AU2862495A - Point-of-use ammonia purification for electronic component m anufacture - Google Patents
Point-of-use ammonia purification for electronic component m anufactureInfo
- Publication number
- AU2862495A AU2862495A AU28624/95A AU2862495A AU2862495A AU 2862495 A AU2862495 A AU 2862495A AU 28624/95 A AU28624/95 A AU 28624/95A AU 2862495 A AU2862495 A AU 2862495A AU 2862495 A AU2862495 A AU 2862495A
- Authority
- AU
- Australia
- Prior art keywords
- anufacture
- point
- electronic component
- use ammonia
- ammonia purification
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 title 2
- 229910021529 ammonia Inorganic materials 0.000 title 1
- 238000000746 purification Methods 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3105—After-treatment
- H01L21/311—Etching the insulating layers by chemical or physical means
- H01L21/31105—Etching inorganic layers
- H01L21/31111—Etching inorganic layers by chemical means
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01C—AMMONIA; CYANOGEN; COMPOUNDS THEREOF
- C01C1/00—Ammonia; Compounds thereof
- C01C1/02—Preparation, purification or separation of ammonia
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01J—CHEMICAL OR PHYSICAL PROCESSES, e.g. CATALYSIS OR COLLOID CHEMISTRY; THEIR RELEVANT APPARATUS
- B01J39/00—Cation exchange; Use of material as cation exchangers; Treatment of material for improving the cation exchange properties
- B01J39/04—Processes using organic exchangers
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B15/00—Peroxides; Peroxyhydrates; Peroxyacids or salts thereof; Superoxides; Ozonides
- C01B15/01—Hydrogen peroxide
- C01B15/013—Separation; Purification; Concentration
- C01B15/0135—Purification by solid ion-exchangers or solid chelating agents
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B7/00—Halogens; Halogen acids
- C01B7/19—Fluorine; Hydrogen fluoride
- C01B7/191—Hydrogen fluoride
- C01B7/195—Separation; Purification
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B7/00—Halogens; Halogen acids
- C01B7/19—Fluorine; Hydrogen fluoride
- C01B7/191—Hydrogen fluoride
- C01B7/195—Separation; Purification
- C01B7/197—Separation; Purification by adsorption
- C01B7/198—Separation; Purification by adsorption by solid ion-exchangers
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01C—AMMONIA; CYANOGEN; COMPOUNDS THEREOF
- C01C1/00—Ammonia; Compounds thereof
- C01C1/02—Preparation, purification or separation of ammonia
- C01C1/024—Purification
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01C—AMMONIA; CYANOGEN; COMPOUNDS THEREOF
- C01C1/00—Ammonia; Compounds thereof
- C01C1/16—Halides of ammonium
- C01C1/162—Ammonium fluoride
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/30604—Chemical etching
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2006/00—Physical properties of inorganic compounds
- C01P2006/80—Compositional purity
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Inorganic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Chemical & Material Sciences (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Analytical Chemistry (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Separation Using Semi-Permeable Membranes (AREA)
- Weting (AREA)
- Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/US1995/007649 WO1996039358A1 (en) | 1995-06-05 | 1995-06-05 | Point-of-use ammonia purification for electronic component manufacture |
Publications (1)
Publication Number | Publication Date |
---|---|
AU2862495A true AU2862495A (en) | 1996-12-24 |
Family
ID=22249322
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU28624/95A Abandoned AU2862495A (en) | 1995-06-05 | 1995-06-05 | Point-of-use ammonia purification for electronic component m anufacture |
AU60934/96A Abandoned AU6093496A (en) | 1995-06-05 | 1996-06-05 | On-site manufacture of ultra-high-purity nitric acid for sem iconductor processing |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AU60934/96A Abandoned AU6093496A (en) | 1995-06-05 | 1996-06-05 | On-site manufacture of ultra-high-purity nitric acid for sem iconductor processing |
Country Status (5)
Country | Link |
---|---|
EP (2) | EP0830316A1 (en) |
JP (2) | JPH11506411A (en) |
KR (2) | KR19990022281A (en) |
AU (2) | AU2862495A (en) |
WO (2) | WO1996039358A1 (en) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7980753B2 (en) | 1998-04-16 | 2011-07-19 | Air Liquide Electronics U.S. Lp | Systems and methods for managing fluids in a processing environment using a liquid ring pump and reclamation system |
US7871249B2 (en) | 1998-04-16 | 2011-01-18 | Air Liquide Electronics U.S. Lp | Systems and methods for managing fluids using a liquid ring pump |
US6224252B1 (en) | 1998-07-07 | 2001-05-01 | Air Products And Chemicals, Inc. | Chemical generator with controlled mixing and concentration feedback and adjustment |
