Nothing Special   »   [go: up one dir, main page]

CN104236726A - Spectrum phase interference device and ultrashort light pulse electric field direct reconstruction system - Google Patents

Spectrum phase interference device and ultrashort light pulse electric field direct reconstruction system Download PDF

Info

Publication number
CN104236726A
CN104236726A CN201310244775.9A CN201310244775A CN104236726A CN 104236726 A CN104236726 A CN 104236726A CN 201310244775 A CN201310244775 A CN 201310244775A CN 104236726 A CN104236726 A CN 104236726A
Authority
CN
China
Prior art keywords
pulse
subpulse
frequency
frequently
wave plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN201310244775.9A
Other languages
Chinese (zh)
Other versions
CN104236726B (en
Inventor
徐世祥
马影坤
蔡懿
曾选科
李景镇
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenzhen University
Original Assignee
Shenzhen University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenzhen University filed Critical Shenzhen University
Priority to CN201310244775.9A priority Critical patent/CN104236726B/en
Publication of CN104236726A publication Critical patent/CN104236726A/en
Application granted granted Critical
Publication of CN104236726B publication Critical patent/CN104236726B/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Spectrometry And Color Measurement (AREA)

Abstract

本发明适用于光电技术领域,提供了一种光谱相位干涉装置及超短光脉冲电场直接重构系统,所述光谱相位干涉装置在现有SPIDER装置基础上引进二步相移技术,这样可以方便地获得两幅干涉条纹互补的光谱干涉图样,在数据处理上不再需要用时间窗滤去直流量,从而消除了直流量与交流量的时间交叠对测量结果的影响,极大地提升了测量精度。因此,本光谱相位干涉装置广泛应用于各种超短光脉冲电场直接重构系统,尤适用于测量光谱形状比较复杂或光谱较窄的超短脉冲时间/光谱特性。

The invention is applicable to the field of optoelectronic technology, and provides a spectral phase interference device and an ultrashort optical pulse electric field direct reconstruction system. The spectral phase interference device introduces a two-step phase shift technology based on the existing SPIDER device, which can facilitate The spectral interference pattern of two complementary interference fringes can be obtained accurately. In data processing, it is no longer necessary to use a time window to filter out the DC flow, thereby eliminating the influence of the time overlap of the DC flow and the AC flow on the measurement results, and greatly improving the measurement results. precision. Therefore, the spectral phase interference device is widely used in various ultrashort optical pulse electric field direct reconstruction systems, and is especially suitable for measuring ultrashort pulse time/spectral characteristics with complex spectral shapes or narrow spectra.

Description

一种光谱相位干涉装置及超短光脉冲电场直接重构系统A spectral phase interference device and an ultrashort optical pulse electric field direct reconstruction system

技术领域technical field

本发明属于光电技术领域,尤其涉及一种光谱相位干涉装置及超短光脉冲电场直接重构系统。The invention belongs to the field of optoelectronic technology, in particular to a spectral phase interference device and an ultrashort optical pulse electric field direct reconstruction system.

背景技术Background technique

超短激光脉冲目前已广泛应用于物理、化学、材料、生物医学、国防、工业加工等各个领域。自八十年代末至今,人们对超短光脉冲的研究一直就没有停止过。其中包括更短、更强的超短脉冲的产生和放大技术、超短脉冲的诊断技术以及不断开拓各种新的应用领域。在各种超短脉冲测量技术中,自相关测量是一种最为常用的技术,其特点为简单、易用。但它只能近似地测量脉冲宽度而不能测量脉冲的形状和相位。频率分辨光快门技术能测量光脉冲的形状、宽度和相位,结构也相对简单,不过它复杂的数据处理限制了它的工作效率和实时诊断能力。利用传统的光谱剪切干涉的SPIDER技术也能测量光脉冲的宽度、形状和相位。它的优点是:测量在光谱域进行,不需快响应接收器;装置内不含任何移动元件,稳定可靠;递代算法简单,有利于高重复率实时检测。其不足之处为对于光谱形状比较复杂,或光谱较窄的超短脉冲,测量的精度就比较差。Ultrashort laser pulses have been widely used in various fields such as physics, chemistry, materials, biomedicine, national defense, and industrial processing. Since the end of the 1980s, research on ultrashort optical pulses has never stopped. These include the generation and amplification technology of shorter and stronger ultrashort pulses, the diagnostic technology of ultrashort pulses, and the continuous development of various new application fields. Among various ultrashort pulse measurement techniques, autocorrelation measurement is the most commonly used technique, which is characterized by simplicity and ease of use. But it can only measure the pulse width approximately but not the shape and phase of the pulse. Frequency-resolved optical shutter technology can measure the shape, width, and phase of optical pulses, and its structure is relatively simple, but its complex data processing limits its work efficiency and real-time diagnostic capabilities. The SPIDER technique using conventional spectral shearing interferometry can also measure the width, shape and phase of optical pulses. Its advantages are: the measurement is carried out in the spectral domain and does not require a fast-response receiver; the device does not contain any moving components, which is stable and reliable; the generation algorithm is simple, which is conducive to real-time detection with high repetition rate. The disadvantage is that for ultrashort pulses with complex spectral shapes or narrow spectra, the measurement accuracy is relatively poor.

发明内容Contents of the invention

本发明实施例的目的在于提供一种用于超短光脉冲电场直接重构的光谱相位干涉装置,旨在提高现有光谱相位干涉装置测量精度。The purpose of the embodiments of the present invention is to provide a spectral phase interference device for direct reconstruction of an ultrashort optical pulse electric field, aiming at improving the measurement accuracy of the existing spectral phase interference device.

