Nothing Special   »   [go: up one dir, main page]

Wolny et al., 2008 - Google Patents

Iron-filled carbon nanotubes as probes for magnetic force microscopy

Wolny et al., 2008

Document ID
3330138495873094055
Author
Wolny F
Weissker U
Mühl T
Leonhardt A
Menzel S
Winkler A
Büchner B
Publication year
Publication venue
Journal of Applied Physics

External Links

Snippet

Iron-filled carbon nanotubes (Fe-CNTs) were used to prepare probes for magnetic force microscopy (MFM) by attaching them to the tips of conventional atomic force microscopy cantilevers. An optimized chemical vapor deposition process, employing a two stage furnace …
Continue reading at pubs.aip.org (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q60/00—Particular type of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
    • G01Q60/24—AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
    • G01Q60/38—Probes, their manufacture, or their related instrumentation, e.g. holders
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANO-TECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE OR TREATMENT OF NANO-STRUCTURES
    • B82Y35/00—Methods or apparatus for measurement or analysis of nano-structures
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANO-TECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE OR TREATMENT OF NANO-STRUCTURES
    • B82Y30/00—Nano-technology for materials or surface science, e.g. nano-composites
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANO-TECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE OR TREATMENT OF NANO-STRUCTURES
    • B82Y10/00—Nano-technology for information processing, storage or transmission, e.g. quantum computing or single electron logic
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANO-TECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE OR TREATMENT OF NANO-STRUCTURES
    • B82Y40/00—Manufacture or treatment of nano-structures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
    • G01Q70/00—General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group G01Q60/00
    • G01Q70/08—Probe characteristics
    • G01Q70/10—Shape or taper

Similar Documents

Publication Publication Date Title
Winkler et al. Magnetic force microscopy sensors using iron-filled carbon nanotubes
Wolny et al. Iron-filled carbon nanotubes as probes for magnetic force microscopy
Kazakova et al. Frontiers of magnetic force microscopy
Deng et al. Metal-coated carbon nanotube tips for magnetic force microscopy
Arie et al. Carbon-nanotube probe equipped magnetic force microscope
Leonhardt et al. Enhanced magnetism in Fe-filled carbon nanotubes produced by pyrolysis of ferrocene
Skidmore et al. Improved spatial resolution in magnetic force microscopy
TWI286993B (en) Magnetic carbon nanotube
US20110203021A1 (en) Spm nanoprobes and the preparation method thereof
Obraztsov et al. Single crystal diamond tips for scanning probe microscopy
Wolny et al. Magnetic force microscopy measurements in external magnetic fields—comparison between coated probes and an iron filled carbon nanotube probe
Tay et al. High-resolution nanowire atomic force microscope probe grownby a field-emission induced process
Chen et al. Iron–platinum-coated carbon nanocone probes on tipless cantilevers for high resolution magnetic force imaging
US7170055B1 (en) Nanotube arrangements and methods therefor
Ruskov et al. Mössbauer morphological analysis of Fe-filled multiwalled carbon nanotube samples
Tan et al. Fabrication of high aspect ratio AFM probes with different materials inspired by TEM “lift-out” method
Zaman et al. In-situ magnetic nano-patterning of Fe films grown on Cu (100)
Fujita et al. Cobalt nanorods fully encapsulated in carbon nanotube and magnetization measurements by off-axis electron holography
Xu et al. Ion-beam-induced chemical-vapor deposition of FePt and CoPt particles
JP4485393B2 (en) Magnetic force measurement method
Fujita et al. Electron holography of single-crystal iron nanorods encapsulated in carbon nanotubes
Ding et al. Electron-beam tip/sample heating device for a scanning tunneling microscopy
Bondino et al. Stable Fe nanomagnets encapsulated inside vertically-aligned carbon nanotubes
US10203354B2 (en) Cantilever for a scanning type probe microscope
Wolny et al. Stable magnetization of iron filled carbon nanotube MFM probes in external magnetic fields