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Baksht et al., 2012 - Google Patents

Experimental and numerical investigation of two mechanisms underlying runaway electron beam formation

Baksht et al., 2012

Document ID
3700811804273066075
Author
Baksht E
Belomyttsev S
Burachenko A
Ryzhov V
Tarasenko V
Shklyaev V
Publication year
Publication venue
Technical Physics

External Links

Snippet

The electrical breakdown of a gas-filled diode with a highly nonuniform electric field is studied in the case when a 25-kV voltage pulse generates runaway electron beams with time-separated maxima of different duration behind anode foil. Experimental data are …
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Classifications

    • HELECTRICITY
    • H03BASIC ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/53Generators characterised by the type of circuit or by the means used for producing pulses by the use of an energy-accumulating element discharged through the load by a switching device controlled by an external signal and not incorporating positive feedback
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometer or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • HELECTRICITY
    • H03BASIC ELECTRONIC CIRCUITRY
    • H03KPULSE TECHNIQUE
    • H03K3/00Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/64Generators producing trains of pulses, i.e. finite sequences of pulses
    • H03K3/72Generators producing trains of pulses, i.e. finite sequences of pulses with means for varying repetition rate of trains

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