本发明实施例是这样实现的,一种光谱相位干涉装置,包括:The embodiment of the present invention is achieved in this way, a spectral phase interference device, comprising:

用于获取啁啾脉冲及特性相同的第一待测子脉冲和第二待测子脉冲,并使所述啁啾脉冲分别作用于第一待测子脉冲和第二待测子脉冲,以产生第一和频脉冲和第二和频脉冲的和频晶体;It is used to obtain the chirped pulse and the first sub-pulse to be measured and the second sub-pulse to be measured with the same characteristics, and to make the chirped pulse act on the first sub-pulse to be measured and the second sub-pulse to be measured respectively to generate A sum frequency crystal of the first sum frequency pulse and the second sum frequency pulse;

用于将所述第一和频脉冲分为第一和频子脉冲和第二和频子脉冲、所述第二和频脉冲分为第三和频子脉冲和第四和频子脉冲的第三分束器;The first sum-frequency pulse is used to divide the first sum-frequency sub-pulse into a first sum-frequency sub-pulse and a second sum-frequency sub-pulse, and the second sum-frequency pulse is divided into a third sum-frequency sub-pulse and a fourth sum-frequency sub-pulse. Three beam splitters;

用于使所述第一和频子脉冲与第三和频子脉冲叠加,以产生第一光谱干涉图样的第一相移机构;a first phase shifting mechanism for superimposing said first sum frequency sub-pulse with a third sum frequency sub-pulse to produce a first spectral interference pattern;

用于使所述第二和频子脉冲与第四和频子脉冲叠加,以产生第二光谱干涉图样的第二相移机构;a second phase shifting mechanism for superimposing said second sum frequency sub-pulse with a fourth sum frequency sub-pulse to produce a second spectral interference pattern;

用于获取所述第一光谱干涉图样和第二光谱干涉图样的光谱仪;以及a spectrometer for acquiring said first and second spectral interference patterns; and

用于对所述第一光谱干涉图样和第二光谱干涉图样进行处理,以获得所述第一待测子脉冲或第二待测子脉冲特性的处理器;a processor for processing the first spectral interference pattern and the second spectral interference pattern to obtain characteristics of the first sub-pulse to be measured or the second sub-pulse to be measured;

其中,所述第一相移机构和第二相移机构分别具有使第一和频子脉冲与第二和频子脉冲或者使第三和频子脉冲与第四和频子脉冲间产生π或-π相移的第二波片和第三波片。Wherein, the first phase shifting mechanism and the second phase shifting mechanism respectively have the functions of making the first sum frequency sub-pulse and the second sum frequency subpulse or making the third sum frequency subpulse and the fourth sum frequency subpulse generate π or - π phase shifted second and third wave plates.

本发明实施例的另一目的在于提供一种采用上述光谱相位干涉装置的超短光脉冲电场直接重构系统。Another object of the embodiments of the present invention is to provide a system for direct electric field reconstruction of ultrashort optical pulses using the above-mentioned spectral phase interference device.

本发明实施例在现有SPIDER装置基础上引进二步相移技术,这样可以方便地获得两幅干涉条纹互补的光谱干涉图样,在数据处理上不再需要用时间窗滤去直流量,从而消除了直流量与交流量的时间交叠对测量结果的影响,从而提升了测量精度和测量范围。因此,本光谱相位干涉装置广泛应用于各种超短光脉冲电场直接重构系统,尤适用于测量光谱形状比较复杂或光谱较窄的超短脉冲时间/光谱特性。The embodiment of the present invention introduces two-step phase shift technology on the basis of the existing SPIDER device, so that two spectral interference patterns with complementary interference fringes can be obtained conveniently, and it is no longer necessary to use a time window to filter out the DC flow in data processing, thereby eliminating The impact of the time overlap of DC and AC on the measurement results is eliminated, thereby improving the measurement accuracy and measurement range. Therefore, the spectral phase interference device is widely used in various ultrashort optical pulse electric field direct reconstruction systems, and is especially suitable for measuring ultrashort pulse time/spectral characteristics with complex spectral shapes or narrow spectra.

附图说明Description of drawings

图1是本发明实施例一提供的光谱相位干涉装置的光路结构图;Fig. 1 is an optical path structure diagram of a spectral phase interference device provided in Embodiment 1 of the present invention;

图2是线偏振光通过半波片后,光束偏振面受到调制发生偏转的示意图;Figure 2 is a schematic diagram of the beam polarization plane being modulated and deflected after the linearly polarized light passes through the half-wave plate;

图3是偏振无关的无色散光束分束器的结构示意图;Fig. 3 is a schematic structural view of a polarization-independent non-dispersive beam splitter;

图4是本发明实施例二提供的光谱相位干涉装置的光路结构图;以及Fig. 4 is an optical path structure diagram of the spectral phase interference device provided by Embodiment 2 of the present invention; and

图5是本发明实施例三提供的光谱相位干涉装置的光路结构图。Fig. 5 is a diagram of the optical path structure of the spectral phase interference device provided by the third embodiment of the present invention.

具体实施方式Detailed ways

为了使本发明的目的、技术方案及优点更加清楚明白,以下结合附图及实施例,对本发明进行进一步详细说明。应当理解,此处所描述的具体实施例仅仅用于解释本发明,并不用于限定本发明。In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

本发明实施例在现有SPIDER装置基础上引进二步相移技术,这样可以方便地获得两幅干涉条纹互补的光谱干涉图样,在数据处理上不再需要用时间窗滤去直流量,从而消除了直流量与交流量的时间交叠对测量结果的影响,提升了测量精度。因此,本光谱相位干涉装置广泛应用于各种超短光脉冲电场直接重构系统,尤适用于测量光谱形状比较复杂或光谱较窄的超短脉冲时间/光谱特性。The embodiment of the present invention introduces two-step phase shift technology on the basis of the existing SPIDER device, so that two spectral interference patterns with complementary interference fringes can be obtained conveniently, and it is no longer necessary to use a time window to filter out the DC flow in data processing, thereby eliminating The impact of the time overlap of DC and AC on the measurement results is eliminated, and the measurement accuracy is improved. Therefore, the spectral phase interference device is widely used in various ultrashort optical pulse electric field direct reconstruction systems, and is especially suitable for measuring ultrashort pulse time/spectral characteristics with complex spectral shapes or narrow spectra.

下面列举若干实施例对本发明的实现进行详细描述。Several embodiments are enumerated below to describe the implementation of the present invention in detail.

