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BR112013000904A8 - Projetor de luz e sistema de visão - Google Patents

Projetor de luz e sistema de visão

Info

Publication number
BR112013000904A8
BR112013000904A8 BR112013000904A BR112013000904A BR112013000904A8 BR 112013000904 A8 BR112013000904 A8 BR 112013000904A8 BR 112013000904 A BR112013000904 A BR 112013000904A BR 112013000904 A BR112013000904 A BR 112013000904A BR 112013000904 A8 BR112013000904 A8 BR 112013000904A8
Authority
BR
Brazil
Prior art keywords
light
patterns
light patterns
vision system
stack
Prior art date
Application number
BR112013000904A
Other languages
English (en)
Other versions
BR112013000904A2 (pt
Inventor
Agnes Wilhelmus Schmeitz Harold
Jan De Bruijn Frederik
Original Assignee
Koninklijke Philips Electronics Nv
Koninklijke Philips Nv
Philips Lighting Holding Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics Nv, Koninklijke Philips Nv, Philips Lighting Holding Bv filed Critical Koninklijke Philips Electronics Nv
Publication of BR112013000904A2 publication Critical patent/BR112013000904A2/pt
Publication of BR112013000904A8 publication Critical patent/BR112013000904A8/pt

Links

Classifications

    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F21—LIGHTING
    • F21V—FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR
    • F21V5/00—Refractors for light sources
    • F21V5/002—Refractors for light sources using microoptical elements for redirecting or diffusing light
    • F21V5/004—Refractors for light sources using microoptical elements for redirecting or diffusing light using microlenses
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/14—Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N7/00—Television systems
    • H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Projection Apparatus (AREA)
  • Transforming Electric Information Into Light Information (AREA)
  • Measurement Of Optical Distance (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

PROJETOR DE LUZ E SISTEMA DE VISÃO Um projetor de luz compreende uma pilha de elementos óticos planos em camadas, em que a pilha compreende um grupo (103) e elementos óticos planos (107-111) dispostos para fornecer uma série de padrões de luz. A pilha pode compreender especificamente um grupo de camadas transparentes que possuem padrões opacos de tal forma que a luz que se propaga através das camadas resulte nos padrões de luz. Os padrões de luz atingem um conjunto de microlentes (101) que é disposto para fazer foco dos padrões de luz em diferentes distâncias focais. Em alguns cenários, podem ser utilizados elementos óticos programáveis para gerar os padrões de luz. Um sistema de visão pode determinar características de objetos com base em reflexos dos padrões de luz projetados. A abordagem pode fornecer particularmente um projetor de luz eficiente, mas de baixo custo.
BR112013000904A 2010-07-16 2011-07-12 Projetor de luz e sistema de visão BR112013000904A8 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP10169800 2010-07-16
PCT/IB2011/053098 WO2012007898A1 (en) 2010-07-16 2011-07-12 A light projector and vision system for distance determination

Publications (2)

Publication Number Publication Date
BR112013000904A2 BR112013000904A2 (pt) 2017-10-31
BR112013000904A8 true BR112013000904A8 (pt) 2018-02-06

Family

ID=44630369

Family Applications (1)

Application Number Title Priority Date Filing Date
BR112013000904A BR112013000904A8 (pt) 2010-07-16 2011-07-12 Projetor de luz e sistema de visão

Country Status (7)

Country Link
US (1) US20130113927A1 (pt)
EP (1) EP2593748A1 (pt)
JP (1) JP6230911B2 (pt)
CN (1) CN102985786A (pt)
BR (1) BR112013000904A8 (pt)
RU (1) RU2608690C2 (pt)
WO (1) WO2012007898A1 (pt)

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* Cited by examiner, † Cited by third party
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DE102012215408A1 (de) * 2012-08-30 2014-03-06 Robert Bosch Gmbh Vorrichtung zur Fahrzeugvermessung
CN104515035A (zh) * 2013-09-29 2015-04-15 深圳市海洋王照明工程有限公司 边界投射模块及灯具
JP6386194B2 (ja) * 2015-03-22 2018-09-05 フェイスブック，インク． ステレオカメラと構造化光とを使用したヘッドマウントディスプレイでの深度マッピング
US10760762B2 (en) 2015-05-22 2020-09-01 Flex-N-Gate Advanced Product Development, Llc Lit image projection lamp and assemblies and methods to use the same to generate three-dimensional images
US10317667B2 (en) * 2015-07-04 2019-06-11 The Regents Of The University Of California Compressive plenoptic microscopy for functional brain imaging
CN117028910A (zh) * 2016-06-10 2023-11-10 奇跃公司 纹理投射灯泡的积分点光源
JP6851029B2 (ja) * 2017-03-09 2021-03-31 パナソニックＩｐマネジメント株式会社 投射光源装置
KR102444288B1 (ko) * 2017-11-08 2022-09-16 삼성전자주식회사 메타 렌즈를 포함하는 프로젝터
US11373321B2 (en) 2017-11-08 2022-06-28 Samsung Electronics Co., Ltd. Projector including meta-lens
CN112729226A (zh) * 2020-12-28 2021-04-30 深圳市朝华彩晶科技有限公司 一种光学透镜及利用该透镜测距的测距方法
JP2023019651A (ja) * 2021-07-29 2023-02-09 ミツミ電機株式会社 投影デバイスおよび測距システム

