Nothing Special   »   [go: up one dir, main page]

Meierer et al., 1995 - Google Patents

An on-wafer noise parameter measurement technique with automatic receiver calibration

Meierer et al., 1995

Document ID
2280780040908620168
Author
Meierer R
Tsironis C
Publication year
Publication venue
Microwave Journal

External Links

Snippet

The two most commonly used techniques for noise figure measurements are the standard and the cold-source measurement techniques. The standard technique,[1] shown in Figure 1, uses a noise source connected to the input of the DUT set to its cold ([T. sub. C]) and hot …
Continue reading at go.gale.com (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/28—Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks using network analysers Measuring transient response
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R35/00—Testing or calibrating of apparatus covered by the preceding groups
    • G01R35/005—Calibrating; Standards or reference devices, e.g. voltage or resistance standards, "golden" references
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply, e.g. by thermoelectric elements
    • G01K7/32—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply, e.g. by thermoelectric elements using change of resonant frequency of a crystal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments

Similar Documents

Publication Publication Date Title
Juroshek A direct calibration method for measuring equivalent source mismatch
Ranzani et al. Two-port microwave calibration at millikelvin temperatures
Meierer et al. An on-wafer noise parameter measurement technique with automatic receiver calibration
Sipila et al. High-frequency periodic time-domain waveform measurement system
US7107170B2 (en) Multiport network analyzer calibration employing reciprocity of a device
Teppati et al. A Comparison of Uncertainty Evaluation Methods for On-Wafer $ S $-Parameter Measurements
Calandra et al. Characterization of GaAs FET's in terms of noise, gain, and scattering parameters through a noise parameter test set
US7002335B2 (en) Method for measuring a three-port device using a two-port vector network analyzer
Potter et al. Nonlinearity correction of microwave diode detectors using a repeatable attenuation step
Stumper Influence of TMSO calibration standards uncertainties on VNA S-parameter measurements
Zhu Phase uncertainty in calibrating microwave test fixtures
Archer et al. Fully automated on-wafer noise characterization of GaAs MESFETs and HEMTs
Withington Scattered noise waves in microwave and mm-wave networks
Vondran Noise figure measurement: Corrections related to match and gain
Romano et al. The HΓ-VNA, an interferometric approach for the accurate measurement of extreme impedances
Rytting Effects of uncorrected RF performance in a vector network analyzer
Slobodnik et al. Millimeter wave GaAs switch FET modeling
Rahmati et al. On optimum impedance pattern for accurate wideband noise parameter characterization
Gallego et al. Determination of noise parameters of low noise microwave IF amplifiers
Wong et al. Microwave electronic calibration: Transferring standards lab accuracy to the production floor
Marsan et al. Make accurate sub-1 dB noise figure measurements part 2: the measurements
Bouny Impedance measurements for high power RF transistors using the TRL method
Gronau Scattering-parameter measurement of microstrip devices
Tsironis Calibration of network analyzers for tuner characterization
Tong et al. An accurate calibration method of microwave noise sources using noise wave de-embedding techniques