Espinoza‐Nava et al., 2016 - Google Patents
QCL‐Based Perfluorocarbon Emission MonitoringEspinoza‐Nava et al., 2016
- Document ID
- 2122601964280977541
- Author
- Espinoza‐Nava L
- Menegazzo N
- Dando N
- Geiser P
- Publication year
- Publication venue
- Light Metals 2016
External Links
Snippet
Periodic, short‐term, extractives ampling with Fourier transform infrared (FTIR) spectrometers is often employed to measure perfluorocarbon (PFC) emissions at aluminum smelters. FTIRs have been routinely deployed by Alcoa to measure tetrafluoromethane …
- TXEYQDLBPFQVAA-UHFFFAOYSA-N Tetrafluoromethane 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FC(F)(F)F 0 title abstract description 30
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
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