US7091043B2 (en) | 1999-12-10 | 2006-08-15 | Showa Denko K.K. | Method for measuring water concentration in ammonia |
US6576138B2 (en) * | 2000-12-14 | 2003-06-10 | Praxair Technology, Inc. | Method for purifying semiconductor gases |
KR101470311B1 (en) * | 2013-07-24 | 2014-12-08 | 코아텍주식회사 | System for purifying industrial ammonia |
CN105786052B (en) | 2014-12-16 | 2020-09-08 | 艺康美国股份有限公司 | Online control and reaction method for pH adjustment |
PL233084B1 (en) * | 2015-07-14 | 2019-08-30 | Inst Lotnictwa | Single-stage method for obtaining HTP ( High Test Peroxide) class hydrogen peroxide for the driving applications and the system for obtaining it |
CN105056563B (en) * | 2015-08-11 | 2017-06-16 | 浙江尚能实业股份有限公司 | A kind of nitric acid distillation system and its rectificating method |
US20160296902A1 (en) | 2016-06-17 | 2016-10-13 | Air Liquide Electronics U.S. Lp | Deterministic feedback blender |
CN110589784B (en) * | 2019-10-08 | 2021-11-23 | 中国计量科学研究院 | Fine series purification system and purification method for laboratory-grade ultrapure nitric acid |
KR102505203B1 (en) | 2022-08-01 | 2023-03-02 | 제이엔에프주식회사 | Ultra high purity nitric acid purification system with excellent nitric acid purification process waste heat recycling and without metal ion elution using reboiler made from tantalum |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3401095A (en) * | 1964-07-09 | 1968-09-10 | Gnii Pi Azotnoj | Method of purifying nitric acid |
US3383173A (en) * | 1965-12-30 | 1968-05-14 | Chevron Res | Ammonia purification |
AT335251B (en) * | 1975-03-10 | 1977-03-10 | Ruthner Industrieanlagen Ag | METHOD AND DEVICE FOR THE RECOVERY OF NITRIC ACID AND FLUID ACID FROM SOLUTIONS |
US5164049A (en) * | 1986-10-06 | 1992-11-17 | Athens Corporation | Method for making ultrapure sulfuric acid |
US4828660A (en) * | 1986-10-06 | 1989-05-09 | Athens Corporation | Method and apparatus for the continuous on-site chemical reprocessing of ultrapure liquids |
US4756899A (en) * | 1987-02-12 | 1988-07-12 | Allied-Signal Inc. | Manufacture of high purity low arsenic anhydrous hydrogen fluoride |
US4929435A (en) * | 1987-02-12 | 1990-05-29 | Allied-Signal Inc. | Manufacture of high purity low arsenic anhydrous hydrogen fluoride |
DD268230A1 (en) * | 1987-12-28 | 1989-05-24 | Dresden Komplette Chemieanlag | PROCESS FOR CLEANING AMMONIA STEAM |
US4952386A (en) * | 1988-05-20 | 1990-08-28 | Athens Corporation | Method and apparatus for purifying hydrogen fluoride |
SU1650579A1 (en) * | 1988-07-18 | 1991-05-23 | Ленинградский институт текстильной и легкой промышленности им.С.М.Кирова | Method for purifying ammonia gas from oil and mechanical impurities |
US4980032A (en) * | 1988-08-12 | 1990-12-25 | Alameda Instruments, Inc. | Distillation method and apparatus for reprocessing sulfuric acid |
US5288333A (en) * | 1989-05-06 | 1994-02-22 | Dainippon Screen Mfg. Co., Ltd. | Wafer cleaning method and apparatus therefore |
US5242468A (en) * | 1991-03-19 | 1993-09-07 | Startec Ventures, Inc. | Manufacture of high precision electronic components with ultra-high purity liquids |
JPH05121390A (en) * | 1991-10-29 | 1993-05-18 | Koujiyundo Silicon Kk | Removing method for acid |
DE4135918A1 (en) * | 1991-10-31 | 1993-05-06 | Solvay Fluor Und Derivate Gmbh, 3000 Hannover, De | MANUFACTURE OF HIGHLY PURE FLUORED HYDROGEN |
US5500098A (en) * | 1993-08-05 | 1996-03-19 | Eco-Tec Limited | Process for regeneration of volatile acids |
US5496778A (en) * | 1994-01-07 | 1996-03-05 | Startec Ventures, Inc. | Point-of-use ammonia purification for electronic component manufacture |
-
1995
- 1995-06-05 KR KR1019970708760A patent/KR19990022281A/en active IP Right Grant
- 1995-06-05 EP EP95923915A patent/EP0830316A1/en not_active Withdrawn
- 1995-06-05 JP JP9500388A patent/JPH11506411A/en active Pending
- 1995-06-05 WO PCT/US1995/007649 patent/WO1996039358A1/en active IP Right Grant
- 1995-06-05 AU AU28624/95A patent/AU2862495A/en not_active Abandoned
-
1996
- 1996-06-05 KR KR1019970708704A patent/KR19990022225A/en active IP Right Grant
- 1996-06-05 WO PCT/US1996/009215 patent/WO1996039263A1/en active IP Right Grant
- 1996-06-05 AU AU60934/96A patent/AU6093496A/en not_active Abandoned
- 1996-06-05 JP JP9501593A patent/JPH11507004A/en active Pending
- 1996-06-05 EP EP96918226A patent/EP0835168A4/en not_active Withdrawn
Also Published As
Publication number | Publication date |
---|---|
WO1996039358A1 (en) | 1996-12-12 |
JPH11507004A (en) | 1999-06-22 |
EP0835168A4 (en) | 1998-08-26 |
AU6093496A (en) | 1996-12-24 |
KR19990022225A (en) | 1999-03-25 |
EP0830316A1 (en) | 1998-03-25 |
JPH11506411A (en) | 1999-06-08 |
EP0835168A1 (en) | 1998-04-15 |
KR19990022281A (en) | 1999-03-25 |
WO1996039263A1 (en) | 1996-12-12 |
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