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AU2862495A - Point-of-use ammonia purification for electronic component m anufacture - Google Patents

Point-of-use ammonia purification for electronic component m anufacture

Info

Publication number
AU2862495A
AU2862495A AU28624/95A AU2862495A AU2862495A AU 2862495 A AU2862495 A AU 2862495A AU 28624/95 A AU28624/95 A AU 28624/95A AU 2862495 A AU2862495 A AU 2862495A AU 2862495 A AU2862495 A AU 2862495A
Authority
AU
Australia
Prior art keywords
anufacture
point
electronic component
use ammonia
ammonia purification
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU28624/95A
Inventor
R. Scot Clark
Joe G. Hoffman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Startec Ventures Inc
Original Assignee
Startec Ventures Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Startec Ventures Inc filed Critical Startec Ventures Inc
Publication of AU2862495A publication Critical patent/AU2862495A/en
Abandoned legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3105After-treatment
    • H01L21/311Etching the insulating layers by chemical or physical means
    • H01L21/31105Etching inorganic layers
    • H01L21/31111Etching inorganic layers by chemical means
    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01CAMMONIA; CYANOGEN; COMPOUNDS THEREOF
    • C01C1/00Ammonia; Compounds thereof
    • C01C1/02Preparation, purification or separation of ammonia
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B01PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
    • B01JCHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
    • B01J39/00Cation exchange; Use of material as cation exchangers; Treatment of material for improving the cation exchange properties
    • B01J39/04Processes using organic exchangers
    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01BNON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
    • C01B15/00Peroxides; Peroxyhydrates; Peroxyacids or salts thereof; Superoxides; Ozonides
    • C01B15/01Hydrogen peroxide
    • C01B15/013Separation; Purification; Concentration
    • C01B15/0135Purification by solid ion-exchangers or solid chelating agents
    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01BNON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
    • C01B7/00Halogens; Halogen acids
    • C01B7/19Fluorine; Hydrogen fluoride
    • C01B7/191Hydrogen fluoride
    • C01B7/195Separation; Purification
    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01BNON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
    • C01B7/00Halogens; Halogen acids
    • C01B7/19Fluorine; Hydrogen fluoride
    • C01B7/191Hydrogen fluoride
    • C01B7/195Separation; Purification
    • C01B7/197Separation; Purification by adsorption
    • C01B7/198Separation; Purification by adsorption by solid ion-exchangers
    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01CAMMONIA; CYANOGEN; COMPOUNDS THEREOF
    • C01C1/00Ammonia; Compounds thereof
    • C01C1/02Preparation, purification or separation of ammonia
    • C01C1/024Purification
    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01CAMMONIA; CYANOGEN; COMPOUNDS THEREOF
    • C01C1/00Ammonia; Compounds thereof
    • C01C1/16Halides of ammonium
    • C01C1/162Ammonium fluoride
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/302Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
    • H01L21/306Chemical or electrical treatment, e.g. electrolytic etching
    • H01L21/30604Chemical etching
    • CCHEMISTRY; METALLURGY
    • C01INORGANIC CHEMISTRY
    • C01PINDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
    • C01P2006/00Physical properties of inorganic compounds
    • C01P2006/80Compositional purity

Landscapes

  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Chemical & Material Sciences (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Analytical Chemistry (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Separation Using Semi-Permeable Membranes (AREA)
  • Weting (AREA)
  • Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
AU28624/95A 1995-06-05 1995-06-05 Point-of-use ammonia purification for electronic component m anufacture Abandoned AU2862495A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US1995/007649 WO1996039358A1 (en) 1995-06-05 1995-06-05 Point-of-use ammonia purification for electronic component manufacture

Publications (1)

Publication Number Publication Date
AU2862495A true AU2862495A (en) 1996-12-24

Family

ID=22249322

Family Applications (2)

Application Number Title Priority Date Filing Date
AU28624/95A Abandoned AU2862495A (en) 1995-06-05 1995-06-05 Point-of-use ammonia purification for electronic component m anufacture
AU60934/96A Abandoned AU6093496A (en) 1995-06-05 1996-06-05 On-site manufacture of ultra-high-purity nitric acid for sem iconductor processing

Family Applications After (1)

Application Number Title Priority Date Filing Date
AU60934/96A Abandoned AU6093496A (en) 1995-06-05 1996-06-05 On-site manufacture of ultra-high-purity nitric acid for sem iconductor processing

Country Status (5)

