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AU6848200A - Method and device for individually determining the ageing condition of a capacitor - Google Patents

Method and device for individually determining the ageing condition of a capacitor

Info

Publication number
AU6848200A
AU6848200A AU68482/00A AU6848200A AU6848200A AU 6848200 A AU6848200 A AU 6848200A AU 68482/00 A AU68482/00 A AU 68482/00A AU 6848200 A AU6848200 A AU 6848200A AU 6848200 A AU6848200 A AU 6848200A
Authority
AU
Australia
Prior art keywords
capacitor
determining
value
equivalent
temperature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU68482/00A
Inventor
Guy Grellet
Frederic Perisse
Gerard Rojat
Pascal Venet
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Universite Claude Bernard Lyon 1 UCBL
Original Assignee
Universite Claude Bernard Lyon 1 UCBL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Universite Claude Bernard Lyon 1 UCBL filed Critical Universite Claude Bernard Lyon 1 UCBL
Publication of AU6848200A publication Critical patent/AU6848200A/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/64—Testing of capacitors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/40—Testing power supplies

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)

Abstract

The invention concerns a device for determining the ageing condition of a capacitor (2) comprising: means (4) for determining ripple voltage; means (5) for determining the current flowing in the capacitor, means for determining the value of the equivalent series resistance of the operating conditions of the capacitor (2) by calculating the measured ratio of the ripple voltage values over the measured current, means for measuring (9) the capacitor temperature (2), means (11) for determining the measured temperature, and using a law providing variations of the equivalent series resistance based on the temperature, the value of the so-called theoretical equivalent series resistance corresponding to a capacitor in good working condition, and means (12) for comparing the value of the equivalent resistance series of the operating conditions with the value of the theoretical equivalent resistance series enabling to determine the ageing condition of the capacitor.
AU68482/00A 1999-08-04 2000-08-02 Method and device for individually determining the ageing condition of a capacitor Abandoned AU6848200A (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
FR9910292 1999-08-04
FR9910292A FR2797345B1 (en) 1999-08-04 1999-08-04 METHOD AND DEVICE FOR INDIVIDUALLY DETERMINING THE AGING CONDITION OF A CAPACITOR
PCT/FR2000/002215 WO2001011377A1 (en) 1999-08-04 2000-08-02 Method and device for individually determining the ageing condition of a capacitor

Publications (1)

Publication Number Publication Date
AU6848200A true AU6848200A (en) 2001-03-05

Family

ID=9548997

Family Applications (1)

Application Number Title Priority Date Filing Date
AU68482/00A Abandoned AU6848200A (en) 1999-08-04 2000-08-02 Method and device for individually determining the ageing condition of a capacitor

Country Status (6)

Country Link
EP (1) EP1198715B1 (en)
AT (1) ATE241145T1 (en)
AU (1) AU6848200A (en)
DE (1) DE60002882D1 (en)
FR (1) FR2797345B1 (en)
WO (1) WO2001011377A1 (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7212011B2 (en) * 2004-06-30 2007-05-01 Matsushita Electrid Industrial Co. Ltd. Capacitor deterioration judgment method
US7499817B2 (en) 2005-09-27 2009-03-03 Medtronic, Inc. Determination of equivalent series resistance
US7538563B2 (en) 2005-09-27 2009-05-26 Medtronic, Inc. Determination of equivalent series resistance
FR2923020B1 (en) * 2007-10-30 2009-11-13 Mge Ups Systems METHOD AND DEVICE FOR PREDICTING ELECTROLYTIC CAPACITOR FAILURES, CONVERTER AND NON-INTERRUPTION POWER EQUIPPED WITH SUCH A DEVICE
AT510380B1 (en) * 2010-09-09 2012-11-15 Univ Wien Tech DEVICE FOR MEASURING CURRENTS IN POWER CAPACITORS
CN103033697B (en) * 2012-09-06 2015-07-08 漆良波 Capacitor aging test circuit and aging system
CN105372524B (en) * 2015-11-04 2018-03-16 南通新三能电子有限公司 A kind of aging method of large-scale welding needle type capacitor
CN107797001B (en) * 2016-08-30 2019-01-01 北京金风科创风电设备有限公司 Detection method, device and the wind power generating set of capacitive faults
CN106569066B (en) * 2016-10-26 2019-06-18 西安华为技术有限公司 A kind of method and device detecting the bus capacitor service life
US11525850B2 (en) * 2019-01-28 2022-12-13 Gentec Inc. Method and apparatus for monitoring capacitor faults in a capacitor bank
WO2020183540A1 (en) * 2019-03-08 2020-09-17 三菱電機株式会社 Control device for air conditioner
CN114325119B (en) * 2021-12-17 2023-09-05 深蓝汽车科技有限公司 New energy automobile high-voltage system capacitance health degree prediction method and system and automobile

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4216424A (en) * 1978-10-30 1980-08-05 Vette Carl W Method and apparatus for testing electrolytic capacitors
JP2960469B2 (en) * 1990-03-19 1999-10-06 株式会社日立製作所 Inverter device
DE69433701T2 (en) * 1993-11-08 2005-03-17 Honda Giken Kogyo K.K. Device for testing the electrical components of an inverter
FR2768228B1 (en) * 1997-09-08 1999-12-03 Univ Claude Bernard Lyon METHOD AND DEVICE FOR DETERMINING THE AGING CONDITION OF A CAPACITOR

Also Published As

Publication number Publication date
EP1198715B1 (en) 2003-05-21
DE60002882D1 (en) 2003-06-26
ATE241145T1 (en) 2003-06-15
FR2797345B1 (en) 2002-03-29
WO2001011377A1 (en) 2001-02-15
FR2797345A1 (en) 2001-02-09
EP1198715A1 (en) 2002-04-24

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase