邻的阵列基板区域之间的两个电容线彼此面对并形成第一电容元件,所述导电部分包括第一导电部分和第二导电部分,所述第一导电部分和第二导电部分可以同层设置,也可以位于不同层设置;在形成所述导电部分和电容线的第一功能层上形成多个第二功能层以形成多个阵列基板;以及在连接区域切割相邻的阵列基板,并切除所述阵列基板之间的电容线,从而形成多个独立的阵列基板。通过由两个相邻的阵列基板区域之间的两个电容线形成第一电容元件,可以增加形成在导电部分上的电荷释放通道,并存储在导电部分上产生的多余的电荷,降低电弧放电和烧坏导电部分的几率。
在下面的详细描述中,为便于解释,阐述了许多具体的细节以提供对本披露实施例的全面理解。然而明显地,一个或多个实施例在没有这些具体细节的情况下也可以被实施。在其他情况下,公知的结构和装置以图示的方式体现以简化附图。
图1是包括利用根据本发明的一种示例性实施例的方法制作的阵列基板的显示面板的立体示意图;图2是利用根据本发明的一种示例性实施例的方法制作的一个阵列基板的平面示意图。
参见图1和2,一种典型的显示面板主要包括阵列基板100、以及与阵列基板100对置的彩膜基板200。阵列基板100主要包括显示区域1、以及周边线路区域2,显示区域1中形成有多个像素区域,周边线路区域2的设有多条共用导线(Common line)3,这些共用导线3通过薄膜封装(Tape Carrier Package,简称TCP)400与信号驱动电路300电连接,以使信号驱动电路400控制阵列基板工作。在周边线路区域2还形成多个与设置在显示区域2中的薄膜晶体管(TFT)的栅极电连接的焊垫4,多个阵列测试导线(Array Test Line,AT line)5分别通过所述栅极焊接垫4与栅极电连接,以测试显示基板100中的各个子像素的性能。
图3是利用根据本发明的第一种示例性实施例的方法制作的多个阵列基板的平面示意图,其中多个阵列基板还未切割。参见图3,根据本发明的一种示例性实施例的制作显示面板的方法包括如下步骤:形成第一功能层6,在一种实施例中,该第一功能层可以包括例如由玻璃或者透明树脂材料制成的基板、以及形成在基板上的缓冲层,第一功能层6可以分成多个阵列基板区域7,每个阵列基板区域用于形成一个如图2所示的阵列基板100,相邻的阵列基板区域7之间具有连接区域8;在每个所述阵列基板区域7上形成多个导电部分,所述导电部分从所述阵列基板区域7延伸到相应的连接区域8,所述导电部分的末端在所述连接区域8电连接至电容线9,使得两个相邻的阵列基板区域8之间的两个电容线9彼此面对并形成第一电容元件;在形成所述导电部分和电容线9的第一功能层6上形成多个第二功能层(未示出)以形成多个阵列基板100;以及在连接区域8切割相邻的阵列基板100,并切除所述阵列基板之间的电容线9,从而形成如图2所示的多个独立的阵列基板100。
根据本发明实施例的制作阵列基板的方法,通过由两个相邻的阵列基板区域7之间的两个电容线9形成第一电容元件,这样,在形成有导电部分的第一功能层6上形成第二功能层时,可以增加形成在导电部分上的电荷释放通道,并存储在导电部分上产生的多余的电荷,降低在第一导电部分发生电弧放电和烧坏导电部分和第一功能层的几率。进一步地,即便电容线9被烧坏,但在后续的切割工序中,电容线9与连接区域8都将被切除,因此,被烧坏的电容线并不影响阵列基板的性能。因此,根据本发明的方法制作的阵列基板可以提高产品合格率,降低了生产成本。
图4是根据本发明的第一种示例性实施例的电容元件的原理示意图,图5是根据本发明的第二种示例性实施例的电容元件的原理示意图。如图4和5所示,每个电容线9形成为弯曲的形状。具体而言,在图4所示的电容元件的第一种实施例中,电容线9形成为大致的锯齿形状;在图5所示的电容元件的第二种实施例中,电容线9形成为大致的弧形形状。这样,用于形成第一电容元件的两个电容电极的电容线9不是彼此平行地设置,电容线9具有非均匀的容纳电荷的能力,一旦电荷在第一电容元件上积累超标,则会在电容线的薄弱环节释放,增加对异常放电的疏导作用。这样,将异常放电的现象引导在电容线上,同时降低了在导电部分上发生异常放电的可能性,从而进一步避免了导电部分和第一功能层被烧坏的可能性。
