Gu et al., 2014 - Google Patents
Amorphous Al 2 O 3 shield for thermal management in electrically pumped metallo-dielectric nanolasersGu et al., 2014
- Document ID
- 3096292020408990555
- Author
- Gu Q
- Shane J
- Vallini F
- Wingad B
- Smalley J
- Frateschi N
- Fainman Y
- Publication year
- Publication venue
- IEEE Journal of Quantum Electronics
External Links
Snippet
We analyze amorphous Al 2 O 3 (-Al 2 O 3) for use as a thick thermally conductive shield in metallo-dielectric semiconductor nanolasers, and show that the use of-Al 2 O 3 allows a laser to efficiently dissipate heat through its shield. This new mechanism for thermal …
- 229910018072 Al 2 O 3 0 title abstract description 53
Classifications
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01S—DEVICES USING STIMULATED EMISSION
- H01S5/00—Semiconductor lasers
- H01S5/30—Structure or shape of the active region; Materials used for the active region
- H01S5/34—Structure or shape of the active region; Materials used for the active region comprising quantum well, or supperlattice structures, e.g. single quantum well lasers (SQW lasers), multiple quantum well lasers (MQW lasers), graded index separate confinement hetrostructure lasers (GRINSCH lasers)
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01S—DEVICES USING STIMULATED EMISSION
- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
- H01S5/18—Surface-emitting lasers (SE-lasers)
- H01S5/183—Surface-emitting lasers (SE-lasers) having a vertical cavity (VCSE-lasers)
- H01S5/18308—Surface-emitting lasers (SE-lasers) having a vertical cavity (VCSE-lasers) having a special structure for lateral current or light confinement
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer, carrier concentration layer
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01S—DEVICES USING STIMULATED EMISSION
- H01S5/00—Semiconductor lasers
- H01S5/02—Structural details or components not essential to laser action
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01S—DEVICES USING STIMULATED EMISSION
- H01S5/00—Semiconductor lasers
- H01S5/20—Structure or shape of the semi-conductor body to guide the optical wave; Confining structures perpendicular to the optical axis, e.g. index- or gain-guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers
- H01S5/22—Structure or shape of the semi-conductor body to guide the optical wave; Confining structures perpendicular to the optical axis, e.g. index- or gain-guiding, stripe geometry, broad area lasers, gain tailoring, transverse or lateral reflectors, special cladding structures, MQW barrier reflection layers having a ridge or stripe structure
-
- H—ELECTRICITY
- H01—BASIC ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H01L31/00—Semiconductor devices sensitive to infra-red radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus peculiar to the manufacture or treatment thereof or of parts thereof; Details thereof
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Gu et al. | Amorphous Al 2 O 3 shield for thermal management in electrically pumped metallo-dielectric nanolasers | |
Koblmüller et al. | GaAs–AlGaAs core–shell nanowire lasers on silicon: invited review | |
Chang et al. | Fundamental formulation for plasmonic nanolasers | |
Mishkat-Ul-Masabih et al. | Electrically injected nonpolar GaN-based VCSELs with lattice-matched nanoporous distributed Bragg reflector mirrors | |
Li et al. | Monolithic III–V on silicon plasmonic nanolaser structure for optical interconnects | |
Evans et al. | Investigation of thermal effects in quantum-cascade lasers | |
Liang et al. | Optimization of hybrid silicon microring lasers | |
Smalley et al. | Temperature dependence of the spontaneous emission factor in subwavelength semiconductor lasers | |
Kim et al. | Room‐Temperature InGaAs Nanowire Array Band‐Edge Lasers on Patterned Silicon‐on‐Insulator Platforms | |
Gu et al. | Temperature effects in metal-clad semiconductor nanolasers | |
Al-Omari et al. | Improved performance of top-emitting oxide-confined polyimide-planarized 980 nm VCSELs with copper-plated heat sinks | |
Dimopoulos et al. | Electrically‐Driven Photonic Crystal Lasers with Ultra‐low Threshold | |
US10965101B2 (en) | Plasmonic quantum well laser | |
Qi et al. | Optimized arrangement of vertical cavity surface emitting laser arrays to improve thermal characteristics | |
Zhang et al. | A hybrid silicon single mode laser with a slotted feedback structure | |
Lu et al. | CW substrate-free metal-cavity surface microemitters at 300 K | |
Chuang et al. | Metal-cavity nanolasers: How small can they go? | |
Zhang et al. | Constriction resistance and current crowding in electrically pumped semiconductor nanolasers with the presence of undercut and sidewall tilt | |
Eissa et al. | High thermal performance hybrid GaInAsP/SOI ridge waveguide lasers with enhanced heat dissipation structure | |
Fang et al. | Low resistance tunnel junctions for efficient electrically pumped nanolasers | |
Lakhani et al. | Lasing in subwavelength semiconductor nanopatches | |
Banerjee et al. | Electrically injected ultra-low threshold room temperature InGaN/GaN-based lateral triangular nanowire laser | |
Wang et al. | Analysis of mode quality factors and mode reflectivities for nanowire cavity by FDTD technique | |
Shane et al. | Effect of undercut etch on performance and fabrication robustness of metal-clad semiconductor nanolasers | |
Hosoda et al. | Room temperature operated diffraction limited λ≃ 3 µm diode lasers with 37 mW of continuous‐wave output power |