实施例一Embodiment one

如图1所示,本实施例提供的光谱相位干涉装置包括:用于获取啁啾脉冲10及特性相同的第一待测子脉冲11和第二待测子脉冲12,并使所述啁啾脉冲1分别作用于第一待测子脉冲11和第二待测子脉冲12、以产生第一和频脉冲13和第二和频脉冲14的和频晶体5;用于将所述第一和频脉冲13分为第一和频子脉冲15和第二和频子脉冲16、所述第二和频脉冲14分为第三和频子脉冲17和第四和频子脉冲18的第三分束器3;用于使所述第一和频子脉冲15与第三和频子脉冲17叠加,以产生第一光谱干涉图样的第一相移机构;用于使所述第二和频子脉冲16与第四和频子脉冲18叠加,以产生第二光谱干涉图样的第二相移机构;用于获取所述第一光谱干涉图样和第二光谱干涉图样的光谱仪;以及用于对所述第一光谱干涉图样和第二光谱干涉图样进行处理,以获得所述第一待测子脉冲11或第二待测子脉冲12的特性的处理器19;其中,所述第一相移机构和第二相移机构分别具有使第一和频子脉冲15与第二和频子脉冲16或者使第三和频子脉冲17与第四和频子脉冲18间产生π相移的第二波片22和第三波片23。这样可以方便地获得两幅干涉条纹互补的光谱干涉图样,在数据处理上不再需要用时间窗滤去直流量,从而消除了直流量与交流量的时间交叠对测量结果的影响,极大地提升了测量精度。因此,本光谱相位干涉装置广泛应用于各种超短光脉冲电场直接重构系统,尤适用于测量光谱形状比较复杂或光谱较窄的超短脉冲时间/光谱特性。As shown in Figure 1, the spectral phase interference device provided by this embodiment includes: used to obtain a chirped pulse 10 and a first sub-pulse to be measured 11 and a second sub-pulse to be measured 12 with the same characteristics, and make the chirped pulse The pulse 1 acts on the first sub-pulse 11 to be measured and the second sub-pulse 12 to be measured respectively to generate the sum frequency crystal 5 of the first sum frequency pulse 13 and the second sum frequency pulse 14; The frequency pulse 13 is divided into the first sum frequency sub-pulse 15 and the second sum frequency sub-pulse 16, and the second sum frequency pulse 14 is divided into the third sum frequency sub-pulse 17 and the fourth sum frequency sub-pulse 18. Beamer 3; for superimposing the first sum-frequency sub-pulse 15 and the third sum-frequency sub-pulse 17 to generate the first phase shift mechanism of the first spectral interference pattern; for making the second sum-frequency sub-pulse pulse 16 superimposed with a fourth sum frequency sub-pulse 18 to produce a second phase shifting mechanism for a second spectral interference pattern; a spectrometer for acquiring said first spectral interference pattern and a second spectral interference pattern; The first spectral interference pattern and the second spectral interference pattern are processed to obtain the processor 19 of the characteristics of the first sub-pulse 11 to be measured or the second sub-pulse 12 to be measured; wherein, the first phase shift mechanism And the second phase-shifting mechanism respectively has the second wave that makes the first sum-frequency sub-pulse 15 and the second sum-frequency sub-pulse 16 or makes the third sum-frequency sub-pulse 17 and the fourth sum-frequency sub-pulse 18 produce π phase shift plate 22 and a third wave plate 23. In this way, two spectral interference patterns with complementary interference fringes can be obtained conveniently. In data processing, it is no longer necessary to use a time window to filter out the DC flow, thereby eliminating the influence of the time overlap of the DC flow and the AC flow on the measurement results, which greatly improves the measurement results. Improved measurement accuracy. Therefore, the spectral phase interference device is widely used in various ultrashort optical pulse electric field direct reconstruction systems, and is especially suitable for measuring ultrashort pulse time/spectral characteristics with complex spectral shapes or narrow spectra.

为获得所述啁啾脉冲10及特性相同的第一待测子脉冲11和第二待测子脉冲12,本光谱相位干涉装置还包括:用于接收待测脉冲20并使之分为反射脉冲24和透射脉冲25的第一分束器1;用于对所述透射脉冲25进行展宽并使之成为啁啾脉冲10的色散器6;用于将所述反射脉冲24分为第一待测子脉冲11和第二待测子脉冲12的第二分束器2;以及用于调整所述啁啾脉冲10的偏振方向的第一波片21。其中,所述第一波片21使投射至其上的啁啾脉冲10的偏振方向旋转90°后出射。In order to obtain the chirped pulse 10 and the first sub-pulse to be measured 11 and the second sub-pulse to be measured 12 with the same characteristics, the spectral phase interference device further includes: for receiving the pulse to be measured 20 and dividing it into reflected pulses 24 and the first beam splitter 1 of the transmitted pulse 25; the disperser 6 for expanding the transmitted pulse 25 and making it a chirped pulse 10; for dividing the reflected pulse 24 into the first beam splitter to be measured a second beam splitter 2 for the sub-pulse 11 and the second sub-pulse 12 to be measured; and a first wave plate 21 for adjusting the polarization direction of the chirped pulse 10 . Wherein, the first wave plate 21 rotates the polarization direction of the chirped pulse 10 projected thereon by 90° before emitting it.

本实施例主要用于单次脉冲测量,所述第一波片21、第二波片22和第三波片23均采用半波片。应当说明的是,半波片(相位延迟器)作为一种常用的偏振器件,它可以由多种人工或天然双折射晶体制成,常被用来改变入射光束的偏振态。半波片能够使得在其中传播的o光和e光产生一个π的相对相移,它能够将入射的线偏振光的偏振面旋转一个特定的角度,在激光技术领域常被用来作为偏振控制器件。若一束线偏振光入射至半波片,光束偏振面与半波片的慢轴的夹角为φ(如45°),经过该半波片调制后,光束偏振面将以半波片的慢轴为对称轴旋转2φ(如90°),如图2所示。在本实施例中,入射至所述第一波片21的啁啾脉冲光束偏振面与该波片慢轴的夹角为45°。所述第一和频子脉冲15与第二波片22慢轴的夹角为0°或90°,所述第二和频子脉冲16与第三波片23慢轴的夹角为90°或0°。This embodiment is mainly used for single pulse measurement, and the first wave plate 21 , the second wave plate 22 and the third wave plate 23 are all half-wave plates. It should be noted that half-wave plates (phase retarders), as a commonly used polarizing device, can be made of various artificial or natural birefringent crystals, and are often used to change the polarization state of the incident beam. The half-wave plate can make the o-light and e-light propagating in it produce a relative phase shift of π, which can rotate the polarization plane of the incident linearly polarized light by a specific angle, and is often used as a polarization control in the field of laser technology device. If a beam of linearly polarized light is incident on a half-wave plate, the angle between the polarization plane of the beam and the slow axis of the half-wave plate is φ (such as 45°). The slow axis is rotated by 2φ (such as 90°) for the symmetrical axis, as shown in Figure 2. In this embodiment, the included angle between the polarization plane of the chirped pulse beam incident on the first wave plate 21 and the slow axis of the wave plate is 45°. The angle between the first sum-frequency sub-pulse 15 and the slow axis of the second wave plate 22 is 0° or 90°, and the angle between the second sum-frequency sub-pulse 16 and the slow axis of the third wave plate 23 is 90° or 0°.