如图2和3所示,在一种示例性实施例中,每个阵列基板区域7的导电部分包括:多个第一导电部分,与阵列基板区域7的一个第一电容元件的电容线电连接;以及多个第二导电部分,与阵列基板区域7的另一个第一电容元件的电容线电连接。也就是说,在该阵列基板区域7中,第一导电部分与位于该阵列基板区域7左侧的第一电容元件的一个电容线9电连接,第二导电部分与该阵列基板区域7右侧的一个第一电容元件的电容线电连接。这样,多个相邻的阵列基板区域7的第一导电部分和第二导电部分互为电荷释放通道,可以降低由于异常放电而烧坏导电部分和第一功能层被烧坏的可能性。
图6-8是根据本发明的三种示例性实施例的电容元件的一个极板的平面示意图。如图6-8所示,每个电容线9形成有镂空区域。具体而言,在图6所示的电容线9的第一种实施例中,所述镂空区域包括多个一体连接的倾斜条形栅91;在图7所示的电容元件的第二种实施例中,所述镂空区域包括多个一体连接的水平条形栅92;在图8所示的电容元件的第三种实施例中,所述镂空区域包括多个一体连接的网格93。通过在电容线9上形成镂空区域,可以增加对异常放电的疏导作用,降低大面积的金属线容易累积电荷的风险,进一步降低了在导电部分上发生异常放电的可能性,从而进一步避免了导电部分和第一功能层被烧坏的可能性。
图9是根据本发明的另一种示例性实施例的方法制作的多个阵列基板的平面示意图,其中多个阵列基板还未切割。在一种示例性实施例中,在每个所述阵列基板区域7上形成多个导电部分的步骤中,进一步形成与所述第一导电部分或者第二导电部分电连接的连接线10,两个相邻的阵列基板区域7的连接线10通过第二电容元件11耦合。这样,多个阵列基板区域7通过第二电容元件11电耦合,形成放电电容组,进一步之间了电荷释放通道,可以更加有效的疏导和存储电荷。
可以理解,用于组成第二电容元件的电容电极可以具有与第一电容元件的电容线相同的结构,即形成为大致的锯齿形状、以及形成镂空区域,以进一步提高有效的疏导和存储电荷的能力。
在一种示例性实施例中,所述连接线10、第二电容元件11、电容线9、第一导电部分和第二导电部分由相同的材料通过一次构图工艺中形成,例如由氧化铟锡(Indium TinOxide,ITO)材料制成。这样,可以减少构图次数,减少掩模板的使用数量,降低制作成本。
在一种示例性实施例中,所述第一功能层6包括透明基板与导电部分,所述导电部分包括第一导电部分和第二导电部分,所述第一导电部分为共用导线3,所述第二导电部分为测试导线5。在此情况下,如图2和3所示,在一个阵列基板区域7中,共用导线3与位于该阵列基板区域7右侧的第一电容元件的一个电容线9电连接,测试导线5与该阵列基板区域7左侧的一个第一电容元件的电容线电连接。
这样,多个相邻的阵列基板区域7的共用导线和测试导线互为电荷释放通道,在形成有共用导线和测试导线的基板上形成第二功能层时,可以增加形成在共用导线上的电荷释放通道,并存储在共用导线和测试导线上产生的多余的电荷,降低在共用导线和测试导线发生电弧放电和烧坏共用导线、测试导线和第一功能层的几率。进一步地,即便电容线9被烧坏,但在后续的切割工序中,电容线9与连接区域8都将被切除,因此,被烧坏的电容线并不影响阵列基板的性能。
根据本发明的方法适用于制作薄膜晶体管液晶显示器(Thin Film Transistor-Liquid Cristal Display,TFT-LCD)的阵列基板。形成在阵列基板上的每个像素区域主要包括透明基板、以及依次形成在基板上的栅极、栅线、栅极绝缘层、源极、漏极、数据线、钝化层和像素电极等。共用导线在的一部分分别与栅线和数据线电连接。
在一种示例性实施例中,在基板上设有栅线、与所述栅线电连接的薄膜晶体管(TFT)的栅极、以及与所述栅极电连接的栅极焊接垫4,所述第二导电部分所述测试导线5电连接至形成在所述基板上的栅极焊接垫4上,并由相同的材料并通过一次构图工艺在所述基板上形成所述共用导线3、电容线9、测试导线5、以及用于薄膜晶体管的栅线和、与所述栅线电连接的栅极和栅极焊接垫4。共用导线在的一部分分别与栅线和数据线电连接。这样,可以避免形成在基板上的共用导线3、测试导线5在后续的制作薄膜晶体管的源极、漏极和像素电极的工艺中由于异常放电而被烧坏,从而提高产品的合格率。
