Nothing Special   »   [go: up one dir, main page]

Boscaro et al., 2016 - Google Patents

Automatic process for time-frequency scan of VLSI

Boscaro et al., 2016

View PDF
Document ID
2020549054556106138
Author
Boscaro A
Jacquir S
Melendez K
Sanchez K
Perdu P
Binczak S
Publication year
Publication venue
Microelectronics Reliability

External Links

Snippet

Electro optical techniques (EOP: electro optical probing and EOFM: electro optical frequency mapping) are effective backside contactless methods for defect localization and design debug for VLSI. The image mode (EOFM) gives only one frequency at each scan. In this …
Continue reading at hal.science (PDF) (other versions)

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/44—Arrangements or instruments for measuring magnetic variables involving magnetic resonance using nuclear magnetic resonance [NMR]
    • G01R33/48—NMR imaging systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00—Arrangements for displaying electric variables or waveforms
    • G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using infra-red, visible or ultra-violet light

Similar Documents

Publication Publication Date Title
Lin et al. Fourier analysis on transient imaging with a multifrequency time-of-flight camera
US10180402B2 (en) Method and apparatus for conducting automated integrated circuit analysis
Ng et al. Laser voltage imaging: A new perspective of laser voltage probing
US9581642B2 (en) Method and system for quickly identifying circuit components in an emission image
AT411496B (en) METHOD AND DEVICE FOR OPTICALLY TESTING SEMICONDUCTOR COMPONENTS
US9903824B2 (en) Spectral mapping of photo emission
KR102255480B1 (en) Waveform Mapping and Gated Laser Voltage Imaging
Boscaro et al. Automatic process for time-frequency scan of VLSI
JP2018072290A (en) Fault location specification device and fault location specification method
US7973545B2 (en) Time resolved radiation assisted device alteration
US6327394B1 (en) Apparatus and method for deriving temporal delays in integrated circuits
Boscaro et al. Improvement of signal to noise ratio in electro optical probing technique by wavelets filtering
US7679358B2 (en) System and method for voltage noise and jitter measurement using time-resolved emission
DE10296665T5 (en) Backside voltage measurement of an integrated circuit
US20150300882A1 (en) Dynamic Differential Thermal Measurement Systems and Methods
Bascoul et al. Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis
US20150260789A1 (en) System and method for fault isolation by emission spectra analysis
Chef et al. Unsupervised learning for signal mapping in dynamic photon emission
Chef et al. Frequency mapping in dynamic light emission with wavelet transform
Goh et al. Take a Closer Look at Electrically-Enhanced LADA: Setup
Villa et al. Exploitation of Laser Voltage techniques for identification and complete characterization of a scan chain transition fail issue using the second harmonic approach
US8326558B2 (en) Method of analyzing an integrated circuit, method of observation and their associated installations
Sanchez et al. Comparison of cw electro optical probing and light emission techniques
Bruce et al. Through silicon in-circuit logic analysis for localizing logic pattern failures
Wu et al. EMI Detection on Time Domain–Practice through Cloud Computing