另外,本光谱相位干涉装置还可以进一步包括:用于调节所述第一待测子脉冲11与第二待测子脉冲12间的相对时间延迟的第一脉冲延时器31以及用于调节所述第一和频脉冲13与第二和频脉冲14间的相对时间延迟的第二脉冲延时器32。当所述待测脉冲20在10飞秒左右时,由用作所述第一分束器1的分束片将所述待测脉冲20分为两束,其中一束为反射脉冲24,另一束为透射脉冲25。所述透射脉冲25经所述色散器6被展宽为时间宽度在300飞秒至800飞秒间的啁啾脉冲10。所述反射脉冲24经所述第二分束器2被等分成两个脉冲,其中一个脉冲为第一待测子脉冲11,另一个为第二待测子脉冲12,两者宽度、形状和相位等特性相同。所述第一待测子脉冲11和第二待测子脉冲12与啁啾脉冲10一起入射到非线性和频晶体5,产生第一和频脉冲13以及第二和频脉冲14。其中,所述非线性和频晶体5系厚度约为几十微米的β-BBO晶体,采用第二类相位匹配。和频过程中,所述啁啾脉冲10为e光,而所述第一待测子脉冲11和第二待测子脉冲12均为o光。In addition, the spectral phase interference device may further include: a first pulse delayer 31 for adjusting the relative time delay between the first sub-pulse 11 to be measured and the second sub-pulse 12 to be measured, and a first pulse delayer 31 for adjusting the The second pulse delayer 32 for the relative time delay between the first sum frequency pulse 13 and the second sum frequency pulse 14 is described. When the pulse 20 to be measured is about 10 femtoseconds, the pulse 20 to be measured is divided into two beams by the beam splitter used as the first beam splitter 1, one of which is a reflected pulse 24, and the other is a reflected pulse 24. One beam is transmitted pulses 25 . The transmitted pulse 25 is stretched by the disperser 6 into a chirped pulse 10 with a time width between 300 femtoseconds and 800 femtoseconds. The reflected pulse 24 is equally divided into two pulses by the second beam splitter 2, wherein one pulse is the first sub-pulse 11 to be measured, and the other is the second sub-pulse 12 to be measured. The width, shape and The characteristics such as phase are the same. The first sub-pulse to be measured 11 and the second sub-pulse to be measured 12 are incident on the nonlinear sum-frequency crystal 5 together with the chirped pulse 10 to generate a first sum-frequency pulse 13 and a second sum-frequency pulse 14 . Wherein, the nonlinear sum frequency crystal 5 is a β-BBO crystal with a thickness of about tens of microns, and adopts the second type of phase matching. In the sum-frequency process, the chirped pulse 10 is e-light, and the first sub-pulse 11 to be measured and the second sub-pulse 12 to be measured are both o-light.

此处通过调节所述第一脉冲延时器31使第一和频脉冲13与第二和频脉冲14的中心波长相差约2.5纳米。这两个和频脉冲随后平行地投射至所述第三分束器3,各自被分成两束;即所述第一和频脉冲13经所述第三分束器3反射、透射后分为第一和频子脉冲15和第二和频子脉冲16;同样地,所述第二和频脉冲14经所述第三分束器3反射、透射后分为第三和频子脉冲17和第四和频子脉冲18。通常,所述第三分束器3优选为50:50的非偏振立方体分束器。其中,所述第一和频子脉冲15和第二和频子脉冲16分别经一400纳米波长光的宽带半波片(即第二波片22和第三波片23)后进入第一光谱仪41和第二光谱仪42。而第三和频子脉冲17和第四和频子脉冲18则直接被第一光谱仪41和第二光谱仪42分别接收。此时,所述第一和频子脉冲15与第三和频子脉冲17叠加,产生第一光谱干涉图样;所述第二和频子脉冲16与第四和频子脉冲18叠加,产生第二光谱干涉图样。Here, the center wavelength difference between the first sum frequency pulse 13 and the second sum frequency pulse 14 is about 2.5 nanometers by adjusting the first pulse delayer 31 . The two sum-frequency pulses are then projected into the third beam splitter 3 in parallel, and each is divided into two beams; that is, the first sum-frequency pulse 13 is reflected and transmitted by the third beam splitter 3 and divided into two beams. The first sum-frequency sub-pulse 15 and the second sum-frequency sub-pulse 16; similarly, the second sum-frequency pulse 14 is divided into the third sum-frequency sub-pulse 17 and the third sum-frequency sub-pulse 17 after being transmitted through the third beam splitter 3 The fourth sum frequency sub-pulse 18 . Usually, the third beam splitter 3 is preferably a 50:50 non-polarizing cube beam splitter. Wherein, the first sum-frequency sub-pulse 15 and the second sum-frequency sub-pulse 16 respectively pass through a broadband half-wave plate of light with a wavelength of 400 nanometers (ie, the second wave plate 22 and the third wave plate 23) and then enter the first spectrometer 41 and a second spectrometer 42. The third sum-frequency sub-pulse 17 and the fourth sum-frequency sub-pulse 18 are directly received by the first spectrometer 41 and the second spectrometer 42 respectively. At this time, the first sum-frequency sub-pulse 15 is superimposed with the third sum-frequency sub-pulse 17 to generate the first spectral interference pattern; the second sum-frequency sub-pulse 16 is superimposed with the fourth sum-frequency sub-pulse 18 to generate the first sum-frequency sub-pulse 18 Two spectral interference patterns.

可通过所述第二脉冲延时器32调节所述第一和频脉冲13与第二和频脉冲14间的相对时间延迟,以使各光谱仪测得的光谱干涉环疏密适当。其中,所述第一光谱仪41和第二光谱仪42的光谱分辨率需足够高(例如0.02纳米)。另外,此处使透过所述第二波片22的和频子脉冲为o光,使透过所述第三波片23的和频子脉冲为e光;或者使透过所述第二波片22的和频子脉冲为e光,使透过所述第三波片23的和频子脉冲为o光。即若所述第一和频子脉冲15为o光,则所述第二和频子脉冲16为e光;若所述第三和频子脉冲17为o光,则所述第四和频子脉冲18为e光;若所述第一和频子脉冲15为e光,则所述第二和频子脉冲16为o光;若所述第三和频子脉冲17为e光,则所述第四和频子脉冲18为o光。The relative time delay between the first sum-frequency pulse 13 and the second sum-frequency pulse 14 can be adjusted by the second pulse delayer 32, so that the density of the spectral interference ring measured by each spectrometer is appropriate. Wherein, the spectral resolution of the first spectrometer 41 and the second spectrometer 42 needs to be high enough (for example, 0.02 nm). In addition, the sum-frequency sub-pulse passing through the second wave plate 22 is made to be o light, the sum-frequency sub-pulse passing through the third wave plate 23 is made to be e light; or the sum-frequency sub-pulse passing through the second wave plate 23 is made to be e light; The sum-frequency sub-pulse of the wave plate 22 is e-light, and the sum-frequency sub-pulse transmitted through the third wave plate 23 is o-light. That is, if the first sum frequency sub-pulse 15 is o light, then the second sum frequency sub pulse 16 is e light; if the third sum frequency sub pulse 17 is o light, then the fourth sum frequency sub pulse The sub-pulse 18 is e-light; if the first sum-frequency sub-pulse 15 is e-light, then the second sum-frequency sub-pulse 16 is o-light; if the third sum-frequency sub-pulse 17 is e-light, then The fourth sum frequency sub-pulse 18 is o light.