在一种示例性实施例中,多个第二功能层包括栅极绝缘层,并且在形成所述导电部分和电容线9的第一功能层6上形成第二功能层以形成多个阵列基板的步骤包括:在所述基板上形成覆盖所述共用导线3、电容线9、栅线、栅极和栅极焊接垫4的栅极绝缘层,在所述栅极绝缘层中形成过孔,这样,第二功能层包括栅极绝缘层;以及在栅极绝缘层上由相同的材料并通过一次构图工艺形成测试导线5、连接线10和第二电容元件11,所述测试导线5通过所述过孔与所述栅极焊接垫4电连接。这样,可以避免形成在栅极绝缘层上的测试导线5在后续的制作工艺中由于异常放电而被烧坏,从而提高产品的合格率。
根据本发明实施例的制作阵列基板的方法,在基板上形成共用导线3、以及用于薄膜晶体管(TFT)的栅线、与所述栅线电连接的栅极和栅极焊接垫4的情况下,在利用等离子增强化学气相沉积(Plasma Enhanced Chemical Vapor Deposition(PECVD))工艺形成氮化硅(SiNx)和/或氧化硅(SiO2)薄膜形成栅极绝缘层和有源层、以及通过干刻蚀(dryetch)工序形成源极和漏极图案的过程中,即便由于执行PECVD工艺真空设备等离子体无法保证绝对均匀,布置在阵列基板区域上的密集的导电部分也不会发生异常的弧光放电,表面了烧毁已形成的栅线和数据线,从而可以提高最终显示面板的产品合格率。
在一种示例性实施例中,在形成所述导电部分和电容线9的第一功能层6上形成第二功能层以形成多个阵列基板的步骤还包括:在所述栅极绝缘层之上依次形成源极和漏极、覆盖所述源极和漏极的钝化层、以及形成在所述钝化层上并通过钝化层中的过孔与所述漏极电连接的像素电极,从而在每个阵列基板区域形成一个阵列基板,以便在后续的切割工艺中将第一电容元件和第二电容元件切除,并得到独立的阵列基板。根据本发明实施例的制作阵列基板的方法可以在其它制作工艺,例如制作钝化层或平坦层、或者切割工艺,中也能起到静电保护电路的作用。
在一种实施例中,在各个阵列基板区域形成阵列基板之后,可以进一步执行将多个彩膜基板分别对盒到阵列基板上的工艺,以形成多个显示面板,之后再执行切割工艺,将第一电容元件和第二电容元件切除,并得到独立的显示面板。
在一种可替换的实施例中,在基板上设有栅线、与所述栅线电连接的薄膜晶体管的栅极、以及与所述栅极电连接的栅极焊接垫,所述测试导线电连接至所述栅极焊接垫,由相同的材料(例如氧化铟锡)并通过一次构图工艺在所述基板上形成所述共用导线、电容线、测试导线、连接线、第二电容元件、栅线、栅极和栅极焊接垫。这样,可以减少构图次数,减少掩模板的使用数量,降低制作成本。
进一步地,在形成所述导电部分和电容线的第一功能层上形成第二功能层以形成多个阵列基板的步骤包括:在所述基板上形成覆盖所述共用导线、栅线、栅极和栅极焊接垫的栅极绝缘层。这样,第二功能层包括栅极绝缘层。之后,在所述栅极绝缘层之上依次形成源极和漏极、覆盖所述源极和漏极的钝化层、以及形成在所述钝化层上并通过钝化层中的过孔与所述漏极电连接的像素电极,从而在每个阵列基板区域形成一个阵列基板,以便在后续的切割工艺中将第一电容元件和第二电容元件切除,并得到独立的阵列基板。
上面以TFT-LCD为例描述了本发明实施例的制作阵列基板的方法,但本发明并不局限于此。在一种可替换的实施例中,阵列基板可以是用于有机发光二极管(OrganicLight Emitting Diode,OLED)单元或者有源矩阵有机发光二极管(Active MatrixOrganic Light Emitting Diode,AMOLED)单元的阵列基板。
上面描述了第一功能层为包括基板的实施例,但本发明并不局限于此。在一种可替换的实施例中,第一功能层可以包括栅极绝缘层和或中间介质层。
根据本发明更进一步发明的实施例,提供一种由上述实施例的所述的方法制成的阵列基板。这种阵列基板可以应用于显示装置中。显示装置可以为手机、平板电脑、电视机、显示器、笔记本电脑、数码相框、导航仪、电子纸等任何具有显示功能的产品或部件。
