Nothing Special   »   [go: up one dir, main page]

Hajizadeh et al., 2014 - Google Patents

Extended linear detection range for optical tweezers using image-plane detection scheme

Hajizadeh et al., 2014

View PDF
Document ID
2987248413752415137
Author
Hajizadeh F
Mousavi S
Khaksar Z
Reihani S
Publication year
Publication venue
Journal of Optics

External Links

Snippet

Ability to measure pico-and femto-Newton range forces using optical tweezers (OT) strongly relies on the sensitivity of its detection system. We show that the commonly used back-focal- plane detection method provides a linear response range which is shorter than that of the …
Continue reading at www.researchgate.net (PDF) (other versions)

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/65Raman scattering
    • G01N2021/653Coherent methods [CARS]
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume, or surface-area of porous materials
    • G01N15/10Investigating individual particles

Similar Documents

Publication Publication Date Title
Ether et al. Probing the Casimir force with optical tweezers
Bauer et al. Nanointerferometric amplitude and phase reconstruction of tightly focused vector beams
Giavazzi et al. Digital Fourier microscopy for soft matter dynamics
Salomon et al. Plasmonic coupling between metallic nanocavities
Li et al. A plasmonic staircase nano-antenna device with strong electric field enhancement for surface enhanced Raman scattering (SERS) applications
Karimullin et al. A tool for alignment of multiple laser beams in pump–probe experiments
Tian et al. In-focus quantitative intensity and phase imaging with the numerical focusing transport of intensity equation method
Grießhammer et al. 5D-Tracking of a nanorod in a focused laser beam-a theoretical concept
Zhou et al. Enhanced magnification factors in super-resolution imaging using stacked dual microspheres
Lee et al. High speed 3D surface profile without axial scanning: dual-detection confocal reflectance microscopy
Dong et al. Characterization and layer thickness mapping of two-dimensional MoS2 flakes via hyperspectral line-scanning microscopy
Gurtner et al. Twin-beam real-time position estimation of micro-objects in 3D
Masajada et al. Optical vortex dynamics induced by vortex lens shift—optical system error analysis
Fordey et al. Single-shot three-dimensional orientation imaging of nanorods using spin to orbital angular momentum conversion
Dienerowitz et al. Expanding the toolbox for nanoparticle trapping and spectroscopy with holographic optical tweezers
Hajizadeh et al. Extended linear detection range for optical tweezers using image-plane detection scheme
Li et al. The origin of interferometric effect involving surface plasmon polariton in scattering near-field scanning optical microscopy
Wang et al. Divided-aperture differential confocal fast-imaging microscopy
McCloskey et al. Photonic nanojets in Fresnel zone scattering from non-spherical dielectric particles
Kuo et al. Simultaneous measurement of refractive index and thickness of transparent material by dual-beam confocal microscopy
Michihata et al. Sensing a vertical surface by measuring a fluorescence signal using a confocal optical system
Greenwood et al. On the impact of realistic point sources in spatial mode demultiplexing super resolution imaging
Sil et al. Dual-mode optical fiber-based tweezers for robust trapping and manipulation of absorbing particles in air
Mousavi et al. Extended linear detection range for optical tweezers using a stop at the back focal plane of the condenser
Farcau et al. Polarized SERS on linear arrays of silver half-shells: SERS re-radiation modulated by local density of optical states