假设所述第一光谱仪41测到的光谱干涉环为Assuming that the spectral interference ring measured by the first spectrometer 41 is

D1=|E1A(ω)|2+|E2A(ω-Ω)|2+2|E1A(ω)E2A(ω-Ω)|cos[ωτ+ψ(ω)-ψ(ω-Ω)   (1)D 1 =|E 1A (ω)| 2 +|E 2A (ω-Ω)| 2 +2|E 1A (ω)E 2A (ω-Ω)|cos[ωτ+ψ(ω)-ψ(ω -Ω) (1)

其中E表示电场,τ为所述第一和频脉冲13与第二和频脉冲14间的时间延迟,Ω为所述第一和频脉冲13与第二和频脉冲14间的中心频率差,而ψ表示相位。相应地,所述第二光谱仪42测到的光谱干涉环可表示为Wherein E represents the electric field, τ is the time delay between the first sum frequency pulse 13 and the second sum frequency pulse 14, and Ω is the center frequency difference between the first sum frequency pulse 13 and the second sum frequency pulse 14, And ψ represents the phase. Correspondingly, the spectral interference ring measured by the second spectrometer 42 can be expressed as

D2=|E1B(ω)|2+|E2B(ω-Ω)|2-2|E1B(ω)E2B(ω-Ω)|cos[ωτ+ψ(ω)-ψ(ω-Ω)   (2)D 2 =|E 1B (ω)| 2 +|E 2B (ω-Ω)| 2 -2|E 1B (ω)E 2B (ω-Ω)|cos[ωτ+ψ(ω)-ψ(ω -Ω) (2)

因所述第一和频脉冲13和第二和频脉冲14平行地入射至一50:50的非偏振立方体分束器,故有Because the first sum-frequency pulse 13 and the second sum-frequency pulse 14 are incident to a 50:50 non-polarizing cube beam splitter in parallel, there is

|E1B(ω)|2/|E1A(ω)|2=|E2B(ω)|2/|E2A(ω)|2=1   (3)|E 1B (ω)| 2 /|E 1A (ω)| 2 =|E 2B (ω)| 2 /|E 2A (ω)| 2 =1 (3)

实际上,非偏振立方体分束器的分束比可能略微偏离1。对此进行数值修正,于是可得下式结果In practice, the splitting ratio of a non-polarizing cube beamsplitter may deviate slightly from unity. Numerically correcting this, the following result can be obtained

D1-μD2=4|E1B(ω)E2B(ω-Ω)|cos[ωτ+ψ(ω)-ψ(ω-Ω)]   (4)D 1 -μD 2 =4|E 1B (ω)E 2B (ω-Ω)|cos[ωτ+ψ(ω)-ψ(ω-Ω)] (4)

显然,修正系数μ满足Obviously, the correction coefficient μ satisfies

μ|E1B(ω)|2=|E1A(ω)|2,μ|E2B(ω-Ω)|2=|E2A(ω)|2   (5)μ|E 1B (ω)| 2 =|E 1A (ω)| 2 , μ|E 2B (ω-Ω)| 2 =|E 2A (ω)| 2 (5)

于是可以直接从(4)式得到光谱剪切相位差。Then the spectral shear phase difference can be obtained directly from (4).

本实施例中所述第一光谱仪41和第二光谱仪42为同型号同规格的光谱仪,以便具有相同的光谱响应特性和噪声特性等。这两光谱仪在时间上同步获取第一光谱干涉环和第二光谱干涉环上记录的数据,并存储到处理器19中由相应的数据处理软件进行处理。与现有的SPIDER装置比较,本实施例通过二步相移技术记录两幅光谱干涉环,使得在数据处理上能轻易消除现有装置中直流量对交流量时间截取的影响,这带来两个方面的好处:In this embodiment, the first spectrometer 41 and the second spectrometer 42 are spectrometers of the same model and specification, so as to have the same spectral response characteristics and noise characteristics. The two spectrometers acquire the data recorded on the first spectral interference ring and the second spectral interference ring synchronously in time, and store them in the processor 19 for processing by corresponding data processing software. Compared with the existing SPIDER device, this embodiment records two spectral interference rings through the two-step phase shift technology, so that the influence of DC flow on the time interception of AC flow in the existing device can be easily eliminated in data processing, which brings two Benefits in two ways:

1)当测量光谱形状复杂或光谱较窄(时间较宽)的超短脉冲时,可有效地避免直流量与交流量在时间域上的重叠。从而有效地拓宽可测量范围。1) When measuring ultrashort pulses with complex spectral shape or narrow spectrum (wider time), it can effectively avoid the overlapping of DC and AC quantities in the time domain. Thereby effectively widening the measurable range.

2)选取交流分量不再靠时间窗截取,而是靠两台同样性能的光谱仪测到的光谱干涉环的加权相减,有效地减少噪声的影响。2) The selection of the AC component is no longer intercepted by the time window, but by the weighted subtraction of the spectral interference rings measured by two spectrometers with the same performance, which effectively reduces the influence of noise.