根据本发明实施例的制作阵列基板的方法和阵列基板,通过由两个相邻的阵列基板区域之间的两个电容线形成第一电容元件,这样,在形成有导电部分的第一功能层上形成第二功能层时,可以增加形成在导电部分上的电荷释放通道,并存储在导电部分上产生的多余的电荷,降低在第一导电部分发生电弧放电和烧坏导电部分和第一功能层的几率。进一步地,即便电容线被烧坏,但在后续的切割工序中,电容线与连接区域都将被切除,因此,被烧坏的电容线并不影响阵列基板的性能。因此,根据本发明的方法制作的阵列基板可以提高产品合格率,降低了生产成本。
以上所述的具体实施例,对本发明的目的、技术方案和有益效果进行了进一步详细说明,应理解的是,以上所述仅为本发明的具体实施例而已,并不用于限制本发明,凡在本发明的精神和原则之内,所做的任何修改、等同替换、改进等,均应包含在本发明的保护范围之内。
Claims (14)
1.一种制作阵列基板的方法,其特征在于,包括如下步骤:
形成第一功能层,所述第一功能层包括多个阵列基板区域,相邻的阵列基板区域之间具有连接区域;
在每个所述阵列基板区域上形成多个导电部分,所述导电部分从所述阵列基板区域延伸到相应的连接区域,所述导电部分的末端在所述连接区域电连接至电容线,使得两个相邻的阵列基板区域之间的两个电容线彼此面对并形成第一电容元件;
在形成所述导电部分和电容线的第一功能层上形成多个第二功能层以形成多个阵列基板;以及
在连接区域切割相邻的阵列基板,并切除所述阵列基板之间的电容线。
2.根据权利要求1所述的制作阵列基板的方法,其特征在于,每个所述电容线形成为弯曲的形状。
3.根据权利要求1所述的制作阵列基板的方法,其特征在于,每个所述电容线形成有镂空区域。
4.根据权利要求3所述的制作阵列基板的方法,其特征在于,所述镂空区域包括多个一体连接的网格或者条形栅。
5.根据权利要求1-4中的任一项所述的制作阵列基板的方法,其特征在于,每个所述阵列基板区域的导电部分包括:
多个第一导电部分,与所述阵列基板区域的一个第一电容元件的电容线电连接;以及
多个第二导电部分,与所述阵列基板区域的另一个第一电容元件的电容线电连接。
6.根据权利要求5所述的制作阵列基板的方法,其特征在于,在每个所述阵列基板区域上形成多个导电部分的步骤中,进一步形成与所述第一导电部分或者第二导电部分电连接的连接线,两个相邻的阵列基板区域的连接线通过第二电容元件耦合。
7.根据权利要求6所述的制作阵列基板的方法,其特征在于,所述连接线、第二电容元件、电容线、第一导电部分和第二导电部分由相同的材料通过一次构图工艺中形成。
8.根据权利要求6所述的制作阵列基板的方法,其特征在于,所述第一功能层包括基板,所述第一导电部分为共用导线,所述第二导电部分为测试导线。
9.根据权利要求8所述的制作阵列基板的方法,其特征在于,在所述基板上设有栅线、与所述栅线电连接的薄膜晶体管的栅极、以及与所述栅极电连接的栅极焊接垫,所述第二导电部分电连接至所述栅极焊接垫,由相同的材料并通过一次构图工艺在所述基板上形成所述共用导线、电容线、栅线和与所述栅线电连接的栅极和栅极焊接垫。
10.根据权利要求9所述的制作阵列基板的方法,其特征在于,在形成所述导电部分和电容线的第一功能层上形成第二功能层以形成多个阵列基板的步骤包括:
在所述基板上形成覆盖所述共用导线、电容线、栅线、栅极和栅极焊接垫的栅极绝缘层,在所述栅极绝缘层中形成过孔;以及
在所述栅极绝缘层上由相同的材料并通过一次构图工艺形成测试导线、连接线和第二电容元件,所述测试导线通过所述过孔与所述栅极焊接垫电连接。
11.根据权利要求10所述的制作阵列基板的方法,其特征在于,在形成所述导电部分和电容线的第一功能层上形成第二功能层以形成多个阵列基板的步骤还包括:
在所述栅极绝缘层之上依次形成源极和漏极、覆盖所述源极和漏极的钝化层、以及形成在所述钝化层上并通过钝化层中的过孔与所述漏极电连接的像素电极。
12.根据权利要求8所述的制作阵列基板的方法,其特征在于,在所述基板上设有栅线、与所述栅线电连接的薄膜晶体管的栅极、以及与所述栅极电连接的栅极焊接垫,所述测试导线电连接至所述栅极焊接垫,由相同的材料并通过一次构图工艺在所述基板上形成所述共用导线、电容线、测试导线、连接线、第二电容元件、栅线、栅极和栅极焊接垫。
13.根据权利要求12所述的制作阵列基板的方法,其特征在于,在形成所述导电部分和电容线的第一功能层上形成第二功能层以形成多个阵列基板的步骤包括:
