CN105091793A - New parallelism detection method and apparatus - Google Patents
New parallelism detection method and apparatus Download PDFInfo
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- CN105091793A CN105091793A CN201510277292.8A CN201510277292A CN105091793A CN 105091793 A CN105091793 A CN 105091793A CN 201510277292 A CN201510277292 A CN 201510277292A CN 105091793 A CN105091793 A CN 105091793A
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Abstract
The invention provides a new parallelism detection method and apparatus. The new parallelism detection method and apparatus comprise a detection pedestal (1), stainless steel mirror surfaces (2), sockets (3) and locating pins (4), wherein each stainless steel mirror surface (2) is arranged on each socket (3); the detection pedestal (1) is provided with fixed holes; each socket (3) is arranged in each fixed hole of the detection pedestal (1); the detection pedestal (1) is provided with circular holes; and each locating pin (4) is arranged in each circular hole of the detection pedestal (1). The new parallelism detection method and apparatus provided by the invention have the advantages of being simple, being low in cost, being pollution-free, and being safe in operation, and can effectively solve the problem about low efficiency for detecting the flatness of a pad product which is mounted on the surface of a current electronic component, thus improving the quality and the output of the pad product mounted on the surface of the electronic component, and having significant social benefit and economic benefit.
Description
Technical field
The present invention relates to a kind of new Parallel testing method and device thereof.
Background technology
Miniaturization, the miniaturization trend of electronic product are more and more obvious, the wiring board of electronic devices and components all adopts SMT(surface mounting technology) technology, when carrying out component surface attachment, the depth of parallelism of component surface attachment pad is the key factor affecting welding quality, so the Parallel testing carrying out surface mount pad to components and parts is necessary.Because the amount of edge of surface mount pad differs, few has several, and many has tens, and manual detection is got up more difficult.At present, most of producer effects on surface attachment pads parallel degree detects all to have come by manually adding microscope, and manually add microscopical method detection speed slow, easily produce fatigue after human eye detects for a long time, often occur undetected situation, reliability is very low.There is partial automation producer have devised and adopt multiple laser probe or the depth of parallelism of multiple camera to the not coplanar of same surface mount pad to detect, but effect is all undesirable, tune motor speed is slow, and cost also remains high, and cannot obtain effective popularization and application.Therefore for the problems referred to above, a kind of method proposing Parallel testing be simple and easy to becomes technical task to be solved at present.
Summary of the invention
The present invention is intended to solve the problem, and provides a kind of Parallel testing problem solving metal material component surface attachment pad, reduces the cost of detection system, improve the method and apparatus of a kind of new Parallel testing adjusting motor speed and detection efficiency.
For achieving the above object, the invention provides a kind of method of new Parallel testing, comprise and detect base (1), stainless steel mirror (2), socket (3), pilot pin (4), described stainless steel mirror (2) is arranged on socket (3), described detection base (1) is provided with fixed orifice, described socket (3) is arranged on the fixed orifice position detecting base (1), and described detection base (1) is provided with circular hole, and described pilot pin (4) is arranged on the circular hole position detecting base (1).
Angle (9) between the inclined-plane (7) of described socket (3) and vertical plane (8) is 45 degree.
The quantity of described socket (3), comprises at least two sockets, and the edge feature according to product to be detected (5) is arranged.
The quantity of described pilot pin (4), comprises at least two pilot pins, and the edge feature according to product to be detected (5) is arranged.
Described stainless steel mirror (2) is positioned at the centre of socket (3) and product to be detected (5).
The reflective surface of described stainless steel mirror (2) is towards the sideline of product to be detected (5).
The sideline of product to be detected (5) is reflected into straight line (6) by described stainless steel mirror (2) in stainless steel mirror (2), adopt the method for Digital Image Processing can draw the changing value of the position deviation of described straight line (6), thus draw the changing value of the depth of parallelism of institute's testing product (5).
The invention provides a kind of device of new Parallel testing, comprise and detect base (1), stainless steel mirror (2), socket (3), pilot pin (4), described stainless steel mirror (2) is arranged on socket (3), described detection base (1) is provided with fixed orifice, described socket (3) is arranged on the fixed orifice position detecting base (1), described detection base (1) is provided with circular hole, and described pilot pin (4) is arranged on the circular hole position detecting base (1).
Angle (9) between the inclined-plane (7) of described socket (3) and vertical plane (8) is 45 degree.
The quantity of described socket (3), comprises at least two sockets, and the edge feature according to product to be detected (5) is arranged.
The quantity of described pilot pin (4), comprises at least two pilot pins, and the edge feature according to product to be detected (5) is arranged.