如果所述待测脉冲20为100飞秒左右的光脉冲,则可以通过调整所述色散器6使所述啁啾脉冲10的时间宽度为1.5皮秒左右,而所述第一分束器1采用50:50的宽度分束片即可。若所述待测脉冲20为光周期量级的超短脉冲,则所述第二分束器2可采用与偏振无关的无色散光束分束器,其系底角小于10°的等腰棱镜,并于两腰平面镀0度宽度高反膜,如图3所示。前述反射脉冲24垂直于等腰棱镜的底面投射至两腰平面即可将其分为第一待测子脉冲11和第二待测子脉冲12,沿垂直于所述反射脉冲24传输方向平移该等腰棱镜即可调节所述第一待测子脉冲11与第二待测子脉冲12的功率比,操作简便。If the pulse 20 to be measured is an optical pulse of about 100 femtoseconds, the time width of the chirped pulse 10 can be about 1.5 picoseconds by adjusting the disperser 6, and the first beam splitter 1 A 50:50 width beamsplitter is sufficient. If the pulse 20 to be measured is an ultrashort pulse on the order of an optical period, then the second beam splitter 2 can be a polarization-independent non-dispersive beam splitter, which is an isosceles prism with a base angle of less than 10° , and plate a 0-degree width high-reflection film on the two waist planes, as shown in Figure 3. The aforementioned reflected pulse 24 is projected onto the two waist planes perpendicular to the bottom surface of the isosceles prism, which can be divided into the first sub-pulse 11 to be measured and the second sub-pulse 12 to be measured, and the pulse is translated along the direction perpendicular to the transmission direction of the reflected pulse 24 The isosceles prism can adjust the power ratio between the first sub-pulse to be measured 11 and the second sub-pulse to be measured 12 , which is easy to operate.

实施例二Embodiment two

如图4所示,与实施例一不同的是,本实施例提供的光谱相位干涉装置适用于多次脉冲测量,其还包括:用于使所述第一和频子脉冲15与第三和频子脉冲17同时透射/反射、而后叠加产生所述第一光谱干涉图样,所述第二和频子脉冲16与第四和频子脉冲18同时反射/透射、而后叠加产生所述第二光谱干涉图样的第四分束器4;用于使所述第一和频子脉冲15与第三和频子脉冲17、所述第二和频子脉冲16与第四和频子脉冲18分时进入所述第四分束器4的光学斩波器7。若所述第一和频子脉冲15与第三和频子脉冲17经所述第四分束器4同时透射,则所述第二和频子脉冲16与第四和频子脉冲18经所述第四分束器4同时反射;若所述第一和频子脉冲15与第三和频子脉冲17经所述第四分束器4同时反射,则所述第二和频子脉冲16与第四和频子脉冲18经所述第四分束器4同时透射,而这与所述第四分束器4的摆放位置相关。As shown in Figure 4, different from Embodiment 1, the spectral phase interference device provided by this embodiment is suitable for multiple pulse measurements, and it also includes: for making the first sum frequency sub-pulse 15 and the third sum frequency sub-pulse 15 The frequency sub-pulse 17 is simultaneously transmitted/reflected, then superimposed to generate the first spectral interference pattern, and the second sum-frequency sub-pulse 16 and the fourth sum-frequency sub-pulse 18 are simultaneously reflected/transmitted, and then superimposed to generate the second spectrum The fourth beam splitter 4 of the interference pattern; for time-sharing the first sum-frequency sub-pulse 15 and the third sum-frequency sub-pulse 17, the second sum-frequency sub-pulse 16 and the fourth sum-frequency sub-pulse 18 Enters the optical chopper 7 of the fourth beam splitter 4 . If the first sum-frequency sub-pulse 15 and the third sum-frequency sub-pulse 17 are simultaneously transmitted through the fourth beam splitter 4, then the second sum-frequency sub-pulse 16 and the fourth sum-frequency sub-pulse 18 are transmitted through the fourth beam splitter 4 The fourth beam splitter 4 reflects at the same time; if the first sum frequency sub-pulse 15 and the third sum frequency sub-pulse 17 are simultaneously reflected by the fourth beam splitter 4, the second sum frequency sub-pulse 16 The fourth sum frequency sub-pulse 18 is transmitted through the fourth beam splitter 4 at the same time, and this is related to the placement position of the fourth beam splitter 4 .

其中,所述光谱仪40仅为一个,用于分时接收所述第一光谱干涉图样和第二光谱干涉图样。同样地,所述第四分束器优选为50:50的非偏振立方体分束器。应当理解,所述光谱仪40与光学斩波器7同步工作,以达更佳效果。另外,所述光学斩波器7位于第三分束器3与第四分束器4之间。在此省却了一台光谱仪,而同一光谱仪40对所接收到的不同光谱干涉环引入的噪声特性相同,更有利于提升测量精度。Wherein, the spectrometer 40 is only one, and is used to receive the first spectral interference pattern and the second spectral interference pattern in time division. Likewise, the fourth beam splitter is preferably a 50:50 non-polarizing cube beam splitter. It should be understood that the spectrometer 40 works synchronously with the optical chopper 7 to achieve better results. In addition, the optical chopper 7 is located between the third beam splitter 3 and the fourth beam splitter 4 . Here, a spectrometer is omitted, and the noise characteristics introduced by the same spectrometer 40 to different received spectral interference rings are the same, which is more conducive to improving the measurement accuracy.

实施例三Embodiment three

如图5所示,与实施例二不同的是,本实施例提供的光谱相位干涉装置还包括:用于使所述第一和频子脉冲15与第三和频子脉冲17沿原光路返回至所述第三分束器3,从所述第三分束器3透射/反射后叠加,以产生所述第一光谱干涉图样的第一反射镜51;用于使所述第二和频子脉冲16与第四和频子脉冲18沿原光路返回至所述第三分束器3,从所述第三分束器3反射/透射后叠加,以产生所述第二光谱干涉图样的第二反射镜52;以及用于使所述第一和频子脉冲15与第三和频子脉冲17、所述第二和频子脉冲16与第四和频子脉冲18分时投射至第一反射镜51、第二反射镜52的光学斩波器7。其中,所述光学斩波器7位于第三分束器3与第一反射镜51、第二反射镜52之间,且相互平行。当然,所述第二波片22和第三波片23均应为四分之一波片。在此省却了实施例二所述的第四分束器,结构简单,成本更低。As shown in Figure 5, different from the second embodiment, the spectral phase interference device provided by this embodiment also includes: for making the first sum-frequency sub-pulse 15 and the third sum-frequency sub-pulse 17 return along the original optical path To the third beam splitter 3, superposed after transmission/reflection from the third beam splitter 3, to generate the first mirror 51 of the first spectral interference pattern; for making the second sum frequency The sub-pulse 16 and the fourth sum-frequency sub-pulse 18 return to the third beam splitter 3 along the original optical path, and are superimposed after reflection/transmission from the third beam splitter 3 to generate the second spectral interference pattern The second reflecting mirror 52; and for making the first sum-frequency sub-pulse 15 and the third sum-frequency sub-pulse 17, the second sum-frequency sub-pulse 16 and the fourth sum-frequency sub-pulse 18 time-divisionally projected to the first sum-frequency sub-pulse 15 An optical chopper 7 for a mirror 51 and a second mirror 52. Wherein, the optical chopper 7 is located between the third beam splitter 3 and the first reflector 51 and the second reflector 52, and is parallel to each other. Of course, both the second wave plate 22 and the third wave plate 23 should be quarter wave plates. Here, the fourth beam splitter described in the second embodiment is omitted, and the structure is simple and the cost is lower.

