Nothing Special   »   [go: up one dir, main page]

Stråhlman et al., 2016 - Google Patents

A tandem time–of–flight spectrometer for negative–ion/positive–ion coincidence measurements with soft x-ray excitation

Stråhlman et al., 2016

Document ID
2865350992463563730
Author
Stråhlman C
Sankari R
Kivimäki A
Richter R
Coreno M
Nyholm R
Publication year
Publication venue
Review of Scientific Instruments

External Links

Snippet

We present a newly constructed spectrometer for negative–ion/positive–ion coincidence spectroscopy of gaseous samples. The instrument consists of two time–of–flight ion spectrometers and a magnetic momentum filter for deflection of electrons. The instrument …
Continue reading at pubs.aip.org (other versions)

Classifications

    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/34—Dynamic spectrometers
    • H01J49/42—Stability-of-path spectrometers, e.g. monopole, quadrupole, multipole, farvitrons
    • H01J49/4205—Device types
    • H01J49/422—Two-dimensional RF ion traps
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/26—Mass spectrometers or separator tubes
    • H01J49/28—Static spectrometers
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/025—Detectors specially adapted to particle spectrometers
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/02—Details
    • H01J49/22—Electrostatic deflection
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/0027—Methods for using particle spectrometers
    • H—ELECTRICITY
    • H01—BASIC ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometer or separator tubes
    • H01J49/004—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045—Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction

Similar Documents

Publication Publication Date Title
Fehre et al. Absolute ion detection efficiencies of microchannel plates and funnel microchannel plates for multi-coincidence detection
Shevelko et al. Atomic multielectron processes
Ghafur et al. A velocity map imaging detector with an integrated gas injection system
Vredenborg et al. A photoelectron-photoion coincidence imaging apparatus for femtosecond time-resolved molecular dynamics with electron time-of-flight resolution of σ= 18ps and energy resolution ΔE∕ E= 3.5%
Ames et al. Cooling of radioactive ions with the Penning trap REXTRAP
Horke et al. Velocity-map imaging at low extraction fields
O’keeffe et al. A photoelectron velocity map imaging spectrometer for experiments combining synchrotron and laser radiations
Münzenberg Development of mass spectrometers from Thomson and Aston to present
Wu et al. Positive/negative ion velocity mapping apparatus for electron-molecule reactions
Huang et al. Modification of photoionization mass spectrometer with synchrotron radiation as ionization source
Kothe et al. Time-of-flight electron spectrometer for a broad range of kinetic energies
Johnston et al. A velocity map imaging mass spectrometer for photofragments of fast ion beams
Kurahashi et al. Design and characterization of a magnetic bottle electron spectrometer for time-resolved extreme UV and X-ray photoemission spectroscopy of liquid microjets
Tyunkov et al. Generation of metal ions in the beam plasma produced by a forevacuum-pressure electron beam source
Matsuda et al. A magnetic-bottle multi-electron-ion coincidence spectrometer
Hua et al. A cryogenic cylindrical ion trap velocity map imaging spectrometer
Diehl et al. Ion optical design of a collinear laser-negative ion beam apparatus
Skopinski et al. Time-of-flight mass spectrometry of particle emission during irradiation with slow, highly charged ions
Stråhlman et al. A tandem time–of–flight spectrometer for negative–ion/positive–ion coincidence measurements with soft x-ray excitation
Aviv et al. A bent electrostatic ion beam trap for simultaneous measurements of fragmentation and ionization of cluster ions
Prümper et al. Combining high mass resolution and velocity imaging in a time-of-flight ion spectrometer using pulsed fields and an electrostatic lens
Ames et al. Charge state breeding of radioactive ions with an electron cyclotron resonance ion source at TRIUMF
Saha et al. A combined electron-ion spectrometer for studying complete kinematics of molecular dissociation upon shell selective ionization
Ermakov et al. An electrostatic autoresonant ion trap mass spectrometer
Qu et al. The design of double electrostatic-lens optics for resonance enhanced multiphoton ionization and photoelectron imaging experiments