CN104360169A - Dielectric constant measuring method for high-frequency microwave printed board - Google Patents
Dielectric constant measuring method for high-frequency microwave printed board Download PDFInfo
- Publication number
- CN104360169A CN104360169A CN201410597783.6A CN201410597783A CN104360169A CN 104360169 A CN104360169 A CN 104360169A CN 201410597783 A CN201410597783 A CN 201410597783A CN 104360169 A CN104360169 A CN 104360169A
- Authority
- CN
- China
- Prior art keywords
- frequency microwave
- microwave printed
- high frequency
- dielectric constant
- printed board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
Abstract
The invention relates to a dielectric constant measuring method for a high-frequency microwave printed board. The method includes the steps of firstly, using mechanical arms to clamp two opposite angles of the high-frequency microwave printed board, and fixing the two cable probes of a measuring device to the center of two sides of the high-frequency microwave printed board; secondly, measuring the voltage Vc of the capacitor of the microwave printed board and the voltage Vr of the standard resistor of the microwave printed board, and calculating the capacitance c (PF) of high-frequency microwave printed board; thirdly, using the mechanical arms to rotate the high-frequency microwave printed board, and using an optical measuring instrument to measure the area A (CM<2>), the medium thickness d (CM) and the perimeter L (CM) of the high-frequency microwave printed board during rotation; fourthly, calculating the dielectric constant according to the capacitance c (PF), the area A (CM<2>), the medium thickness d (CM) and the perimeter L (CM). The dielectric constant measuring method is high in dielectric constant measuring accuracy, low in cost and suitable for being popularized and used by vast manufacturers.
Description
Technical field
The present invention relates to a kind of dielectric constant measurement method of high frequency microwave printed, relate to the fields of measurement of electric variable.
Background technology
Determine that the identity of people mainly uses I.D. now, along with the development of Digital Microwave circuit, the transfer rate of signal is more and more higher, when signal rate is increased to that megabits is per second arranges upper Gigabits per second, on galley (PCB) circuit will there are high-frequency effects in the transmission of signal, to the effect of dispersion on signal wire transmission line, the estimation of the high-frequency effects such as skin effect just becomes very necessary, the bad transmission line of high frequency performance is deteriorated causing the integrality of signal, therefore the specific inductive capacity of dielectric substrate will be known accurately, so that the circuit of design can realize the performance of expecting, therefore, a kind of method needing common manufacturer generally to apply can measure the specific inductive capacity of high frequency microwave printed exactly.
Summary of the invention
The technical problem to be solved in the present invention is: for overcoming the problems referred to above, provides a kind of dielectric constant measurement method of the high frequency microwave printed that can generally apply.
The technical solution adopted for the present invention to solve the technical problems is:
A dielectric constant measurement method for high frequency microwave printed, comprises the following steps:
(1) clamped by relative two angles of mechanical arm by high frequency microwave printed, then two of proving installation cabled probe are separately fixed at the central authorities on the two sides of high frequency microwave printed;
(2) the voltage V on microwave printed board electric capacity is measured
cwith the voltage V in measuring resistance
r, the electric capacity c (PF) of described high frequency microwave printed is calculated according to tester frequency and range ohmer;
(3) by mechanical arm, described high frequency microwave printed is rotated, in the process rotated, measured the area A (CM of high frequency microwave printed by optical measuring instrument
2), dielectric thickness d (CM) and perimeter L (CM);
(4) described proving installation is according to electric capacity c (PF), the area A (CM of described high frequency microwave printed
2), dielectric thickness d (CM) and perimeter L (CM) calculate the specific inductive capacity of high frequency microwave printed.
Preferably, following formula is pre-entered in described proving installation:
The relative dielectric constant of high frequency microwave printed is gone out by this formulae discovery.
Preferably, tester frequency is 10KHz.
Preferably, magnet is respectively arranged with in described two cabled probe and its magnetic is contrary.
Preferably, the probe contacts area of described two test probes is 14-40mm
2.
Preferably, described range resistance arranges 6, is 1000K Ω, 800K Ω, 400K Ω, 200K Ω, 100K Ω, 10K Ω respectively.
The invention has the beneficial effects as follows: the both sides that the inventive method is separately fixed at high frequency microwave printed by two cabled probe with opposite magnetic are measured, calculate the electric capacity C of high frequency microwave printed accurately, and substitute into by proving installation the specific inductive capacity that correlation formula measures high frequency microwave printed, provide a kind of detection method of accurate quick.
