CA2031733A1 - Method for forming probe and apparatus therefor - Google Patents
Method for forming probe and apparatus thereforInfo
- Publication number
- CA2031733A1 CA2031733A1 CA 2031733 CA2031733A CA2031733A1 CA 2031733 A1 CA2031733 A1 CA 2031733A1 CA 2031733 CA2031733 CA 2031733 CA 2031733 A CA2031733 A CA 2031733A CA 2031733 A1 CA2031733 A1 CA 2031733A1
- Authority
- CA
- Canada
- Prior art keywords
- probe
- end portion
- electrode
- forming part
- apparatus therefor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
Abstract
A probe for use in an apparatus for effecting information reading and/or information input on an information carrier member by closely positioning the probe thereto is formed by the following manner. An electrode is placed to a portion of the probe where the end portion is to be formed. Distance information between the end portion forming part of the probe and the electrode is detected. The relative position of the end portion forming part of the probe to the electrode is controlled on the basis of the detection result.
A voltage is applied to the end portion forming part of the probe through the electrode under the relative position control, thereby forming the end portion of the probe.
A voltage is applied to the end portion forming part of the probe through the electrode under the relative position control, thereby forming the end portion of the probe.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1-317468 | 1989-12-08 | ||
| JP31746889A JP2789244B2 (en) | 1989-12-08 | 1989-12-08 | Method of forming microprobe |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CA2031733A1 true CA2031733A1 (en) | 1991-06-09 |
| CA2031733C CA2031733C (en) | 1994-10-04 |
Family
ID=18088567
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA 2031733 Expired - Lifetime CA2031733C (en) | 1989-12-08 | 1990-12-07 | Method for forming probe and apparatus therefor |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP2789244B2 (en) |
| CA (1) | CA2031733C (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100660189B1 (en) * | 2004-11-12 | 2006-12-21 | 한국과학기술원 | An apparatus to bond a nano-tip using electrochemical etching and method thereof |
| KR100736358B1 (en) * | 2004-11-12 | 2007-07-06 | 재단법인서울대학교산학협력재단 | Method to assemble nanostructures at the end of scanning probe microscope's probe and scanning probe microscope with the probe |
-
1989
- 1989-12-08 JP JP31746889A patent/JP2789244B2/en not_active Expired - Fee Related
-
1990
- 1990-12-07 CA CA 2031733 patent/CA2031733C/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JP2789244B2 (en) | 1998-08-20 |
| JPH03179202A (en) | 1991-08-05 |
| CA2031733C (en) | 1994-10-04 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EEER | Examination request | ||
| MKLA | Lapsed | ||
| MKEC | Expiry (correction) |
Effective date: 20121202 |