Nothing Special   »   [go: up one dir, main page]

Petroni et al., 2012 - Google Patents

Flexible piezoelectric cantilevers fabricated on polyimide substrate

Petroni et al., 2012

View PDF
Document ID
229388300196795854
Author
Petroni S
Maruccio G
Guido F
Amato M
Campa A
Passaseo A
Todaro M
De Vittorio M
Publication year
Publication venue
Microelectronic engineering

External Links

Snippet

In this work we present for the first time the fabrication and the characterization of flexible micro cantilevers based on Aluminum Nitride (AlN) as piezoelectric active layer and polyimide as elastic substrate. The AlN thin film, embedded into two layers of Molybdenum …
Continue reading at www.academia.edu (PDF) (other versions)

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/02Analysing fluids
    • G01N29/036Analysing fluids by measuring frequency or resonance of acoustic waves
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/02Indexing codes associated with the analysed material
    • G01N2291/025Change of phase or condition
    • G01N2291/0256Adsorption, desorption, surface mass change, e.g. on biosensors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/02Analysing fluids
    • G01N29/022Fluid sensors based on micro-sensors, e.g. quartz crystal-microbalance [QCM], surface acoustic wave [SAW] devices, tuning forks, cantilevers, flexural plate wave [FPW] devices
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22Details, e.g. general constructional or apparatus details
    • G01N29/24Probes
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00Indexing codes associated with group G01N29/00
    • G01N2291/04Wave modes and trajectories
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L5/00Apparatus for, or methods of, measuring force, e.g. due to impact, work, mechanical power, or torque, adapted for special purposes
    • G01L5/0047Apparatus for, or methods of, measuring force, e.g. due to impact, work, mechanical power, or torque, adapted for special purposes measuring forces due to residual stresses
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress in general
    • G01L1/20Measuring force or stress in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electro-kinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22Measuring force or stress in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electro-kinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electro-chemical, or magnetic means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2203/00Investigating strength properties of solid materials by application of mechanical stress
    • G01N2203/02Details not specific for a particular testing method

Similar Documents

Publication Publication Date Title
Petroni et al. Flexible piezoelectric cantilevers fabricated on polyimide substrate
Rathod et al. Characterization of a large-area PVDF thin film for electro-mechanical and ultrasonic sensing applications
Joshi et al. Distributed MEMS mass-sensor based on piezoelectric resonant micro-cantilevers
Shibata et al. Characterization of sputtered ZnO thin film as sensor and actuator for diamond AFM probe
Andrei et al. AlN as an actuation material for MEMS applications: The case of AlN driven multilayered cantilevers
Mazzalai et al. Characterization and fatigue of the converse piezoelectric effect in PZT films for MEMS applications
Prume et al. Piezoelectric thin films: Evaluation of electrical and electromechanical characteristics for MEMS devices
Arora et al. Design of mems based microcantilever using comsol multiphysics
Sielmann et al. Inkjet printed all-polymer flexural plate wave sensors
Wei et al. Partial-electroded ZnO pyroelectric sensors for responsivity improvement
Salowitz et al. A vision on stretchable bio-inspired networks for intelligent structures
Prashanthi et al. Fabrication and characterization of a novel magnetoelectric multiferroic MEMS cantilevers on Si
Chivukula et al. Simulation of SiO2-based piezoresistive microcantilevers
Isarakorn et al. Finite element analysis and experiments on a silicon membrane actuated by an epitaxial PZT thin film for localized-mass sensing applications
Pant et al. MEMS-based nanomechanics: influence of MEMS design on test temperature
Mutyala et al. Mechanical and electronic approaches to improve the sensitivity of microcantilever sensors
Wilke et al. Wafer mapping of the transverse piezoelectric coefficient, e31, f, using the wafer flexure technique with sputter deposited Pt strain gauges
Huang et al. Determination of piezoelectric coefficients and elastic constant of thin films by laser scanning vibrometry techniques
Singh et al. Microcantilever sensors with embedded piezoresistive transistor read-out: Design and characterization
Dong et al. Fabrication and characterization of microcantilever integrated with PZT thin film sensor and actuator
Kursu et al. Piezoelectric bimorph charge mode force sensor
Prume et al. Extensive electromechanical characterization of PZT thin films for MEMS applications by electrical and mechanical excitation signals
WO2007014044A2 (en) Biological detection based on differentially coupled nanomechanical systems using self-sensing cantilevers with attonewton force resolution
Tina et al. Silicon mems nanomechanical membrane flexure sensor with integrated high gauge factor ito
Xiong et al. Piezoelectric properties of PZT films prepared by the sol–gel method and their application in MEMS