Embodiment
The dielectric constant measurement method of a kind of high frequency microwave printed of the present invention, comprises the following steps:
(1) clamped by relative two angles of mechanical arm by high frequency microwave printed, two of proving installation cabled probe are separately fixed at the central authorities on the two sides of high frequency microwave printed, each cabled probe is connected with a test cable, test cable is connected with proving installation, described proving installation comprises conventional voltage and current measurement equipment and has the existing processor of calculating memory function as AMD processor, as as described in the cabled probe centre position that is fixed on the face of high frequency microwave printed be conducive to electric capacity accurate test, because like this distribution of electric field and the impact of edge effect all more symmetrical, closer to capacity plate antenna state, when testing, ensure the close contact of cabled probe and high frequency microwave printed, so that Measurement accuracy,
(2) the voltage V on microwave printed board electric capacity can be measured by proving installation
cwith the voltage V in measuring resistance
r, the electric capacity c (PF) of high frequency microwave printed is calculated according to tester frequency and range ohmer, because the electric current flowed through is identical, therefore ω CV
c=V
r/ R, after conversion
therefore tester frequencies omega and range resistance R just can be obtained the electric capacity C of tested high frequency microwave printed;
(3) rotated by described high frequency microwave printed by mechanical arm, described mechanical arm adopts existing conventional mechanical arm, is measured the area A (CM of high frequency microwave printed in the process rotated by optical measuring instrument
2), dielectric thickness d (CM) and perimeter L (CM), described optical measuring instrument can adopt CCD camera to measure, and calculates above-mentioned design parameter by the processor in measurement mechanism;
(4) described proving installation is according to electric capacity c (PF), the area A (CM of described high frequency microwave printed
2), dielectric thickness d (CM) and perimeter L (CM) calculate the specific inductive capacity of high frequency microwave printed, can computing formula be pre-entered in the processor in described proving installation, be calculated by computing formula.
Preferably, following formula is pre-entered in described proving installation:
By this, above-mentioned parameter is substituted into the relative dielectric constant ε that this formulae discovery goes out high frequency microwave printed
r, this formula by being arranged in proving installation, after the data measured are sent to proving installation, proving installation automated intelligent calculate specific inductive capacity, and by display device, as display etc. is shown to user.
In preferred embodiments, tester frequency is 10KHz, specifically can also be set to other numerical value as required.
In preferred embodiments, be respectively arranged with magnet in described two cabled probe and its magnetic is contrary, therefore can ensure that cabled probe is adsorbed on high frequency microwave printed closely.
In preferred embodiments, the probe contacts area of described two test probes is 14-40mm
2, ensure that the surface of contact of popping one's head in has the smooth finish of more than 8 grades, to improve accuracy of measurement.
In preferred embodiments, described range resistance arranges 6, is 1000K Ω, 800K Ω, 400K Ω, 200K Ω, 100K Ω, 10K Ω respectively, specifically also can arranges as required.
With above-mentioned according to desirable embodiment of the present invention for enlightenment, by above-mentioned description, relevant staff in the scope not departing from this invention technological thought, can carry out various change and amendment completely.The technical scope of this invention is not limited to the content on instructions, must determine its technical scope according to right.
Claims (6)
1. a dielectric constant measurement method for high frequency microwave printed, is characterized in that, comprise the following steps:
(1) clamped by relative two angles of mechanical arm by high frequency microwave printed, then two of proving installation cabled probe are separately fixed at the central authorities on the two sides of high frequency microwave printed;
(2) the voltage V on microwave printed board electric capacity is measured
cwith the voltage V in measuring resistance
r, the electric capacity c (PF) of described high frequency microwave printed is calculated according to tester frequency and range ohmer;
(3) by mechanical arm, described high frequency microwave printed is rotated, in the process rotated, measured the area A (CM of high frequency microwave printed by optical measuring instrument
2), dielectric thickness d (CM) and perimeter L (CM);
(4) described proving installation is according to electric capacity c (PF), the area A (CM of described high frequency microwave printed
2), dielectric thickness d (CM) and perimeter L (CM) calculate the specific inductive capacity of high frequency microwave printed.
2. the dielectric constant measurement method of high frequency microwave printed as claimed in claim 1, is characterized in that, pre-enter following formula in described proving installation:
The relative dielectric constant ε of high frequency microwave printed is gone out by this formulae discovery
r.
3. the dielectric constant measurement method of high frequency microwave printed as claimed in claim 1 or 2, it is characterized in that, tester frequency is 10KHz.
4. the dielectric constant measurement method of the high frequency microwave printed as described in any one of claim 1-3, is characterized in that, is respectively arranged with magnet and its magnetic is contrary in described two cabled probe.
5. the dielectric constant measurement method of the high frequency microwave printed as described in any one of claim 1-4, is characterized in that, the probe contacts area of described two test probes is 14-40mm
2.
