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AU2001275007A1 - Methods of testing materials - Google Patents

Methods of testing materials

Info

Publication number
AU2001275007A1
AU2001275007A1 AU2001275007A AU7500701A AU2001275007A1 AU 2001275007 A1 AU2001275007 A1 AU 2001275007A1 AU 2001275007 A AU2001275007 A AU 2001275007A AU 7500701 A AU7500701 A AU 7500701A AU 2001275007 A1 AU2001275007 A1 AU 2001275007A1
Authority
AU
Australia
Prior art keywords
methods
testing materials
testing
materials
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001275007A
Inventor
Ronald H. Fleming
Russell B. Gore
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Honeywell International Inc
Original Assignee
Honeywell International Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell International Inc filed Critical Honeywell International Inc
Publication of AU2001275007A1 publication Critical patent/AU2001275007A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4445—Classification of defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/11—Analysing solids by measuring attenuation of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/26—Arrangements for orientation or scanning by relative movement of the head and the sensor
    • G01N29/265—Arrangements for orientation or scanning by relative movement of the head and the sensor by moving the sensor relative to a stationary material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/30—Arrangements for calibrating or comparing, e.g. with standard objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/01—Indexing codes associated with the measuring variable
    • G01N2291/012—Phase angle
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/01—Indexing codes associated with the measuring variable
    • G01N2291/015—Attenuation, scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/028—Material parameters
    • G01N2291/02854—Length, thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/26—Scanned objects
    • G01N2291/263—Surfaces
    • G01N2291/2632—Surfaces flat
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/26—Scanned objects
    • G01N2291/269—Various geometry objects
    • G01N2291/2698—Other discrete objects, e.g. bricks

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Acoustics & Sound (AREA)
  • Engineering & Computer Science (AREA)
  • Signal Processing (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Physical Vapour Deposition (AREA)
AU2001275007A 2000-05-31 2001-05-29 Methods of testing materials Abandoned AU2001275007A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/585,242 US6439054B1 (en) 2000-05-31 2000-05-31 Methods of testing sputtering target materials
US09585242 2000-05-31
PCT/US2001/017342 WO2001092868A2 (en) 2000-05-31 2001-05-29 Methods of testing materials

Publications (1)

Publication Number Publication Date
AU2001275007A1 true AU2001275007A1 (en) 2001-12-11

Family

ID=24340632

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001275007A Abandoned AU2001275007A1 (en) 2000-05-31 2001-05-29 Methods of testing materials

Country Status (4)

Country Link
US (1) US6439054B1 (en)
AU (1) AU2001275007A1 (en)
TW (1) TW511205B (en)
WO (1) WO2001092868A2 (en)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4284762B2 (en) * 1999-07-14 2009-06-24 日本精工株式会社 Evaluation method of sliding member for highly reliable toroidal continuously variable transmission
JP3652943B2 (en) * 1999-11-29 2005-05-25 三菱重工業株式会社 Metal material damage evaluation method and apparatus
US20020184970A1 (en) * 2001-12-13 2002-12-12 Wickersham Charles E. Sptutter targets and methods of manufacturing same to reduce particulate emission during sputtering
KR100783304B1 (en) * 2000-05-11 2007-12-10 토소우 에스엠디, 인크 Method and apparatus for non-destructive cleanliness evaluation in sputter targets using sound wave phase change detection
JP4303970B2 (en) * 2001-04-04 2009-07-29 トーソー エスエムディー，インク． Method for determining the critical dimension of aluminum oxide inclusions in an aluminum sputtering target or aluminum alloy sputtering target
US7334479B2 (en) * 2003-04-24 2008-02-26 Tosoh Smd, Inc. Systems and methods for non-contact measuring sputtering target thickness ultrasonics
US20050247894A1 (en) 2004-05-05 2005-11-10 Watkins Charles M Systems and methods for forming apertures in microfeature workpieces
US7237438B1 (en) * 2005-03-16 2007-07-03 United Technologies Corporation Systems and methods for determining the velocity of ultrasonic surface skimming longitudinal waves on various materials
DE102006032431B4 (en) * 2006-06-22 2011-12-01 Siltronic Ag Method and device for detecting mechanical defects in a rod made of semiconductor material
SG138524A1 (en) * 2006-06-22 2008-01-28 Siltronic Ag Method and apparatus for detection of mechanical defects in an ingot piece composed of semiconductor material
DE102006040486A1 (en) * 2006-08-30 2008-03-13 Wacker Chemie Ag Non-destructive testing of high purity polycrystalline silicon
US7849747B2 (en) * 2008-03-07 2010-12-14 Umicore Ag & Co. Kg Flaw detection in exhaust system ceramic monoliths
CN102393420A (en) * 2011-10-25 2012-03-28 宁波江丰电子材料有限公司 Detection method of copper target compact and forming method of copper target component
DE102013207919A1 (en) * 2013-04-30 2014-10-30 United NDT GmbH Method and device for checking the authenticity of precious metal moldings
FR3044131B1 (en) * 2015-11-23 2020-02-21 Airbus Group Sas DEVICE AND METHOD FOR AUTOMATIC CALCULATION OF TCG CURVE
JP6263665B1 (en) * 2017-01-24 2018-01-17 住友化学株式会社 Pseudo-defect sample and manufacturing method thereof, adjustment method of ultrasonic flaw detection measurement conditions, target material inspection method, and sputtering target manufacturing method
CN111829403B (en) * 2020-08-10 2022-08-19 西安近代化学研究所 Experimental observation method for explosive forming projectile transient damage process