Described stainless steel mirror (2) is positioned at the centre of socket (3) and product to be detected (5).
The reflective surface of described stainless steel mirror (2) is towards the sideline of product to be detected (5).
The sideline of product to be detected (5) is reflected into straight line (6) by described stainless steel mirror (2) in stainless steel mirror (2), adopt the method for Digital Image Processing can draw the changing value of the position deviation of described straight line (6), thus draw the changing value of the depth of parallelism of institute's testing product (5).
Contribution of the present invention is, it breaches the limitation of existing Parallel testing method, propose a kind of new Parallel testing method, and a kind of device of Parallel testing of simple possible is provided, for the multiple different product of factory, only need change different detection bases, the socket that installation quantity does not wait and pilot pin can realize the detection of the product depth of parallelism.Compared with existing Parallel testing method, the present invention has following distinguishing feature:
One, propose a kind of new detection method to replace manually detecting, effectively can detect the electronic devices and components surface mount pad product depth of parallelism;
Two, to realize the Measures compare of product Parallel testing easy in the present invention, and be easy to realize, the Parallel testing for electronic devices and components surface mount pad product greatly can be saved cost of labor, shorten product quality sense cycle;
Three, the present invention has the economic benefit of highly significant, effectively improves quality and the product of electronic product, improves the competitive power of electronic product; Electronic product has been widely used in multiple fields such as people's daily life, engineering, medical treatment, military affairs, and the quality of raising electronic product must reduce the security incident in electronic product use, reduces potential safety hazard, has obviously social benefit.
Accompanying drawing explanation
Fig. 1 is the structural drawing that the present invention adopts the parallelism detecting device of detection base, stainless steel mirror, socket, pilot pin composition, wherein (1) detects base, (2) be stainless steel mirror, (3) be socket, (4) be pilot pin, (5) are products to be detected.
Fig. 2 is the vertical view that the present invention adopts the parallelism detecting device of detection base, stainless steel mirror, socket, pilot pin composition, wherein (1) detects base, (2) be stainless steel mirror, (3) be socket, (4) be pilot pin, (5) be product to be detected, (6) are the reflected ray of product sideline to be detected in stainless steel mirror.
The structural drawing of Fig. 3 socket of the present invention, wherein (3) are sockets, and (7) are socket hypotenuses, and (8) are socket vertical edges, and (9) are the angles of socket hypotenuse (7) and socket vertical edges (8).
Fig. 4 is the structural drawing of pilot pin of the present invention, and wherein (4) are pilot pins.
Embodiment
Below in conjunction with accompanying drawing, the present invention is described in detail.
Fig. 1 be the present invention adopt detect base (1), the schematic diagram of the embodiment of a kind of new parallelism detecting device that stainless steel mirror (2), socket (3), pilot pin (4) form, the vertical view of Fig. 2 embodiment for this reason.A kind of new Parallel testing method provided by the invention and device contrast Conventional parallel degree detection method thereof, stainless steel mirror (2) is adopted to be installed on socket (3), again socket (3) is installed in the fixed orifice detecting base (1), and keep socket inclined-plane (7) and socket (2) vertical plane (8) method in angle of 45 degrees, the sideline of product to be detected (5) is reflected into straight line (6) by described stainless steel mirror (2) in stainless steel mirror (2), adopt the method for Digital Image Processing can draw the changing value of the position deviation of described straight line (6), thus draw the changing value of the depth of parallelism of institute's testing product (5).Described pilot pin (4) is for being directed to product to be detected (5) in correct detection position.
Although by above embodiment to invention has been announcement, but scope of the present invention is not limited thereto, under the condition not departing from the present invention's design, each component can be replaced with the similar or equivalent element that art personnel understand above, the stainless steel mirror quantity that the present invention proposes, comprise at least two stainless steel mirrors, the pilot pin quantity that the present invention proposes, comprise at least two pilot pins.
In sum, a kind of new Parallel testing method that the present invention proposes and device thereof have every advantages such as realization is simple, cost is low, pollution-free, security of operation, effectively can solve the problem of current electronic devices and components surface mount pad product Parallel testing inefficiency, improve the Quality and yield of electronic devices and components surface mount pad product, there is the economic benefit of highly significant; Electronic product has been widely used in people's daily life, engineering, military affairs and the field such as medical, the quality improving electronic product must reduce electronic product use in security incident, reduce potential safety hazard, there is obviously social benefit.
Claims (7)
1. a new Parallel testing method and device thereof, it is characterized in that: comprise and detect base (1), stainless steel mirror (2), socket (3), pilot pin (4), described stainless steel mirror (2) is arranged on socket (3), described detection base (1) is provided with fixed orifice, described socket (3) is arranged on the fixed orifice position detecting base (1), described detection base (1) is provided with circular hole, and described pilot pin (4) is arranged on the circular hole position detecting base (1).