以上所述仅为本发明的较佳实施例而已,并不用于限制本发明,凡在本发明的精神和原则之内所作的任何修改、等同替换和改进等,均应包含在本发明的保护范围之内。The above descriptions are only preferred embodiments of the present invention, and are not intended to limit the present invention. Any modifications, equivalent replacements and improvements made within the spirit and principles of the present invention should be included in the protection of the present invention. within range.

Claims (10)

1. a spectrum phase interference device, is characterized in that, comprising:
For obtaining chirped pulse and identical the first subpulse to be measured of characteristic and the second subpulse to be measured, and make described chirped pulse act on the first subpulse to be measured and the second subpulse to be measured respectively, with produce first and frequently pulse and second and pulse frequently with frequency crystal;
For described first and frequently pulse are divided into first and frequently subpulse and second and frequently subpulse, described second and pulse be frequently divided into the 3rd and subpulse and the 4th and the 3rd beam splitter of subpulse frequently frequently;
Superpose with the 3rd and frequency subpulse, to produce the first-phase moving mechanism of the first spectral interference pattern with frequency subpulse for making described first;
Superpose with the 4th and frequency subpulse, to produce the second-phase moving mechanism of the second spectral interference pattern with frequency subpulse for making described second;
For obtaining the spectrometer of described first spectral interference pattern and the second spectral interference pattern; And
For processing described first spectral interference pattern and the second spectral interference pattern, to obtain the processor of the characteristic of described first subpulse to be measured or the second subpulse to be measured;
Wherein, described first-phase moving mechanism and second-phase moving mechanism have respectively and make first and frequently subpulse and second and subpulse or make the 3rd and subpulse and the 4th and frequently produce the second wave plate and the 3rd wave plate of π or-π phase shift between subpulse frequently frequently.
2. spectrum phase interference device as claimed in claim 1, it is characterized in that, described spectrum phase interference device also comprises:
For receiving pulse to be measured and making it to be divided into the first beam splitter of reflected impulse and transmitted pulse;
For carrying out broadening to described transmitted pulse and making it to become the dispersor of chirped pulse;
For described reflected impulse being divided into the second beam splitter of the first subpulse to be measured and the second subpulse to be measured; And
For adjusting the first wave plate of described chirped pulse polarization direction.
3. spectrum phase interference device as claimed in claim 2, it is characterized in that, when described pulse to be measured is single pulse, described first wave plate, the second wave plate and the 3rd wave plate are half-wave plate; Described spectrometer is two, and its model, specification are all identical, is respectively used to receive described first spectral interference pattern and the second spectral interference pattern.
4. spectrum phase interference device as claimed in claim 2, it is characterized in that, when described pulse to be measured is multiple pulses, described spectrum phase interference device also comprises:
For making described first and frequently subpulse and the 3rd and subpulse transmission/reflection simultaneously frequently, then superpose and produces described first spectral interference pattern, described second and frequency subpulse and the 4th with reflection/transmission while of frequency subpulse, then superpose the 4th beam splitter producing described second spectral interference pattern; And
For make described first and frequently subpulse with the 3rd and frequently subpulse, described second and frequently subpulse and the 4th and the timesharing of frequency subpulse enter the optical chopper of described 4th beam splitter;
Wherein said spectrometer is only one, receives described first spectral interference pattern and the second spectral interference pattern for timesharing; Described optical chopper is between the 3rd beam splitter and the 4th beam splitter; Described first wave plate, the second wave plate and the 3rd wave plate are half-wave plate.
5. spectrum phase interference device as claimed in claim 4, it is characterized in that, described 3rd beam splitter and the 4th beam splitter are the unpolarized cube splitter of 50:50.
6. spectrum phase interference device as claimed in claim 2, it is characterized in that, when described pulse to be measured is multiple pulses, described spectrum phase interference device also comprises:
For making described first to be back to described three beam splitter with frequency subpulse along original optical path with frequency subpulse and the 3rd, superpose after described 3rd beam splitter transmission/reflection, to produce the first catoptron of described first spectral interference pattern;
For making described second to be back to described three beam splitter with frequency subpulse along original optical path with frequency subpulse and the 4th, superpose after described three beam splitter reflection/transmission, to produce the second catoptron of described second spectral interference pattern;
For make described first and frequently subpulse with the 3rd and frequently subpulse, described second and frequently subpulse and the 4th and the timesharing of frequency subpulse be projected to the optical chopper of the first catoptron, the second catoptron;
Wherein, described spectrometer is only one, receives described first spectral interference pattern and the second spectral interference pattern for timesharing; Described optical chopper is between the 3rd beam splitter and first, second catoptron, and described first wave plate is half-wave plate, and the second wave plate and the 3rd wave plate are quarter-wave plate.
7. the spectrum phase interference device according to any one of claim 1 ~ 6, is characterized in that, described spectrum phase interference device comprises further:
For regulating the first pulse delay unit of the relative time-delay between described first subpulse to be measured and the second subpulse to be measured; And
For regulating described first and frequently pulse and second and the second pulse delay unit of the interpulse relative time-delay of frequency.
8. spectrum phase interference device as claimed in claim 7, it is characterized in that, when described pulse to be measured is the ultrashort pulse of photoperiod magnitude, described second beam splitter is polarization-independent non-dispersive beam splitter, it is the girdle prism such as grade that base angle is less than 10 °, in two waist planes platings, 0 degree of width high-reflecting film; Described reflected impulse is projected to two waist planes perpendicular to waiting bottom surface of girdle prism, carries out beam splitting with this.
9. spectrum phase interference device as claimed in claim 7, is characterized in that, being incident to chirped pulse that is described and crystal frequently is e light, and described first subpulse to be measured and the second subpulse to be measured are o light;
If is o light through described second wave plate with frequency subpulse, then make to be e light through described 3rd wave plate with frequency subpulse; If or be e light through described second wave plate with frequency subpulse, then make to be o light through described 3rd wave plate with frequency subpulse.
10. one kind adopts the direct reconfiguration system of ultrashort light pulse electric field of the spectrum phase interference device according to any one of claim 1 ~ 9.
CN201310244775.9A 2013-06-19 2013-06-19 Spectrum phase interference device and ultrashort light pulse electric field direct reconstruction system Expired - Fee Related CN104236726B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201310244775.9A CN104236726B (en) 2013-06-19 2013-06-19 Spectrum phase interference device and ultrashort light pulse electric field direct reconstruction system