在所述基板上形成覆盖所述共用导线、栅线、栅极和栅极焊接垫的栅极绝缘层。
14.一种阵列基板,其特征在于,所述阵列基板由根据权利要求5-13中的任一项所述的制作阵列基板的方法制成。
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Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101907788A (zh) * | 2009-06-03 | 2010-12-08 | 株式会社日立显示器 | 显示装置 |
CN102097440A (zh) * | 2009-10-30 | 2011-06-15 | 乐金显示有限公司 | 液晶显示器的母基板及其制造方法 |
CN102385207A (zh) * | 2011-11-01 | 2012-03-21 | 深圳市华星光电技术有限公司 | 薄膜晶体管阵列基板及其制造方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100777724B1 (ko) * | 2002-02-07 | 2007-11-19 | 삼성에스디아이 주식회사 | 유기전자 발광소자와, 이의 기판 및 그 절단방법 |
JP2004139774A (ja) * | 2002-10-16 | 2004-05-13 | Pioneer Electronic Corp | プラズマディスプレイパネルの隔壁構造およびプラズマディスプレイパネル |
JP4943152B2 (ja) * | 2003-10-03 | 2012-05-30 | アイファイアー・アイピー・コーポレーション | エレクトロルミネセント・ディスプレイをテストする装置 |
US9287329B1 (en) * | 2014-12-30 | 2016-03-15 | Lg Display Co., Ltd. | Flexible display device with chamfered polarization layer |
CN105355633B (zh) | 2015-10-26 | 2018-08-03 | 京东方科技集团股份有限公司 | 制作阵列基板的方法和阵列基板 |
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Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101907788A (zh) * | 2009-06-03 | 2010-12-08 | 株式会社日立显示器 | 显示装置 |
CN102097440A (zh) * | 2009-10-30 | 2011-06-15 | 乐金显示有限公司 | 液晶显示器的母基板及其制造方法 |
CN102385207A (zh) * | 2011-11-01 | 2012-03-21 | 深圳市华星光电技术有限公司 | 薄膜晶体管阵列基板及其制造方法 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
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CN110444117A (zh) * | 2019-07-24 | 2019-11-12 | 昆山维信诺科技有限公司 | 封装基板及显示面板的制备方法 |
CN110444117B (zh) * | 2019-07-24 | 2021-09-28 | 苏州清越光电科技股份有限公司 | 封装基板及显示面板的制备方法 |
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US9804466B2 (en) | 2017-10-31 |
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US20170269411A1 (en) | 2017-09-21 |
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