2. a kind of new Parallel testing method according to claim 1 and device thereof, is characterized in that: the angle (9) between the inclined-plane (7) of described socket (3) and vertical plane (8) is 45 degree.
3. a kind of new Parallel testing method according to claim 1 and device thereof, is characterized in that: the quantity of described socket (3), comprises at least two sockets, and the edge feature according to product to be detected is arranged.
4. a kind of new Parallel testing method according to claim 1 and device thereof, is characterized in that: the quantity of described pilot pin (4), comprises at least two pilot pins, and the edge feature according to product to be detected is arranged.
5. a kind of new parallelism detecting device according to claim 1, is characterized in that: described stainless steel mirror (2) is positioned at the centre of socket (3) and product to be detected.
6. a kind of new Parallel testing method according to claim 1 and device thereof, is characterized in that: the reflective surface of described stainless steel mirror (2) is towards the sideline of product to be detected.
7. a kind of new Parallel testing method according to claim 1 and device thereof, it is characterized in that: the sideline of product to be detected is reflected into straight line (6) by described stainless steel mirror (2) in stainless steel mirror (2), adopt the method for Digital Image Processing can draw the changing value of the position deviation of described straight line (6), thus draw the changing value of the depth of parallelism of institute's testing product.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510277292.8A CN105091793A (en) | 2015-05-27 | 2015-05-27 | New parallelism detection method and apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510277292.8A CN105091793A (en) | 2015-05-27 | 2015-05-27 | New parallelism detection method and apparatus |
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| Publication Number | Publication Date |
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| CN105091793A true CN105091793A (en) | 2015-11-25 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201510277292.8A Pending CN105091793A (en) | 2015-05-27 | 2015-05-27 | New parallelism detection method and apparatus |
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Citations (8)
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|---|---|---|---|---|
| US5043589A (en) * | 1990-05-18 | 1991-08-27 | Trigon/Adcotech | Semiconductor device inspection apparatus using a plurality of reflective elements |
| US5452080A (en) * | 1993-06-04 | 1995-09-19 | Sony Corporation | Image inspection apparatus and method |
| CN101542231A (en) * | 2006-11-21 | 2009-09-23 | 康宁股份有限公司 | Gauge to measure distortion in glass sheet |
| CN101571375A (en) * | 2009-04-27 | 2009-11-04 | 东莞康视达自动化科技有限公司 | On-line data measuring method for regular polygon measured object based on machine vision and system |
| CN102359758A (en) * | 2011-07-21 | 2012-02-22 | 华中科技大学 | Method for detecting appearance of semiconductor chip |
| CN102997842A (en) * | 2011-09-19 | 2013-03-27 | 苏州比特速浪电子科技有限公司 | Sample multi-side detection device |
| CN103308007A (en) * | 2013-05-24 | 2013-09-18 | 华南理工大学 | System and method for measuring coplanarity of integrated circuit (IC) pins through multistage reflection and raster imaging |
| CN103453860A (en) * | 2013-09-16 | 2013-12-18 | 深圳市维图视技术有限公司 | Flatness visual detection method and device thereof |
-
2015
- 2015-05-27 CN CN201510277292.8A patent/CN105091793A/en active Pending
Patent Citations (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5043589A (en) * | 1990-05-18 | 1991-08-27 | Trigon/Adcotech | Semiconductor device inspection apparatus using a plurality of reflective elements |
| US5452080A (en) * | 1993-06-04 | 1995-09-19 | Sony Corporation | Image inspection apparatus and method |
| CN101542231A (en) * | 2006-11-21 | 2009-09-23 | 康宁股份有限公司 | Gauge to measure distortion in glass sheet |
| CN101571375A (en) * | 2009-04-27 | 2009-11-04 | 东莞康视达自动化科技有限公司 | On-line data measuring method for regular polygon measured object based on machine vision and system |
| CN102359758A (en) * | 2011-07-21 | 2012-02-22 | 华中科技大学 | Method for detecting appearance of semiconductor chip |
| CN102997842A (en) * | 2011-09-19 | 2013-03-27 | 苏州比特速浪电子科技有限公司 | Sample multi-side detection device |
| CN103308007A (en) * | 2013-05-24 | 2013-09-18 | 华南理工大学 | System and method for measuring coplanarity of integrated circuit (IC) pins through multistage reflection and raster imaging |
| CN103453860A (en) * | 2013-09-16 | 2013-12-18 | 深圳市维图视技术有限公司 | Flatness visual detection method and device thereof |
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Application publication date: 20151125 |