Nothing Special   »   [go: up one dir, main page]

McGrath et al., 1995 - Google Patents

A novel noncontacting waveguide backshort for submillimeter wave frequencies

McGrath et al., 1995

View PDF
Document ID
3513487148640810233
Author
McGrath W
Weller T
Katehi L
Publication year
Publication venue
International journal of infrared and millimeter waves

External Links

Snippet

A novel noncontacting waveguide backshort has been developed for millimeter wave and submillimeter wave frequencies. It employs a metallic bar with rectangular or circular holes. The size and spacing of the holes are adjusted to provide a periodic variation of the guide …
Continue reading at citeseerx.ist.psu.edu (PDF) (other versions)

Classifications

    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01PWAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P5/00Coupling devices of the waveguide type
    • H01P5/12Coupling devices having more than two ports
    • H01P5/16Conjugate devices, i.e. devices having at least one port decoupled from one other port
    • H01P5/18Conjugate devices, i.e. devices having at least one port decoupled from one other port consisting of two coupled guides, e.g. directional couplers
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01PWAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P5/00Coupling devices of the waveguide type
    • H01P5/08Coupling devices of the waveguide type for linking dissimilar lines or devices
    • H01P5/10Coupling devices of the waveguide type for linking dissimilar lines or devices for coupling balanced with unbalanced lines or devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants; Measuring impedance or related variables
    • G01R27/2617Measuring dielectric properties, e.g. constants
    • G01R27/2635Sample holders, electrodes or excitation arrangements, e.g. sensors or measuring cells
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01PWAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P1/00Auxiliary devices
    • H01P1/24Terminating devices
    • H01P1/26Dissipative terminations
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01PWAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P1/00Auxiliary devices
    • H01P1/22Attenuating devices
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01PWAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P1/00Auxiliary devices
    • H01P1/18Phase-shifters
    • H01P1/19Phase-shifters using a ferromagnetic device
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01PWAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P11/00Apparatus or processes specially adapted for manufacturing waveguides or resonators, lines, or other devices of the waveguide type
    • H01P11/001Manufacturing waveguides or transmission lines of the waveguide type
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01PWAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P1/00Auxiliary devices
    • H01P1/20Frequency-selective devices, e.g. filters
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01PWAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P1/00Auxiliary devices
    • H01P1/32Non-reciprocal transmission devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics
    • G01R29/0807Measuring electromagnetic field characteristics characterised by the application
    • G01R29/0814Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning
    • G01R29/0821Field measurements related to measuring influence on or from apparatus, components or humans, e.g. in ESD, EMI, EMC, EMP testing, measuring radiation leakage; detecting presence of micro- or radiowave emitters; dosimetry; testing shielding; measurements related to lightning rooms and test sites therefor, e.g. anechoic chambers, open field sites or TEM cells
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics
    • G01R29/10Radiation diagrams of aerials; Antenna testing in general
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants; Measuring impedance or related variables
    • G01R27/2688Measuring quality factor or dielectric loss, e.g. loss angle, or power factor
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01PWAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P3/00Waveguides; Transmission lines of the waveguide type
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01PWAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
    • H01P7/00Resonators of the waveguide type

Similar Documents

Publication Publication Date Title
Catala-Civera et al. Accurate determination of the complex permittivity of materials with transmission reflection measurements in partially filled rectangular waveguides
Ghodgaonkar et al. A free-space method for measurement of dielectric constants and loss tangents at microwave frequencies
Barry A broad-band, automated, stripline technique for the simultaneous measurement of complex permittivity and permeability
Wang et al. Characterization of dielectric materials at WR-15 band (50–75 GHz) using VNA-based technique
Li et al. Compact dielectric constant characterization of low-loss thin dielectric slabs with microwave reflection measurement
Suzuki et al. Millimeter-wave measurement of complex permittivity by perturbation method using open resonator
McGrath et al. A novel noncontacting waveguide backshort for submillimeter wave frequencies
Pohl et al. High precision radar distance measurements in overmoded circular waveguides
Gagnon et al. Low-cost free-space measurement of dielectric constant at Ka band
Fang et al. A tunable split resonator method for nondestructive permittivity characterization
Katehi et al. A novel noncontacting waveguide backshort for submillimeter wave frequencies
Dvorsky et al. Microwave surface conductivity measurement using an open-ended circular waveguide probe
Li et al. New tunable phase shifters using perturbed dielectric image lines
Yu et al. A novel parallel-plate dielectric resonator method for broadband complex permittivity measurement in the millimeter-wave bands
Li et al. Design of a cylindrical cavity resonator for measurements of electrical properties of dielectric materials
Weller et al. Analysis and design of a novel noncontacting waveguide backshort
Shu et al. Millimeter wave measurement of the low-loss dielectric in vacuum electronic devices with reflection-type hemispherical open resonator
Harris et al. Groove-and H-Waveguide Design and Characteristics at Short Millimetric Wavelengths
Khayam et al. Analytical Approach of EM Wave Propagation in Different Stacked Materials Encapsulated by Rectangular Waveguide
Shwaykani et al. A new calculation method for the dielectric constant of low-loss materials
Zhang et al. Measurement of anisotropic material by using orthomode transducer for high efficiency
Jaschke et al. Novel multilayer SIW tapers synthesized using an extended transverse resonance method
CN115842234B (en) Strip line resonator
Cho et al. Design of a Waveguide Calibration Kit Consisting of Offset Shorts for Low Measurement Uncertainty
Zhang et al. Electromagnetic parameters measurement of sheet using separate microstrip line