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4056971A (en) * 1976-05-10 1977-11-08 Automation Industries, Inc. Distance amplitude compensation system
FR2423781A1 (en) 1978-04-19 1979-11-16 Framatome Sa REFERENCE PART, ESPECIALLY FOR NON-DESTRUCTIVE ULTRASONIC EXAMINATIONS, AND PROCEDURE FOR ITS CARRYING OUT
JPS57120857A (en) * 1981-01-19 1982-07-28 Chugoku Electric Power Co Ltd:The Method and device for identification of ultrasonic echo
US4467653A (en) * 1982-03-26 1984-08-28 Matix Industries S.A. Method and apparatus for ultrasonic analysis
US4441369A (en) * 1982-09-30 1984-04-10 General Electric Company Ultrasonic detection of extended flaws
DE3443675C2 (en) 1984-11-30 1986-10-02 MTU Motoren- und Turbinen-Union München GmbH, 8000 München Sample for examination by ultrasound
EP0276308B1 (en) * 1985-10-11 1993-07-14 Hitachi Construction Machinery Co., Ltd. Ultrasonic method of measuring dimensions of flaw in solid material
JPH071255B2 (en) * 1987-11-16 1995-01-11 川崎製鉄株式会社 Method and apparatus for measuring crystal grain orientation distribution of grain-oriented silicon steel sheet
ATE103069T1 (en) * 1988-10-11 1994-04-15 Rieter Ag Maschf DETECTION OF FOREIGN MATERIAL IN TEXTILE FIBERS.
JP2686887B2 (en) 1992-08-11 1997-12-08 キッセイ薬品工業株式会社 Piperidino-3,4-dihydrocarbostyril derivative
US5406850A (en) * 1993-01-14 1995-04-18 Tosoh Smd, Inc. Method of non-destructively testing a sputtering target
FR2744805B1 (en) * 1996-02-13 1998-03-20 Pechiney Aluminium CATHODE SPRAY TARGETS SELECTED BY ULTRASONIC CONTROL FOR THEIR LOW PARTICLE EMISSION RATES
JP3755552B2 (en) * 1996-07-05 2006-03-15 株式会社日鉱マテリアルズ Aluminum or aluminum alloy sputtering target
FR2756572B1 (en) 1996-12-04 1999-01-08 Pechiney Aluminium ALUMINUM ALLOYS WITH HIGH RECRYSTALLIZATION TEMPERATURE USED IN CATHODE SPRAYING TARGETS
KR100625000B1 (en) 1998-06-09 2006-09-20 토소우 에스엠디, 인크 Method and apparatus for quantitative sputter target cleanliness characterization
US6269699B1 (en) * 1999-11-01 2001-08-07 Praxair S. T. Technology, Inc. Determination of actual defect size in cathode sputter targets subjected to ultrasonic inspection

Also Published As

Publication number Publication date
WO2001092868A2 (en) 2001-12-06
TW511205B (en) 2002-11-21
WO2001092868A3 (en) 2002-04-04
US6439054B1 (en) 2002-08-27

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