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US5737084A (en) * 1995-09-29 1998-04-07 Takaoka Electric Mtg. Co., Ltd. Three-dimensional shape measuring apparatus
DE19732376C1 (de) * 1997-07-25 1999-02-18 Fraunhofer Ges Forschung Verfahren und Vorrichtung zur Abstandsmessung nach dem Triangulationsprinzip
EP0939294B1 (en) * 1998-02-26 2004-06-09 Agilent Technologies, Inc. (a Delaware corporation) Determining topographical values
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JP2004012791A (ja) 2002-06-06 2004-01-15 Nikon Corp 補助光投影装置
US6868231B2 (en) * 2002-06-12 2005-03-15 Eastman Kodak Company Imaging using silver halide films with micro-lens capture and optical reconstruction
GB2395289A (en) * 2002-11-11 2004-05-19 Qinetiq Ltd Structured light generator
US6801719B1 (en) * 2003-03-14 2004-10-05 Eastman Kodak Company Camera using beam splitter with micro-lens image amplification
US7227692B2 (en) * 2003-10-09 2007-06-05 Micron Technology, Inc Method and apparatus for balancing color response of imagers
US7333267B2 (en) * 2003-11-26 2008-02-19 Micron Technology, Inc. Micro-lenses for CMOS imagers
US7504613B2 (en) * 2004-03-25 2009-03-17 The Board Of Trustees Of The Leland Stanford Junior University Optical imaging system having an illumination source between object and image
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DE102005043064B4 (de) * 2005-09-06 2010-07-01 Siemens Ag Verfahren zum Messen des Abstandes eines Objektes
WO2007063306A2 (en) * 2005-12-02 2007-06-07 Spiral Scratch Limited Virtual computer interface
DE102006005000B4 (de) * 2006-02-01 2016-05-04 Ovd Kinegram Ag Mehrschichtkörper mit Mikrolinsen-Anordnung
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JP2007298762A (ja) * 2006-04-28 2007-11-15 Casio Comput Co Ltd 表示装置
US8243127B2 (en) * 2006-10-27 2012-08-14 Zecotek Display Systems Pte. Ltd. Switchable optical imaging system and related 3D/2D image switchable apparatus
JP5034556B2 (ja) * 2007-02-27 2012-09-26 株式会社ニコン 焦点検出装置および撮像装置
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JP4538766B2 (ja) * 2008-08-21 2010-09-08 ソニー株式会社 撮像装置、表示装置および画像処理装置
JP5224046B2 (ja) * 2008-09-08 2013-07-03 ソニー株式会社 画像処理装置、撮像装置および表示装置
JP2010217360A (ja) * 2009-03-16 2010-09-30 Seiko Epson Corp プロジェクター
JP6149339B2 (ja) * 2010-06-16 2017-06-21 株式会社ニコン 表示装置

Also Published As

Publication number Publication date
EP2593748A1 (en) 2013-05-22
JP2013534635A (ja) 2013-09-05
WO2012007898A1 (en) 2012-01-19
CN102985786A (zh) 2013-03-20
US20130113927A1 (en) 2013-05-09
JP6230911B2 (ja) 2017-11-15
BR112013000904A2 (pt) 2017-10-31
RU2608690C2 (ru) 2017-01-23
RU2013106906A (ru) 2014-08-27

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Legal Events

Date Code Title Description
B25D Requested change of name of applicant approved

Owner name: KONINKLIJKE PHILIPS N.V. (NL)

B25G Requested change of headquarter approved

Owner name: KONINKLIJKE PHILIPS N.V. (NL)

B25A Requested transfer of rights approved

Owner name: PHILIPS LIGHTING HOLDING B.V (NL)

B06F Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette]
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE A 8A ANUIDADE.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2522 DE 07-05-2019 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.