Country Link
EP (2) EP0830316A1 (en)
JP (2) JPH11506411A (en)
KR (2) KR19990022281A (en)
AU (2) AU2862495A (en)
WO (2) WO1996039358A1 (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7980753B2 (en) 1998-04-16 2011-07-19 Air Liquide Electronics U.S. Lp Systems and methods for managing fluids in a processing environment using a liquid ring pump and reclamation system
US7871249B2 (en) 1998-04-16 2011-01-18 Air Liquide Electronics U.S. Lp Systems and methods for managing fluids using a liquid ring pump
US6224252B1 (en) 1998-07-07 2001-05-01 Air Products And Chemicals, Inc. Chemical generator with controlled mixing and concentration feedback and adjustment
US7091043B2 (en) 1999-12-10 2006-08-15 Showa Denko K.K. Method for measuring water concentration in ammonia
US6576138B2 (en) * 2000-12-14 2003-06-10 Praxair Technology, Inc. Method for purifying semiconductor gases
KR101470311B1 (en) * 2013-07-24 2014-12-08 코아텍주식회사 System for purifying industrial ammonia
CN105786052B (en) 2014-12-16 2020-09-08 艺康美国股份有限公司 Online control and reaction method for pH adjustment
PL233084B1 (en) * 2015-07-14 2019-08-30 Inst Lotnictwa Single-stage method for obtaining HTP ( High Test Peroxide) class hydrogen peroxide for the driving applications and the system for obtaining it
CN105056563B (en) * 2015-08-11 2017-06-16 浙江尚能实业股份有限公司 A kind of nitric acid distillation system and its rectificating method
US20160296902A1 (en) 2016-06-17 2016-10-13 Air Liquide Electronics U.S. Lp Deterministic feedback blender
CN110589784B (en) * 2019-10-08 2021-11-23 中国计量科学研究院 Fine series purification system and purification method for laboratory-grade ultrapure nitric acid
KR102505203B1 (en) 2022-08-01 2023-03-02 제이엔에프주식회사 Ultra high purity nitric acid purification system with excellent nitric acid purification process waste heat recycling and without metal ion elution using reboiler made from tantalum

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3401095A (en) * 1964-07-09 1968-09-10 Gnii Pi Azotnoj Method of purifying nitric acid
US3383173A (en) * 1965-12-30 1968-05-14 Chevron Res Ammonia purification
AT335251B (en) * 1975-03-10 1977-03-10 Ruthner Industrieanlagen Ag METHOD AND DEVICE FOR THE RECOVERY OF NITRIC ACID AND FLUID ACID FROM SOLUTIONS
US5164049A (en) * 1986-10-06 1992-11-17 Athens Corporation Method for making ultrapure sulfuric acid
US4828660A (en) * 1986-10-06 1989-05-09 Athens Corporation Method and apparatus for the continuous on-site chemical reprocessing of ultrapure liquids
US4756899A (en) * 1987-02-12 1988-07-12 Allied-Signal Inc. Manufacture of high purity low arsenic anhydrous hydrogen fluoride
US4929435A (en) * 1987-02-12 1990-05-29 Allied-Signal Inc. Manufacture of high purity low arsenic anhydrous hydrogen fluoride
DD268230A1 (en) * 1987-12-28 1989-05-24 Dresden Komplette Chemieanlag PROCESS FOR CLEANING AMMONIA STEAM
US4952386A (en) * 1988-05-20 1990-08-28 Athens Corporation Method and apparatus for purifying hydrogen fluoride
SU1650579A1 (en) * 1988-07-18 1991-05-23 Ленинградский институт текстильной и легкой промышленности им.С.М.Кирова Method for purifying ammonia gas from oil and mechanical impurities
US4980032A (en) * 1988-08-12 1990-12-25 Alameda Instruments, Inc. Distillation method and apparatus for reprocessing sulfuric acid
US5288333A (en) * 1989-05-06 1994-02-22 Dainippon Screen Mfg. Co., Ltd. Wafer cleaning method and apparatus therefore
US5242468A (en) * 1991-03-19 1993-09-07 Startec Ventures, Inc. Manufacture of high precision electronic components with ultra-high purity liquids
JPH05121390A (en) * 1991-10-29 1993-05-18 Koujiyundo Silicon Kk Removing method for acid
DE4135918A1 (en) * 1991-10-31 1993-05-06 Solvay Fluor Und Derivate Gmbh, 3000 Hannover, De MANUFACTURE OF HIGHLY PURE FLUORED HYDROGEN
US5500098A (en) * 1993-08-05 1996-03-19 Eco-Tec Limited Process for regeneration of volatile acids
US5496778A (en) * 1994-01-07 1996-03-05 Startec Ventures, Inc. Point-of-use ammonia purification for electronic component manufacture

Also Published As

Publication number Publication date
WO1996039358A1 (en) 1996-12-12
JPH11507004A (en) 1999-06-22
EP0835168A4 (en) 1998-08-26
AU6093496A (en) 1996-12-24
KR19990022225A (en) 1999-03-25
EP0830316A1 (en) 1998-03-25
JPH11506411A (en) 1999-06-08
EP0835168A1 (en) 1998-04-15
KR19990022281A (en) 1999-03-25
WO1996039263A1 (en) 1996-12-12

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