Nothing Special   »   [go: up one dir, main page]

Colodner et al., 1994 - Google Patents

Ion sources for analysis of inorganic solids and liquids by MS

Colodner et al., 1994

Document ID
2772256619146430783
Author
Colodner D
Salters V
Duckworth D
Publication year
Publication venue
Analytical Chemistry

External Links

Snippet

Until about 10 years ago, inorganic MS was relatively limited in both variety and utility com- pared with its organic counterpart, prima-rily because of the nonvolatile natureof most inorganic materials and the difficulties encountered in ionizing these sub-stances …
Continue reading at pubs.acs.org (other versions)

Classifications

    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometer or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/16Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometer or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometer or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/12Ion sources; Ion guns using an arc discharge, e.g. of the duoplasmatron type
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometer or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometer or separator tubes
    • H01J49/02Details
    • H01J49/025Detectors specially adapted to particle spectrometers
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02Details
    • H01J37/04Arrangements of electrodes and associated parts for generating or controlling the discharge, e.g. electron-optical arrangement, ion-optical arrangement
    • H01J37/08Ion sources; Ion guns
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/06Sources
    • H01J2237/08Ion sources
    • H01J2237/0802Field ionization sources
    • H01J2237/0807Gas field ion sources [GFIS]
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometer or separator tubes
    • H01J49/0027Methods for using particle spectrometers
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometer or separator tubes
    • H01J49/004Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn
    • H01J49/0045Combinations of spectrometers, tandem spectrometers, e.g. MS/MS, MSn characterised by the fragmentation or other specific reaction
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/32Gas-filled discharge tubes, e.g. for surface treatment of objects such as coating, plating, etching, sterilising or bringing about chemical reactions
    • HELECTRICITY
    • H01BASIC ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J27/00Ion beam tubes
    • H01J27/02Ion sources; Ion guns
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering

Similar Documents

Publication Publication Date Title
Becker Inorganic mass spectrometry: principles and applications
Shelley et al. Characterization of direct-current atmospheric-pressure discharges useful for ambient desorption/ionization mass spectrometry
King et al. Special feature: tutorial. Glow discharge mass spectrometry: trace element determinations in solid samples
Becker et al. State-of-the-art in inorganic mass spectrometry for analysis of high-purity materials
De Heer The physics of simple metal clusters: experimental aspects and simple models
EP0103586B1 (en) Sputter initiated resonance ionization spectrometry
Caroli The hollow cathode emission source: a survey of the past and a look into the future
Olesik et al. Matrix effects using an ICP-MS with a single positive ion lens and grounded stop: analyte mass dependent?
Muniz et al. Pulsed radiofrequency glow discharge time of flight mass spectrometer for the direct analysis of bulk and thin coated glasses
Price et al. The renaissance of time-of-flight mass spectrometry
US4896035A (en) High mass ion detection system and method
Colodner et al. Ion sources for analysis of inorganic solids and liquids by MS
Hang Laser ionization time-of-flight mass spectrometer with an ion guide collision cell for elemental analysis of solids
Wayne et al. The thermal ionization cavity (TIC) source: elucidation of possible mechanisms for enhanced ionization efficiency
Westman-Brinkmalm et al. A mass spectrometer's building blocks
Pisonero et al. A double microsecond-pulsed glow discharge ion source
JP2010170995A (en) Mass spectroscope and mass spectrometry
Fassett et al. Analytical applications of resonance ionization mass spectrometry (RIMS)
Bernhardt et al. Unimolecular decomposition of antimony and bismuth cluster ions studied by surface collision induced dissociation mass spectrometry
King et al. Glow discharge mass spectrometry
Čada et al. Heavy species dynamics in high power impulse magnetron sputtering discharges
Duan et al. Characterization of an improved thermal ionization cavity source for mass spectrometry
Mahoney et al. A unique fast atom source for mass spectrometry applications
Blades Atomic mass spectrometry
De Heer et al. An improved laser vaporization cluster source and time-of-flight mass spectrometer