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201310244775.9A CN104236726B (en) 2013-06-19 2013-06-19 Spectrum phase interference device and ultrashort light pulse electric field direct reconstruction system

Publications (2)

Publication Number Publication Date
CN104236726A true CN104236726A (en) 2014-12-24
CN104236726B CN104236726B (en) 2017-04-19

Family

ID=52225253

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201310244775.9A Expired - Fee Related CN104236726B (en) 2013-06-19 2013-06-19 Spectrum phase interference device and ultrashort light pulse electric field direct reconstruction system

Country Status (1)

Country Link
CN (1) CN104236726B (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106441583A (en) * 2016-12-02 2017-02-22 深圳大学 Spectral phase interference device and spectral interferometry system for reconstruction of ultrafast optical field
CN107036714A (en) * 2017-04-25 2017-08-11 深圳大学 A kind of spectrum phase interference apparatus and system
CN110567595A (en) * 2019-09-11 2019-12-13 华东师范大学重庆研究院 A method and system for real-time measurement of transient ultrashort pulse time width
CN110715734A (en) * 2019-11-20 2020-01-21 深圳大学 Single-shot measurement device and method for terahertz polarization information and waveform in time domain

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6611336B1 (en) * 1997-08-01 2003-08-26 The University Of Rochester Pulse measurement using frequency shifting techniques
US20050179905A1 (en) * 2004-02-17 2005-08-18 Aisin Seiki Kabushiki Kaisha Multi-channeled measuring method and apparatus for measuring spectrum of terahertz pulse
CN1936523A (en) * 2006-09-29 2007-03-28 华东师范大学 Super-short light impulse measuring apparatus based on SPIDER technology
CN101294850A (en) * 2007-04-23 2008-10-29 中山大学 A new method and device for measuring the spectral phase of ultrashort optical pulses
CN203432688U (en) * 2013-06-19 2014-02-12 深圳大学 Spectral phase interference device and ultra-short optical pulse electric field direct reconstruction system

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6611336B1 (en) * 1997-08-01 2003-08-26 The University Of Rochester Pulse measurement using frequency shifting techniques
US20050179905A1 (en) * 2004-02-17 2005-08-18 Aisin Seiki Kabushiki Kaisha Multi-channeled measuring method and apparatus for measuring spectrum of terahertz pulse
CN1936523A (en) * 2006-09-29 2007-03-28 华东师范大学 Super-short light impulse measuring apparatus based on SPIDER technology
CN101294850A (en) * 2007-04-23 2008-10-29 中山大学 A new method and device for measuring the spectral phase of ultrashort optical pulses
CN203432688U (en) * 2013-06-19 2014-02-12 深圳大学 Spectral phase interference device and ultra-short optical pulse electric field direct reconstruction system

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
M.E. ANDERSON ET AL.: "SPIDER: A decade of measuring ultrashort pulses", 《LASER PHYSICS LETTERS》 *

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106441583A (en) * 2016-12-02 2017-02-22 深圳大学 Spectral phase interference device and spectral interferometry system for reconstruction of ultrafast optical field
CN107036714A (en) * 2017-04-25 2017-08-11 深圳大学 A kind of spectrum phase interference apparatus and system
WO2018196104A1 (en) * 2017-04-25 2018-11-01 深圳大学 Spectral phase interference apparatus and system
CN107036714B (en) * 2017-04-25 2019-02-12 深圳大学 A spectral phase interference device and system
US11029209B2 (en) 2017-04-25 2021-06-08 Shenzhen University Spectral phase interference device and system
CN110567595A (en) * 2019-09-11 2019-12-13 华东师范大学重庆研究院 A method and system for real-time measurement of transient ultrashort pulse time width
CN110715734A (en) * 2019-11-20 2020-01-21 深圳大学 Single-shot measurement device and method for terahertz polarization information and waveform in time domain

Also Published As

Publication number Publication date
CN104236726B (en) 2017-04-19

Similar Documents

Publication Publication Date Title
CN103412299B (en) Femtosecond laser absolute distance measuring device and method based on non-linear optical sampling
CN102636272B (en) Femtosecond laser pulse measurement method based on transient grating effect and device
CN104897270B (en) Michelson heterodyne laser vialog based on monophone light modulation and polarization spectro
CN106289499B (en) A kind of micrometer vibrational system and micrometer method for oscillating using femtosecond laser
CN108007572B (en) A Rotational Disturbance Measurement System Based on Vortex Beam and Sagerach Interferometer
CN106441583B (en) Spectrum phase interference device and the spectral interference measuring system for rebuilding ultrafast light field
CN106289527B (en) A kind of Hyperspectral imaging devices and its imaging method based on polarization interference
JP6397318B2 (en) Electric field vector detection method and electric field vector detection device
CN104697649B (en) Single-shot laser pulse detection device
CN101294850A (en) A new method and device for measuring the spectral phase of ultrashort optical pulses
CN109238153B (en) Dual-optical-frequency comb thickness measuring optical path structure, system, method, device and storage medium
CN100451582C (en) Femtosecond pulse simple real-time measuring instrument
CN103245423B (en) Light path polarized point diffraction movable phase interfere Wavefront sensor altogether
CN103063315B (en) Single signal-to-noise ratio measuring method and device based on chirp pulse characteristics
CN106338333A (en) High-robustness homodyne laser vibration measurer based on wave plate yawing and four-step adjustment method thereof
CN104897273A (en) Quadrature error-free single-path circular polarization interference and double-Wollaston prism light-splitting type homodyne laser vibration meter
CN104236726B (en) Spectrum phase interference device and ultrashort light pulse electric field direct reconstruction system
CN104931124B (en) Based on dual-acousto-optic modulation and the Michelson heterodyne laser vialog of polarization spectro
CN106248195A (en) The high robust homodyne laser vibration measurer of additional phase shift compensation and four steppings
CN104457559B (en) Synchronous phase shift point diffraction interference detection method based on reflecting grating
CN100432643C (en) Femtosecond laser camera
CN101498589A (en) Method and apparatus for doubling optical length twice in optical measurement
CN203432688U (en) Spectral phase interference device and ultra-short optical pulse electric field direct reconstruction system
CN108318143B (en) Measurement System of Carrier Envelope Phase of Ultrashort Optical Pulse with High Repetition Rate
CN201251428Y (en) Synchronous phase-shifting fizeau interferometer

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20170419

Termination date: 20190619