6. the dielectric constant measurement method of the high frequency microwave printed as described in any one of claim 1-5, is characterized in that, described range resistance arranges 6, is 1000K Ω, 800K Ω, 400K Ω, 200K Ω, 100K Ω, 10K Ω respectively.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410597783.6A CN104360169A (en) | 2014-10-30 | 2014-10-30 | Dielectric constant measuring method for high-frequency microwave printed board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410597783.6A CN104360169A (en) | 2014-10-30 | 2014-10-30 | Dielectric constant measuring method for high-frequency microwave printed board |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN104360169A true CN104360169A (en) | 2015-02-18 |
Family
ID=52527451
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410597783.6A Pending CN104360169A (en) | 2014-10-30 | 2014-10-30 | Dielectric constant measuring method for high-frequency microwave printed board |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN104360169A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111551792A (en) * | 2020-05-27 | 2020-08-18 | 哈尔滨理工大学 | Dielectric infinite high frequency relative dielectric constant measuring principle |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5416424A (en) * | 1993-09-15 | 1995-05-16 | Mitutoyo Corporation | Dielectric coating for capacitive position transducers to reduce sensitivity to contaminants |
| WO2006101145A1 (en) * | 2005-03-23 | 2006-09-28 | Nec Corporation | Resonator, printed board, and method for measuring complex dielectric constant |
| CN101013146A (en) * | 2007-03-05 | 2007-08-08 | 徐缓 | Test method for relative dielectric constant Epsilon of high-frequency microwave printed board |
| CN201322774Y (en) * | 2008-10-23 | 2009-10-07 | 深圳市博敏电子有限公司 | Testing device of high-frequency microwave printing plate dielectric constant |
| CN102426299A (en) * | 2011-11-01 | 2012-04-25 | 电子科技大学 | Method for measuring effective dielectric constant of double-sided metal-foil-clad plate |
| CN202562436U (en) * | 2012-01-09 | 2012-11-28 | 成都术有科技有限公司 | Optical measuring instrument |
-
2014
- 2014-10-30 CN CN201410597783.6A patent/CN104360169A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5416424A (en) * | 1993-09-15 | 1995-05-16 | Mitutoyo Corporation | Dielectric coating for capacitive position transducers to reduce sensitivity to contaminants |
| WO2006101145A1 (en) * | 2005-03-23 | 2006-09-28 | Nec Corporation | Resonator, printed board, and method for measuring complex dielectric constant |
| CN101013146A (en) * | 2007-03-05 | 2007-08-08 | 徐缓 | Test method for relative dielectric constant Epsilon of high-frequency microwave printed board |
| CN201322774Y (en) * | 2008-10-23 | 2009-10-07 | 深圳市博敏电子有限公司 | Testing device of high-frequency microwave printing plate dielectric constant |
| CN102426299A (en) * | 2011-11-01 | 2012-04-25 | 电子科技大学 | Method for measuring effective dielectric constant of double-sided metal-foil-clad plate |
| CN202562436U (en) * | 2012-01-09 | 2012-11-28 | 成都术有科技有限公司 | Optical measuring instrument |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111551792A (en) * | 2020-05-27 | 2020-08-18 | 哈尔滨理工大学 | Dielectric infinite high frequency relative dielectric constant measuring principle |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN106556748B (en) | The measuring device and method of thin-film material complex dielectric permittivity based on transmission bounce technique | |
| US8803538B2 (en) | Contactless measuring system for near field measurement of a signal waveguide | |
| CN108169701B (en) | Radio frequency power time domain measuring method and calibration method | |
| CN205786867U (en) | A kind of nano thin-film Micro-wave low-noise transistor test device | |
| CN105929346B (en) | A kind of device and its measurement method of contactless vector network high temperature test film magnetic conductivity | |
| CN109633273B (en) | Open-hole load impedance test system and method | |
| CN104237832B (en) | A kind of calibration method and device of complex impedance standard | |
| CN205810498U (en) | Shunt resistance device | |
| CN202815093U (en) | Silicon steel sheet coating film insulation resistance test device | |
| CN104635088A (en) | Intelligent sensing device of zinc oxide arrester tester | |
| CN104360169A (en) | Dielectric constant measuring method for high-frequency microwave printed board | |
| CN113125857A (en) | Wave-absorbing material dielectric parameter measurement and inversion method based on open-circuit coaxial line | |
| CN105425014A (en) | Time domain measurement system, time domain measurement calibration system and time domain measurement calibration verification system for board-level radio frequency current | |
| CN210199207U (en) | Ultralow frequency dielectric loss test system | |
| CA2536083A1 (en) | Method and apparatus for measuring impedance of electrical component under high interference conditions | |
| CN105866667B (en) | A kind of loop resistance test method of two sides earth breaker | |
| CN104678339B (en) | Calibration device, system and method for probe type microwave voltage measurement system | |
| CN105372498B (en) | Current divider impedance parameter for transient current measure determines method | |
| CN101788610B (en) | Calibration method of coaxial impedance calibrator | |
| CN103954854B (en) | Testing method and device for pogo pin electrical performance | |
| US7365550B2 (en) | Low impedance test fixture for impedance measurements | |
| CN207516448U (en) | The preferable screening factor test system of communication cable | |
| CN111024186B (en) | Microwave level meter step response time measuring device and method | |
| CN215985832U (en) | Carbon fiber composite material conductivity measurement system | |
| CN206311670U (en) | Dielectric material measurement apparatus |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20150218 |
|
| RJ01 | Rejection of invention patent application after publication |